CN114662291A - Microstructure arrangement method and diffusion plate - Google Patents

Microstructure arrangement method and diffusion plate Download PDF

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Publication number
CN114662291A
CN114662291A CN202210223680.8A CN202210223680A CN114662291A CN 114662291 A CN114662291 A CN 114662291A CN 202210223680 A CN202210223680 A CN 202210223680A CN 114662291 A CN114662291 A CN 114662291A
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microstructures
point
closed
microstructure
sampling
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CN202210223680.8A
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徐子沛
王兆文
郭丹阳
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Suzhou Op Lighting Co Ltd
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Suzhou Op Lighting Co Ltd
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Priority to CN202210223680.8A priority Critical patent/CN114662291A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements
    • G02B5/0205—Diffusing elements; Afocal elements characterised by the diffusing properties
    • G02B5/021—Diffusing elements; Afocal elements characterised by the diffusing properties the diffusion taking place at the element's surface, e.g. by means of surface roughening or microprismatic structures
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
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  • Computer Hardware Design (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Graphics (AREA)
  • Software Systems (AREA)
  • Optics & Photonics (AREA)
  • Optical Elements Other Than Lenses (AREA)

Abstract

The embodiment of the application provides a microstructure arrangement method and a diffusion plate, relates to the technical field of optical element design, and aims to solve the problem that the optical effect of an optical element is unstable due to a frosted surface arranged on the optical element. The microstructure arrangement method comprises the following steps: constructing a plurality of first sampling points on a reference surface based on a preset arrangement mode; respectively constructing a closed graph by taking each first sampling point as a reference point; randomly acquiring a second sampling point in each closed graph; and arranging the microstructures on the surfaces of the microstructures to be arranged based on the obtained second sampling points.

Description

Microstructure arrangement method and diffusion plate
Technical Field
The present disclosure relates to the field of optical element design technologies, and in particular, to a microstructure arrangement method and a diffusion plate.
Background
In the design process of optical elements, it is often necessary to provide the optical elements with a frosted surface. In the related art, a frosted surface is generally processed by a frosting process, and the frosted surface is processed by the frosting process, so that the problem of unstable structure of the frosted surface exists. For example, for two optical elements provided with frosted surfaces, if the frosted surface of one of the optical elements is better processed, the frosted surface of the other optical element is poorer processed, so that the two optical elements can present different optical effects. Since the optical element was provided with the frosted surface, the optical effect of the optical element was found to be unstable due to the frosted surface.
Disclosure of Invention
The embodiment of the application provides a microstructure arrangement method and a diffusion plate, and aims to solve the problem that the optical effect of an optical element is unstable due to the frosted surface arranged on the optical element.
In a first aspect, an embodiment of the present application provides a method for arranging microstructures.
The microstructure arrangement method provided by the embodiment of the application comprises the following steps:
constructing a plurality of first sampling points on a reference surface based on a preset arrangement mode;
respectively constructing a closed graph by taking each first sampling point as a reference point;
randomly acquiring a second sampling point in each closed graph;
and arranging the microstructures on the surfaces of the microstructures to be arranged based on the obtained second sampling points.
Optionally, the preset arrangement is a fibonacci brother number array arrangement.
Optionally, the preset arrangement mode is an array arrangement mode.
Optionally, the constructing a plurality of first sampling points on the reference plane includes: constructing a plurality of the first sampling points at the reference surface with a target density.
Optionally, the constructed closed figure is a Thiessen polygon.
Optionally, all the closed figures constructed are the same shape.
Optionally, the closed graph is circular, the sizes of the closed graphs are all equal, and the first sampling point is the center of the circle of the closed graph.
Optionally, the randomly acquiring a second sampling point in each of the closed graphs includes: in each closed graph, taking the first same point corresponding to the closed graph as an offset point, and offsetting the offset point by using a target direction and a target distance, wherein the offset point after offset is positioned in the closed graph; and taking the offset point after the offset as the second sampling point.
Optionally, the arranging the microstructures on the surface of the microstructure to be arranged based on the obtained second sampling points includes: mapping each second sampling point to the surface of the microstructure to be distributed; constructing a third sampling point at the position of the second sampling point mapped to the surface of the microstructure to be distributed; and distributing the microstructures on the surface of the microstructure to be distributed in a one-to-one correspondence manner by taking the third sampling point as a reference point.
Optionally, the reference surface is a surface on which the microstructures are to be arranged.
In a second aspect, embodiments of the present application provide a diffuser plate.
The diffuser plate provided by the embodiment of the application comprises a light incident surface and a light emergent surface, wherein microstructures are arranged on at least one of the light incident surface and the light emergent surface according to any one of the microstructure arrangement methods provided by the first aspect.
The embodiment of the application adopts at least one technical scheme which can achieve the following beneficial effects:
in the embodiment of the present application, the microstructure may be constructed on the three-dimensional model of the optical element based on the microstructure arrangement method, and the real object of the optical element may be processed based on the three-dimensional model of the optical element constructed with the microstructure, so that the real object of the optical element and the three-dimensional model of the optical element may be substantially consistent. Further, the structures of the microstructures of the optical elements to be processed can be made substantially uniform, and the problem that the frosted surface of the optical element has an unstable optical effect due to the unstable structure of the frosted surface can be solved.
In addition, in the embodiment of the application, the arrangement of the first sampling points can be more regular, and the second sampling points can have a certain dispersion degree on the basis of the first sampling points in a mode of randomly acquiring the second sampling points in the closed graph constructed on the basis of the first sampling points. Thus, the second sampling points are not too random or too regular. Therefore, the microstructures distributed based on the second sampling point distribution mode are not too random or too regular, and the optical element has a better optical effect.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments or related technologies of the present application, the drawings needed to be used in the description of the embodiments or related technologies are briefly introduced below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without any creative effort.
Fig. 1 is a flowchart of a microstructure layout method according to an embodiment of the present disclosure;
fig. 2 is a schematic arrangement diagram of a first sampling point provided in the embodiment of the present application;
fig. 3 is a schematic arrangement diagram of another first sampling point provided in the embodiment of the present application;
fig. 4 is a schematic arrangement diagram of a second sampling point provided in an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort belong to the protection scope of the present application.
Although the terms used in the present application are selected from publicly known and used terms, some of the terms mentioned in the specification of the present application may be selected by the applicant at his or her discretion, the detailed meanings of which are described in relevant parts of the description herein. Further, it is required that the present application is understood not only by the actual terms used but also by the meaning of each term lying within.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
The embodiment of the application provides a microstructure arrangement method. Referring to fig. 1, a microstructure arranging method provided in an embodiment of the present application may include:
and step 110, constructing a plurality of first sampling points on a reference surface based on a preset arrangement mode.
In the embodiment of the present application, the preset arrangement manner may be a specification arrangement manner. Referring to fig. 2, the preset arrangement may be a fibonacci's number array arrangement, for example. As such, in embodiments of the present application, a plurality of first uniform points 220 may be constructed on reference plane 210 based on a fibonacci's factorial arrangement.
Referring to fig. 3, in the embodiment of the present application, the predetermined arrangement may be an array arrangement. For example, the predetermined arrangement may be a rectangular array arrangement. Thus, in the embodiment of the present application, a plurality of first uniform points 220 may be constructed on the reference surface 210 based on the array arrangement. In the embodiments of the present application, the plurality of first sampling points may also be constructed on the reference surface by other arrangements, which are not listed here.
It should be noted that, in the embodiments of the present application, the reference surface may be a surface of the microstructures to be arranged, and the reference surface may also be a surface constructed based on the surface of the microstructures to be arranged. In the case where the reference surface is a surface constructed based on the surfaces of the microstructures to be arranged, the projection of the surfaces of the microstructures to be arranged may fall into the reference surface. That is, the area of the reference surface may be larger than the surface on which the microstructures are to be arranged.
It should be further noted that, in the embodiments of the present application, constructing a plurality of first sampling points on the reference plane includes: a plurality of first samples are constructed at a target density at a reference plane. Illustratively, the density of the first spots may be controlled by adjusting the number of constructed first spots. For example, 2000 first sampling points may be constructed on the reference surface, and 4000 first sampling points may also be constructed on the reference surface, so that the density of the first sampling points may be controlled by adjusting the number of the constructed first sampling points. In the embodiments of the present application, the density of the first dots can be controlled in other ways, which are not listed here.
And 120, respectively constructing a closed graph by taking each first sampling point as a reference point.
In the embodiment of the application, after the first sampling points are constructed, a closed graph can be constructed by taking each first sampling point as a reference point. In an embodiment of the present application, the constructed closed figure may be a Thiessen polygon. It should be noted that the Thiessen polygon is also called von Lonouh diagram, and the Thiessen polygon is a set of continuous polygons composed of perpendicular bisectors connecting two adjacent point line segments. Any point within a Thiessen polygon is less distant from the control points that make up the polygon than from the control points of other polygons.
In the embodiment of the present application, the shape of each closed figure may also be made the same. For example, each closed figure may be made triangular, circular, rectangular, or the like.
In the embodiment of the present application, the size of each closed figure may be made equal. For example, the constructed closed figures can be all squares with a side length of 1 millimeter.
For example, in the embodiment of the present application, the closed figure may be a circle, and the first sample point may be a center of the closed figure. Thus, the difficulty of constructing the closed graph can be reduced.
It should be noted that, in the embodiments of the present application, the first sample point may be located in the center of the closed figure, may also be located within the closed figure, and may also be located in other positions of the closed figure. For example, in the embodiment of the present application, the closed figure may be a rectangle, and the first vertex may be located at the center of the rectangle, or at any vertex of the rectangle, or at other positions of the rectangle. This is not to be taken as an example.
Step 130, a second sampling point is randomly obtained in each closed graph.
In an embodiment of the present application, after the closed graph is constructed, a second sampling point may be randomly obtained in each closed graph. It should be noted that, in the embodiments of the present application, adjacent closed figures may not overlap with each other. In this way, the distribution of the second pattern points can be made more uniform. Of course, in other embodiments of the present application, there may be an overlapping region between adjacent closed figures, which is not described herein.
Optionally, in an embodiment of the present application, in each closed graph, a first uniform point corresponding to the closed graph may be used as an offset point, and the offset point is offset by a target direction and a target distance, where the offset point after offset is located in the closed graph; the offset point after the offset may be taken as the second sampling point. In this way, the second sample points can be distributed more uniformly by shifting the offset points in the target direction and the target distance.
Exemplarily, in an embodiment of the present application, in a case that the closed graph is a circle and the first sampling point is a center of the closed graph, randomly acquiring one second sampling point within each closed graph includes: in each closed graph, taking a first identical point corresponding to the closed graph as an offset point, and offsetting the offset point by a target direction and a target distance, wherein the target distance is smaller than the radius of the closed graph; and taking the offset point after the offset as a second sampling point.
In the embodiment of the application, both the target direction and the target distance can be randomly selected through a corresponding random number generation algorithm, and only the target distance needs to be smaller than the radius of the closed graph. For example, the closed figure may be a circle having a radius of 1 mm, the target direction may be 15 degrees off from the right-hand direction of the first sampling point, and the target distance may be 0.8 mm.
It should be noted that, in other embodiments of the present application, the second sampling points may also be randomly obtained in the closed graph by using a random number generation algorithm, and specifically, a random number generation algorithm in the prior art may be selected. And will not be described here.
And 140, arranging the microstructures on the surfaces of the microstructures to be arranged based on the obtained second sampling points.
In the embodiment of the present application, after the second sampling points are obtained, the microstructures may be arranged on the surface of the microstructure to be arranged based on the obtained second sampling points. In an embodiment of the present application, the first sampling point may be replaced with the second sampling point. Thus, the microstructures may be arranged in the arrangement of the second spots.
Referring to fig. 4, in the embodiment of the present application, in a case that the preset arrangement mode is a fibonacci forehead arrangement mode, and the reference plane is a surface of the microstructures to be arranged, the second sampling point 230 may also be located on the surface of the microstructures to be arranged, so that the microstructures may be arranged on the surface of the microstructures to be arranged by using the second sampling point 230 as a reference point.
In the embodiment of the application, since the first sampling points are arranged in the preset arrangement manner, the arrangement of the first sampling points 220 is more regular, and the second sampling points 230 have a certain dispersion degree with respect to the first sampling points 220 by randomly obtaining the second sampling points 230 from the closed graph constructed based on the first sampling points 220. In this way, the second sampling points 230 may be arranged not too randomly or too regularly.
In the embodiment of the present application, in the case that the reference surface is a surface constructed based on the surface of the microstructures to be arranged, each of the second sampling points may be mapped to the surface of the microstructures to be arranged; furthermore, a third sampling point can be constructed at the position of the second sampling point mapped to the surface of the microstructure to be distributed; further, the microstructures may be arranged on the surface of the microstructure to be arranged in a one-to-one correspondence manner with the third sampling point as a reference point. Thus, the microstructures may be arranged in the third pattern.
It should be noted that, for example, in the embodiment of the present application, a third sampling point may be constructed on the surface of the microstructure to be arranged in a manner of projecting the second sampling point on the reference surface to the surface of the microstructure to be arranged, so that the microstructures may be arranged on the surface of the microstructure to be arranged in a one-to-one correspondence manner with the third sampling point as a reference point. In embodiments of the present application, the microstructures may be identical in shape and size, which facilitates fabrication of the microstructures. Of course, in other embodiments of the present application, the shape and size of each microstructure may be different, and will not be described herein.
It should be noted that, in the embodiments of the present application, the microstructure may refer to a fine protrusion or a fine depression disposed on a surface on which the microstructure is to be arranged. After the surface of the microstructure to be distributed is provided with the microstructure, the surface of the microstructure to be distributed can become uneven, so that the microstructure can be used for refracting or reflecting light, and the microstructure to be distributed has a special optical effect. Illustratively, the microstructures may be protrusions or depressions having a hemispherical shape, a triangular prism shape, a quadrangular prism shape, or the like. For example, in the case where the microstructure is a hemisphere, the center of sphere of the microstructure may be located at the second sampling point. In addition, in the embodiments of the present application, the microstructure may also be other protruding structures, and the top surface of the microstructure may be a concave surface or a convex surface.
In the embodiment of the present application, a microstructure may be constructed on a three-dimensional model of an optical element based on a microstructure arrangement method, and a real object of the optical element may be processed based on the three-dimensional model of the optical element constructed with the microstructure. In this way, the physical object of the optical element can be made to substantially conform to the three-dimensional model of the optical element. Further, the structures of the microstructures of the optical elements to be processed can be made substantially uniform, and the problem of unstable optical effect of the frosted surface of the optical element due to unstable structure of the frosted surface can be solved.
It should be noted that, in the embodiment of the present application, the density of the first sampling points may be adjusted by adjusting the number of the first sampling points, so as to indirectly adjust the density of the second sampling points. The dispersion of the second sampling points can be adjusted by adjusting the size of the closed figure. In the embodiment of the present application, different microstructure arrangement modes can be constructed by adjusting the density and the dispersion of the second sampling points. Therefore, optical simulation can be carried out on different microstructure arrangement modes and microstructure structure forms, the optical effect of the microstructure can be basically consistent with that of the frosted surface, and therefore the frosted surface can be replaced by the microstructure.
It should be noted that, if the second sampling points are directly constructed on the surface of the microstructure to be arranged in a random manner, the density of the second sampling points is not uniform. The microstructures are deformed, the positions where the arrangement is sparse are sparse, and even the microstructures are not arranged in partial areas, so that the optical effect of the optical element is poor. By adopting the scheme provided by the embodiment of the application, the arrangement of the first sampling points 220 can be more regular, and the second sampling points 230 can have a certain dispersion degree on the basis of the first sampling points 220 by randomly acquiring the second sampling points 230 in the closed graph constructed on the basis of the first sampling points 220, so that the second sampling points 230 are not too random and too regular. Therefore, the microstructures arranged based on the arrangement of the second sampling points 230 are not too random or too regular, and the optical element has a better optical effect.
The embodiment of the application also provides a diffusion plate. The diffusion plate provided by the embodiment of the application comprises a light incident surface and a light emergent surface, wherein microstructures are arranged on at least one of the light incident surface and the light emergent surface according to any one of the microstructure arrangement methods provided by the embodiment of the application.
In this way, in the embodiment of the present application, the microstructure may be built on the three-dimensional model of the diffusion plate based on the microstructure arrangement method, and the real object of the diffusion plate may be processed based on the three-dimensional model of the diffusion plate with the microstructure built therein, so that the real object of the diffusion plate and the three-dimensional model of the diffusion plate may be substantially consistent. Furthermore, the structures of the microstructures of the processed diffusion plates can be basically consistent, so that the problem of unstable optical effect of the frosted surfaces of the diffusion plates caused by unstable structures of the frosted surfaces can be solved.
In addition, in the embodiment of the application, the arrangement of the first sampling points can be more regular, and the second sampling points can have a certain dispersion degree on the basis of the first sampling points by randomly acquiring the second sampling points in the closed graph constructed on the basis of the first sampling points. Thus, the second sampling points are not too random or too regular. Therefore, the microstructures arranged based on the arrangement mode of the second sampling points are not too random or too regular. Thus, the diffusion plate has good optical effect.
It should be noted that, in this document, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present application have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the embodiments of the application, the scope of which is defined in the appended claims and their equivalents.

Claims (10)

1. A method for arranging microstructures, comprising:
constructing a plurality of first sampling points on a reference surface based on a preset arrangement mode;
respectively constructing a closed graph by taking each first sampling point as a reference point;
randomly acquiring a second sampling point in each closed graph;
and arranging the microstructures on the surfaces of the microstructures to be arranged based on the obtained second sampling points.
2. A method of arranging microstructures according to claim 1, wherein the predetermined arrangement is a fibonacci quotieth arrangement or an array arrangement.
3. The method of claim 1, wherein the creating a plurality of first uniform points on a reference plane comprises: constructing a plurality of the first sampling points at the reference surface with a target density.
4. The method of claim 1, wherein the closed figure is a Thiessen polygon.
5. The method of claim 1, wherein all of the closed figures are constructed with the same shape.
6. The method of claim 5, wherein the closed figures are circular, the closed figures are all equal in size, and the first sampling point is the center of the closed figures.
7. A method as claimed in claim 1, wherein randomly acquiring a second sample within each of the closed patterns comprises:
in each closed graph, taking the first same point corresponding to the closed graph as an offset point, and offsetting the offset point by using a target direction and a target distance, wherein the offset point after offset is positioned in the closed graph; and taking the offset point after the offset as the second sampling point.
8. The method of claim 1, wherein the arranging the microstructures on the surface of the microstructures to be arranged based on the obtained second sampling points comprises:
mapping each second sampling point to the surface of the microstructure to be distributed; constructing a third sampling point at the position of the second sampling point mapped to the surface of the microstructure to be distributed; and distributing the microstructures on the surface of the microstructure to be distributed in a one-to-one correspondence manner by taking the third sampling point as a reference point.
9. The method of claim 1, wherein the reference surface is a surface on which the microstructures are to be arranged.
10. A diffusion plate, comprising a light incident surface and a light emergent surface, wherein at least one of the light incident surface and the light emergent surface has microstructures arranged thereon according to the microstructure arrangement method of any one of claims 1 to 9.
CN202210223680.8A 2022-03-07 2022-03-07 Microstructure arrangement method and diffusion plate Pending CN114662291A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210223680.8A CN114662291A (en) 2022-03-07 2022-03-07 Microstructure arrangement method and diffusion plate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210223680.8A CN114662291A (en) 2022-03-07 2022-03-07 Microstructure arrangement method and diffusion plate

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CN114662291A true CN114662291A (en) 2022-06-24

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