CN114705935A - Testing method and testing platform for grid-connected electronic equipment - Google Patents
Testing method and testing platform for grid-connected electronic equipment Download PDFInfo
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- CN114705935A CN114705935A CN202210322520.9A CN202210322520A CN114705935A CN 114705935 A CN114705935 A CN 114705935A CN 202210322520 A CN202210322520 A CN 202210322520A CN 114705935 A CN114705935 A CN 114705935A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
Abstract
The application discloses a testing method and a testing platform of grid-connected electronic equipment, wherein one side of the grid-connected electronic equipment is connected with a power grid simulation source, the power grid simulation source is used for generating a simulation power grid, the other side of the grid-connected electronic equipment is connected with a power supply, and the testing method comprises the step of configuring the power supply to provide power for the grid-connected electronic equipment so that the grid-connected electronic equipment is in a working state. And configuring a power grid phase angle mutation test program for the power grid simulation source, so that the preset phase angle and the preset angle range of the simulation power grid at the preset phase angle mutation preset angle are both [0 degrees and 360 degrees ]. Monitoring the output of the grid-connected electronic equipment when the power grid phase angle sudden change test program runs. Through the mode, the quality coefficient of the grid-connected electronic equipment can be improved.
Description
Technical Field
The application relates to the technical field of grid connection, in particular to a test method and a test platform for grid-connected electronic equipment.
Background
With the wide application of power generation systems, the requirement for the grid-connected electronic equipment to be connected into the power grid is increasingly strict, and the grid-connected electronic equipment is required to respond to any change of the power grid in time. Therefore, it is important to determine whether grid-connected electronic devices can be effectively integrated into the power grid.
Most of the existing test schemes evaluate the adaptability of the grid-connected electronic equipment to the phase of the power grid by randomly disconnecting the power grid so as to evaluate whether the grid-connected electronic equipment can be effectively incorporated into the power grid. However, the random power-off mode cannot accurately simulate the actual state of the power grid phase under the real condition. Therefore, the test result is not accurate, so that the problem that the grid-connected electronic equipment may have when being connected to a real power grid is difficult to find, and the quality coefficient of the grid-connected electronic equipment is influenced finally.
Disclosure of Invention
The application aims to provide a testing method and a testing platform for grid-connected electronic equipment, which can improve the quality coefficient of the grid-connected electronic equipment.
In order to achieve the above object, in a first aspect, the present application provides a method for testing a grid-connected electronic device, where one side of the grid-connected electronic device is connected to a power grid analog source, the power grid analog source is used to generate an analog power grid, and the other side of the grid-connected electronic device is connected to a power supply, where the method for testing the grid-connected electronic device includes:
the power supply is configured to provide power for the grid-connected electronic equipment so that the grid-connected electronic equipment is in a working state;
configuring a power grid phase angle mutation test program for the power grid simulation source so that the simulation power grid mutates a preset angle at a preset phase angle, wherein the ranges of the preset phase angle and the preset angle are both [0 degrees and 360 degrees ];
and monitoring the output of the grid-connected electronic equipment when the power grid phase angle sudden change test program runs.
In an alternative, the preset phase angles are 0 °, 90 °, 180 ° and 270 °.
In an optional mode, a preset phase angle of 0 °/180 ° is configured in the power grid phase angle sudden change test program, and the test that the preset angle is gradually increased is performed.
In an optional mode, a preset phase angle of 90 °/270 ° is configured later in the power grid phase angle sudden change test program, and the preset angle is tested in a gradually increasing mode.
In an alternative form, the preset angles are 90 °, 180 °, 270 ° and 360 °.
In an optional manner, the grid-connected electronic device is a single-phase grid-connected electronic device or a three-phase grid-connected electronic device, and correspondingly, the analog grid is a single-phase grid or a three-phase grid.
In an optional manner, the method further comprises:
after the simulation power grid suddenly changes the preset angle every time,
if the output waveform of the grid-connected electronic equipment follows the output waveform of the analog power grid, or the output waveform of the grid-connected electronic equipment follows the output waveform of the analog power grid after interruption, determining that the grid-connected electronic equipment passes the test;
and if the output of the grid-connected electronic equipment is smaller than a preset threshold value, determining that the grid-connected electronic equipment fails the test.
In a second aspect, the present application provides a test platform for grid-connected electronic devices, including:
the power supply is used for supplying power to the grid-connected electronic equipment;
the power grid simulation source is used for outputting a simulation power grid with a preset angle suddenly changed at a preset phase angle based on the configured power grid phase angle sudden change test program, and the ranges of the preset phase angle and the preset angle are both [0 degrees and 360 degrees ];
and the monitoring and analyzing device is used for monitoring the output of the grid-connected electronic equipment when the power grid phase angle mutation test program runs.
In an optional manner, the test platform further comprises:
and the control device is used for controlling the power supply, the power grid simulation source and the monitoring analysis device.
In a third aspect, the present application provides a non-transitory computer-readable storage medium having stored thereon computer-executable instructions that, when executed by a processor, cause the processor to perform a method as described above.
The beneficial effect of this application is: according to the testing method of the grid-connected electronic equipment, the phase angle mutation is carried out by mutating the preset angle at the preset phase angle of the simulated power grid connected with the grid-connected electronic equipment, and the output of the grid-connected electronic equipment when the mutated preset angle is gradually increased is recorded and analyzed, so that the state of the real power grid when the phase angle mutates can be simulated to test whether the quality of the grid-connected electronic equipment meets the testing standard or not under the actual condition. And then, when the grid-connected electronic equipment is determined to meet the test standard, the grid-connected electronic equipment is put into a real power grid for use, otherwise, corresponding improvement is needed, so that the quality coefficient of the grid-connected electronic equipment is improved.
Drawings
One or more embodiments are illustrated by way of example in the accompanying drawings, which correspond to the figures in which like reference numerals refer to similar elements and which are not to scale unless otherwise specified.
Fig. 1 is a schematic structural diagram of a test platform of grid-connected electronic equipment according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of a test platform of grid-connected electronic equipment according to another embodiment of the present application;
fig. 3 is a schematic structural diagram of a control device 40 according to an embodiment of the present application;
fig. 4 is a flowchart of a testing method for grid-connected electronic devices according to an embodiment of the present disclosure;
fig. 5 is a working flow of testing a single-phase grid-connected electronic device and a three-phase grid-connected electronic device provided in the embodiment of the present application;
fig. 6a, fig. 6b, fig. 6c and fig. 6d are schematic diagrams of output waveforms of abrupt change angles of 90 °, 180 °, 270 ° and 360 °, respectively, provided by an embodiment of the present application when the preset phase angle is 0 °;
7a, 7b and 7c are schematic diagrams of output waveforms of abrupt change angles of 90 °, 180 ° and 270 ° respectively when the preset phase angle is 90 ° in the simulation grid provided by the embodiment of the present application;
fig. 8a and 8b are schematic diagrams of output waveforms of abrupt change angles of 90 ° and 180 ° respectively when the preset phase angle is 180 ° in a simulation power grid provided by an embodiment of the present application;
fig. 9 is a schematic diagram of an output waveform of a simulated power grid with an abrupt change angle of 90 ° when a preset phase angle is 270 ° according to an embodiment of the present application;
fig. 10a, 10b, 10c and 10d are schematic diagrams of output waveforms of abrupt change angles of 90 °, 180 °, 270 ° and 360 ° when the phase angle of the first phase is 0 °, the phase angle of the second phase is 240 ° and the phase angle of the third phase is 120 °, respectively, of a simulated grid provided by an embodiment of the present application;
11a, 11b and 11c are schematic diagrams of output waveforms of abrupt change angles of 90 °, 180 ° and 270 ° when the phase angle of the first phase is 90 °, the phase angle of the second phase is 330 ° and the phase angle of the third phase is 210 °, respectively, of the simulated grid according to the embodiment of the present application;
fig. 12a and 12b are schematic diagrams of output waveforms of abrupt change angles of 90 ° and 180 ° when the phase angle of the first phase is 180 °, the phase angle of the second phase is 60 °, and the phase angle of the third phase is 300 °, respectively, of a simulation grid provided by an embodiment of the present application;
fig. 13 is a schematic diagram of an output waveform of an abrupt change angle of 90 ° when a phase angle of a first phase is 270 °, a phase angle of a second phase is 150 °, and a phase angle of a third phase is 30 ° in a simulated power grid provided by an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Referring to fig. 1, fig. 1 is a schematic view of a test platform of a grid-connected electronic device according to an embodiment of the present disclosure. As shown in fig. 1, the test platform 100 includes a power supply 10, a grid simulation source 20, and a monitoring and analyzing device 30. One side of the grid-connected electronic device 200 is connected to the grid simulation source 20, the other side of the grid-connected electronic device 200 is connected to the power supply 10, and the output of the grid-connected electronic device 200 is further connected to the monitoring and analyzing device 30.
Specifically, the power supply 10 is configured to provide power to the grid-connected electronic device 200, and then the grid-connected electronic device 200 may be powered on and enter an operating state, and the grid-connected electronic device 200 may output voltage and current.
Grid simulation source 20 is used to generate a simulated grid. And by adjusting the parameter configuration of the power grid simulation source 20, the simulated power grid generated by the power grid simulation source 20 can simulate different working states of a real power grid. The specific process includes firstly configuring a power grid phase angle mutation test program for the power grid simulation source 20, and then outputting the simulation power grid with a preset angle at a preset phase angle mutation by the power grid simulation source 20 based on the configured power grid phase angle mutation test program. The simulation power grid can be used for carrying out grid-connected test on grid-connected electronic equipment.
The monitoring and analyzing device 30 is used for monitoring the output of the grid-connected electronic equipment when the power grid phase angle sudden change test program runs. Specifically, the monitoring and analyzing device 30 may record and analyze the output (such as a voltage waveform, a current waveform, and the like) of the grid-connected electronic device 200 to determine whether the grid-connected electronic device 200 meets the test standard.
The grid-connected electronic device 200 may be a grid-connected device such as a photovoltaic grid-connected inverter, a wind-solar grid-connected inverter, or the like.
In one embodiment, as shown in FIG. 2, the test platform 100 further comprises a control device 40. The control device 40 is used for controlling the power supply 10, the grid simulation source 20, and the monitoring and analyzing device 30.
Specifically, first, the control device 40 controls the power supply 10 to output a direct current, and inputs the direct current to the grid-connected electronic device 200 to be tested, so that the grid-connected electronic device 200 to be tested is powered on. Next, the control device 40 configures a power grid phase angle jump test program for the power grid simulation source 20, so that the power grid simulation source 20 outputs the simulation power grid 40 with a preset phase angle jump, and then the tested grid-connected electronic device 200 is operated in a grid-connected manner. Finally, the control device 40 controls the monitoring and analyzing device 30 to record and analyze the output (such as the grid waveform and the current waveform) of the tested grid-connected electronic device 200.
The control device 40 may be a Micro Controller Unit (MCU) or a Digital Signal Processing (DSP) controller.
Fig. 3 also illustrates an exemplary configuration of the control device 40, and as shown in fig. 3, the control device 40 includes at least one processor 41 and a memory 42, where the memory 42 may be built in the control device 40 or external to the control device 40, and the memory 42 may be a remote memory connected to the control device 40 through a network.
The processor 41 executes various functions of the terminal and processes data by running or executing software programs and/or modules stored in the memory 42 and calling data stored in the memory 42, so as to perform overall monitoring on the terminal, for example, implement a testing method of the grid-connected electronic device according to any embodiment of the present application.
The processor 41 may be one or more, and one processor 41 is illustrated in fig. 1. The processor 41 and the memory 42 may be connected by a bus or other means. Processor 41 may include a Central Processing Unit (CPU), Digital Signal Processor (DSP), Application Specific Integrated Circuit (ASIC), controller, Field Programmable Gate Array (FPGA) device, or the like. Processor 41 may also be implemented as a combination of computing devices, e.g., a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP core, or any other such configuration.
It should be noted that the hardware configuration of test platform 100 as shown in fig. 2 is merely an example, and that test platform 100 may have more or fewer components than shown in the figures, may combine two or more components, or may have a different configuration of components, and that the various components shown in the figures may be implemented in hardware, software, or a combination of hardware and software including one or more signal processing and/or application specific integrated circuits. For example, the monitoring and analyzing device 30 may be one of the functional modules in the testing platform 100, or may be integrated into the control device 40.
Referring to fig. 4, fig. 4 is a diagram illustrating a testing method for grid-connected electronic equipment according to an embodiment of the present disclosure. One side of the grid-connected electronic equipment is connected with a power grid simulation source, the power grid simulation source is used for generating a simulation power grid, and the other side of the grid-connected electronic equipment is connected with a power supply. For the connection relationship between the grid-connected electronic device and the power supply and the grid analog source, reference may be made to the above detailed description of fig. 1 and fig. 2, which is not described herein again. As shown in fig. 4, the testing method of the grid-connected electronic device includes the following steps:
step 401: and configuring a power supply to provide power for the grid-connected electronic equipment so as to enable the grid-connected electronic equipment to be in a working state.
Specifically, one side of the grid-connected electronic equipment is connected to a power grid simulation source, the other side of the grid-connected electronic equipment is connected to a power supply, and when the test is started, the power supply is started to supply power to the grid-connected electronic equipment so that the power of the grid-connected electronic equipment is in a normal working state.
Step 402: and configuring a power grid phase angle mutation test program for the power grid simulation source so that the simulation power grid mutates a preset angle at a preset phase angle.
The preset phase angle is any phase angle of the simulation power grid. The ranges of the preset phase angle and the preset angle are both [0 ° and 360 ° ], and the preset phase angle and the preset angle may be correspondingly set according to the actual application situation, which is not specifically limited in the embodiment of the present application.
In this embodiment, by configuring a power grid phase angle sudden change test program for the power grid simulation source, parameter configuration of the power grid simulation source can be realized, so that the power grid simulation source can output a simulated power grid with a preset phase angle sudden change of a preset angle (for example, a phase angle sudden change of 90 ° at 0 °). Therefore, the process of simulating the sudden phase angle change of the real power grid is realized.
In the actual testing process of the grid-connected electronic equipment, the simulated power grid can be suddenly changed at different angles at a plurality of phase angles so as to simulate the working state of the real power grid. Meanwhile, a plurality of groups of comparison tests can be designed to simulate the process of phase angle mutation of a real power grid as much as possible, and the adaptability of the grid-connected electronic equipment to the phase angle mutation of the power grid can be verified more accurately, namely whether the grid-connected electronic equipment is shut down or not in the process of the phase angle mutation of the power grid is verified.
Step 403: monitoring the output of the grid-connected electronic equipment when the power grid phase angle sudden change test program runs.
When the power grid phase angle mutation test program runs, the output of the grid-connected electronic equipment is monitored, and whether the quality of the grid-connected electronic equipment meets the test standard or not can be simulated when the grid-connected electronic equipment is used in a real power grid if the phase angle mutation occurs in the power grid. Furthermore, if the quality of the grid-connected electronic equipment is determined to meet the test standard, the grid-connected electronic equipment is put into a real power grid for use, otherwise, the grid-connected electronic equipment needs to be improved, so that the grid-connected electronic equipment can be effectively incorporated into the power grid, namely the quality coefficient of the grid-connected electronic equipment is higher.
In one embodiment, the preset phase angles are 0 °, 90 °, 180 °, and 270 °.
The angles of 0 °, 90 °, 180 ° and 270 ° correspond to several special states in the power grid waveform, specifically, the angles of 0 ° and 180 ° correspond to the zero point of the power grid waveform, the angles of 90 ° correspond to the peaks of the power grid waveform, and the angles of 270 ° correspond to the troughs of the power grid waveform. The influence of sudden change of the phase angle on the grid-connected electronic equipment is the lowest at the zero point (namely 0 degree and 180 degrees) of the waveform of the power grid, namely the power grid environment is the most loose at the moment; the sudden change of the phase angle at the peak or the trough (i.e. 90 ° or 270 °) of the power grid waveform has the greatest influence on the grid-connected electronic device because the voltage change generated at the peak and the trough of the voltage is the most serious, and the output current of the grid-connected electronic device is the most serious at this time, i.e. the power grid environment is the most severe at this time.
Therefore, when the preset phase angles are 0 degrees, 90 degrees, 180 degrees and 270 degrees, the sudden change of the phase angles can accurately reflect the overall situation of the power grid waveform, namely, the number of the preset phase angles is small on the premise of keeping the test accuracy, and the work efficiency is improved. Of course, in other embodiments, the preset phase angle may be set to other angles, and more or less preset phase angles may also be selected, which is not specifically limited in the embodiments of the present application.
In one embodiment, a test that a preset phase angle is 0 °/180 ° and the preset angle is gradually increased is configured in a power grid phase angle sudden change test program.
Specifically, since the grid environment is the most relaxed between 0 ° and 180 ° (i.e., when the grid waveform is at zero), when the grid-connected electronic device still fails to meet the test standard under this condition, it is determined that the grid-connected electronic device fails to meet the test standard under other conditions. In general, in such a case, it may be determined that the grid-connected electronic device cannot meet the grid-connected condition at present, and needs to be repaired or modified. On the contrary, if the preset phase angle is configured as another phase angle at a non-zero point of the power grid waveform, for example, 90 °, even if the phase angle passes the phase angle mutation test, further tests are performed when the preset phase angle is 0 ° or 180 °, which increases the complexity of the test process.
Therefore, in this embodiment, the preset phase angle is preferentially configured to be 0 °/180 °, and the test in which the preset angle is gradually increased is performed, which is beneficial to simplifying the test process, so as to improve the test efficiency and save the test time.
In addition, in order to better test and verify the adaptability of the grid-connected electronic equipment to the phase angle mutation of the power grid, a plurality of groups of comparison experiments are designed, namely, the preset angles of the preset phase angle mutation are gradually increased. For example, in a first set of experiments, the preset angle of the simulated power grid at the sudden change of the preset phase angle is set to 90 °, in a second set of experiments, the preset angle of the simulated power grid at the sudden change of the preset phase angle is set to 180 °, and in a third set of experiments, the preset angle of the simulated power grid at the sudden change of the preset phase angle is set to 270 ° to verify whether the tested grid-connected electronic device can meet the test standard at each set preset angle. The number of the comparison experiments, that is, the number of the preset angles can be set according to actual requirements, and is not limited herein.
Of course, in other embodiments, a test in which the preset phase angle is 0 °/180 ° and the preset angle is gradually decreased may be configured. That is, after the preset phase angle is configured to be 0 °/180 °, the adopted preset angle may be set according to the actual application, for example, gradually increased, gradually decreased, or increased and decreased, and the embodiment of the present application does not specifically limit this.
In some embodiments, when the grid-connected electronic device performs a phase angle jump between 0 ° and 180 ° in the simulation grid and the test standard is satisfied in the test in which the preset angle is gradually increased, the test in which the preset phase angle is configured to be 90 ° and 270 ° is continued, and the preset angle is gradually increased is performed.
Specifically, when the grid-connected electronic device performs phase angle sudden change at 0 ° and 180 ° in the simulated grid and the test standard is satisfied in the test in which the preset angle is gradually increased, it indicates that the grid-connected electronic device can adapt to the situation of the phase angle sudden change of the grid at the time when the grid environment is most relaxed. Then, the condition of sudden change of the phase angle of the power grid at the most severe time of the power grid environment needs to be further simulated so as to test and verify the adaptability of the grid-connected electronic equipment under the condition.
Therefore, experiments are provided for simulating phase angle jump of the power grid at 90 ° and 270 ° (namely, peak and trough), respectively, and the preset angle of the phase angle jump is gradually increased. If the grid-connected electronic equipment meets the test standard under the condition, the corresponding grid-connected electronic equipment can adapt to the condition of sudden change of the phase angle of the power grid at the most loose moment of the power grid environment and can also adapt to the condition of sudden change of the phase angle of the power grid at the most severe moment of the power grid environment, so that the grid-connected electronic equipment can be accurately determined to be effectively incorporated into a real power grid, and the quality coefficient of the grid-connected electronic equipment is higher. In addition, in the embodiment, only a part of more important nodes are selected for testing, so that the testing efficiency can be more effectively improved on the premise of the testing accuracy.
Similarly, in other embodiments, after the grid-connected electronic device performs the phase angle jump between 0 ° and 180 ° in the simulation grid and the test criterion is satisfied in the test in which the preset angle is gradually increased, the test in which the preset phase angle is configured to be 90 ° and 270 ° and the preset angle is gradually decreased may be continued. That is, after the preset phase angles are configured to be 90 ° and 270 °, the adopted preset angles may also be set according to the actual application, for example, increasing gradually, decreasing gradually, or increasing first and then decreasing, and the embodiment of the present application does not specifically limit this.
In some embodiments, the grid-connected electronic device may be a single-phase grid-connected electronic device or a three-phase grid-connected electronic device, and the analog grid is a single-phase grid or a three-phase grid, respectively.
When the grid-connected electronic equipment can be single-phase grid-connected electronic equipment, the simulation power grid generated by the power grid simulation source is a single-phase power grid; when the grid-connected electronic equipment can be three-phase grid-connected electronic equipment, the simulated power grid generated by the power grid simulation source is a three-phase power grid.
Specifically, in the test and verification of the actual grid-connected electronic device, only the test of the phase angle jump of the single-phase power grid can be performed, the test of the phase angle jump of the three-phase power grid can also be performed, or the test of the phase angle jump of any two-phase power grid in the three phases can be performed, that is, different power grids can be set according to the actual test and verification requirements to perform the phase angle jump test scheme.
In some embodiments, after the simulation grid suddenly changes the preset angle each time, if the output of the grid-connected electronic device is smaller than a preset threshold, it is determined that the grid-connected electronic device fails the test.
The preset threshold may be set according to an actual application situation, which is not specifically limited in the embodiment of the present application. For example, in an embodiment, the preset threshold may be set to be close to 0, and if the output of the grid-connected electronic device is smaller than the preset threshold, it is determined that the grid-connected electronic device fails to pass the test, which corresponds to that the grid-connected electronic device may not output due to the damage of the grid-connected electronic device at this time.
In other embodiments, the grid-connected electronic device may be determined to pass the test if the output waveform of the grid-connected electronic device can follow the output waveform of the analog grid after the analog grid suddenly changes by the preset angle, or the output waveform of the grid-connected electronic device can resume following the output waveform of the analog grid after the output waveform of the grid-connected electronic device is interrupted.
For the reason that the output waveform of the grid-connected electronic device can resume following the output waveform of the analog power grid after being interrupted, the interruption duration of the output waveform of the grid-connected electronic device can be set according to the actual application situation, and the embodiment of the application does not specifically limit the interruption duration. And the shorter the interruption time, the better the adaptability of the grid-connected electronic equipment to the power grid.
For example, in one embodiment, before the power grid suddenly changes by a preset angle, the waveform output by the grid-connected electronic device is a sine wave, after the simulation of the power grid suddenly changes by the preset angle, the output waveform of the simulation power grid continues to be kept as the sine wave by taking the suddenly changed angle as a starting point, and the output waveform of the grid-connected electronic device can follow the output waveform of the simulation power grid to determine that the grid-connected electronic device passes the test; at the moment, the grid-connected electronic equipment has better adaptability to the power grid, and the quality coefficient of the grid-connected electronic equipment is kept in a higher standard. Or after the simulation power grid suddenly changes the preset angle, the output waveform of the simulation power grid is continuously kept as a sine wave by taking the suddenly changed angle as a starting point, the following of the output waveform of the simulation power grid can be recovered after the output waveform of the grid-connected electronic equipment is interrupted, and the grid-connected electronic equipment is also determined to pass the test; at the moment, the grid-connected electronic equipment has good adaptability to the power grid, namely, the grid-connected electronic equipment can also adapt to sudden changes of the power grid.
To sum up, the test method for the grid-connected electronic device provided in the embodiment of the present application simulates a state of a real power grid when a phase angle suddenly changes so as to test whether the quality of the grid-connected electronic device meets a test standard under an actual condition by performing a phase angle sudden change at a preset phase angle of a simulated power grid to which the grid-connected electronic device is connected, suddenly changing the preset angle, and recording and analyzing an output of the grid-connected electronic device when the suddenly changed preset angle gradually increases. When the grid-connected electronic equipment can adapt to the state of the simulated power grid when the phase angle suddenly changes, specifically, the simulated power grid cannot stop the grid-connected electronic equipment when the phase angle suddenly changes, the grid-connected electronic equipment conforms to the test standard and can be put into use by a real power grid, otherwise, corresponding improvement is needed, and therefore the quality coefficient of the grid-connected electronic equipment is improved.
In addition, the testing method also provides a set of standardized testing flow scheme to standardize the testing operation of the grid-connected electronic equipment, thereby improving the quality and the working efficiency of the grid-connected testing of the grid-connected electronic equipment.
The test method of the present application is described in more detail below by referring to some specific test examples.
Referring to fig. 5, fig. 5 shows a work flow of testing the single-phase grid-connected electronic device and the three-phase grid-connected electronic device. Specifically, the method comprises the following steps:
step 501: and connecting the single-phase grid-connected electronic equipment or the three-phase grid-connected electronic equipment in a grid-connected mode.
Step 502: and starting a power supply to supply power to the single-phase grid-connected electronic or three-phase grid-connected electronic equipment.
Step 503: and starting the power grid simulation source.
Step 504: and configuring a power grid phase angle mutation test program for the power grid simulation source so that the simulation power grid generated by the power grid simulation source mutates at a preset angle at a preset phase angle.
Step 505: and (5) after the test is finished, powering off the power supply.
Wherein, the range of the preset phase angle and the preset angle is [0 degree, 360 degrees ].
In this embodiment, when the grid-connected electronic device is a single-phase grid-connected electronic device, the specific test result that the output waveform of the simulated grid suddenly changes by the preset angle at the preset phase angle is shown in fig. 6a, 6b, 6c, 6d, 7a, 7b, 7c, 8a, 8b and 9.
Fig. 6a, 6b, 6c, and 6d are output waveforms of which abrupt change angles are 90 °, 180 °, 270 °, and 360 ° respectively when the preset phase angle of the simulation grid is 0 °. Taking fig. 6a as an example, at time t1, the preset phase angle of the simulation grid is 0 °, and the phase angle of the simulation grid is suddenly changed from 0 ° to 90 °. After the time t1, the simulation power grid takes a phase angle of 90 degrees as a starting point and continues to be kept as a sine wave; for fig. 6b, at time t1, when the preset phase angle of the simulation grid is 0 °, the simulation grid changes from 180 ° to 180 ° suddenly, and then continues to keep a sine wave; for fig. 6c, at time t1, when the preset phase angle of the simulation grid is 0 °, the simulation grid suddenly changes from 270 ° to 270 °, and then continues to keep a sine wave; for fig. 6d, at time t1, the simulated grid abruptly changes 360 ° to 360 ° when the preset phase angle is 0 °, and then continues to maintain a sine wave. After the output waveforms of the analog power grids shown in fig. 6a, 6b, 6c, and 6d suddenly change, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can resume following the output waveform of the analog power grid after being interrupted, the grid-connected electronic device meets the test standard, otherwise the grid-connected electronic device does not meet the test standard.
Fig. 7a, 7b and 7c are output waveforms of sudden change angles of 90 °, 180 ° and 270 ° respectively when the preset phase angle of the simulated power grid is 90 °. Taking fig. 7a as an example, at time t2, the preset phase angle of the simulation grid is 90 °, and the phase angle of the simulation grid is suddenly changed from 90 ° to 180 °. After the time t2, simulating the power grid from a phase angle of 180 degrees as a starting point, and continuously keeping the power grid as a sine wave; for fig. 7b, at time t2, when the preset phase angle is 90 °, the simulated grid changes abruptly by 180 ° to 270 °, and then continues to maintain a sine wave; for fig. 7c, at time t2, the simulated grid abruptly changes 270 ° to 360 ° when the preset phase angle is 90 °, and then continues to remain as a sine wave. After the output waveforms of the analog power grids shown in fig. 7a, 7b, and 7c are suddenly changed, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can be recovered to follow the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise the grid-connected electronic device does not meet the test standard.
Fig. 8a and 8b are output waveforms of the simulated power grid with 90 ° and 180 ° abrupt angles respectively when the preset phase angle is 180 °. Taking fig. 8a as an example, at time t3, the preset phase angle of the simulation grid is 180 °, and the phase angle of the simulation grid abruptly changes from 180 ° to 270 °. After the time t3, the simulation power grid takes a phase angle of 270 degrees as a starting point and continues to be kept as a sine wave; for fig. 8b, at time t3, the simulated grid abruptly changes 180 ° to 360 ° at the preset phase angle of 180 °, and then continues to maintain a sine wave. After the output waveform of the analog power grid shown in fig. 8a and 8b suddenly changes, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can recover following the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise, the grid-connected electronic device does not meet the test standard.
Fig. 9 is an output waveform of a simulated power grid with an abrupt change angle of 90 degrees when a preset phase angle is 270 degrees. At the moment t4, the preset phase angle of the simulation power grid is 270 degrees, and the phase angle of the simulation power grid is suddenly changed from 270 degrees to 360 degrees. After time t4, the simulated grid starts at a phase angle of 360 ° and continues to remain a sine wave. After the output waveform of the analog power grid shown in fig. 9 suddenly changes, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can recover following the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise the grid-connected electronic device does not meet the test standard.
When the grid-connected electronic device is a three-phase grid-connected electronic device, the specific test result of the sudden change of the output waveform of the analog power grid at the preset phase angle by the preset angle is shown in fig. 10a, 10b, 10c, 10d, 11a, 11b, 11c, 12a, 12b and 13.
Fig. 10a, 10b, 10c, and 10d show output waveforms of the simulation grid at 90 °, 180 °, 270 °, and 360 ° abrupt changes when the phase angle of the first phase is 0 °, the phase angle of the second phase is 240 °, and the phase angle of the third phase is 120 °. Taking fig. 10b as an example, at time t5, as shown by a curve L101, the preset phase angle of the simulated grid in the first phase is 0 °, and the phase angle of the simulated grid changes abruptly from 0 ° to 180 °; as shown by a curve L102, the preset phase angle of the simulated grid in the second phase is 240 °, and the phase angle of the simulated grid is suddenly changed from 240 ° to 60 °; as shown by the curve L103, the preset phase angle of the utility grid in the first phase is 120 °, and the phase angle of the utility grid is abruptly changed from 120 ° to 300 °. After time t5, the first phase of the simulated power grid takes the phase angle of 180 ° as a starting point, the second phase takes the phase angle of 60 ° as a starting point, the second phase takes the phase angle of 300 ° as a starting point, and the simulated power grid continues to be maintained as a sine wave; for fig. 10a, at time t5, when the phase angles of the first phase, the second phase and the third phase of the simulated grid are 0 °, 240 ° and 120 °, respectively, the simulated grid is suddenly changed by 90 ° to 90 °, 330 ° and 210 °, and then the simulated grid continues to be maintained as a sine wave; for fig. 10c, at time t5, when the phase angles of the first phase, the second phase and the third phase of the simulation grid are 0 °, 240 ° and 120 °, respectively, the simulation grid is suddenly changed by 270 ° to 270 °, 150 ° and 30 °, and then the simulation grid continues to be maintained as a sine wave; for fig. 10d, at time t5, when the phase angles of the first phase, the second phase and the third phase of the simulated grid are 0 °, 240 ° and 120 °, the simulated grid changes abruptly by 360 °, 240 ° and 120 °, and then keeps on maintaining a sine wave. After the output waveforms of the analog power grids shown in fig. 10a, 10b, 10c, and 10d suddenly change, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can recover following the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise the grid-connected electronic device does not meet the test standard.
11a, 11b and 11c are output waveforms of the simulation power grid with the abrupt angle of 90 °, 180 ° and 270 ° when the phase angle of the first phase, the phase angle of the second phase and the phase angle of the third phase of the simulation power grid are 90 °, 330 ° and 210 °, respectively. Taking fig. 11a as an example, at time t6, as shown by a curve L111, the preset phase angle of the simulated grid in the first phase is 90 °, and the phase angle of the simulated grid is suddenly changed from 90 ° to 180 °; as shown by a curve L112, the preset phase angle of the simulated grid in the second phase is 330 °, and the phase angle of the simulated grid is suddenly changed from 330 ° to 60 °; as shown by the curve L113, the preset phase angle of the utility grid in the first phase is 120 °, and the phase angle of the utility grid is abruptly changed from 120 ° to 300 °. After time t6, the first phase of the simulated power grid takes the phase angle of 180 ° as a starting point, the second phase takes the phase angle of 60 ° as a starting point, the second phase takes the phase angle of 300 ° as a starting point, and the simulated power grid continues to be maintained as a sine wave; for fig. 11b, at time t6, when the phase angles of the first phase, the second phase and the third phase of the simulation grid are 90 °, 330 ° and 210 °, respectively, the simulation grid is suddenly changed by 180 ° to 270 °, 150 ° and 30 °, and then the simulation grid continues to maintain a sine wave; for fig. 11c, at time t6, when the phase angles of the first phase, the second phase and the third phase of the simulated grid are 90 °, 330 ° and 210 °, the simulated grid is suddenly changed by 270 ° to 360 °, 240 ° and 120 °, and then the simulated grid is continuously maintained as a sine wave. After the output waveforms of the analog power grids shown in fig. 11a, 11b, and 11c suddenly change, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can resume following the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise the grid-connected electronic device does not meet the test standard.
Fig. 12a and 12b are output waveforms of the simulated grid at abrupt angles of 90 ° and 180 ° when the phase angle of the first phase is 180 °, the phase angle of the second phase is 60 °, and the phase angle of the third phase is 300 °, respectively. Taking fig. 12a as an example, at time t7, as shown by a curve L121, the preset phase angle of the simulated grid in the first phase is 180 °, and the phase angle of the simulated grid is suddenly changed from 180 ° to 270 °; as shown by a curve L122, the preset phase angle of the simulated grid in the second phase is 60 °, and the phase angle of the simulated grid is suddenly changed from 60 ° to 150 °; as shown by the curve L123, the preset phase angle of the utility grid in the first phase is 300 °, and the phase angle of the utility grid is abruptly changed from 300 ° to 30 °. After the time t7, the first phase of the simulation power grid takes the phase angle of 270 degrees as a starting point, the second phase takes the phase angle of 150 degrees as a starting point, the second phase takes the phase angle of 30 degrees as a starting point, and the simulation power grid continues to be maintained as a sine wave; for fig. 12b, at time t7, when the phase angles of the first phase, the second phase and the third phase of the simulated grid are 180 °, 60 ° and 300 °, respectively, the simulated grid changes abruptly by 180 ° to 360 °, 240 ° and 120 °, and then keeps a sine wave. After the output waveform of the analog power grid shown in fig. 12a and 12b suddenly changes, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can recover following the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise, the grid-connected electronic device does not meet the test standard.
Fig. 13 is an output waveform of the simulated grid with an abrupt angle of 90 ° when the phase angle of the first phase is 270 °, the phase angle of the second phase is 150 °, and the phase angle of the third phase is 30 °. At the time t8, as shown by a curve L131, the preset phase angle of the simulated power grid at the first phase is 270 °, and the phase angle of the simulated power grid changes from 270 ° to 360 °; as shown by a curve L132, the preset phase angle of the simulated grid in the second phase is 150 °, and the phase angle of the simulated grid is suddenly changed from 150 ° to 240 °; as shown by the curve L133, the preset phase angle of the utility grid in the first phase is 30 °, and the phase angle of the utility grid is abruptly changed from 30 ° to 120 °. After time t8, the first phase of the simulated grid starts at 360 ° from the phase angle, the second phase starts at 240 ° from the phase angle, and the second phase starts at 120 ° from the phase angle and continues to remain as a sine wave. After the output waveform of the analog power grid shown in fig. 13 suddenly changes, if the output waveform of the grid-connected electronic device can follow the output waveform of the analog power grid, or the output waveform of the grid-connected electronic device can recover following the output waveform of the analog power grid after interruption, the grid-connected electronic device meets the test standard, otherwise the grid-connected electronic device does not meet the test standard.
Embodiments of the present application also provide a non-transitory computer-readable storage medium storing computer-executable instructions for execution by one or more processors, for example, to perform the method steps of fig. 4 and 5 described above.
Embodiments of the present application further provide a computer program product comprising a computer program stored on a non-volatile computer-readable storage medium, where the computer program comprises program instructions that, when executed by a computer, cause the computer to perform the method for testing a grid-connected electronic device in any of the above-mentioned method embodiments, for example, to perform the method steps of fig. 4 and 5 described above.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; within the context of the present application, where technical features in the above embodiments or in different embodiments can also be combined, the steps can be implemented in any order and there are many other variations of the different aspects of the present application as described above, which are not provided in detail for the sake of brevity; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.
Claims (10)
1. A testing method of grid-connected electronic equipment is characterized in that one side of the grid-connected electronic equipment is connected with a power grid simulation source, the power grid simulation source is used for generating a simulation power grid, and the other side of the grid-connected electronic equipment is connected with a power supply, and the method comprises the following steps:
the power supply is configured to provide power for the grid-connected electronic equipment so that the grid-connected electronic equipment is in a working state;
configuring a power grid phase angle mutation test program for the power grid simulation source so that the simulation power grid mutates a preset angle at a preset phase angle, wherein the ranges of the preset phase angle and the preset angle are both [0 degrees and 360 degrees ];
and monitoring the output of the grid-connected electronic equipment when the power grid phase angle sudden change test program runs.
2. The method according to claim 1, characterized in that the preset phase angles are 0 °, 90 °, 180 ° and 270 °.
3. The method according to claim 2, characterized in that a test with a preset phase angle of 0 °/180 ° is configured in the power grid phase angle sudden change test program, and the preset angle is gradually increased.
4. The method according to claim 3, characterized in that the preset phase angle of 90 °/270 ° is configured later in the power grid phase angle sudden change test program, and the preset angle is tested in a gradual increase mode.
5. The method according to any of claims 1-4, characterized in that the preset angles are 90 °, 180 °, 270 ° and 360 °.
6. The method according to claim 1, wherein the grid-connected electronic device is a single-phase grid-connected electronic device or a three-phase grid-connected electronic device, and correspondingly, the analog grid is a single-phase grid or a three-phase grid.
7. The method of claim 1, further comprising:
after the simulation power grid suddenly changes the preset angle every time,
if the output waveform of the grid-connected electronic equipment follows the output waveform of the analog power grid, or the output waveform of the grid-connected electronic equipment follows the output waveform of the analog power grid after interruption, determining that the grid-connected electronic equipment passes the test;
and if the output of the grid-connected electronic equipment is smaller than a preset threshold value, determining that the grid-connected electronic equipment fails the test.
8. A test platform of grid-connected electronic equipment is characterized by comprising:
the power supply is used for providing electric power for the grid-connected electronic equipment;
the power grid simulation source is used for outputting a simulation power grid with a preset angle suddenly changed at a preset phase angle based on the configured power grid phase angle sudden change test program, and the ranges of the preset phase angle and the preset angle are both [0 degrees and 360 degrees ];
and the monitoring and analyzing device is used for monitoring the output of the grid-connected electronic equipment when the phase angle mutation test program of the power grid runs.
9. The test platform of claim 8, further comprising:
and the control device is used for controlling the power supply, the power grid simulation source and the monitoring analysis device.
10. A non-transitory computer-readable storage medium having stored thereon computer-executable instructions that, when executed by a processor, cause the processor to perform the method of any one of claims 1-5.
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