CN114659759A - Spectral mismatch testing method of solar simulator - Google Patents
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Abstract
The invention discloses a spectrum mismatch testing method of a solar simulator. The test method specifically comprises the following steps: selecting a1 st standard plate group to a 4 th standard plate group, numbering the standard plates in the 1 st standard plate group to the 4 th standard plate group, then adopting the solar simulator as two testing machines of a light source, respectively testing the short-circuit current of each standard plate in the 1 st standard plate group to the 4 th standard plate group according to the numbering sequence, and judging the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each standard plate in the 1 st standard plate group to the 4 th standard plate group obtained by the test of the two testing machines. According to the technical scheme provided by the invention, whether the spectrum of the solar simulator is mismatched can be quickly determined, a spectrum tester is not required to be additionally purchased for testing, and the quality risk caused by abnormal testing is reduced.
Description
Technical Field
The embodiment of the invention relates to the technical field of light sources of solar simulators, in particular to a method for testing spectrum mismatch of a solar simulator.
Background
The solar simulator is experimental equipment for simulating and realizing the characteristics of spectral distribution, irradiance and the like of real sunlight in a laboratory by utilizing an artificial light source.
The solar simulator light source used by the existing testing machine changes spectral energy distribution along with the increase of the using time, and the situation of spectral mismatch can occur when the change is large. The IEC (International electrotechnical Commission) specifies that the matching degree of the A-class spectrum of the simulator is between 75% and 125%, and the B-class spectrum or the C-class spectrum is beyond the range. In actual use, when the spectrum is mismatched, the testing parameters of the battery piece are inaccurate, so that the stable output of the test is influenced, and certain quality risk is caused. Therefore, the good spectrum matching degree of the solar simulator is an indispensable precondition for accurate product test parameters. At present, a production line uses a Halm tester without a self-contained spectrum test function, and if a spectrum tester needs to be additionally purchased for testing the spectrum grade of the product line, whether the spectrum of the current simulator is mismatched can be known.
Disclosure of Invention
The invention provides a spectrum mismatch testing method of a solar simulator, which can quickly determine whether the spectrum of the solar simulator is mismatched or not without additionally purchasing a spectrum tester for testing, and reduces the quality risk caused by abnormal testing.
In a first aspect, an embodiment of the present invention provides a method for testing a spectrum mismatch of a solar simulator, where the method includes:
selecting a1 st standard plate group to a 4 th standard plate group, wherein the ith standard plate group comprises n ith standard plates, i is a positive integer which is more than or equal to 1 and less than or equal to 4, the quantum efficiency curves of the jth standard plate and the 1 st standard plate are different at a jth wave band, the difference between the short-circuit current of the jth standard plate and the 1 st standard plate is more than or equal to a first preset value, j is a positive integer which is more than or equal to 2 and less than or equal to 4, the 2 nd wave band is a short wave band, the 3 rd wave band is a medium wave band, and the 4 th wave band is a long wave band;
numbering the slices from the 1 st slice group to the 4 th slice group, wherein the numbers of n ith slices in the ith slice group are i1 and i2 … … in respectively;
the method comprises the following steps of (1) respectively testing the short-circuit current of each of the 1 st standard plate group to the 4 th standard plate group according to the serial number sequence by adopting two testing machines taking a solar simulator as a light source;
and judging the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each standard sheet in the 1 st standard sheet group to the 4 th standard sheet group obtained by the testing of the two testing machines.
Optionally, the determining the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each tab in the 1 st tab group to the 4 th tab group obtained by the two testing machines includes:
the two testing machines comprise a first testing machine and a second testing machine, and are used for extracting the short-circuit current of each of the 1 st to 4 th standard plate groups obtained by the testing of the first testing machine and extracting the short-circuit current of each of the 1 st to 4 th standard plate groups obtained by the testing of the second testing machine; wherein, the short circuit current of the I standard slice with the number im in the I standard slice group obtained by the test of the first test machine is I1i-imAnd the short-circuit current of the standard sheet with the number im in the ith standard sheet group obtained by the test of the second test machine is I2i-imM is a positive integer of 1 or more and n or less;
calculating the difference of the short-circuit current corresponding to each slice from the 1 st slice group to the 4 th slice group, wherein the difference Pim of the short-circuit current corresponding to the slice with the number im in the ith slice group is I1i-im-I2i-im；
And judging the spectrum mismatch state of the solar simulator in the two test machines according to the difference of the short-circuit current corresponding to each standard plate from the 1 st standard plate group to the i th standard plate group.
Optionally, determining the spectrum mismatch state of the solar simulator in the two testing machines according to the difference between the short-circuit currents corresponding to the respective tabs in the 1 st tab group to the i th tab group includes:
if the difference between Pjm and P1m is greater than the first preset value, the spectrum mismatch of the solar simulator in the j-th band in the first testing machine or the second testing machine is determined.
Optionally, determining the spectrum mismatch state of the solar simulator in the two testing machines according to the difference between the short-circuit currents corresponding to each tab in the 1 st tab group to the ith tab group includes:
calculating the sum of the differences of the n short-circuit currents corresponding to each slice group, wherein the average value Ai of the sum of the differences of the n short-circuit currents corresponding to the ith slice group is (i1+ Pi2+ … … Pin)/n;
and when the difference between Aj and A1 is larger than or equal to a second preset value, judging that the spectrum of the solar simulator in the first test machine or the second test machine is mismatched at the jth waveband.
Optionally, the second preset value is 0.05.
Optionally, the first preset value is 0.05A.
Optionally, n is 5.
Optionally, the method further includes, after determining the spectrum mismatch state of the solar simulator in the two testing machines:
and displaying the spectrum mismatch state of the solar simulator in the two test machines.
Optionally, the slice numbers in the 1 st slice group to the 4 th slice group are numbered, where the numbers i1 and i2 … … in of n ith slices in the ith slice group respectively include:
the back of the n ith tabs in the ith tab group is marked with i1 and i2 … … in respectively.
Optionally, the method further includes, after determining the spectrum mismatch state of the solar simulator in the two testing machines:
and after the rechecking instruction is detected, the spectrum mismatch state of the solar simulator in the two test machines is detected again.
The spectrum mismatch testing method of the solar simulator comprises the steps of selecting a1 st standard plate group to a 4 th standard plate group, wherein the i th standard plate group comprises n i th standard plates, i is a positive integer which is more than or equal to 1 and less than or equal to 4, quantum efficiency curves of the j th standard plate and the 1 st standard plate have difference in a j wave band, the difference between short-circuit currents of the j th standard plate and the 1 st standard plate is more than or equal to a first preset value, j is a positive integer which is more than or equal to 2 and less than or equal to 4, the 2 nd wave band is a short wave band, the 3 rd wave band is a middle wave band, the 4 th wave band is a long wave band, and then the standard plates in the 1 st to 4 th standard plate groups are numbered, wherein the numbers of the n i th standard plates in the i standard plate group are respectively in i1 and i2 … … in, then two testing machine tables which use the solar simulator as a light source respectively test short-circuit currents of each standard plate in the 1 st to 4 th standard plate groups according to the number sequence, and finally, judging the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each standard sheet in the 1 st standard sheet group to the 4 th standard sheet group obtained by the two testing machines through testing, so that whether the spectrum of the solar simulator is mismatched can be quickly determined, a spectrum tester is not required to be additionally purchased for testing, and the quality risk caused by abnormal testing is reduced.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments made with reference to the following drawings:
fig. 1 is a schematic flowchart of a method for testing a spectrum mismatch of a solar simulator according to an embodiment of the present invention;
FIG. 2 is a graph of wavelength as a function of quantum efficiency according to an embodiment of the present invention;
FIG. 3 is a graph of wavelength as a function of quantum efficiency for another embodiment of the present invention;
FIG. 4 is a graph of wavelength as a function of quantum efficiency for another embodiment of the present invention;
fig. 5 is a schematic flow chart illustrating a process of determining a spectrum mismatch state of a solar simulator in two testing machines according to an embodiment of the present invention;
fig. 6 is a schematic flow chart illustrating a process of determining a spectrum mismatch state of a solar simulator in two testing machines according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention are described in further detail below with reference to the accompanying drawings. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention.
It should be noted that, in order to further explain the technical means and effects of the present invention adopted to achieve the predetermined object, the following detailed description is given to the specific implementation, features and effects of the method for testing the spectrum mismatch of the solar simulator according to the present invention with reference to the accompanying drawings and preferred embodiments.
Fig. 1 is a schematic flowchart of a method for testing a spectrum mismatch of a solar simulator according to an embodiment of the present invention. As shown in fig. 1, the testing method specifically includes the following steps:
s110, selecting a1 st standard plate group to a 4 th standard plate group, wherein the ith standard plate group comprises n ith standard plates, i is a positive integer which is more than or equal to 1 and less than or equal to 4, quantum efficiency curves of the jth standard plate and the 1 st standard plate are different in a jth wave band, the difference between short-circuit currents of the jth standard plate and the 1 st standard plate is more than or equal to a first preset value, j is a positive integer which is more than or equal to 2 and less than or equal to 4, the 2 nd wave band is a short wave band, the 3 rd wave band is a middle wave band, and the 4 th wave band is a long wave band.
In real life, solar radiation can change along with changes of factors such as time, geographical position and seasons, reproducibility and comparability of current and voltage data measured by the photovoltaic module under natural light are poor, and deviation can be generated in monitoring of photoelectric conversion efficiency, so that generally, a solar simulator is used for testing the photovoltaic module indoors, the solar simulator can provide approximate standard solar spectrum, and the matching degree of the solar simulator and a standard light source greatly influences the test result of the photovoltaic module.
It should be noted that Quantum Efficiency (QE) of the target is an important parameter for converting light energy into electric energy in a solar cell, and represents a ratio of an average number of photoelectrons generated in a certain wavelength range to an incident number of photons. In the present embodiment, the test wavelength range may be 300-1200nm, and specifically, fig. 2 is a graph of the variation of wavelength with quantum efficiency provided by the embodiment of the present invention. As shown in fig. 2, S1 is the variation curve of the wavelength with the quantum efficiency of the 1 st tab, S2 is the variation curve of the wavelength with the quantum efficiency of the 2 nd tab, and the quantum efficiencies of S2 and S1 are different in the short wavelength band. Fig. 3 is a graph of wavelength as a function of quantum efficiency according to another embodiment of the present invention. As shown in fig. 3, S1 is the variation curve of the wavelength with the quantum efficiency of the 1 st tab, S3 is the variation curve of the wavelength with the quantum efficiency of the 3 rd tab, and the quantum efficiencies of S3 and S1 are different in the middle band. Fig. 4 is a graph of wavelength as a function of quantum efficiency according to another embodiment of the present invention. As shown in FIG. 4, S1 is the variation curve of the wavelength with the quantum efficiency of the 1 st tab, S4 is the variation curve of the wavelength with the quantum efficiency of the 4 th tab, and the quantum efficiencies of S4 and S1 are different in the long wavelength band.
It should be noted that the 1 st tab set to the 4 th tab set are selected from battery pieces produced in mass production in a production line, and can be used as spectrum verification tabs of a solar simulator, and specifically can be directly selected in a quantum efficiency test step in a conventional mass production process, so as to reduce the difficulty in tab selection. When the target is selected, the mismatch of the solar simulator is in direct proportion to the difference of the spectrum wave bands, the larger the difference of the spectrum wave bands is, the more sensitive the mismatch performance of the different wave bands of the spectrum of the solar simulator is, and the more prominent the parameter characteristics of the related target are. When measuring the quantum efficiency of different patches, in order to ensure that the measured data has a reference significance, a point-shaped local part cannot be taken on the patch for testing. In addition, when selecting the standard sheet, the following requirements are required to be met: 1) the appearance is A grade, and the defects of dirt, foreign matters and the like are not allowed to exist; 2) the electroluminescent grade is A grade, and the electrical property is good; 3) the irradiation is carried out for more than 12 hours by using a halogen lamp with the irradiance of 1000 +/-50W/square meter so as to achieve the purpose of reducing the photoinduced attenuation, or the cell is placed in the air and stands for 3 days so as to achieve the purpose of reducing the time attenuation, so that the cell is in a stable state, and the variation of the cell in the later use process is reduced; 4) ensuring that the difference between the short-circuit current Isc of the n standard plates in each of the 2 nd standard plate group, the 3 rd standard plate group and the 4 th standard plate group and the short-circuit current Isc of the n standard plates in the 1 st standard plate group is large enough, and the difference value of the short-circuit current Isc is small, so that the difference of the spectrum response of the cell is small, and quickly determining whether the spectrum of the solar simulator is mismatched; 5) in slice group 1: the electrical performance parameter characteristics of the battery piece need to meet the parameter characteristics of most products in the field, and each control parameter of the battery piece needs to be smaller than or equal to a central value, and the control parameters include: the color of the cell must be the dominant color, such as weight loss, sheet resistance, film layer, refractive index, wet weight, etc.
S120, numbering the 1 st slice group to the 4 th slice group, wherein the numbers of the n ith slices in the ith slice group are i1 and i2 … … in respectively.
In addition, in this embodiment, the manner of numbering the slice in the 1 st slice group to the 4 th slice group is not limited, and for example, the order of fetching slices or the quantum efficiency may be used.
In addition, in order to distinguish different tabs, a number mark may be formed on the tab, and a specific forming process is not limited, and may be, for example, a laser.
And S130, adopting two testing machines which take the solar simulator as a light source, and respectively testing the short-circuit current of each standard plate in the 1 st to 4 th standard plate groups according to the numbering sequence.
In the application of the solar photovoltaic device, the short-circuit current Isc is the current which flows through two ends of the solar cell when the output end is in short circuit when the solar cell is placed under the irradiation of a standard light source, the short-circuit current is mainly influenced by the spectrum difference, the quality of the cell can be judged by measuring the short-circuit current Isc of the solar cell, the power and the efficiency of the cell are obtained, and the performance of the solar cell is analyzed and compared by taking the short-circuit current Isc as a main parameter when a user purchases the solar cell.
Specifically, on the basis of the above steps, the number sequence from 1 to n of the tabs in each group from the 1 st tab group to the 4 th tab group is tested for electrical property data, and the electrical property data is the short-circuit current Isc.
In this embodiment, before the two testing machines using the solar simulator as the light source perform the electrical performance data test, in order to ensure the accuracy of the measured data, it is further confirmed from the following aspects: 1) ensuring that the electrical property calibration data of each test machine is within a standard range; 2) ensuring that no foreign matter is placed in a darkroom of each testing machine table and no shielding object exists between the incident light and the cell; 3) the darkroom of each testing machine table is ensured to be closed tightly without gap light leakage; 4) the repetition value (GRR value) of the stability performance of each test machine is less than 10, and it is ensured that no other equipment abnormality exists. If any one of the above conditions is lost, the result of the electrical performance data test performed by the test machine has errors, and the quality risk of the abnormal test is further caused.
S140, judging the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each standard plate in the 1 st standard plate group to the 4 th standard plate group obtained by the testing of the two testing machines.
In the photovoltaic module test, the spectrum mismatch can cause short-circuit current density errors, in order to reduce the influence of the spectrum mismatch errors on the test result as much as possible, firstly, two test machines are adopted to test and obtain the short-circuit current of the 1 st slice group under the standard test condition, and then the 2 nd slice group, the 3 rd slice group and the 4 th slice group are tested, so that the short-circuit currents of the three slice groups under the same standard test condition can be obtained.
It should be noted that, in the above-mentioned test method for obtaining the short-circuit current of each slice in the 1 st slice group to the 4 th slice group by the test of two test machines, the use premise is that the spectral responses of the four slice groups are consistent, and only the influence of the spectral mismatch of the solar simulator on the short-circuit current needs to be considered.
Specifically, the specific method for determining the spectrum mismatch state of the solar simulator in the two test machines according to the short-circuit current measured by the two test machines is specifically described in other embodiments.
The spectrum mismatch testing method of the solar simulator of the embodiment includes selecting a1 st standard plate group to a 4 th standard plate group, wherein the i th standard plate group includes n i th standard plates, i is a positive integer which is greater than or equal to 1 and less than or equal to 4, quantum efficiency curves of the j th standard plate and the 1 st standard plate have difference in a j wave band, the difference between short-circuit currents of the j th standard plate and the 1 st standard plate is greater than or equal to a first preset value, j is a positive integer which is greater than or equal to 2 and less than or equal to 4, the 2 nd wave band is a short wave band, the 3 rd wave band is a middle wave band, the 4 th wave band is a long wave band, and then standard plates in the 1 st to 4 th standard plate groups are numbered, wherein the numbers of the n i th standard plates in the i standard plate group are respectively in i1 and i2 … … in, then two testing machines which use the solar simulator as a light source are adopted to respectively test the short-circuit currents of each standard plate in the 1 st to 4 th standard plate groups according to the number sequence, and finally, judging the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each standard sheet in the 1 st standard sheet group to the 4 th standard sheet group obtained by the two testing machines through testing, so that whether the spectrum of the solar simulator is mismatched can be quickly determined, a spectrum tester is not required to be additionally purchased for testing, and the quality risk caused by abnormal testing is reduced.
Optionally, fig. 5 is a schematic flowchart of a process for determining a spectrum mismatch state of solar simulators in two testing machines according to an embodiment of the present invention. According to the short-circuit current of each tab in the 1 st tab group to the 4 th tab group obtained by the test of the two test machines, the spectrum mismatch state of the solar simulator in the two test machines can be judged, as shown in fig. 5, the judging method specifically comprises the following steps:
s510, the two testing machines comprise a first testing machine and a second testing machine, short-circuit currents of all the slices from the 1 st slice group to the 4 th slice group obtained through testing of the first testing machine are extracted, and short-circuit currents of all the slices from the 1 st slice group to the 4 th slice group obtained through testing of the second testing machine are extracted, wherein the short-circuit current of the slice with the number im in the ith slice group obtained through testing of the first testing machine is I1i-imAnd the short-circuit current of the standard sheet with the number im in the ith standard sheet group obtained by the test of the second test machine is I2i-imAnd m is a positive integer of 1 to n.
Specifically, when the spectrum matching verification target is selected, in order to ensure that the quantum efficiency of the selected cell is more ideal, in this embodiment, the value of n may be 5, but is not limited to 5. Table 1 shows the 1 st to 1 st slice in the 1 st slice group obtained by the test of the first test machine and the second test machineShort circuit current of the 5 th patch. Referring to table 1, the short-circuit current I of the 1 st slice group numbered 15 slices obtained by the first testing machine test can be obtained11-15And the short-circuit current I of the No. 15 standard pieces in the No. 1 standard piece group obtained by the test of the second test machine21-15. Table 2 shows short-circuit currents of the 1 st tab to the 5 th tab in the 2 nd tab group obtained by the test of the first test machine and the second test machine. Table 3 shows short-circuit currents of the 1 st tab to the 5 th tab in the 3 rd tab group obtained by the test of the first test machine and the second test machine. Table 4 shows short-circuit currents of the 1 st tab to the 4 th tab in the 4 th tab group obtained by the test of the first test machine and the second test machine.
TABLE 1
TABLE 2
TABLE 3
TABLE 4
S520, calculating a difference between short-circuit currents corresponding to each slice in the 1 st slice group to the 4 th slice group, where the difference Pim between the short-circuit currents corresponding to the slices numbered im in the ith slice group is equal to I1i-im-I2i-im。
For example, in this embodiment, a short-circuit current obtained by the 3 rd calibration set test by the first test machine and the second test machine is taken as an example for description. Referring to table 3, the first testing machine and the second testing machine obtain P33 (10.456-10.332) 0.124 in the 3 rd tab test.
S530, judging the spectrum mismatch state of the solar simulator in the two testing machines according to the difference of the short-circuit current corresponding to each standard plate in the 1 st standard plate group to the ith standard plate group.
Optionally, determining the spectrum mismatch state of the solar simulator in the two testing machines according to the difference between the short-circuit currents corresponding to the respective tabs in the 1 st tab group to the i th tab group includes:
if the difference between Pjm and P1m is greater than the first preset value, the spectrum mismatch of the solar simulator in the j-th band in the first testing machine or the second testing machine is determined.
The first preset value is a value set by an operator according to the fact that whether the spectrum of the solar simulator is mismatched or not is quickly determined.
For example, in this embodiment, a short-circuit current of a single target obtained by the 3 rd calibration set test by using a first test machine and a second test machine is taken as an example for description. Referring to table 3, in the 3 rd tab group, P33 of the first testing machine and the second testing machine at the 1 st tab 31 is 0.221, for the tab at the same position, referring to table 1, the value of P11 of the first testing machine and the second testing machine at the 1 st tab group 11 is 0.006, the absolute value of the difference between P11 and P31 is taken to compare with the first preset value, if the absolute value of the difference is greater than the first preset value, it is determined that the solar simulator in the first testing machine or the second testing machine is in a mismatch state in the middle band spectrum, and if the absolute value of the difference is less than or equal to the first preset value, it is determined that the solar simulator in the first testing machine or the second testing machine is not in a mismatch state in the middle band spectrum.
For example, if it is determined that the spectrum of the solar simulator in the first test machine or the second test machine in the middle band is in the mismatch state, the operator may obtain that the spectrum of the solar simulator in the first test machine or the second test machine in the middle band is in the mismatch state through the console connected to the test machine.
It should be noted that, in other calibration groups, the method for determining whether the spectra of the solar simulators in the two test machines are in a mismatch state is the same as the method for determining whether the spectra of the solar simulators in the calibration group 3 in this embodiment, and details are not repeated here.
Optionally, fig. 6 is a schematic flow chart illustrating a further process for determining a spectrum mismatch state of the solar simulator in the two test machines according to the embodiment of the present invention. Specifically, according to the difference between the short-circuit currents corresponding to each of the 1 st tab group to the i th tab group, the spectrum mismatch state of the solar simulator in the two testing machines can be determined, as shown in fig. 6, the determining method specifically includes the following steps:
and S610, calculating the sum of the differences of the n short-circuit currents corresponding to each slice group, wherein the average value Ai of the sum of the differences of the n short-circuit currents corresponding to the ith slice group is (Pi1+ Pi2+ … … Pin)/n.
For example, in this embodiment, the short-circuit current obtained by the 3 rd calibration set test by the first test machine and the second test machine is still used as an example for description. Referring to table 3, in the 3 rd tab group, the difference values of the short-circuit currents measured at the 1 st tab 31, the 2 nd tab 32, the 3 rd tab 33, the 4 th tab 34 and the 5 th tab 35 by the first testing station and the second testing station are 0.221, 0.12, 0.133, 0.1424 and 0.096 respectively, and the five values are summed and averaged to obtain A3 of 0.1388.
And S620, when the difference between Aj and A1 is larger than or equal to a second preset value, judging that the spectrum of the solar simulator in the first test machine or the second test machine is mismatched at the jth wave band.
Similarly, the second predetermined value is a value set by an operator to quickly determine whether the solar simulator spectrum is mismatched.
Specifically, referring to table 1, in the 1 st tab group, the difference values of the short-circuit currents measured at the 1 st tab 11, the 2 nd tab 12, the 3 rd tab 13, the 4 th tab 14 and the fifth tab 15 by the first testing station and the second testing station are 0.006, 0.01, 0.011, 0.013 and 0.0009, respectively, and the sum and the average of these five values are performed to obtain a1 of 0.0098.
On the basis of the above steps, it is determined that A3 is 0.0106, the absolute value of the difference between a1 and A3 is compared with a second preset value, if the absolute value of the difference is greater than or equal to the second preset value, it is determined that the spectrum of the solar simulator in the first test machine or the second test machine in the middle band is in a mismatch state, and if the absolute value of the difference is less than the second preset value, it is determined that the spectrum of the solar simulator in the first test machine or the second test machine in the middle band is not in a mismatch state.
Optionally, the first preset value is 0.05.
Optionally, the second preset value is 0.05A.
It should be noted that the first preset value and the second preset value are already described in the above embodiments, and are not described herein again.
Optionally, n is 5.
When selecting the spectrum matching verification standard plate, the more the number of the standard plates verified is better in principle, but in this embodiment, in order to ensure that the quantum efficiency of the selected battery plate is more ideal, the standard plates verified by collection can be screened, and finally, 5 standard plates are selected from each group of standard plate groups for testing.
Optionally, the method further includes, after determining the spectrum mismatch state of the solar simulator in the two testing machines: and displaying the spectrum mismatch state of the solar simulator in the two test machines.
Illustratively, the two testing machines send the testing data to the upper computer, the upper computer analyzes the received data, and displays an analysis result on a display screen of the upper computer, for example, if the analysis result indicates that at least one of the two testing machines has a mid-band mismatch problem, then "the mid-band mismatch of the testing machine 1 or the testing machine 2" is displayed on the display screen. It is understood that, in other embodiments of this embodiment, the mismatch condition may also be displayed in other manners, and this embodiment is not particularly limited to this.
Optionally, the slice numbers in the 1 st slice group to the 4 th slice group are numbered, where the numbers i1 and i2 … … in of n ith slices in the ith slice group respectively include: the back of the n ith tabs in the ith tab group is marked with i1 and i2 … … in respectively.
Under the premise of not influencing the chip efficiency of each verification cell, the back of each standard chip can be numbered digitally.
For example, the process of numbering the number on the back of each tab may be: the laser code spraying process is adopted, the label sheet is formed by direct laser and instant gasification on the back surface, and the number can also be formed by other manufacturing processes, which are not limited here.
Optionally, the method further includes, after determining the spectrum mismatch state of the solar simulator in the two testing machines: and after the rechecking instruction is detected, the spectrum mismatch state of the solar simulator in the two test machines is detected again.
Specifically, after confirming that the spectrum mismatch problem occurs in at least one of the two testing machines, the worker checks and solves the spectrum mismatch problem by replacing the light source, replacing the filter and the like, controls the generation of a rechecking instruction by a button and the like, and rechecks the mismatch band of the solar simulator in the two testing machines again, wherein the specific testing mode is the same as the mode mentioned in the foregoing, and is not described again here.
It can be understood that if the re-detection result confirms that the spectrum mismatch problem of the mismatch waveband disappears, the spectrum mismatch correction is confirmed to be completed, otherwise, the staff is prompted to continue to process until the spectrum mismatch problem disappears.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious modifications, rearrangements, combinations and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. A method for testing spectral mismatch of a solar simulator is characterized by comprising the following steps:
selecting a1 st standard plate group to a 4 th standard plate group, wherein the ith standard plate group comprises n ith standard plates, i is a positive integer which is more than or equal to 1 and less than or equal to 4, the quantum efficiency curves of the jth standard plate and the 1 st standard plate have difference at a jth wave band, the difference between the short-circuit current of the jth standard plate and the 1 st standard plate is more than or equal to a first preset value, j is a positive integer which is more than or equal to 2 and less than or equal to 4, the 2 nd wave band is a short wave band, the 3 rd wave band is a medium wave band, and the 4 th wave band is a long wave band;
numbering the slices from the 1 st slice group to the 4 th slice group, wherein the numbers of n ith slices in the ith slice group are i1 and i2 … … in respectively;
the method comprises the following steps of (1) respectively testing the short-circuit current of each of the 1 st standard plate group to the 4 th standard plate group according to the serial number sequence by adopting two testing machines taking a solar simulator as a light source;
and judging the spectrum mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each standard sheet in the 1 st standard sheet group to the 4 th standard sheet group obtained by the testing of the two testing machines.
2. The method for testing spectral mismatch according to claim 1, wherein the step of judging the spectral mismatch state of the solar simulator in the two testing machines according to the short-circuit current of each of the 1 st to 4 th slice groups obtained by the two testing machines comprises:
the two testing machines comprise a first testing machine and a second testing machine, and are used for extracting the short-circuit current of each of the 1 st to 4 th standard plate groups obtained by the testing of the first testing machine and extracting the short-circuit current of each of the 1 st to 4 th standard plate groups obtained by the testing of the second testing machine; wherein, the short circuit current of the I standard slice with the number im in the I standard slice group obtained by the test of the first test machine is I1i-imThe short-circuit current of the standard sheet with the number im in the ith standard sheet group obtained by the test of the second test machine is I2i-imM is a positive integer of 1 or more and n or less;
calculating the difference of the short-circuit current corresponding to each slice from the 1 st slice group to the 4 th slice group, wherein the index im numbered in the ith slice groupThe difference Pim of the short-circuit current corresponding to the chip is I1i-im-I2i-im；
And judging the spectrum mismatch state of the solar simulator in the two test machines according to the difference of the short-circuit current corresponding to each standard plate from the 1 st standard plate group to the i th standard plate group.
3. The method of claim 2, wherein the determining the spectrum mismatch state of the solar simulator in the two testing machines according to the difference between the short-circuit currents corresponding to the respective tabs in the 1 st tab group to the i th tab group comprises:
if the difference between Pjm and P1m is greater than the first preset value, the spectrum mismatch of the solar simulator in the j-th band in the first testing machine or the second testing machine is determined.
4. The method of claim 1, wherein the step of determining the spectrum mismatch state of the solar simulator in the two testing machines according to the difference between the short-circuit currents corresponding to the respective tabs in the 1 st tab group to the i th tab group comprises:
calculating the sum of the differences of the n short-circuit currents corresponding to each slice group, wherein the average value Ai of the sum of the differences of the n short-circuit currents corresponding to the ith slice group is (Pi1+ Pi2+ … … Pin)/n;
and when the difference between Aj and A1 is larger than or equal to a second preset value, judging that the spectrum of the solar simulator in the first test machine or the second test machine is mismatched at the jth waveband.
5. The method for testing spectral mismatch according to claim 3 or 4, wherein said second preset value is 0.05.
6. The method for testing spectral mismatch according to claim 1, wherein said first preset value is 0.05A.
7. The method of claim 1, wherein n-5.
8. The method for testing spectral mismatch according to claim 1, wherein the step of determining the spectral mismatch state of the solar simulator in the two testing machines further comprises:
and displaying the spectrum mismatch state of the solar simulator in the two test machines.
9. The method of claim 1, wherein the slice numbers from 1 st slice group to 4 th slice group are numbered, wherein the numbers i1 and i2 … … in of n ith slices in the ith slice group respectively comprise:
the back of the n ith tabs in the ith tab group is marked with i1 and i2 … … in respectively.
10. The method for testing spectral mismatch according to claim 1, wherein the step of determining the spectral mismatch state of the solar simulator in the two testing machines further comprises:
and after the rechecking instruction is detected, the spectrum mismatch state of the solar simulator in the two test machines is detected again.
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