CN114552359A - Method and device for controlling femtosecond laser with multiple wavelengths - Google Patents

Method and device for controlling femtosecond laser with multiple wavelengths Download PDF

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CN114552359A
CN114552359A CN202210443699.3A CN202210443699A CN114552359A CN 114552359 A CN114552359 A CN 114552359A CN 202210443699 A CN202210443699 A CN 202210443699A CN 114552359 A CN114552359 A CN 114552359A
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CN114552359B (en
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黄焱坤
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Nanjing Manyu Medical Technology Co ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/0014Monitoring arrangements not otherwise provided for
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/0014Measuring characteristics or properties thereof
    • H01S5/0021Degradation or life time measurements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/06Arrangements for controlling the laser output parameters, e.g. by operating on the active medium

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Abstract

The invention provides a control method and a control device of a femtosecond laser with multiple wavelengths, which relate to the femtosecond laser technology, and are used for processing a preset limit damage value, the interval time, the beam quality damage value between a previous time point and a current time point according to a time length prediction model to generate a preliminary time length; acquiring the actual use time and the preset use time of the harmonic separator in the interval time, and processing the actual use time and the preset use time according to a time offset model to generate a time offset value; performing offset processing on the preliminary time length based on the time length offset value to generate the residual time length of the harmonic separator; the operation time of the femtosecond laser is controlled based on the residual time of the harmonic separator, the working state of the femtosecond laser can be judged through the harmonic separator, and the femtosecond laser is effectively controlled to work.

Description

Method and device for controlling femtosecond laser with multiple wavelengths
Technical Field
The invention relates to a femtosecond laser technology, in particular to a control method and a control device of a femtosecond laser with multiple wavelengths.
Background
The ultraviolet femtosecond laser is generally generated by frequency doubling outside a cavity and has the characteristics of high peak power of the femtosecond laser and short wavelength of the ultraviolet light, so that an optical device inside the laser is very easy to damage, thereby influencing the service life of the femtosecond laser. The ultraviolet harmonic separator is an optical element which is easy to damage in a laser, and is a beam splitter coated with a light splitting film for reflecting other light transmission by ultraviolet light.
In the prior art, whether the femtosecond laser can be continuously used is generally judged according to the running time of the femtosecond laser, and if the time limit is not reached, the femtosecond laser is continuously controlled to work.
In the process of implementing the invention, the inventor finds that at least the following problems exist in the prior art: the femtosecond laser needs high-precision work, particularly an ultraviolet harmonic separator which is easy to damage, and the work of the femtosecond laser can be seriously influenced if the loss value of the ultraviolet harmonic separator exceeds a threshold value within a period.
Therefore, how to effectively control the operation of the femtosecond laser becomes an urgent problem to be solved.
Disclosure of Invention
The embodiment of the invention provides a method and a device for controlling a femtosecond laser with multiple wavelengths, which can judge the working state of the femtosecond laser and effectively control the femtosecond laser to work.
In a first aspect of the embodiments of the present invention, a method for controlling a femtosecond laser with multiple wavelengths is provided, including:
respectively acquiring the beam quality of transmitted light passing through a harmonic separator at a previous time point and a current time point according to detection equipment, and respectively acquiring the beam quality damage values at the previous time point and the current time point on the basis of the beam quality and a reference beam quality value;
processing a preset limit damage value, the interval time between a previous time point and a current time point and the light beam quality damage value between the previous time point and the current time point according to a time length prediction model to generate a preliminary time length;
acquiring the actual use time and the preset use time of the harmonic separator in the interval time, and processing the actual use time and the preset use time according to a time offset model to generate a time offset value;
performing offset processing on the preliminary time length based on the time length offset value to generate the residual time length of the harmonic separator;
controlling an operating time of the femtosecond laser based on a remaining time of the harmonic separator.
Optionally, in a possible implementation manner of the first aspect, in the step of processing a preset limit damage value, the interval duration, the beam quality damage value between a previous time point and a current time point according to a duration prediction model to generate a preliminary duration, the method specifically includes:
generating a residual damage amount based on the difference value between the preset limit damage value and the beam quality damage value at the current time point;
generating a damage rate based on the ratio of the difference value between the beam quality damage value of the current time point and the beam quality damage value of the previous time point to the interval duration;
and processing the residual damage amount and the damage rate according to the time length prediction model to generate the preliminary time length.
Optionally, in a possible implementation manner of the first aspect, in the step of processing the actual usage duration and the preset usage duration according to a duration offset model to generate the duration offset value, the step specifically includes:
acquiring a preset using time length and an actual using time length in the interval time length, and generating a time length difference value of the preset using time length and the actual using time length;
and generating the time length deviation value according to the time length difference value.
Optionally, in a possible implementation manner of the first aspect, offsetting the preliminary duration based on the duration offset value to generate the remaining duration of the harmonic separator includes:
Figure 464347DEST_PATH_IMAGE001
where T represents the remaining duration, K1 represents the weight of the damage rate, K2 represents the weight of the preliminary duration, K3 represents the weight of the offset value, T1 represents the previous time point, and T2 represents the current time pointTime point, S1 represents the beam quality damage value of the previous time point, S2 represents the beam quality damage value of the current time point, G represents the preset limit damage value, N represents the preset usage time within the interval time period, R represents the actual usage time period,
Figure 270760DEST_PATH_IMAGE002
represents a constant, h is a constant related to the loss rate, c represents a non-zero constant,
Figure 821827DEST_PATH_IMAGE003
is a constant greater than 1 and a2 is a constant less than 1.
Optionally, in a possible implementation manner of the first aspect, after obtaining the remaining duration of the harmonic separator, the method further includes:
acquiring the total use duration and the total use times of the harmonic separator, and generating the total use amount according to the total use duration and the total use times;
generating a prediction test frequency according to the residual time length, the total usage amount, the preset limit damage value and the light beam quality damage value of the current time point by a time sequence model;
and generating a plurality of test time points according to the predicted test times and the residual duration, and triggering the detection equipment to work based on the test time points.
Optionally, in a possible implementation manner of the first aspect, in the step of generating the predicted test times according to a time series model for the remaining time length, the total usage amount, the preset limit damage value, and the beam quality damage value at the current time point, the method specifically includes:
acquiring the total usage amount of the harmonic separator based on the total usage duration and the total usage times, and generating an adjustment value according to the total usage amount and a preset usage amount;
adjusting a preset loss interval for indicating a detection interval according to the adjustment value to generate a real-time loss interval;
and generating a prediction test frequency based on the real-time loss interval and the residual damage amount.
Optionally, in a possible implementation manner of the first aspect, generating a predicted number of tests based on the real-time loss interval and the remaining damage amount includes:
Figure 136002DEST_PATH_IMAGE004
wherein the content of the first and second substances,
Figure 721704DEST_PATH_IMAGE005
representing the number of predicted tests, J represents the preset loss interval spaced every test,
Figure 964598DEST_PATH_IMAGE006
represents the adjustment value of J, Y represents the preset usage amount, Z1 represents the total usage time, Z2 represents the total usage times, K5 represents the weight of Z1, K6 represents the weight of Z2,
Figure 2961DEST_PATH_IMAGE007
is a constant number of times, and is,
Figure 855248DEST_PATH_IMAGE008
is a constant less than 1 and b2 is a constant greater than 1.
In a second aspect of the embodiments of the present invention, there is provided a control apparatus for a femtosecond laser having multiple wavelengths, including:
the detection module is used for respectively acquiring the beam quality of the transmitted light passing through the harmonic separator at the previous time point and the current time point according to the detection equipment, and respectively acquiring the beam quality damage values at the previous time point and the current time point based on the beam quality and the reference beam quality value;
the preliminary duration module is used for processing a preset limit damage value, the interval duration between a previous time point and a current time point and the light beam quality damage value between the previous time point and the current time point according to a duration prediction model to generate preliminary duration;
the offset module is used for acquiring the actual use duration and the preset use duration of the harmonic separator in the interval duration, and processing the actual use duration and the preset use duration according to a duration offset model to generate a duration offset value;
a result module, configured to perform offset processing on the preliminary duration based on the duration offset value, and generate a remaining duration of the harmonic separator;
a control module for controlling an operating duration of the femtosecond laser based on a remaining duration of the harmonic separator.
In a third aspect of embodiments of the present invention, there is provided a control apparatus for a femtosecond laser with multiple wavelengths, including: memory, a processor and a computer program, the computer program being stored in the memory, the processor running the computer program to perform the method of the first aspect of the invention and the various possible references to the first aspect.
A fourth aspect of the embodiments of the present invention provides a readable storage medium, in which a computer program is stored, the computer program being, when executed by a processor, configured to implement the method according to the first aspect of the present invention and various possible aspects of the first aspect.
According to the control method and device for the femtosecond laser with multiple wavelengths, provided by the invention, the residual working time of the harmonic separator is predicted by performing loss test on the frequently damaged harmonic separator in the femtosecond laser, so that the working time of the femtosecond laser is predicted, a user is assisted to effectively control the operation of the femtosecond laser, and the use accident of the femtosecond laser is prevented. In addition, the invention can predict the testing time, assist the user to test the harmonic separator according to the predicted time, and the testing time can be updated.
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FIG. 1 is a schematic diagram of the present solution for embodying an application scenario;
FIG. 2 is a schematic diagram of a method for controlling a femtosecond laser with multiple wavelengths according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a control device for a femtosecond laser with multiple wavelengths according to an embodiment of the present invention;
fig. 4 is a schematic hardware structure diagram of a control device of a femtosecond laser with multiple wavelengths according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims, as well as in the drawings, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein.
It should be understood that, in various embodiments of the present invention, the sequence numbers of the processes do not mean the execution sequence, and the execution sequence of the processes should be determined by the functions and the internal logic of the processes, and should not constitute any limitation on the implementation process of the embodiments of the present invention.
It should be understood that in the present application, "comprising" and "having" and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It should be understood that, in the present invention, "a plurality" means two or more. "and/or" is merely an association describing an associated object, meaning that three relationships may exist, e.g., a and/or B, may mean: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship. "comprises A, B and C" and "comprises A, B, C" means that A, B, C all comprise, "comprises A, B or C" means comprise one of A, B, C, "comprises A, B and/or C" means comprise any 1 or any 2 or 3 of A, B, C.
It should be understood that in the present invention, "B corresponding to a", "a corresponds to B", or "B corresponds to a" means that B is associated with a, and B can be determined from a. Determining B from a does not mean determining B from a alone, but may be determined from a and/or other information. And the matching of A and B means that the similarity of A and B is greater than or equal to a preset threshold value.
As used herein, "if" may be interpreted as "at … …" or "when … …" or "in response to a determination" or "in response to a detection", depending on the context.
The technical solution of the present invention will be described in detail below with specific examples. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments.
Referring to fig. 1, for an application scenario of the present solution, as is well known, a typical femtosecond laser mainly includes a pumping source, a gain medium, an optical resonant cavity, an ultraviolet harmonic separator, and the like, where the ultraviolet harmonic separator is a relatively easily damaged optical element in the laser and is a beam splitter coated with a light splitting film for reflecting other light transmission by ultraviolet light. A harmonic separator is also called a high-modulation separator, and sometimes a harmonic separator or a dichroic beam splitter, called a "spectroscope" or a "filter", is one of the beam splitters, as shown in fig. 1, the harmonic separator can separate incident light into reflected light and transmitted light, and under normal conditions (the harmonic separator is not damaged), the transmitted light is hardly mixed with light with a reflected wavelength, but the reflected light is mixed with light with a transmitted wavelength, that is, the quality of the transmitted light beam is high; in an abnormal situation (damage to the harmonic separator), the transmitted light is mixed with the light of the reflected wavelength, but the reflected light is also mixed with the light of the transmitted wavelength, so that the quality of the transmitted light beam is low, and the normal operation condition of the laser is influenced.
The invention of the scheme is characterized in that the remaining time of the optical component is predicted by detecting the harmonic separator of the optical component which is very easily damaged in the femtosecond laser, so that the user is assisted in predicting how long the femtosecond laser can be used, the plan of using the femtosecond laser by the user is further controlled, and the situation that the user is still using the femtosecond laser after the femtosecond laser is damaged or the femtosecond laser is abandoned when the femtosecond laser is not damaged is prevented.
In order to implement the above inventive concept, referring to fig. 2, it is a schematic diagram of a control method of a femtosecond laser with multiple wavelengths according to an embodiment of the present invention, and an execution main body of the method shown in fig. 2 may be a software and/or hardware device. The execution subject of the present application may include, but is not limited to, at least one of: user equipment, network equipment, etc. The user equipment may include, but is not limited to, a computer, a smart phone, a Personal Digital Assistant (PDA), and the electronic devices mentioned above. The network device may include, but is not limited to, a single network server, a server group of multiple network servers, or a cloud of numerous computers or network servers based on cloud computing, wherein cloud computing is one type of distributed computing, a super virtual computer consisting of a cluster of loosely coupled computers. The present embodiment does not limit this. The control method of the femtosecond laser with multiple wavelengths comprises the following steps from S101 to S105:
s101, beam quality of transmitted light of a previous time point and a current time point after passing through a harmonic separator is respectively obtained according to detection equipment, and beam quality damage values of the previous time point and the current time point are respectively obtained on the basis of the beam quality and a reference beam quality value.
S102, processing a preset limit damage value, interval time between a previous time point and a current time point, and the light beam quality damage value between the previous time point and the current time point according to a time length prediction model to generate a preliminary time length.
Specifically, the detection device may be, for example, an excimer laser source for generating laser light, the generated laser light is incident on the harmonic separator and is divided into reflected light and transmitted light, and the detection device further includes a beam quality analyzer for analyzing the beam quality of the transmitted light, so as to determine whether the harmonic separator in the current state is in a normal state through the analysis of the beam quality.
It is understood that when the harmonic separator is damaged, the beam quality thereof is poor and exceeds a set value, so that the femtosecond laser cannot be used continuously, and when the harmonic separator is not damaged, the beam quality thereof is within the set value, and the femtosecond laser can be used normally.
It should be noted that, according to the present embodiment, the light beam quality damage values at the previous time point and the current time point and the interval duration between the previous time point and the current time point need to be obtained according to the analyzed light beam quality.
It is understood that after the beam quality at each time point is obtained, the beam quality can be compared with the reference beam quality value to determine the beam quality damage value at each time point.
For example, the reference beam quality value may be 99%, the beam quality at the previous time point may be 98%, the beam quality at the current time point may be 96%, the beam quality damage value at the previous time point is 1%, the beam quality damage value at the current time point is 3%, and the beam quality damage value calculation principles at other time points are similar and will not be described herein again.
A preset limit damage value may also be set, for example, 15%, and it is understood that when the beam quality damage value at a certain time point is 16%, it exceeds the preset limit damage value, which indicates that the harmonic separator is damaged, at this time, the femtosecond laser cannot be used continuously, otherwise, a major error of the femtosecond laser occurs.
Specifically, the scheme is provided with a time duration prediction model to process some data to obtain preliminary time duration, wherein the preliminary time duration is the preliminary remaining time duration of the harmonic separator. It can be understood that the preliminary duration of this step is obtained only by processing some parameters that have a large influence, and is not accurate enough.
In some embodiments, step S102 may be step S1021-step S1023:
and S1021, generating a residual damage amount based on the difference value between the preset limit damage value and the beam quality damage value of the current time point.
For example, it may be to utilize
Figure 701982DEST_PATH_IMAGE009
To calculate the remaining damage amount, wherein G represents a preset limit damage value, and S2 represents the beam quality damage value at the current time point. Specifically, for example, the preset limit damage value may be 15%, the beam quality damage value at the current time point is 1%, and the remaining damage amount is 15%; for another example, if the beam quality damage value at the current time point is 2%, the remaining damage amount is 14%.
And S1022, generating a damage rate based on a ratio of the difference between the beam quality damage value at the current time point and the beam quality damage value at the previous time point to the interval duration.
It can be understood that, in order to calculate the preliminary time length, the damage rate needs to be calculated according to the present embodiment, and then the interval time length is compared by using the difference between the beam quality damage value at the current time point and the beam quality damage value at the previous time point, so that the damage rate can be calculated.
It should be noted that, the same femtosecond laser is used by different people, and the damage rates are different, for example, the damage rate is higher if the user a has bad habits or has long duration, while the damage rate is lower if the user B has good habits and has short duration, and the damage rate can be calculated according to the scheme to better fit the femtosecond laser used by the user.
Illustratively, can adopt
Figure 99465DEST_PATH_IMAGE010
To calculate the damage rate, t1 represents the previous time point, t2 represents the current time pointAt time point, S1 represents the beam quality damage value at the previous time point, and S2 represents the beam quality damage value at the current time point.
For example, if t 2-t 1 is 30 days and S2-S1 are 2%, then the injury rate may be 1/15. Note that t1 and t2 may be in units of days or hours, and may be specifically adjusted and converted as needed.
And S1023, processing the residual damage amount and the damage rate according to the time length prediction model to generate the preliminary time length.
It is understood that after the remaining damage amount and the damage rate are obtained, the preliminary time period may be calculated.
In some embodiments, the remaining damage amount and the damage rate may be processed based on the following formula, generating the preliminary length of time,
Figure 641436DEST_PATH_IMAGE011
wherein the content of the first and second substances,
Figure 313726DEST_PATH_IMAGE012
representing a preliminary time period, t1 representing a previous time point, t2 representing a current time point, S1 representing a beam quality damage value at the previous time point, S2 representing a beam quality damage value at the current time point, G representing a preset limit damage value, K1 representing a weight of the damage rate, h being a constant related to the loss rate,
Figure 280545DEST_PATH_IMAGE003
is a constant less than 1 and a2 is a constant greater than 1.
The above K1 is a weight of the damage rate, and the damage rate can be corrected to be larger or smaller according to the actual situation.
For example, the damage rate may be 1/10, the remaining damage amount may be 2%, and the preliminary period may be 2 days.
S103, acquiring the preset using time and the actual using time of the harmonic separator in the interval time, and processing the preset using time and the actual using time according to a time offset model to generate a time offset value.
Specifically, in the interval duration, if the harmonic separator is used for a short time, the loss of the harmonic separator may be slower, the preliminary duration needs to be shifted, and the preliminary duration is revised; within the interval duration, the longer the harmonic separator is used, the faster the loss of the harmonic separator may be, the value of the preliminary duration needs to be shifted, and the preliminary duration is reduced to fit the user situation to calculate the more accurate prediction duration.
In some embodiments, the step of generating the duration offset value by processing the preset duration and the actual duration according to the duration offset model specifically includes:
acquiring a preset using time length and an actual using time length in the interval time length, and generating a time length difference value of the preset using time length and the actual using time length;
and generating the time length deviation value according to the time length difference value.
Wherein, the calculation formula can be as follows:
Figure 912513DEST_PATH_IMAGE013
wherein the content of the first and second substances,
Figure 191047DEST_PATH_IMAGE014
represents an offset value, N represents a preset usage time period within the interval time period, R represents an actual usage time period,
Figure 542394DEST_PATH_IMAGE002
representing the coefficient and c represents a non-zero constant.
C is a constant value that ensures that a is a positive number and that ensures that a is a non-negative number.
S104, carrying out offset processing on the preliminary time length based on the time length offset value to generate the residual time length of the harmonic separator.
Specifically, after the preliminary duration and the duration offset value are obtained in steps S102 and S103, the preliminary duration may be adjusted cheaply to obtain a more accurate remaining duration.
In some embodiments, offsetting the preliminary duration based on the duration offset value to generate the remaining duration of the harmonic separator may include:
Figure 239086DEST_PATH_IMAGE015
wherein T represents a remaining time period, K1 represents a weight of a damage rate, K2 represents a weight of a preliminary time period, K3 represents a weight of an offset value, T1 represents a previous time point, T2 represents a current time point, S1 represents a beam quality damage value at the previous time point, S2 represents a beam quality damage value at the current time point, G represents a preset limit damage value, N represents a preset usage time period within the interval time period, R represents an actual usage time period,
Figure 650476DEST_PATH_IMAGE002
represents a constant, c represents a non-zero constant, h is a constant related to the loss rate,
Figure 681886DEST_PATH_IMAGE003
is a constant greater than 1 and a2 is a constant less than 1.
It is understood that the above is that K2 represents the weight of the preliminary duration, and K3 represents the weight of the offset value, which can be adjusted according to the actual situation of the user.
S105, controlling the operation time of the femtosecond laser based on the residual time of the harmonic separator.
It can be understood that, for example, the remaining time of the harmonic separator is 100 days, the user can know that the operation time of the femtosecond laser is about 100 days, and can effectively control the femtosecond laser to normally work within 100 days; for another example, if the remaining time of the harmonic separator is 0 day, the user may know that the operating time of the femtosecond laser is about 0 day, which indicates that the femtosecond laser cannot work normally, and the user may find in time, and if the user does not find that the operating time of the femtosecond laser may be an accident of the femtosecond laser, so that the effective control of the femtosecond laser may be realized through the above embodiment.
It should be noted that, the scheme only uses the harmonic separator which is very easy to damage and often damaged in the femtosecond laser to predict, of course, other devices in the femtosecond laser may be damaged, but the damage, for example, power supply damage and the like, occurs infrequently, the scheme only predicts the remaining service life of the femtosecond laser from one side surface, assists the user to control the femtosecond laser, and does not use the prediction of only one component of the scheme to achieve the effect of accurate prediction.
On the basis of the above embodiment, the present invention provides a scheme for predicting test time, which assists a user in performing a time point for testing a harmonic separator next time, or may control a detection device to automatically complete a test according to the obtained time point, where the specific scheme refers to the following.
After acquiring the remaining time of the harmonic separator, the scheme further comprises steps S201-S203:
s201, acquiring the total using time length and the total using times of the harmonic separator, and generating the total using amount according to the total using time length and the total using times.
Specifically, the total usage amount of the harmonic separator is comprehensively calculated by acquiring the total usage duration and the total usage times of the harmonic separator. It will be appreciated that the greater the total usage of the harmonic separators, the faster will be their rate of loss.
In practical applications, the statistics of the total usage time may be how long the harmonic separator operates, for example, 10 days, or 240 hours, and the total usage times may be, for example, the on/off times of the femtosecond laser, for example, after the femtosecond laser is put into use, the total on/off times is 1000 times.
In some embodiments, calculating the total usage may be calculated in the following manner:
Figure 305765DEST_PATH_IMAGE016
wherein the content of the first and second substances,
Figure 621077DEST_PATH_IMAGE017
represents the total usage amount, Z1 represents the total usage duration, Z2 represents the total number of times of usage, K5 represents the weight of Z1, K6 represents the weight of Z2,
Figure 62423DEST_PATH_IMAGE007
is a constant. Preferably, the weight value of K5 may be greater than K6 to increase the influence of the total usage duration Z1 on the total usage amount U. For example, K5 may be 0.8 and K6 may be 0.2. It will be appreciated that the total usage duration has a greater effect on the total usage than the total number of uses. Of course, the weight values are not limited to the above limitations.
And S202, generating prediction test times according to the residual time length, the total usage amount, the preset limit damage value and the beam quality damage value of the current time point by a time series model.
The step may specifically include:
acquiring the total usage amount of the harmonic separator based on the total usage duration and the total usage times, and generating an adjustment value according to the total usage amount and a preset usage amount;
adjusting a preset loss interval for indicating a detection interval according to the adjustment value to generate a real-time loss interval;
and generating a prediction test frequency based on the real-time loss interval and the residual damage amount.
Generating a prediction test frequency based on the real-time loss interval and the residual damage amount, wherein the generating comprises the following steps:
Figure 800703DEST_PATH_IMAGE018
wherein the content of the first and second substances,
Figure 493853DEST_PATH_IMAGE005
representing the number of predictive tests, J representing once per testThe predetermined loss interval that is to be separated,
Figure 617666DEST_PATH_IMAGE006
represents the adjustment value of J, Y represents the preset usage amount, Z1 represents the total usage time, Z2 represents the total usage times, K5 represents the weight of Z1, K6 represents the weight of Z2,
Figure 479181DEST_PATH_IMAGE007
is a constant number of times, and is,
Figure 219604DEST_PATH_IMAGE008
is a constant less than 1 and b2 is a constant greater than 1.
It is to be noted that, among others,
Figure 450865DEST_PATH_IMAGE019
meaning that the result of the operation is rounded, for example,
Figure 976655DEST_PATH_IMAGE020
the result of the operation of (C) is 3.4, then the final result of C is 3.
It will be appreciated that the present solution may set a preset loss interval for indicating the detection interval, which may for example be a preset requirement that the harmonic separator needs to be detected once every 2% loss.
In this step, the preset loss interval is adjusted in real time by calculating the total usage amount of the harmonic separator, and the preset loss interval is adjusted to the real-time loss interval.
In an exemplary manner, the first and second electrodes are,
Figure 228645DEST_PATH_IMAGE021
for presetting the loss interval, the weight K4 is used for pairing
Figure 705632DEST_PATH_IMAGE022
It is understood that when the total usage is larger, the weight K4 is
Figure 475005DEST_PATH_IMAGE008
Figure 104569DEST_PATH_IMAGE008
Is a constant less than 1, resulting in
Figure 543772DEST_PATH_IMAGE023
The size of the laser is reduced, so that a user can measure for multiple times in the final use stage of the femtosecond laser, and the purpose of accurately prompting the user to control the femtosecond laser is achieved.
S203, generating a plurality of test time points according to the predicted test times and the residual duration, and triggering the detection equipment to work based on the test time points.
According to the scheme, the test time point can be calculated after the predicted test times are obtained, so that the detection equipment is controlled to automatically detect the harmonic separator in the femtosecond laser. It should be noted that, in step S203, the detection device and the femtosecond laser need to be combined together to achieve automatic testing, otherwise, after a plurality of testing time points are obtained, the testing time points may be transmitted to a user, and the user is instructed to use the detection device to test the harmonic separator.
Illustratively, the predicted number of tests is 2, and the remaining time period is 4 days, then the test time points are obtained as the harmonic separator is tested once at 2 days and the harmonic separator is tested a second time at 4 days.
On the basis of the above embodiment, the present solution further includes:
acquiring first image information of the surface to be detected of the harmonic separator at a previous time point, and acquiring second image information of the surface to be detected of the harmonic separator at a current time point, wherein the acquisition environments of the previous time point and the current time point are consistent;
acquiring a first brightness value of the first image information and a second brightness value of the second image information, and generating a brightness difference value based on the first brightness value and the second brightness value;
and generating aging result information of the surface to be detected according to the brightness difference value and a preset threshold value.
It is understood that the present solution can also determine whether the harmonic separator is aged or can still be used normally by determining the brightness value of the first image information and the brightness value of the second image information of the harmonic separator, so as to implement the precise detection of the harmonic separator in cooperation with the above-mentioned embodiments.
In some embodiments, obtaining a first luminance value of the first image information and a second luminance value of the second image information comprises:
marking a first area of a pre-marked using area in the first image information and the second image information, and taking the rest areas as second areas;
the first luminance value and the second luminance value are obtained according to the following formulas,
Figure 258787DEST_PATH_IMAGE024
wherein L1 represents the luminance value of the first region, K7 represents the weight of L1, L2 represents the luminance value of the second region, K8 represents the weight of L2,
Figure 97430DEST_PATH_IMAGE025
is a constant.
It can be understood that the pre-marked using region can be a region frequently used by the harmonic separator, and the second region is a region not frequently used, and the scheme adjusts the weight of the brightness value of the frequently used region to be larger, so that the calculation of the brightness value can be realized more accurately, and the final comparison result is more accurate.
Referring to fig. 3, a schematic structural diagram of a control device of a multi-wavelength femtosecond laser according to an embodiment of the present invention is provided, where the control device 30 of the multi-wavelength femtosecond laser includes:
the detection module 31 is configured to obtain, according to the detection device, beam qualities of the transmitted light at the previous time point and the transmitted light at the current time point after passing through the harmonic separator, and obtain, based on the beam qualities and the reference beam quality values, beam quality damage values at the previous time point and the current time point, respectively;
a preliminary duration module 32, configured to process a preset limit damage value, an interval duration between a previous time point and a current time point, and the light beam quality damage value between the previous time point and the current time point according to a duration prediction model, so as to generate a preliminary duration;
the offset module 33 is configured to obtain an actual usage duration and a preset usage duration of the harmonic separator within the interval duration, and process the actual usage duration and the preset usage duration according to a duration offset model to generate a duration offset value;
a result module 34, configured to perform offset processing on the preliminary duration based on the duration offset value, and generate a remaining duration of the harmonic separator;
a control module 35 for controlling the operating duration of the femtosecond laser based on the remaining duration of the harmonic separator.
The apparatus in the embodiment shown in fig. 3 can be correspondingly used to perform the steps in the method embodiment shown in fig. 1, and the implementation principle and technical effect are similar, which are not described herein again.
Referring to fig. 4, it is a schematic diagram of a hardware structure of a control device of a multi-wavelength femtosecond laser according to an embodiment of the present invention, where the control device 40 of the multi-wavelength femtosecond laser includes: a processor 41, memory 42 and computer programs; wherein
A memory 42 for storing the computer program, which may also be a flash memory (flash). The computer program is, for example, an application program, a functional module, or the like that implements the above method.
A processor 41 for executing the computer program stored in the memory to implement the steps performed by the apparatus in the above method. Reference may be made in particular to the description relating to the preceding method embodiment.
Alternatively, the memory 42 may be separate or integrated with the processor 41.
When the memory 42 is a device independent of the processor 41, the apparatus may further include:
a bus 43 for connecting the memory 42 and the processor 41.
The present invention also provides a readable storage medium, in which a computer program is stored, which, when being executed by a processor, is adapted to implement the methods provided by the various embodiments described above.
The readable storage medium may be a computer storage medium or a communication medium. Communication media includes any medium that facilitates transfer of a computer program from one place to another. Computer storage media may be any available media that can be accessed by a general purpose or special purpose computer. For example, a readable storage medium is coupled to the processor such that the processor can read information from, and write information to, the readable storage medium. Of course, the readable storage medium may also be an integral part of the processor. The processor and the readable storage medium may reside in an Application Specific Integrated Circuits (ASIC). Additionally, the ASIC may reside in user equipment. Of course, the processor and the readable storage medium may also reside as discrete components in a communication device. The readable storage medium may be a read-only memory (ROM), a random-access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.
The present invention also provides a program product comprising execution instructions stored in a readable storage medium. The at least one processor of the device may read the execution instructions from the readable storage medium, and the execution of the execution instructions by the at least one processor causes the device to implement the methods provided by the various embodiments described above.
In the above embodiments of the apparatus, it should be understood that the Processor may be a Central Processing Unit (CPU), other general purpose processors, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in connection with the present invention may be embodied directly in a hardware processor, or in a combination of the hardware and software modules within the processor.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and these modifications or substitutions do not depart from the spirit of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A method of controlling a multi-wavelength femtosecond laser, comprising:
respectively acquiring the beam quality of transmitted light passing through a harmonic separator at a previous time point and a current time point according to detection equipment, and respectively acquiring the beam quality damage values at the previous time point and the current time point on the basis of the beam quality and a reference beam quality value;
processing a preset limit damage value, the interval time between a previous time point and a current time point and the light beam quality damage value between the previous time point and the current time point according to a time length prediction model to generate a preliminary time length;
acquiring the actual use time and the preset use time of the harmonic separator in the interval time, and processing the actual use time and the preset use time according to a time offset model to generate a time offset value;
performing offset processing on the preliminary time length based on the time length offset value to generate the residual time length of the harmonic separator;
controlling an operating time of the femtosecond laser based on a remaining time of the harmonic separator.
2. The method of claim 1,
the method specifically comprises the following steps of processing a preset limit damage value, the interval duration, the beam quality damage value between a previous time point and a current time point according to a duration prediction model to generate a preliminary duration:
generating a residual damage amount based on the difference value between the preset limit damage value and the beam quality damage value at the current time point;
generating a damage rate based on the ratio of the difference value between the beam quality damage value of the current time point and the beam quality damage value of the previous time point to the interval duration;
and processing the residual damage amount and the damage rate according to the time length prediction model to generate the preliminary time length.
3. The method of claim 2,
in the step of processing the actual usage duration and the preset usage duration according to the duration offset model to generate the duration offset value, the method specifically includes:
acquiring a preset using time length and an actual using time length in the interval time length, and generating a time length difference value of the preset using time length and the actual using time length;
and generating the time length deviation value according to the time length difference value.
4. The method of claim 3, wherein offsetting the preliminary duration based on the duration offset value to generate the remaining duration of the harmonic separator comprises:
Figure 673855DEST_PATH_IMAGE001
wherein T represents the remaining time period, K1 represents the weight of the damage rate, K2 represents the weight of the preliminary time period, K3 represents the weight of the offset value, T1 represents the previous time point, T2 represents the current time point, S1 represents the beam quality damage value at the previous time point, S2 represents the beam quality damage value at the current time point, G represents the preset limit damage value, and N represents the preset limit damage value in the interval time periodThe length of time of use, R represents the length of time of actual use,
Figure 404045DEST_PATH_IMAGE002
represents a constant, h is a constant related to the loss rate, c represents a non-zero constant,
Figure 387044DEST_PATH_IMAGE003
is a constant greater than 1 and a2 is a constant less than 1.
5. The method of claim 1, further comprising, after obtaining the remaining duration of the harmonic separator:
acquiring the total use duration and the total use times of the harmonic separator, and generating the total use amount according to the total use duration and the total use times;
generating a prediction test frequency according to the residual time length, the total usage amount, the preset limit damage value and the light beam quality damage value of the current time point by a time sequence model;
and generating a plurality of test time points according to the predicted test times and the residual duration, and triggering the detection equipment to work based on the test time points.
6. The method according to claim 5, wherein the step of generating the predicted number of tests for the remaining duration, the total usage amount, the preset limit damage value and the beam quality damage value at the current time point according to the time series model specifically comprises:
acquiring the total usage amount of the harmonic separator based on the total usage duration and the total usage times, and generating an adjustment value according to the total usage amount and a preset usage amount;
adjusting a preset loss interval for indicating a detection interval according to the adjustment value to generate a real-time loss interval;
and generating a prediction test frequency based on the real-time loss interval and the residual damage amount.
7. The method of claim 6, wherein generating a predicted number of tests based on the real-time loss interval and the amount of remaining damage comprises:
Figure 375729DEST_PATH_IMAGE004
wherein the content of the first and second substances,
Figure 501686DEST_PATH_IMAGE005
representing the number of predicted tests, J represents the preset loss interval spaced every test,
Figure 652044DEST_PATH_IMAGE006
represents the adjustment value of J, Y represents the preset usage amount, Z1 represents the total usage time length, Z2 represents the total number of usage times, K5 represents the weight of Z1, K6 represents the weight of Z2,
Figure 122340DEST_PATH_IMAGE007
is a constant number of times, and is,
Figure 399868DEST_PATH_IMAGE008
is a constant less than 1 and b2 is a constant greater than 1.
8. A control apparatus for a multi-wavelength femtosecond laser, comprising:
the detection module is used for respectively acquiring the beam quality of the transmitted light passing through the harmonic separator at the previous time point and the current time point according to the detection equipment, and respectively acquiring the beam quality damage values at the previous time point and the current time point on the basis of the beam quality and the reference beam quality value;
the preliminary duration module is used for processing a preset limit damage value, the interval duration between a previous time point and a current time point and the light beam quality damage value between the previous time point and the current time point according to a duration prediction model to generate preliminary duration;
the offset module is used for acquiring the actual use duration and the preset use duration of the harmonic separator in the interval duration, and processing the actual use duration and the preset use duration according to a duration offset model to generate a duration offset value;
a result module, configured to perform offset processing on the preliminary duration based on the duration offset value, and generate a remaining duration of the harmonic separator;
a control module for controlling an operating duration of the femtosecond laser based on a remaining duration of the harmonic separator.
9. A control apparatus for a multi-wavelength femtosecond laser, comprising: memory, a processor and a computer program, the computer program being stored in the memory, the processor running the computer program to perform the method of any of claims 1 to 7.
10. A readable storage medium, in which a computer program is stored which, when being executed by a processor, is adapted to carry out the method of any one of claims 1 to 7.
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