CN114627636A - Infrared chip code sending function test method and device, electronic equipment and storage medium - Google Patents
Infrared chip code sending function test method and device, electronic equipment and storage medium Download PDFInfo
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- CN114627636A CN114627636A CN202210531632.5A CN202210531632A CN114627636A CN 114627636 A CN114627636 A CN 114627636A CN 202210531632 A CN202210531632 A CN 202210531632A CN 114627636 A CN114627636 A CN 114627636A
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- 238000012360 testing method Methods 0.000 claims abstract description 90
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- 230000006870 function Effects 0.000 claims description 58
- 238000004590 computer program Methods 0.000 claims description 10
- 238000011990 functional testing Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 17
- 238000004519 manufacturing process Methods 0.000 description 4
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- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C23/00—Non-electrical signal transmission systems, e.g. optical systems
- G08C23/04—Non-electrical signal transmission systems, e.g. optical systems using light waves, e.g. infrared
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- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C25/00—Arrangements for preventing or correcting errors; Monitoring arrangements
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- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C2201/00—Transmission systems of control signals via wireless link
- G08C2201/20—Binding and programming of remote control devices
Abstract
The invention discloses a method and a device for testing code sending function of an infrared chip, electronic equipment and a storage medium, wherein the method comprises the following steps: recording coding format information of a code type sent by a key of an infrared code sending chip to be tested through recording equipment, and transmitting the coding format information to test equipment; when the infrared code sending chip is tested, the testing equipment triggers the same keys and records the coding format information of the code sent by the keys; the testing device judges whether the errors of the coding format information recorded by the testing device and the coding format information received from the recording device are within the testing errors; if so, the code sending function of the infrared code sending chip is normal. The method can accurately test the correctness of the code pattern no matter whether the code pattern sent by the infrared integrated circuit needs to be checked by an odd-even frame or has a simple code repetition function and needs to test one frame or a plurality of frames, thereby judging whether the function of the infrared integrated circuit is normal or not.
Description
Technical Field
The present invention relates to the field of chip testing, and more particularly, to a method and apparatus for testing code sending function of an infrared chip, an electronic device, and a storage medium.
Background
The infrared remote control is a wireless and non-contact control technology, has the obvious characteristics of strong anti-interference capability, reliable information transmission, low power consumption, low cost, easy realization and the like, is widely adopted by a plurality of electronic devices, particularly household appliances, and has the same or different principles of various infrared remote control systems in application, but the difference is that the signal coding formats of the systems are different. The remote control coded pulse carries out Pulse Amplitude Modulation (PAM) on a 38KHz carrier wave to form a remote control signal, the remote control signal is transmitted out by an infrared transmitting tube through a driving circuit, and the modulated remote control signal is received by an infrared receiving head and is subjected to preamplification, amplitude limiting amplification, band-pass filtering, peak detection and waveform shaping, so that the remote control pulse opposite to the input remote control signal is demodulated.
Because the difference of various code type coding formats is large, the formats are difficult to be identified uniformly. During the production of the integrated circuits, the functions of the integrated circuits may be abnormal, and therefore, before being soldered to the PCB, each integrated circuit needs to be tested to ensure its functions are correct. However, since the infrared code patterns are many, the automatic test tool needs to be modified frequently to adapt to the change, which brings inconvenience to the production test.
The traditional test mode of the infrared code sending integrated circuit is to completely decode the infrared codes sent by the infrared code sending integrated circuit, obtain information such as the code pattern, the key value, the user code and the like of the key at the time through decoding, and then judge whether the information is correct or not. This approach requires that the test equipment have the ability to decode all of the infrared patterns, otherwise it is impossible to determine whether the integrated circuit functions correctly. Therefore, the decoding procedure needs to be updated irregularly, and the decoding function of the new code pattern is added, which brings certain risks and difficulties to production and maintenance.
The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a method and a device for testing the code sending function of an infrared chip, electronic equipment and a storage medium, which solve the problems that the traditional test method of an infrared code sending integrated circuit needs to update a decoding program irregularly and add a decoding function of a new code type.
In order to achieve the above object, an embodiment of the present invention provides a method for testing a code sending function of an infrared code sending chip.
In one or more embodiments of the invention, the method comprises: recording coding format information of a code type sent by a key of an infrared code sending chip to be tested through recording equipment, and transmitting the coding format information to test equipment; when the infrared code sending chip is tested, the testing equipment triggers the same keys and records the coding format information of the code sent by the keys; the testing device judges whether the errors of the coding format information recorded by the testing device and the coding format information received from the recording device are within the testing errors; if so, the code sending function of the infrared code sending chip is normal.
In one or more embodiments of the present invention, the encoding format information includes: the time length of each carrier part of the pattern and the time length of each non-carrier part of the pattern.
In one or more embodiments of the invention, the method further comprises: and when the recording duration of the recording equipment reaches the total recording duration, the recording equipment stops recording.
In one or more embodiments of the present invention, the recording device and the testing device may be the same device, and the device has a carrier recording function and an analog key function.
In another aspect of the present invention, an apparatus for testing code sending function of an infrared code sending chip is provided, which includes a recording module and a testing module.
And the recording module is used for recording the coding format information of the code type sent by the keys of the infrared code sending chip to be tested through recording equipment and transmitting the coding format information to the testing equipment.
The test module is used for triggering the same key by the test equipment and recording the coding format information of the code type sent by the key when the infrared code sending chip is tested; the testing device judges whether the errors of the coding format information recorded by the testing device and the coding format information received from the recording device are within the testing errors; if so, the code sending function of the infrared code sending chip is normal.
In one or more embodiments of the invention, the recording module is further configured to: and when the recording duration of the recording equipment reaches the total recording duration, the recording equipment stops recording.
In one or more embodiments of the present invention, the encoding format information includes: the time length of each carrier part of the pattern and the time length of each non-carrier part of the pattern.
In one or more embodiments of the present invention, the recording device and the testing device may be the same device, and the device has a carrier recording function and an analog key function.
In another aspect of the present invention, there is provided an electronic device including: at least one processor; and a memory storing instructions that, when executed by the at least one processor, cause the at least one processor to perform the method of infrared code chip code function testing as described above.
In another aspect of the present invention, a computer-readable storage medium is provided, on which a computer program is stored, which, when being executed by a processor, implements the steps of the method for testing the code sending function of an infrared code sending chip as described.
Compared with the prior art, the method and the device for testing the code sending function of the infrared chip, the electronic equipment and the storage medium can judge whether the code sending function of the infrared code sending chip is normal or not by comparing the coding format information recorded by the recording equipment and the testing equipment.
Drawings
FIG. 1 is a flow chart of a method for testing code sending function of an infrared code sending chip according to an embodiment of the invention;
FIG. 2 is a schematic diagram of a 3010 code type encoding format of a method for testing a code sending function of an infrared code sending chip according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a 6122 code pattern encoding format of a method for testing a code sending function of an infrared code sending chip according to an embodiment of the present invention;
FIG. 4 is a 9012 code type encoding format diagram of a method for testing a code sending function of an infrared code sending chip according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a 5104 code pattern coding format of a method for testing code sending function of an infrared code sending chip according to an embodiment of the invention;
FIG. 6 is a schematic diagram of encoding format information of a method for testing code sending function of an infrared code sending chip according to an embodiment of the present invention;
FIG. 7 is a block diagram of an apparatus for testing code-sending function of an infrared code-sending chip according to an embodiment of the present invention;
fig. 8 is a hardware structure diagram of a computing device for testing the code sending function of the infrared code sending chip according to an embodiment of the invention.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
The technical solutions provided by the embodiments of the present invention are described in detail below with reference to the accompanying drawings.
Example 1
Referring to fig. 1 to 6, a method for testing code sending function of an infrared code sending chip according to an embodiment of the present invention is described, which includes the following steps.
In step S101, recording, by a recording device, encoding format information of a code pattern transmitted by a key of an infrared code transmitting chip to be tested, and transmitting the encoding format information to a testing device.
The initialization sets the total recording duration and allowable test errors of the recording apparatus. Recording all information (coding format information) of a certain key sending code pattern of the infrared code sending chip to be detected through recording equipment, wherein the code pattern comprises but is not limited to a 3010 code pattern, a 6122 code pattern, a 9012 code pattern and a 5104 code pattern, the coding format schematic diagram of the code patterns is shown in figures 2-5, the recorded coding format information comprises the time length of each carrier-carrying part of the code pattern and the time length of each carrier-free part of the code pattern, and the recording equipment stops recording when the recording time length of the recording equipment reaches the total recording time length.
As shown in fig. 6, where D0-D17 are the time duration needed for recording, the time duration of the carrier part is D0, D2, D4, D6, D8, etc., the time duration of the carrier-free part is D1, D3, D5, D7, D9, etc., and D18 is the total recording time duration.
In step S102, during the test of the infrared code sending chip, the test equipment triggers the same key and records the coding format information of the code sent by the key.
When the infrared code sending chip is tested, the testing equipment presses a key which is the same as that of the recording equipment, the testing equipment records all information (coding format information) of the sent code pattern, the recorded coding format information comprises the time length of each carrier-carrying part of the code pattern and the time length of each carrier-free part of the code pattern, and the recording equipment stops recording when the recording time length of the recording equipment reaches the total recording time length.
In step S103, the test apparatus determines whether the errors of the encoding format information it records and the encoding format information received from the recording apparatus are within the test error.
The test equipment compares the code format information recorded by the test equipment, namely the time length of each carrier part and each carrier-free part of the code pattern with the code format information (namely D0-D17) recorded by the record equipment one by one, if the comparison error of the time length of each part is within the allowable test error, the test is passed, and the code sending function of the infrared code sending chip is normal.
In step S104, the code sending function of the infrared code sending chip is normal.
According to the method and the device for testing the code sending function of the infrared chip, the electronic equipment and the storage medium, whether the code sending function of the infrared code sending chip is normal or not can be judged by comparing the coding format information recorded by the recording equipment and the testing equipment.
Referring to fig. 7, an apparatus for testing code sending function of an infrared code sending chip according to an embodiment of the present invention is described.
In the embodiment of the invention, the device for testing the code sending function of the infrared code sending chip comprises a recording module 701 and a testing module 702.
The recording module 701 is used for recording the coding format information of the code type sent by the keys of the infrared code sending chip to be tested through the recording equipment and transmitting the coding format information to the testing equipment.
The testing module 702 is used for triggering the same key by the testing equipment and recording the coding format information of the code type sent by the key when the infrared code sending chip is tested; the testing equipment judges whether the errors of the coding format information recorded by the testing equipment and the coding format information received from the recording equipment are within the testing errors or not; if so, the code sending function of the infrared code sending chip is normal.
The recording module 701 is further configured to: when the recording time of the recording device reaches the total recording time, the recording device stops recording.
In this embodiment, the encoding format information includes: the time length of each of the carrier portions of the pattern and the time length of each of the non-carrier portions of the pattern. The recording device and the testing device can be the same device, and the device has a carrier recording function and a simulated key function.
Fig. 8 shows a hardware block diagram of a computing device 80 for code-sending function testing of an infrared code-sending chip according to an embodiment of the present specification. As shown in fig. 8, computing device 80 may include at least one processor 801, storage 802 (e.g., non-volatile storage), memory 803, and a communication interface 804, and the at least one processor 801, storage 802, memory 803, and communication interface 804 are connected together via a bus 805. The at least one processor 801 executes at least one computer readable instruction stored or encoded in the memory 802.
It should be appreciated that the computer-executable instructions stored in the memory 802, when executed, cause the at least one processor 801 to perform the various operations and functions described above in connection with fig. 1-8 in the various embodiments of the present description.
In embodiments of the present description, computing device 80 may include, but is not limited to: personal computers, server computers, workstations, desktop computers, laptop computers, notebook computers, mobile computing devices, smart phones, tablet computers, cellular phones, Personal Digital Assistants (PDAs), handheld devices, messaging devices, wearable computing devices, consumer electronics, and so forth.
According to one embodiment, a program product, such as a machine-readable medium, is provided. A machine-readable medium may have instructions (i.e., elements described above as being implemented in software) that, when executed by a machine, cause the machine to perform various operations and functions described above in connection with fig. 1-8 in the various embodiments of the present specification. Specifically, a system or apparatus may be provided which is provided with a readable storage medium on which software program code implementing the functions of any of the above embodiments is stored, and causes a computer or processor of the system or apparatus to read out and execute instructions stored in the readable storage medium.
According to the method and the device for testing the code sending function of the infrared chip, the electronic equipment and the storage medium, whether the code sending function of the infrared code sending chip is normal or not can be judged by comparing the coding format information recorded by the recording equipment and the testing equipment.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (8)
1. A method for testing code sending function of an infrared code sending chip is characterized by comprising the following steps:
recording coding format information of a code type sent by a key of an infrared code sending chip to be tested through recording equipment, and transmitting the coding format information to test equipment;
when the infrared code sending chip is tested, the testing equipment triggers the same keys and records the coding format information of the code sent by the keys; and
the test equipment judges whether the errors of the coding format information recorded by the test equipment and the coding format information received from the recording equipment are within the test errors; if so,
the code sending function of the infrared code sending chip is normal.
2. The method for testing the code sending function of the infrared code sending chip as claimed in claim 1, wherein the coding format information comprises: the time length of each carrier part of the pattern and the time length of each non-carrier part of the pattern.
3. The method for testing the code sending function of the infrared code sending chip as claimed in claim 1, wherein the method further comprises:
and when the recording duration of the recording equipment reaches the total recording duration, the recording equipment stops recording.
4. The method for testing the code sending function of the infrared code sending chip as claimed in claim 1, wherein the recording device and the testing device can be the same device, and the device has a carrier recording function and an analog key function.
5. The utility model provides a device that infrared code chip sent out a yard functional test which characterized in that, the device includes:
the recording module is used for recording the coding format information of the code type sent by the keys of the infrared code sending chip to be tested through recording equipment and transmitting the coding format information to the testing equipment; and
the test module is used for triggering the same key by the test equipment and recording the coding format information of the code type sent by the key when the infrared code sending chip is tested; the testing device judges whether the errors of the coding format information recorded by the testing device and the coding format information received from the recording device are within the testing errors; if so, the code sending function of the infrared code sending chip is normal.
6. The apparatus for testing code sending function of infrared code sending chip of claim 5, wherein the recording module is further configured to:
and when the recording duration of the recording equipment reaches the total recording duration, the recording equipment stops recording.
7. An electronic device, comprising:
at least one processor; and
a memory storing instructions that, when executed by the at least one processor, cause the at least one processor to perform the method of infrared code-emitting chip code-emitting functional testing of any of claims 1 to 4.
8. A computer-readable storage medium, wherein a computer program is stored on the computer-readable storage medium, and when being executed by a processor, the computer program implements the steps of the method for testing the code sending function of an infrared code sending chip according to any one of claims 1 to 4.
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| CN202210531632.5A CN114627636A (en) | 2022-05-17 | 2022-05-17 | Infrared chip code sending function test method and device, electronic equipment and storage medium |
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| CN211979138U (en) * | 2020-04-16 | 2020-11-20 | 惠州高盛达智联科技有限公司 | Remote controller key test circuit |
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- 2022-05-17 CN CN202210531632.5A patent/CN114627636A/en active Pending
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