CN114690010A - Device life testing method, device, terminal device and system - Google Patents
Device life testing method, device, terminal device and system Download PDFInfo
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- CN114690010A CN114690010A CN202011638932.0A CN202011638932A CN114690010A CN 114690010 A CN114690010 A CN 114690010A CN 202011638932 A CN202011638932 A CN 202011638932A CN 114690010 A CN114690010 A CN 114690010A
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Abstract
The embodiment of the application provides a device life test method, device, terminal device and system, wherein the method comprises the following steps: receiving reference brightness of a device to be tested measured by a brightness meter, wherein the reference brightness is the maximum brightness of the device to be tested reached under a target constant current; and taking the reference brightness as initial brightness to carry out device life test. According to the embodiment of the application, the maximum brightness of the device to be tested under the target constant current is used as the initial brightness, the service life of the device is tested, and the device has higher reliability, so that the service life testing accuracy is improved.
Description
Technical Field
The application belongs to the field of testing of electric equipment, and particularly relates to a device life testing method, device, terminal equipment and system.
Background
In recent years, quantum dot light emitting diodes (QLEDs) and Organic Light Emitting Diodes (OLEDs) have attracted much attention and research in the fields of illumination and display due to their advantages of high brightness, low power consumption, wide color gamut, and easy processing. Compared with an Organic Light Emitting Diode (OLED), under the same image quality, the energy saving performance of the QLED is expected to be twice that of the OLED, and the light emitting rate is improved by 30-40%. Meanwhile, the QLED has the advantages of low starting voltage, narrow half-height width of photoluminescence spectrum, adjustable luminescence wavelength and color through the particle size of quantum dots, low-cost solution preparation and the like, and has huge application potential in the fields of solid-state illumination and display. In the actual development process, the device needs to be subjected to life test evaluation as a display device.
However, in the conventional device lifetime testing method, when the light emitting area of the device is not uniform, or if the area of the light emitting area of the device is defective, the initial luminance value of the device has a significant error, and the initial luminance value is not accurate, which causes a large error in the device lifetime testing result.
Disclosure of Invention
The embodiment of the application provides a device life testing method, device, terminal device and system, and the life testing accuracy can be effectively improved.
In a first aspect, an embodiment of the present application provides a device lifetime testing method, including:
receiving reference brightness of a device to be tested measured by a brightness meter, wherein the reference brightness is the maximum brightness of the device to be tested reached under a target constant current;
and taking the reference brightness as initial brightness to carry out device life test.
In a second aspect, embodiments of the present application provide a device lifetime testing apparatus, including:
the receiving module is used for receiving reference brightness of a device to be tested, which is measured by a brightness meter, wherein the reference brightness is the maximum brightness of the device to be tested, which is achieved under a target constant current;
and the service life testing module is used for taking the reference brightness as initial brightness to test the service life of the device.
In a third aspect, an embodiment of the present application provides a terminal device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the steps of the device lifetime testing method according to any one of the first aspect when executing the computer program.
In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the computer program implements the steps of the device lifetime testing method according to any one of the first aspect.
In a fifth aspect, an embodiment of the present application provides a device lifetime testing system, including the device lifetime testing apparatus and a luminance meter, where:
and the brightness meter is used for measuring the brightness of the first device when the device to be tested is electrified by the first constant current after reaching the maximum brightness under the first constant current, wherein the brightness of the first device is used as the initial brightness of the device life test.
It is understood that the beneficial effects of the second aspect to the fifth aspect can be referred to the related description of the first aspect, and are not described herein again.
Compared with the prior art, the embodiment of the application has the advantages that: the embodiment of the application provides a device life test method, device and system, wherein the method comprises the following steps: receiving reference brightness of a device to be tested measured by a brightness meter, wherein the reference brightness is the maximum brightness of the device to be tested reached under a target constant current; and taking the reference brightness as initial brightness to carry out device life test. According to the method and the device, the service life of the device is tested by taking the maximum brightness of the device to be tested under the target constant current as the initial brightness, so that the reliability is high, and the accuracy of the service life test is improved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
FIG. 1 is a schematic flow chart diagram illustrating a device lifetime testing method according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram illustrating an effect of a device lifetime testing method according to an embodiment of the present application;
FIG. 3 is a diagram illustrating brightness unrecoverable in a device lifetime testing method according to an embodiment of the present disclosure;
FIG. 4 is a diagram illustrating brightness recovery in a device lifetime testing method according to an embodiment of the present disclosure;
FIG. 5 is a schematic structural diagram of a device lifetime testing apparatus according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of a terminal device according to an embodiment of the present application.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to" determining "or" in response to detecting ". Similarly, the phrase "if it is determined" or "if a described condition or event is detected" may be interpreted, depending on the context, to mean "upon determining" or "in response to determining" or "upon detecting a described condition or event" or "in response to detecting a described condition or event".
Furthermore, in the description of the present application and the appended claims, the terms "first," "second," "third," and the like are used for distinguishing between descriptions and not necessarily for describing or implying relative importance.
Reference throughout this specification to "one embodiment" or "some embodiments," or the like, means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the present application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," or the like, in various places throughout this specification are not necessarily all referring to the same embodiment, but rather "one or more but not all embodiments" unless specifically stated otherwise. The terms "comprising," "including," "having," and variations thereof mean "including, but not limited to," unless expressly specified otherwise.
Referring to fig. 1, a schematic block flow diagram of a device life testing method is shown, which may include the steps of:
step S101: and receiving the reference brightness of the device to be tested, which is measured by a brightness meter, wherein the target constant current is used as the electrifying current of the device to be tested, the brightness of the device to be tested is read by the brightness meter and is recorded as the reference brightness, and the reference brightness is the maximum brightness of the device to be tested under the target constant current.
In a possible implementation manner, the device to be tested can be continuously electrified with the target constant current in the luminance meter, whether the maximum luminance of the device to be tested is achieved or not is judged by observing whether the reading of the luminance meter reaches the maximum value or not, and when the maximum luminance is achieved, the luminance value is recorded as the reference luminance.
In another possible implementation manner, the device life test equipment is powered on by the target constant current continuously, whether the device to be tested reaches the maximum brightness is judged according to the brightness change information of the first device, and after the device to be tested reaches the maximum brightness, the device to be tested is powered on by the target constant current by using the brightness meter, and the brightness value of the device to be tested is recorded as the reference brightness. Specifically, before receiving the reference brightness of the device under test measured by the brightness meter, the method further includes:
continuously electrifying the device to be tested by using the target constant current, and acquiring first device brightness change information of the device to be tested in the continuous electrifying process; and determining that the to-be-tested device reaches the maximum brightness according to the brightness change information of the first device, namely judging that the to-be-tested device reaches the maximum brightness under the target constant current at a first target moment.
The method comprises the steps of putting a device to be tested into a station jig of the device life testing equipment, setting a testing mode of the device life testing equipment to be a constant current mode, setting the life testing equipment to output a target constant current, continuously electrifying the device to be tested by using the life testing equipment, aligning a light emitting area direction of the device to be tested to a brightness change detector of the device life testing equipment, and acquiring first device brightness change information of the device to be tested at intervals of preset time in the continuous electrifying process of the brightness change detector. It can be understood that the brightness change detector can obtain the brightness change condition of the device, so the device life test equipment can obtain the brightness change trend of the device. Optionally, the brightness change detector may be a photodiode detector. The preset time is usually short, otherwise, the brightness change of the device to be tested is difficult to track, the specific time is determined according to the device to be tested, the value range is usually 1s-5s, and the value range can be set to be 2s optionally. The target constant current is usually larger than the normal working current of the device to be tested, the specific current is different according to the device to be tested, for example, the current can be 2mA, and if the device to be tested has long service life and strong endurance capability, the current can be moderately increased to 3 mA.
Determining that the to-be-tested device reaches the maximum brightness according to the brightness change information of the first device, namely judging that the to-be-tested device reaches the maximum brightness under the target constant current at a first target moment, wherein the method comprises the following steps of: if the device brightness at the first target moment is larger than the device brightness at the moment before the first target moment and larger than the device brightness at the moment after the first target moment, and the current at the first target moment is a first constant current, determining that the device to be tested reaches the maximum brightness, and taking the brightness of the device to be tested at the first target moment as the maximum brightness.
It should be noted that the to-be-tested device reaching the maximum brightness under the first constant current means that the to-be-tested device is continuously electrified by the first constant current, and the to-be-tested device reaching the maximum brightness under the first constant current, that is, the electrifying currents of the devices corresponding to the first target time, the time before the first target time, and the time after the first target time are all the first constant current.
And after determining that the device to be tested reaches the maximum brightness under the target constant current, taking out the device to be tested from the service life testing equipment, and then measuring by using a brightness meter.
According to the embodiment of the application, the device to be tested reaches the maximum brightness under the target constant current, and then the maximum brightness is used as the initial brightness to test the service life of the device, so that the problem that the brightness of the device is higher than the actual brightness on the premise that the luminous area of the device is less than 100% and the whole luminous area of the default luminous area is luminous in the calculation process is solved, and the test error is caused; and the problem that the brightness of the device to be tested is high due to the fact that errors exist in the current density of the luminous zone of the device to be tested if the area of the luminous zone of the device to be tested is defective during testing of the device to be tested is solved, reliability is high, and therefore the service life testing accuracy is improved. Optionally, before the target constant current is used to continuously energize the device to be tested, a smaller constant current may be used to start energizing and continuously increase the current to the target constant current, which specifically includes:
outputting a first constant current by setting a life test device, electrifying the device to be tested by the first constant current, and acquiring second device brightness change information of the device to be tested in the continuous electrifying process, wherein the second device brightness change information is device brightness change information under the second constant current;
determining that the to-be-tested device reaches the maximum brightness according to the brightness change information of the second device, namely judging whether the to-be-tested device reaches the maximum brightness under a first constant current, wherein the first constant current is smaller than the target constant current;
and if the fact that the to-be-tested device reaches the maximum brightness is determined, namely the to-be-tested device reaches the maximum brightness under the first constant current, increasing the value of the first constant current, updating the increased constant current into the first constant current, returning to the step of continuously electrifying the to-be-tested device by the first constant current, and acquiring the brightness change information of a second device of the to-be-tested device in the continuous electrifying process until the increased constant current is equal to the target constant current. After the current is increased to the target constant current, repeating the continuous electrifying process to obtain the brightness change information of the first device of the device to be tested; and determining that the device to be tested reaches the maximum brightness according to the brightness change information of the first device, which is not described herein again.
Determining that the device to be tested reaches the maximum brightness according to the brightness change information of the second device, namely judging whether the device to be tested reaches the maximum brightness under the first constant current, wherein the method comprises the following steps: and if the device brightness at the second target moment is determined to be greater than the device brightness at the moment before the second target moment and greater than the device brightness at the moment after the second target moment, and the current at the second target moment is the first constant current, determining that the device to be tested reaches the maximum brightness, and taking the brightness of the device to be tested at the second target moment as the maximum brightness.
The value of the first constant current may be increased according to a certain rule, an arithmetic increase, an geometric increase, a linear increase, a logarithmic increase or an exponential increase, for example, the value of the first constant current may be increased by a fixed amplitude, for example, from 0.8mA to 1.2mA to 1.6mA to 2.0 mA; there may also be no regularity, for example increasing the value of the first constant current by different magnitudes, for example 0.8 mA-0.9 mA-1.0 mA-1.6 mA-1.8 mA-2.0 mA. For example, taking the first constant current as 0.8mA as an example, taking the current change as 0.8 mA-1.2 mA-1.6 mA-2.0 mA as an example, after the device to be tested reaches the maximum brightness under 0.8mA, the constant current is increased to 1.2mA, after the device to be tested reaches the maximum brightness under 1.2mA, the constant current is increased to 1.6mA, and after the device to be tested reaches the maximum brightness under 1.6mA, the constant current is increased to 2.0mA, that is, the target constant current is a current value determined by a person skilled in the art to accelerate the device life test according to the parameters such as the conventional life of the device, the current resistance of the device material, the stability of the device, and the like, and the current value is usually higher than the normal operating current value of the device, and is selected to accelerate the device life test, and on the one hand, the device cannot be damaged.
It should be noted that the to-be-tested device reaching the maximum brightness under the first constant current means that the to-be-tested device is continuously electrified by the first constant current, and the to-be-tested device reaching the maximum brightness under the first constant current, that is, the electrifying currents of the devices corresponding to the second target time, the previous time before the second target time, and the next time after the second target time are the first constant current.
According to the embodiment of the application, the first constant current is increased through the steps, and the corresponding maximum brightness of each first constant current is obtained under each first constant current, so that the device can obtain stable states at different stages of electrification, and finally the first constant current is equal to the target constant current, so that the device can gradually keep a more stable state in the process of increasing the current, the device can emit light more stably in the test process, the damage to the device can be reduced, and the stability and the accuracy of the device test are improved.
As shown in fig. 2, in the effect schematic diagram of the device life testing method provided in an embodiment of the present application, by continuously energizing the device to be tested with the first constant current, the light emitting area of the device to be tested is increased, and the light emitting uniformity is greatly improved, and when the device to be tested reaches the maximum brightness under the target constant current, the reference brightness of the device to be tested measured by the luminance meter is received, and the life test is started with the reference brightness, so that the reliability is higher, and the accuracy of the life test is improved.
Optionally, starting to energize with a smaller constant current, and continuously increasing the current to the target constant current, wherein the process of increasing the current may further include:
electrifying the device to be tested by using a second constant current, and acquiring third device brightness change information of the device to be tested in the continuous electrifying process, wherein the third device brightness change information is device brightness change information under the second constant current, and the second constant current is smaller than the target constant current;
and increasing the second constant current according to the brightness change information of the third device until the increased current is equal to the target constant current, wherein the rate of increase of the second constant current is inversely related to the rate of brightness change, that is, the rate of increase of the second constant current can be slowed down when the brightness change is larger, and the rate of increase of the second constant current can be accelerated when the brightness change is smaller. The embodiment of the application ensures that the device to be tested can be fully electrified in each current stage by gradually increasing the electrifying current to the constant current, can ensure that the device to be tested can emit light more stably by virtue of the slow rise of the brightness, reduces the damage and the damage to the device, reduces the fluctuation caused by instability, ensures that the brightness value is more accurate, and improves the accuracy of the accelerated aging test result.
Step S102: and taking the reference brightness as initial brightness to carry out device life test.
In the process of testing the service life of the device, the target constant current can be used for electrifying the device to be tested so as to test the service life of the device, and the current with a certain difference value with the target constant current can also be used for electrifying, and the embodiment of the application is not specifically limited.
It should be noted that, when the device lifetime testing apparatus performs lifetime testing, since the luminance change detector can only sense luminance change and cannot obtain accurate luminance of the device to be tested, the reference luminance needs to be used as an initial luminance, and then the device luminance of the device to be tested in the lifetime testing process is calculated according to a corresponding relationship between the device luminance and luminance change information, which is a specific corresponding relationship.
In a possible implementation manner, in the process of performing the device lifetime test, if it is detected that the device brightness of the device to be tested is attenuated to be not greater than the preset cut-off brightness, the lifetime test is terminated. For example, if the preset cut-off brightness is set to be 40% of the initial brightness, the device brightness of the device to be tested is detected to be reduced to 40% of the initial brightness or 30% of the initial brightness, and the life test is terminated.
In another possible implementation manner, in the process of performing the device lifetime test, if it is detected that the device brightness of the device to be tested is attenuated to be not greater than the preset cut-off brightness within the preset time, the lifetime test is not terminated, but the device to be tested is continuously powered on, a preset number of second device brightnesses are obtained, and whether the lifetime test is terminated is judged according to the second device brightnesses. Specifically, three situations can be included:
the first method comprises the following steps: and terminating the life test when the brightness of all the second devices cannot be recovered to 95% -105% of the preset cut-off brightness.
And the second method comprises the following steps: when the brightness of all the second devices cannot be recovered to 95% -105% of the preset cut-off brightness, detecting the surface temperature of the device to be tested or the voltage at two ends of the device to be tested; and when the increase of the surface temperature is detected to exceed a preset temperature value and the increase of the voltage at the two ends exceeds a preset voltage value, terminating the life test. The preset temperature value and the preset voltage value can be flexibly set according to actual conditions.
Fig. 3 is a schematic diagram illustrating brightness unrecoverable in a device lifetime testing method according to an embodiment of the present application. When the first and second conditions occur during the life test, indicating that the device under test is malfunctioning, the life test may be terminated. Wherein the fault may include an open circuit condition, the device is extinguished; or the device has short circuit phenomenon, and the brightness is extremely low and can not be recovered. When the device is in an open circuit, the conditions of sudden increase of resistance and increase of current can occur, so that the light emitting region can be completely damaged due to the generated Joule heat when the device is continuously electrified, the temperature of the device rises, and the voltage at two ends of the device increases, so that the surface temperature of the device and the voltage at two ends of the device can be monitored.
And the third is that: fig. 4 is a schematic diagram illustrating brightness recovery in a device lifetime testing method according to an embodiment of the present application. When at least one of the second device brightness can be recovered to 95% -105% of the preset cut-off brightness, determining that the device to be tested flickers, and continuing to perform the life test on the device to be tested;
and if the number of times of the flicker of the device to be tested is greater than the preset number of times, terminating the life test.
Wherein the preset cut-off brightness is 30% -50% of the initial brightness, and optionally 40%.
In a possible implementation manner, whether the life test is ended or not can be judged according to the brightness of the device, but the surface temperature of the device to be tested or the voltage at two ends of the device to be tested is detected; and when the increase of the surface temperature is detected to exceed a preset temperature value and the increase of the voltage at the two ends exceeds a preset voltage value, terminating the life test.
According to the embodiment of the application, the temporary abnormity is not subjected to the service life termination test treatment in the service life test process, the identification capability of the devices with permanent open circuit and short circuit or flicker is improved, the efficiency of conventional test is improved, and the test error caused by bad devices is solved.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Referring to fig. 5, a schematic structural diagram of a device lifetime testing apparatus is shown, wherein for convenience of explanation, only parts related to the embodiments of the present application are shown, and the device lifetime testing apparatus includes:
the receiving module 51 is configured to receive a reference brightness of the device to be tested, where the reference brightness is a maximum brightness reached by the device to be tested under a target constant current, and the reference brightness is measured by a brightness meter;
and the life test module 52 is configured to perform a device life test by using the reference brightness as an initial brightness.
In one embodiment, the device life test apparatus further includes a brightness change detector, configured to continuously energize the device to be tested with the target constant current, and obtain first device brightness change information of the device to be tested during continuous energization;
and determining that the to-be-tested device reaches the maximum brightness according to the brightness change information of the first device, namely judging that the to-be-tested device reaches the maximum brightness under the target constant current at the first target moment.
The power-on module is used for powering on the device to be tested by using a first constant current and acquiring second device brightness change information of the device to be tested in the continuous power-on process, wherein the second device brightness change information is device brightness change information under the first constant current, and the first constant current is smaller than the target constant current;
determining that the to-be-tested device reaches the maximum brightness according to the brightness change information of the second device, namely judging whether the to-be-tested device reaches the maximum brightness under a first constant current;
and if the fact that the to-be-tested device reaches the maximum brightness is determined, namely the to-be-tested device reaches the maximum brightness under a first constant current, increasing the value of the first constant current, updating the increased constant current into the first constant current, returning to the step of executing the step of continuously electrifying the to-be-tested device by using the target constant current, and acquiring brightness change information of a second device of the to-be-tested device in the continuous electrifying process until the increased constant current is equal to the target constant current.
The power-on module can be further used for powering on the device to be tested by using a second constant current, and acquiring third device brightness change information of the device to be tested in the continuous power-on process, wherein the third device brightness change information is device brightness change information under the second constant current, and the second constant current is smaller than the target constant current;
and increasing the second constant current according to the brightness change information of the third device until the increased current is equal to the target constant current, wherein the rate of increase of the second constant current is inversely related to the rate of brightness change.
Fig. 6 is a schematic diagram of a terminal device provided in an embodiment of the present application. The terminal device 6 of this embodiment includes: a processor 60, a memory 61 and a computer program 62 stored in said memory 61 and executable on said processor 60. The processor 60, when executing the computer program 62, performs the steps of the device lifetime test described above, such as steps 101 to 102 shown in fig. 1. Alternatively, the processor 60, when executing the computer program 62, implements the functions of the modules/units in the above-mentioned device embodiments, such as the functions of the modules 51 to 52 shown in fig. 5.
Illustratively, the computer program 62 may be partitioned into one or more modules/units that are stored in the memory 61 and executed by the processor 60 to implement the present invention. The one or more modules/units may be a series of computer program instruction segments capable of performing specific functions, which are used to describe the execution of the computer program 62 in the terminal device 6.
The terminal device may include, but is not limited to, a processor 60, a memory 61. Those skilled in the art will appreciate that fig. 6 is merely an example of a terminal device 6 and does not constitute a limitation of terminal device 6 and may include more or less components than those shown, or some components in combination, or different components, for example, the terminal device may also include input output devices, network access devices, buses, etc.
The Processor 60 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The memory 61 may be an internal storage unit of the terminal device 6, such as a hard disk or a memory of the terminal device 6. The memory 61 may also be an external storage device of the terminal device 6, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, which are provided on the terminal device 6. Further, the memory 61 may also include both an internal storage unit and an external storage device of the terminal device 6. The memory 61 is used for storing the computer program and other programs and data required by the terminal device. The memory 61 may also be used to temporarily store data that has been output or is to be output.
An embodiment of the present application further provides a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the steps of the device lifetime testing method are implemented.
The embodiment of the application further provides a device life test system, including aforementioned device life test equipment and luminance meter, the luminance meter is used for measuring the device to be tested and reaches under first constant current the maximum brightness back to first device luminance when first constant current carries out the circular telegram, wherein first device luminance is as the initial luminance of device life test.
Those of ordinary skill in the art will appreciate that the various illustrative algorithmic steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or as a combination of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (12)
1. A device lifetime testing method, comprising:
receiving reference brightness of a device to be tested measured by a brightness meter, wherein the reference brightness is the maximum brightness of the device to be tested reached under a target constant current;
and taking the reference brightness as initial brightness to carry out device life test.
2. The device lifetime testing method of claim 1, wherein before receiving the reference luminance of the device under test measured by the luminance meter, further comprising:
continuously electrifying the device to be tested by the target constant current, and acquiring first device brightness change information of the device to be tested in the continuous electrifying process;
and determining that the device to be tested reaches the maximum brightness according to the brightness change information of the first device.
3. The device lifetime testing method of claim 2, wherein determining that the device under test reaches the maximum luminance according to the first device luminance variation information comprises:
according to the first device brightness change information, if the fact that the device brightness of the device to be tested at the first target moment is larger than the device brightness at the moment before the first target moment and is also larger than the device brightness at the moment after the first target moment is determined, it is determined that the device to be tested reaches the maximum brightness, and the brightness of the device to be tested at the first target moment is taken as the maximum brightness.
4. The device lifetime testing method of claim 2, before continuously energizing the device under test with the target constant current, further comprising:
electrifying the device to be tested by using a first constant current, and acquiring second device brightness change information of the device to be tested in the continuous electrifying process, wherein the second device brightness change information is device brightness change information under the first constant current, and the first constant current is smaller than the target constant current;
determining that the device to be tested reaches the maximum brightness according to the brightness change information of the second device;
and if the to-be-tested device reaches the maximum brightness, increasing the value of the first constant current, updating the increased constant current into the first constant current, returning to the step of executing the continuous energization of the to-be-tested device by the target constant current, and acquiring the brightness change information of a second device of the to-be-tested device in the continuous energization process until the increased constant current is equal to the target constant current.
5. The device lifetime testing method of claim 2, before continuously energizing the device under test with the target constant current, further comprising:
electrifying the device to be tested by using a second constant current, and acquiring third device brightness change information of the device to be tested in the continuous electrifying process, wherein the third device brightness change information is device brightness change information under the second constant current, and the second constant current is smaller than the target constant current;
and increasing the second constant current according to the brightness change information of the third device until the increased current is equal to the target constant current, wherein the rate of increase of the second constant current is inversely related to the rate of brightness change.
6. The device lifetime testing method of claim 4, wherein determining that the device under test reaches a maximum luminance based on the second device luminance variation information comprises:
and according to the brightness change information of the second device, if the brightness of the device to be tested at a second target moment is determined to be greater than the brightness of the device at the moment before the second target moment and greater than the brightness of the device at the moment after the second target moment, determining that the maximum brightness of the device to be tested is reached, and taking the brightness of the device to be tested at the second target moment as the maximum brightness.
7. The device lifetime testing method of claim 1, wherein performing the device lifetime test using the reference luminance as an initial luminance comprises:
when the device brightness of the device to be tested is detected to be attenuated to be not more than the preset cut-off brightness within the preset time, continuing to electrify the device to be tested;
and acquiring the brightness of a preset number of second devices, terminating the life test when the brightness of all the second devices cannot be recovered to 95% -105% of the preset cut-off brightness, and otherwise, continuing the life test.
8. The device lifetime testing method of claim 1, wherein performing a device lifetime test using the reference luminance as an initial luminance comprises:
detecting the surface temperature of the device to be tested or the voltage at two ends of the device to be tested;
and when the increment of the surface temperature exceeds a preset temperature value and the increment of the voltage at the two ends exceeds a preset voltage value, terminating the service life test.
9. A device lifetime testing apparatus, comprising:
the receiving module is used for receiving reference brightness of a device to be tested, which is measured by a brightness meter, wherein the reference brightness is the maximum brightness of the device to be tested, which is achieved under a target constant current;
and the service life testing module is used for taking the reference brightness as initial brightness to test the service life of the device.
10. A terminal device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the steps of the device lifetime testing method according to any one of claims 1 to 8 when executing the computer program.
11. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program which, when executed by a processor, carries out the steps of the device lifetime testing method according to any of claims 1 to 8.
12. A device life test system comprising the device life test apparatus of claim 9 and a luminance meter, wherein:
the brightness meter is used for measuring reference brightness of a device to be tested as initial brightness of the device life test, wherein the reference brightness is the maximum brightness of the device to be tested under a target constant current.
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