CN114493193A - Supplier material spot inspection method, supplier material spot inspection system, supplier material spot inspection terminal and storage medium - Google Patents
Supplier material spot inspection method, supplier material spot inspection system, supplier material spot inspection terminal and storage medium Download PDFInfo
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Abstract
The invention provides a supplier goods and materials spot check method, a supplier goods and materials spot check system, a supplier goods and materials spot check terminal and a storage medium, wherein the supplier goods and materials spot check method comprises the following steps: an initial sampling inspection scheme is formulated and distributed to each sampling inspection terminal; acquiring a selective inspection result returned by each selective inspection terminal, and analyzing manufacturer information and attribute information of unqualified samples in the selective inspection result; and formulating a manufacturer weight and an attribute weight according to the manufacturer information and the attribute information of the unqualified sample, and updating the sampling inspection scheme according to the manufacturer weight and the attribute weight. The invention continuously corrects the sampling inspection scheme based on the sampling inspection result, can effectively carry out sampling inspection on various materials, ensures the rationality of the sampling inspection scheme and improves the sampling inspection efficiency and accuracy.
Description
Technical Field
The invention relates to the technical field of material management of power supply equipment, in particular to a method, a system, a terminal and a storage medium for randomly inspecting materials of a supplier.
Background
In the field of power supply, various devices and apparatuses are used in the construction of a power grid, and the power supply devices and apparatuses may be purchased from multiple suppliers or produced by the suppliers. In order to improve the quality of the power grid, the disordered materials must be subjected to uniform quality detection and management.
However, because of the huge amount of materials, only sampling detection can be performed. The number of times of the selective examination limited by the formulated selective examination scheme directly influences the accuracy of the selective examination result. The conventional random inspection method usually stipulates the random inspection times, and the method is too rigid and cannot ensure the random inspection accuracy of the materials.
Disclosure of Invention
In view of the above-mentioned deficiencies of the prior art, the present invention provides a supplier material spot check method, system, terminal and storage medium to solve the above-mentioned technical problems.
In a first aspect, the present invention provides a supplier material spot inspection method, including:
an initial sampling inspection scheme is formulated and distributed to each sampling inspection terminal;
acquiring a selective inspection result returned by each selective inspection terminal, and analyzing manufacturer information and attribute information of unqualified samples in the selective inspection result;
and formulating a manufacturer weight and an attribute weight according to the manufacturer information and the attribute information of the unqualified sample, and updating the sampling inspection scheme according to the manufacturer weight and the attribute weight.
Further, an initial sampling inspection scheme is formulated and distributed to each sampling inspection terminal, and the method comprises the following steps:
setting the random inspection weight of each attribute according to the importance degree of each attribute of the material;
and calculating the random inspection rate of each attribute of each material according to the set initial random inspection rate and the attribute random inspection weight of each material, and writing the random inspection rate of each attribute of each material into a random inspection scheme, wherein each attribute corresponds to a corresponding detection item.
Further, acquiring the spot check result returned by each spot check terminal, and analyzing manufacturer information and attribute information of unqualified samples in the spot check result, wherein the method comprises the following steps:
summarizing the sampling inspection results returned by each sampling inspection terminal;
and extracting manufacturer information and attribute information of unqualified samples from the sampling inspection result by using a keyword retrieval function.
Further, a manufacturer weight and an attribute weight are formulated according to manufacturer information and attribute information of unqualified samples, and a spot check scheme is updated according to the manufacturer weight and the attribute weight, and the method comprises the following steps:
counting the number of abnormal manufacturers of all unqualified samples and the number of times of repeated abnormal attributes;
taking the product of the number of abnormal manufacturers and a set first coefficient as an abnormal manufacturer weight, and taking the product of the abnormal attribute repetition times and a set second coefficient as an abnormal attribute weight;
screening out target materials related to abnormal manufacturers or abnormal attributes, and modifying the sampling rate of the target materials into an initial sampling rate multiplied by the weight of the abnormal manufacturers;
updating the abnormal attribute weight and the spot check weight of the corresponding attribute into an attribute weight, and taking the product of each attribute weight of the target material and the current spot check rate of the target material as each attribute spot check rate of the target material respectively;
and issuing the latest attribute random inspection rate of the materials to the corresponding random inspection terminal according to the random inspection terminal corresponding to each material.
In a second aspect, the present invention provides a supplier material spot check system, including:
the scheme making unit is used for making an initial sampling scheme and distributing the initial sampling scheme to each sampling terminal;
the result analysis unit is used for acquiring the sampling inspection result returned by each sampling inspection terminal and analyzing manufacturer information and attribute information of unqualified samples in the sampling inspection result;
and the scheme updating unit is used for formulating the manufacturer weight and the attribute weight according to the manufacturer information and the attribute information of the unqualified sample and updating the spot check scheme according to the manufacturer weight and the attribute weight.
Further, the scheme making unit includes:
the initial setting module is used for setting the random inspection weight of each attribute according to the importance degree of each attribute of the material;
and the initial calculation module is used for calculating the random inspection rates of various attributes of various materials according to the set initial random inspection rate and the attribute random inspection weight of the materials, and writing the random inspection rates of various materials into a random inspection scheme, wherein each attribute corresponds to a corresponding detection item.
Further, the result analysis unit includes:
the result summarizing module is used for summarizing the sampling inspection results returned by each sampling inspection terminal;
and the information extraction module is used for extracting manufacturer information and attribute information of unqualified samples from the sampling inspection result by utilizing the keyword retrieval function.
Further, the scheme updating unit includes:
the result counting module is used for counting the number of abnormal manufacturers and the number of times of repeated abnormal attributes of all unqualified samples;
the weight generation module is used for taking the product of the number of abnormal manufacturers and a set first coefficient as an abnormal manufacturer weight and taking the product of the repeated times of the abnormal attribute and a set second coefficient as an abnormal attribute weight;
the sampling inspection updating module is used for screening out target materials related to abnormal manufacturers or abnormal attributes, and modifying the sampling inspection rate of the target materials into the initial sampling inspection rate multiplied by the weight of the abnormal manufacturers;
the attribute updating module is used for updating the abnormal attribute weight and the spot check weight of the corresponding attribute into an attribute weight, and taking the product of various attribute weights of the target material and the current spot check rate of the target material as the spot check rate of each attribute of the target material;
and the selective examination distribution module is used for issuing the latest attribute selective examination rate of the materials to the corresponding selective examination terminals according to the selective examination terminals corresponding to the various materials.
In a third aspect, a terminal is provided, including:
a processor, a memory, wherein,
the memory is used for storing a computer program which,
the processor is used for calling and running the computer program from the memory so as to make the terminal execute the method of the terminal.
In a fourth aspect, a computer storage medium is provided having stored therein instructions that, when executed on a computer, cause the computer to perform the method of the above aspects.
The method, the system, the terminal and the storage medium for the selective inspection of the supplier materials have the advantages that the selective inspection scheme is continuously corrected based on the selective inspection result, various materials can be effectively subjected to selective inspection, the rationality of the selective inspection scheme is ensured, and the selective inspection efficiency and accuracy are improved.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
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In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the present invention.
FIG. 2 is a schematic block diagram of a system of one embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention. Wherein, the execution subject in fig. 1 may be a supplier material sampling system.
As shown in fig. 1, the method includes:
and step 130, formulating a manufacturer weight and an attribute weight according to the manufacturer information and the attribute information of the unqualified sample, and updating the sampling inspection scheme according to the manufacturer weight and the attribute weight.
In order to facilitate understanding of the present invention, the method for sampling and inspecting supplier materials provided by the present invention is further described below with reference to the principle of the method for sampling and inspecting supplier materials in the embodiments and the process of sampling and inspecting supplier materials in the embodiments.
Specifically, the supplier material spot inspection method comprises the following steps:
and S1, making an initial sampling scheme, and distributing the initial sampling scheme to each sampling terminal.
Setting the random inspection weight of each attribute according to the importance degree of each attribute of the material; and calculating the random inspection rate of various materials according to the set initial random inspection rate and the attribute random inspection weight of the materials, and writing the random inspection rate of various materials into a random inspection scheme.
For example, the power supplies may be from different vendors and the power supply attribute information such as stability, lifetime, etc. When an initial sampling inspection scheme is formulated, manufacturers are not used as factors influencing the sampling inspection rate, the sampling inspection rate of the materials is formulated only according to attributes, and the more important the attributes are, the higher the sampling inspection rate is. Each attribute corresponds to a detection method, for example, a stability test, that is, a test for power stability by continuously changing load power consumption.
And S2, acquiring the sampling inspection results returned by each sampling inspection terminal, and analyzing the manufacturer information and the attribute information of the unqualified sample in the sampling inspection results.
Summarizing the sampling inspection results returned by each sampling inspection terminal; and extracting manufacturer information and attribute information of unqualified samples from the sampling inspection result by using a keyword retrieval function.
And S3, formulating a manufacturer weight and an attribute weight according to the manufacturer information and the attribute information of the unqualified sample, and updating the sampling inspection scheme according to the manufacturer weight and the attribute weight.
Counting the number of abnormal manufacturers of all unqualified samples and the number of times of repeated abnormal attributes; taking the product of the number of abnormal manufacturers and a set first coefficient as an abnormal manufacturer weight, and taking the product of the repetition times of the abnormal attribute and a set second coefficient as an abnormal attribute weight; screening out target materials related to abnormal manufacturers or abnormal attributes, and modifying the sampling rate of the target materials into an initial sampling rate multiplied by the weight of the abnormal manufacturers; updating the abnormal attribute weight and the spot check weight of the corresponding attribute into an attribute weight, and taking the product of each attribute weight of the target material and the current spot check rate of the target material as each attribute spot check rate of the target material respectively; and issuing the latest attribute random inspection rate of the materials to the corresponding random inspection terminal according to the random inspection terminal corresponding to each material.
Taking the power supply as an example, the unqualified power supplies in the sampling inspection result are 5, wherein two are manufacturers A, three are manufacturers B, 1 is that the stability does not reach the standard, and 4 are that the service life does not reach the standard.
When one power supply is manufacturer C, the sampling rate is still the initially set sampling rate, and only the attribute test quota is needed to be updated. When a power supply is supplied by manufacturer a, the sampling rate of the power supply needs to be adjusted, and the quota of the attribute test is adjusted after the sampling rate is adjusted.
As shown in fig. 2, the system 200 includes:
the plan making unit 210 is configured to make an initial sampling plan and distribute the initial sampling plan to each sampling terminal;
a result analysis unit 220, configured to obtain the spot check result returned by each spot check terminal, and analyze manufacturer information and attribute information of the unqualified sample in the spot check result;
and the scheme updating unit 230 is used for formulating the manufacturer weight and the attribute weight according to the manufacturer information and the attribute information of the unqualified sample, and updating the spot check scheme according to the manufacturer weight and the attribute weight.
Optionally, as an embodiment of the present invention, the scheme creating unit includes:
the initial setting module is used for setting the random inspection weight of each attribute according to the importance degree of each attribute of the material;
and the initial calculation module is used for calculating the random inspection rates of various attributes of various materials according to the set initial random inspection rate and the attribute random inspection weight of the materials, and writing the random inspection rates of various materials into a random inspection scheme, wherein each attribute corresponds to a corresponding detection item.
Optionally, as an embodiment of the present invention, the result analysis unit includes:
the result summarizing module is used for summarizing the sampling inspection results returned by each sampling inspection terminal;
and the information extraction module is used for extracting manufacturer information and attribute information of unqualified samples from the sampling inspection result by utilizing the keyword retrieval function.
Optionally, as an embodiment of the present invention, the scheme updating unit includes:
the result counting module is used for counting the number of abnormal manufacturers and the number of times of repeated abnormal attributes of all unqualified samples;
the weight generation module is used for taking the product of the number of abnormal manufacturers and a set first coefficient as an abnormal manufacturer weight and taking the product of the repeated times of the abnormal attribute and a set second coefficient as an abnormal attribute weight;
the sampling inspection updating module is used for screening out target materials related to abnormal manufacturers or abnormal attributes, and modifying the sampling inspection rate of the target materials into the initial sampling inspection rate multiplied by the weight of the abnormal manufacturers;
the attribute updating module is used for updating the abnormal attribute weight and the spot check weight of the corresponding attribute into an attribute weight, and taking the product of various attribute weights of the target material and the current spot check rate of the target material as the spot check rate of each attribute of the target material;
and the selective examination distribution module is used for issuing the latest attribute selective examination rate of the materials to the corresponding selective examination terminals according to the selective examination terminals corresponding to the various materials.
Fig. 3 is a schematic structural diagram of a terminal 300 according to an embodiment of the present invention, where the terminal 300 may be used to execute the supplier material spot check method according to the embodiment of the present invention.
Among them, the terminal 300 may include: a processor 310, a memory 320, and a communication unit 330. The components communicate via one or more buses, and those skilled in the art will appreciate that the architecture of the servers shown in the figures is not intended to be limiting, and may be a bus architecture, a star architecture, a combination of more or less components than those shown, or a different arrangement of components.
The memory 320 may be used for storing instructions executed by the processor 310, and the memory 320 may be implemented by any type of volatile or non-volatile storage terminal or combination thereof, such as a Static Random Access Memory (SRAM), an electrically erasable programmable read-only memory (EEPROM), an erasable programmable read-only memory (EPROM), a programmable read-only memory (PROM), a read-only memory (ROM), a magnetic memory, a flash memory, a magnetic disk or an optical disk. The executable instructions in memory 320, when executed by processor 310, enable terminal 300 to perform some or all of the steps in the method embodiments described below.
The processor 310 is a control center of the storage terminal, connects various parts of the entire electronic terminal using various interfaces and lines, and performs various functions of the electronic terminal and/or processes data by operating or executing software programs and/or modules stored in the memory 320 and calling data stored in the memory. The processor may be composed of an Integrated Circuit (IC), for example, a single packaged IC, or a plurality of packaged ICs connected with the same or different functions. For example, the processor 310 may include only a Central Processing Unit (CPU). In the embodiment of the present invention, the CPU may be a single operation core, or may include multiple operation cores.
A communication unit 330, configured to establish a communication channel so that the storage terminal can communicate with other terminals. And receiving user data sent by other terminals or sending the user data to other terminals.
The present invention also provides a computer storage medium, wherein the computer storage medium may store a program, and the program may include some or all of the steps in the embodiments provided by the present invention when executed. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM) or a Random Access Memory (RAM).
Therefore, the invention continuously corrects the sampling inspection scheme based on the sampling inspection result, can effectively perform sampling inspection on various materials, ensures the rationality of the sampling inspection scheme, and improves the sampling inspection efficiency and accuracy.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented as software plus a required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be substantially or partially embodied in the form of a software product, the computer software product is stored in a storage medium, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and various media capable of storing program codes include several instructions for enabling a computer terminal (which may be a personal computer, a server, or a second terminal, a network terminal, etc.) to execute all or part of the steps of the method in the embodiments of the present invention.
The same and similar parts in the various embodiments in this specification may be referred to each other. Especially, for the terminal embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant points can be referred to the description in the method embodiment.
In the embodiments provided in the present invention, it should be understood that the disclosed system and method can be implemented in other ways. For example, the above-described system embodiments are merely illustrative, and for example, the division of the units is only one logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, systems or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
Although the present invention has been described in detail by referring to the drawings in connection with the preferred embodiments, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A supplier material spot check method is characterized by comprising the following steps:
an initial sampling inspection scheme is formulated and distributed to each sampling inspection terminal;
acquiring a selective inspection result returned by each selective inspection terminal, and analyzing manufacturer information and attribute information of unqualified samples in the selective inspection result;
and formulating a manufacturer weight and an attribute weight according to the manufacturer information and the attribute information of the unqualified sample, and updating the sampling inspection scheme according to the manufacturer weight and the attribute weight.
2. The method of claim 1, wherein formulating an initial sampling plan and distributing the initial sampling plan to each sampling terminal comprises:
setting the random inspection weight of each attribute according to the importance degree of each attribute of the material;
and calculating the random inspection rates of various attributes of the various materials according to the set initial random inspection rate and the attribute random inspection weight of the materials, and writing the attribute random inspection rates of the various materials into a random inspection scheme, wherein each attribute corresponds to a corresponding detection item.
3. The method of claim 1, wherein the steps of obtaining the spot check result returned by each spot check terminal and analyzing the manufacturer information and the attribute information of the unqualified sample in the spot check result comprise:
summarizing the sampling inspection results returned by each sampling inspection terminal;
and extracting manufacturer information and attribute information of unqualified samples from the sampling inspection result by using a keyword retrieval function.
4. The method of claim 2, wherein the step of formulating a manufacturer weight and an attribute weight according to manufacturer information and attribute information of the unqualified sample and updating the spot check scheme according to the manufacturer weight and the attribute weight comprises:
counting the number of abnormal manufacturers of all unqualified samples and the number of times of repeated abnormal attributes;
taking the product of the number of abnormal manufacturers and a set first coefficient as an abnormal manufacturer weight, and taking the product of the abnormal attribute repetition times and a set second coefficient as an abnormal attribute weight;
screening out target materials related to abnormal manufacturers or abnormal attributes, and modifying the sampling rate of the target materials into an initial sampling rate multiplied by the weight of the abnormal manufacturers;
updating the abnormal attribute weight and the spot check weight of the corresponding attribute into an attribute weight, and taking the product of each attribute weight of the target material and the current spot check rate of the target material as each attribute spot check rate of the target material respectively;
and issuing the latest attribute random inspection rate of the materials to the corresponding random inspection terminal according to the random inspection terminal corresponding to each material.
5. A supplier materials spot check system, comprising:
the scheme making unit is used for making an initial sampling inspection scheme and distributing the initial sampling inspection scheme to each sampling inspection terminal;
the result analysis unit is used for acquiring the sampling inspection result returned by each sampling inspection terminal and analyzing manufacturer information and attribute information of unqualified samples in the sampling inspection result;
and the scheme updating unit is used for formulating the manufacturer weight and the attribute weight according to the manufacturer information and the attribute information of the unqualified sample and updating the spot check scheme according to the manufacturer weight and the attribute weight.
6. The system of claim 5, wherein the solution preparation unit comprises:
the initial setting module is used for setting the random inspection weight of each attribute according to the importance degree of each attribute of the material;
and the initial calculation module is used for calculating the random inspection rates of various attributes of the various materials according to the set initial random inspection rate and the attribute random inspection weight of the materials, and writing the attribute random inspection rates of the various materials into a random inspection scheme, wherein each attribute corresponds to a corresponding detection item.
7. The system of claim 5, wherein the results analysis unit comprises:
the result summarizing module is used for summarizing the sampling inspection results returned by each sampling inspection terminal;
and the information extraction module is used for extracting manufacturer information and attribute information of unqualified samples from the sampling inspection result by utilizing the keyword retrieval function.
8. The system of claim 6, wherein the scheme updating unit comprises:
the result counting module is used for counting the number of abnormal manufacturers and the number of times of repeated abnormal attributes of all unqualified samples;
the weight generation module is used for taking the product of the number of abnormal manufacturers and a set first coefficient as an abnormal manufacturer weight, and taking the product of the repetition times of the abnormal attribute and a set second coefficient as an abnormal attribute weight;
the sampling inspection updating module is used for screening out target materials related to abnormal manufacturers or abnormal attributes, and modifying the sampling inspection rate of the target materials into the initial sampling inspection rate multiplied by the weight of the abnormal manufacturers;
the attribute updating module is used for updating the abnormal attribute weight and the spot check weight of the corresponding attribute into an attribute weight, and taking the product of various attribute weights of the target material and the current spot check rate of the target material as the spot check rate of each attribute of the target material;
and the selective inspection distribution module is used for issuing the latest attribute selective inspection rate of the materials to the corresponding selective inspection terminals according to the selective inspection terminals corresponding to the various materials.
9. A terminal, comprising:
a processor;
a memory for storing instructions for execution by the processor;
wherein the processor is configured to perform the method of any one of claims 1-4.
10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-4.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107133903A (en) * | 2017-05-15 | 2017-09-05 | 深圳市博安达信息技术股份有限公司 | Random inspection system and the key random inspection method of pollution sources surroundings one |
| CN110555596A (en) * | 2019-08-09 | 2019-12-10 | 国网陕西省电力公司电力科学研究院 | sampling inspection strategy making method and system based on power distribution material quality evaluation |
| CN110826855A (en) * | 2019-10-09 | 2020-02-21 | 广州供电局有限公司 | Method and system for testing network access performance of intelligent power distribution room state monitoring sensor |
-
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- 2022-01-07 CN CN202210018560.4A patent/CN114493193A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107133903A (en) * | 2017-05-15 | 2017-09-05 | 深圳市博安达信息技术股份有限公司 | Random inspection system and the key random inspection method of pollution sources surroundings one |
| CN110555596A (en) * | 2019-08-09 | 2019-12-10 | 国网陕西省电力公司电力科学研究院 | sampling inspection strategy making method and system based on power distribution material quality evaluation |
| CN110826855A (en) * | 2019-10-09 | 2020-02-21 | 广州供电局有限公司 | Method and system for testing network access performance of intelligent power distribution room state monitoring sensor |
Non-Patent Citations (2)
| Title |
|---|
| 毛昭勇;宋保维;胡海豹;王鹏;: "基于优化分析的计数抽样检验方法", 兵工学报, no. 04, 15 April 2008 (2008-04-15) * |
| 韩志颖等: "《信息时代企业供应链采购管理的策略研究》", 30 June 2021, 吉林科学技术出版社, pages: 214 * |
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