CN114902054A - Analysis device, program for analysis device, and analysis method - Google Patents
Analysis device, program for analysis device, and analysis method Download PDFInfo
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- CN114902054A CN114902054A CN202180007627.8A CN202180007627A CN114902054A CN 114902054 A CN114902054 A CN 114902054A CN 202180007627 A CN202180007627 A CN 202180007627A CN 114902054 A CN114902054 A CN 114902054A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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Abstract
The present invention provides an analyzer which can detect an unexpected abnormality without depending on an expert and measures a predetermined component contained in a sample after the sample is subjected to a series of different processes, the analyzer (1) including: a plurality of analysis instruments including a processing device (2a) used for processing and a measuring device (2b) for measuring a predetermined component; a monitoring unit (33) that monitors and stores output values output from one or more analysis instruments; and a threshold value setting unit (34) that acquires output values of a plurality of past measurements stored by the monitoring unit (33) and sets the threshold values of one or more analysis instruments in a new measurement based on the output values.
Description
Technical Field
The present invention relates to an analyzer and the like for analyzing a sample (for example, water quality and the like).
Background
As shown in patent document 1, each measurement of a predetermined component contained in a sample by this analyzer includes various steps such as a step of measuring a fixed amount of the sample, a step of injecting a reagent into the sample, a step of reacting the sample with the reagent, and a step of measuring the predetermined component contained in the sample.
In this way, in an analysis device that performs measurement after performing various kinds of processing, when an unexpected measurement result is obtained, it is estimated that an abnormality has occurred in some of various instruments constituting the analysis device.
Therefore, as a method for identifying a case where an abnormality occurs or a location of the abnormality, the following method is mentioned: output values of various instruments are monitored, and when the output values exceed a threshold value set in advance, for example, at the time of product shipment, it is determined that an abnormality has occurred in the instrument.
However, the abnormality detected by using the threshold value set in advance is an abnormality in which the deterioration gradually appears as an output value, for example, wear of components, and the like, and an abrupt abnormality such as a pipe blockage and/or a malfunction of the electromagnetic valve is not detected as long as the output value at that time does not exceed the threshold value.
Therefore, in order to notice the occurrence or imminent occurrence of such an unexpected abnormality or to find out where the cause of the abnormality is in the apparatus, for example, the output value in the abnormal state is compared with the output value in the normal state closest to the abnormality in all steps, and the cause of the abnormality is specified from a slight difference therebetween.
As described above, it is difficult for a user to detect an unexpected abnormality on site, and there is a problem that, for example, data analysis in an instrument must be requested to an expert at the manufacturer.
Documents of the prior art
Patent document
Patent document 1: japanese laid-open patent publication No. 2015-25794
Disclosure of Invention
Technical problem
The present invention has been made to solve the above-described problems, and a main object of the present invention is to detect an unexpected abnormality without depending on an expert in an analysis device that performs measurement after performing various kinds of processing on a sample.
Technical scheme
That is, an analyzer according to the present invention is an analyzer for measuring a predetermined component contained in a sample after the sample is subjected to a series of different processes, the analyzer comprising: a plurality of analyzing instruments including a processing device used for the processing and a measuring device for measuring the predetermined component; a monitoring unit that monitors and stores output values output from one or a plurality of the analysis devices; and a threshold value setting unit that acquires the output values of the past plurality of measurements stored in the monitoring unit, and sets the threshold value of one or more of the analysis devices in a new measurement based on the output values.
According to the analysis device configured as described above, since the threshold value for the new measurement is set based on the output value over the past multiple measurements, the threshold value for the most recent state in which the analysis device is incorporated can be set, for example, unlike the threshold value set in advance at the time of product shipment or the like.
As described above, for example, if the threshold value is set so that the output value of the analysis device in the case of sudden abnormality exceeds the threshold value, the abnormality can be detected, and if the threshold value is set with a margin from the threshold value, the sign (tendency) of the occurrence of the abnormality can be noticed.
Thus, when various abnormalities including sudden abnormalities occur in a new measurement, the occurrence of the abnormalities and the warning thereof can be noticed without depending on experts, and the cause of the abnormalities can be identified and/or the measures before the occurrence of the abnormalities can be taken.
Here, as one of the analysis devices, if a pump for transporting a sample is focused, for example, there is a series of processes in which a process is performed almost without a pressure variation of the pump and a process is performed with a large pressure variation.
Therefore, it is preferable that the threshold setting unit sets an allowable range of the output value as the threshold, and the allowable range varies in size throughout the series of processing.
According to such a configuration, as described by taking the pump as an example, the allowable range can be increased in the process in which the fluctuation range of the output value is large, and the allowable range can be decreased in the process in which the fluctuation range of the output value is small, and by setting an appropriate threshold value for each process, it is possible to more reliably detect an unexpected abnormality.
Preferably, the threshold setting unit sets the threshold so that the latest measured output value is used as one of the output values measured over the past plurality of times.
With this configuration, the threshold value set for the analysis device can be set to a value that incorporates the latest state of the analysis device and/or the latest measurement environment. This can prevent erroneous detection of a variation in output value, which is caused by a difference in measurement environment such as a difference between day and night or a difference in climate, as an abnormality.
In order to more reliably detect a sudden abnormality, it is preferable that the threshold setting unit updates and sets the threshold every time a new measurement is performed.
In a specific embodiment, the threshold setting unit preferably sets the threshold based on an average value and a standard deviation of the output values measured over the plurality of past measurements.
As described above, in the analysis device in which the fluctuation range of the output value changes for each process, as described above using a pump as an example, an appropriate threshold value can be set for each process.
In another embodiment, the threshold setting unit may predict an output value in a new measurement from the output values measured over the past plural times, and set the threshold based on the predicted value.
Preferably, the analysis device includes a display unit that displays the threshold value set for the analysis device and a change with time of a new output value of the analysis device in a graph, and when the output value exceeds the threshold value, the display unit displays the output value so as to be distinguishable from other output values.
According to such a configuration, in a configuration in which the graph displays a temporal change in the output value, the output value (abnormal value) exceeding the threshold value is displayed so as to be distinguishable from other output values (normal values), and therefore it is possible to grasp in which process the sudden abnormality has occurred.
Preferably, the analysis device further includes an abnormality prediction unit that predicts whether or not the output value in a new measurement will exceed the threshold value based on the output values of the past measurements stored by the monitoring unit, and when the abnormality prediction unit predicts that the output value will exceed the threshold value, the display unit outputs a prediction display indicating that situation on the same screen as the graph.
With this configuration, it can be seen that the output value in the new measurement is highly likely to exceed the threshold value, and sudden abnormality or the like can be prevented from occurring, based on the advance notice display output to the screen.
The program for an analysis device according to the present invention is used for an analysis device that measures a predetermined component contained in a sample after the sample is subjected to a series of different processes, the analysis device including a plurality of analysis instruments including a processing device used in the processes and a measurement device that measures the predetermined component, the program causing a computer to function as a monitoring unit that monitors and stores output values output from one or a plurality of the analysis instruments and a threshold setting unit that acquires the output values stored in the monitoring unit over a plurality of past measurements and sets a threshold of one or a plurality of the analysis instruments in a new measurement based on the output values.
According to such a program for an analyzer, the same effects as those of the analyzer can be exhibited.
An analysis method according to the present invention is a method for measuring a predetermined component contained in a sample after a series of different processes are performed on the sample, the analysis method monitoring and storing output values output from one or more of a plurality of analysis devices including a processing device used in the processes and a measurement device that measures the predetermined component, acquiring the stored output values measured over a plurality of past measurements, and setting a threshold value of one or more of the analysis devices in a new measurement based on the output values.
According to such an analysis method, the same effects as those of the above-described analysis apparatus can be exhibited.
Technical effects
According to the present invention thus constituted, an analysis device that performs measurement after performing various kinds of processing on a sample can detect an unexpected abnormality without depending on an expert.
Drawings
Fig. 1 is a schematic diagram showing a configuration of an analysis device according to an embodiment.
Fig. 2 is a flowchart showing an analysis method using the analysis device of the embodiment.
Fig. 3 is a functional block diagram showing functions of the information processing apparatus of the embodiment.
Fig. 4 is a graph showing the output value of the pump in the analysis device of this embodiment.
Fig. 5 is a graph showing the output value of the photodetector in the analyzer of this embodiment.
Fig. 6 is a graph showing an example of an output value in the case where the standard deviation is large in this embodiment.
Fig. 7 is a graph showing an example of an output value in the case where the standard deviation is small in this embodiment.
Fig. 8 is a graph showing the output value of the pump in the analysis device of this embodiment.
Fig. 9 is a graph showing the output value of the pump in the analysis device of this embodiment.
Fig. 10 is a graph showing an output value of a pump in an analysis device according to another embodiment.
Fig. 11 is a graph showing an output value of a pump in an analysis device according to another embodiment.
Description of the symbols
1. analytical equipment
2. analytical instrument unit
2a · treatment apparatus
2 b. measuring apparatus
3. information processing apparatus
31. analysis control section
32. concentration calculating section
33. monitoring section
34. threshold setting section
35 · actual data storage section
36. display part
37. abnormality prediction unit
Detailed Description
Hereinafter, an embodiment of an analysis device according to the present invention will be described with reference to the drawings.
The analyzer 1 of the present embodiment measures the concentration of a predetermined component such as nitrogen and/or phosphorus contained in a liquid sample (sample) such as tap water and/or sewage, for example, and as shown in fig. 1, the analyzer 1 includes: an analyzer unit 2 having various analyzers; and an information processing device 3 that receives and transmits various signals with the analysis instrument unit 2.
The analyzer unit 2 measures the concentration of a predetermined component contained in a sample by, for example, ultraviolet absorptiometry after the sample is subjected to a series of different processes.
Specifically, as described above, the analysis device unit 2 includes various analysis devices, which are represented by reference numerals 4 to 11 in fig. 1, for example. As shown in fig. 1, these analyzing devices 4 to 11 are roughly divided into a processing device 2a for performing a series of processes and a measuring device 2b for measuring the concentration of a predetermined component.
First, the processing apparatus 2a will be explained.
The processing apparatus 2a is used for performing a series of processes while transferring a sample to a plurality of locations, and specifically, the processing apparatus 2a includes a sample metering mechanism 4, a reagent metering mechanism 5, a pressure adjusting mechanism 6, and the like.
The sample metering mechanism 4 meters the sample by a predetermined fixed amount, and here, the sample metering mechanism 4 dilutes the sample to a predetermined concentration and meters the diluted sample by a fixed amount.
Specifically, the mechanism includes: a sample container (not shown) for storing a sample; a dilution cell (not shown) to which a fixed amount of the sample is supplied from the sample container and to which a fixed amount of the diluent is supplied; and a measuring unit 4a which is supplied with the diluted sample diluted to a predetermined concentration in the dilution cell, temporarily stores the diluted sample, and measures a fixed amount. The diluted sample measured by the measuring section 4a is introduced into the measuring cell 7 through the sample pipe 4b, and the sample pipe 4b is provided with a first opening/closing valve 4c for opening and closing the inside of the pipe.
The reagent measuring mechanism 5 measures a predetermined fixed amount of a reagent used for measuring the concentration of a predetermined component in a sample, and here, the reagent measuring mechanism 5 measures reagents for analyzing a nitrogen component contained in the sample, that is, sodium hydroxide, potassium peroxodisulfate, and hydrochloric acid, for example.
Specifically, the reagent measuring mechanism 5 includes: a reagent container (not shown) for storing a reagent; and a measuring unit 5a that is supplied with a reagent from the reagent container, temporarily stores the reagent, and measures a fixed amount of the reagent. The reagent measured by the measuring section 5a is introduced into the measuring cell 7 through a reagent pipe 5b, and a second opening/closing valve 5c for opening and closing the inside of the pipe is provided in the reagent pipe 5 b. Although fig. 1 illustrates the configuration of one reagent measuring mechanism 5, the reagent measuring mechanism 5 may be provided for each reagent.
The pressure adjustment mechanism 6 is used to transfer various liquids such as a sample, a diluent, a diluted sample, and a reagent from one location to another location, and the pressure adjustment mechanism 6 includes a pump P that adjusts the internal pressures of the sample container (not shown), the dilution well (not shown), the reagent container (not shown), the measurement well 7, and the like to positive or negative pressures.
Next, the measurement device 2b will be explained.
The measuring device 2b measures the concentration of a predetermined component contained in the sample processed by the processing device 2a, and specifically, the measuring device 2b includes a measuring cell 7, a light source 8, a photodetector 9, a heater 10, an ultraviolet light source 11, and the like.
The measuring cell 7 is injected with a fixed amount of the sample measured by the sample measuring mechanism 4 and also with a fixed amount of the reagent measured by the reagent measuring mechanism 5, thereby performing a sample injection step, a reagent injection step, a reaction step, a pH adjustment step, a measurement step, and a waste liquid step, which will be described later.
The light source 8 irradiates the measuring cell 7 with light having a predetermined wavelength (for example, light having an ultraviolet wavelength band such as 220 nm). As the light source, for example, a UV lamp such as a xenon lamp, an ultraviolet LED, or the like can be used.
The photodetector 9 detects light emitted from the light source 8 to the measuring cell 7 and transmitted through the measuring cell 7. As the light detector 9, for example, a photomultiplier tube (PMT) that converts light of a predetermined wavelength (light having an ultraviolet band) transmitted through the measuring cell 7 into an electric signal (light detection data) corresponding to the light intensity may be used.
The heater 10 heats the sample and the reagent mixed in the measuring cell 7. Specifically, the heater 10 is used in a processing step of hydrolyzing a sample with a reagent and a processing step of measuring the concentration of a predetermined component contained in the sample, and the temperature of the measuring cell 7 in each processing step is adjusted to a predetermined temperature range.
The ultraviolet light source 11 irradiates the sample and the reagent mixed in the measuring cell 7 with ultraviolet light. The ultraviolet light source 11 is used together with the heater in the hydrolysis process, and for example, a UV lamp, an LED, or the like that irradiates a wavelength required for the hydrolysis reaction can be used.
The analysis device unit 2 thus configured is controlled by a control signal output from the information processing apparatus 3.
The information processing device 3 is a dedicated or general-purpose computer having a CPU, a memory, an AD converter, and the like, and the information processing device 3 is configured to operate in accordance with a program stored in a predetermined area of the memory, and functions as at least an analysis control unit 31 and a density calculation unit 32 as shown in fig. 1.
Specifically, as shown in fig. 2, the information processing device 3 is configured to sequentially control the analyzer unit 2, and the information processing device 3 repeatedly executes a series of analysis processes including a sample injection step, a reagent injection step, a reaction step, a pH adjustment step, a measurement step, and a liquid disposal step. That is, in addition to the measurement of the sample, the series of analysis processes includes a pretreatment before the measurement step and a post-treatment after the measurement step.
The sample injection step is a process step in which the analysis control unit 31 controls the sample metering mechanism 4 to inject the metered sample into the measuring cell 7. In this embodiment, as described above, the sample is diluted to a predetermined concentration, and a fixed amount of the diluted sample is measured and injected into the measuring cell 7.
The reagent injection step is a processing step in which the analysis controller 31 controls the reagent metering mechanism 5 to inject the metered reagent (sodium hydroxide and potassium peroxodisulfate) into the measurement cell 7.
The reaction steps are as follows: the analysis control unit 31 controls the heater 10 to heat a solution including the sample and the reagent mixed in the measuring cell 7, controls the ultraviolet light source 11 to irradiate the solution with ultraviolet light, and hydrolyzes the sample included in the solution with the reagent.
The pH adjustment step is a treatment step in which the analysis controller 31 controls the reagent measuring mechanism 5 to add a measured reagent (hydrochloric acid) to the solution to neutralize the solution.
The measurement step is a processing step in which the analysis control unit 31 controls the light source 8 to irradiate the measuring cell 7 with light, and detects the transmitted light emitted from the measuring cell 7 by the light detector 9. The light detection data acquired by the photodetector 9 is output to the concentration calculation unit 32, and the concentration calculation unit 32 measures the nitrogen concentration contained in the sample using the light detection data.
The waste liquid step is a treatment step of discharging the solution in the measurement cell 7 that has undergone the measurement step.
As shown in fig. 3, the information processing device 3 of the present embodiment further includes a monitoring unit 33 that monitors and stores output values output from one or more analysis instruments by operating in accordance with a program stored in a predetermined area of the memory, and a threshold setting unit 34 that sets a threshold of one or more analysis instruments by operating in accordance with a program stored in a predetermined area of the memory.
Here, the monitoring unit 33 monitors output values output from the plurality of analysis devices, and stores the output values in the actual data storage unit 35 set in a predetermined area of the memory.
Specifically, the monitoring unit 33 monitors a pump pressure as an output value from the pump P of the analysis device, a light intensity as an output value from the photodetector 9 of the analysis device, and the like.
The monitoring unit 33 stores time series data of output values output from the analysis device in the series of analysis processes as a set of data in the actual data storage unit 35.
In other words, the monitoring unit 33 stores time series data of output values output from the analysis device at the time of measuring the concentration of the predetermined component contained in the primary sample, as one set of data, in the actual data storage unit 35. Then, the actual data storage unit 35 stores a plurality of sets of time series data corresponding to a plurality of measurements.
The time-series data is data in which an output value that is output from the analysis device and changes with time is associated with the time at which each output value is output. That is, the time series data here is data composed of output values output from the analysis device at the time of preprocessing, measurement, and post-processing.
The threshold setting unit 34 acquires output values of a plurality of past measurements stored by the monitoring unit 33, and sets the threshold of one or more analysis instruments in a new measurement based on the output values.
The threshold setting unit 34 is configured to use at least the latest measured output value as one of the output values over the past plural times. More specifically, the threshold setting unit 43 acquires a plurality of sets of time-series data corresponding to a plurality of past measurements, and includes the time-series data of the latest measurement as one set of time-series data of the plurality of sets. Here, the threshold setting unit 34 is configured to calculate and set a threshold for a new measurement using time series data of output values of each measurement from the latest measurement to a measurement traced back a predetermined number of times (for example, several times to several hundred times).
Here, the threshold value is a value set so that, when an unexpected abnormality occurs in the analysis device or in a device associated with (connected to) the analysis device, the output value at that time exceeds the threshold value, and indicates an allowable range of the output value for the analysis device.
In the present embodiment, since the output value outputted from the analysis device changes with time as described above, the threshold value setting unit 34 is configured to set the threshold value that changes with time for the output value that changes with time. That is, the threshold set by the threshold setting unit 34 is also time-series data that changes with time.
In this embodiment, the threshold setting unit 34 is configured to set the upper limit value and the lower limit value of the output value of the analysis device as the threshold, and to update and set the threshold every time a new measurement is performed. Note that the threshold setting unit 34 may be configured to set only one of the upper limit value and the lower limit value as the threshold, or may be configured to update the threshold every time a predetermined number of new measurements are performed.
Specifically, the threshold setting unit 34 here sets the threshold based on the average value and the standard deviation of the output values measured over a plurality of past times, and the threshold setting unit 34 is configured to set a value obtained by adding the average value and the standard deviation as the upper limit value and a value obtained by subtracting the standard deviation from the average value as the lower limit value.
Here, the threshold value set by the threshold value setting unit 34 will be described by taking, for example, the pump pressure in the above-described sample injection step and reagent injection step as an example (see fig. 4).
In these steps, when the sample, the reagent, and the like are supplied to the measuring section 4a and the measuring section 5a and measured, since these liquids are transported by the pump P, the variation in the pump pressure (output value) is large, and thus the standard deviation of the pump pressure (output value) is large. Therefore, the magnitude of the threshold value of the pump pressure in these steps becomes relatively large.
In the sample injection step and the reagent injection step, the average value and the standard deviation are different values because the physical properties (for example, viscosity) of the liquid to be transported are different.
In addition, since various liquids are transferred by the pump P in the pH adjustment step and the waste liquid step, the threshold value of the pump pressure is relatively large in the same manner as in the sample injection step and the reagent injection step described above.
On the other hand, in the reaction step, since liquid transfer by the pump P is not performed, for example, when the sample and the reagent are stirred, fluctuation of the pump pressure (output value) is small, and thus the standard deviation of the pump pressure (output value) is small. Therefore, the magnitude of the threshold value of the pump pressure in this reaction step becomes relatively small.
In the measurement step, since the pump P is not used as in the reaction step, the variation in the pump pressure (output value) is small, and the standard deviation of the pump pressure (output value) is small. Therefore, the width of the threshold value of the pump pressure in this measurement step becomes relatively small.
Next, as an output value of the analysis device, a threshold value for the photodetector 9 will be described with attention paid to an output value of the measurement device 2b, more specifically, with attention paid to a light intensity as an output value of the photodetector 9 (see fig. 5).
Since the light source 8 irradiates light in the reaction step and the measurement step, the output value of the photodetector 9 fluctuates more than the output value of the photodetector 9 in the other steps, and thus the standard deviation of the output value of the photodetector 9 is large. Therefore, the threshold value of the photodetector 9 in the reaction step and the measurement step becomes relatively large.
On the other hand, in the sample injection step, the reagent injection step, the pH adjustment step, and the liquid waste step, which are steps other than the reaction step and the measurement step, since light is not irradiated from the light source 8, the fluctuation of the output value of the photodetector 9 is small, the standard deviation is small, and the range of the threshold value of the photodetector 9 is relatively small.
As an example of the series of output values (for example, 100 output values) in the step having a large standard deviation, the contents shown in fig. 6 can be cited, and as an example of the series of output values (for example, 100 output values) in the step having a small standard deviation, the contents shown in fig. 7 can be cited.
The width of the difference between the upper limit value and the lower limit value set by the threshold setting unit 34, that is, the size of the allowable range set as the threshold value varies with time.
Here, as shown in fig. 3, the information processing device 3 of the present embodiment further has a function as a display unit 36 that graphically displays changes over time in the output value output from the analysis device, and a function as an abnormality prediction unit 37 that predicts whether or not the output value in the new measurement will exceed a threshold value.
As shown in fig. 4, the display unit 36 displays a graph in which one axis is set to time and the other axis is set to an output value on a screen, and outputs a temporal change in the output value of the analysis device to the graph.
The display unit 36 is configured to display the temporal change in the threshold set by the threshold setting unit 34 on the graph as well, and here, also display the average value of the output values used when setting the threshold on the graph.
The display unit 36 is configured to display the output value in the new measurement so as to be distinguishable from other output values when the output value exceeds the threshold value.
More specifically, as shown in fig. 4, the display unit 36 is configured to make a display form of an output value (abnormal value) exceeding a threshold value, for example, a color and/or a plot shape, different from a display form of another output value (normal value) in a graph showing a change with time of the output value. This makes it possible to intuitively recognize the timing at which the output value exceeds the threshold value, that is, the process in which the output value exceeds the threshold value. In fig. 4, the output values plotted by black circles are displayed as abnormal values exceeding the threshold value. The display unit 36 may change a display form such as a color and/or a shape of a plot displayed in association with the analysis device, for example, according to the number of times the output value of the analysis device exceeds a threshold value. In this way, the priority of the analytical instrument to be confirmed or the urgency of confirmation can be grasped by the display form of the plot.
As shown in fig. 8, the display unit 36 is configured to display the graph in an enlarged or reduced manner based on an operation signal input via an input device such as a mouse or a touch panel.
Here, as shown in fig. 8, an output value exceeding a threshold value can be selected by an input device such as a mouse or a touch panel, and the display unit 36 can display abnormal contents such as a process step and an output value that output the selected output value on the same screen as the graph (here, on the graph).
The abnormality prediction unit 37 predicts whether or not the output value in the new measurement exceeds the threshold value based on the output values of the past multiple measurements stored by the monitoring unit 33.
Specifically, as shown in fig. 9, the abnormality prediction unit 37 is configured to predict whether or not the output value in the new measurement exceeds the threshold value by comparing the output value of each measurement from the latest measurement to the measurement traced back a predetermined number of times (for example, several times) with the average value obtained by the threshold value setting unit 34.
Specific prediction methods include the following: for example, when all the output values in the predetermined number of measurements are lower than the average value, or when all the output values in the predetermined number of measurements are higher than the average value, it is predicted that the output value after the determination exceeds the threshold value.
In this way, when the abnormality prediction unit 37 predicts that the output value after that exceeds the threshold value, the display unit 36 outputs a notice display X indicating that on the same screen as the graph as shown in fig. 9.
The advance notice display X may be, for example, a display that displays output values measured a plurality of times in the past, which are used when it is predicted that the output value after the prediction exceeds a threshold value, so as to be distinguishable from other output values. As a display form for displaying the straight value, colors, a plot shape, and the like can be cited. Note that the advance notice display X is not limited to the mode shown in fig. 9, and may be appropriately changed.
According to the analysis device 1 described above, since the threshold value for the new measurement is set based on the output value of the past multiple measurements, the threshold value can be set to, for example, the most recent state in which the analysis device is incorporated, unlike the threshold value set in advance at the time of product shipment or the like.
Thus, for example, when the trace of the output value in the new measurement is different from the trace of the output value in the past measurement, the value of the threshold is set so that the trace of the new output value exceeds the threshold, and when a sudden abnormality occurs in the new measurement, the abnormality or the cause of the abnormality can be specified without depending on an expert.
Further, since the threshold value setting unit 34 sets the threshold value based on the average value and the standard deviation of the output values of the entire past plurality of measurements, the size of the allowable range set as the threshold value varies throughout the series of processing.
Thus, for example, in an analysis device such as a pump P in which the fluctuation range of the output value changes with each process, an appropriate threshold value can be set for each process.
Further, since the threshold value setting unit 34 sets the threshold value so as to use the latest measured output value as one of the output values measured over a plurality of previous times, the threshold value is set to a value that incorporates the latest state of the analysis device, the measurement environment, and the like.
This can prevent erroneous detection of a variation in output value or the like due to a difference in measurement environment as an abnormality.
Further, since the threshold value setting unit 34 updates and sets the threshold value every time a new measurement is performed, it is possible to more reliably detect an unexpected abnormality occurring in the analysis device.
Further, when the output value in the new measurement exceeds the threshold value, the display unit 36 displays the output value so as to be distinguishable from other output values, and thus it is possible to intuitively grasp in which process the sudden abnormality has occurred.
In addition, when the abnormality prediction unit 37 predicts that the output value will exceed the threshold value, the display unit 36 outputs the advance notice display X indicating that the output value will exceed the threshold value on the same screen as the graph, and therefore, it can be known from the advance notice display X that the output value in the new measurement is highly likely to exceed the threshold value, and sudden abnormality or the like can be prevented from occurring.
The present invention is not limited to the above embodiments.
For example, in the above embodiment, the threshold value setting unit 34 sets the threshold value using the average value and the standard deviation of the output values measured over the past plural times, but as shown in fig. 10, it may be configured to predict the output value in the new measurement from the output values measured over the past plural times and set the threshold value based on the predicted value.
With such a configuration, it is possible to predict that an abnormality occurs after several days, for example, and to plan repair and/or maintenance in accordance with the prediction.
In the above configuration, the threshold setting unit 34 may generate a learning algorithm using machine learning appropriately selected from supervised learning, unsupervised learning, reinforcement learning, deep learning, and the like, for example, using an output value in the past measurement as an explanatory variable and using a predicted value of an output value in the new measurement as a target variable.
In the above embodiment, the threshold value setting unit 34 sets the threshold value using the average value and the standard deviation of the output values measured over a plurality of past times, but may be configured to set the threshold value using an index indicating the deviation such as a variance value instead of the standard deviation.
As shown in fig. 11, a second threshold value different from the threshold value set by the threshold value setting unit 34 of the above-described embodiment may be set in the analysis device.
The second threshold in this case is an upper limit value and/or a lower limit value that is set in advance, for example, at the time of product shipment, and a threshold for detecting an abnormality that gradually degrades and presents as an output value, for example, wear of a component, can be cited.
The information processing device 3 may also have a function of a notification unit (not shown) that notifies a user of the fact when the output value of the analysis device exceeds the threshold value.
Specifically, the notification unit may be configured to notify that the number of abnormality times, which is the number of times the output value exceeds the threshold value, reaches a predetermined upper limit number of times.
In this configuration, it is preferable that the degree of urgency be set for each analysis device, and the upper limit number of times be set to be smaller as the degree of urgency is higher. The emergency level may be set to a high level for a component related to the waste liquid, for example.
In addition, a computer or the like different from the information processing apparatus 3 may be provided with a part of the functions of the information processing apparatus 3 described in the above embodiments. As an example, the actual data storage unit 35 may be provided separately from the information processing device 3, for example, a cloud server.
Although the analyzer 1 analyzes nitrogen, phosphorus, and the like contained in the liquid sample in the above-described embodiment, TOC and COD contained in the liquid sample may be analyzed, and a gas sample, a solid sample, or a gel-like sample may be analyzed.
The analyzer 1 for analyzing a gas sample may be, for example, CO obtained by burning a solid material 2 、CO、SO 2 、N 2 、H 2 And (3) a device for analyzing the gas sample. More specifically, the present invention relates to an analysis device for measuring impurities and the like contained in a solid material, and examples of the analysis device include a combustion step for burning the solid material, a removal step for removing the impurities, an extraction step for extracting a predetermined component contained in a gas sample, and a measurement step for measuring the concentration of the predetermined component.
The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the scope of the invention.
Industrial applicability
An analyzer for performing measurement after various processes are performed on a sample, which can detect an unexpected abnormality without depending on an expert.
Claims (10)
1. An analysis device for measuring a predetermined component contained in a sample after the sample is subjected to a series of different treatments,
the analysis device is provided with:
a plurality of analyzing instruments including a processing device used for the processing and a measuring device for measuring the predetermined component;
a monitoring unit that monitors and stores output values output from one or a plurality of the analysis devices; and
and a threshold setting unit that acquires the output values of the past plurality of measurements stored in the monitoring unit and sets a threshold of one or more of the analysis devices in a new measurement based on the output values.
2. The analysis device according to claim 1,
the threshold setting unit sets an allowable range of the output value as the threshold,
the size of the allowable range varies throughout the series of processes.
3. The analysis device according to claim 1 or 2,
the threshold setting unit sets the threshold so that the latest measured output value is used as one of the output values measured over the past plurality of times.
4. The analysis device according to any one of claims 1 to 3,
the threshold setting unit updates and sets the threshold each time a new measurement is performed.
5. The analysis device according to any one of claims 1 to 4,
the threshold setting unit sets the threshold based on an average value and a standard deviation of the output values measured over the past plurality of times.
6. The analysis device according to any one of claims 1 to 5,
the threshold setting unit predicts an output value in a new measurement from the output values measured over the past plural times, and sets the threshold based on the predicted value.
7. The analysis device according to any one of claims 1 to 6,
the analysis device includes a display unit that displays the threshold value set for the analysis device and a change with time of a new output value of the analysis device in a graph,
when the output value exceeds the threshold value, the display unit displays the output value so as to be distinguishable from other output values.
8. The analysis device according to claim 7,
the analysis device further includes an abnormality prediction unit that predicts whether or not the output value in a new measurement will exceed the threshold value based on the output values of the past measurements stored by the monitoring unit,
when it is predicted by the abnormality prediction unit that the output value exceeds the threshold value, the display unit outputs a notice display showing the situation on the same screen as the graph.
9. A program for an analysis device that measures a predetermined component contained in a sample after the sample is subjected to a series of different treatments, the program being characterized by comprising a plurality of analysis instruments including a processing device used for the treatments and a measurement device for measuring the predetermined component,
the analysis device program causes a computer to function as a monitoring unit and a threshold setting unit,
the monitoring unit monitors and stores output values outputted from one or more of the analyzing devices,
the threshold setting unit acquires the output values of the past plurality of measurements stored in the monitoring unit, and sets the threshold of one or more analysis instruments in a new measurement based on the output values.
10. An analysis method characterized by comprising subjecting a sample to a series of different treatments, measuring a predetermined component contained in the sample,
the analysis method monitors and stores output values output from one or more of a plurality of analysis instruments including a processing device used in the processing and a measurement device that measures the predetermined component, and
the stored output values of the plurality of past measurements are acquired, and one or more thresholds of the analysis device in the new measurement are set based on the output values.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020-004707 | 2020-01-15 | ||
| JP2020004707 | 2020-01-15 | ||
| PCT/JP2021/000637 WO2021145302A1 (en) | 2020-01-15 | 2021-01-12 | Analysis apparatus, program for analysis apparatus, and analysis method |
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| CN114902054A true CN114902054A (en) | 2022-08-12 |
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| CN202180007627.8A Pending CN114902054A (en) | 2020-01-15 | 2021-01-12 | Analysis device, program for analysis device, and analysis method |
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| JP (1) | JPWO2021145302A1 (en) |
| CN (1) | CN114902054A (en) |
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| JP3868102B2 (en) * | 1998-03-19 | 2007-01-17 | オリンパス株式会社 | Dispensing device and analyzer comprising this dispensing device as a component |
| JP6654881B2 (en) * | 2015-12-09 | 2020-02-26 | 株式会社日立ハイテクノロジーズ | Automatic analyzer and method for determining abnormality of automatic analyzer |
| EP3621739B1 (en) * | 2018-01-05 | 2023-07-05 | Illumina Inc. | Predicting reagent chiller instability and flow cell heater failure in sequencing systems |
| JP7064365B2 (en) * | 2018-03-29 | 2022-05-10 | シスメックス株式会社 | Monitoring data generation device of sample analysis device, sample analysis device, monitoring data generation system of sample analysis device, construction method of the system, monitoring data generation method of sample analysis device, monitoring method of sample analysis device |
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- 2021-01-12 CN CN202180007627.8A patent/CN114902054A/en active Pending
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| JPWO2021145302A1 (en) | 2021-07-22 |
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