CN114691490A

CN114691490A - DCS (distributed control system) screen cabinet automatic test method, equipment and system and readable storage medium

Info

Publication number: CN114691490A
Application number: CN202210167924.5A
Authority: CN
Inventors: 王治国; 于哲; 陈寅; 卢海松; 谭良良; 马雷; 胡华荣; 吴骏; 笃峻; 王翔; 文继锋; 严伟
Original assignee: NR Electric Co Ltd; NR Engineering Co Ltd
Current assignee: NR Electric Co Ltd; NR Engineering Co Ltd
Priority date: 2022-02-23
Filing date: 2022-02-23
Publication date: 2022-07-01

Abstract

The application discloses a DCS screen cabinet automatic test method, equipment, a system and a readable storage medium. The DCS screen cabinet comprises a first controller and a plurality of clamping pieces, and the automatic testing method of the DCS screen cabinet comprises the following steps: the method comprises the steps that a test end obtains design drawing information of a DCS (distributed control System) cabinet; acquiring configuration information of a plurality of clamping pieces through a first controller; checking whether the configuration information is matched with the DCS screen cabinet design drawing information setting; if not, sending an error prompt to adjust the configuration information and checking again; if yes, creating a test sequence logic according to the configuration information, and generating a test instruction; and according to the test instruction and the test sequence logic, automatically executing the card piece function test on the plurality of card pieces. According to the DCS screen cabinet automatic testing method, the card type is automatically identified, and the card function test is automatically completed according to the test sequence logic. Through industrial process automation control, the efficiency of DCS screen cabinet delivery test is improved.

Description

DCS (distributed control system) screen cabinet automatic test method, equipment and system and readable storage medium

Technical Field

The invention relates to the field of industrial process automation control, in particular to a DCS screen cabinet automatic test method, equipment, a system and a readable storage medium.

Background

The dcs (distributed Control system) system is a short name for a distributed Control system, and is also called a distributed Control system. The DCS system is a new Control system developed from the viewpoint of comprehensive automation by integrating process Control and process monitoring together with 4C technologies such as Computer (Computer), Communication (Communication), display (CRT) and Control (Control) in order to meet the requirements of large-scale industrial production and increasingly complex process Control.

The DCS system is basically composed of a field level, a control level, a monitoring level and a management layer level. The field level primarily includes various process channel cards or modules, so the DCS system exists in the form of a cubicle assembly on-site.

The DCS screen cabinet needs to pass strict tests when a manufacturer leaves a factory. However, the inventor finds that the existing DCS cabinet factory test has the following problems.

The type and the quantity of IO cards in the DCS cabinet are more, and the test platform needs to identify the address and the type of the IO cards in each slot, so that multiple cards/equipment need to be integrated correspondingly by the test platform, the operation is relatively complex, and the cost is higher.

The inside interface quantity including a plurality of terminals of DCS screen cabinet is many, and the function exists the difference, and in the testing process, the required connection pencil of test platform is too much, not only makes mistakes easily in loaded down with trivial details wiring, and the wiring finishes still need the manual verification, wastes time and energy.

And 3, the DCS screen cabinet is in default configuration/empty configuration during factory test, and has no functions of acquisition, transmission and the like, so that an additional corresponding configuration needs to be provided for the test platform.

Disclosure of Invention

The application discloses a DCS screen cabinet automatic test method, equipment, a system and a readable storage medium, which can carry out automatic factory test on the DCS screen cabinet.

According to one aspect of the application, a DCS screen cabinet automatic test method is provided.

The method comprises the following steps: the DCS screen cabinet comprises a first controller and a plurality of clamping pieces, and the method comprises the following steps: the method comprises the steps that a test end obtains design drawing information of a DCS screen cabinet; acquiring configuration information of a plurality of clamping pieces through a first controller; checking whether the configuration information is matched with the DCS screen cabinet design drawing information setting; if not, sending an error prompt to adjust the configuration information and checking again; if yes, creating a test sequence logic according to the configuration information, and generating a test instruction; and automatically executing the function test of the card pieces to the plurality of card pieces according to the test instruction and the test sequence logic.

According to some embodiments of the application, the testing end is provided with a plurality of wiring terminals, a plurality of switching board cards, a plurality of card type switching board cards and a plurality of card type testing sources, and the plurality of wiring terminals are connected with the plurality of card pieces in a one-to-one correspondence manner; the plurality of wiring terminals are also connected with the plurality of switching board cards in a one-to-one correspondence manner, the switching board cards are connected with the clamping piece type switching board cards, and the clamping piece type switching board cards are connected with the clamping piece type test sources so as to establish a test environment of the clamping pieces to be tested; according to the test instruction, according to test sequence logic, to a plurality of cards automatic execution card piece functional test include: and the test end sequentially executes instructions in a test instruction set corresponding to the type of the clamping piece to be tested according to the test sequence logic to the clamping piece to be tested under the test environment of the clamping piece to be tested according to the test instructions.

According to some embodiments of the present application, the types of the plurality of cards include an AO card type, an AI card type, a DO card type, a DI card type, and a thermal resistance collection card type; the plurality of card type switching boards comprise an AO switching board, an AI switching board, a DO switching board, a DI switching board and an RTD switching board; the test sources of the types of the cards comprise an AO test source, an AI test source, a DO test source, a DI test source and an RTD test source; the test instruction set of AO fastener kind includes: switching board closing instructions, AI switching board closing instructions, AO card output instructions, AI test source delay sampling instructions, AI switching board disconnection instructions and switching board disconnection instructions; the test instruction set of the AI card type comprises: switching board card closing instructions, AO test source output instructions, AI card delay reading instructions, AO switching board card opening instructions and switching board card closing instructions; the testing instruction set of the DO card type comprises the following steps: switching board closing instructions, DI switching board closing instructions, DO card output instructions, DI test source delay sampling instructions, DI switching board disconnection instructions and switching board disconnection instructions; the testing instruction set of the DI card category comprises: switching board closing instructions, DO test source output instructions, DI card delay reading instructions, DO switching board opening instructions and switching board closing instructions; the kind test instruction set of the thermal resistance acquisition card comprises: the system comprises a switching board card closing instruction, an RTD switching board card closing instruction, a thermal resistance acquisition card reading instruction, a switching board card opening instruction and an RTD switching board card opening instruction.

According to some embodiments of the present application, the configuration information includes a card member branch number, a slot number, and a card member type code.

According to another aspect of this application, a DCS screen cabinet automatic test equipment is provided, DCS screen cabinet includes first controller and a plurality of fastener, and equipment includes: the information acquisition device is used for acquiring DCS screen cabinet design drawing information and sending the DCS screen cabinet design drawing information; the control and measurement center is in communication connection with the information acquisition device and used for receiving DCS screen cabinet design drawing information, and is also in communication connection with the first controller and used for acquiring configuration information of the plurality of clamping pieces through the first controller; the control and measurement center also verifies whether the configuration information is matched with the DCS screen cabinet design drawing information, if the verification result is negative, an error reporting prompt is sent out so as to adjust the configuration information, and the verification is carried out again; if the verification result is yes, creating a test sequence logic according to the configuration information, and generating a test instruction; and the testing device is in communication connection with the control and test center, receives the testing instruction and automatically executes the function test of the card pieces for the plurality of card pieces according to the testing sequence logic.

According to some embodiments of the present application, a test device comprises: the second controller receives the test instruction; the first signal switching device comprises a plurality of wiring terminals and a plurality of switching board cards, wherein the wiring terminals are connected with the clamping pieces in a one-to-one corresponding mode, and the wiring terminals are further connected with the switching board cards in a one-to-one corresponding mode; the first control board card controls the on and off of the plurality of switching board cards of the first signal switching device according to the instruction of the second controller; the second signal switching device comprises a plurality of card type switching board cards and is connected with the first signal switching device; the second control board card controls the on and off of the plurality of switching board cards of the first signal switching device according to the instruction of the second controller; the card type switching board is connected with the card type testing sources; the testing device sequentially executes instructions in a testing instruction set corresponding to the types of the clamping pieces according to the testing instructions and the testing sequence logic through the first controller or the second controller.

According to some embodiments of the present application, the types of the plurality of cards include an AO card type, an AI card type, a DO card type, a DI card type, and a thermal resistance collection card type; the plurality of card type switching boards comprise AO switching boards, AI switching boards, DO switching boards, DI switching boards and RTD switching boards; the plurality of card type test sources comprise an AO test source, an AI test source, a DO test source, a DI test source and a RTD test source; when the type of the test card is AO card type, the control and test center sequentially sends a switching card closing instruction, an AI switching card closing instruction, an AO card output instruction, an AI test source delay sampling instruction, an AI switching card opening instruction and a switching card opening instruction, and the first controller or the second controller executes the corresponding instructions; when the type of the test card is AI card, the control and test center sequentially sends a switching card closing instruction, an AO test source output instruction, an AI card delay reading instruction, an AO switching card opening instruction and a switching card closing instruction, and the first controller or the second controller executes the corresponding instructions; when the type of the test card is a DO card, the control and test center sequentially sends a switching card closing instruction, a DI switching card closing instruction, a DO card output instruction, a DI test source delay sampling instruction, a DI switching card opening instruction and a switching card opening instruction, and the first controller or the second controller executes the corresponding instructions; when the type of the test card is a DI card type, the control and test center sequentially sends a switching card closing instruction, a DO test source output instruction, a DI card delay reading instruction, a DO switching card opening instruction and a switching card closing instruction, and the first controller or the second controller executes the corresponding instructions; when the type of the test card is the type of the thermal resistance acquisition card, the control and test center sequentially sends out a switching card closing instruction, an RTD switching card closing instruction, a thermal resistance acquisition card reading instruction, a switching card opening instruction and an RTD switching card opening instruction, and the first controller or the second controller executes a corresponding instruction.

According to some embodiments of the present application, the DCS cabinet automatic test equipment further comprises: and the switch is used for performing instruction/data exchange between the control and measurement center and the first controller and between the control and measurement center and the second controller.

According to some embodiments of the present application, the first signal switching device and the second signal switching device are integrated through the bus backplane; or the first signal switching device and the second signal switching device are separately arranged and connected through a bus.

According to another aspect of the present application, there is also provided a non-transitory computer readable storage medium having stored thereon a computer program for causing a DCS cubicle automatic test equipment to implement the method as described above.

According to another aspect of the present application, there is also provided a DCS panel cabinet automatic test system, including: one or more processors; storage means for storing one or more programs; the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the methods as described above.

The DCS screen cabinet automatic testing method can automatically identify the configuration information of the clamping pieces of each branch in the DCS screen cabinet, automatically establish testing sequence logic according to the configuration information of the clamping pieces, sequentially complete the functional test of the clamping pieces of each branch through the testing sequence logic, and generate a testing report according to a testing result.

The DCS screen cabinet automatic testing method does not need complex wiring and manual one-by-one verification, and the function test of the card is completed through test sequence logic calculated by an intelligent computer in the testing process. Thereby realized industrial process automated control, reached and used manpower sparingly, improved the effect of DCS screen cabinet efficiency of dispatching from the factory test.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 shows a schematic diagram 1000 of a prior art DCS cabinet;

FIG. 2 shows a schematic flow diagram 2000 of a DCS cabinet automatic testing method according to an example embodiment of the present application;

fig. 3 shows a schematic structural diagram 3000 of the DCS cubicle automatic test equipment according to an exemplary embodiment of the present application;

FIG. 4 shows a schematic diagram 4000 of a connection between an automatic test equipment of a DCS cabinet and the DCS cabinet according to an example embodiment of the present application;

fig. 5 shows a schematic structural diagram 5000 of a test apparatus according to an example embodiment of the present application.

Description of the reference numerals

A DCS screen cabinet 1; a first controller 10; a first branch 11; a second branch 12; a third branch 13;

DCS screen cabinet automatic test equipment 2; an information acquisition device 21; a control and measurement center 23; a switch 25; a testing device 27;

a second controller 271; a first signal switching device 273; a connection terminal 2731; a switch board 2733; a second signal switching device 275; the card type switching board 2751;

a first control board 277; a second control board 279; a cartridge type test source 270.

Detailed Description

Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The same reference numerals denote the same or similar parts in the drawings, and thus, a repetitive description thereof will be omitted.

The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided to give a thorough understanding of embodiments of the disclosure. One skilled in the relevant art will recognize, however, that the embodiments of the disclosure can be practiced without one or more of the specific details, or with other means, components, materials, devices, etc. In such cases, well-known structures, methods, devices, implementations, materials, or operations are not shown or described in detail.

Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

The terms "first," "second," and the like in the description and claims of the present application and in the above-described drawings are used for distinguishing between different objects and not for describing a particular order.

The technical solutions of the present application will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, not all, of the embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The DCS (distributed Control system) is a distributed Control system, and is an instrument Control system which is based on a microprocessor and adopts a design principle of decentralized Control function, centralized display operation, distribution, autonomy and comprehensive coordination.

The DCS system exists in an industrial application scene in a DCS screen cabinet mode, and the DCS screen cabinet mainly comprises various process channel clamping pieces or modules. The DCS screen cabinet is further provided with a first controller, and the first controller is connected with a plurality of clamping pieces in the DCS screen cabinet so as to operate and control the plurality of clamping pieces.

For example, fig. 1 shows a schematic diagram 1000 of a DCS cabinet of the prior art. Referring to fig. 1, a DCS panel cabinet 1 shown in fig. 1 includes a first controller 10, the first controller 10 is connected to a plurality of branches, the plurality of branches further include a plurality of card slot (slot), different kinds of cards can be arranged in the card slot, and the first controller 10 is in communication connection with the cards in the plurality of card slot.

As shown in fig. 1, the first controller 10 is connected to a first branch 11, a second branch 12 and a third branch 13. The first branch 11 is provided with 10 card slot parts, such as slot 1-slot 10, the second branch 12 is provided with 8 card slot parts, such as slot 1-slot 8, and the third branch 13 is provided with 3 card slot parts, such as slot 1-slot 3.

When the DCS screen cabinet leaves a factory, the DCS screen cabinet needs to be subjected to factory test, and simulation test and performance verification are carried out on the DCS screen cabinet, so that accurate configuration of the DCS screen cabinet and normal functions of all accessories are guaranteed. However, the factory test of the existing DCS screen cabinet depends on manual work, a plurality of clamping pieces and circuits in the DCS screen cabinet need to be tested, the problems of complex wiring, easy error, manual work consumption and the like exist, and the factory test efficiency of the DCS screen cabinet is low.

The application provides a DCS screen cabinet automatic test method and equipment thereof, which are used for carrying out automatic test on the DCS screen cabinet. The technical solution provided by the present application will be described in detail below with reference to the accompanying drawings.

According to one aspect of the application, a DCS screen cabinet automatic test method is provided. Fig. 2 shows a schematic flowchart 2000 of an automatic testing method for a DCS cabinet according to an example embodiment of the present application.

Referring to FIG. 2, method 2000 includes steps S100-S600. A flow chart 2000 of the DCS panel automatic test method is described below with reference to fig. 1 and 2.

In step S100, the test end acquires DCS panel design drawing information.

For example, the test end can discern the figure or the figure of predetermineeing the information through scanning on the DCS screen cabinet 1, for example screen cabinet two-dimensional code or bar code, acquire DCS screen cabinet design drawing information from the enterprise cloud through discerning the screen cabinet two-dimensional code. The DCS screen cabinet design drawing information comprises design drawing data of the DCS screen cabinet. The design drawing data of the DCS screen cabinet comprises information such as types, position layout and the like of a plurality of clamping pieces inside the DCS screen cabinet.

In step S200, the test terminal obtains configuration information of the plurality of cards through the first controller.

According to an example embodiment, the first controller 10 is in communication connection with a testing end, and the testing end obtains configuration information of a plurality of cards in each branch of the DCS panel cabinet through the first controller 10.

Optionally, the configuration information of the card includes a card branch number (such as the first branch 11, the second branch 12, or the third branch 13), a slot number (such as slot1, solt2, solt3 …, etc.), and a card type code, where the card type code represents the type of the card.

In step S300, the testing end verifies whether the configuration information of the acquired card matches the acquired DCS panel design drawing information.

In step S300, if the check result is negative, the process proceeds to step S400. And the test end sends an error prompt so as to adjust the configuration information and check again.

According to the embodiment, the configuration information of the card is matched with the DCS screen cabinet design drawing information by the test end.

If the matching result is inconsistent, representing that the assembly of the card inside the DCS screen cabinet has problems, the test end sends out an error-reporting prompt. The error exists in the inside of the DCS screen cabinet of the tester who reminds the DCS screen cabinet, so that the tester combines the error-reporting hint content to adjust the relevant problems, and the problem of inconsistent assembly in the DCS screen cabinet is corrected.

And after the configuration information of the DCS screen cabinet is adjusted by the tester according to the error prompt, the testing end checks again until the configuration information of the clamping piece is matched with the design drawing information of the DCS screen cabinet.

In step S300, if the verification result is yes, the process proceeds to step S500, and the test end creates a test sequence logic according to the configuration information and generates a test instruction.

In step S600, the test end automatically executes the function test of the card assembly for a plurality of card assemblies according to the test instruction and the test sequence logic.

According to the embodiment, if the verification result is yes, the testing end automatically identifies the type and the sequence of the card pieces according to the configuration information, and automatically creates a testing sequence logic according to the type and the sequence of the card pieces. And the test end generates a test instruction, and tests by taking the branch as a detection unit and taking the card in the branch as a basic unit. And the test end completes the function detection of the clamping piece in sequence in a time-sharing manner according to the test sequence logic.

For example, the test end automatically recognizes, through the first controller 10, that the combination of the card configurations of the first branch 11 is { slot 1: AI class card, slot 2: AO class card, slot 3: AI class card, slot 4: AO class card, slot 5: DI type cartridge, slot 6: DO type cartridge, slot 7: DI type cartridge, slot 8: DO type cartridge, slot 9: DI type cartridge, slot 10: DO type fastener }. The test end generates the card testing sequence logic of the first branch 11 according to the order of the cards in the card configuration combination of the first branch 11: { AI type fastener, AO type fastener, DI type fastener, DO type fastener, DI type fastener, DO type fastener }.

And the test end completes the function test on the cards in the first branch 11 in sequence in a time-sharing manner according to the test instruction and the test sequence logic. And the test end generates a test report taking the card as a basic unit according to the tested card function test result.

For example, the test report includes the screen cabinet number of the DCS screen cabinet to be tested, the branch and slot numbers of the card to be tested, and the function test result. The test report can inquire the test result of the appointed card piece for the index through the screen cabinet number of the DCS screen cabinet, the branch number and the slot number of the tested card piece so as to facilitate the detection personnel to look up.

Through the embodiment, the test end can automatically identify the configuration information of the clamping pieces of each branch in the DCS screen cabinet, automatically establish the test sequence logic according to the configuration information of the clamping pieces, sequentially complete the functional test of the clamping pieces of each branch through the test sequence logic, and generate the test report according to the test result.

The testing end automatically identifies the type of the card of the testing card through the intelligent computer, and generates testing sequence logic according to the configuration combination of the card in a plurality of branches in the DCS screen cabinet. The test end completes the function test of the clamping piece according to the test sequence logic, thereby realizing the automatic control of the industrial process, saving manpower and improving the efficiency of the factory test of the DCS screen cabinet.

Optionally, the test end is provided with a plurality of wiring terminals, a plurality of switching boards, a plurality of card type switching boards and a plurality of card type test sources. The plurality of wiring terminals are connected with the plurality of clamping pieces in a one-to-one correspondence mode, and the plurality of wiring terminals are further connected with the plurality of switching board cards in a one-to-one correspondence mode.

According to an example embodiment, a branch in the existing DCS cabinet may have 10 card slots, so the test end may provide 10 wiring terminals. The wiring terminal is connected with the clamping piece in the branch in a one-to-one correspondence mode, and the wiring connection principle of the wiring terminal and the clamping piece is that the serial number of the wiring terminal corresponds to the number of the clamping piece insertion grooves in the branch in a one-to-one correspondence mode.

For example, fig. 1 shows an embodiment in which a first controller 10 is on the upper side of each branch. If the first controller 10 is located on the upper side of each branch, when the test end tests the card in the first branch 11, 1-10 lines of wiring terminals are correspondingly connected with solt 1-solt 10 respectively. When the test end tests the clamping piece in the second branch 12, the 1-8 lines of wiring terminals are correspondingly connected with solt 1-solt 8 respectively, and the 9 th line of wiring terminals and the 10 th line of wiring terminals are vacant. When the test end tests the clamping piece in the third branch 13, the 1-3 lines of wiring terminals are correspondingly connected with solt 1-solt 3 respectively, and the 4 th-10 th lines of wiring terminals are vacant.

According to the embodiment, when the first controller 10 is arranged at the lower side of each branch in the DCS screen cabinet, when the test end tests the cards in the first branch 11, the 1-10 line connection terminals are correspondingly connected with the solt 10-solt 1 respectively. When the test end tests the clamping piece in the second branch 12, the 1-8 lines of wiring terminals are correspondingly connected with solt 8-solt 1 respectively, and the 9 th line of wiring terminals and the 10 th line of wiring terminals are vacant. When the test end tests the clamping piece in the third branch 13, the 1-3 lines of wiring terminals are correspondingly connected with solt 3-solt 1 respectively, and the 4 th-10 th lines of wiring terminals are vacant.

According to an example embodiment, the plurality of wiring terminals are further connected with the plurality of switching boards in a one-to-one correspondence manner.

For example, the test end further comprises at most 10 switching boards, and the switching boards and the wiring terminals are in one-to-one correspondence. When the wiring terminal is connected with a card to be tested in the DCS screen cabinet to be tested according to a line connection principle, 10 wiring terminals are correspondingly connected with 10 switching board cards of the testing end, and therefore physical connection between the DCS screen cabinet to be tested and the testing end is established.

The test end establishes a closed-loop test environment with the appointed card to be tested by controlling the on and off of the switching board card, and only 1 path of switching board card is in a closed state in the detection process.

According to an example embodiment, the switching board card is connected with the card type switching board card, and the card type switching board card is connected with the card type testing source.

According to an exemplary embodiment, the card types include AO card, AI card, DO card, DI card and thermal resistance acquisition card. The plurality of card type switching boards comprise AO switching boards, AI switching boards, DO switching boards, DI switching boards and RTD switching boards. The multiple card type test sources comprise an AO test source, an AI test source, a DO test source, a DI test source and a RTD test source.

The testing end is connected with the to-be-tested clamping piece through the wiring terminal, when the testing end identifies the clamping piece type of the to-be-tested clamping piece, the switching board card is controlled to be connected with the corresponding clamping piece type switching board card, and the clamping piece type switching board card is controlled to be connected with the corresponding clamping piece type testing source, so that the testing environment of the to-be-tested clamping piece is established.

For example, when the test end identifies that the type of the card to be tested is an AO card, the switching board is controlled to be connected with the AI switching board, and the AI switching board is controlled to be connected with an AI test source, so as to establish a test environment of the test end and the AO card.

According to the embodiment, the test end sequentially executes instructions in the test instruction set corresponding to the card type to different card types according to the test sequence logic according to the test instructions.

Optionally, the test instruction set corresponding to the type of the AO card includes { a switch card closing instruction, an AI switch card closing instruction, an AO card output instruction, an AI test source delay sampling instruction, an AI switch card opening instruction, and a switch card opening instruction }.

For example, when the test terminal identifies that the type of the card to be tested is an AO card, the switching board is controlled to be connected with the AI switching board, and the AI switching board is controlled to be connected with the AI test source.

The test end executes a switching board card closing instruction and an AI switching board card closing instruction in sequence according to the instruction in the AO card type test instruction set, closes the switching board card correspondingly connected with the AO card and the AI switching board card, and establishes the detection environment of the AO card at the moment.

The test end sends an AO card output instruction to the first controller 10, and the AO card executes signal output. And the test end executes the AI test source delay sampling instruction and controls the AI test source to execute delay sampling, so that the AI test source acquires the signal output by the AO card to obtain a test result.

And after the test end obtains the test result, the AI switching board card disconnection instruction and the switching board card disconnection instruction are continuously and sequentially executed, the AI switching board card correspondingly connected with the to-be-tested card is disconnected, and the switching board card is disconnected, so that the function test of the to-be-tested AO card is completed.

According to the embodiment, the number of the output instructions of the AO card piece and the number of the instructions of the AI test source delay sampling instructions can be adjusted, and the linear analysis of the functions of the AO card piece can be obtained through multiple groups of data.

Optionally, the test instruction set corresponding to the type of the AI card includes { switching card closing instruction, AO test source output instruction, AI card delay reading instruction, AO switching card opening instruction, and switching card closing instruction }.

The test instruction set corresponding to the type of the DO card comprises a { switching card closing instruction, a DI switching card closing instruction, a DO card output instruction, a DI test source delay sampling instruction, a DI switching card opening instruction and a switching card opening instruction }.

The test instruction set corresponding to the type of the DI card comprises a { switching card closing instruction, a DO test source output instruction, a DI card delay reading instruction, a DO switching card opening instruction and a switching card closing instruction }.

According to an exemplary embodiment, the AI card type, the DO card type and the DI card type are the same as the above-mentioned AO card type test principle, and therefore, detailed description thereof is omitted.

According to an example embodiment, when the card to be tested is a thermal resistance acquisition card, the wiring terminal is connected with the thermal resistance acquisition card, the wiring terminal is also connected with the RTD switching board card, and the RTD switching board card is connected with the RTD test source.

The RTD test source comprises a plurality of resistance boxes, and the RTD test source controls the thermal resistance acquisition clamping piece to carry out data reading on the resistance boxes through the test instruction set so as to carry out the functional test of the thermal resistance acquisition clamping piece.

Optionally, the test instruction set corresponding to the type of the thermal resistance acquisition card comprises a switching card closing instruction, an RTD switching card closing instruction, a thermal resistance acquisition card reading instruction, a switching card opening instruction and an RTD switching card opening instruction.

For example, an RTD may include 4 resistance boxes, such as resistance box 1, resistance box 2, resistance box 3, resistance box 4, where the 4 resistance boxes have 4 different types of high precision resistances. The test end includes 4 RTD change over switches, and every RTD change over switch corresponds a resistance box. The thermal resistance acquisition clamping piece is connected with the wiring terminal, the wiring terminal is connected with the resistance boxes with different resistances through connecting different RTD change-over switches, and the clamping piece function test of the thermal resistance acquisition clamping piece is completed according to the test instruction set.

When the testing end identifies that the type of the card to be tested is a thermal resistance acquisition card, the switching board is controlled to be connected with the RTD switching board, and the RTD switching board is controlled to be connected with the resistance box 1 in the RTD testing source.

The test end executes switching board card closing instructions and RTD switching board card closing instructions in sequence according to instructions in the thermal resistance acquisition card type test instruction set, the switching board cards to be correspondingly connected with the cards to be tested are closed and the RTD switching board cards are closed, and the detection environment of the thermal resistance acquisition card is established at the moment.

The test end sends a reading instruction of the thermal resistance acquisition card to the first controller 10, and controls the thermal resistance acquisition card to be tested to execute reading so as to obtain a test result.

And the test end continues to sequentially execute the switching board card disconnection instruction and the RTD switching board card disconnection instruction, and disconnects the RTD switching board card correspondingly connected with the to-be-tested card, and disconnects the switching board card to obtain a test result of the thermal resistance acquisition card taking the resistance box 1 as an RTD test source.

The principle of the function test of the clamping piece of the type of the thermal resistance acquisition clamping piece which takes the resistance box 2 as the RTD test source, the resistance box 3 as the RTD test source and the resistance box 4 as the RTD test source is the same, and the detailed description is not repeated here.

According to the example embodiment, the number of the resistor boxes can be adjusted, the thermal resistor acquisition clamping piece can be subjected to functional test according to high-precision resistors of different types, and the linear analysis of the functions of the thermal resistor acquisition clamping piece can be obtained through multiple groups of data.

Through the embodiment, the test end sequentially executes the instructions in the test instruction set corresponding to the types of the clamping pieces to the different types of the clamping pieces according to the test instructions and the test sequence logic. And the test end automatically accesses the corresponding card type test source according to the test sequence logic, and controls the corresponding change-over switch and the closing and opening of the card type change-over switch according to the test instruction set to carry out automatic intelligent test.

In the prior art, the DCS cabinet delivery test has the defects that all wiring error rates are high after the terminals in the DCS cabinet are finished at one time due to the fact that the number and the types of the terminals in the DCS cabinet are large, and manual verification is needed after the wiring is finished.

The DCS screen cabinet automatic detection method does not need complex wiring layout, and only needs to connect at most 10 paths of terminals of the test end with a plurality of clamping pieces in the DCS screen cabinet, so that manual verification is not needed. Detection personnel only need to correspondingly insert the connecting terminal of the test end of at most 10 ways into the DCS screen cabinet, and the test end can completely realize automatic detection of the card function. Therefore, industrial automatic control is realized, manpower is saved, and the factory test efficiency of the DCS screen cabinet is improved.

According to another aspect of the application, still provide a DCS screen cabinet automatic test equipment. Fig. 3 shows a schematic structural diagram 3000 of the DCS cabinet automatic test equipment according to an example embodiment of the present application.

Referring to fig. 3, the DCS panel cabinet automatic test equipment 2 includes an information acquisition device 21, a control and test center 23, and a test device 27.

Fig. 4 shows a schematic connection diagram 4000 of the DCS panel automatic test equipment and the DCS panel according to an example embodiment of the present application. Wherein the DCS cabinet 1 shown in fig. 4 may be the DCS cabinet shown in fig. 1.

As shown in fig. 4, the DCS panel automatic test equipment includes an information obtaining device 21, where the information obtaining device 21 obtains DCS panel design drawing information and sends the DCS panel design drawing information.

For example, the information obtaining device 21 is a scanning device, the scanning device scans a graph or a number of preset information on the DCS panel, such as a two-dimensional code or a barcode of the panel, and the scanning device obtains the DCS panel design drawing information from the cloud of the enterprise by identifying the two-dimensional code or the barcode of the panel. The design drawing information of the DCS screen cabinet comprises design drawing data of the DCS screen cabinet, and the design drawing data of the DCS screen cabinet comprises information such as types, position layout and the like of a plurality of clamping pieces inside the DCS screen cabinet.

The DCS cabinet automatic test equipment further comprises a control and test center 23, wherein the control and test center 23 is in communication connection with the information acquisition device 21 and receives design drawing information of the DCS cabinet.

The control and measurement center 23 is also in communication connection with the first controller 10, and the configuration information of the plurality of cards is acquired through the first controller 10.

According to an example embodiment, the configuration information of the card includes a card branch number (e.g., the first branch 11, the second branch 12, or the third branch 13, etc., shown in fig. 1), a slot number (e.g., the slot1, the solt2, the solt3 …, etc., shown in fig. 1), and a card type code, which represents the kind of the card.

The control and measurement center 23 also checks whether the configuration information is matched with the DCS screen cabinet design drawing information. If the verification result is negative, sending an error prompt to adjust the configuration information and verifying again. And if the verification result is yes, creating a test sequence logic according to the configuration information and generating a test instruction.

According to an example embodiment, the control and measurement center 23 matches the configuration information of the card with the DCS cabinet design drawing information.

If the matching result is inconsistent, the assembly of the clamping piece inside the DCS screen cabinet is represented. The control and test center sends out an error-reporting prompt. So as to prompt a tester of the DCS screen cabinet that an error exists inside the DCS screen cabinet. So that the tester combines the error prompt content to adjust the relevant problems, and the problem of inconsistent assembly in the DCS screen cabinet is corrected.

After the configuration information of the DCS screen cabinet is adjusted by the tester according to the error prompt, the control and test center 23 checks again until the configuration information of the card is matched with the design drawing information of the DCS screen cabinet.

If the matching result is consistent, the control and test center 23 automatically identifies the type of the card and the order of the card according to the configuration information, and automatically creates a test sequence logic according to the type of the card and the order of the card. And the control and test center 23 generates a test instruction, and tests with the branch as a detection unit and the card in the branch as a basic unit. And the control and test center 23 completes the function detection of the clamping piece in sequence in time sharing according to the test sequence logic.

According to fig. 4, the DCS panel cabinet automatic test equipment further includes a test device 27, where the test device 27 is in communication connection with the control and test center 23, receives a test instruction, and automatically executes a card function test on a plurality of cards according to a test sequence logic.

For example, the control and measurement center 23 automatically recognizes, through the first controller 10, that the card configuration combination of the first branch 11 is { slot 1: AI class card, slot 2: AO class card, slot 3: AI class card, slot 4: AO class card, slot 5: DI type cartridge, slot 6: DO type cartridge, slot 7: DI type cartridge, slot 8: DO type cartridge, slot 9: DI type cartridge, slot 10: DO type fastener }. The control and test center 23 generates the card testing sequence logic of the first branch 11 according to the order of the cards in the card configuration combination of the first branch 11: { AI type fastener, AO type fastener, DI type fastener, DO type fastener, DI type fastener, DO type fastener }.

The testing device 27 sequentially performs the function test on the cards in the test sequence logic of the first branch 11 card according to the test instruction in a time-sharing manner. The test device 27 generates a test report on a card basis according to the result of the function of the card to be tested.

Through the embodiment, the control and test center 23 can automatically identify the configuration information of the card of each branch in the DCS panel cabinet, and automatically create a test sequence logic and a test instruction according to the configuration information of the card. The testing device 27 sequentially completes the function test of the card of each branch according to the testing sequence logic, and generates a testing report according to the testing result.

The application provides a DCS screen cabinet automatic test equipment passes through the card type of intelligent computer automatic identification test card to according to the card configuration combination in the DCS screen cabinet in a plurality of branches, generate the test sequence logic. The DCS screen cabinet automatic test equipment completes the function test of the clamping piece according to the test sequence logic, thereby realizing the automatic control of the industrial process, saving manpower and improving the efficiency of the factory test of the DCS screen cabinet.

As shown in fig. 5, the testing apparatus 27 includes a second controller 271, and the second controller 271 receives a testing command from the testing center 23.

Optionally, the DCS cubicle automatic test equipment 2 further includes a switch 25, and the switch 25 performs instruction/data exchange between the control and test center 23 and the first controller 10, and between the control and test center 23 and the second controller 271.

The testing device 27 further comprises a first signal switching device 273 and a second signal switching device 275. The first signal switching device 273 includes a plurality of connection terminals 2731 and a plurality of switching boards 2733, and the plurality of connection terminals 2731 are connected to a plurality of cards in a one-to-one correspondence.

For example, referring to fig. 5, the first signal switching device 273 includes 10 connection terminals 2731. There are at most 10 card slots in the branch of the existing DCS cabinet, so the first signal switching device 273 can provide 10 connection terminals 2731. The line connection principle of the wiring terminal 2731 and the card is that the sequence number of the wiring terminal 2731 corresponds to the number of card slots in the branch one by one.

For example, fig. 1 shows an embodiment in which a first controller 10 is on the upper side of each branch. When the first controller 10 is arranged on the upper side of each branch and the testing device 27 tests the cards in the first branch 11, the 1-10-path wiring terminals 2731 are correspondingly connected with solt 1-solt 10 respectively. When the testing device 27 tests the card in the second branch 12, the 1-8-way connection terminals 2731 are correspondingly connected with solt 1-solt 8, and the 9 th-way and 10 th-way connection terminals 2731 are vacant. When the testing device 27 tests the card in the third branch 13, the 1-3 lines of wiring terminals 2731 are correspondingly connected with solt 1-solt 3, respectively, and the 4 th-10 th lines of wiring terminals 2731 are vacant.

According to the exemplary embodiment, if the first controller 10 is located under each branch in the DCS panel, and the testing device 27 tests the cards in the first branch 11, the 1-10 line connection terminals 2731 are respectively connected to the solt 10-solt 1. When the testing device 27 tests the card in the second branch 12, the 1-8 line connection terminals 2731 are correspondingly connected with solt 8-solt 1, and the 9 th line connection terminal 2731 and the 10 th line connection terminal 2731 are empty. When the testing device 27 tests the card in the third branch 13, the 1-3 lines of wiring terminals 2731 are correspondingly connected with solt 3-solt 1, respectively, and the 4 th-10 th lines of wiring terminals 2731 are vacant.

According to an example embodiment, the plurality of connection terminals 2731 are also connected to the plurality of switch boards 2733 in a one-to-one correspondence.

For example, referring to fig. 5, the first signal switching device 273 further includes 10 switching boards 2733, and the switching boards 2733 and the connection terminals 2731 are in a one-to-one correspondence relationship. When the connecting terminal 2731 is connected with a card to be tested in the DCS screen cabinet to be tested according to the line connection principle, the 10 connecting terminals 2731 are correspondingly connected with 10 switching boards 2733, so that physical connection between the DCS screen cabinet to be tested and the testing device 27 is established.

The testing device 27 establishes a closed-loop testing environment with the specified card to be tested by controlling the on and off of the switching board 2733, and only 1 path of the switching board 2733 is in a closed state in the detection process.

According to an exemplary embodiment, the second signal switching device 275 includes a plurality of card kind switching boards 2751, and the first signal switching device 273 is connected to the second signal switching device 275.

Optionally, the first signal switching device 273 and the second signal switching device 275 are integrated through the bus backplane. Alternatively, the first signal switching device 273 and the second signal switching device 275 may be provided separately and connected via a bus.

For example, the switching board 2733 and the board type switching board 2751 of the first signal switching device 273 and the second signal switching device 275 can be inserted into one chassis and connected through a 37-core bus backplane, so that the integration level of the DCS panel cabinet automatic test equipment 2 can be improved.

Or, the first signal switching device 273, the switching board card 2733 of the second signal switching device 275 and the switching board card 2751 of the card type can be inserted into two different cases, and the two cases are connected through a line, so that the DCS panel cabinet automatic test equipment 2 can perform later-stage application expansion.

According to an exemplary embodiment, referring to fig. 5, the test device 27 further includes a first control board 277 and a second control board 279.

The first control board 277 controls the switching boards 2733 of the first signal switching device 273 to be turned on and off according to an instruction of the second controller 271.

The second control board 279 controls the closing and opening of a plurality of card kind switching boards 2751 of the second signal switching device 275 according to an instruction of the second controller 271.

According to an exemplary embodiment, the testing device 27 further includes a plurality of card kind testing sources 270, and a card kind switching board 2751 is connected to the card kind testing sources 270.

For example, referring to fig. 5, the card type switch cards 2751 in the second signal switching device 275 include AO switch cards, AI switch cards, DO switch cards, DI switch cards, and RTD switch cards.

The card type test source 270 includes an AO test source, an AI test source, a DO test source, a DI test source, and an RTD test source.

The testing device 27 is connected with the corresponding card type switching board 2751 by controlling the switching board 2733, and controls the card type switching board 2751 to be connected with the corresponding card type testing source 270, so as to establish a testing environment of the testing device 27 and the card to be tested.

For example, when the type of the card to be tested is an AO card, the testing device 27 controls the switching board 2733 to connect to the AI switching board and controls the AI switching board to connect to the AI test source, so as to establish a testing environment of the testing device 27 and the AO card.

According to an exemplary embodiment, the testing device 27 sequentially executes instructions in a test instruction set corresponding to the card type for different types of cards through the first controller 10 or the second controller 271 according to the test sequence logic.

For example, when the control and test center 23 recognizes that the type of the card to be tested is AO card, the switching board 2731 connected to the card to be tested in the control and test device 27 is connected to the AI switching board, and the AI switching board is controlled to be connected to the AI test source.

The second controller 271 executes the switching board card closing instruction and the AI switching board card closing instruction in sequence according to the instruction in the AO card type test instruction set, closes the switching board card 2731 correspondingly connected with the AO card and closes the AI switching board card, and at this time, the detection environment of the AO card is established.

The control and measurement center 23 sends an AO card output instruction to the first controller 10, and the AO card executes signal output. The second controller 271 executes an AI test source delay sampling instruction to control the AI test source to execute delay sampling, so that the AI test source obtains a signal output by the AO card to obtain a test result.

And after obtaining the test result, the second controller 271 continuously and sequentially executes the AI switching board card disconnection instruction and the switching board card disconnection instruction, and disconnects the AI switching board card and the switching board card correspondingly connected with the AO card to be tested, so as to complete the card function test of the AO card to be tested.

Optionally, the test instruction set corresponding to the type of the AI card comprises a { switching card closing instruction, an AO test source output instruction, an AI card delay reading instruction, an AO switching card opening instruction and a switching card closing instruction }.

According to an exemplary embodiment, the AI card type, the DO card type and the DI card type are the same as the above-mentioned AO card type test principle, and therefore will not be described in detail herein.

According to an exemplary embodiment, when the to-be-tested cards are thermal resistance acquisition cards, connection terminal 2731 is connected to the thermal resistance acquisition cards, connection terminal 2731 is further connected to an RTD switch board card, which is connected to an RTD test source.

For example, an RTD may include 4 resistance boxes, such as resistance box 1, resistance box 2, resistance box 3, resistance box 4, where the 4 resistance boxes have 4 different types of high precision resistances. The test end includes 4 RTD change over switches, and every RTD change over switch corresponds a resistance box. The thermal resistance collection clamping piece is connected with the wiring terminal 2731, the wiring terminal 2731 is connected with the resistance boxes with different resistances through connecting different RTD change-over switches, and the function test of the clamping piece of the thermal resistance collection clamping piece is completed according to the test instruction set.

When the type of the card to be tested is a thermal resistance acquisition card, the second controller 271 controls the switching board 2733 to connect with the RTD switching board and controls the RTD switching board to connect with the resistance box 1 in the RTD test source.

The second controller 271 executes the switching board card closing instruction and the RTD switching board card closing instruction in sequence according to the instruction in the thermal resistance acquisition card type test instruction set, closes the switching board card and the RTD switching board card which are correspondingly connected with the thermal resistance acquisition card to be detected, and establishes the detection environment of the thermal resistance acquisition card at the moment.

And the control and test center 23 sends a reading value instruction of the thermal resistance acquisition card to the first controller 10, and controls the thermal resistance acquisition card to be tested to execute reading value so as to obtain a test result.

The second controller 271 continues to sequentially execute the switching board card disconnection instruction and the RTD switching board card disconnection instruction, and disconnects the RTD switching board card correspondingly connected with the card to be tested from the switching board card, so as to obtain the test result of the thermal resistance acquisition card taking the resistance box 1 as an RTD test source.

According to the embodiment, the number of the resistor boxes can be adjusted, the function test of the thermal resistor acquisition clamping piece can be performed according to high-precision resistors of different types, and the linear analysis of the function of the thermal resistor acquisition clamping piece can be performed through multiple groups of data.

Through the embodiment, the DCS screen cabinet automatic test 2 equipment sequentially executes the instructions in the test instruction set corresponding to the types of the clamping pieces to the different types of the clamping pieces according to the test instructions and the test sequence logic. The second controller 271 automatically accesses the corresponding card type testing source 270 according to the testing sequence logic, and controls the on and off of the corresponding switch 2733 and the card type switch 2751 according to the testing instruction set, so as to perform the automatic intelligent testing.

In the prior art, the DCS cabinet delivery test has the defects that all wiring error rates are high after the terminals in the DCS cabinet are finished at one time due to the fact that the number and the types of the terminals in the DCS cabinet are large, and manual verification is needed after the wiring is finished. And the DCS screen cabinet automatic check out test set that this application provided need not to carry out complicated wiring overall arrangement, only needs to be connected 10 way terminals at most of test end with a plurality of fasteners in the DCS screen cabinet, consequently also need not artifical the verification. Detection personnel only need to correspondingly insert the binding post of the test end of at most 10 ways into the DCS screen cabinet, and DCS screen cabinet automatic detection equipment can realize detecting the card function automatically. Therefore, industrial automatic control is realized, manpower is saved, and the factory test efficiency of the DCS screen cabinet is improved.

According to yet another aspect of the present application, there is also provided a non-transitory computer-readable storage medium having stored thereon a computer program capable of implementing the DCS screen cabinet automatic test method as described above.

According to another aspect of the present application, there is also provided a DCS cabinet automatic test system, including: one or more processors; a storage device for storing one or more programs which, when executed by the one or more processors, cause the one or more processors to implement a DCS cubicle automatic test method as described above.

Finally, it should be noted that the above-mentioned embodiments are only preferred embodiments of the present application, and are not intended to limit the present application, and although the present application is described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the above-mentioned embodiments, or equivalents may be substituted for some of the technical features. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. The DCS screen cabinet automatic test method is characterized in that the DCS screen cabinet comprises a first controller and a plurality of clamping pieces, and the method comprises the following steps:

the method comprises the steps that a test end obtains design drawing information of a DCS screen cabinet;

acquiring configuration information of the plurality of cards through the first controller;

checking whether the configuration information is matched with the DCS screen cabinet design drawing information setting;

if not, sending an error prompt to adjust the configuration information and checking again;

if yes, creating a test sequence logic according to the configuration information and generating a test instruction;

and according to the test instruction and the test sequence logic, automatically executing the card function test on the plurality of cards.

2. The DCS screen cabinet automatic testing method of claim 1, wherein the testing end is provided with a plurality of wiring terminals, a plurality of switching boards, a plurality of card type switching boards and a plurality of card type testing sources, and the plurality of wiring terminals are connected with the plurality of cards in a one-to-one correspondence;

the plurality of wiring terminals are further connected with a plurality of switching board cards in a one-to-one correspondence manner, the switching board cards are connected with the card type switching board cards, and the card type switching board cards are connected with the card type testing source so as to establish a testing environment of the to-be-tested card;

the automatically executing the card member function test to the plurality of card members according to the test order and the test sequence logic comprises:

and the test end sequentially executes instructions in a test instruction set corresponding to the type of the clamping piece to be tested according to the test sequence logic under the test environment of the clamping piece to be tested according to the test instruction.

3. The DCS screen cabinet automatic testing method of claim 2, wherein the card types of the plurality of cards comprise AO card type, AI card type, DO card type, DI card type and thermal resistance collection card type;

the plurality of card type switching boards comprise an AO switching board, an AI switching board, a DO switching board, a DI switching board and an RTD switching board; the plurality of card type test sources comprise an AO test source, an AI test source, a DO test source, a DI test source and an RTD test source;

the test instruction set of AO fastener kind includes: switching board closing instructions, AI switching board closing instructions, AO card output instructions, AI test source delay sampling instructions, AI switching board disconnection instructions and switching board disconnection instructions;

the AI card type test instruction set comprises: switching board card closing instructions, AO test source output instructions, AI card delay reading instructions, AO switching board card opening instructions and switching board card closing instructions;

the test instruction set of the DO card type comprises the following steps: switching board closing instructions, DI switching board closing instructions, DO card output instructions, DI test source delay sampling instructions, DI switching board opening instructions and switching board opening instructions;

the test instruction set of the DI card category comprises: switching board closing instructions, DO test source output instructions, DI card delay reading instructions, DO switching board opening instructions and switching board closing instructions;

the test instruction set of the thermal resistance acquisition card type comprises: the system comprises a switching board card closing instruction, an RTD switching board card closing instruction, a thermal resistance acquisition card reading instruction, a switching board card opening instruction and an RTD switching board card opening instruction.

4. The DCS cabinet automatic testing method of claim 1, wherein the configuration information comprises a card branch number, a slot number and a card type code.

5. The utility model provides a DCS screen cabinet automatic test equipment which characterized in that, the DCS screen cabinet includes first controller and a plurality of fastener, equipment includes:

the information acquisition device is used for acquiring DCS screen cabinet design drawing information and sending the DCS screen cabinet design drawing information;

the control and measurement center is in communication connection with the information acquisition device and receives the DCS screen cabinet design drawing information, and is also in communication connection with the first controller and acquires the configuration information of the plurality of clamping pieces through the first controller;

the control and test center also verifies whether the configuration information is matched with the DCS screen cabinet design drawing information, if the verification result is negative, an error report prompt is sent out so as to adjust the configuration information and verify again; if the verification result is yes, creating a test sequence logic according to the configuration information and generating a test instruction;

and the testing device is in communication connection with the control testing center, receives the testing instruction and automatically executes the card function test on the plurality of cards according to the testing sequence logic.

6. The DCS cabinet automatic test equipment of claim 5, wherein the test device comprises:

the second controller receives the test instruction;

the first signal switching device comprises a plurality of wiring terminals and a plurality of switching board cards, wherein the wiring terminals are connected with the clamping pieces in a one-to-one corresponding mode, and the wiring terminals are further connected with the switching board cards in a one-to-one corresponding mode;

the first control board card controls the switching board cards of the first signal switching device to be switched on and off according to the instruction of the second controller;

the second signal switching device comprises a plurality of card type switching board cards, and is connected with the first signal switching device;

the second control board card controls the switching board cards of the first signal switching device to be switched on and off according to the instruction of the second controller;

the card type switching board is connected with the card type testing sources;

and the testing device sequentially executes instructions in a testing instruction set corresponding to the types of the clamping pieces according to the testing instructions and the testing sequence logic to the clamping pieces through the first controller or the second controller.

7. The DCS screen cabinet automatic test equipment of claim 6, wherein the card types of the plurality of cards comprise an AO card type, an AI card type, a DO card type, a DI card type and a thermal resistance collection card type; the plurality of card type switching boards comprise an AO switching board, an AI switching board, a DO switching board, a DI switching board and an RTD switching board; the plurality of card type test sources comprise an AO test source, an AI test source, a DO test source, a DI test source and an RTD test source;

when the type of the test card is the AO card type, the control and test center sequentially sends a switching card closing instruction, an AI switching card closing instruction, an AO card output instruction, an AI test source delay sampling instruction, an AI switching card opening instruction and a switching card opening instruction, and the first controller or the second controller executes the corresponding instructions;

when the type of the test card is the AI card type, the control and test center sequentially sends a switching card closing instruction, an AO test source output instruction, an AI card delay reading instruction, an AO switching card opening instruction and a switching card closing instruction, and the first controller or the second controller executes the corresponding instructions;

when the type of the test card is the type of the DO card, the control and test center sequentially sends a switching card closing instruction, a DI switching card closing instruction, a DO card output instruction, a DI test source delay sampling instruction, a DI switching card opening instruction and a switching card opening instruction, and the first controller or the second controller executes the corresponding instructions;

when the type of the test card is the type of the DI card, the control and test center sequentially sends a switching card closing instruction, a DO test source output instruction, a DI card delay reading instruction, a DO switching card opening instruction and a switching card closing instruction, and the first controller or the second controller executes the corresponding instruction;

when the type of the test card is the type of the thermal resistance acquisition card, the control and test center sequentially sends a switching card closing instruction, an RTD switching card closing instruction, a thermal resistance acquisition card reading instruction, a switching card opening instruction and an RTD switching card opening instruction, and the first controller or the second controller executes a corresponding instruction.

8. The DCS screen cabinet automatic test equipment of claim 5, further comprising:

and the switch is used for performing instruction/data exchange between the control and measurement center and the first controller and between the control and measurement center and the second controller.

9. The DCS cabinet automatic test equipment of claim 5, wherein the first signal switching device and the second signal switching device are integrated through a bus backplane; or

The first signal switching device and the second signal switching device are separately arranged and connected through a bus.

10. A non-transitory computer readable storage medium having a computer program stored thereon, wherein the computer program causes a DCS rack automatic test equipment to implement the method of any of claims 1 to 4.

11. The utility model provides a DCS screen cabinet automatic test system which characterized in that includes:

one or more processors;

storage means for storing one or more programs;

the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of any of claims 1-4.