CN114609678A - Dust deposition quality in-situ detector caused by lifting of spacecraft on lunar surface - Google Patents
Dust deposition quality in-situ detector caused by lifting of spacecraft on lunar surface Download PDFInfo
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Abstract
The utility model relates to a space detection technical field particularly, relates to a dust deposition quality normal position detector that spacecraft leads to in lunar surface lift, including measuring probe, electronics system, temperature sensor and reference probe, wherein: the measuring probe is of a uncovered box body structure, and a first monocrystalline silicon solar cell is arranged inside the measuring probe; the reference probe is of a box body structure with a dustproof cover, and a second monocrystalline silicon solar cell is arranged inside the reference probe; temperature sensors are arranged in the measuring probe and the reference probe; the electronic system is respectively in communication connection with the measuring probe, the reference probe, the temperature sensor and the ground receiver. The method has the advantages of low power consumption, high response speed, wide measurement range and high sensitivity, greatly reduces the adverse contribution of solar cell short-circuit current drift caused by non-solar direct incident light, improves the accuracy of dust deposition quality in-situ measurement when the method works in a lunar complex space environment, and can obtain a lunar dust deposition quality test result with higher reliability.
Description
Technical Field
The application relates to the technical field of space detection, in particular to a dust deposition quality in-situ detector for a spacecraft, which is caused by the lifting of the lunar surface.
Background
Lunar dust is a fine lunar soil particle widely distributed on the lunar surface, which is considered as one of the most important spatial environmental factors on the lunar surface. The lunar dust is mainly formed by meteorite impact, is transformed by periodic thermal cycle and other late-stage space weathering effects caused by micro meteorite impact, high-energy cosmic ray impact and larger day-night temperature difference, has extremely irregular structure, often presents the characteristics of sharpness or hooks, is easy to form hook connection with each other, is easy to electrically suspend under the special environment of the lunar surface, is easy to attach to the surfaces of spacecrafts and various detection loads capable of contacting, leads to a series of faults including mechanical structure blocking, sealing mechanism failure, optical system sensitivity reduction, component abrasion, thermal control system failure and the like, seriously influences the normal implementation of lunar detection tasks, in addition, the adhesion abrasion or other mechanical damage of the lunar dust to the lunar uniform can cause the sealing performance reduction and even the failure of the lunar uniform, and the prior practice shows that the lunar dust not only has great harm to the spacecrafts and the detection loads, it also has potential hazards to astronauts, such as blocking vision, blocking action, affecting physiology and physical health. The study of Apollo indicated that the lunar dust has an irritant odor of a fire drug, which is most likely generated by the activated release of volatile gases on the surface of particles of the lunar dust, and if astronauts inhale the lunar dust for a long time, various respiratory tract and internal organs can be induced to cancerate. In addition, because the lunar dust contains radioactive and high-surface-reaction-activity components, if the components enter the human body through the respiratory tract, the components can slowly react with part of human tissues, and the long-term threat to the health of astronauts can be caused. Of course, if the lunar dust remains stationary on the lunar surface without external disturbance, it is unlikely to cause any of the hazards mentioned above. In other words, suspension and migration of the lunar dust are the premise and the basis for really causing the related problems, and at present, the understanding of key basic problems such as lunar dust charging and moving mechanisms in a lunar surface complex plasma environment is not clear, so that the study on a lunar dust migration mechanism and lunar dust deposition amount caused by different mechanisms is particularly important.
In the existing research, two main detection methods of lunar surface dust include remote sensing detection and in-situ detection, wherein the remote sensing detection is mainly used for inverting the spatial distribution abundance of the dust according to the scattering of light by dust particles, and the detection method has very large dependence on the particle size of the lunar dust, for example, in 2009, when a far ultraviolet spectrometer carried on a lunar exploration orbit aircraft emitted by NASA observes the abundance of the dust in an atmospheric layer outside a moon, if the assumed particle radius is increased to 0.20 μm from 0.10 μm, the vertical column density of the dust is reduced by the whole 1 order of magnitude. Therefore, there is a great uncertainty in the results of remote sensing without knowing the particle size of the lunar surface space dust particles. The in-situ detection is a characteristic detection method for measuring lunar dust by placing a sensor on the lunar surface (lunar surface or lunar orbit) through direct action of dust and the sensor. For example, in Apollo, No. 11, 12, 14, 15, there is carried a matchbox-sized miniature lunar dust detector, originally designed as a risk management aid, primarily concerned with experimental hardware damage caused by lunar dust, radiation-induced solar cell damage and failure. In the last 90 th century, NASA researchers found that the short-circuit current of solar cells and the quality of lunar dust deposited on the surfaces of the cells are in exponential decay relationship, and an Apollo lunar dust detector designer roughly measured and calculated the annual deposition amount of lunar dust by using a model developed by others.
A lunar dust detector is also mounted on 'ChangE III' emitted in 2013 years in China, and the solar cell probe inverts the lunar dust deposition quality by measuring the change of short-circuit current caused by dust deposited on the surface of a cell. The solar cell probe mainly comprises a three-junction gallium arsenide solar cell (GaInP/GaAS/Ge) and a platinum resistance temperature sensor (Pt 100), is arranged at the top end of a Chang 'e' three-number lander, and is directly exposed to the space environment of the lunar surface to monitor the deposition quality of lunar dust which is kicked by the back-thrust rocket plume in the descending process of the Chang 'e' three-number lander. However, when the "ChangE three-size" lunar dust detector actually works on the lunar surface, it is found that because the top end of the lander is provided with a plurality of components (such as a directional antenna, a flip cover, a solar cell panel and the like) at positions higher than the solar cell probe, when the sun irradiates the components, the sunlight reflected by the surfaces of the components irradiates the position of the solar cell probe, so that the irradiance on the surface of the solar cell is stronger than the intensity of the independent irradiation of the sun, and the intensity of the part of the reflected light can change along with the change of the solar altitude angle of the "ChangE three-size" landing area, therefore, the reflection of the components of the "ChangE three-size" lander itself on the light can have a larger influence on the short-circuit current output by the solar cell, so that the inversion of the lunar dust deposition quality based on the short-circuit current has a larger error. In addition, the solar cell probe of the "ChangE' III-type" lunar dust detector is a three-junction gallium arsenide cell, each subcode cell of the solar cell probe has different responses to spectrums of different wavebands, the spectrum of the ground simulation light source is different from the actual solar spectrum of the lunar surface, and the mismatch of the two spectrums can cause the error of the measurement result.
Disclosure of Invention
Aiming at the defects of a three-junction gallium arsenide solar cell in the lunar surface in-situ detection of lunar dust deposition quality, the application mainly aims to provide the dust deposition quality in-situ detector caused by the lunar surface lifting of the spacecraft.
In order to achieve the above object, the present application provides an in-situ detector for dust deposition mass caused by the lifting of a spacecraft on the lunar surface, comprising a measurement probe, an electronics system, a temperature sensor and a reference probe, wherein: the measuring probe is of a uncovered box body structure, and a first monocrystalline silicon solar cell is arranged inside the measuring probe; the reference probe is of a box body structure with a dustproof cover, and a second monocrystalline silicon solar cell is arranged inside the reference probe; temperature sensors are arranged in the measuring probe and the reference probe; the electronic system is respectively in communication connection with the measuring probe, the reference probe, the temperature sensor and the ground receiver.
Furthermore, the surfaces of the first monocrystalline silicon solar cell and the second monocrystalline silicon solar cell are subjected to high-energy electron irradiation ageing treatment, and silicon oxide irradiation-resistant layers are arranged on the surfaces of the first monocrystalline silicon solar cell and the second monocrystalline silicon solar cell.
Further, when the first monocrystalline silicon solar cell and the second monocrystalline silicon solar cell are vertically irradiated by the AM0 solar simulation light source, the short-circuit current is 330 +/-2 mA.
Further, the temperature sensor includes a first temperature sensor and a second temperature sensor, the first temperature sensor is attached to the back surface of the first monocrystalline silicon solar cell, and the second temperature sensor is attached to the back surface of the second monocrystalline silicon solar cell.
Furthermore, the first temperature sensor and the second temperature sensor are both platinum resistance elements, and the measurement accuracy is +/-0.100 ℃.
Furthermore, the dust cover is connected with the box body of the reference probe through a driving mechanism, and the driving mechanism comprises a control unit, a driving motor and a mechanical transmission device.
Further, the electronics system comprises 3 circuit boards, including power strip, analog-to-digital conversion board and control panel, wherein: the power panel is provided with a power module; the analog-digital conversion plate is provided with a current acquisition module and a temperature acquisition module; the control panel is provided with a control module and a communication module.
Furthermore, the measuring probe monitors the change of short-circuit current before and after the first monocrystalline silicon solar cell dust is deposited and utilizes a dust shielding model to realize the measurement of the deposition amount, and the mass measurement range of the measuring probe is 1.0 multiplied by 10-4~10mg/cm2The maximum sensitivity was 98.47 mA/mg.
The dust deposition quality in-situ detector for the spacecraft, which is caused by the lifting of the spacecraft on the lunar surface, provided by the invention has the following beneficial effects:
the device has the advantages of simple structure, low power consumption, high response speed, wide measurement range and high sensitivity, a measurement probe for measuring the lunar dust deposition quality and a reference probe for monitoring the irradiation intensity of the lunar dust detector are positioned in the same lunar radiation environment, so that the irradiation intensity obtained by inverting the short-circuit current of the reference probe is equivalent to the irradiation intensity of the measurement probe, the adverse contribution of solar cell short-circuit current drift caused by non-solar direct incident light can be greatly reduced, the accuracy of dust deposition quality in-situ measurement when the device works in a lunar complex space environment is improved, a monocrystalline silicon solar cell is selected for constructing the detector, the device is far better than a three-junction gallium arsenide cell in spectral matching, and a lunar dust deposition quality test result with higher reliability can be obtained.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, are included to provide a further understanding of the application and to enable other features, objects, and advantages of the application to be more apparent. The drawings and their description illustrate the embodiments of the invention and do not limit it. In the drawings:
FIG. 1 is a schematic structural diagram of an in-situ dust deposition mass detector of a spacecraft, caused by lifting on the moon surface, according to an embodiment of the application;
FIG. 2 is a schematic diagram of an electronic system of an in-situ dust deposition mass detector for a spacecraft during lunar ascent and descent according to an embodiment of the present application;
in the figure: 1-measuring probe, 2-electronics system, 3-reference probe, 4-first monocrystalline silicon solar cell, 5-second monocrystalline silicon solar cell, 6-first temperature sensor, 7-second temperature sensor, 8-dust cap, 9-driving mechanism, 10-monthly dust and 11-incident light.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In this application, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings. These terms are used primarily to better describe the present application and its embodiments, and are not used to limit the indicated devices, elements or components to a particular orientation or to be constructed and operated in a particular orientation.
Moreover, some of the above terms may be used to indicate other meanings besides the orientation or positional relationship, for example, the term "on" may also be used to indicate some kind of attachment or connection relationship in some cases. The specific meaning of these terms in this application will be understood by those of ordinary skill in the art as appropriate.
In addition, the term "plurality" shall mean two as well as more than two.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
As shown in fig. 1, the present application provides an in-situ detector for dust deposition mass caused by the lifting of a spacecraft on the lunar surface, comprising a measuring probe 1, an electronics system 2, a temperature sensor and a reference probe 3, wherein: the measuring probe 1 is of a uncovered box body structure, and a first monocrystalline silicon solar cell 4 is arranged inside the measuring probe; the reference probe 3 is of a box body structure with a dustproof cover 8, and a second monocrystalline silicon solar cell 5 is arranged inside the reference probe; temperature sensors are arranged in the measuring probe 1 and the reference probe 3; the electronic system 2 is respectively in communication connection with the measuring probe 1, the reference probe 3, the temperature sensor and the ground receiver.
Specifically, the in-situ dust deposition mass detector for a spacecraft, which is caused by the lifting of the lunar surface, is mainly used for monitoring the mass of a large amount of dust deposition mass which is caused by the backward thrust rocket plume in the processes of landing and taking off of the spacecraft on the lunar surface, and is mainly constructed on the basis of a pair of monocrystalline silicon solar cells, wherein the measuring probe 1 is a uncovered box body, the box body is preferably a cylinder in shape, a first monocrystalline silicon solar cell 4 is arranged inside the box body, is directly exposed in the lunar surface space environment and is used for receiving lunar dust 10 generated in the lifting process of the spacecraft, the reference probe 3 is a box body with a dustproof cover 8, the box body is also preferably a cylinder in shape and is used for calibrating the solar irradiation intensity at the position of the dust deposition mass detector, the deposition mass of the lunar dust 10 is calculated by using the variation of the solar cell short-circuit current, and the short-circuit current strongly depends on the irradiation intensity at the position of the dust deposition mass detector, therefore, a clean reference probe 3 is used for monitoring the change of the solar radiation intensity at the installation position of the detector, and accurate solar radiation intensity data are provided for another measuring probe 1, so that the high-precision in-situ measurement of dust deposition quality in the lunar complex space environment is improved.
Further, the surfaces of the first single crystal silicon solar cell 4 and the second single crystal silicon solar cell 5 are both subjected to high energy electron irradiation aging treatment, andthe surfaces are all provided with silicon oxide anti-radiation layers. The first single crystal silicon solar cell 4 and the second single crystal silicon solar cell 5 are samples of the same lot having the same electrical characteristics, the size of the single crystal silicon solar cell is preferably 2cm × 4cm × 0.7mm, each cell is subjected to irradiation aging treatment with high-energy electrons of 1MeV, and the electron irradiation flux of each cell is 1015/cm2And a silicon oxide anti-radiation layer with the thickness of 0.12mm is arranged on each cell.
Further, when the first monocrystalline silicon solar cell 4 and the second monocrystalline silicon solar cell 5 are vertically irradiated by the AM0 solar simulation light source, the short-circuit current is 330 ± 2 mA. For the second monocrystalline silicon solar cell 5 of the reference probe 3, spectral irradiation is carried out by using a solar simulator AM0, and the relationship between the short-circuit current and the irradiation intensity is measured by changing the light incidence angle, which is the basis for calibrating the irradiation intensity caused by the sunlight and various reflected lights together where the dust detector is located on the lunar surface. For the first monocrystalline silicon solar cell 4 of the measuring probe 1, spectral irradiation is carried out by using a solar simulator AM0, and the drift amount of the short-circuit current of the first monocrystalline silicon solar cell 4 at different temperatures is determined by adjusting the temperature of a solar cell temperature control table, so that the temperature coefficient of the cell is obtained, which is the correction basis for the drift amount of the short-circuit current caused by the temperature in the lunar environment; by changing the light incidence angle, the change relation of the solar cell short-circuit current when the simulated lunar dust 10 with different qualities is deposited under different incidence angles of the incident light 11 is determined, which is the basis for inverting the deposition quality of the lunar dust 10 in the lunar environment through the short-circuit current.
Further, the temperature sensor includes a first temperature sensor 6 and a second temperature sensor 7, the first temperature sensor 6 is attached to the back surface of the first monocrystalline silicon solar cell 4, and the second temperature sensor 7 is attached to the back surface of the second monocrystalline silicon solar cell 5. The monocrystalline silicon solar cell short-circuit current is obviously dependent on the light irradiation intensity and is also related to the self temperature change, so the actually measured data of the temperature sensor is finally used for correcting the influence of the cell characteristic parameter short-circuit current.
Further, the first temperature sensor 6 and the second temperature sensor 7 are both platinum resistance elements, and the measurement accuracy is ± 0.100 ℃. A platinum resistance element (Pt 100) having a measurement accuracy better than ± 0.100 ℃ is preferably used as a high-accuracy temperature sensor for monitoring a change in the temperature of the cell in real time due to environmental radiation by attaching the first temperature sensor 6 to the back surface of the first monocrystalline silicon solar cell 4 and attaching the second temperature sensor 7 to the back surface of the second monocrystalline silicon solar cell 5.
Further, the dust cover 8 is connected with the box body of the reference probe 3 through a driving mechanism 9, and the driving mechanism 9 comprises a control unit, a driving motor and a mechanical transmission device. The dustproof cover 8 is formed by stamping titanium alloy (Ti 6Al 4V), is closed in the lifting process of the spacecraft, prevents the moon dust 10 blown up by the plume from depositing on the second monocrystalline silicon solar cell 5 in the reference probe 3, opens the dustproof cover 8 after the deposition of the moon dust 10 blown up by the plume is finished, allows sunlight and sunlight reflected by each part of the lander to irradiate on the second monocrystalline silicon solar cell 5, and finishes the calibration of the light irradiation intensity, the diameter of the cover body is preferably 5.5mm, the thickness is preferably 3 mm, and the cover edge is a bulge of 1.5 mm, so as to prevent the deposited dust from sliding off in the lifting process of the cover body. The driving mechanism 9 includes a control unit, a driving motor and a mechanical transmission device, the specific structure is not limited, and the driving mechanism is mainly used for driving the dust-proof cover 8 to rotate, so that the dust-proof cover 8 can be opened by a certain angle (< 45 °), and can horizontally rotate around a longitudinal axis by 180 degrees, thereby avoiding shielding incident sunlight and various reflected lights.
Further, as shown in fig. 2, the electronic system 2 is composed of 3 circuit boards, including a power board, an analog-to-digital conversion board, and a control board, wherein: the power panel is provided with a power module; the analog-digital conversion plate is provided with a current acquisition module and a temperature acquisition module; the control panel is provided with a control module and a communication module. The electronic system 2 is composed of a control circuit, a data acquisition system, a data transmission and storage system, related control software and internal and external communication interfaces, and is used for completing acquisition, processing and storage of electric signals and thermal signals output by the monocrystalline silicon solar cell and finally transmitting all data to a ground receiving station. The power supply module forms a power panel, the current acquisition module and the temperature acquisition module form an analog-digital conversion panel, and the control module and the communication module form a control panel. The power panel mainly converts a primary power supply into various required secondary power supplies, and the secondary power supplies required by the dust deposition quality in-situ detector mainly comprise an analog power supply of +/-15V and a digital power supply of +5V, +3.3V, + 1.8V; the analog-digital conversion plate is mainly used for collecting and converting a temperature signal and a short-circuit current signal of the monocrystalline silicon solar cell; the control panel mainly completes control over the temperature acquisition module and the current acquisition module.
Further, the measuring probe 1 monitors the change of short-circuit current before and after the deposition of dust in the first monocrystalline silicon solar cell 4, and utilizes a dust shielding model to realize the measurement of the deposition amount, and the mass measurement range is 1.0 multiplied by 10-4~10mg/ cm2The maximum sensitivity was 98.47 mA/mg.
Furthermore, when the solar cell is selected, firstly, a group of high-performance monocrystalline silicon solar cell pieces are selected, the size of each cell piece is 2cm multiplied by 4cm multiplied by 0.7mm, the solar simulator AM0 spectrum is used for irradiating the cell pieces under the room temperature environment, 4 key parameters of open-circuit voltage, short-circuit current, filling factor and maximum output power of each cell piece are measured, 2 cell pieces with the relative deviation of the 4 parameters being less than 2.5% are selected as a measuring probe 1 and a reference probe 3, namely a first monocrystalline silicon solar cell 4 and a second monocrystalline silicon solar cell 5, then the two cell pieces are irradiated and aged by high-energy electrons with the voltage of 1MeV, and the electron irradiation flux of each cell piece is 1015/cm2And a silicon oxide anti-radiation layer with the thickness of 0.12mm is arranged on each cell, and after the treatment, when the solar simulator AM0 is used for spectral vertical irradiation, the short-circuit current of 2 monocrystalline silicon solar cells is about 330 +/-2 mA.
More specifically, the in-situ detector for the dust deposition mass caused by the lifting of the lunar surface of the spacecraft provided by the embodiment of the application is arranged and installed on the spacecraft, in the detection process, the measuring probe 1 is always exposed in the lunar surface space environment, the lunar dust 10 and incident light 11 excited by a plume in the lifting process of the spacecraft can be received at any time, and the total mass of the deposition lunar dust 10 caused by the lifting of the spacecraft can be finally obtained according to the ground calibration relation. The reference probe 3 is in a closed state in the lifting process of the spacecraft, deposition pollution of the lunar dust 10 is prevented, after the lunar dust 10 deposition caused in the lifting process of the spacecraft is exhausted, the dust cover 8 is opened, the irradiation intensity generated by superposition of various light rays at the position of the lunar dust 10 detector is calibrated, and a guarantee is provided for inversion of the deposition quality of the measurement probe 1.
The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (8)
1. An in-situ detector for dust deposition mass caused by the lifting of a spacecraft on the lunar surface, which is characterized by comprising a measuring probe, an electronics system, a temperature sensor and a reference probe, wherein:
the measuring probe is of a uncovered box body structure, and a first monocrystalline silicon solar cell is arranged inside the measuring probe;
the reference probe is of a box body structure with a dustproof cover, and a second monocrystalline silicon solar cell is arranged inside the reference probe;
the temperature sensors are arranged in the measuring probe and the reference probe;
and the electronic system is in communication connection with the measuring probe, the reference probe, the temperature sensor and the ground receiver respectively.
2. The in-situ dust deposition quality detector caused by the lifting of the spacecraft on the lunar surface according to claim 1, wherein the surfaces of the first monocrystalline silicon solar cell and the second monocrystalline silicon solar cell are subjected to high-energy electron irradiation aging treatment, and are provided with silicon oxide anti-irradiation layers.
3. The in-situ dust deposition mass detector caused by the lunar ascent and descent of the spacecraft of claim 2, wherein the short circuit current of the first and second monocrystalline silicon solar cells is 330 ± 2mA when vertically illuminated by an AM0 solar analog light source.
4. The in-situ dust deposition mass detector of claim 1, wherein the temperature sensor comprises a first temperature sensor and a second temperature sensor, the first temperature sensor being attached to a back surface of the first monocrystalline silicon solar cell, and the second temperature sensor being attached to a back surface of the second monocrystalline silicon solar cell.
5. The in-situ dust deposition mass detector for spacecraft induced lunar lifting according to claim 4, wherein said first temperature sensor and said second temperature sensor are both platinum resistance elements with a measurement accuracy of ± 0.100 ℃.
6. The in-situ detector for the dust deposition quality caused by the lunar lifting of the spacecraft according to claim 1, wherein the dust cap is connected with the box body of the reference probe through a driving mechanism, and the driving mechanism comprises a control unit, a driving motor and a mechanical transmission device.
7. The in-situ dust deposition mass detector caused by the ascent and descent of a spacecraft on the moon surface according to claim 1, characterized in that said electronics system is constituted by 3 circuit boards, including a power supply board, an analog-to-digital conversion board and a control board, wherein:
the power panel is provided with a power module;
the analog-digital conversion plate is provided with a current acquisition module and a temperature acquisition module;
and the control panel is provided with a control module and a communication module.
8. The in-situ detector for detecting the deposition quality of dust caused by the lunar ascent and descent of a spacecraft according to claim 1, wherein the measuring probe monitors the change of short-circuit current before and after the deposition of the dust of the first monocrystalline silicon solar cell and is used for detecting the change of the short-circuit current before and after the deposition of the dust of the first monocrystalline silicon solar cellThe dust shielding model is used for measuring the deposition amount, and the mass measurement range is 1.0 multiplied by 10-4~10mg/ cm2The maximum sensitivity was 98.47 mA/mg.
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