CN114577235A - Cross-scale calibration method and system for space extremely-high-precision pointing measuring instrument - Google Patents
Cross-scale calibration method and system for space extremely-high-precision pointing measuring instrument Download PDFInfo
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- 238000005070 sampling Methods 0.000 description 9
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- 238000003384 imaging method Methods 0.000 description 8
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- 230000004927 fusion Effects 0.000 description 1
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Abstract
The invention discloses a cross-scale calibration method and a system for a space extremely-high-precision pointing measuring instrument, wherein the method comprises the following steps: acquiring photoelectric test parameters; according to the photoelectric test parameters, carrying out pixel-level calibration on an image detector of the spatial direction measuring instrument; according to the pixel-level calibration result, performing field-level calibration on the spatial direction measuring instrument; and according to the result of the field-of-view level calibration, performing track level calibration on the spatial direction measuring instrument. The invention realizes the cross-scale and fine calibration of pixel level, field level and track level, and can meet the requirement of extremely high precision pointing measurement of a space pointing measuring instrument.
Description
Technical Field
The invention belongs to the technical field of space extremely-high-precision pointing measurement, and particularly relates to a cross-scale calibration method and a system of a space extremely-high-precision pointing measurement instrument.
Background
The calibration method is a key technology for realizing the extremely high-precision pointing measurement of the spatial pointing measurement instrument, and the ground calibration and the on-orbit calibration can directly influence the attitude measurement result and the attitude measurement precision. Along with the improvement of the measurement precision requirement of the space directional measuring instrument, the precision of the existing calibration method can not meet the requirement, and the space high-precision directional measuring instrument needs to be subjected to refined cross-scale calibration, and a detector high-frequency error, a field-of-view space low-frequency error and a track-level low-frequency error are calibrated and calibrated, so that the high-precision directional measurement of the space directional measuring instrument is realized.
In the imaging and attitude resolving process of the space direction measuring instrument, due to the manufacturing process of the detector, high-frequency error terms such as inconsistent response among pixels, pixel position deviation and the like have influence on an imaging result, so that the precision of a method for extracting the center of a fixed star target through an image is influenced; on the other hand, due to the distortion of the optical system, the imaging appearance of the star point at different positions in the field of view is distorted, so that the centering accuracy at different positions in the field of view is different, and the imaging position deviation caused at the same time can reduce the calibration accuracy, thereby influencing the pointing measurement accuracy.
Disclosure of Invention
The technical problem of the invention is solved: the method and the system aim to realize cross-scale and refined calibration of a pixel level, a field of view level and a track level so as to meet the requirement of extremely high-precision pointing measurement of the space pointing measuring instrument.
In order to solve the technical problem, the invention discloses a cross-scale calibration method of a spatial direction measuring instrument, which comprises the following steps:
acquiring photoelectric test parameters;
according to the photoelectric test parameters, carrying out pixel-level calibration on an image detector of the spatial direction measuring instrument;
according to the pixel-level calibration result, performing field-level calibration on the spatial direction measuring instrument;
and according to the result of the field-of-view level calibration, performing track level calibration on the spatial direction measuring instrument.
In the above cross-scale calibration method for a spatial direction measuring instrument, acquiring a photoelectric test parameter includes: and carrying out photoelectric test on an image detector of the spatial direction measuring instrument through the integrating sphere equipment to obtain photoelectric test parameters.
In the above cross-scale calibration method for a spatial direction measuring instrument, the pixel-level calibration of an image detector of the spatial direction measuring instrument according to the photoelectric test parameters includes:
correcting the response inconsistency effect of the image detector according to the photoelectric test parameters to obtain dark field data bkg and a response inconsistency result prnu;
constructing an image detector pixel position deviation measuring device based on high-precision heterodyne interference based on a high-precision heterodyne interference method;
according to the image detector pixel position deviation measuring device, pixel-level calibration is carried out on the pixel position deviation of the image detector of the spatial direction measuring instrument by combining dark field data bkg and a response inconsistency result prnu.
In the above cross-scale calibration method for a spatial direction measuring instrument, the device for measuring the pixel position deviation of the image detector comprises: the device comprises a frequency stabilized laser, an optical isolator, an optical fiber coupler, a single-mode polarization maintaining optical fiber, an optical fiber beam splitter, an electro-optical modulator, a signal generator, an optical switch, a cabin-passing optical fiber, an optical fiber fixing pressing block, an image detector, an optical platform, a vacuum tank A, a control and data processing computer and a glass box;
the frequency stabilized laser, the optical isolator and the optical fiber coupler are arranged in sequence and are arranged in the glass box; the optical fiber coupler is respectively connected with the electro-optical modulator and the optical switch through a single-mode polarization-maintaining optical fiber and an optical fiber beam splitter; the optical switch is connected with the optical fiber fixing pressing block through the cabin-penetrating optical fiber; the optical fiber fixing pressing block and the image detector are fixed on the optical platform and are arranged in the vacuum tank A; the electro-optical modulator is connected with the signal generator; the control and data processing computer is respectively connected with the signal generator and the image detector.
In the cross-scale calibration method of the spatial direction measuring instrument, the light path propagation path in the image detector pixel position deviation measuring device is as follows:
the single-frequency stabilized laser emitted by the frequency stabilized laser is divided into two beams after passing through an optical isolator, an optical fiber coupler, a single-mode polarization maintaining optical fiber and an optical fiber beam splitter, the light beam directly enters an optical switch, and the light beam II enters an electro-optical modulator; the signal generator sends corresponding driving signals to the electro-optical modulator after receiving the periodic signals sent by the control and data processing computer, and phase modulation is carried out on the light beam II entering the electro-optical modulator, so that the light beam II generates phase change along with time change
Outputting the phase-modulated light beam II to an optical switch; and any two channels in the gating optical switch, the first light beam and the second light beam after phase modulation are respectively output to corresponding optical fibers in the optical fiber fixed pressing block through the first channel and the second channel and cabin-passing optical fibers, and finally the emergent light beam forms heterodyne interference fringes on the surface of the image detector.
In the above cross-scale calibration method for the spatial direction measuring instrument, the pixel position deviation of the image detector of the spatial direction measuring instrument is calibrated at a pixel level according to the image detector pixel position deviation measuring device by combining the dark field data bgg and the inconsistent response result prnu, and the method includes:
step a1, vacuumizing the vacuum tank A to 10-3Pa；
Step a2, operating a frequency stabilized laser, dividing the emitted single-frequency stabilized laser into two beams after passing through an optical isolator, a single-mode polarization maintaining optical fiber of an optical fiber coupler and an optical fiber beam splitter, wherein the light beam directly enters an optical switch, and the light beam II enters an electro-optical modulator;
a3, sending periodic signal to signal generator by data processing computer, sending drive signal V to electro-optical modulator after receiving periodic signal by signal generator, phase modulating light beam II entering electro-optical modulator, and outputting phase modulated light beam II to optical switch; wherein the phase difference between the first light beam and the second phase-modulated light beam is
Step a4, two channels in the gating optical switch, the first light beam and the second light beam after phase modulation are respectively output to corresponding optical fibers in the optical fiber fixing pressing block through the first channel and the second channel and the cabin-penetrating optical fiber, and finally the emergent light beam forms heterodyne interference fringes M on the surface of the image detector1；
Step a5, according to dark field data bkg and response inconsistency result prnu, heterodyne interference fringe M1Corrected to obtain corrected heterodyne interference fringes M'1；
Step a6, repeating steps a 4-a 5, gating two different channels in the optical switch, generating a plurality of heterodyne interference fringes M1Heterodyne interference fringe M with different spatial frequencies and same fringe directioniAnd the external difference interference fringe MiCorrecting to obtain a plurality of corrected heterodyne interference fringes M'i(ii) a According to the corrected heterodyne interference fringe M'1And a plurality of corrected heterodyne interference fringes M'iAnd calculating to obtain the pixel position deviation delta P in the vertical direction of the image detector1(p,q)；
Step a7, repeating steps a 4-a 5, gating two different channels in the optical switch, generating a plurality of heterodyne interference fringes M1Heterodyne interference fringe M with same spatial frequency and vertical fringe directionjAnd the external difference interference fringe MjCorrecting to obtain a plurality of corrected heterodyne interference fringes M'j(ii) a According to the corrected heterodyne interference fringe M'jAnd calculating to obtain the pixel position deviation delta P in the horizontal direction of the image detector2(p,q)。
In the above cross-scale calibration method for a spatial direction measuring instrument, the field-of-view calibration of the spatial direction measuring instrument according to the result of the pixel-level calibration includes:
constructing a cross-scale calibration device of a space extremely-high-precision pointing measuring instrument;
according to the cross-scale calibration device of the spatial extremely high-precision pointing measurement instrument, the field-of-view calibration is carried out on the low-frequency error of the spatial optical pointing measurement instrument on the basis of a neighborhood average calibration method by combining the calibration result of the pixel-level calibration.
In the above cross-scale calibration method for a spatial direction measuring instrument, the cross-scale calibration device for a spatial extremely high precision direction measuring instrument includes: the device comprises a vacuum tank B, a vibration isolation platform, a single-star simulator, a two-dimensional turntable, a space direction measuring instrument, a laser interference goniometer, two-dimensional turntable control equipment and a control computer;
the single-star simulator, the two-dimensional turntable and the laser interference goniometer are sequentially arranged on the vibration isolation platform; the space direction measuring instrument is arranged on the two-dimensional turntable and is positioned between the two-dimensional turntable and the single-star simulator; the two-dimensional rotary table control equipment is connected with the two-dimensional rotary table; the control computer is respectively connected with the space direction measuring instrument, the laser interference goniometer and the two-dimensional turntable control device; the vibration isolation platform, the single-star simulator, the two-dimensional turntable, the spatial direction measuring instrument and the laser interference goniometer are arranged in the vacuum tank B.
In the above cross-scale calibration method for a spatial directional measuring instrument, the field-of-view calibration is performed on the low-frequency error of the spatial optical directional measuring instrument based on the neighborhood average calibration method according to the cross-scale calibration device for the spatial extremely high-precision directional measuring instrument and by combining the calibration result of the pixel-level calibration, and the method includes:
step (ii) ofb1, controlling the two-dimensional rotary table to rotate to a planned position according to a neighborhood average calibration method, acquiring a star point diagram S through a space pointing measuring instrument, measuring the angle of the two-dimensional rotary table through a laser interference goniometer, and obtaining the angle (alpha) of the rotary tableτ,βτ) (ii) a Wherein alpha isτAnd betaτRespectively representing a pitch angle and a yaw angle of the two-dimensional rotary table;
step b2, correcting the collected star point image S to obtain a corrected star point image S';
step b3, combining the delta P according to the corrected star point graph S1(P, q) and Δ P2(p, q), determining a matrix U;
step b4, according to (alpha)τ,βτ) And an installation matrix F between the two-dimensional rotary table and the star sensor, and determining a matrix G;
step b5, determining a resolving equation of the calibration coefficient K:
K＝GUTinv(UUT)
and b6, solving the resolving equation of the calibration coefficient K determined in the step b5 by adopting a least square method according to the measurement and calculation results in the steps b 1-b 4 to obtain the value of the calibration coefficient K, and completing the field-of-view level calibration of the low-frequency error of the spatial optical pointing measuring instrument.
In the above cross-scale calibration method for a spatial direction measuring instrument, performing track-level calibration on the spatial direction measuring instrument according to a field-of-view-level calibration result, the method includes: and according to the calibration result of the field-of-view level calibration, performing track level calibration on the low-frequency error of the spatial optical pointing measuring instrument based on the influence of the emission process and the on-orbit environment to obtain a cross-scale calibration result and output the cross-scale calibration result.
Correspondingly, the invention also discloses a cross-scale calibration system of the spatial direction measuring instrument, which comprises the following components:
the acquisition module is used for acquiring photoelectric test parameters;
the pixel-level calibration module is used for carrying out pixel-level calibration on an image detector of the spatial direction measuring instrument according to the photoelectric test parameters;
the visual field level calibration module is used for carrying out visual field level calibration on the spatial direction measuring instrument according to the pixel level calibration result;
and the track-level calibration module is used for performing track-level calibration on the spatial direction measuring instrument according to the result of the field-level calibration.
The invention has the following advantages:
the invention discloses a cross-scale calibration method and a cross-scale calibration system for a space extremely-high-precision pointing measuring instrument, which are improved on the basis of the existing method, and provide a pixel-field-level-orbit-level calibration system, so that the extremely-high-precision pixel position deviation calibration precision can be realized through pixel-level calibration, and the calibration precision superior to 1/1000 pixels is achieved; the field-of-view calibration is improved on the basis of the existing grid calibration, and is easy to implement; the rail-level calibration is based on the original on-rail calibration method, the high-precision calibration result of the ground is taken as the basis, and the on-rail application is taken as the purpose.
Drawings
FIG. 1 is a flowchart illustrating steps of a cross-scale calibration method for a spatial directional measuring instrument according to an embodiment of the present invention;
FIG. 2 is a schematic diagram illustrating a distribution of calibration grid points in a field-of-view calibration according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of the distribution locations of neighborhood sample points of each calibration grid point shown in FIG. 2;
FIG. 4 is a block diagram of an apparatus for measuring pixel position deviation of an image sensor according to an embodiment of the present invention;
FIG. 5 is a block diagram of a cross-scale calibration apparatus for a spatial ultra-high precision pointing measurement instrument according to an embodiment of the present invention;
FIG. 6 is a block diagram of a cross-scale calibration system of a spatial directional measuring instrument according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the embodiments of the present invention will be described in detail with reference to the accompanying drawings.
Example 1
As shown in fig. 1, in this embodiment, the method for calibrating a spatial direction measuring instrument across scales includes:
In this embodiment, any suitable manner may be adopted to obtain the optoelectronic test parameters, for example, the optoelectronic test may be performed on the image detector of the spatial direction measuring instrument by an integrating sphere device to obtain the optoelectronic test parameters.
And 102, carrying out pixel-level calibration on an image detector of the spatial direction measuring instrument according to the photoelectric test parameters.
In this embodiment, when the pixel-level calibration is specifically implemented, the response inconsistency effect of the image detector can be corrected according to the photoelectric test parameters, so as to obtain dark field data and a response inconsistency result; then, the pixel position deviation calibration of the image detector is performed based on the laser heterodyne interference method, for example, multiple groups of young interference fringes with different spatial frequencies are generated by building a multi-fiber channel interference optical path in a vacuum environment and selecting different position fiber channels, and a high-precision pixel position deviation calibration result is obtained by resolving a fringe image, so that the pixel position deviation calibration precision of 1/1000 is realized.
And 103, carrying out field-of-view calibration on the spatial direction measuring instrument according to the pixel-level calibration result.
In this embodiment, based on the conventional grid calibration method, field-of-view calibration may be performed on the spatial directional measurement instrument based on the neighborhood average calibration method, so as to improve the calibration accuracy. For example, as shown in fig. 2 and 3, the influence of the spatial high-frequency error term can be reduced by averaging processing by acquiring star point maps of a plurality of positions in a small range near the index point; respectively using grid calibration point O on the basis of traditional grid calibration methodη(representing that the eta takes a grid calibration point) as a center, r is a radius, and gamma is a step length to carry out neighborhood sampling, and 360/gamma average distribution points are obtained and are evenly distributed at a point OηThe sampling points on the circumference which is the circle center and r is the radius are taken as the points O by the average processing of the sampling pointsηProcessing the calibration data according to the grid calibration method to obtain the calibration result, and realizing 1A field-of-view level calibration accuracy of 100.
And 104, performing track-level calibration on the spatial direction measuring instrument according to the result of the field-level calibration.
In this embodiment, on-orbit calibration can be performed through star sensor-gyro data fusion, and calibration are performed on orbit-level low-frequency errors: the method comprises the steps of establishing a star sensor-gyroscope installation error and calibration factor error model, then compensating various errors in real time through a Kalman filter-based algorithm to reduce the influence of the errors on attitude measurement as much as possible, achieving the purpose of improving the attitude measurement precision, compensating the star sensor installation error in real time on the track, and achieving the track-level calibration precision of the spatial orientation measuring instrument 1/100.
In summary, the invention combines the pixel-level calibration, the field-of-view-level calibration and the orbit-level calibration, realizes the mutual combination of the calibration results of different scales, corrects the pixel space high-frequency error and the field-of-view space high-frequency error, and can effectively improve the calibration precision and the star sensor attitude measurement precision.
Example 2
In this embodiment, the method for calibrating a spatial directional measuring instrument across scales includes:
step 201, acquiring photoelectric test parameters.
In this embodiment, the image detector of the spatial direction measuring instrument may be subjected to a photoelectric test based on an integrating sphere device, so as to obtain a photoelectric test parameter.
Step 202, according to the photoelectric test parameters, performing pixel-level calibration on an image detector of the spatial direction measuring instrument.
In this embodiment, the specific flow of pixel-level calibration is as follows:
substep 2021, according to the photoelectric test parameters, correcting the response inconsistency effect of the image detector to obtain dark field data bkg and a response inconsistency result prnu.
And a substep 2022 of constructing a device for measuring the pixel position deviation of the image detector based on the high-precision heterodyne interferometry.
As shown in fig. 4, the apparatus for measuring pixel position deviation of an image detector may specifically include: the device comprises a frequency stabilized laser 1, an optical isolator 2, a fiber coupler 3, a single-mode polarization maintaining fiber 4, a fiber beam splitter 5, an electro-optical modulator 6, a signal generator 7, an optical switch 8, a cabin penetrating fiber 9, a fiber fixing pressing block 10, an image detector 11, an optical platform 12, a vacuum tank A13, a control and data processing computer 14 and a glass box 15. Wherein, the frequency stabilized laser 1, the optical isolator 2 and the optical fiber coupler 3 are arranged in sequence and are arranged in the glass box 15 to prevent air disturbance; the optical fiber coupler 3 is respectively connected with the electro-optical modulator 6 and the optical switch 8 through a single-mode polarization-maintaining optical fiber 4 and an optical fiber beam splitter 5; the optical switch 8 is connected with an optical fiber fixing pressing block 10 through a cabin-penetrating optical fiber 9; the optical fiber fixing pressing block 10 and the image detector 11 are fixed on the optical platform 12 and are arranged in the vacuum tank A13; the electro-optical modulator 6 is connected with the signal generator 7; the control and data processing computer 14 is connected to the signal generator 7 and the image detector 11, respectively. The stable frequency laser 1 can be selected from a helium-neon stable frequency laser in a stable frequency mode, and the vibration direction of laser emitted by the stable frequency laser 1 is consistent with the light transmission direction of a polarizer of the optical isolator 2, so that the intensity of light beams passing through the optical isolator 2 reaches the maximum value.
Further, the optical path propagation path in the image detector pixel position deviation measuring device is as follows: the single-frequency stabilizing laser emitted by the frequency stabilizing laser 1 is divided into two beams after passing through an optical isolator 2, an optical fiber coupler 3, a single-mode polarization maintaining optical fiber 4 and an optical fiber beam splitter 5, the light beam directly enters an optical switch 8, and the light beam II enters an electro-optic modulator 6; after receiving the periodic signal sent by the control and data processing computer 14, the signal generator 7 sends a corresponding driving signal to the electro-optical modulator 6 to phase-modulate the light beam II entering the electro-optical modulator 6, so that the light beam II generates phase change along with time change
Outputting the phase-modulated light beam II to an optical switch 8; any two channels in the optical switch 8 are selected, the first light beam and the second light beam after phase modulation are respectively output to corresponding optical fibers in the optical fiber fixed pressing block 10 through the first channel, the second channel and the cabin-passing optical fiber 9, and finally the emergent light beams are shown in the figureHeterodyne interference fringes are formed on the surface of the image detector 11.
And a substep 2023 of performing pixel-level calibration on the pixel position deviation of the image detector spatially directed to the measuring instrument according to the image detector pixel position deviation measuring device by combining the dark field data bgg and the response inconsistency result prnu. The specific implementation process is as follows:
step a1, vacuum tank A13 was evacuated to 10-3Pa。
Step a2, the frequency stabilized laser 1 works, the emergent single-frequency stabilized laser is divided into two beams after passing through the optical isolator 2, the optical fiber coupler 3, the single-mode polarization maintaining optical fiber 4 and the optical fiber beam splitter 5, the light beam directly enters the optical switch 8, and the light beam II enters the electro-optic modulator 6.
Step a3, the data processing computer 14 sends a periodic signal to the signal generator 7, the signal generator 7 sends a driving signal V to the electro-optical modulator 6 after receiving the periodic signal, phase modulates the second light beam entering the electro-optical modulator 6, and outputs the phase-modulated second light beam to the optical switch 8; wherein the phase difference between the first light beam and the second phase-modulated light beam is
In this embodiment, the driving signal V can be expressed as: v ═ C × t2+ D × t; where t represents time and C and D represent two adjustable parameters. The regulation strategy of the drive signal V is as follows: the image detector 11 records heterodyne interference fringes within one cycle, and a fitting objective function I (p, q) ═ B + a × (k) sin (k) from the spatial-domain fringe imagexp+kyq + Ψ), performing nonlinear spatial domain fitting on each interference fringe recorded by the image detector 11, and calculating to obtain a corresponding fringe brightness bias coefficient B, a fringe brightness peak-to-peak coefficient A, x and a spatial frequency k in the y directionxAnd kyTime domain phase Ψ. Wherein, a and b represent peak-to-peak value and bias of ideal stripe, respectively, (p, q) represent position coordinates of pixel; further, it is determined whether the time-domain phase Ψ satisfies the following condition: psi is uniformly distributed in 0-360 degrees, if psi is uniformly distributed in 0-360 degrees, the current driving signal meets the requirement; if psi is not satisfied, all the degrees are within 0-360 DEGAnd (4) uniformly distributing, and adjusting the values of C and D until the time domain phase psi satisfies uniform distribution in 0-360 degrees.
Step a4, gating two channels in the optical switch 8, outputting the first light beam and the second light beam after phase modulation to corresponding optical fibers in the optical fiber fixing pressing block 10 through the first channel and the second channel and the cabin-passing optical fiber 9 respectively, and finally forming heterodyne interference fringes M on the surface of the image detector 11 by the emergent light beam1。
Step a5, according to dark field data bkg and response inconsistency result prnu, heterodyne interference fringe M1Corrected to obtain corrected heterodyne interference fringes M'1. Wherein, M'1＝prnu*(M1-bkg)。
Step a6, repeating steps a 4-a 5, gating two different channels in the optical switch 8, generating a plurality of heterodyne interference fringes M1Heterodyne interference fringe M with different spatial frequencies and same fringe directioniAnd the external difference interference fringe MiCorrecting to obtain a plurality of corrected heterodyne interference fringes M'i(ii) a According to the corrected heterodyne interference fringe M'1And a plurality of corrected heterodyne interference fringes M'iAnd calculating to obtain the pixel position deviation delta P in the vertical direction of the image detector1(p,q)。
In this embodiment, the calculation process of the pixel position deviation in the vertical direction of the image detector is as follows: firstly, calculating to obtain corrected heterodyne interference fringes M 'by the method in the step a 3'iCorresponding stripe brightness offset coefficient B'iAnd a streak luminance peak-to-peak coefficient A'iSpatial frequencies k 'in x and y directions'xAnd k'yTime domain phase Ψ'i(ii) a Then, using least square fitting to calculate the corresponding actual phase value of each pixel in the space stripe
And determining the corresponding ideal phase value of each pixel in the ideal stripe
Further, the method can be used for preparing a novel materialDetermining a phase offset value corresponding to each pixel
Finally, calculating to obtain the pixel position deviation of the image detector in the vertical direction
Note that the heterodyne interference fringe MiIs formed with heterodyne interference fringes M1The same, different in that the gating channels of the optical switches 8 are different, heterodyne interference fringes MiCorrection and heterodyne interference fringes M1The same applies to the correction of (a), and reference may be made to heterodyne interference fringe M described in step a5 above1Correction formula of (2) for the heterodyne interference fringe MiAnd (6) correcting.
Step a7, repeating steps a 4-a 5, gating two different channels in the optical switch 8, generating a plurality of heterodyne interference fringes M1Heterodyne interference fringe M with same spatial frequency and vertical fringe directionjAnd the external difference interference fringe MjCorrecting to obtain a plurality of corrected heterodyne interference fringes M'j(ii) a According to the corrected heterodyne interference fringe M'jAnd calculating to obtain the pixel position deviation delta P in the horizontal direction of the image detector2(p,q)。
In the present embodiment, heterodyne interference fringe MjIs formed with heterodyne interference fringes M1The same, the difference is that the gating channels of the optical switches 8 are different; heterodyne interference fringe MjCorrection and heterodyne interference fringes M1The same manner is adopted for the correction, and reference may be made to heterodyne interference fringe M described in step a5 above1Correction formula of (2), the heterodyne interference fringe MjCorrecting; the process of resolving the pixel position deviation in the horizontal direction of the image detector is the same as the process of resolving the pixel position deviation in the vertical direction of the image detector, and it is possible to refer to the method in step a6,according to corrected heterodyne interference fringe M'jAnd calculating to obtain the pixel position deviation delta P in the horizontal direction of the image detector2(p,q)。
And step 203, carrying out field-of-view calibration on the spatial direction measuring instrument according to the pixel-level calibration result.
In this embodiment, the specific flow of the field-level calibration is as follows:
substep 2031, constructing a cross-scale calibration device of the spatial extreme high-precision directional measuring instrument.
As shown in fig. 5, the cross-scale calibration apparatus for a spatial ultra-high precision pointing measurement instrument may specifically include: the device comprises a vacuum tank B16, a vibration isolation platform 17, a single-star simulator 18, a two-dimensional turntable 19, a space direction measuring instrument 20, a laser interference goniometer 21, two-dimensional turntable control equipment 22 and a control computer 23. Wherein, the single-star simulator 18, the two-dimensional turntable 19 and the laser interference goniometer 21 are sequentially arranged on the vibration isolation platform 17; the space direction measuring instrument 20 is arranged on the two-dimensional rotary table 19 and is positioned between the two-dimensional rotary table 19 and the single-star simulator 18; the two-dimensional turntable control device 22 is connected with the two-dimensional turntable 19; the control computer 23 is respectively connected with the space direction measuring instrument 20, the laser interference goniometer 21 and the two-dimensional turntable control device 22; the vibration isolation platform 17, the single-star simulator 18, the two-dimensional turntable 19, the spatial direction measuring instrument 20 and the laser interference goniometer 21 are arranged in a vacuum tank B16.
Substep 2032, performing field-level calibration on the low-frequency error of the spatial optical pointing measurement instrument based on a neighborhood average calibration method by combining the calibration result of pixel-level calibration according to the cross-scale calibration device of the spatial extremely high-precision pointing measurement instrument. The specific implementation process is as follows:
and b1, controlling the two-dimensional rotary table 19 to rotate to a planned position according to a neighborhood average calibration method, acquiring a star point diagram through the spatial direction measuring instrument 20, and measuring the angle of the two-dimensional rotary table 19 through the laser interference goniometer 21 to obtain the angle of the rotary table.
The rotation position of the two-dimensional turntable 19 satisfies the following rule: evenly distributing N x N grid points in the field of view of the star sensor, and in the neighborhood of each grid point, using the current gridThe two-dimensional rotary table 19 is controlled to rotate by taking r as radius and gamma as step length by taking a point as a center, the two-dimensional rotary table is collected at each position, and the angle (alpha) of the rotary table is measured by a laser interference goniometer 21τ,βτ) The star point diagram S is acquired by the spatial direction measuring instrument 20. Wherein alpha isτAnd betaτRespectively representing the pitch angle and the yaw angle of the two-dimensional turntable.
And b2, correcting the collected star point image S to obtain a corrected star point image S'.
S'＝prnu*(S-bkg)
Step b3, combining delta P according to the corrected star point graph S1(P, q) and Δ P2(p, q), determining a matrix U.
First, from the corrected star point map S', Δ P is combined1(P, q) and Δ P2(p, q), calculating to obtain the star point imaging mass center position of the current neighborhood sampling point:
wherein, UkAnd VkRespectively representing the abscissa and ordinate, x, of the star imaging centroid of the current neighborhood sampling pointpqAnd ypqRespectively representing the abscissa and the ordinate of the pixel in the coordinate system of the detector, and S '(p, q) representing the pixel point in the corrected star point map S'.
Then, for each neighborhood sampling point taking the grid point as the center, calculating to obtain the mean value of the star point imaging mass center positions corresponding to all the neighborhood sampling point positions, and determining a matrix U:
U＝(uυ,vυ)
wherein u isτAnd vτThe mean coordinates of the star point imaging mass center after the neighborhood sampling points are averaged are respectively represented, H represents the number of the neighborhood sampling points, and tau is 0,1,2.
Step b4, according to (alpha)τ,βτ) And determining a matrix G by using an installation matrix F between the two-dimensional turntable and the star sensor.
First, according to (alpha)τ,βτ) Determining the vector vec of the single star vector under the coordinate system of the rotary tableτ：
Then, according to vecτObtaining the vector Vec of the single star vector under the coordinate system of the space direction measuring instrument bodyτ：
Wherein, F represents the installation moment between the two-dimensional turntable and the star sensor; x is the number ofτ、yτAnd zτAs a vector VecτThe three-axis component of (a).
Finally, a matrix G is determined: g ═ xτ,yτ)。
Step b5, determining a resolving equation of the calibration coefficient K:
K＝GUTinv(UUT)
and step b6, solving the resolving equation of the calibration coefficient K determined in the step b5 by adopting a least square method according to the measurement and calculation results of the steps b 1-b 4 to obtain the value of the calibration coefficient K, and completing field-of-view level calibration of the low-frequency error of the spatial optical pointing measurement instrument.
And 204, performing track-level calibration on the spatial direction measuring instrument according to the result of the field-level calibration.
In this embodiment, according to the calibration result of the field-of-view level calibration, based on the emission process and the influence of the in-orbit environment, the track level calibration is performed on the low-frequency error of the spatial optical pointing measurement instrument, and the cross-scale calibration result is obtained and output. Specifically, the method comprises the following steps: after the star sensor enters the orbit, carrying out attitude measurement and determination according to the calculation and calibration results of the step 202 and the step 203; and (3) with the increase of the on-orbit working time, the on-orbit real-time correction is carried out on the calibration coefficient K by observing the star angular distance and taking the star angular distance as a true value, so that the track-level calibration of the low-frequency error of the spatial optical pointing measuring instrument is completed.
In summary, the invention discloses a cross-scale calibration method of a spatial directional measuring instrument, and provides a cross-scale calibration system of pixel level, field level and track level, wherein the cross-scale calibration system is used for calibrating the spatial directional measurement and the pixel level and the field level through a laser interference calibration and circle calibration method and the like carried out in a ground laboratory, calibrating and calibrating errors such as response inconsistency, pixel position deviation and the like of an image detector, and calibrating low-frequency errors of a field space caused by distortion and the like of an optical system; the calibration and calibration of the track-level low-frequency error characteristics are carried out through on-track real-time correction and calibration, so that the calibration of the extremely-high-precision spatial direction measuring instrument is realized. The calibration precision of the pixel-level calibration is as follows: 1/1000, the calibration accuracy of the field-of-view level calibration is: 1/100, the calibration accuracy of the track level calibration is: 1/100.
Example 3
As shown in fig. 6, the present invention also discloses a cross-scale calibration system for a spatial directional measuring instrument, comprising: an obtaining module 601, configured to obtain a photoelectric test parameter; the pixel-level calibration module 602 is configured to perform pixel-level calibration on an image detector of the spatial direction measurement instrument according to the photoelectric test parameter; the field-of-view calibration module 603 is configured to perform field-of-view calibration on the spatial direction measuring instrument according to a pixel-level calibration result; and the track-level calibration module 604 is configured to perform track-level calibration on the spatial direction measuring instrument according to a result of the field-level calibration.
For the system embodiment, since it corresponds to the method embodiment, the description is relatively simple, and for the relevant points, refer to the description of the method embodiment section.
Although the present invention has been described with reference to the preferred embodiments, it is not intended to limit the present invention, and those skilled in the art can make possible variations and modifications of the present invention using the method and the technical contents disclosed above without departing from the spirit and scope of the present invention, and therefore, any simple modifications, equivalent changes and modifications made to the above embodiments according to the technical essence of the present invention are all within the scope of the present invention.
Those skilled in the art will appreciate that the invention may be practiced without these specific details.
Claims (11)
1. A cross-scale calibration method for a spatial direction measuring instrument is characterized by comprising the following steps:
acquiring photoelectric test parameters;
according to the photoelectric test parameters, carrying out pixel-level calibration on an image detector of the spatial direction measuring instrument;
according to the pixel-level calibration result, performing field-level calibration on the spatial direction measuring instrument;
and according to the result of the field-of-view level calibration, performing track level calibration on the spatial direction measuring instrument.
2. The cross-scale calibration method of the spatial direction measuring instrument according to claim 1, wherein the obtaining of the photoelectric test parameters comprises: and carrying out photoelectric test on an image detector of the spatial direction measuring instrument through the integrating sphere equipment to obtain photoelectric test parameters.
3. The cross-scale calibration method of the spatial direction measuring instrument according to claim 1, wherein the pixel-level calibration of the image detector of the spatial direction measuring instrument according to the photoelectric test parameters comprises:
correcting the response inconsistency effect of the image detector according to the photoelectric test parameters to obtain dark field data bkg and a response inconsistency result prnu;
constructing an image detector pixel position deviation measuring device based on high-precision heterodyne interference based on a high-precision heterodyne interference method;
according to the image detector pixel position deviation measuring device, pixel-level calibration is carried out on the pixel position deviation of the image detector of the spatial direction measuring instrument by combining dark field data bkg and a response inconsistency result prnu.
4. The cross-scale calibration method of the spatial direction measuring instrument according to claim 3, wherein the image detector pixel position deviation measuring device comprises: the device comprises a frequency stabilized laser (1), an optical isolator (2), an optical fiber coupler (3), a single-mode polarization maintaining optical fiber (4), an optical fiber beam splitter (5), an electro-optical modulator (6), a signal generator (7), an optical switch (8), a cabin-penetrating optical fiber (9), an optical fiber fixing pressing block (10), an image detector (11), an optical platform (12), a vacuum tank A (13), a control and data processing computer (14) and a glass box (15);
the frequency stabilized laser (1), the optical isolator (2) and the optical fiber coupler (3) are sequentially arranged and are arranged in a glass box (15); the optical fiber coupler (3) is respectively connected with the electro-optical modulator (6) and the optical switch (8) through a single-mode polarization-maintaining optical fiber (4) and an optical fiber beam splitter (5); the optical switch (8) is connected with the optical fiber fixing pressing block (10) through the cabin penetrating optical fiber (9); the optical fiber fixing pressing block (10) and the image detector (11) are fixed on the optical platform (12) and are arranged in the vacuum tank A (13); the electro-optical modulator (6) is connected with the signal generator (7); the control and data processing computer (14) is respectively connected with the signal generator (7) and the image detector (11).
5. The cross-scale calibration method of the spatial direction measuring instrument according to claim 4, wherein the light path propagation path in the image detector pixel position deviation measuring device is as follows:
the single-frequency stabilized laser emitted by the frequency stabilized laser (1) is divided into two beams after passing through the optical isolator (2), the optical fiber coupler (3), the single-mode polarization maintaining optical fiber (4) and the optical fiber beam splitter (5)The light beam directly enters the light switch (8), and the light beam II enters the electro-optical modulator (6); after receiving the periodic signal sent by the control and data processing computer (14), the signal generator (7) sends a corresponding driving signal to the electro-optical modulator (6) to phase modulate a second light beam entering the electro-optical modulator (6) so that the second light beam generates phase change along with time change
Outputting the phase-modulated light beam II to an optical switch (8); any two channels in the gating optical switch (8), the first light beam and the second light beam after phase modulation are respectively output to corresponding optical fibers in the optical fiber fixing pressing block (10) through the first channel and the second channel and the cabin-passing optical fiber (9), and finally the emergent light beam forms heterodyne interference fringes on the surface of the image detector (11).
6. The cross-scale calibration method of the spatial direction measuring instrument according to claim 5, wherein the pixel-level calibration of the pixel position deviation of the image detector of the spatial direction measuring instrument is performed according to the image detector pixel position deviation measuring device by combining the dark field data bgg and the response inconsistency result prnu, and includes:
step a1, vacuum tank A (13) is evacuated to 10-3Pa；
Step a2, a frequency stabilized laser (1) works, an emergent single-frequency stabilized laser is divided into two beams after passing through an optical isolator (2), an optical fiber coupler (3), a single-mode polarization maintaining optical fiber (4) and an optical fiber beam splitter (5), the beam directly enters an optical switch (8), and the second beam enters an electro-optic modulator (6);
a3, the data processing computer (14) sends periodic signal to the signal generator (7), the signal generator (7) sends driving signal V to the electro-optical modulator (6) after receiving the periodic signal, phase modulates the light beam II entering the electro-optical modulator (6), and outputs the phase modulated light beam II to the optical switch (8); wherein the phase difference between the first light beam and the second phase-modulated light beam is
Step a4, two channels in the optical switch (8) are gated, a first light beam and a second light beam after phase modulation are respectively output to corresponding optical fibers in the optical fiber fixing pressing block (10) through the first channel and the second channel and through cabin-passing optical fibers (9), and finally, an emergent light beam forms heterodyne interference fringes M on the surface of the image detector (11)1；
Step a5, according to dark field data bkg and response inconsistency result prnu, heterodyne interference fringe M1Corrected to obtain corrected heterodyne interference fringes M'1；
Step a6, repeating steps a 4-a 5, gating two different channels in the optical switch (8), and generating a plurality of heterodyne interference fringes M1Heterodyne interference fringe M with different spatial frequencies and same fringe directioniAnd the external difference interference fringe MiCorrecting to obtain a plurality of corrected heterodyne interference fringes M'i(ii) a According to the corrected heterodyne interference fringe M'1And a plurality of corrected heterodyne interference fringes M'iAnd calculating to obtain the pixel position deviation delta P in the vertical direction of the image detector1(p,q)；
Step a7, repeating steps a 4-a 5, gating two different channels in the optical switch (8), and generating a plurality of heterodyne interference fringes M1Heterodyne interference fringe M with same spatial frequency and vertical fringe directionjAnd the external difference interference fringe MjCorrecting to obtain a plurality of corrected heterodyne interference fringes M'j(ii) a According to the corrected heterodyne interference fringe M'jAnd calculating to obtain the pixel position deviation delta P in the horizontal direction of the image detector2(p,q)。
7. The cross-scale calibration method of the spatial direction measuring instrument according to claim 6, wherein the field-of-view calibration of the spatial direction measuring instrument is performed according to the result of the pixel-level calibration, and the method comprises the following steps:
constructing a cross-scale calibration device of a space extremely-high-precision pointing measuring instrument;
according to the cross-scale calibration device of the spatial extremely high-precision pointing measurement instrument, the low-frequency error of the spatial optical pointing measurement instrument is calibrated in a view field level on the basis of a neighborhood average calibration method by combining the calibration result of pixel-level calibration.
8. The cross-scale calibration method of the spatial direction measuring instrument according to claim 7, wherein the cross-scale calibration device of the spatial direction measuring instrument with extremely high precision comprises: the device comprises a vacuum tank B (16), an isolation platform (17), a single-star simulator (18), a two-dimensional turntable (19), a space direction measuring instrument (20), a laser interference goniometer (21), two-dimensional turntable control equipment (22) and a control computer (23);
the single-star simulator (18), the two-dimensional turntable (19) and the laser interference goniometer (21) are sequentially arranged on the vibration isolation platform (17); the spatial direction measuring instrument (20) is arranged on the two-dimensional rotary table (19) and is positioned between the two-dimensional rotary table (19) and the single-star simulator (18); the two-dimensional rotary table control equipment (22) is connected with the two-dimensional rotary table (19); the control computer (23) is respectively connected with the space direction measuring instrument (20), the laser interference goniometer (21) and the two-dimensional turntable control equipment (22); the vibration isolation platform (17), the single-star simulator (18), the two-dimensional rotary table (19), the spatial direction measuring instrument (20) and the laser interference goniometer (21) are arranged in the vacuum tank B (16).
9. The cross-scale calibration method of the spatial directional measuring instrument according to claim 8, wherein the field-of-view calibration is performed on the low-frequency error of the spatial optical directional measuring instrument based on a neighborhood average calibration method according to the cross-scale calibration device of the spatial extremely high-precision directional measuring instrument in combination with the calibration result of the pixel-level calibration, and the method comprises the following steps:
step b1, controlling the two-dimensional rotary table (19) to rotate to a planned position according to a neighborhood average calibration method, acquiring a star point diagram S through a space pointing measuring instrument (20), measuring the angle of the two-dimensional rotary table (19) through a laser interference goniometer (21), and obtaining a rotary table angle (alpha)τ,βτ) (ii) a Wherein alpha isτAnd betaτRespectively representing a pitch angle and a yaw angle of the two-dimensional rotary table;
step b2, correcting the collected star point image S to obtain a corrected star point image S';
step b3, combining delta P according to the corrected star point graph S1(P, q) and Δ P2(p, q), determining a matrix U;
step b4, according to (alpha)τ,βτ) And an installation matrix F between the two-dimensional rotary table and the star sensor, and determining a matrix G;
step b5, determining a resolving equation of the calibration coefficient K:
K＝GUTinv(UUT)
and b6, solving the resolving equation of the calibration coefficient K determined in the step b5 by adopting a least square method according to the measurement and calculation results in the steps b 1-b 4 to obtain the value of the calibration coefficient K, and completing the field-of-view level calibration of the low-frequency error of the spatial optical pointing measuring instrument.
10. The cross-scale calibration method of the spatial direction measuring instrument according to claim 1, wherein the track-level calibration of the spatial direction measuring instrument is performed according to the result of the field-of-view-level calibration, and comprises: and according to the calibration result of the field-of-view level calibration, performing track level calibration on the low-frequency error of the spatial optical pointing measuring instrument based on the influence of the emission process and the on-orbit environment to obtain a cross-scale calibration result and output the cross-scale calibration result.
11. A cross-scale calibration system of a spatial directional measuring instrument is characterized by comprising:
the acquisition module is used for acquiring photoelectric test parameters;
the pixel-level calibration module is used for carrying out pixel-level calibration on an image detector of the spatial direction measuring instrument according to the photoelectric test parameters;
the visual field level calibration module is used for carrying out visual field level calibration on the spatial direction measuring instrument according to the pixel level calibration result;
and the track-level calibration module is used for performing track-level calibration on the spatial direction measuring instrument according to the result of the field-level calibration.
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