CN114609444A - Method, device, system, equipment and medium for testing support insulator - Google Patents
Method, device, system, equipment and medium for testing support insulator Download PDFInfo
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Abstract
The embodiment of the invention discloses a method, a device, a system, equipment and a medium for testing a supporting insulator. The method comprises the following steps: acquiring a real-time current value, a real-time voltage value and a transfer function of a support insulator model; adjusting the transfer function of the support insulator model to be an initial function of the support insulator model; determining a test parameter of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model; and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters. This scheme has realized accurate insulation resistance and the capacitance value who records supporting insulator.
Description
Technical Field
The embodiment of the invention relates to a transformer station technology, in particular to a method, a device, a system, equipment and a medium for testing a supporting insulator.
Background
For a transformer substation with the voltage level of 110KV and above, a main transformer (10kV or 35kV) side is connected to a switch cabinet body through a bus bridge with a long distance, and when a pre-test and scheduled inspection or a cross-over acceptance insulation related test is carried out on a supporting insulator connected with the bus bridge, due to the existence of a ground capacitance effect, the actually-measured insulation resistance value is lower, and even an evaluation result of the insulation level of the actually-measured insulation resistance value causes misjudgment. The method has important significance for accurately measuring the insulation resistance and the ground capacitance of a plurality of groups of supporting insulators with stronger capacitance effect, particularly for supporting insulators with longer bus bridges, and for evaluating the state of insulator equipment and the safe operation of subsequent equipment.
In the prior art, because the bus bridge is generally longer and components such as disconnecting links and the like are arranged on two sides, accurate calculation of capacitance to ground of the bus bridge is difficult to carry out by an analytic method, and meanwhile, a capacitance and inductance tester or a dielectric loss tester is mainly adopted for obtaining capacitance values at present and is obtained by measuring by adopting an impedance method or a penicillin bridge method, but the precision is limited, the capacitance value to ground of the bus is smaller, and a conventional testing instrument cannot meet the requirement of measuring precision; at present, for insulation resistance, a manual or electric megger tester is generally adopted to detect in engineering, the principle is that a direct current is output by an uncontrolled rectifying circuit and is applied to a tested supporting insulator, and applied voltage/passing current is calculated to obtain the insulation resistance; in addition, since RC is generally large, the transient process is long, the data is difficult to stabilize, and the measured value is low. In addition, due to the existence of one or more supporting insulators and different pollution degrees of the surfaces of the insulators, the test of the insulation resistance of the insulators is also influenced.
Disclosure of Invention
The invention provides a method, a device, a system, equipment and a medium for testing a supporting insulator, which are used for accurately obtaining the insulation resistance value and the capacitance value of the supporting insulator.
In a first aspect, an embodiment of the present invention provides a method for testing a supporting insulator, where the method includes:
acquiring a real-time current value, a real-time voltage value and a transfer function of a support insulator model;
adjusting the transfer function of the support insulator model to be an initial function of the support insulator model;
determining a test parameter of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model;
and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
Optionally, the method further includes:
optimizing the test parameters based on a least square method to obtain optimal test parameters;
determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters, comprising:
and determining the capacitance value and the insulation resistance value of the supporting insulator according to the optimal test parameters.
Optionally, the transfer function of the support insulator model is as follows:
wherein, I(s) is a real-time current value, U(s) is a real-time voltage value, R is an insulation resistance value of the supporting insulator, s is a continuous measuring point parameter, and C is a capacitance value of the supporting insulator.
Optionally, adjusting the transfer function of the support insulator model to be an initial function of the support insulator model includes:
carrying out bilinear transformation on the continuous measuring point parameters in the transfer function of the supporting insulator model to obtain discrete measuring point parameters;
and determining the initial function of the support insulator model according to the discrete measuring point parameters and the transfer function of the support insulator model.
Optionally, bilinear transformation is performed on the continuous measurement point parameters in the transfer function of the support insulator model to obtain discrete measurement point parameters, which specifically includes:
wherein s is the continuous measuring point parameter; z is the discrete measurement point parameter; t is a sampling period;
determining an initial function of the support insulator model according to the discrete measuring point parameters and the support insulator model transfer function, specifically:
substituting the discrete measuring point parameters into the transfer function of the support insulator model to obtain an initial function of the support insulator model; wherein the support insulator model initial function is:
wherein I (z) is the real-time current value of z time domain space; u (z) is the real-time voltage value of the z time domain space.
Optionally, determining a test parameter of the initial function of the support insulator model according to the current value, the voltage value, and the initial function of the support insulator model, specifically:
wherein, I (z) is the current value actually output by the z discrete measuring point; i (z-1) is a current value actually output by the z-1 discrete measuring point; u (z) is the voltage value actually output by the z discrete measuring points; u (z-1) is the voltage value actually output by the z-1 discrete measuring point,
and
and testing parameters of the initial function of the support insulator model.
Optionally, based on a least square method, the test parameters are optimized to obtain optimal test parameters, which specifically include:
wherein I' (z) is the actual current output value; i (z) is a predicted current value;
and
and the optimal test parameters are obtained.
In a second aspect, an embodiment of the present invention further provides a testing apparatus for a supporting insulator, where the testing apparatus includes:
the acquisition module is used for acquiring a real-time current value, a real-time voltage and a transfer function of a support insulator model;
the adjusting module is used for adjusting the transfer function of the support insulator model into an initial function of the support insulator model;
the test parameter determining module is used for determining test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model;
and the capacitance and insulation resistance determining module is used for determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
In a third aspect, the present invention further provides a test system for a supporting insulator, where the test system includes a control box, a voltage regulating transformer, a current transformer, and a voltage transformer, which are used for executing the test method for the supporting insulator according to the first aspect;
the input end of the control box is connected with an input source, the output end of the control box is electrically connected with the input end of the regulating transformer, the output end of the regulating transformer is electrically connected with a supporting insulator to be tested, and the current transformer is connected in series between the supporting insulator to be tested and the output end of the regulating transformer; the voltage transformer is connected in parallel with the output end of the regulating transformer;
the current transformer is in communication connection with the control box and is used for outputting a current value to the control box in real time; the voltage transformer is in communication connection with the control box and is used for outputting a voltage value to the control box in real time;
and the voltage regulating transformer is used for transforming the voltage output by the input source so as to provide the supporting insulator.
In a fourth aspect, an embodiment of the present invention further provides a computer device, including a memory, a processor, and a computer program stored on the memory and executable on the processor, where the processor executes the computer program to implement the method for detecting a supporting insulator according to the first aspect.
In a fifth aspect, an embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the method for detecting a support insulator according to any one of the first aspect.
According to the embodiment of the invention, a real-time current value, a real-time voltage value and a transfer function of a support insulator model are obtained; adjusting the transfer function of the support insulator model to be an initial function of the support insulator model; determining a test parameter of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model; and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters. Thus, the insulation resistance value and the capacitance value of the supporting insulator can be accurately measured.
Drawings
Fig. 1 is a flowchart of a method for testing a support insulator according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of an integrated tester for supporting insulators according to an embodiment of the present invention;
fig. 3 is a flow chart of another testing method for a support insulator according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a testing apparatus for a supporting insulator according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a computer device according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some structures related to the present invention are shown in the drawings, not all of them.
Fig. 1 is a flowchart of a method for testing a supporting insulator according to an embodiment of the present invention, where the method is applicable to detecting capacitance and insulation resistance of the supporting insulator, and the method can be executed by a testing apparatus for a supporting insulator, and specifically includes the following steps:
and S110, acquiring a real-time current value, a real-time voltage value and a transfer function of the support insulator model.
Fig. 2 is a schematic structural diagram of an integrated tester for supporting insulators according to an embodiment of the present invention; as shown in fig. 2, the comprehensive tester includes a control box 10, a regulating transformer 20, a current transformer 30 and a voltage transformer 40; the input end of the control box 10 is connected with an input source, the output end of the control box 10 is electrically connected with the input end of the regulating transformer 20, the output end of the regulating transformer 20 is electrically connected with the supporting insulator to be tested, and the current transformer 30 is connected in series between the supporting insulator to be tested and the output end of the regulating transformer 20; the voltage transformer 40 is connected in parallel with the output end of the regulating transformer 20; and a voltage regulating transformer 20 for transforming the voltage outputted from the input source to provide a support insulator. The current transformer 30 is in communication connection with the control box 10 and is used for outputting a current value to the control box 10 in real time; the voltage transformer 40 is in communication connection with the control box 10 and is used for outputting a voltage value to the control box 10 in real time; the control box 10 obtains a real-time current value and a real-time voltage value; obtaining a transfer function of the established support insulator model; wherein, the transfer function of the support insulator model is as follows:
in the formula (1), i(s) is a real-time current value, u(s) is a real-time voltage value, R is an insulation resistance value of the supporting insulator, s is a continuous measurement point parameter, and C is a capacitance value of the supporting insulator.
And S120, adjusting the transfer function of the support insulator model to be an initial function of the support insulator model.
Firstly, carrying out bilinear transformation on a continuous measuring point parameter s in a transfer function of a support insulator model to obtain a discrete measuring point parameter z, wherein the discrete measuring point parameter z is as follows (2):
wherein s is a continuous measuring point parameter; z is a discrete measurement point parameter; r is a sampling period;
then, determining an initial function of a support insulator model according to the discrete measuring point parameters and the transfer function of the support insulator model, namely substituting the discrete measuring point parameters (2) into the transfer function (1) of the support insulator model to obtain the initial function of the support insulator model, wherein the function is as follows:
wherein I (z) is the real-time current value of z time domain space; u (z) is the real-time voltage value of the z time domain space.
And S130, determining test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model.
The method comprises the following steps of determining test parameters of an initial function of a support insulator model according to a current value, a voltage value and the initial function of the support insulator model, and specifically comprises the following steps:
wherein, I (z) is the current value actually output by the z discrete measuring point; i (z-1) is a current value actually output by the z-1 discrete measuring point; u (z) is the voltage value actually output by the z discrete measuring point; u (z-1) is the voltage value actually output by the z-1 discrete measuring point,
and
the test parameters are the initial functions of the support insulator model. Therefore, the test parameters of the initial function of the support insulator model can be determined according to the input current value actually output by the z discrete measuring point, the current value actually output by the z-1 discrete measuring point, the voltage value actually output by the z discrete measuring point and the voltage value actually output by the z-1 discrete measuring point
And
and S140, determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
Wherein, to simplify the calculation, the test parameters are ordered
Test parameters
The capacitance value of the supporting insulator
The insulation resistance value of the supporting insulator is
According to the scheme, a real-time current value, a real-time voltage value and a transfer function of a support insulator model are obtained; adjusting a transfer function of a support insulator model to be an initial function of the support insulator model; determining test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model; and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters, thereby realizing the accurate measurement of the insulation resistance value and the capacitance value of the supporting insulator. Meanwhile, the proposal also improves the identification precision of the capacitance to ground by improving the sampling frequency T.
Optionally, on the basis of the foregoing embodiment, further optimization is performed, and fig. 3 is a flowchart of another testing method for a support insulator according to an embodiment of the present invention, as shown in fig. 3, the testing method includes the following steps:
s210, acquiring a real-time current value, a real-time voltage value and a support insulator model transfer function.
And S220, adjusting the transfer function of the support insulator model to be an initial function of the support insulator model.
And S230, determining test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model.
And S240, optimizing the test parameters based on a least square method to obtain the optimal test parameters.
In particular, for the test parameters
And
to explain the optimization, the initial function of the support insulator model is first transformed into a least-squares equation:
wherein,
then, a minimization criteria function is established as follows:
namely, it is
Wherein I' (z) is the actual current output value; i (z) is a predicted current value;
and
for optimum test parameters, i.e. so that
Minimum test parameters.
And S250, determining the capacitance value and the insulation resistance value of the supporting insulator according to the optimal test parameters.
Wherein, to simplify the calculation, the test parameters are optimized
Test parameters
The capacitance value of the support insulator
The insulation resistance value of the supporting insulator is
Thus, the insulation resistance value and the capacitance value of the supporting insulator can be obtained more accurately.
The embodiment of the invention also provides a testing device for the supporting insulator, and the testing device for the supporting insulator provided by the embodiment of the invention can execute the testing method for the supporting insulator provided by any embodiment of the invention, and has corresponding functional modules and beneficial effects of the execution method. Fig. 4 is a schematic structural diagram of a testing apparatus for a supporting insulator according to an embodiment of the present invention, and as shown in fig. 4, the testing apparatus includes:
the acquisition module 01 is used for acquiring a real-time current value, a real-time voltage and a transfer function of a support insulator model;
the adjusting module 02 is used for adjusting a transfer function of the support insulator model into an initial function of the support insulator model;
the test parameter determining module 03 is used for determining test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model;
and the capacitance and insulation resistance determining module 04 is used for determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
The embodiment of the invention also provides a test system of the supporting insulator, referring to fig. 2, the test system comprises a control box 10, a regulating transformer 20, a current transformer 30 and a voltage transformer 40, which are used for executing the test method of the supporting insulator described in the embodiment; a voltage-regulating transformer 20 for transforming the voltage outputted from the input source to provide a support insulator; the current transformer 30 is in communication connection with the control box 10 and is used for outputting a current value to the control box 10 in real time; the voltage transformer 40 is in communication connection with the control box 10 and is used for outputting a voltage value to the control box 10 in real time; the control box 10 is used for acquiring a real-time current value, a real-time voltage value and a transfer function of a support insulator model; adjusting a transfer function of a support insulator model to be an initial function of the support insulator model; determining a test parameter of an initial function of a support insulator model according to the current value, the voltage value and the initial function of the support insulator model; and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
Fig. 5 is a schematic structural diagram of a computer device according to an embodiment of the present invention, and as shown in fig. 5, the computer device includes a processor 70, a memory 71, an input device 72, and an output device 73; the number of processors 70 in the device may be one or more, and one processor 70 is taken as an example in fig. 5; the processor 70, the memory 71, the input device 72 and the output device 73 of the apparatus may be connected by a bus or other means, as exemplified by the bus connection in fig. 5.
The memory 71 is a computer-readable storage medium, and can be used for storing software programs, computer-executable programs, and modules, such as program instructions/modules corresponding to the testing method of the supporting insulator in the embodiment of the present invention. The processor 70 executes various functional applications and data processing of the device by running software programs, instructions and modules stored in the memory 71, so as to implement the above-mentioned testing method for the supporting insulator.
The memory 71 may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the terminal, and the like. Further, the memory 71 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some examples, the memory 71 may further include memory located remotely from the processor 70, which may be connected to the device over a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The input device 72 may be used to receive entered numeric or character information and to generate key signal inputs relating to user settings and function controls of the apparatus. The output device 73 may include a display device such as a display screen.
Embodiments of the present invention also provide a storage medium containing computer-executable instructions, which when executed by a computer processor, are configured to perform a method for testing a support insulator, the method including:
acquiring a real-time current value, a real-time voltage value and a transfer function of a support insulator model;
adjusting the transfer function of the support insulator model to be an initial function of the support insulator model;
determining a test parameter of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model;
and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
Of course, the storage medium containing the computer-executable instructions provided by the embodiments of the present invention is not limited to the method operations described above, and may also perform related operations in the method for testing a support insulator provided by any embodiment of the present invention.
From the above description of the embodiments, it is obvious for those skilled in the art that the present invention can be implemented by software and necessary general hardware, and certainly, can also be implemented by hardware, but the former is a better embodiment in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which can be stored in a computer-readable storage medium, such as a floppy disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a FLASH Memory (FLASH), a hard disk or an optical disk of a computer, and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device) to execute the methods according to the embodiments of the present invention.
It should be noted that, in the embodiment of the above search apparatus, each included unit and module are merely divided according to functional logic, but are not limited to the above division as long as the corresponding functions can be implemented; in addition, specific names of the functional units are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present invention.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (11)
1. A method for testing a support insulator is characterized by comprising the following steps:
obtaining a real-time current value, a real-time voltage value and a transfer function of a support insulator model;
adjusting the transfer function of the support insulator model to be an initial function of the support insulator model;
determining a test parameter of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model;
and determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
2. The method for testing a support insulator according to claim 1, further comprising:
optimizing the test parameters based on a least square method to obtain optimal test parameters;
determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters, comprising:
and determining the capacitance value and the insulation resistance value of the supporting insulator according to the optimal test parameters.
3. The method for testing a support insulator according to claim 1, characterized in that the support insulator model transfer function is:
wherein, I(s) is a real-time current value, U(s) is a real-time voltage value, R is an insulation resistance value of the supporting insulator, s is a continuous measuring point parameter, and C is a capacitance value of the supporting insulator.
4. The method of testing a support insulator of claim 3, wherein adjusting the support insulator model transfer function to a support insulator model initial function comprises:
carrying out bilinear transformation on the continuous measuring point parameters in the transfer function of the supporting insulator model to obtain discrete measuring point parameters;
and determining the initial function of the support insulator model according to the discrete measuring point parameters and the transfer function of the support insulator model.
5. The method for testing the supporting insulator according to claim 4, wherein the parameters of the continuous measuring points in the transfer function of the supporting insulator model are subjected to bilinear transformation to obtain parameters of discrete measuring points, and specifically the method comprises the following steps:
wherein s is the continuous measuring point parameter; z is the discrete measurement point parameter; t is a sampling period;
determining an initial function of the support insulator model according to the discrete measuring point parameters and the support insulator model transfer function, specifically:
substituting the discrete measuring point parameters into the transfer function of the support insulator model to obtain an initial function of the support insulator model; wherein the initial function of the support insulator model is as follows:
wherein I (z) is the real-time current value of z time domain space; u (z) is the real-time voltage value of the z time domain space.
6. The method according to claim 5, wherein the determining of the test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model comprises:
wherein, I (z) is the current value actually output by the z discrete measuring point; i (z-1) is a current value actually output by the z-1 discrete measuring point; u (z) is the voltage value actually output by the z discrete measuring point; u (z-1) is the voltage value actually output by the z-1 discrete measuring point,
and
and testing parameters of the initial function of the support insulator model.
7. The method for testing a supporting insulator according to claim 6, wherein the test parameters are optimized to obtain optimal test parameters based on a least square method, specifically:
wherein I' (z) is the actual current output value; i (z) is a predicted current value;
and
and the optimal test parameters are obtained.
8. A testing device for a support insulator, comprising:
the acquisition module is used for acquiring a real-time current value, a real-time voltage and a transfer function of a support insulator model;
the adjusting module is used for adjusting the transfer function of the support insulator model into an initial function of the support insulator model;
the test parameter determining module is used for determining test parameters of the initial function of the support insulator model according to the current value, the voltage value and the initial function of the support insulator model;
and the capacitance and insulation resistance determining module is used for determining the capacitance value and the insulation resistance value of the supporting insulator according to the test parameters.
9. A test system for supporting insulators, characterised in that it comprises a control box, a regulating transformer, a current transformer and a voltage transformer for implementing the test method for supporting insulators according to any one of claims 1 to 7;
the input end of the control box is connected with an input source, the output end of the control box is electrically connected with the input end of the regulating transformer, the output end of the regulating transformer is electrically connected with a supporting insulator to be tested, and the current transformer is connected in series between the supporting insulator to be tested and the output end of the regulating transformer; the voltage transformer is connected in parallel with the output end of the regulating transformer;
the current transformer is in communication connection with the control box and is used for outputting a current value to the control box in real time; the voltage transformer is in communication connection with the control box and is used for outputting a voltage value to the control box in real time;
and the voltage regulating transformer is used for transforming the voltage output by the input source so as to provide the supporting insulator.
10. A computer arrangement comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor, when executing the program, carries out the method of detection of a supporting insulator according to any one of claims 1-7.
11. A computer-readable storage medium, on which a computer program is stored, characterized in that the program, when being executed by a processor, carries out a method for detection of a support insulator according to any one of claims 1-7.
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| CN202210279280.9A CN114609444A (en) | 2022-03-21 | 2022-03-21 | Method, device, system, equipment and medium for testing support insulator |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116148536A (en) * | 2023-03-28 | 2023-05-23 | 湖南大学 | Electric automobile insulation resistance value detection method based on unbalanced bridge method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116148536A (en) * | 2023-03-28 | 2023-05-23 | 湖南大学 | Electric automobile insulation resistance value detection method based on unbalanced bridge method |
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