CN114740828A - Circuit for testing functions of controller - Google Patents

Circuit for testing functions of controller Download PDF

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Publication number
CN114740828A
CN114740828A CN202210450604.0A CN202210450604A CN114740828A CN 114740828 A CN114740828 A CN 114740828A CN 202210450604 A CN202210450604 A CN 202210450604A CN 114740828 A CN114740828 A CN 114740828A
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CN
China
Prior art keywords
resistor
power supply
controller
triode
target measured
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CN202210450604.0A
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Chinese (zh)
Inventor
伍艳丽
王科发
兰启洪
刘超
白立
袁宇
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Chengdu Kenbaojie Xinchen Transducer Co ltd
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Chengdu Kenbaojie Xinchen Transducer Co ltd
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Priority to CN202210450604.0A priority Critical patent/CN114740828A/en
Publication of CN114740828A publication Critical patent/CN114740828A/en
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
    • G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Electronic Switches (AREA)

Abstract

The invention provides a circuit for testing the function of a controller, which comprises: the device comprises an MCU, a power supply voltage detection unit, a first switch unit and a CAN communication unit; the MCU sends a first control signal to the first switch unit to control whether a first power supply end supplies power to the target measured controller or not, when the target measured controller is electrified, the target measured controller CAN detect the working voltage value of the target measured controller, namely, a working voltage signal is generated, and the working voltage signal is sent to the MCU through CAN communication; the power supply voltage detection unit obtains a power supply voltage detection signal by detecting the power supply voltage of the first power supply end, and the MCU receives the power supply voltage detection signal sent by the power supply voltage detection unit and a working voltage signal sent by the target measured controller, and compares the power supply voltage detection signal with the working voltage signal to obtain working voltage test result data, so that the working voltage value of the target measured controller is detected, and the power supply reliability of the target measured controller in the using process is ensured.

Description

Circuit for testing functions of controller
Technical Field
The invention relates to the technical field of electronics, in particular to a circuit for testing functions of a controller.
Background
In the field of automobiles, a tire pressure controller is an important control device in an automobile, and in order to improve the functional reliability of the tire pressure controller, the functions of the tire pressure controller need to be tested after the tire pressure controller is produced, so that the tire pressure controller is installed in the automobile after the functions of the tire pressure controller are qualified, and the risk of the failure of the tire pressure controller in the driving process of the automobile is reduced. The reliability of the power supply of the tire pressure controller is very important for the tire pressure controller, and when the power supply of the tire pressure controller breaks down, the tire pressure controller is powered off or damaged and cannot work.
Therefore, the problem that the reliability of power supply of the tire pressure controller cannot be guaranteed exists in the prior art.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a circuit for testing the functions of a controller, which solves the problem that the power supply reliability of the controller in the prior art cannot be guaranteed, realizes the detection of the working voltage value of a target measured controller, and ensures the power supply reliability of the target measured controller in the use process.
A circuit for testing controller functionality, the circuit comprising: the device comprises an MCU, a power supply voltage detection unit, a first switch unit and a CAN communication unit; the MCU is respectively connected with the output end of the power supply voltage detection unit and the control end of the first switch unit, is used for receiving the power supply voltage detection signal output by the power supply voltage detection unit and is also used for sending a first control signal to the first switch control unit; the first switch unit is respectively connected with a first power supply end and a target measured controller and used for controlling whether the first power supply end supplies power to the target measured controller or not according to the received first control signal so as to enable the target measured controller to generate a working voltage signal; the CAN communication unit is respectively connected with the MCU and the target measured controller, and is used for receiving a working voltage signal sent by the target measured controller and sending the working voltage signal to the MCU; and the MCU is also used for comparing the received power supply voltage detection signal with the working voltage signal to obtain working voltage test result data.
Optionally, the first switching unit includes: the first resistor, the first diode, the second resistor, the first triode, the third resistor and the fourth resistor are connected with the second triode; two ends of the first resistor are respectively connected with the MCU and the anode of the first diode; the cathode of the first diode is connected with the base electrode of the first triode; two ends of the second resistor are respectively connected with the base electrode and the emitting electrode of the first triode; the collector of the first triode is connected with the base of the second triode through a third resistor, and the emitter of the first triode is grounded; two ends of the fourth resistor are respectively connected with the base electrode and the emitting electrode of the second triode; and the emitter of the second triode is connected with the first power supply end, and the collector of the second triode is connected with the target measured controller.
Optionally, the circuit further comprises a first overcurrent protection unit; the first overcurrent protection unit is respectively connected with the first switch unit and the target measured controller, and is used for sending an overcurrent signal to the first switch unit when the current output by the first switch unit exceeds a preset value, so that the first switch unit controls the first power supply end to stop supplying power to the target measured controller.
Optionally, the first overcurrent protection unit includes: the third resistor, the fourth resistor, the fifth resistor, the sixth resistor, the third triode, the seventh resistor, the second diode and the thyristor; a first end of the fifth resistor is connected with a collector of the second triode, and a second end of the fifth resistor is connected with the target measured controller; a base electrode of the third triode is connected with a second end of the fifth resistor through a sixth resistor, a collector electrode of the third triode is connected with the anode of the second diode through a seventh resistor, and an emitter electrode of the third triode is connected with a first end of the fifth resistor; the first end of the thyristor is connected with the anode of the first diode, the second end of the thyristor is grounded, and the third end of the thyristor is connected with the cathode of the second diode.
Optionally, the power supply voltage detection unit includes: the circuit comprises an eighth resistor, a ninth resistor, a tenth resistor, a fourth diode and a first capacitor; a first end of the eighth resistor is connected with a first power supply end, and a second end of the eighth resistor is connected with a first end of the ninth resistor; a second end of the ninth resistor is grounded; a first end of the tenth resistor is connected with a second end of the eighth resistor, and a second end of the tenth resistor is connected with the MCU; the anode of the fourth diode is connected with the second end of the tenth resistor, and the cathode of the fourth diode is connected with the second power supply end; the first end of the first capacitor is connected with the anode of the fourth diode, and the second end of the first capacitor is grounded.
Optionally, the circuit further comprises an IG control unit; the IG control unit is respectively connected with the MCU, the power receiving end of the target measured controller and the IG function end of the target measured controller and used for controlling whether the power receiving end of the target measured controller supplies power to the IG function end of the target measured controller or not according to a second control signal sent by the MCU.
Optionally, the IG control unit comprises: the circuit comprises an eleventh resistor, a twelfth resistor, a second capacitor, a fourth triode, a thirteenth resistor, a fourteenth resistor and a first MOS (metal oxide semiconductor) tube; two ends of the eleventh resistor are respectively connected with the base electrodes of the MCU and the fourth triode; two ends of the twelfth resistor are respectively connected with the base electrode and the emitting electrode of the fourth triode; the second capacitor is connected with the twelfth resistor in parallel; a collector electrode of the fourth triode is connected with a gate electrode of the first MOS transistor through a thirteenth resistor; two ends of the fourteenth resistor are respectively connected with the source electrode and the drain electrode of the first MOS tube; the source electrode of the first MOS tube is connected with the power supply receiving end of the target measured controller, and the drain electrode of the first MOS tube is connected with the IG function end of the target measured controller.
Optionally, the circuit further comprises a door pop-up control module; the door pop-up control module comprises a second switch unit; the second switch unit is respectively connected with the first power supply end, the MCU and the control end of the cavity door and used for controlling whether the first power supply end supplies power to the control end of the cavity door or not according to a second control signal sent by the MCU.
Optionally, the door pop-up control module further includes a second overcurrent protection unit; the second overcurrent protection unit is respectively connected with the second switch unit and the control end of the cavity door, and is used for sending an overcurrent signal to the second switch unit when the output current of the second switch unit exceeds a preset value, so that the second switch unit controls the first power supply end to stop supplying power to the control end of the cavity door.
Optionally, the CAN communication unit is further configured to receive speed signal test data, LED output test data, and/or RSSI test data sent by the target measured controller, and further configured to output the speed signal test data, the LED output test data, and/or the RSSI test data; the MCU is also used for judging the received speed signal test data, the LED output test data and/or the RSSI test data to obtain speed signal test result data, the LED output test result data and/or the RSSI test result data.
Compared with the prior art, the invention has the following beneficial effects:
the first switch unit is used for sending a first control signal to the MCU to control whether a first power end supplies power to the target measured controller or not, when the target measured controller is powered on, the target measured controller CAN detect the working voltage value of the target measured controller, namely, a working voltage signal is generated, and the working voltage signal is sent to the MCU through CAN communication; the power supply voltage detection unit obtains a power supply voltage detection signal by detecting the power supply voltage of the first power supply end, and the MCU receives the power supply voltage detection signal sent by the power supply voltage detection unit and a working voltage signal sent by the target measured controller, and compares the power supply voltage detection signal with the working voltage signal to obtain working voltage test result data, so that the working voltage value of the target measured controller is detected, and the power supply reliability of the target measured controller in the using process is ensured.
Drawings
Fig. 1 is a circuit structure diagram for testing the functions of a controller according to an embodiment of the present invention;
fig. 2 is a circuit diagram of a first switch unit according to an embodiment of the present invention;
FIG. 3 is a circuit diagram of another embodiment of the present invention for testing controller functions;
fig. 4 is a circuit diagram of a first overcurrent protection unit according to an embodiment of the invention;
fig. 5 is a circuit diagram of a power supply voltage detection unit according to an embodiment of the invention;
fig. 6 is a circuit diagram of an IG control unit according to an embodiment of the present invention.
Detailed Description
The technical solution of the present invention is further described with reference to the drawings and the embodiments.
Fig. 1 is a circuit structure diagram for testing the functions of a controller according to an embodiment of the present invention, and as shown in fig. 1, the circuit includes: the MCU200, the power voltage detection unit 100, the first switching unit 300, and the CAN communication unit 400;
the MCU200 is connected to the output terminal of the power supply voltage detection unit 100 and the control terminal of the first switch unit 300, and is configured to receive the power supply voltage detection signal output by the power supply voltage detection unit 100 and send a first control signal to the first switch control unit;
the first switch unit 300 is respectively connected to the first power supply terminal VCC1 and the target measured controller, and is configured to control whether the first power supply terminal VCC1 supplies power to the target measured controller according to the received first control signal, so that the target measured controller generates a working voltage signal;
the CAN communication unit 400 is respectively connected to the MCU200 and the target measured controller, and is configured to receive a working voltage signal sent by the target measured controller, and send the working voltage signal to the MCU 200;
the MCU200 is further configured to compare the received power supply voltage detection signal with the working voltage signal to obtain working voltage test result data.
In this embodiment, the MCU200 sends a first control signal to the first switch unit 300 to control whether the first power source VCC1 supplies power to the target measured controller, when the target measured controller is powered on, the target measured controller CAN detect its working voltage value, i.e. generate a working voltage signal, and send the working voltage signal to the MCU200 through CAN communication; the power supply voltage detection unit 100 obtains a power supply voltage detection signal by detecting the power supply voltage of the first power supply terminal VCC1, and the MCU200 compares the power supply voltage detection signal received by the power supply voltage detection unit 100 with the operating voltage signal sent by the target measured controller to obtain operating voltage test result data, thereby detecting the operating voltage value of the target measured controller and ensuring the power supply reliability of the target measured controller in the use process. It should be noted that the MCU200 may be of the AC78013MDQA type, and the CAN communication unit 400 specifically includes a CAN transceiver of the SIT105DT type.
Fig. 2 is a circuit diagram of a first switch unit 300 according to an embodiment of the present invention, and as shown in fig. 2, the first switch unit 300 includes: the first resistor R1, the first diode D1, the second resistor R2, the first triode Q1, the third resistor R3, the fourth resistor R4 and the second triode Q2 are connected; two ends of the first resistor R1 are respectively connected with the MCU200 and the anode of the first diode D1; the cathode of the first diode D1 is connected with the base of a first triode Q1; two ends of the second resistor R2 are respectively connected with the base electrode and the emitter electrode of the first triode Q1; the collector of the first triode Q1 is connected with the base of the second triode Q2 through a third resistor R3, and the emitter of the first triode Q1 is grounded; two ends of the fourth resistor R4 are respectively connected with the base electrode and the emitter electrode of the second triode Q2; an emitter of the second triode Q2 is connected to the first power supply terminal VCC1, and a collector of the second triode Q2 is connected to the target measured controller.
In this embodiment, when the MCU200 sends out the first control signal, that is, a high level signal, the base of the first transistor Q1Q1 receives the high level signal, the first transistor Q1 is turned on, the base of the second transistor Q2 is grounded via the first transistor Q1, that is, the base of the second transistor Q2 receives a low level signal, the second transistor Q2 is turned on, the voltage output by the first power source VCC1 provides a working voltage to the target measured controller via the second transistor Q2, the target measured controller detects the received working voltage and generates a working voltage signal, the working voltage signal of the target measured sensor is sent to the MCU200 via the CAN communication unit 400, and the MCU200 compares the received power source voltage detection signal with the working voltage signal to obtain the working voltage test result data.
Fig. 3 is a circuit structure diagram for testing the functions of the controller according to another embodiment of the present invention, and as shown in fig. 3, the circuit further includes a first overcurrent protection unit 500; the first overcurrent protection unit 500 is respectively connected to the first switch unit 300 and the target measured controller, and is configured to send an overcurrent signal to the first switch unit 300 when the current output by the first switch unit 300 exceeds a preset value, so that the first switch unit 300 controls the first power source terminal VCC1 to stop supplying power to the target measured controller.
In this embodiment, when the current output from the first switch unit 300 exceeds the preset value of the first overcurrent protection unit 500, the first overcurrent protection unit 500 sends an overcurrent signal to the first switch yard, the first switch unit 300 is turned off, and the first power source terminal VCC1 is controlled to stop supplying power to the target measured controller, thereby preventing overcurrent from flowing into the target measured controller and preventing the target measured controller from being damaged due to the overcurrent.
Fig. 4 is a circuit diagram of a first overcurrent protection unit 500 according to an embodiment of the present invention, and as shown in fig. 4, the first overcurrent protection unit 500 includes: a fifth resistor R5, a sixth resistor R6, a third triode Q3, a seventh resistor R7, a second diode D2 and a thyristor D3; a first end of the fifth resistor R5 is connected to the collector of the second transistor Q2, and a second end of the fifth resistor R5 is connected to the target measured controller; the base of the third triode Q3 is connected to the second end of the fifth resistor R5 through a sixth resistor R6, the collector of the third triode Q3 is connected to the anode of the second diode D2 through a seventh resistor R7, and the emitter of the third triode Q3 is connected to the first end of the fifth resistor R5; the first end of the thyristor D3 is connected to the anode of the first diode D1, the second end of the thyristor D3 is grounded, and the third end of the thyristor D3 is connected to the cathode of the second diode D2.
In the embodiment of the present invention, when the overcurrent is output by the second transistor Q2, the voltage across the fifth resistor R5 rises, and when the voltage across the fifth resistor R5 rises to the on-state value of the third transistor Q3, the third transistor Q3 is turned on, so that the thyristor D3 is turned on, the voltage across the thyristor D3 is clamped to the operating voltage of the thyristor D3 and divided by the second diode, and further the voltage across the base and emitter of the first transistor Q1 is smaller than the on-state voltage, the first transistor Q1 is turned off, so that the second transistor Q2 is also turned off, the first power source terminal VCC1 stops powering off the target measured controller, so as to prevent the overcurrent from flowing into the target measured controller, thereby implementing the overcurrent protection for the target measured controller.
Fig. 5 is a circuit diagram of a power supply voltage detection unit 100 according to an embodiment of the present invention, and as shown in fig. 5, the power supply voltage detection unit 100 includes: an eighth resistor R8, a ninth resistor R9, a tenth resistor R10, a fourth diode D4 and a first capacitor C1; a first end of the eighth resistor R8 is connected to a first power terminal VCC1, and a second end of the eighth resistor R8 is connected to a first end of the ninth resistor R9; a second end of the ninth resistor R9 is grounded; a first end of the tenth resistor R10 is connected to a second end of the eighth resistor R8, and a second end of the tenth resistor R10 is connected to the MCU 200; an anode of the fourth diode D4 is connected to the second end of the tenth resistor R10, and a cathode of the fourth diode D4 is connected to the second power supply terminal VCC 2; the first end of the first capacitor C1 is connected to the anode of the fourth diode D4, and the second end of the first capacitor C1 is grounded.
In this embodiment, the eighth resistor R8 and the ninth resistor R9 form a voltage divider, and the MCU200 obtains the operating voltage test result data of the target measured controller by detecting the voltage at the two ends of the ninth resistor R9, i.e., a power supply voltage detection signal, and calculating the voltage of the first power supply terminal VCC1 through a voltage dividing coefficient, and comparing the voltage of the first power supply terminal VCC1 with the operating voltage of the target measured controller. It should be noted that the fourth diode D4 is used to protect against damage to the MCU200 due to an excessively high voltage, and the first capacitor C1 is used to filter the voltage, so that the power supply voltage detection signal collected by the MCU200 is more stable. It should be noted that the second power supply terminal VCC2 can be obtained by dropping the voltage from the first power supply terminal VCC 1.
In another embodiment of the present invention, the circuit further comprises an IG control unit; the IG control unit is respectively connected with the MCU200, the power receiving end of the target measured controller and the IG function end of the target measured controller, and is used for controlling whether the power receiving end of the target measured controller supplies power to the IG function end of the target measured controller according to a second control signal sent by the MCU 200. It should be noted that the IG function is used as a part of the target measured controller, and whether the target IG function is normal is determined by detecting whether the IG function end of the target measured controller can normally receive power.
Fig. 6 is a circuit diagram of an IG control unit according to an embodiment of the present invention, and as shown in fig. 6, the IG control unit includes: an eleventh resistor R11, a twelfth resistor R12, a second capacitor C2, a fourth triode Q4, a thirteenth resistor R13, a fourteenth resistor R14 and a first MOS transistor Q5; two ends of the eleventh resistor R11 are respectively connected with the MCU200 and the base electrodes of the fourth triode Q4; two ends of the twelfth resistor R12 are respectively connected with the base electrode and the emitter electrode of the fourth triode Q4; the second capacitor C2 is connected in parallel with the twelfth resistor R12; the collector of the fourth triode Q4 is connected with the gate of the first MOS transistor Q5 through a thirteenth resistor R13; two ends of the fourteenth resistor R14 are respectively connected with the source and the drain of the first MOS transistor Q5; the source electrode of the first MOS tube Q5 is connected with the power supply receiving end of the target measured controller, and the drain electrode of the first MOS tube Q5 is connected with the IG function end of the target measured controller.
In this embodiment, after the first power source terminal VCC1 provides the operating voltage to the target measured controller, the MCU200 sends a second control signal, that is, a high level signal, the base of the fourth transistor Q4 receives the high level signal through the eleventh resistor R11, the fourth transistor Q4 is turned on, the gate of the first MOS transistor Q5 receives the low level signal through the thirteenth resistor R13, the first MOS transistor Q5 is turned on, the IG function terminal of the target measured controller receives the operating voltage, the target measured controller detects the voltage of the IG function terminal and sends the detection data to the MCU200 through the CAN communication unit 400, and the MCU200 determines whether the IG function is normal through the detection data.
In another embodiment of the present invention, the circuit further comprises a door pop-up control module; the door pop-up control module comprises a second switch unit; the second switch unit is respectively connected with the first power supply terminal VCC1, the MCU200 and the control terminal of the cavity door, and is used for controlling whether the first power supply terminal VCC1 supplies power to the control terminal of the cavity door according to a second control signal sent by the MCU 200. In this embodiment, when the target measured controller is detected, the target measured controller needs to be placed into the cavity, the cavity is provided with a cavity door, and the opening and closing of the cavity door are controlled by the door spring control module, so that the target measured controller can be placed into or taken out of the cavity. When the MCU200 sends a second control signal to the second switch unit, the second switch unit controls whether the first power supply terminal VCC1 supplies power to the control terminal of the cavity door, and when the control terminal of the cavity door is powered on, the cavity door is closed; when the control end of the cavity door is powered off, the cavity door is opened. It should be noted that the specific circuit of the second switch unit is the same as the specific circuit of the first switch unit 300, and is not described herein again.
In another embodiment of the present invention, the door pop-up control module further includes a second overcurrent protection unit; the second overcurrent protection unit is respectively connected to the second switch unit and the control end of the cavity door, and is configured to send an overcurrent signal to the second switch unit when the output current of the second switch unit exceeds a preset value, so that the second switch unit controls the first power supply end VCC1 to stop supplying power to the control end of the cavity door. In this embodiment, when the current output by the second switch unit is too large, that is, the output current of the second switch unit exceeds the preset value, the second overcurrent protection unit sends an overcurrent signal to the second switch unit, so that the second switch unit controls the first power supply terminal VCC1 to stop supplying power to the control terminal of the cavity door, thereby preventing the overcurrent from flowing into the control terminal of the cavity door and damaging the control terminal of the cavity door. It should be noted that the specific circuit of the second overcurrent protection unit is the same as the specific circuit of the first overcurrent protection unit 500, and is not described herein again.
In another embodiment of the present invention, the CAN communication unit 400 is further configured to receive speed signal test data, LED output test data and/or RSSI test data sent by the target measured controller, and further configured to output the speed signal test data, the LED output test data and/or RSSI test data; the MCU200 is further configured to determine the received speed signal test data, the LED output test data and/or the RSSI test data to obtain speed signal test result data, the LED output test result data and/or the RSSI test result data. It should be noted that. The speed signal detection, the LED output and the RSSI are all functions of the target measured controller, and the reliability of the target measured controller is improved by detecting the functions of the target measured controller.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Finally, the above embodiments are only for illustrating the technical solutions of the present invention and not for limiting, although the present invention has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications or equivalent substitutions may be made to the technical solutions of the present invention without departing from the spirit and scope of the technical solutions of the present invention, and all of them should be covered in the claims of the present invention.

Claims (10)

1. A circuit for testing the functionality of a controller, the circuit comprising: the device comprises an MCU, a power supply voltage detection unit, a first switch unit and a CAN communication unit;
the MCU is respectively connected with the output end of the power supply voltage detection unit and the control end of the first switch unit, is used for receiving the power supply voltage detection signal output by the power supply voltage detection unit and is also used for sending a first control signal to the first switch control unit;
the first switch unit is respectively connected with a first power supply end and a target measured controller and used for controlling whether the first power supply end supplies power to the target measured controller or not according to the received first control signal so as to enable the target measured controller to generate a working voltage signal;
the CAN communication unit is respectively connected with the MCU and the target measured controller, and is used for receiving a working voltage signal sent by the target measured controller and sending the working voltage signal to the MCU;
and the MCU is also used for comparing the received power supply voltage detection signal with the working voltage signal to obtain working voltage test result data.
2. The circuit for testing a controller function of claim 1, wherein the first switching unit comprises: the first resistor, the first diode, the second resistor, the first triode, the third resistor and the fourth resistor are connected with the second triode;
two ends of the first resistor are respectively connected with the MCU and the anode of the first diode;
the cathode of the first diode is connected with the base of the first triode;
two ends of the second resistor are respectively connected with the base electrode and the emitting electrode of the first triode;
the collector of the first triode is connected with the base of the second triode through a third resistor, and the emitter of the first triode is grounded;
two ends of the fourth resistor are respectively connected with the base electrode and the emitting electrode of the second triode;
and the emitter of the second triode is connected with the first power supply end, and the collector of the second triode is connected with the target measured controller.
3. A circuit for testing controller functionality according to claim 2, wherein said circuit further comprises a first overcurrent protection unit;
the first overcurrent protection unit is respectively connected with the first switch unit and the target measured controller, and is used for sending an overcurrent signal to the first switch unit when the current output by the first switch unit exceeds a preset value, so that the first switch unit controls the first power supply end to stop supplying power to the target measured controller.
4. A circuit for testing a controller function according to claim 3, wherein said first overcurrent protection unit comprises: the third resistor, the fourth resistor, the fifth resistor, the sixth resistor, the third triode, the seventh resistor, the second diode and the thyristor;
a first end of the fifth resistor is connected with a collector of the second triode, and a second end of the fifth resistor is connected with the target measured controller;
a base electrode of the third triode is connected with a second end of the fifth resistor through a sixth resistor, a collector electrode of the third triode is connected with the anode of the second diode through a seventh resistor, and an emitter electrode of the third triode is connected with a first end of the fifth resistor;
the first end of the thyristor is connected with the anode of the first diode, the second end of the thyristor is grounded, and the third end of the thyristor is connected with the cathode of the second diode.
5. The circuit for testing a function of a controller according to claim 1, wherein the power supply voltage detecting unit comprises: the circuit comprises an eighth resistor, a ninth resistor, a tenth resistor, a fourth diode and a first capacitor;
a first end of the eighth resistor is connected with a first power supply end, and a second end of the eighth resistor is connected with a first end of the ninth resistor;
a second end of the ninth resistor is grounded;
a first end of the tenth resistor is connected with a second end of the eighth resistor, and a second end of the tenth resistor is connected with the MCU;
the anode of the fourth diode is connected with the second end of the tenth resistor, and the cathode of the fourth diode is connected with the second power supply end;
the first end of the first capacitor is connected with the anode of the fourth diode, and the second end of the first capacitor is grounded.
6. A circuit for testing controller functionality according to claim 4, wherein said circuit further comprises an IG control unit;
the IG control unit is respectively connected with the MCU, the power receiving end of the target measured controller and the IG function end of the target measured controller and used for controlling whether the power receiving end of the target measured controller supplies power to the IG function end of the target measured controller or not according to a second control signal sent by the MCU.
7. The circuit for testing controller functionality according to claim 6, wherein said IG control unit comprises: the first MOS transistor comprises an eleventh resistor, a twelfth resistor, a second capacitor, a fourth triode, a thirteenth resistor, a fourteenth resistor and a first MOS transistor;
two ends of the eleventh resistor are respectively connected with the base electrodes of the MCU and the fourth triode;
two ends of the twelfth resistor are respectively connected with the base electrode and the emitting electrode of the fourth triode;
the second capacitor is connected with the twelfth resistor in parallel;
a collector electrode of the fourth triode is connected with a gate electrode of the first MOS transistor through a thirteenth resistor;
two ends of the fourteenth resistor are respectively connected with the source electrode and the drain electrode of the first MOS tube;
the source electrode of the first MOS tube is connected with the power supply receiving end of the target measured controller, and the drain electrode of the first MOS tube is connected with the IG function end of the target measured controller.
8. The circuit for testing controller functionality of claim 1, further comprising a door pop-up control module; the door pop-up control module comprises a second switch unit;
the second switch unit is respectively connected with the first power supply end, the MCU and the control end of the cavity door and used for controlling whether the first power supply end supplies power to the control end of the cavity door or not according to a second control signal sent by the MCU.
9. The circuit for testing a controller function of claim 8, wherein the door pop-up control module further comprises a second overcurrent protection unit;
the second overcurrent protection unit is respectively connected with the second switch unit and the control end of the cavity door, and is used for sending an overcurrent signal to the second switch unit when the output current of the second switch unit exceeds a preset value, so that the second switch unit controls the first power supply end to stop supplying power to the control end of the cavity door.
10. The circuit for testing controller functions of claim 1, wherein the CAN communication unit is further configured to receive speed signal test data, LED output test data, and/or RSSI test data from the target dut, and further configured to transmit the speed signal test data, the LED output test data, and/or RSSI test data;
the MCU is also used for judging the received speed signal test data, the LED output test data and/or the RSSI test data to obtain speed signal test result data, the LED output test result data and/or the RSSI test result data.
CN202210450604.0A 2022-04-27 2022-04-27 Circuit for testing functions of controller Pending CN114740828A (en)

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Application Number Priority Date Filing Date Title
CN202210450604.0A CN114740828A (en) 2022-04-27 2022-04-27 Circuit for testing functions of controller

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210450604.0A CN114740828A (en) 2022-04-27 2022-04-27 Circuit for testing functions of controller

Publications (1)

Publication Number Publication Date
CN114740828A true CN114740828A (en) 2022-07-12

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210450604.0A Pending CN114740828A (en) 2022-04-27 2022-04-27 Circuit for testing functions of controller

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