CN114942517A - Method for automatically focusing under high power microscope by using electric control platform - Google Patents

Method for automatically focusing under high power microscope by using electric control platform Download PDF

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Publication number
CN114942517A
CN114942517A CN202210532907.7A CN202210532907A CN114942517A CN 114942517 A CN114942517 A CN 114942517A CN 202210532907 A CN202210532907 A CN 202210532907A CN 114942517 A CN114942517 A CN 114942517A
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CN
China
Prior art keywords
microscope
computer
camera
objective table
electric
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Pending
Application number
CN202210532907.7A
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Chinese (zh)
Inventor
李永平
何金龙
李焕平
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Hanpo Shanghai Biotechnology Co Ltd
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Hanpo Shanghai Biotechnology Co Ltd
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Priority to CN202210532907.7A priority Critical patent/CN114942517A/en
Publication of CN114942517A publication Critical patent/CN114942517A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/241Devices for focusing
    • G02B21/244Devices for focusing using image analysis techniques
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/241Devices for focusing
    • G02B21/242Devices for focusing with coarse and fine adjustment mechanism
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28Systems for automatic generation of focusing signals
    • G02B7/36Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Automatic Focus Adjustment (AREA)

Abstract

The invention discloses a method for automatically focusing under a high power microscope by utilizing an electric control platform, which comprises the following steps: a set of microscope photographing system is set up, the microscope photographing system comprises a microscope, a computer, an electric objective table and a camera, the electric objective table can move in a three-axis direction, and the camera can transmit images to the computer and is controlled by the computer in a master mode; finding the upper limit and the lower limit of the motion of the electric objective table and recording the position of a z axis; placing a slide, and directly selecting a required high-power objective lens; finding out blurred images in a mode of shooting one by one, and calculating a z-axis coordinate 'F' of the positions of the blurred images by using a computer; obtaining a group of pictures by taking pictures one by one near the F, finding out the clearest picture in the group of pictures by a computer algorithm, and recording the corresponding axis coordinate F; the electric objective table moves to the position of f, so that the full-automatic focusing without human intervention under the high power lens is realized. The invention obtains the effect of clear images under a high-power microscope by realizing automatic focusing.

Description

Method for automatically focusing under high power microscope by using electric control platform
Technical Field
The invention relates to the technical field of microscopes, in particular to a method for automatically focusing under a high-power microscope by utilizing an electric control platform.
Background
The microscope is an optical instrument formed by one lens or a combination of several lenses, and is a mark for human beings to enter the atomic era. A microscope is an instrument that is used primarily to magnify tiny objects as seen by the naked human eye.
The focal plane of the microscope is a very small range, especially in the case of high-power objective lenses (e.g., 100 x oil lenses). The usual way is to manually find the image under the low power mirror and then switch to the high power mirror to continue to find a more accurate focal plane. However, manually, it is inefficient and takes a lot of time.
Based on the above situation, we have designed a method for automatically focusing under a high power microscope by using an electronic control platform.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a method for automatically focusing under a high power microscope by utilizing an electric control platform.
The above object of the present invention is achieved by the following technical solutions:
a method for automatically focusing under a high power microscope by utilizing an electric control platform comprises the following steps:
step 1: a set of microscope photographing system is set up, the microscope photographing system comprises a microscope, a computer, an electric objective table and a camera, the electric objective table can move in a three-axis direction, the camera can transmit images to the computer, and the computer is connected with all components and performs master control;
step 2: finding the upper limit and the lower limit of the motion of the electric objective table and recording the position of the z axis;
and step 3: placing a slide, and directly selecting a required high-power objective lens;
and 4, step 4: finding out blurred images in a mode of photographing one by one, and calculating a z-axis coordinate 'F' of the position of each blurred image by using a computer;
and 5: obtaining a group of pictures by taking pictures one by one near the F, finding out the clearest picture in the group of pictures by a computer algorithm, and recording the corresponding axis coordinate F;
step 6: the electric objective table moves to the position of f, so that the full-automatic focusing without human intervention under the high power lens is realized.
The further technical scheme of the invention is that the step 4 comprises the following steps:
step 4.1: the electric objective table starts to move from the lower limit position of the z axis, moves 0.01mm each time, sends an instruction to the camera through the computer after moving each time, triggers the camera to take a picture and stores the picture;
step 4.2: analyzing the atlas stored in the last step by using a computer, and calculating the average gray value of the image under the square segmentation to obtain the image sequence of the image with the lowest gray value;
step 4.3: the z-axis coordinate "F" of the location of the map is calculated.
The further technical scheme of the invention is that the step 5 comprises the following steps:
step 5.1: the electric objective table moves to the position of 'F-0.01', starts to move upwards, moves 0.0005mm each time and moves 40 times, sends an instruction to the camera through the computer after moving each time, triggers the camera to take a picture and stores the picture;
step 5.2: finding out a piece with highest definition from the 40 graphs through a definition algorithm;
step 5.3: the z-axis coordinate position "f" corresponding to the graph with the highest resolution is calculated.
The invention further adopts the technical scheme that the electric objective table can replace a coarse focusing screw and a fine focusing screw of a microscope to control the movement in the z-axis direction.
The invention further adopts the technical scheme that a plurality of groups of slides can be placed on the electric objective table.
The technical scheme of the invention is that the slide is clamped on the electric objective table.
The further technical scheme of the invention is that the method also comprises the following steps of 7: and (5) completing the full-automatic focusing of the slide, repeating the steps 1-6, and performing full-automatic focusing on the rest slides one by one.
The microscope, the electric objective table and the camera are arranged in the box body, one side of the box body is provided with an observation window, and the computer is arranged outside and is electrically connected with the microscope, the electric objective table and the camera through communication wires.
In summary, the invention has the following beneficial technical effects:
the invention solves the problem that a clear image cannot be directly found under a high-power microscope by adopting a structure that the movement of the electric objective table is matched with a camera computer definition algorithm, and achieves the effect of directly obtaining the clear image under the high-power microscope in a full-automatic way without manual intervention; the focusing method of the invention is different from the focusing principle of a camera, the camera focusing is generally automatic from blurring to clearness, and the focusing method of the invention is automatic from no image to image.
Detailed Description
The present invention will be described in further detail below.
The invention discloses a method for automatically focusing under a high-power microscope by utilizing an electric control platform.
The method for automatically focusing under a high power microscope by utilizing the electric control platform comprises the following steps:
step 1: set up one set of microscope system of shooing, the microscope system of shooing includes microscope, computer, electronic objective table and camera, and triaxial motion can be done to electronic objective table, and electronic objective table can replace microscopical thick accurate burnt spiral and thin accurate burnt spiral control z axle (about promptly) direction motion, and the camera can be to the image transmission to the computer in, connect all parts and do total control by the computer.
Step 2: the upper and lower limits of the motorized stage motion are found and the z-axis position is recorded.
And step 3: the slide is placed and the desired high power objective lens is selected directly.
And 4, step 4: the blurred images are found by means of shooting one by one, and the z-axis coordinate 'F' of the position of the blurred images is calculated by a computer.
And 5: and (3) acquiring a group of pictures by taking pictures one by one near the F, finding out the clearest picture in the group of pictures by using a computer algorithm, and recording the corresponding axis coordinate F.
Step 6: the electric objective table moves to the position of f, so that the full-automatic focusing without human intervention under the high power lens is realized.
In the present invention, step 4 comprises the steps of:
step 4.1: the electric objective table starts to move from the lower limit position of the z axis, moves 0.01mm each time, sends an instruction to the camera through the computer after moving each time, triggers the camera to take a picture and stores the picture.
And 4.2: and analyzing the atlas stored in the previous step by using a computer, and calculating the average gray value of the image under the square segmentation to obtain the image sequence of the image with the lowest gray value.
Step 4.3: the z-axis coordinate "F" of the location of this map is calculated.
The step 5 comprises the following steps:
step 5.1: and (3) moving the electric object stage to the position of F-0.01, starting to move upwards for 40 times by 0.0005mm each time, sending an instruction to the camera through the computer after each movement, triggering the camera to take a picture and storing the image.
Step 5.2: the highest resolution one is found from the above 40 images by a resolution algorithm (an open source image resolution algorithm).
Step 5.3: the z-axis coordinate position "f" corresponding to the graph with the highest resolution is calculated.
Because the microscope photographing system is a precise instrument, in order to avoid the damage of the microscope photographing system, the invention also comprises a box body structure for protecting the microscope photographing system.
Specifically, microscope, electronic objective table and camera are installed in the box, and transparent observation window is installed to box one side, and the computer is external and is connected with microscope, electronic objective table and camera electricity through the communication line. The computer is externally connected so as to be convenient for practical use.
In addition, after the automatic focusing is completed, the next slide needs to be replaced, and the automatic focusing operation is carried out, so that the operation is complicated.
In order to avoid the situation, a plurality of groups of slides can be placed on the electric objective table, the slides can be arranged on the electric objective table in a clamping or pressing mode, and the microscope photographing system can finish the automatic focusing operation of a plurality of slides at one time, so that the working efficiency is improved.
Therefore, the method of auto-focusing of the present invention further comprises step 7: and (5) completing the full-automatic focusing of the slide, repeating the steps 1-6, and performing full-automatic focusing on the rest slides one by one.
The implementation principle of the invention is as follows:
the invention solves the problem that a clear image cannot be directly found under a high-power microscope by adopting a structure that the movement of the electric objective table is matched with a camera computer definition algorithm, and achieves the effect of directly obtaining the clear image under the high-power microscope in a full-automatic way without manual intervention.
The embodiments of the present invention are preferred embodiments of the present invention, and the scope of the present invention is not limited by these embodiments, so: all equivalent changes made according to the structure, shape and principle of the invention are covered by the protection scope of the invention.

Claims (8)

1. A method for automatically focusing under a high power microscope by using an electric control platform is characterized by comprising the following steps:
step 1: a set of microscope photographing system is set up, the microscope photographing system comprises a microscope, a computer, an electric objective table and a camera, the electric objective table can move in a three-axis direction, the camera can transmit images to the computer, and the computer is connected with all components and performs master control;
and 2, step: finding the upper limit and the lower limit of the motion of the electric objective table and recording the position of a z axis;
and step 3: placing a slide, and directly selecting a required high-power objective lens;
and 4, step 4: finding out blurred images in a mode of photographing one by one, and calculating a z-axis coordinate 'F' of the position of each blurred image by using a computer;
and 5: obtaining a group of pictures by taking pictures one by one near the F, finding out the clearest picture in the group of pictures by a computer algorithm, and recording the corresponding axis coordinate F;
step 6: the electric objective table moves to the position of f, so that the full-automatic focusing without human intervention under the high power lens is realized.
2. The method of claim 1, wherein the step of automatically focusing on the high power microscope by using the electrically controlled platform,
the step 4 comprises the following steps:
step 4.1: the electric objective table starts to move from the lower limit position of the z axis, moves 0.01mm each time, sends an instruction to the camera through the computer after moving each time, triggers the camera to take a picture and stores the picture;
and 4.2: analyzing the atlas stored in the last step by using a computer, and calculating the average gray value of the image under the square segmentation to obtain the image sequence of the image with the lowest gray value;
step 4.3: the z-axis coordinate "F" of the location of the map is calculated.
3. The method of claim 1, wherein the step of automatically focusing on the high power microscope by using the electrically controlled platform,
the step 5 comprises the following steps:
step 5.1: the electric objective table moves to the position of F-0.01, starts to move upwards, moves 0.0005mm each time and moves 40 times, sends an instruction to the camera through the computer after moving each time, triggers the camera to take a picture and stores the picture;
step 5.2: finding out a piece with highest definition from the 40 graphs through a definition algorithm;
step 5.3: the z-axis coordinate position "f" corresponding to the graph with the highest resolution is calculated.
4. The method of claim 1, wherein the motorized stage is capable of controlling the z-axis motion in place of the coarse and fine focusing screws of the microscope.
5. The method of claim 1, wherein a plurality of slides can be placed on the motorized stage.
6. The method of claim 5, wherein the slide is mounted on the motorized stage.
7. The method of claim 6, wherein the automatically controlled stage is used for auto-focusing under a high power microscope,
further comprising step 7: and (5) completing the full-automatic focusing of the slide, repeating the steps 1-6, and performing full-automatic focusing on the rest slides one by one.
8. The method as claimed in claim 1, further comprising a housing, wherein the microscope, the motorized stage and the camera are mounted in the housing, an observation window is disposed on one side of the housing, and the computer is disposed outside and electrically connected to the microscope, the motorized stage and the camera through a communication line.
CN202210532907.7A 2022-05-11 2022-05-11 Method for automatically focusing under high power microscope by using electric control platform Pending CN114942517A (en)

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CN202210532907.7A CN114942517A (en) 2022-05-11 2022-05-11 Method for automatically focusing under high power microscope by using electric control platform

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210532907.7A CN114942517A (en) 2022-05-11 2022-05-11 Method for automatically focusing under high power microscope by using electric control platform

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112099217A (en) * 2020-08-18 2020-12-18 宁波永新光学股份有限公司 Automatic focusing method for microscope
CN112099216A (en) * 2020-08-18 2020-12-18 宁波永新光学股份有限公司 Focusing method of electric fluorescence microscope

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112099217A (en) * 2020-08-18 2020-12-18 宁波永新光学股份有限公司 Automatic focusing method for microscope
CN112099216A (en) * 2020-08-18 2020-12-18 宁波永新光学股份有限公司 Focusing method of electric fluorescence microscope

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