CN114719996B - High-precision spectral band radiance measuring system and method - Google Patents
High-precision spectral band radiance measuring system and method Download PDFInfo
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Abstract
The invention relates to a high-precision spectral band radiance measuring system and a method, wherein the system comprises an infrared measuring device and a temperature control device; the temperature control device comprises a first water cooler and a second water cooler. And under different lens temperatures, respectively carrying out infrared measurement on the measured target and the black body at different temperatures to obtain corresponding instrument readings. And establishing two overdetermined equation sets according to the instrument reading equation, and solving a least square solution to further obtain the spectral band radiance of the measured target. The method can be used for measuring the band radiance of conventional objects and non-Lambertian bodies such as polished metal surfaces, smooth coating surfaces, optical mirrors, smooth ceramic surfaces and the like in a specific temperature range.
Description
Technical Field
The invention belongs to the field of radiance measurement, and particularly relates to a high-precision radiance measurement system and method, in particular to a spectral band radiance measurement system and method for a non-Lambert body.
Background
The radiance is a physical quantity for representing the surface heat radiation capability of a substance, and is a thermophysical property parameter playing an important role in the fields of infrared temperature measurement, thermal control, infrared target identification and the like. Emissivity is constant for lambertian bodies such as ideal black and ideal gray bodies. However, in many practical materials, the spectral radiance changes quite complex, mostly as a function of wavelength and temperature, and there is a large error when the radiance is taken as a constant. Furthermore, most infrared measurement devices do not respond to a single wavelength nor a full wavelength band, but rather have a certain operating band. The average emissivity in a certain temperature range and wavelength range is called the spectral band emissivity of a specific temperature range and is marked as epsilon Tλ . In fact e Tλ Is the radiance required in the field of infrared measurements.
Currently measuring epsilon Tλ A widely used method is reflectometry. For an opaque object, the average reflectivity rho of the surface of the object in a specific temperature range and a specific wave band range is measured, and then the epsilon of the surface of the object is obtained Tλ ，ε Tλ And (= 1-rho). The method is only suitable for Lambertian bodiesEmissivity measurement of the surface. According to the results of the Yankee study, the object with smooth surface and low emissivity is called non-Lambertian object, the sum of emissivity and reflectivity of which is not equal to 1. In general, the smoother the surface of the object, the further the surface condition deviates from a lambertian body, and the greater the deviation of the sum of emissivity and reflectivity from 1. Conventional reflectance measurements at present are inaccurate for emissivity measurements of non-lambertian bodies. Especially for mirror surfaces and smooth metal surfaces such as optical gold films, silver films, aluminum films and the like, the radiance of the metal surfaces is difficult to accurately measure at present.
Disclosure of Invention
In order to solve the problems, the invention provides a high-precision band radiance measuring system and a high-precision band radiance measuring method in a specific temperature range, which can be used for measuring the radiance of non-lambertian bodies besides conventional objects, and can accurately measure the radiance of non-lambertian bodies such as polished metal surfaces, smooth paint surfaces, optical mirror surfaces, smooth coating surfaces, smooth ceramic surfaces and the like.
The invention is realized by the following technical scheme:
a high-precision spectral band radiance measuring method comprises the following steps:
1.1 determining the target temperature range: according to the actual temperature variation range of the target in the common use environment, a target temperature range covering the actual temperature variation range is given and recorded as [ Ta, tb ].
1.2 determining the ambient temperature range: the ambient temperature range is given as [ TSa, TSb ] depending on the actual temperature range of the environment of use.
1.3 determining blackbody temperature range: the emissivity of the black body does not vary with wavelength and temperature, and the black body temperature range is set to be equal to or less than a target temperature range, which is denoted as TBa, TBb, to reduce the thermal influence of the black body on the infrared detector through convection and radiant heat exchange.
1.4, manufacturing a target temperature changing device;
1.5, sampling m items in a target temperature range [ Ta, tb ] at equal intervals to obtain a temperature sequence { Ti }, wherein i =1,2,. M; sampling z terms at equal intervals for the blackbody temperature range [ TBa, TBb ], and obtaining a temperature number sequence { Tq }, q =1, 2.. Z; sampling an environment temperature range [ TSa, TSb ] to obtain n temperature points, and obtaining a temperature number sequence { TSj }, wherein j =1, 2.. N;
1.6 combining the temperature series { Ti } and { TSj } pairwise to obtain m multiplied by n temperature parameter combinations [ Ti, TSj ]; combining the temperature number series { Tq } and { TSj } in pairs to obtain zxn temperature parameter combinations [ Tq, TSj ];
1.7 measuring instrument readings of the infrared measuring devices corresponding to different temperature parameter combinations:
starting from a first item of the temperature parameter combination [ Ti, TSj ], respectively setting a target temperature and a lens temperature as a temperature value corresponding to each item of the temperature parameter combination [ Ti, TSj ], wherein the lens temperature corresponds to TSj, and simultaneously acquiring an instrument reading { Rs }, s =1,2,. K, corresponding to the infrared measuring device, wherein k = m × n; the instrument reading R is the average value of all pixel readings of the infrared measuring device; the working waveband of the infrared measuring device is equal to the waveband range of spectral band radiance, and is marked as [ lambda 1, lambda 2]; during measurement, the measured target is ensured to be full of the view field of the infrared measuring device;
starting from a first item of the temperature parameter combination [ Tq, TSj ], setting the blackbody temperature and the lens temperature as temperature values corresponding to each item of the temperature parameter combination [ Tq, TSj ], and simultaneously acquiring an instrument reading { RBr }, r =1,2,. H corresponding to the infrared measurement device, wherein h = zxn; during measurement, the blackbody emission surface is ensured to be full of the view field of the infrared measurement device.
1.8 given the temperature values in the series { Ti }, { Tq } and { TSj } for the blackbody temperature, the wavelength band radiation emittance in the wavelength range [ λ 1, λ 2] is denoted as the series { Mi }, { Mq } and { MSj }.
1.9 arrays of { Mi } and { MSj } are combined pairwise to obtain k radiation exitance parameter combinations [ Mi, MSj ], wherein each combination corresponds to an instrument reading { Rs }, s =1,2,. K; the instrument readings are expressed as:
R＝D*M+E*MS+F (1)
substituting [ Mi, MSj ] and corresponding instrument reading { Rs } into formula (1), obtaining k linear equations of two elements to form an over-determined equation set, and writing the over-determined equation set into a matrix form as shown in formula (2):
combining the 1.10 arrays { Mq } and { MSj } in pairs to obtain h (z × n) radiation exitance parameter combinations [ Mq, MSj ], wherein each combination corresponds to an instrument reading { RBr }, and r =1, 2.. H; taking the formula (1) into consideration, further obtaining h linear equations of two-dimensional system, forming an overdetermined equation set, and writing the overdetermined equation set into a matrix form as shown in the formula (3):
1.11 calculating specular radiance: solving a least square solution of the 2 over-determined equation sets according to a least square method, namely obtaining coefficients D, E and F corresponding to the square sum minimum value of each equation error in each equation set, and respectively marking as D0, E0 and F0 and DB, EB and FB; the radiance of the measured object is recorded as epsilon m ，ε m ＝(D0/DB)*ε b (ii) a Wherein epsilon b The emissivity of the black body used.
Further, in 1.4, the measured object is made into a sheet with a thickness of submillimeter level, the sheet is adhered to the surface of a red copper water-cooling head through heat-conducting silica gel, a liquid-cooling cavity is arranged in the water-cooling head, and a liquid outlet and a liquid inlet of the water-cooling head are respectively connected with a liquid inlet and a liquid outlet of a high-temperature-control-precision water-cooling machine; the target temperature is the same as the inflow cooling liquid, and the target temperature can be accurately changed by changing the temperature of the cooling liquid.
Further, the measuring device comprises an infrared measuring device and a temperature control device; the temperature control device comprises a first water cooler and a second water cooler, a thin-wall silica gel hose is connected with a liquid inlet and a liquid outlet of the first water cooler, and the silica gel hose is densely wound on a lens shell of the infrared measuring device.
Furthermore, the infrared measuring device is an infrared focal plane array detector and is matched with a short-focus infrared imaging lens with the F number less than or equal to 1.
Further, the coolant is a glycol type coolant.
The invention also relates to a high-precision spectral band radiance measuring system, which comprises an infrared measuring device and a temperature control device; the temperature control device comprises a first water cooler and a second water cooler, a thin-wall silica gel hose is connected with a liquid inlet and a liquid outlet of the first water cooler, and the thin-wall silica gel hose is densely wound on a lens shell of the infrared measurement device; taking the temperature of the cooling liquid as the temperature of the lens;
the measured object is adhered to the surface of the water cooling head, a liquid cooling cavity is arranged in the water cooling head, a liquid outlet and a liquid inlet of the water cooling head are respectively connected with a liquid inlet and a liquid outlet of the second water cooling machine, and the measurement is carried out according to the method.
Compared with the prior art, the invention has the following beneficial effects:
the method can be used for measuring the band radiance of non-Lambertian bodies such as polished metal surfaces, smooth coating surfaces, optical mirror surfaces, smooth ceramic surfaces and the like.
Drawings
FIG. 1 is a schematic block diagram of a system according to an embodiment of the invention;
wherein: 1-a first water cooler; 2-a liquid inlet; 3-a liquid outlet; 4-an infrared measuring device; 5-thin-wall silica gel hose; 6-a target to be measured; 7-a water cooling head; 8-a liquid inlet pipe; 9-a liquid outlet pipe; 10-a second water cooler.
Detailed Description
The technical solutions in the embodiments will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the examples without making any creative effort, shall fall within the protection scope of the present application.
Unless otherwise defined, technical or scientific terms used in the embodiments of the present application should have the ordinary meaning as understood by those having ordinary skill in the art. The use of "first," "second," and similar terms in the present embodiments does not denote any order, quantity, or importance, but rather the terms are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item preceding the word comprises the element or item listed after the word and its equivalent, but does not exclude other elements or items. "mounted," "connected," and "coupled" are to be construed broadly and may include, for example, fixed and removable connections or integral connections; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. "upper," "lower," "left," "right," "transverse," and "vertical" are used merely for purposes of orientation relative to the elements in the drawings, and these directional terms are relative terms, which are used for descriptive and clarifying purposes and which can vary accordingly depending upon the orientation in which the elements in the drawings are placed.
Example 1
As shown in fig. 1, the high-precision spectral band radiance measuring system of the present embodiment includes an infrared measuring device and a temperature control device. The infrared measuring device consists of an Airi LA6110 movement matched infrared lens with the caliber of 1F number and 5 cm; the temperature control device is arranged on the lens shell of the infrared measuring device. The spectral band radiance of the measured target is obtained by collecting instrument readings of the infrared measuring device with different measured target and lens temperatures and processing the instrument readings.
According to the wave band range of the required spectral band emissivity, selecting infrared measuring devices with the same wave band range, wherein most of the wave band ranges of the required spectral band emissivity are provided with the same wave band infrared measuring devices, and the majority of the wave band ranges are 8-14 micrometers, 3-5 micrometers and the like. The surface source black body is a conventional surface source black body, and the emission surface of the black body can cover the view field of the infrared measuring device.
The embodiment can be used for the spectral band radiance measuring method of various objects including non-lambertian objects in a specific temperature range, and comprises the following steps:
as shown in fig. 1, the high-precision spectral band radiance measuring system of the present embodiment.
Comprises an infrared measuring device 4 and a temperature control device; the temperature control device comprises a first water-cooling machine and a second water-cooling machine, the first water-cooling machine is used for controlling the temperature of a lens of the infrared measuring device, and the second water-cooling machine is used for controlling the temperature of the water-cooling head 7. The thin-wall silica gel hose 5 is connected with the liquid inlet 2 and the liquid outlet 3 of the first water cooler. The thin-wall silica gel hose 5 is densely wound on the lens shell of the infrared measuring device, and because no heat source exists in the lens, the temperature difference between the lens and the cooling liquid is fixed and small after the lens is sufficiently thermally stabilized, and the temperature of the lens can be considered to be equal to that of the cooling liquid.
The infrared measuring device is a non-refrigeration infrared focal plane array detector and is matched with a short-focus infrared imaging lens with the F number less than or equal to 1.
The measured target is a submillimeter-level sheet, the sheet is adhered to the surface of a water cooling head 7 made of red copper through heat-conducting silica gel, a liquid cooling cavity is arranged in the water cooling head 7, a liquid outlet and a liquid inlet of the water cooling head 7 are respectively connected with a liquid inlet and a liquid outlet of a second water cooling machine 10 through a liquid inlet pipe 8 and a liquid outlet pipe 9, and the water cooling machine adopts high-precision PID temperature control. The target temperature is the same as the inflow cooling liquid, and the target temperature can be accurately changed by changing the temperature of the cooling liquid.
The first water cooler 1 and the second water cooler 10 are both KD-3AS high temperature control precision water coolers. The cooling liquid is glycol type cooling liquid.
The high-precision spectral band radiance measuring method comprises the following steps:
1.1 determination of target temperature range: according to the actual temperature variation range of a target in a common use environment, providing a target temperature range covering the actual temperature variation range, and marking as [ Ta, tb ];
1.2 determining the ambient temperature range: according to the actual temperature variation range of the target common use environment, giving an environment temperature range, and recording as [ TSa, TSb ];
1.3 determining blackbody temperature range: the radiance of the black body does not change with the wavelength and the temperature, the temperature range of the black body is set to be equal to or less than the target temperature range so as to reduce the thermal influence of the black body on the infrared detector through convection and radiation heat exchange, and the temperature range of the black body is marked as [ TBa, TBb ];
1.4 make target alternating temperature device, cut into the thickness for the thin slice of submillimeter level to the target of being surveyed, paste the water-cooling head surface at red copper material through heat conduction silica gel, there is the liquid cooling cavity in the water-cooling head, the liquid outlet and the inlet of water-cooling head are connected with the liquid inlet, the liquid outlet of water-cooling machine respectively, and the water-cooling machine adopts high accuracy PID accuse temperature. The target temperature is the same as the inflow cooling liquid, and the target temperature can be accurately changed by changing the temperature of the cooling liquid.
1.5, sampling m items in a target temperature range [ Ta, tb ] at equal intervals to obtain a temperature number sequence { Ti }, wherein i =1,2,. M; sampling z terms at equal intervals in the blackbody temperature range [ TBa, TBb ], and obtaining a temperature number sequence { Tq }, wherein q =1, 2.. Z; sampling an environment temperature range [ TSa, TSb ] to obtain n temperature points, and obtaining a temperature number sequence { TSj }, wherein j =1, 2.. N;
1.6 temperature arrays { Ti } and { TSj } are combined pairwise to obtain m multiplied by n temperature parameter combinations [ Ti, TSj }; combining the temperature number series { Tq } and { TSj } in pairs to obtain zxn temperature parameter combinations [ Tq, TSj ];
1.7 measuring instrument readings of the infrared measuring devices corresponding to different temperature parameter combinations:
starting from a first item of the temperature parameter combination [ Ti, TSj ], respectively setting a target temperature and a lens temperature as a temperature value corresponding to each item of the temperature parameter combination [ Ti, TSj ], wherein the lens temperature corresponds to TSj, and simultaneously acquiring an instrument reading { Rs }, s =1,2,. K, corresponding to the infrared measuring device, wherein k = m × n; the instrument reading R is the average value of all pixel readings of the infrared measuring device; the working waveband of the infrared measuring device is equal to the waveband range of spectral band radiance, and is marked as [ lambda 1, lambda 2]; during measurement, ensuring that the measured target is full of the view field of the infrared measuring device;
starting from a first item of the temperature parameter combination [ Tq, TSj ], respectively setting the black body temperature and the lens temperature as temperature values corresponding to each item of the temperature parameter combination [ Tq, TSj ], and simultaneously acquiring an instrument reading { RBr }, wherein r =1, 2.. H, and h = zxn, corresponding to the infrared measuring device; during measurement, the blackbody emission surface is ensured to be full of the view field of the infrared measurement device.
1.8, the radiation emittance of each wavelength band with the temperature value in [ lambda 1, lambda 2] wavelength range in the blackbody temperature in the number series { Ti }, { Tq } and { TSj } is respectively given, and is marked as the number series { Mi }, { Mq } and { MSj };
1.9 arrays of { Mi } and { MSj } are combined pairwise to obtain k radiation exitance parameter combinations [ Mi, MSj ], wherein each combination corresponds to an instrument reading { Rs }, s =1,2,. K; the instrument reading has both the contribution of the infrared radiation of the measured target and the contribution of the infrared radiation of the lens, and can be expressed as:
R＝D*M+E*MS+F (1)
substituting [ Mi, MSj ] and corresponding instrument reading { Rs } into formula (1), obtaining k binary linear equations to form an over-determined equation set, and writing the over-determined equation set into a matrix form as shown in formula (2):
combining the 1.10 arrays { Mq } and { MSj } in pairs to obtain h (z × n) radiation exitance parameter combinations [ Mq, MSj ], wherein each combination corresponds to an instrument reading { RBr }, and r =1, 2.. H; and (2) taking the equation (1) into the equation (1), further obtaining h linear equations of two-dimensional, forming an overdetermined equation set, and writing the overdetermined equation set into a matrix form as shown in the equation (3):
1.11 calculating specular radiance: solving a least square solution of the 2 overdetermined equation sets according to a least square method, namely obtaining coefficients D, E and F corresponding to the square sum minimum value of each equation error in each equation set, and respectively recording the coefficients D0, E0 and F0 as well as DB, EB and FB; the radiance of the measured object is recorded as epsilon m ，ε m ＝(D0/DB)*ε b . Wherein epsilon b The emissivity of the black body used.
Examples of detection
As a specific example, the infrared measuring device adopts an Airi LA6110 movement, the response wave band is 8-14 μm, and 14 AD bits. The focal plane array scale is 640 x 512, the pixel spacing is 17 micrometers, and the size of the light-sensitive surface of the infrared detector is 1.088 x 0.87cm. The LA6110 movement is furnished with the high-accuracy semiconductor temperature control system, guarantee the movement and focal plane temperature does not change with the fluctuation of ambient temperature. The detector is matched with an infrared lens with the F number of 1 and strong light-gathering capacity, the aperture of the lens is 5cm, and the field of view is 12.4 degrees and 9.9 degrees. The lens adopts circulating liquid cooling temperature control, and a thin-wall silica gel hose filled with cooling liquid is wound on a lens shell of the infrared measuring device. The circulating liquid cooling system consists of a high temperature control precision water cooler and matched water pipes and valves. The cooling liquid is subjected to high-precision temperature control by a water cooler, the temperature control range is wide, and the water cooler is a mature product in the market. The first water cooler 1 and the second water cooler 10 are both KD-3AS high temperature control precision water coolers.
The measured target is an aluminum film with high heat conductivity coefficient, the spectral band radiance of the aluminum film at the wavelength of 8-14 microns within the range of 10-34 ℃ is measured, and the wavelength band is completely the same as the working wavelength band of the infrared detector. Most of the wave band ranges of the common spectral band emissivity are corresponding to the same wave band infrared measuring devices, and most of the common spectral band emissivity are 8-14 microns, 3-5 microns and the like. The aluminium membrane is plated on the surface of the water cooling head, a liquid cooling cavity is arranged in the water cooling head, and the cavity is provided with a complex water path design, so that cooling liquid in the cavity can flow through the back of the aluminium mirror at an approximately uniform flow rate. The water cooling head is matched with a high-precision circulating liquid cooling system based on a water cooling machine. The water cooler adopts high-precision PID to control the temperature of the circulating cooling liquid. In addition, the thermal resistance of the wall surface of the water cooling head is small, and the temperature of the aluminum film is uniform and is the same as that of the flowing cooling liquid. The temperature of the aluminum mirror can be accurately changed by changing the temperature of the cooling liquid.
The planar blackbody is SR800N-12D-LT planar blackbody produced by Israel CI Systems, and the actual radiation rate of the blackbody is 0.97.
According to the actual measurement requirement of the aluminum film mirror band radiance temperature range, determining a target temperature range [10, 34] with the unit of centigrade. And (4) determining the environment temperature range to be [10, 17] according to the specific environment, and setting the blackbody temperature variation range to be [10, 30].
the temperature series { Ti } and { TSj } are combined pairwise to obtain 16 temperature parameter combinations [ Ti, TSj ]: [10, 10],[10, 12],[10, 15],[10, 17],[18, 10],...,[34, 17].
The temperature arrays { Tq } and { TSj } are combined pairwise to obtain 20 temperature parameter combinations [ Tq, TSj ]: [10, 10],[10, 12],[10, 15],[10, 17],[15, 10],...,[30, 17].
And (3) measuring instrument readings of the infrared measuring devices corresponding to different temperature parameter combinations:
the distance between the lens and the measured target is firstly adjusted to ensure that the measured target is full of the visual field of the infrared lens. Then the coolant temperature of the target water-cooled head and the lens coolant temperature are set to the temperature value corresponding to each of the temperature parameter sets [ Ti, TSj ], respectively, for example, for the temperature parameter sets [10, 12], the water-cooled head coolant temperature and the lens coolant temperature are set to 10 and 12 ℃. Instrument readings were then taken for 16 infrared measuring devices corresponding to 16 temperature parameter combinations {5898.8, 6920.5, 8407.7, 9429.0, 5927.2, 6934.3, 8435.1, 9429.0, 5966.8, 6957.5, 8467.9, 9500.7, 6004.5, 6989.1, 8509.7, 9541.2}. The instrument reading R is the average of all pel (640 x 512) readings.
The same method sets the black body temperature and the lens coolant temperature to temperature values corresponding to each of the temperature parameter combinations [ Tq, TSj ], for example, 30 ℃ and 17 ℃ for the temperature parameter combinations [30, 17], respectively, and then obtains instrument readings of 20 infrared measuring devices corresponding to the 20 temperature parameter combinations {5892.7, 6753.4, 8084.6, 8972.9, 6331.1, 7202.4, 8526.8, 9417.1, 6807.7, 7671.0, 8993.5, 9892.3, 7307.8, 8172.1, 9490.8, 10402, 7833.1, 8682.4, 18.1000, 10922.0 }.3, respectively.
And calculating 16 wave band radiation exitance combinations [ Mi, MSj ] corresponding to the 16 temperature parameter combinations. Mi is a blackbody with the temperature Ti, and the radiation emittance in the wavelength band of the operating wavelength band (8-14 mu m) of the infrared measuring device is in the unit of W/(cm ^ 2). MSj is the radiant emittance of a black body with the temperature TEj in a wave band of 8-14 mu m. Each radiation exitance combination [ Mi, MSj ] corresponds to an instrument reading and corresponds to the same instrument reading as the corresponding term [ Ti, TSj ] of the temperature parameter combination.
In the same way, 20 wave band radiation exitance combinations [ Mq, MSj ] corresponding to the 20 temperature parameter combinations are calculated. And each radiation emittance combination [ Mi, MSj ] corresponds to the instrument reading of the temperature parameter combination corresponding item [ Ti, TSj ].
The 16 wave band radiation emittance combinations [ Mi, MSj ] and the corresponding instrument reading { Rs } are respectively brought into Rs = D × Mi + E × MSj + F, and then 16 linear equations are obtained to form an overdetermined equation set.
Similarly, the 20 wave band radiation emittance combinations [ Mq, MSj ] and the corresponding instrument readings { RBr } are respectively brought into RBr = D × Mq + E × MSj + F, so as to obtain 20 linear equations of two-dimensional origin, and form another overdetermined equation set.
Solving an instrument reading model: solving the least square solution of the 2 overdetermined equation sets according to a least square method, and further obtaining coefficients D, E and F corresponding to the square sum minimum value of each equation error in each equation set:
when the mirror surface is measured:
RB＝15961.35*Mq+2180073.77*MSj-22987.92；
when measuring a black body:
R＝392922.22*Mi+1905761.64*MSj-24359.22；
and (3) calculating radiance:
radiance epsilon of the aluminum film to be measured m ，ε m ＝(15961.35/392922.22)*0.97＝0.0394。
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (6)
1. A high-precision spectral band radiance measuring method is characterized in that: the method comprises the following steps:
1.1 determination of target temperature range: according to the actual temperature variation range of a target in a common use environment, providing a target temperature range covering the actual temperature variation range, and marking as [ Ta, tb ];
1.2 determining the ambient temperature range: according to the actual temperature range of the use environment, giving an environment temperature range which is marked as [ TSa, TSb ];
1.3 determining blackbody temperature range: the radiation rate of the black body does not change along with the wavelength and the temperature, the temperature range of the black body is set to be equal to or smaller than the target temperature range so as to reduce the thermal influence of the black body on the infrared detector through convection and radiation heat exchange, and the temperature range of the black body is marked as [ TBa, TBb ];
1.4, manufacturing a target temperature changing device;
1.5, sampling m items in a target temperature range [ Ta, tb ] at equal intervals to obtain a temperature number sequence { Ti }, wherein i =1,2,. M; sampling z terms at equal intervals for the blackbody temperature range [ TBa, TBb ], and obtaining a temperature number sequence { Tq }, q =1, 2.. Z;
sampling an environment temperature range [ TSa, TSb ] to obtain n temperature points, and obtaining a temperature number sequence { TSj }, wherein j =1, 2.. N;
1.6 combining the temperature series { Ti } and { TSj } pairwise to obtain m multiplied by n temperature parameter combinations [ Ti, TSj ]; combining the temperature number series { Tq } and { TSj } in pairs to obtain zxn temperature parameter combinations [ Tq, TSj ];
1.7 measuring instrument readings of the infrared measuring devices corresponding to different temperature parameter combinations:
starting from a first item of the temperature parameter combination [ Ti, TSj ], respectively setting a target temperature and a lens temperature as a temperature value corresponding to each item of the temperature parameter combination [ Ti, TSj ], wherein the lens temperature corresponds to TSj, and simultaneously acquiring an instrument reading { Rs }, s =1,2,. K, corresponding to the infrared measuring device, wherein k = m × n; the instrument reading R is the average value of all pixel readings of the infrared measuring device; the working waveband of the infrared measuring device is equal to the waveband range of spectral band radiance, and is marked as [ lambda 1, lambda 2]; during measurement, ensuring that the measured target is full of the view field of the infrared measuring device;
starting from a first item of the temperature parameter combination [ Tq, TSj ], respectively setting the black body temperature and the lens temperature as temperature values corresponding to each item of the temperature parameter combination [ Tq, TSj ], and simultaneously acquiring an instrument reading { RBr }, wherein r =1, 2.. H, and h = zxn, corresponding to the infrared measuring device; during measurement, the blackbody emission surface is ensured to be full of the view field of the infrared measurement device;
1.8, when the blackbody temperature is respectively the temperature values in the series of { Ti }, { Tq } and { TSj }, the radiation emittance of the wave band in the wavelength range of [ lambda 1, lambda 2] is recorded as the series of { Mi }, { Mq } and { MSj };
combining the 1.9 arrays { Mi } and { MSj } in pairs to obtain k radiation exitance parameter combinations [ Mi, MSj ], wherein each combination corresponds to an instrument reading { Rs }, and s =1, 2.. K; the instrument reading is expressed as:
R＝D*M+E*MS+F (1)
substituting [ Mi, MSj ] and corresponding instrument reading { Rs } into formula (1) to obtain k linear equations of two-dimensional system, forming an over-determined equation set, and writing the over-determined equation set into a matrix form as shown in formula (2):
combining the { Mq } and the { MSj } in a 1.10 number sequence in pairs to obtain h (z × n) radiation exitance parameter combinations [ Mq, MSj ], wherein each combination corresponds to an instrument reading { RBr }, r =1,2, \ 8230h; and (2) taking the equation (1) into the equation (1), further obtaining h linear equations of two-dimensional, forming an overdetermined equation set, and writing the overdetermined equation set into a matrix form as shown in the equation (3):
1.11 calculating specular radiance: solving a least square solution of the 2 overdetermined equation sets according to a least square method, namely obtaining coefficients D, E and F corresponding to the square sum minimum value of each equation error in each equation set, and respectively recording the coefficients D0, E0 and F0 as well as DB, EB and FB; the radiance of the measured object is recorded as epsilon m ，ε m ＝(D0/DB)*ε b (ii) a Wherein epsilon b The emissivity of the black body used.
2. The method of claim 1, wherein: 1.4, manufacturing a measured object into a sheet with the thickness of submillimeter level, adhering the sheet to the surface of a water cooling head through heat-conducting silica gel, wherein a liquid cooling cavity is arranged in the water cooling head, and a liquid outlet and a liquid inlet of the water cooling head are respectively connected with a liquid inlet and a liquid outlet of a high-temperature-control-precision water cooling machine; the target temperature is the same as the inflow cooling liquid, and the target temperature can be accurately changed by changing the temperature of the cooling liquid.
3. The method of claim 1, wherein: the measuring device comprises an infrared measuring device and a temperature control device; the temperature control device comprises a first water cooler and a second water cooler, a thin-wall silica gel hose is connected with a liquid inlet and a liquid outlet of the first water cooler, and the silica gel hose is densely wound on a lens shell of the infrared measuring device.
4. The method of claim 3, wherein: the infrared measuring device is an infrared focal plane array detector and is matched with a short-focus infrared imaging lens with the F number less than or equal to 1.
5. The method of claim 3, wherein: the cooling liquid of the liquid cooling system is glycol type cooling liquid.
6. A high accuracy spectral band radiance measurement system which characterized in that: comprises an infrared measuring device and a temperature control device; the temperature control device comprises a first water cooler and a second water cooler, a thin-wall silica gel hose is connected with a liquid inlet and a liquid outlet of the first water cooler, and the thin-wall silica gel hose is densely wound on a lens shell of the infrared measurement device; taking the temperature of the cooling liquid as the temperature of the lens;
the object to be measured is adhered to the surface of a water cooling head through heat-conducting silica gel, a liquid cooling cavity is arranged in the water cooling head, and a liquid outlet and a liquid inlet of the water cooling head are respectively connected with a liquid inlet and a liquid outlet of a second water cooling machine, and the measurement is carried out according to the method of any one of claims 1 to 5.
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