CN114770829A - Composite material electron beam repair and repair process detection integrated device and method - Google Patents

Composite material electron beam repair and repair process detection integrated device and method Download PDF

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Publication number
CN114770829A
CN114770829A CN202210007682.3A CN202210007682A CN114770829A CN 114770829 A CN114770829 A CN 114770829A CN 202210007682 A CN202210007682 A CN 202210007682A CN 114770829 A CN114770829 A CN 114770829A
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Prior art keywords
repair
electron beam
temperature
area
electron
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CN202210007682.3A
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占小红
刘星
卜珩倡
胥颖
王飞云
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Nanjing University of Aeronautics and Astronautics
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Nanjing University of Aeronautics and Astronautics
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Priority to CN202210007682.3A priority Critical patent/CN114770829A/en
Publication of CN114770829A publication Critical patent/CN114770829A/en
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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29CSHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C37/00Component parts, details, accessories or auxiliary operations, not covered by group B29C33/00 or B29C35/00
    • B29C37/0025Applying surface layers, e.g. coatings, decorative layers, printed layers, to articles during shaping, e.g. in-mould printing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)

Abstract

The invention discloses a device and a method for integrating electron beam repair and repair process detection of a composite material, relates to the field of composite material repair, and achieves the effect of integration of repair and detection. In vacuum, enabling an electron beam to act on a composite material area to be repaired, detecting secondary electron and back scattering electron signals, and observing the appearance of the repaired area through the electron signals; the temperature detection device monitors the temperature of the repair area to avoid overheating damage. The method can adjust the energy of the electron beam in the repairing process in real time and detect the repairing process, realizes digitization and visualization of the repairing process, shortens the repairing time and improves the efficiency of material repairing.

Description

Composite material electron beam repair and repair process detection integrated device and method
The technical field is as follows:
the invention relates to a composite material electron beam repair and repair process detection integrated device and method, and belongs to the field of composite material repair.
The background art comprises the following steps:
the composite material has designability, has the advantages of light weight, high specific strength, high specific modulus and the like, and is widely applied to the fields of aerospace, automobiles and the like in recent years. Damage and damage to components and equipment made of the composite material during use are difficult to avoid. The composite material is mostly manufactured by an integrated manufacturing process, and if the composite material is integrally replaced after being damaged, the problems of high use cost and the like are caused, so that the repair problem of the composite material needs to be solved urgently.
Thermoplastic composites have poor creep resistance in relatively high temperature environments, and thermoset composites are more frequently used at relatively high temperatures. In the field of composite material repair at present, after a thermosetting composite material is damaged, repair is performed mostly by sticking a patch on the damaged area through an adhesive, but the performance of the material repaired in such a way depends on the type of the adhesive.
The invention content is as follows:
aiming at the problem that the thermosetting composite material cannot be repaired by heating and melting, the invention provides a composite material electron beam repair and repair process detection integrated device and method, which can induce a polymer to generate a chemical bond to achieve the aim of repairing connection. The invention can accurately repair the damaged area of the material, simultaneously avoids the material from being damaged by overheating during repair, and monitors secondary electrons and back scattered electrons generated in the repair process and detects the temperature of the repair area, thereby detecting the repair process in real time and regulating and controlling the energy of the electron beam in the repair process. The energy consumption is reduced on the premise of ensuring the repair process, the repair process is visualized, the repair process is visually judged, the repair time is shortened, and the material repair efficiency is improved.
The invention is realized by the following technical scheme:
a repair detection device for electron beam repair composite materials comprises a computer control system, an electron beam emission and control device, an electron beam detection and feedback system, a temperature detection and feedback system and a vacuum system;
the computer control system is connected with the electron beam control device, the kinescope, the infrared temperature measuring device and the robot;
the electron beam control device controls the size of the energy emitted by the electron beam gun according to the instruction of the computer control system; the secondary electron detection device and the backscatter band electron detection device detect electronic signals generated in the repair process, and the detected data enters the picture tube through a signal amplifier to display the appearance of a micro-area; and transmitting the image data into a computer control system; the infrared temperature measurement system detects the temperature of the repair area and transmits the temperature data to the computer control system.
An operation method of a composite material electron beam repair and repair process detection integrated device and method comprises the following steps:
the method comprises the following steps: placing a material to be repaired in a vacuum chamber, fixing the material to be repaired on a workbench, closing the vacuum chamber, opening a vacuum pump, and vacuumizing the vacuum chamber;
step three: inputting initial energy parameters of electron beams into a computer, generating high-energy electron beams by an electron beam gun, and starting to repair damaged parts of the material when the electron beams act on damaged areas of the material;
step four: the infrared temperature measurement system measures the temperature of the material repair area in real time and feeds the measured temperature information back to the computer control system, and when the computer judges that the temperature exceeds a preset temperature interval and possibly causes heat damage to the material, the computer controls the electron beam gun to reduce the energy of the electron beam so as to reduce the temperature of the repair area and keep the temperature in the set interval all the time;
step five: the secondary electron and back scattered electron detection device detects the electronic signal, the signal is transmitted into the kinescope after being integrated by the amplifier, and the image data is transmitted into the computer; the computer control system displays the micro-area morphology of the material in the repair area on a screen in real time, and visually judges the repair process of the material by observing the morphology change;
step six: repeating the fourth step and the fifth step until the area to be repaired is completely repaired;
step seven: and after the repair is finished, storing the temperature change condition, the electron beam energy change condition and the micro-morphology of the repair area in the repair process in a computer control system, and providing a basis for subsequent repair.
Compared with the prior art, the invention has the following advantages and effects;
the invention realizes the digitization, the regulation and the visualization of the repair process; the real-time regulation and control of the temperature can prevent the material from being damaged secondarily in the repairing process; the damaged area is accurately repaired through the electron beam, and a heat affected zone is small; repairing in a vacuum chamber to prevent the influence of oxygen on the damaged area in the repairing process; within the temperature allowable range, the energy of the electron beam can be increased, so that the repairing time is shortened, and the repairing efficiency is improved.
Description of the drawings:
FIG. 1 is a diagram of an integrated apparatus for electron beam repair and repair process inspection of composite materials, wherein the numbers in the diagram represent: 1-a computer control system; 2-electron beam control cabinet; 3-a backscattered electron receiver; 4-a scaffold; 5-a robot; 6-vacuum chamber; 7-backscattered electrons; 8-electron beam gun; 9-electron beam; 10-secondary electrons; 11-a repair; 12-fixing the clamp; 13-a vacuum pump; 14-picture tube; 15-a signal amplifier; 16-infrared thermometer; 17-secondary electron receiver.
The specific implementation mode is as follows:
the present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not to be construed as limiting the invention.
Examples
As shown in fig. 1. The invention discloses a composite material electron beam repair and repair process detection integrated device and a method, which comprises a computer control system 1, an electron beam control system 2, electron beam detection and feedback systems (3, 14, 15 and 17) and a temperature detection and feedback system 16. In this example, the repair material is a carbon fiber reinforced epoxy resin based thermosetting composite material with the size of 100 × 150 × 10mm, and the material surface damage is crack damage.
And filling a mixture of the chopped carbon fibers and the epoxy resin in cracks of the carbon fiber reinforced epoxy resin-based thermosetting composite material.
The carbon fiber reinforced epoxy resin composite material is placed in a vacuum chamber 6 and fixed on a workbench, the vacuum chamber is closed, a vacuum pump 13 is opened, and the vacuum chamber is vacuumized.
And (3) turning on a power supply, and turning on the computer 1, the electron beam control cabinet 2, the robot 5, the electron beam detection and feedback systems (3, 14, 15 and 17) and the infrared thermometer 16.
Inputting a motion path of the robot 5 during repairing in the computer 1, trying to run the robot, checking whether the motion path is a crack area to be repaired, and adjusting the motion path until the motion path of the robot is compounded with the crack.
Initial parameters of the electron beam energy input in the computer: the initial energy of the electron beam is 500keV, and the temperature threshold is 250 ℃; and the parameters are transmitted to the electron beam control device 2, the electron beam control cabinet starts to work, the electron beam gun is controlled to emit the electron beam with energy corresponding to the input parameters, the damaged area is repaired, the infrared thermometer 16 detects the temperature of the repaired area and transmits the temperature data to the computer 1, when the temperature does not reach the overheating damage degree of the material, the computer transmits the data to the electron beam control cabinet, and the control cabinet controls the electron beam gun to emit the electron beam with higher energy, so that the material repairing speed is accelerated.
The infrared thermometer 16 detects the temperature condition of the repair area in real time, transmits the temperature data into the computer, and the computer regulates and controls the energy data, transmits the data into the electron beam control cabinet 2 and changes the energy in real time.
The backscattered electron detection device 3 and the secondary electron detection device 17 jointly detect the electronic signals generated during repair, transmit the electronic signals to the signal amplifier 15 for amplification, and then transmit the signals to the kinescope 14.
And observing the microscopic morphology of the repaired area and the connection state of the interface on a display screen, judging whether the defects such as cracks, air holes and the like exist, judging the repairing process of the material, and driving an electron beam gun to move by the robot after the selected area is repaired so as to enable the electron beam to act on the unrepaired area.
After all the damaged areas are repaired, the computer controls the electron beam control cabinet 2 to stop working, and the computer stores all the repair data.
And after the temperature is reduced, opening the vacuum chamber 6, taking out the repaired plate, completing the material repairing work, performing performance test on the repaired carbon fiber reinforced epoxy resin based thermosetting composite material, and optimizing the parameters of the next repairing according to the test result, the parameters in the repairing process and the image result.
The foregoing is illustrative of the preferred embodiments of the present invention and it will be appreciated by those skilled in the art that changes may be made in this embodiment without departing from the principles of the invention, the scope of which is defined by the appended claims.

Claims (5)

1. An electron beam repair and repair process detection integrated device and method for composite materials are characterized in that: the electron beam acts on the composite material to-be-repaired area in vacuum, and the repair process of the composite material is mastered in real time by detecting signals of secondary electrons and back scattered electrons;
the electron beam emitting device emits electron beams with certain energy according to the instruction of the computer control system;
a secondary electron and back-scattered electron detection device is arranged for analyzing an electronic signal, observing the appearance of a repair area and observing the repair process and change of the composite material; the image data is transmitted into a computer control system;
the temperature detection device is arranged to feed back the temperature of the repair area, and the temperature data is transmitted into the computer control system.
2. The composite material electron beam repair and repair process detection integrated device and method according to claim 1, characterized in that: the repair is carried out in a vacuum environment, air influence is eliminated, and bubbles generated in a repair area are reduced.
3. The composite material electron beam repair and restoration process detection integrated device and method according to claim 1, wherein: the secondary electron and back scattered electron detection device detects the electron signal generated in the repair process and transmits the detection data to the kinescope through the signal amplifier to display the appearance of the micro-area; and transmits the image data to a computer control system.
4. The composite material electron beam repair and repair process detection integrated device and method according to claim 1, characterized in that: the temperature detection device monitors the temperature of the repair area in real time to prevent overheating damage to the material; meanwhile, the energy of the electron beam is improved within a temperature allowable range, and the repair speed is accelerated.
5. The operation method of the composite material electron beam repair and repair process detection integrated device and method according to claim 1, comprising the steps of:
the method comprises the following steps: placing a material to be repaired in a vacuum chamber, fixing the material to be repaired on a workbench, closing the vacuum chamber, opening a vacuum pump, and vacuumizing the vacuum chamber;
step three: inputting initial energy parameters of electron beams into a computer, generating high-energy electron beams by an electron beam gun, and starting to repair damaged parts of the material by the action of the electron beams on damaged areas of the material;
step four: the infrared temperature measuring system measures the temperature of the material repairing area in real time and feeds the measured temperature information back to the computer control system, and when the computer judges that the temperature exceeds a preset temperature interval and possibly causes heat damage to the material, the computer controls the electron beam gun to reduce the energy of the electron beam so as to reduce the temperature of the repairing area and keep the temperature in the set interval all the time;
step five: the secondary electron and back scattered electron detection device detects the electronic signal, the signal is transmitted into the kinescope after being integrated by the amplifier, and the image data is transmitted into the computer; the computer control system displays the micro-area morphology of the material in the repair area on a screen in real time, and visually judges the repair process of the material by observing the morphology change;
step six: repeating the fourth step and the fifth step until the area to be repaired is completely repaired;
step seven: and after the repair is finished, storing the temperature change condition, the electron beam energy change condition and the micro-morphology of the repair area in the repair process in a computer control system, and providing a basis for subsequent repair.
CN202210007682.3A 2022-01-05 2022-01-05 Composite material electron beam repair and repair process detection integrated device and method Pending CN114770829A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115304884A (en) * 2022-08-12 2022-11-08 哈尔滨工业大学 Self-healing and damage in-situ recognition epoxy resin composite material and preparation method and application thereof

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6696692B1 (en) * 2000-11-06 2004-02-24 Hrl Laboratories, Llc Process control methods for use with e-beam fabrication technology
CN105584061A (en) * 2016-03-03 2016-05-18 南京航空航天大学 Method and device for microwave nondestructive testing, quick repairing and real-time monitoring of composite material
US20190366656A1 (en) * 2018-05-31 2019-12-05 General Electric Company Composite Component Void Repair
CN110653494A (en) * 2018-06-29 2020-01-07 上海微电子装备(集团)股份有限公司 Laser repairing device and repairing method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6696692B1 (en) * 2000-11-06 2004-02-24 Hrl Laboratories, Llc Process control methods for use with e-beam fabrication technology
CN105584061A (en) * 2016-03-03 2016-05-18 南京航空航天大学 Method and device for microwave nondestructive testing, quick repairing and real-time monitoring of composite material
US20190366656A1 (en) * 2018-05-31 2019-12-05 General Electric Company Composite Component Void Repair
CN110653494A (en) * 2018-06-29 2020-01-07 上海微电子装备(集团)股份有限公司 Laser repairing device and repairing method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115304884A (en) * 2022-08-12 2022-11-08 哈尔滨工业大学 Self-healing and damage in-situ recognition epoxy resin composite material and preparation method and application thereof

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