CN114766023A - 数据处理方法、装置及系统、电子设备 - Google Patents

数据处理方法、装置及系统、电子设备 Download PDF

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CN114766023A
CN114766023A CN202080002604.3A CN202080002604A CN114766023A CN 114766023 A CN114766023 A CN 114766023A CN 202080002604 A CN202080002604 A CN 202080002604A CN 114766023 A CN114766023 A CN 114766023A
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samples
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sample production
data processing
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CN114766023B (zh
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王瑜
王海金
吴建民
王洪
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BOE Technology Group Co Ltd
Beijing Zhongxiangying Technology Co Ltd
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BOE Technology Group Co Ltd
Beijing Zhongxiangying Technology Co Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G05B19/406—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by monitoring or safety
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32187—Correlation between controlling parameters for influence on quality parameters
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32188—Teaching relation between controlling parameters and quality parameters
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32204—Performance assurance; assure certain level of non-defective products
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Human Computer Interaction (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • General Factory Administration (AREA)

Abstract

一种数据处理方法，包括：响应于用户在第一界面的第一输入，获取样本集合的不良类型；所述样本集合中包括多个样本；每个样本具有第一参数和第二参数；所述第一参数被配置为表征所述样本的属于所述不良类型的不良程度；所述第二参数被配置为表征所述样本经过的样本生产设备的设备信息；基于所述多个样本的第一参数和第二参数，计算多个样本生产设备对所述多个样本中的良率纯度指标，获得所述多个样本生产设备的影响参数；每个样本生产设备的影响参数被配置为表征所述样本生产设备对所述多个样本上出现所述不良类型的影响程度；在第二界面上显示所述多个样本生产设备的影响参数。

Description

PCT国内申请，说明书已公开。

Claims (31)

  1. PCT国内申请，权利要求书已公开。
CN202080002604.3A 2020-10-30 2020-10-30 数据处理方法、装置及系统、电子设备 Active CN114766023B (zh)

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US20180033134A1 (en) * 2016-07-29 2018-02-01 Wipro Limited System and method for dynamically determining balance shelf life of an industrial component
JP2018163622A (ja) * 2017-03-27 2018-10-18 国立大学法人鳥取大学 製造不良原因の探索支援方法及び情報処理装置
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* Cited by examiner, † Cited by third party
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TW200509274A (en) * 2003-08-26 2005-03-01 Promos Technologies Inc System and method for effective yield loss analysis for semiconductor wafers
CN103100678A (zh) * 2013-01-15 2013-05-15 中冶南方工程技术有限公司 连铸坯缺陷影响参数的在线控制系统与方法
US20140355866A1 (en) * 2013-05-30 2014-12-04 Samsung Sds Co., Ltd. Method and apparatus for identifying root cause of defect using composite defect map
CN103606114A (zh) * 2013-12-05 2014-02-26 国家电网公司 一种继电保护设备可靠性的评估方法
CN106815462A (zh) * 2015-11-30 2017-06-09 郑芳田 辨识良率损失的根本原因的系统与方法
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JP2018163622A (ja) * 2017-03-27 2018-10-18 国立大学法人鳥取大学 製造不良原因の探索支援方法及び情報処理装置
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CN110163647A (zh) * 2019-03-14 2019-08-23 腾讯科技（深圳）有限公司 一种数据处理方法及装置
CN110083636A (zh) * 2019-04-04 2019-08-02 深圳市华星光电技术有限公司 面板缺陷的检测系统及检测方法
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CN110796187A (zh) * 2019-10-22 2020-02-14 西安奕斯伟硅片技术有限公司 不良分类方法及装置
CN111159645A (zh) * 2019-12-19 2020-05-15 成都数之联科技有限公司 一种基于产品生产履历和参数的不良根因定位方法

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CN114766023B (zh) 2023-05-16
US20230004138A1 (en) 2023-01-05

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