CN114923485A - Closed-loop atomic interference inertia measurement method and device - Google Patents

Closed-loop atomic interference inertia measurement method and device Download PDF

Info

Publication number
CN114923485A
CN114923485A CN202210718670.1A CN202210718670A CN114923485A CN 114923485 A CN114923485 A CN 114923485A CN 202210718670 A CN202210718670 A CN 202210718670A CN 114923485 A CN114923485 A CN 114923485A
Authority
CN
China
Prior art keywords
pair
interference
laser
raman laser
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN202210718670.1A
Other languages
Chinese (zh)
Other versions
CN114923485B (en
Inventor
冯焱颖
颜培强
孟至欣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Original Assignee
Tsinghua University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University filed Critical Tsinghua University
Priority to CN202210718670.1A priority Critical patent/CN114923485B/en
Publication of CN114923485A publication Critical patent/CN114923485A/en
Application granted granted Critical
Publication of CN114923485B publication Critical patent/CN114923485B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C21/00Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00
    • G01C21/10Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by using measurements of speed or acceleration
    • G01C21/12Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by using measurements of speed or acceleration executed aboard the object being navigated; Dead reckoning
    • G01C21/16Navigation; Navigational instruments not provided for in groups G01C1/00 - G01C19/00 by using measurements of speed or acceleration executed aboard the object being navigated; Dead reckoning by integrating acceleration or speed, i.e. inertial navigation

Landscapes

  • Engineering & Computer Science (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Automation & Control Theory (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Lasers (AREA)

Abstract

The application relates to a closed-loop atomic interference inertia measurement method and device. The method comprises the following steps: generating an atomic beam pair, a Raman laser pair and a detection laser pair; the Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference; the detection laser pair is used for acting with the interfered atomic beam pair to generate a pair of light to be detected; collecting a pair of light to be measured to obtain a target interference signal pair, and determining a signal sum value and a signal difference value according to the target interference signal pair and an interference signal expression; adjusting a compensation parameter of the Raman laser pair through a preset first adjustment strategy, and returning to execute the step of generating the Raman laser pair based on the compensation parameter until the determined signal sum value and the determined signal difference value are both zero; and determining the linear acceleration and the rotation angle rate of the target carrier according to the compensation parameters, the first corresponding relation and the second corresponding relation of the Raman laser pair. The application range of the atomic interference inertia measurement is enlarged.

Description

Closed-loop atomic interference inertia measurement method and device
Technical Field
The application relates to the technical field of quantum precision measurement, in particular to a closed-loop atomic interference inertia measurement method and device.
Background
With the development of quantum precision measurement technology, an atomic interference inertia measurement technology appears, which can measure the linear acceleration and the rotation angular rate of a target carrier, and further can obtain the position and the motion attitude of the target carrier through calculation based on the linear acceleration and the rotation angular rate of the target carrier. Therefore, the method has wide application prospect in the fields of inertial navigation, basic scientific research, engineering technology and the like.
In the conventional technology, a conventional Raman-Mach-Zehnder (Raman-Mach-Zehnder) optical pulse atomic interference inertial measurement system uses Raman laser to perform coherent control on an atomic beam or an atomic cloud cluster, and obtains an interference signal through operations of splitting, reflecting, combining and detecting. And summing or differentiating the interference phase shift of the interference signal, and solving inertial data of the target carrier, such as linear acceleration, rotation angular rate and the like. The interference phase shift refers to a phase change amount of an interference signal obtained by signal detection of an atomic beam.
However, the interference signal exhibits a periodic variation of the cosine function. In the conventional technology, a cross-cycle ambiguity problem exists, that is, it cannot be determined in which half cycle the interference phase shift is, so that in the conventional technology, the default interference phase shift is within the minimum half cycle (0, pi), and then the current interference phase is obtained according to the interference phase shift, and further the linear acceleration of the target carrier and the rotation angular rate of the target carrier are calculated. When the interference phase shift exceeds (0, pi), the linear acceleration of the target carrier and the rotation angular rate of the target carrier calculated based on the interference phase shift are not true values. That is, when the interference phase shift exceeds (0, π), the linear acceleration of the object carrier, the rotation angular rate of the object carrier cannot be directly measured.
Disclosure of Invention
In view of the above, it is necessary to provide an atomic interference inertial measurement method, an apparatus, a computer device, a computer readable storage medium, and a computer program product, which can calculate the linear acceleration and the rotational angular rate of the target carrier by using the compensation parameters of the raman laser pair.
In a first aspect, the present application provides an atomic interferometric inertial measurement method. The method is applied to an atomic interference inertia measurement system on a target carrier, the atomic interference inertia measurement system comprises an atomic source and a laser device, and the method comprises the following steps:
generating an atomic beam pair by the atomic source and a raman laser pair by the laser device; the Raman laser pair interacts with the atomic beam pair, so that the atomic beam pair respectively generates interference;
generating a detection laser pair by the laser device; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
acquiring the target light pair to be measured to obtain a target interference signal pair, and determining a signal sum value and a signal difference value according to the target interference signal pair and an interference signal expression;
adjusting the compensation parameters of the Raman laser pair through a preset first adjustment strategy, and generating the Raman laser pair by the laser device until the determined signal sum value and the determined signal difference value are both zero;
and under the condition that the signal sum value and the signal difference value are zero, determining the linear acceleration of the target carrier and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the carrier.
In one embodiment, the raman laser pair comprises a first raman laser pair, a second raman laser pair, a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; the compensation parameters comprise phase compensation parameters and frequency compensation parameters; the adjusting the compensation parameter of the raman laser pair through a preset first adjustment strategy comprises:
adjusting the phase difference of the two Raman lasers in the second Raman laser pair through the phase compensation parameter;
and respectively adjusting the frequency of the Raman laser in the first Raman laser pair and the frequency of the Raman laser in the third Raman laser pair through the frequency compensation parameter.
In one embodiment, the method further comprises:
under the condition that the signal sum value and the signal difference value are both zero, determining a third corresponding relation between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression;
determining a first corresponding relation between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relation and the corresponding relation between the linear acceleration of the target carrier and the interference phase;
and determining a second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier according to the third corresponding relation and the corresponding relation between the rotation angle rate of the target carrier and the interference phase.
In one embodiment, the method further comprises:
generating an initial Raman laser pair through the laser device based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference so as to obtain an initial interference atomic beam pair;
generating a detection laser pair by the laser device; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial light pair to be detected;
collecting the initial light pair to be measured to obtain an initial interference signal pair;
according to the initial interference signal pair, the preset second compensation parameter, the preset linear acceleration of the target carrier and the preset rotation angle rate of the target carrier, obtaining a direct current deviation value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase;
and constructing the interference signal expression based on the direct current deviation value, the amplitude value and the initial phase difference interference phase.
In one embodiment, the method further comprises:
acquiring an interference signal expression corresponding to each interference signal in the target interference signal pair;
summing the two interference signal expressions to obtain a signal and an expression;
and performing difference processing on the two interference signal expressions to obtain a signal difference expression.
In a second aspect, the present application further provides an atomic interferometric inertial measurement system. The system comprises an atomic source, a laser device, a generating device, a detecting device and a control device; the control device is electrically connected with the atom source, the laser device and the detection device respectively; the atom source is placed in the generating device; wherein:
the atom source is used for generating atom beam pairs;
the laser device is used for generating detection laser and generating a Raman laser pair according to the compensation parameter; the Raman laser pair interacts with the atomic beam pair, so that the atomic beam pair respectively generates interference; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
the generating device is used for providing a space where the Raman laser pair interacts with the atomic beam pair and a space where the detection laser pair interacts with the interfered atomic beam pair;
the detection device is used for collecting the target light pair to be detected to obtain a target interference signal pair and sending the target interference signal pair to the control device;
the control device is used for determining a signal sum value and a signal difference value according to the target interference signal pair and the interference signal expression; and the Raman laser processing device is also used for determining the linear acceleration and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier under the condition that the signal sum value and the signal difference value are both zero.
In one embodiment, the raman laser pair comprises a first raman laser pair, a second raman laser pair, a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; the compensation parameters comprise phase compensation parameters and frequency compensation parameters; the system comprises:
the control device is used for adjusting the compensation parameters and sending the compensation parameters to the laser device;
the laser device is used for adjusting the phase difference of the two Raman lasers in the second Raman laser pair according to the phase compensation parameter; and the frequency compensation module is further used for respectively adjusting the frequency of the Raman laser in the first Raman laser pair and the frequency of the Raman laser in the third Raman laser pair according to the frequency compensation parameter.
In one embodiment, the system further comprises:
the control device is used for determining a third corresponding relation between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression under the condition that the signal sum value and the signal difference value are both zero;
the control device is further configured to determine a first corresponding relationship between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relationship and the corresponding relationship between the linear acceleration of the target carrier and the interference phase;
and the control device is further configured to determine a second corresponding relationship between the compensation parameter and the rotation angular rate of the target carrier according to the third corresponding relationship and the corresponding relationship between the rotation angular rate of the target carrier and the interference phase.
In one embodiment, the system further comprises:
the laser device is used for generating an initial Raman laser pair based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference so as to obtain an initial interference atomic beam pair;
the laser device is also used for generating a detection laser pair; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial to-be-detected optical pair;
the detection device is used for collecting the initial light pair to be detected to obtain an initial interference signal pair;
the control device is used for obtaining a direct current deviation value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase according to the initial interference signal pair, the preset second compensation parameter, the preset linear acceleration of the target carrier and the preset rotation angular rate of the target carrier;
the control device is further configured to construct the interference signal expression based on the direct current offset value, the amplitude value, and the initial phase difference interference phase.
In one embodiment, the system further comprises:
the control device is used for acquiring an interference signal expression corresponding to each interference signal in the target interference signal pair;
the control device is also used for summing the two interference signal expressions to obtain a signal and an expression;
and the control device is also used for carrying out difference processing on the two interference signal expressions to obtain a signal difference expression.
In a third aspect, the application also provides an atomic interference inertia measurement device. The device comprises:
the first generation module is used for generating an atom beam pair through an atom source and generating a Raman laser pair through a laser device; the Raman laser pair interacts with the atomic beam pair, so that the atomic beam pair generates interference respectively;
the second generation module is used for generating a detection laser pair through the laser device; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
the first acquisition module is used for acquiring the target light pair to be detected to obtain a target interference signal pair, and determining a signal sum value and a signal difference value according to the target interference signal pair and an interference signal expression;
the adjusting module is used for adjusting the compensation parameters of the Raman laser pair through a preset first adjusting strategy, and the laser device generates the Raman laser pair until the determined signal sum value and the determined signal difference value are zero;
and the determining module is used for determining the linear acceleration of the target carrier and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier under the condition that the sum of the signals and the difference of the signals are both zero.
In one embodiment, the raman laser pair comprises a first raman laser pair, a second raman laser pair, and a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; the adjustment module is configured to:
adjusting the phase difference of the two Raman lasers in the second Raman laser pair according to the phase compensation parameter;
and respectively adjusting the frequency of the first Raman laser in the first Raman laser pair and the frequency of the third Raman laser in the third Raman laser pair through the frequency compensation parameter.
In one embodiment, the determining module is further configured to:
under the condition that the signal sum value and the signal difference value are both zero, determining a third corresponding relation between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression;
determining a first corresponding relation between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relation and the corresponding relation between the linear acceleration of the target carrier and the interference phase;
and determining a second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier according to the third corresponding relation and the corresponding relation between the rotation angle rate of the target carrier and the interference phase.
In one embodiment, the apparatus further comprises:
the third generation module is used for generating an initial Raman laser pair through the laser device based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference so as to obtain an initial interference atomic beam pair;
the fourth generation module is used for generating a detection laser pair through the laser device; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial light pair to be detected;
the second acquisition module is used for acquiring the initial light pair to be detected to obtain an initial interference signal pair;
the first determining module is used for obtaining a direct current deviation value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase according to the initial interference signal pair, the preset second compensation parameter, the preset linear acceleration of the target carrier and the preset rotation angular rate of the target carrier;
and the construction module is used for constructing the interference signal expression based on the direct current deviation value, the amplitude value and the initial phase difference interference phase.
In one embodiment, the system further comprises:
a second determining module, configured to obtain, for each interference signal in the target interference signal pair, an interference signal expression corresponding to the interference signal;
the third determining module is used for summing the two interference signal expressions to obtain a signal and an expression;
and the fourth determining module is used for carrying out difference processing on the two interference signal expressions to obtain a signal difference expression.
In a fourth aspect, the application also provides a computer device. The computer device comprises a memory storing a computer program and a processor implementing the steps of the first aspect when executing the computer program.
In a fifth aspect, the present application further provides a computer-readable storage medium. The computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps recited in the first aspect.
In a sixth aspect, the present application further provides a computer program product. The present application also provides a computer program product. The computer program product comprising a computer program that when executed by a processor performs the steps recited in the first aspect.
According to the atomic interference inertia measurement method, the atomic interference inertia measurement device, the atomic interference inertia measurement computer equipment, the storage medium and the computer program product, the Raman laser pair is adjusted through the compensation parameters, the sum signal and the difference signal are locked at the zero value, the corresponding relation between the compensation parameters and the linear acceleration of the target carrier and the corresponding relation between the compensation parameters and the rotation angular rate of the target carrier are obtained, and then the linear acceleration of the target carrier and the rotation angular rate of the target carrier are obtained through calculation according to the compensation parameters. That is to say, the scheme does not need to determine the interference phase by judging the interference phase shift corresponding to the target interference signal pair, so that even if the interference phase shift exceeds the preset range, the linear acceleration of the target carrier and the rotation angular rate of the target carrier can be directly obtained through the compensation parameters, and the use range of the atomic interference inertia measurement is expanded.
Drawings
FIG. 1 is a diagram of an exemplary embodiment of an atomic interferometry inertial measurement system;
FIG. 2 is a schematic diagram of atomic interference in one embodiment;
FIG. 3 is a schematic flow chart diagram of a method for atomic interferometric inertial measurement according to one embodiment;
FIG. 4 is a schematic diagram of atomic interference in another embodiment;
FIG. 5 is a flowchart illustrating a method for adjusting compensation parameters according to another embodiment;
FIG. 6 is a block diagram of an atomic interferometric inertial measurement unit according to an embodiment;
FIG. 7 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more clearly understood, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of and not restrictive on the broad application.
The atomic interference inertial measurement method provided by the embodiment of the application can be applied to a terminal, and the terminal can be a terminal which has the function of locking an interference signal value at a zero value by controlling a compensation parameter in real time through a feedback system, such as an atomic interference inertial measurement system. Fig. 1 is a diagram of an application environment of an atomic interference inertial measurement system according to an embodiment of the present disclosure, where the atomic interference inertial measurement system includes an atomic source 102, a laser device 104, a generating device 106, a detecting device 108, and a control device 110. The control device 110 is respectively electrically connected with the atom source 102, the laser device 104 and the detection device 108; the atom source 102 is placed in a generating device 106.
The control device 110 controls the atom source flux from which the atom source 102 generates a pair of two-way opposing atom beams. Wherein the atom source 102 may be a chamber that provides atoms; a two-way correlation atom beam pair is two oppositely directed atom beams. Alternatively, as shown in fig. 2, the two-way correlation atom beam pair includes an atom beam 1 and an atom beam 2. Wherein the trajectory of the atom beam 1 is from left to right and the trajectory of the atom beam 2 is from right to left. In fig. 2, a solid line indicates a trajectory of the atom beam 1, and a broken line indicates a trajectory of the atom beam 2. The arrow indicates the optical path direction of the laser light. The laser comprises a state preparation laser pair, a Raman laser pair and a detection laser pair. The state preparation laser pair comprises a state preparation laser 1 and a state preparation laser 2. The Raman laser pair comprises a first Raman laser pair, a second Raman laser pair and a third Raman laser pair. The first raman laser light pair includes a raman laser light 11 and a raman laser light 12. The second raman laser pair includes raman laser 21 and raman laser 22. The third raman laser light pair includes raman laser light 31 and raman laser light 32. The detection laser pair includes a detection laser 1 and a detection laser 2. In FIG. 2
Figure BDA0003710470090000081
Indicates the angular speed of rotation of the target carrier,
Figure BDA0003710470090000082
Representing the linear acceleration of the object carrier. The optical paths of the Raman lasers in the Raman laser pair are perpendicular to the emission direction of the two-way opposite-emission atomic beam. It can be understood that the target carrier rotation angular rate and the target carrier linear acceleration affect the interference of the atomic beam pairs. Alternatively, the category of atom beams may be continuous hot atom beams or continuous cold atom beams. The atomic species in the atomic beam may be any of alkali metals or alkaline earth metals such as potassium, rubidium, cesium, magnesium, calcium, and strontium. The atom source 102 may be an internal charge, exemplified by the atom class rubidium (Rb) 87 A chamber for Rb atoms. A heating element may also be mounted on the atom source 102. The control device 110 controls the pair of heating elements 87 Rb atoms being heated to generate a pressure 87 Rb atom vapor. 87 The Rb atom vapor exits the elongated channel at the atom source exit to form a continuous beam of thermal atoms.
The control device 110 can control the laser power, the laser frequency, and the laser phase. The laser device 104 generates laser light based on the laser power, the laser frequency, and the laser phase. The laser comprises a state preparation laser pair, a Raman laser pair and a detection laser pair. The state preparation laser pair comprises a state preparation laser 1 and a state preparation laser 2. The Raman laser pair comprises a first Raman laser pair, a second Raman laser pair and a third Raman laser pair. The first raman laser pair includes a raman laser 11 and a raman laser 12. The second raman laser pair includes raman laser 21 and raman laser 22. The second raman laser light pair includes raman laser light 31 and raman laser light 32. The detection laser pair comprises detection laser 1 and detection laser 2. Alternatively, the laser device 104 may include a laser source, a fiber splitter, and a modulator. Wherein, the laser source can be a frequency stabilized semiconductor laser; the modulator may be an acousto-optic modulator or an electro-optic modulator. Specifically, laser generated by the laser source is divided into a plurality of paths through the optical fiber beam splitter, so that a plurality of beams of laser are obtained. Each laser beam is incident on the modulator, and the control device 110 modulates the frequency and phase of the emitted laser beam by controlling the frequency and phase of the rf signal of the modulator. The modulated laser beam emitted is the laser beam emitted from the laser device 104.
The laser light generated by the laser device 104 is emitted into the generating device 106. The generating means 106 comprises, among other things, a main chamber and a vacuum pump. The main cavity is a vacuum region that provides the atomic beam pair to interact with the laser. The surface of the main cavity body can be provided with an optical window; the optical window may be transparent to the laser light. The vacuum pump is used for pumping air to enable the main cavity to generate and maintain a low-vacuum working environment. Thus, the vacuum pump can keep the atoms from oxidizing within the main chamber. The atom source 102 placed within the generating device 106 may be connected to the main chamber by a vacuum flange. Optionally, a lens barrel may be disposed between the laser device 104 and the generating device 106. The lens barrel is used for collimating and shaping laser. The lens barrel is connected to the laser device 104 through an optical fiber. Specifically, the laser device 104 generates laser light, which is input to the lens barrel through the optical fiber, and is collimated and shaped by the lens barrel, and the emergent laser light of the lens barrel is incident into the main cavity through the optical window on the main cavity. In the main cavity, the atomic beam in the atomic beam pair firstly reacts with the corresponding state preparation laser in the incident laser to obtain an atomic beam pair with a preset energy level; then, the atomic beams in the atomic beam pairs with preset energy levels act with the corresponding three pairs of Raman laser pairs in sequence to generate interference, and the interfered atomic beam pairs are obtained; and finally, enabling the atomic beams in the interfered atomic beam pairs to act on the corresponding detection laser in the detection laser pairs to obtain the target light pair to be detected.
The detection device 108 collects a target pair of lights to be detected and converts the target pair of lights to be detected to obtain a target interference signal pair. The detection means 108 sends the target interference signal pair to the control means 110. The detection device 108 includes a photosensitive element and a signal processing circuit. Optionally, the detection device 108 may further include a collection lens. The collecting lens is placed at the front end of the photosensitive element. The light-sensitive element may be a photoelectric conversion device such as a photomultiplier tube or a photodiode. Specifically, the photosensitive element collects a target light pair to be measured, and performs photoelectric conversion on the target light pair to be measured to obtain a current signal pair corresponding to the target light pair to be measured. And the signal processing circuit receives and processes the current signal pair to obtain a target interference signal pair. The processing performed by the signal processing circuit comprises current-voltage conversion, filtering amplification and analog-to-digital conversion.
The control device 110 calculates the normalized interference signal pair according to the target interference signal pair and the interference signal expression. The control device 110 sums two normalized interference signals in the normalized interference signal pair to obtain a signal sum; and performing difference calculation on the two normalized interference signals in the normalized interference signal pair to obtain a signal difference. The control device 110 adjusts the compensation parameters of the raman laser pair according to the signal sum and the signal difference. The control device 110 calculates the frequency and phase of the raman laser pair based on the adjusted compensation parameters of the raman laser pair, and transmits the frequency and phase of the raman laser pair to the laser device 104. The control device 110 includes a computer, analog and digital I/O interfaces, an analog/digital conversion interface, a digital/analog conversion interface, a serial communication interface, and control software.
The laser device 104 generates a corresponding new raman laser pair based on the frequency and phase of the raman laser pair fed back from the control device 110. The atomic beam pair and the new raman laser pair act in the generating device 106 to generate interference, and a new target interference signal pair is obtained. The detection device 108 collects new pairs of target interference signals and continues to feed back to the control device 110. The control device 110 performs calculation processing on the new target interference signal pair to obtain a signal sum and a signal difference. In the above-mentioned closed-loop working process composed of the laser device 104, the generating device 106, the detecting device 108, the controlling device 110 and the laser device 104, until the signal sum and the signal difference obtained by the controlling device 110 are both zero, the controlling device 110 calculates the interference phase according to the compensation parameter of the current raman laser pair, the current signal sum, the current signal difference, the signal sum expression and the signal difference expression. The control device 110 calculates the linear acceleration of the target carrier and the rotation angular rate of the target carrier according to the interference phase. It will be appreciated that the atomic interferometric inertial measurement system will remain operational as long as it is not shut down. That is to say, the atomic interference inertial measurement system can acquire the linear acceleration of the target carrier and the rotation angular rate of the target carrier in real time.
In one embodiment, as shown in fig. 3, an atomic interferometry inertial measurement method is provided, which is described by taking the atomic interferometry inertial measurement system in fig. 1 as an example, and includes the following steps:
step 302, an atom beam pair is generated by an atom source and a raman laser pair is generated by a laser device.
In the embodiment of the application, the atom interference inertia measurement system generates atom beam pairs through an atom source 102. The laser device 104 generates a bi-directionally opposed raman laser pair, a mode preparation laser pair. Specifically, the control device 110 controls the atom source flux, and the atom source 102 generates a pair of atom beams which are directed in two directions according to the atom source flux. The control device 110 can control the laser frequency and the laser phase by adjusting the compensation parameters. The laser device 104 generates laser light based on the laser power, the laser frequency, and the laser phase. Wherein, the laser comprises a state preparation laser pair and a Raman laser pair. The Raman laser pair is used for interacting with the atomic beams in the atomic beam pair to enable the atomic beams to generate Mach-Zehnder interference. The raman laser pairs include three pairs of raman laser pairs. Specifically, the atomic beams in the atomic beam pair respectively and sequentially react with the three pairs of raman laser pairs. In order to distinguish different raman laser pairs, the second raman laser pair that reacts with the atomic beam is named as a second raman laser pair. The other raman laser pairs are respectively named as a first raman laser pair and a third raman laser pair. The Raman laser pair has two frequency components, and the second Raman laser pair has a frequency component of ω 1 And omega 2 The first Raman laser pair has a frequency component of ω 1 And (ω) 2 +2πδf π/2 ) The third Raman laser pair has a frequency component of ω 1 And (ω) 2 -2πδf π/2 ). Wherein, δ f π/2 Is a frequency compensation parameter among the compensation parameters. The phase difference between the two Raman lasers in the second Raman laser pair is
Figure BDA0003710470090000111
The phase difference between the two Raman lasers in the first Raman laser pair is
Figure BDA0003710470090000112
The phase difference between the two Raman lasers in the third Raman laser pair is
Figure BDA0003710470090000113
Where δ Φ is a phase compensation parameter among the compensation parameters.
Specifically, as shown in fig. 2, the frequency of the raman laser light 21 in the second raman laser pair is ω 1 The frequency of the Raman laser 22 is ω 2 (ii) a The frequency of the raman laser light 11 in the first raman laser pair is ω 1 The frequency of the Raman laser 12 is (ω) 2 +2πδf π/2 ) (ii) a The frequency of the raman laser 31 in the third raman laser pair is ω 1 The frequency of the Raman laser 32 is (ω) 2 -2πδf π/2 ). Frequency omega 1 Sum frequency omega 2 The difference is equal to the difference between the ground state hyperfine energy level frequency differences of the atoms in the pair of atomic beams plus the recoil frequency shift of the stimulated raman transition. Firstly, the atomic beam 1 reacts with the state preparation laser 1 to obtain the atomic beam 1 with a specific energy level; the atomic beam 1 with a specific energy level sequentially acts on a first Raman laser pair, a second Raman laser pair and a third Raman laser pair to generate Raman-Mach-Zehnder interference to obtain an interfered atomic beam 1; the interfered atomic beam 1 and the detection laser 1 react to generate the target fluorescence 1 to be detected. The atomic beam 2 firstly reacts with the state preparation laser 2 to obtain the atomic beam 2 with a specific energy level; the atomic beam 2 with a specific energy level sequentially acts with a first Raman laser pair, a second Raman laser pair and a third Raman laser pair to generate Raman-Mach-Zehnder interference to obtain an interfered atomic beam 2; the interfered atomic beam 2 and the detection laser 2 act to generate target fluorescence 2 to be detected.
As shown in fig. 4, the frequency components of the raman laser light 21 and the raman laser light 22 in the second raman laser pair may be ω 1 And ω 2 (ii) a The frequency components of the raman laser light 11 and the raman laser light 12 in the first raman laser pair are ω 1 And (ω) 2 +2πδf π/2 ) (ii) a The frequencies of the raman laser beam 31 and the raman laser beam 32 in the third raman laser pair are ω 1 And (ω) 2 -2πδf π/2 ). Frequency omega 1 Sum frequency omega 2 The difference is equal to the sum of the difference between the ground state hyperfine level frequency of the atom plus the recoil frequency shift plus the raman transition doppler shift. The recoil frequency shift is the recoil frequency shift of the stimulated Raman transition of the atoms, and the Raman transition Doppler frequency shift is caused by an included angle between a Raman laser pair and the vertical direction of the atomic beam. In fig. 4, a solid line indicates a trajectory of the atom beam 1, and a broken line indicates a trajectory of the atom beam 2. The arrow indicates the optical path direction of the laser light. The laser comprises a state preparation laser pair, a Raman laser pair and a detection laser pair. The state preparation laser pair comprises a state preparation laser 1 and a state preparation laser 2. The Raman laser pair comprises a first Raman laser pair, a second Raman laser pair and a third Raman laser pair. The first raman laser pair includes a raman laser 11 and a raman laser 12. The second raman laser light pair includes raman laser light 21 and raman laser light 22. The third raman laser pair includes raman laser 31 and raman laser 32. The detection laser pair comprises detection laser 1 and detection laser 2. In FIG. 4
Figure BDA0003710470090000121
Indicates the angular speed of rotation of the target carrier,
Figure BDA0003710470090000122
Representing the linear acceleration of the object carrier. It can be understood that the target carrier rotation angular rate and the target carrier linear acceleration affect the interference of the atomic beam pairs. Wherein, the light paths of the Raman laser pairs and the emission direction of the two-way correlation atomic beam form a certain included angle. The processes of the beam pair and the preparation laser pair, the raman laser pair and the detection laser pair in fig. 4 are similar to those in fig. 2, and are not described again here. It is understood that fig. 2 and 4 are only used for illustrating the preparation, interference and detection processes, and do not limit the preparation, interference and detection processes.
And step 304, generating a detection laser pair by a laser device.
In the embodiment of the present application, the atomic interference inertia measurement system generates the detection laser pair by the laser device 104. Specifically, the control device 110 may control the frequency of the detection laser pair and the phase of the detection laser pair. The laser device 104 generates a detection laser beam pair based on the frequency of the detection laser beam pair and the phase of the detection laser beam pair. And the detection laser pair and the interfered atomic beam pair act to generate a target light pair to be detected.
And step 306, collecting the target light pairs to be measured to obtain target interference signal pairs, and determining a signal sum value and a signal difference value according to the target interference signal pairs and the interference signal expression.
And the target light to be measured in the target light to be measured pair comprises detection laser or fluorescence after the target light to be measured and the atomic beam are acted. The fluorescence is light excited by the laser beam to be detected. And when the absorption method is adopted to detect the target light pair to be detected, the target light to be detected in the target light pair to be detected is the detection laser after the target light to be detected reacts with the atomic beam. And when the target light pair to be detected is detected by adopting a laser-induced fluorescence method, the target light to be detected in the target light pair to be detected is fluorescence.
In the embodiment of the present application, the atomic interference inertia measurement system collects a target pair of to-be-measured light through the detection device 108, and converts the target pair of to-be-measured light to obtain a target interference signal pair. The detection means 108 sends the target interference signal pair to the control means 110. The control device 110 calculates a normalized interference signal pair value according to the current compensation parameter, the target interference signal pair and the interference signal expression. The control device 110 sums two normalized interference signal values in the normalized interference signal pair to obtain a signal sum value; and (4) performing difference calculation on two normalized interference signal values in the normalized interference signal pair to obtain a signal difference value.
The expression of the interference signal is shown in the following formulas (1) and (2).
Figure BDA0003710470090000123
Figure BDA0003710470090000124
Wherein, S' 1 Is the normalized interference signal 1, S' 2 Is the normalized interference signal 2, S 1 Is the interference signal 1, S in the target interference signal pair 2 Is the interference signal 2, A in the target interference signal pair 1 Is the DC offset value, A, of the interference signal 1 2 Is the DC offset value, C, of the interference signal 2 1 Is the amplitude value of the interference signal 1, C 2 Is the amplitude value of the interference signal 2, phi a Is the interference phase caused by the linear acceleration of the object carrier,
Figure BDA0003710470090000131
is the interference phase caused by the total phase difference of the raman laser pair,
Figure BDA0003710470090000132
is the interference phase caused by the initial phase difference of the Raman laser pair without delta phi, wherein the delta phi is a phase compensation parameter Ω Is the interference phase, δ f, caused by the angular rate of rotation of the object carrier π/2 Is a frequency compensation parameter and T is the time required for an atom to move between two adjacent pairs of raman light pairs.
Wherein,
Figure BDA0003710470090000133
Figure BDA0003710470090000134
is the phase difference of the two raman lasers in the first raman laser pair,
Figure BDA0003710470090000135
is the phase difference of the two raman lasers in the second raman laser pair,
Figure BDA0003710470090000136
two Raman lasers in the second Raman laser pair do not add phase difference of delta phi, delta phi is a phase compensation parameter in the compensation parameters,
Figure BDA0003710470090000137
is the phase difference of the two raman lasers in the third raman laser pair.
And 308, adjusting the compensation parameter of the Raman laser pair through a preset first adjustment strategy, and returning to the step of generating the Raman laser pair through the laser device based on the compensation parameter until the determined signal sum value and the determined signal difference value are both zero.
The preset first adjustment strategy is an adjustment strategy 1 or an adjustment strategy 2. It can be understood that, when step 308 is executed, the preset first adjustment policy may be adjustment policy 1 or adjustment policy 2, and a specific selection manner of the adjustment policy may be determined according to actual requirements, which is not limited in the embodiment of the present application. The compensation parameters comprise phase compensation parameters and frequency compensation parameters.
In the embodiment of the present application, the control device 110 determines whether the sum of the signals and the difference of the signals are both 0. If so, step 310 is performed. If not, the control device 110 adjusts the compensation parameter of the raman laser pair according to a preset first adjustment strategy, and returns to the step of generating the raman laser pair by the laser device based on the compensation parameter until the sum of the signals corresponding to the detected interference signals is zero.
Specifically, in the case that the preset first adjustment strategy is adjustment strategy 1, the control device 110 adjusts the frequency compensation parameter, and based on the frequency compensation parameter, returns to the step of generating the raman laser pair by the laser device until the signal difference corresponding to the detected interference signal is zero. The control device 110 readjusts the phase compensation parameter, and based on the phase compensation parameter, returns to the step of generating the raman laser pair by the laser device until the sum of the signals corresponding to the detected interference signals is zero.
In the case where the preset first adjustment strategy is adjustment strategy 2, the control device 110 adjusts the frequency compensation parameter, and based on the frequency compensation parameter, returns to the step of generating the raman laser pair by the laser device until the sum of the signals corresponding to the detected interference signals is zero. The control device 110 readjusts the phase compensation parameter, and based on the phase compensation parameter, returns to the step of generating the raman laser pair by the laser device until the signal difference corresponding to the detected interference signal is zero.
And 310, under the condition that the signal sum and the signal difference are zero, determining the linear acceleration and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier.
In this embodiment of the application, under the condition that the signal sum and the signal difference are both zero, the control device 110 substitutes the compensation parameter of the raman laser pair into the first corresponding relationship between the compensation parameter and the linear acceleration of the target carrier, and calculates to obtain the linear acceleration of the target carrier; and substituting the compensation parameters of the Raman laser pair into a second corresponding relation between the compensation parameters and the rotation angular rate of the target carrier, and calculating to obtain the rotation angular rate of the target carrier.
Specifically, in the case that the preset first adjustment strategy is adjustment strategy 1, the control device 110 calculates the linear acceleration of the target carrier according to the phase compensation parameter, the preset interference phase caused by the initial phase difference of the raman laser pair when δ Φ is not added, the preset effective wave vector of the raman laser, and the time required by the movement of the preset atom between two adjacent pairs of raman light pairs. The control device 110 calculates the rotation angular rate of the target carrier according to the frequency compensation parameter, the preset effective wave vector of the raman laser, and the preset distance between two adjacent pairs of raman laser pairs. The first correspondence relationship is shown in the following formula (3), and the second correspondence relationship is shown in the following formula (4).
Figure BDA0003710470090000141
Figure BDA0003710470090000142
Where a is the linear acceleration of the target carrier, k eff Is the effective wave vector of the Raman laser, and T is the atom between two adjacent pairs of Raman light pairsThe time required for the exercise is,
Figure BDA0003710470090000143
is the interference phase caused by the initial phase difference of the Raman laser pair without delta phi, wherein the delta phi is a phase compensation parameter, the omega is the rotation angle rate of the target carrier, and the phi is Ω Is the interference phase caused by the rotation angular rate of the target carrier, L is the distance between two adjacent pairs of Raman laser pairs, δ f π/2 Is a frequency compensation parameter.
Specifically, in the case that the preset first adjustment strategy is the adjustment strategy 2, the control device 110 calculates the linear acceleration of the target carrier according to the phase compensation parameter, the preset interference phase caused by the initial phase difference of the raman laser pair when δ Φ is not added, the preset effective wave vector of the raman laser, and the time required by the movement of the preset atom between two adjacent pairs of raman light pairs. The control device 110 calculates the rotation angular rate of the target carrier according to the frequency compensation parameter, the preset effective wave vector of the raman laser, the preset time required for the atoms to move between the two adjacent pairs of raman light pairs, and the preset distance between the two adjacent pairs of raman laser pairs. The first correspondence relationship is shown in the following formula (5), and the second correspondence relationship is shown in the following formula (6).
Figure BDA0003710470090000151
Figure BDA0003710470090000152
In the atomic interference inertia measurement method, the Raman laser pair can be adjusted through the compensation parameter, the signal sum value and the signal difference value are simultaneously locked at the zero value, and then the linear acceleration of the target carrier and the rotation angle rate of the target carrier are calculated according to the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier. And adjusting the Raman laser pair through the compensation parameters, locking the signal sum value and the signal difference value at a zero value, obtaining the corresponding relation between the compensation parameters and the linear acceleration of the target carrier and the corresponding relation between the compensation parameters and the rotation angular rate of the target carrier, and further calculating the linear acceleration of the target carrier and the rotation angular rate of the target carrier according to the compensation parameters. That is to say, the scheme does not need to determine the interference phase by judging the interference phase shift corresponding to the target interference signal pair, so that even if the interference phase shift exceeds the preset range, the linear acceleration of the target carrier and the rotation angular rate of the target carrier can be directly obtained through the compensation parameters, and the use range of the atomic interference inertia measurement is expanded.
In one embodiment, as shown in fig. 5, the raman laser pair includes a first raman laser pair, a second raman laser pair, a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; adjusting compensation parameters of the Raman laser pair through a preset first adjustment strategy comprises the following steps:
and 502, adjusting the phase difference of the two Raman lasers in the second Raman laser pair through the phase compensation parameter.
In order to distinguish different raman laser pairs conveniently, the second raman laser pair interacting with the atomic beam pair is named as a second raman laser pair. The other raman laser pairs are respectively named as a first raman laser pair and a third raman laser pair. The phase difference between the two Raman lasers in the second Raman laser pair is
Figure BDA0003710470090000153
Figure BDA0003710470090000154
The two Raman lasers in the second Raman laser pair do not add the phase difference of delta phi, and the delta phi is a phase compensation parameter in the compensation parameters.
In this embodiment, the control device 110 calculates a phase compensation parameter by using a proportional-integral-derivative (PID) control algorithm according to the current signal sum and the signal difference variation. The control device 110 adjusts the phase compensation parameter to obtain the adjusted phase difference between the two raman laser beams in the second raman laser pair.
And step 504, respectively adjusting the frequency of the Raman laser in the first Raman laser pair and the frequency of the Raman laser in the third Raman laser pair through the frequency compensation parameter.
Wherein the first Raman laser pair has a frequency component of ω 1 And (ω) 2 +2πδf π/2 ) The third Raman laser pair has a frequency component of ω 1 And (omega) 2 -2πδf π/2 )。
In this embodiment, the control device 110 calculates a frequency compensation parameter by using a proportional-integral-derivative (PID) control algorithm according to the current signal sum and the signal difference variation. The control device 110 adjusts the frequency compensation parameter to obtain the adjusted frequency of the raman laser in the first raman laser pair and the adjusted frequency of the raman laser in the third raman laser pair.
In this embodiment, the atomic interference inertial measurement system adjusts the phase and frequency of the raman laser pair by adjusting the compensation parameters. In this way, the closed-loop atomic interference inertial measurement system can generate different Raman lasers by adjusting the compensation parameters.
In one embodiment, the method further comprises:
under the condition that the signal sum value and the signal difference value are zero, determining a third corresponding relation between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression; determining a first corresponding relation between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relation and the corresponding relation between the linear acceleration of the target carrier and the interference phase; and determining a second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier according to the third corresponding relation and the corresponding relation between the rotation angle rate of the target carrier and the interference phase.
The correspondence between the linear acceleration of the target carrier and the interference phase is shown in the following formula (7), and the correspondence between the rotation angular rate of the target carrier and the interference phase is shown in the following formula (8).
φ a =k eff aT 2 ((7)
Figure BDA0003710470090000161
Wherein phi is a Is the interference phase, k, caused by the linear acceleration of the target carrier eff Is the effective wave vector of the Raman laser, a is the linear acceleration of the target carrier, T is the time required by the atoms to move between two adjacent pairs of Raman light pairs, delta phi is a phase compensation parameter, phi Ω Is the interference phase caused by the rotation angular velocity of the target carrier, omega is the rotation angular velocity of the target carrier, L is the distance between two adjacent pairs of raman laser pairs, and v is the longitudinal movement velocity of the atom (T ═ L/v).
In the embodiment of the present application, in the signal sum
Figure BDA0003710470090000162
Figure BDA0003710470090000163
Sum signal difference
Figure BDA0003710470090000164
In the case of all zeros, the control device 110 determines the preset first adjustment strategy category to be used. If the preset first adjustment strategy category is adjustment strategy 1, the control device 110 obtains
Figure BDA0003710470090000171
Figure BDA0003710470090000172
The control device 110 is based on
Figure BDA0003710470090000173
Is calculated to obtain
Figure BDA0003710470090000174
Further, a correspondence relationship between the phase compensation parameter and the linear acceleration interference phase is obtained as shown in the following equation (9). The control means 110 are based on sin (phi) Ω -4πδf π/2 T) is 0, and phi is obtained by calculation Ω -4πδf π/2 T is 0, and the correspondence between the frequency compensation parameter and the rotation angle rate is obtained as shown in the following equation (10). The third corresponding relation between the compensation parameter and the interference phase comprises a corresponding relation between the phase compensation parameter and the linear acceleration interference phase, and a corresponding relation between the frequency compensation parameter and the rotation angular rate.
Figure BDA0003710470090000175
φ Ω =4πδf π/2 T (10)
The control device 110 calculates a first corresponding relationship between the compensation parameter and the linear acceleration of the object carrier according to the formula (9) and the formula (7), as shown in the following formula (3). The control device 110 calculates a second corresponding relationship between the compensation parameter and the rotation angular rate of the target carrier according to the formula (10) and the formula (8), as shown in the following formula (4).
Figure BDA0003710470090000176
Figure BDA0003710470090000177
In the case where the preset first adjustment strategy category is adjustment strategy 2, the control device 110 obtains cos (phi) Ω -4πδf π/2 T)=0、
Figure BDA0003710470090000178
The control device 110 is based on cos (phi) Ω -4πδf π/2 T) is equal to 0, and is obtained by calculation
Figure BDA0003710470090000179
Further, the following formula (11) is obtained; according to
Figure BDA00037104700900001710
Is calculated to obtain
Figure BDA00037104700900001711
Further, the following equation (12) is obtained.
Figure BDA00037104700900001712
Figure BDA00037104700900001713
The control device 110 calculates a first corresponding relationship between the compensation parameter and the linear acceleration of the object carrier according to the formula (12) and the formula (8), as shown in the following formula (5). The control device 110 calculates a second corresponding relationship between the compensation parameter and the rotation angular rate of the target carrier according to the formula (11) and the formula (7), as shown in the following formula (6).
Figure BDA0003710470090000181
Figure BDA0003710470090000182
In the embodiment, the corresponding relation between the compensation parameter and the linear acceleration of the target carrier is obtained through the corresponding relation between the compensation parameter and the interference phase and the corresponding relation between the linear acceleration of the target carrier and the interference phase; and obtaining the corresponding relation between the compensation parameter and the rotating angular rate of the target carrier through the corresponding relation between the compensation parameter and the interference phase and the corresponding relation between the rotating angular rate of the target carrier and the interference phase. Therefore, the scheme can directly determine the linear acceleration of the target carrier and the rotation angular rate of the target carrier through the compensation parameters, and the interference phase does not need to be determined by judging the interference phase shift of the target interference signal to the corresponding interference phase. That is, even if the interference phase shift exceeds the (0, pi) range, the linear acceleration of the object carrier and the rotation angular rate of the object carrier can be measured, and the use range of the atomic interference inertia measurement is expanded.
In one embodiment, the method further comprises:
generating an initial Raman laser pair through a laser device based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam pair to generate interference so as to obtain an initial interference atomic beam pair; generating a detection laser pair by a laser device; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial light pair to be detected; acquiring an initial light pair to be detected to obtain an initial interference signal pair; according to the initial interference signal pair, a preset second compensation parameter, a preset linear acceleration of the target carrier and a preset rotation angle rate of the target carrier, obtaining a direct current offset value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase; and constructing an interference signal expression based on the direct current deviation value, the amplitude value and the initial phase difference interference phase.
In the embodiment of the present application, under the situation that the atomic interference inertia measurement system is placed at the preset linear acceleration and the preset rotation angular rate of the target carrier, the control device 110 adjusts the frequency compensation parameter to be 0, and adjusts the phase compensation parameter for multiple times. The processing procedure of the subsequent step of adjusting the phase compensation parameter each time is similar, and the following description will take one processing procedure as an example. The control device 110 sends the adjusted phase compensation parameter and frequency compensation parameter to the laser device 104, and the laser device generates a raman laser pair according to the phase compensation parameter and the frequency compensation parameter. The Raman laser pair interacts with the atomic beam of the as-prepared laser to generate Raman-Mach-Zehnder interference. The laser device 102 emits detection laser to act on the interfered atomic beam pair to generate a target light pair to be detected. The detection device 108 converts the target light pair to be detected to obtain an initial interference signal pair, and sends the initial interference signal pair to the control device 110. It is understood that after a plurality of times of the above processing, the control device 110 can obtain a plurality of sets of phase compensation parameters and corresponding pairs of initial interference signals. For each interference signal, the control device 110 expresses (i.e. formula (1) and formula (2)) according to the interference signal, a preset linear acceleration of the target carrier, and a preset rotational angular velocityAnd calculating to obtain a direct current deviation value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase value. Wherein the initial phase difference interference phase is the interference phase caused by the initial phase difference of the Raman laser pair without adding delta phi (i.e. the interference phase is generated by adding delta phi to the Raman laser pair
Figure BDA0003710470090000191
). The control device 110 inputs the dc offset value, the amplitude value, and the initial phase difference interference phase value into a preset interference signal expression, and constructs an initial interference signal expression, thereby obtaining each initial interference signal expression. The preset interference signal expression is a formula (13) and a formula (14) of a direct current offset value, an amplitude value and an initial phase difference interference phase value or an unknown value, and the interference signal initial expression is shown as the following formula (13) and the formula (14).
In this embodiment, under the scenario of a preset linear acceleration and a preset rotation angular rate of the target carrier, the frequency compensation parameter is adjusted to be 0 by the control device 110, the phase compensation parameter is adjusted for multiple times, a direct current offset value corresponding to the interference signal, an amplitude value corresponding to the interference signal, and an initial phase difference interference phase are obtained through calculation, and an initial expression of the interference signal is constructed based on the above parameters. Thus, preparation is made for subsequent normalization processing of the interference signal according to the DC offset value and the amplitude value. Meanwhile, an initial phase difference interference phase value is calibrated for a first corresponding relation between a subsequent compensation parameter and the linear acceleration of the target carrier.
In one embodiment, the method further comprises:
acquiring an interference signal expression corresponding to the interference signal aiming at each interference signal in the target interference signal pair; summing the two interference signal expressions to obtain a signal and an expression; and performing difference processing on the two interference signal expressions to obtain a signal difference expression.
In this embodiment of the application, for each interference signal in the target interference signal pair, the control device 110 performs normalization processing on the initial expression of the interference signal according to the direct current offset value corresponding to the interference signal and the amplitude value corresponding to the interference signal, so as to obtain the expression of the interference signal. The initial expression of the interference signal is shown in the following formulas (13) and (14).
Figure BDA0003710470090000192
Figure BDA0003710470090000193
Wherein S is 1 Is the interference signal 1, S in the target interference signal pair 2 Is the interference signal 2, A in the target interference signal pair 1 Is a DC offset value, A, of the interference signal 1 2 Is the DC offset value, C, of the interference signal 2 1 Is the amplitude value of the interference signal 1, C 2 Is the amplitude value of the interference signal 2, phi a Is the interference phase caused by the linear acceleration of the target carrier,
Figure BDA0003710470090000201
is the interference phase caused by the total phase difference of the raman laser pair,
Figure BDA0003710470090000202
is the interference phase caused by the initial phase difference of the Raman laser pair without delta phi, wherein the delta phi is a phase compensation parameter Ω Is the interference phase, δ f, caused by the angular rate of rotation of the object carrier π/2 Is a frequency compensation parameter and T is the time required for an atom to move between two adjacent pairs of raman light pairs.
Specifically, the normalization process may be: the control device 110 substitutes a direct current offset value corresponding to the interference signal, an amplitude value corresponding to the interference signal, and an initial expression of the interference signal into the following equations (15) and (16).
Figure BDA0003710470090000203
Figure BDA0003710470090000204
Wherein, S' 1 Is the normalized interference signal 1, S' 2 Is the normalized interference signal 2, S 1 Is the interference signal 1, S in the target interference signal pair 2 Is the interference signal 2, A in the target interference signal pair 1 Is a DC offset value, A, of the interference signal 1 2 Is the DC offset value, C, of the interference signal 2 1 Is the amplitude value of the interference signal 1, C 2 Is the amplitude value of the interference signal 2.
And (5) obtaining an interference signal expression by sorting, wherein the expression is shown in the following formula (1) and formula (2).
Figure BDA0003710470090000205
Figure BDA0003710470090000206
The control device 110 sums the expressions of the two interference signals, and calculates to obtain a signal sum expression; and (4) performing difference calculation on the two interference signal expressions to obtain a signal difference expression. Specifically, the control device 110 adds the left and right sides of the equation (1) and the equation (2) with equal signs respectively to obtain a signal and an expression, as shown in the following equation (17); the left side and the right side of the equal sign of the formula (1) and the formula (2) are respectively subtracted to obtain a signal difference expression as shown in the following formula (18).
Figure BDA0003710470090000207
Figure BDA0003710470090000208
In this embodiment, the signal sum expression and the signal difference expression are obtained by performing normalization processing and calculation processing on the interference signal initial expression. And providing a basis for obtaining a first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and a second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier based on the signal sum expression and the signal difference expression.
It should be understood that, although the steps in the flowcharts related to the embodiments as described above are sequentially displayed as indicated by arrows, the steps are not necessarily performed sequentially as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a part of the steps in the flowcharts related to the embodiments described above may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the execution order of the steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least a part of the steps or stages in other steps.
Based on the same inventive concept, the embodiment of the application also provides an atomic interference inertia measurement system for realizing the atomic interference inertia measurement method. The implementation scheme for solving the problem provided by the system is similar to the implementation scheme described in the above method, so that specific limitations in one or more embodiments of the atomic interference inertial measurement system provided below can be referred to the limitations of the atomic interference inertial measurement method in the above description, and details are not repeated herein.
In one embodiment, as shown in FIG. 1, an atomic interferometric inertial measurement system is provided. The system comprises an atom source 102, a laser device 104, a generating device 106, a detecting device 108 and a control device 110; the control device 110 is respectively electrically connected with the atom source 102, the laser device 104 and the detection device 108; the atom source 102 is placed in a generating device 106; wherein:
an atom source 102 for generating an atom beam pair;
the laser device 104 is used for generating detection laser and generating a Raman laser pair according to the compensation parameters; the Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam pair to generate interference; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
a generating device 106, configured to provide a space where the raman laser pair interacts with the atomic beam pair, and a space where the detection laser pair interacts with the interfered atomic beam pair;
the detection device 108 is configured to collect a target pair of lights to be detected, obtain a target interference signal pair, and send the target interference signal pair to the control device 110;
a control device 110, for determining a signal sum value and a signal difference value according to the target interference signal pair and the interference signal expression; and the Raman laser processing device is also used for determining the linear acceleration and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier under the condition that the signal sum value and the signal difference value are both zero.
In one embodiment, the raman laser pair comprises a first raman laser pair, a second raman laser pair, a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; the compensation parameters comprise phase compensation parameters and frequency compensation parameters; the system comprises:
a control device 110 for adjusting the compensation parameter and sending the compensation parameter to the laser device 104;
the laser device 104 is used for adjusting the phase difference of the two Raman lasers in the second Raman laser pair according to the phase compensation parameter; and the frequency compensation module is also used for respectively adjusting the frequency of the Raman laser in the first Raman laser pair and the frequency of the Raman laser in the third Raman laser pair according to the frequency compensation parameters.
In one embodiment, the system further comprises:
a control device 110, configured to determine a third corresponding relationship between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression when the signal sum value and the signal difference value are both zero;
the control device 110 is further configured to determine a first corresponding relationship between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relationship and the corresponding relationship between the linear acceleration of the target carrier and the interference phase;
the control device 110 is further configured to determine a second corresponding relationship between the compensation parameter and the rotation angular rate of the object carrier according to the third corresponding relationship and the corresponding relationship between the rotation angular rate of the object carrier and the interference phase.
In one embodiment, the system further comprises:
the laser device 104 is used for generating an initial raman laser pair based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference to obtain an initial interference atomic beam pair;
a laser device 104, further configured to generate a detection laser pair; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial to-be-detected optical pair;
the detection device 108 is used for acquiring an initial to-be-detected light pair to obtain an initial interference signal pair;
the control device 110 is configured to obtain a direct current offset value corresponding to the interference signal, an amplitude value corresponding to the interference signal, and an initial phase difference interference phase according to the initial interference signal pair, a preset second compensation parameter, a preset linear acceleration of the target carrier, and a preset rotation angle rate of the target carrier;
the control device 110 is further configured to construct an interference signal expression based on the direct current offset value, the amplitude value, and the initial phase difference interference phase.
In one embodiment, the system further comprises:
a control device 110, configured to obtain, for each interference signal in the target interference signal pair, an interference signal expression corresponding to the interference signal;
the control device 110 is further configured to sum the two interference signal expressions to obtain a signal and an expression;
the control device 110 is further configured to perform a difference calculation process on the two interference signal expressions to obtain a signal difference expression.
Based on the same inventive concept, the embodiment of the application also provides an atomic interference inertia measurement device for realizing the atomic interference inertia measurement method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the method, so that specific limitations in one or more embodiments of the atomic interference inertia measurement device provided below can be referred to the limitations of the atomic interference inertia measurement method in the above, and details are not repeated herein.
In one embodiment, as shown in fig. 6, there is provided an atomic interferometric inertial measurement device, comprising:
a first generation module 602, configured to generate an atom beam pair by the atom source 102 and a raman laser pair by the laser device 104; the Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference;
a second generating module 604 for generating a detection laser pair by the laser device 104; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
a first collecting module 606, configured to collect a target pair of light to be measured, obtain a target interference signal pair, and determine a signal sum and a signal difference according to the target interference signal pair and an interference signal expression;
an adjusting module 608, configured to adjust a compensation parameter of the raman laser pair according to a preset first adjustment policy, and based on the compensation parameter, return to the step of generating the raman laser pair by the laser device 104 until the determined signal sum and the determined signal difference are both zero;
the determining module 610 is configured to determine the linear acceleration and the rotational angle rate of the target carrier according to the compensation parameter of the raman laser pair, the first corresponding relationship between the compensation parameter and the linear acceleration of the target carrier, and the second corresponding relationship between the compensation parameter and the rotational angle rate of the target carrier when the signal sum and the signal difference are both zero.
In one embodiment, the raman laser pair comprises a first raman laser pair, a second raman laser pair, a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; the adjustment module 608 is configured to:
adjusting the phase difference of the two Raman lasers in the second Raman laser pair through the phase compensation parameter;
and respectively adjusting the frequency of the Raman laser in the first Raman laser pair and the frequency of the Raman laser in the third Raman laser pair through the frequency compensation parameters.
In one embodiment, the determining module 610 is further configured to:
under the condition that the signal sum value and the signal difference value are zero, determining a third corresponding relation between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression;
determining a first corresponding relation between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relation and the corresponding relation between the linear acceleration of the target carrier and the interference phase;
and determining a second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier according to the third corresponding relation and the corresponding relation between the rotation angle rate of the target carrier and the interference phase.
In one embodiment, the apparatus further comprises:
a third generating module, configured to generate an initial raman laser pair through the laser device 104 based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to enable the atomic beam to generate interference to obtain an initial interference atomic beam pair;
a fourth generation module, configured to generate a detection laser pair by using the laser device 104; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial light pair to be detected;
the second acquisition module is used for acquiring an initial to-be-detected light pair to obtain an initial interference signal pair;
the first determining module is used for obtaining a direct current offset value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase according to the initial interference signal pair, a preset second compensation parameter, a preset linear acceleration of the target carrier and a preset rotation angle rate of the target carrier;
and the construction module is used for constructing an interference signal expression based on the direct current offset value, the amplitude value and the initial phase difference interference phase.
In one embodiment, the system further comprises:
the second determining module is used for acquiring an interference signal expression corresponding to the interference signal aiming at each interference signal in the target interference signal pair;
the third determining module is used for summing the two interference signal expressions to obtain a signal and an expression;
and the fourth determining module is used for carrying out difference processing on the two interference signal expressions to obtain a signal difference expression.
The modules in the atomic interference inertia measurement device can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as shown in fig. 7. The computer device includes a processor, a memory, a communication interface, a display screen, and an input device connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operating system and the computer program to run on the non-volatile storage medium. The communication interface of the computer device is used for carrying out wired or wireless communication with an external terminal, and the wireless communication can be realized through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. The computer program is executed by a processor to implement an atomic interferometric inertial measurement method. The display screen of the computer equipment can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer equipment can be a touch layer covered on the display screen, a key, a track ball or a touch pad arranged on a shell of the computer equipment, an external keyboard, a touch pad or a mouse and the like.
Those skilled in the art will appreciate that the architecture shown in fig. 7 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having stored therein a computer program, the processor implementing the steps of the above-described method embodiments when executing the computer program.
In an embodiment, a computer-readable storage medium is provided, on which a computer program is stored which, when being executed by a processor, carries out the steps of the above-mentioned method embodiments.
In an embodiment, a computer program product is provided, comprising a computer program which, when executed by a processor, carries out the steps in the method embodiments described above.
It should be noted that, the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for analysis, stored data, presented data, etc.) referred to in the present application are information and data authorized by the user or sufficiently authorized by each party.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, database, or other medium used in the embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, high-density embedded nonvolatile Memory, resistive Random Access Memory (ReRAM), Magnetic Random Access Memory (MRAM), Ferroelectric Random Access Memory (FRAM), Phase Change Memory (PCM), graphene Memory, and the like. Volatile Memory can include Random Access Memory (RAM), external cache Memory, and the like. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others. The databases referred to in various embodiments provided herein may include at least one of relational and non-relational databases. The non-relational database may include, but is not limited to, a block chain based distributed database, and the like. The processors referred to in the embodiments provided herein may be general purpose processors, central processing units, graphics processors, digital signal processors, programmable logic devices, quantum computing based data processing logic devices, etc., without limitation.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, and these are all within the scope of protection of the present application. Therefore, the protection scope of the present application shall be subject to the appended claims.

Claims (10)

1. An atomic interference inertia measurement method is applied to an atomic interference inertia measurement system on a target carrier, the atomic interference inertia measurement system comprises an atomic source and a laser device, and the method comprises the following steps:
generating an atomic beam pair by the atomic source and a raman laser pair by the laser device; the Raman laser pair interacts with the atomic beam pair, so that the atomic beam pair respectively generates interference;
generating a detection laser pair by the laser device; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
acquiring the target light pair to be measured to obtain a target interference signal pair, and determining a signal sum value and a signal difference value according to the target interference signal pair and an interference signal expression;
adjusting compensation parameters of the Raman laser pair through a preset first adjustment strategy, and returning to execute the step of generating the Raman laser pair through the laser device based on the compensation parameters until the determined signal sum value and the determined signal difference value are both zero;
and under the condition that the signal sum value and the signal difference value are zero, determining the linear acceleration of the target carrier and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the carrier.
2. The method of claim 1, wherein the raman laser pair comprises a first raman laser pair, a second raman laser pair, a third raman laser pair; the atomic beam pair is used for respectively acting with the first Raman laser pair, the second Raman laser pair and the third Raman laser pair according to a preset sequence; the compensation parameters comprise phase compensation parameters and frequency compensation parameters; the adjusting the compensation parameter of the raman laser pair through a preset first adjustment strategy comprises:
adjusting the phase difference of the two Raman lasers in the second Raman laser pair through the phase compensation parameter;
and respectively adjusting the frequency of the Raman laser in the first Raman laser pair and the frequency of the Raman laser in the third Raman laser pair through the frequency compensation parameter.
3. The method of claim 1, further comprising:
under the condition that the signal sum value and the signal difference value are both zero, determining a third corresponding relation between the compensation parameter and the interference phase according to the signal sum expression and the signal difference expression;
determining a first corresponding relation between the compensation parameter and the linear acceleration of the target carrier according to the third corresponding relation and the corresponding relation between the linear acceleration of the target carrier and the interference phase;
and determining a second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier according to the third corresponding relation and the corresponding relation between the rotation angle rate of the target carrier and the interference phase.
4. The method according to any one of claims 1-3, further comprising:
generating an initial Raman laser pair through the laser device based on a preset second compensation parameter; the initial Raman laser pair is used for interacting with the atomic beam pair to obtain an initial interference atomic beam pair;
generating a detection laser pair by the laser device; the detection laser pair is used for acting with the initial interference atomic beam pair to generate an initial light pair to be detected;
collecting the initial light pair to be detected to obtain an initial interference signal pair;
according to the initial interference signal pair, the preset second compensation parameter, the preset linear acceleration of the target carrier and the preset rotation angle rate of the target carrier, obtaining a direct current deviation value corresponding to the interference signal, an amplitude value corresponding to the interference signal and an initial phase difference interference phase;
and constructing the interference signal expression based on the direct current offset value, the amplitude value and the initial phase difference interference phase.
5. The method of claim 4, further comprising:
acquiring an interference signal expression corresponding to each interference signal in the target interference signal pair;
summing the two interference signal expressions to obtain a signal and an expression;
and performing difference processing on the two interference signal expressions to obtain a signal difference expression.
6. An atomic interference inertia measurement system is characterized by comprising an atomic source, a laser device, a generating device, a detecting device and a control device; the control device is electrically connected with the atom source, the laser device and the detection device respectively; the atom source is placed in the generating device; wherein:
the atom source is used for generating atom beam pairs;
the laser device is used for generating detection laser and generating a Raman laser pair according to the compensation parameter; the Raman laser pair interacts with the atomic beam pair, so that the atomic beam pair respectively generates interference; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
the generating device is used for providing a space where the Raman laser pair interferes with the atomic beam pair and a space where the detection laser pair acts on the interfered atomic beam pair;
the detection device is used for collecting the target light pair to be detected to obtain a target interference signal pair and sending the target interference signal pair to the control device;
the control device is used for determining a signal sum value and a signal difference value according to the target interference signal pair and the interference signal expression; and the Raman laser module is further used for determining the linear acceleration and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier under the condition that the signal sum value and the signal difference value are both zero.
7. An atomic interferometric inertial measurement device, comprising:
the first generation module is used for generating an atom beam pair through an atom source and generating a Raman laser pair through a laser device; the Raman laser pair interacts with the atomic beam pair, so that the atomic beam pair respectively generates interference;
the second generation module is used for generating a detection laser pair through the laser device; the detection laser pair is used for acting with the interfered atomic beam pair to generate a target light pair to be detected;
the first acquisition module is used for acquiring the target light pair to be detected to obtain a target interference signal pair, and determining a signal sum value and a signal difference value according to the target interference signal pair and an interference signal expression;
the adjusting module is used for adjusting the compensation parameters of the Raman laser pair through a preset first adjusting strategy, and the laser device generates the Raman laser pair until the determined signal sum value and the determined signal difference value are both zero;
and the determining module is used for determining the linear acceleration of the target carrier and the rotation angle rate of the target carrier according to the compensation parameter of the Raman laser pair, the first corresponding relation between the compensation parameter and the linear acceleration of the target carrier and the second corresponding relation between the compensation parameter and the rotation angle rate of the target carrier under the condition that the signal sum value and the signal difference value are both zero.
8. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method of any of claims 1 to 5.
9. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 1 to 5.
10. A computer program product comprising a computer program, characterized in that the computer program realizes the steps of the method of any one of claims 1 to 5 when executed by a processor.
CN202210718670.1A 2022-06-23 2022-06-23 Closed-loop atomic interferometry inertial measurement method and device Active CN114923485B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210718670.1A CN114923485B (en) 2022-06-23 2022-06-23 Closed-loop atomic interferometry inertial measurement method and device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210718670.1A CN114923485B (en) 2022-06-23 2022-06-23 Closed-loop atomic interferometry inertial measurement method and device

Publications (2)

Publication Number Publication Date
CN114923485A true CN114923485A (en) 2022-08-19
CN114923485B CN114923485B (en) 2024-06-18

Family

ID=82813760

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210718670.1A Active CN114923485B (en) 2022-06-23 2022-06-23 Closed-loop atomic interferometry inertial measurement method and device

Country Status (1)

Country Link
CN (1) CN114923485B (en)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007002327A1 (en) * 2005-06-22 2007-01-04 Litton Systems, Inc. Method for combining continuous and discontinuous inertial instrument measurements and inertial navigation system using the same
CN103837904A (en) * 2014-03-20 2014-06-04 中国科学院武汉物理与数学研究所 Combination inertial sensor based on multi-component atom interferometer and measurement method of combination inertial sensor
FR3063141A1 (en) * 2017-02-23 2018-08-24 Ixblue HYBRID SYSTEM FOR INERTIAL MEASUREMENT BASED ON COLD ATOM INTERFEROMETER AND LIGHT PULSES
CN112833879A (en) * 2021-01-08 2021-05-25 中国船舶重工集团公司第七0七研究所 Six-axis inertia measuring device based on cold atom interference technology
CN113566818A (en) * 2021-07-23 2021-10-29 清华大学 Atomic interference inertia measurement method and system
CN114353790A (en) * 2022-01-11 2022-04-15 清华大学 Atomic interference inertial navigation information detection system and detection method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007002327A1 (en) * 2005-06-22 2007-01-04 Litton Systems, Inc. Method for combining continuous and discontinuous inertial instrument measurements and inertial navigation system using the same
CN103837904A (en) * 2014-03-20 2014-06-04 中国科学院武汉物理与数学研究所 Combination inertial sensor based on multi-component atom interferometer and measurement method of combination inertial sensor
FR3063141A1 (en) * 2017-02-23 2018-08-24 Ixblue HYBRID SYSTEM FOR INERTIAL MEASUREMENT BASED ON COLD ATOM INTERFEROMETER AND LIGHT PULSES
CN112833879A (en) * 2021-01-08 2021-05-25 中国船舶重工集团公司第七0七研究所 Six-axis inertia measuring device based on cold atom interference technology
CN113566818A (en) * 2021-07-23 2021-10-29 清华大学 Atomic interference inertia measurement method and system
CN114353790A (en) * 2022-01-11 2022-04-15 清华大学 Atomic interference inertial navigation information detection system and detection method

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
朱常兴;冯焱颖;叶雄英;周兆英;周永佳;薛洪波;: "利用原子干涉仪的相位调制进行绝对转动测量", 物理学报, no. 02, 15 February 2008 (2008-02-15) *
朱常兴;冯焱颖;薛洪波;周永佳;叶雄英;周兆英;闫树斌;王晓佳;: "一种低速、连续、单色性好的冷原子束", 量子光学学报, no. 01, 25 February 2009 (2009-02-25) *

Also Published As

Publication number Publication date
CN114923485B (en) 2024-06-18

Similar Documents

Publication Publication Date Title
US11166004B2 (en) Three-dimensional computational imaging method and apparatus based on single-pixel sensor, and non-transitory computer-readable storage medium
US9291508B1 (en) Light-pulse atom interferometric device
CN104880614A (en) Microwave electric field intensity meter based on cold Rydberg atom interferometer and measuring method thereof
CN105277188B (en) Sagnac angular velocity measurement system and methods
Kaeppler et al. An investigation comparing ground‐based techniques that quantify auroral electron flux and conductance
Zhang et al. Non-Markovian quantum thermometry
Dranitsyna et al. Reducing the effect of temperature variations on FOG output signal
Heine et al. A transportable quantum gravimeter employing delta-kick collimated Bose–Einstein condensates
Brif et al. Characterization of errors in interferometry with entangled atoms
Tennstedt et al. Integration of atom interferometers and inertial measurement units to improve navigation performance
JPH0332918B2 (en)
Semenin et al. Determination of the heating rate and temperature of an ion chain in a linear paul trap by the dephasing of rabi oscillations
CN113566818A (en) Atomic interference inertia measurement method and system
CN114923485B (en) Closed-loop atomic interferometry inertial measurement method and device
Wang et al. Resilient timekeeping algorithm with multi-observation fusion Kalman filter
Jain Levitated optomechanics at the photon recoil limit
CN112667966B (en) Atomic interference gyroscope signal resolving method and device, computer equipment and storage medium
Meng et al. Closed-loop dual-atom-interferometer inertial sensor with continuous cold atomic beams
JP2007524815A (en) Photon number determination system and method
JPWO2019073657A1 (en) Gyroscope based on Mach-Zehnder atomic interference
Campbell et al. Pseudorandom noise code–based technique for thin-cloud discrimination with CO2 and O2 absorption measurements
Al-Moahmmed Quantum radar: A brief analytical study
Black et al. Velocity‐modulated atom interferometry with enhanced dynamic range
Ng et al. Measuring gravitational effect of superintense laser by spin-squeezed Bose–Einstein condensates interferometer
Song et al. Normalized detection by using the blow-away signal in cold atom interferometry

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant