CN114461480A - Blade server and test system thereof - Google Patents
Blade server and test system thereof Download PDFInfo
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- CN114461480A CN114461480A CN202210073417.5A CN202210073417A CN114461480A CN 114461480 A CN114461480 A CN 114461480A CN 202210073417 A CN202210073417 A CN 202210073417A CN 114461480 A CN114461480 A CN 114461480A
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- 238000010586 diagram Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
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Abstract
The invention discloses a test system of a blade server and the blade server, which realize the test of an interface to be tested of a blade mainboard to be tested by arranging a test backboard and multiplexing the test mainboard in a non-blade mainboard to be tested which forms the blade server, wherein the test backboard is provided with a first interface and a second interface, the blade mainboard to be tested sends data to the first interface through the interface to be tested, the first interface sends the data to the second interface after receiving the data, and the second interface sends the data to the test interface of the blade mainboard to be tested after receiving the data. If the test blade mainboard can receive the data that the blade mainboard that awaits measuring sent, then judge that the interface that awaits measuring of blade mainboard is normal, need not connect other equipment in the testing process, convenient to use.
Description
Technical Field
The present invention relates to the field of servers, and in particular, to a blade server test system and a blade server.
Background
With the rapid development of science and technology, the information amount is rapidly increased, the requirements on the server are higher and higher, the blade server is widely applied as a high-performance server, the blade server is composed of blade mainboards and a working backboard, the blade mainboards are similar to an independent server, and the working backboard supplies power to all the blade mainboards and assists each blade mainboard to communicate. Before the blade mainboard is used, each interface on the blade mainboard needs to be tested, the working back plate in the blade server needs to be reused when each interface on the blade mainboard is tested in the prior art, and other equipment needs to be connected through the working back plate when each data transmission interface on the blade mainboard is tested, so that the use is very inconvenient.
Disclosure of Invention
The invention aims to provide a blade server testing system and a blade server, which do not need to reuse a working back plate in the blade server when testing an interface to be tested on a blade mainboard to be tested, do not need to connect other equipment when testing each data transmission interface on the blade mainboard, and are convenient to use.
In order to solve the technical problem, the invention provides a test system of a blade server, which comprises a test backboard, a blade mainboard to be tested and a test blade mainboard in a non-to-be-tested blade mainboard forming the blade server;
the interface to be tested of the blade mainboard to be tested is connected with the first interface on the test backboard, the test interface of the blade mainboard to be tested is connected with the second interface on the test backboard, and the first interface is connected with the second interface;
the first interface is used for receiving data sent by the blade mainboard to be tested through the interface to be tested and sending the data to the second interface;
the second interface is used for receiving the data sent by the first interface and sending the data to the test blade mainboard through the test interface;
and if the test blade mainboard receives the data sent by the blade mainboard to be tested, judging that the interface to be tested of the blade mainboard to be tested is normal.
Preferably, the interface to be tested and the test interface are both high-speed interconnection interfaces or IPMI management interfaces.
Preferably, when the interface to be tested and the test interface are both the high-speed interconnection interface, the first interface is connected with the second interface through a 40G network transmission line.
Preferably, when both the interface to be tested and the test interface are the IPMI management interface, the first interface and the second interface are connected by an I2C transmission line.
Preferably, the test backboard further comprises a display device, and the test backboard further comprises a display test interface;
the display test interface is respectively connected with the display interface of the blade mainboard to be tested and the display device, so that whether the display interface can work normally is tested through the display device.
Preferably, the test backboard further comprises a fan, and the test backboard further comprises a fan interface;
the fan interface is connected with the fan so as to radiate heat for the test system of the blade server through the fan.
Preferably, the test backplane further comprises a display card or a network card, and the test backplane further comprises a PCIE interface;
the PCIE interface is connected with the display card or the network card so as to test whether the PCIE interface can work normally through the display card or the network card.
Preferably, the test backplane further comprises a serdes interface, a USB interface, a SATA interface, and a GPIO interface.
Preferably, the device further comprises a prompting device for prompting the position of the main board of the blade to be tested.
In order to solve the technical problem, the invention also provides a blade server, which comprises the test system of the blade server.
The invention provides a test system of a blade server and the blade server, which realize the test of an interface to be tested of a blade mainboard to be tested by arranging a test backboard and multiplexing the test mainboard in a non-blade mainboard to be tested which forms the blade server, wherein the test backboard is provided with a first interface and a second interface, the blade mainboard to be tested sends data to the first interface through the interface to be tested, the first interface sends the data to the second interface after receiving the data, and the second interface sends the data to the test interface of the blade mainboard to be tested after receiving the data. And if the test blade mainboard can receive the data sent by the blade mainboard to be tested, judging that the interface to be tested of the blade mainboard to be tested is normal. When testing the interface to be tested on the blade mainboard to be tested, the working backboard in the blade server does not need to be reused, and when testing each data transmission interface on the blade mainboard, other equipment does not need to be connected, so that the use is convenient.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed in the prior art and the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a testing system for a blade server according to the present invention;
fig. 2 is a schematic structural diagram of a test backplane in a test system of a blade server according to the present invention.
Detailed Description
The core of the invention is to provide a blade server and a test system thereof, which do not need to reuse a working backboard in the blade server when testing the interface to be tested on the blade mainboard to be tested, do not need to connect other equipment when testing each data transmission interface on the blade mainboard, and are convenient to use.
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system of a blade server provided in the present invention, where the test system includes a test backplane 100, a blade motherboard 200 to be tested, and a test blade motherboard 300 in a non-blade motherboard to be tested that constitutes the blade server;
the interface to be tested of the blade mainboard 200 to be tested is connected with the first interface 110 on the test backboard 100, the test interface of the test blade mainboard 300 is connected with the second interface 120 on the test backboard 100, and the first interface 110 is connected with the second interface 120;
the first interface 110 is configured to receive data sent by the to-be-tested blade motherboard 200 through the to-be-tested interface and send the data to the second interface 120;
the second interface 120 is configured to receive data sent by the first interface 110, and send the data to the test blade motherboard 300 through the test interface;
if the test blade motherboard 300 receives the data sent by the blade motherboard 200 to be tested, it is determined that the interface to be tested of the blade motherboard 300 to be tested is normal.
The invention provides a test system of a blade server, which aims to solve the problems that a backboard in the blade server needs to be reused when a mainboard to be tested is tested and other equipment needs to be connected when a data transmission interface of the mainboard to be tested is tested in the prior art.
When testing the interface to be tested on the blade mainboard 200 to be tested, whether the interface to be tested can normally transmit or receive data sent or received by the blade mainboard 200 to be tested is mainly tested, the blade mainboard 200 to be tested and the blade mainboard 300 to be tested are connected together through the test backboard 100, and whether the interface to be tested of the blade mainboard 200 to be tested can normally work is detected by judging whether the blade mainboard 300 to be tested can receive the data sent by the blade mainboard 200 to be tested. Specifically, the test backplane 100 is provided with a first interface 110 and a second interface 120 that are connected to each other, the first interface 110 is connected to an interface to be tested of the blade motherboard 200 to be tested, the first interface 110 sends data sent by the blade motherboard 200 to be tested through the interface to be tested to the second interface 120, the second interface 120 is connected to a test interface of the blade motherboard 300 to be tested, the second interface 120 sends the data to the test interface of the blade motherboard 300 to be tested after receiving the data sent by the first interface 110, and if the blade motherboard 300 to be tested can receive the data sent by the blade motherboard 200 to be tested, it is determined that the interface to be tested of the blade motherboard 200 to be tested can work normally. The test mainboard in the non-to-be-tested blade mainboard forming the blade server is utilized to replace other equipment connected with the working backboard in the prior art, the test backboard 100 provided with the first interface 110 and the second interface 120 is additionally arranged, the test of the to-be-tested interface of the to-be-tested blade mainboard 200 can be realized through the operation, and the use is convenient.
In addition, the blade server may include various types of blade motherboards, such as a computing motherboard, a storage motherboard, a management motherboard, a network switch board, and the like.
In summary, the present invention provides a blade server test system, which implements a test on an interface to be tested of a blade motherboard 200 to be tested by setting a test backplane 100 and multiplexing test motherboards in non-to-be-tested blade motherboards constituting a blade server, where the test backplane 100 has a first interface 110 and a second interface 120, the blade motherboard 200 to be tested sends data to the first interface 110 through the interface to be tested, the first interface 110 sends the data to the second interface 120 after receiving the data, and the second interface 120 sends the data to a test interface of the blade motherboard 300 after receiving the data. If the test blade mainboard 300 can receive the data sent by the blade mainboard 200 to be tested, the interface to be tested of the blade mainboard 200 to be tested is judged to be normal, and other equipment does not need to be connected in the detection process, so that the use is convenient.
On the basis of the above-described embodiment:
as a preferred embodiment, the interface to be tested and the test interface are both high-speed interconnect interfaces or IPMI management interfaces.
In this embodiment, the interface to be tested and the test interface may be both high-speed interconnect interfaces, the first interface and the second interface are also high-speed interconnect interfaces, the high-speed interconnect interfaces have a high data transmission speed, and can be used for communication and data transmission between the blade motherboards, and whether the high-speed interconnect interfaces of the blade motherboard 200 to be tested can work normally is determined by detecting whether the test blade motherboard 300 can receive data sent by the blade motherboard 200 to be tested through the high-speed interconnect interfaces.
The Interface to be tested and the test Interface may be both IPMI Management interfaces (intelligent Platform Management interfaces), the first Interface and the second Interface are also IPMI Management interfaces, the operation status of the blade motherboard can be monitored, controlled and reported across different operating systems, firmware and hardware platforms through the IPMI Management interfaces, and essentially, the IPMI Management interfaces also need to realize the function of data transmission.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a test backplane in a test system of another blade server provided in the present invention. The interfaces on the left side of the dotted line are all first interfaces on the test backboard, the interfaces on the right side of the dotted line are all second interfaces on the test backboard, and the first interfaces and the second interfaces are symmetrically arranged on the test backboard. The test backplane comprises a high-speed interconnection interface 121, an IPMI management interface 122, a servers interface 123, a USB interface 124, a SATA interface 125 and a GPIO interface 126.
The high-speed interconnection interface 121 and the IPMI management interface 122 are both data transmission type interfaces, and the test system based on the blade server provided by the invention can realize the test of the high-speed interconnection interface 121 and the IPMI management interface 122, and the test method is simple.
In addition, an ATX standard power supply connection interface can be further arranged on the test backboard, and power supplies with different powers can be connected through the ATX standard power supply connection interface according to actual conditions to be used by the test backboard.
As a preferred embodiment, when the interface to be tested and the test interface are both high-speed interconnect interfaces, the first interface 110 and the second interface 120 are connected by a 40G network transmission line.
In this implementation, when the interface to be tested and the test interface are both high-speed interconnect interfaces, the first interface 110 and the second interface 120 on the test backplane 100 may be connected by a 40G network transmission line, the transmission speed of the 40G network transmission line is faster to meet the requirement of the high-speed interconnect interface for transmitting data, and the blade motherboard 200 to be tested sends data to the test blade motherboard 300 by the 40G network transmission line, so as to test the high-speed interconnect interface of the blade motherboard 200 to be tested.
In a preferred embodiment, when the interface to be tested and the test interface are both IPMI management interfaces, the first interface 110 and the second interface 120 are connected via an I2C transmission line.
When the prior art tests the IPMI management interface of the blade motherboard 200 to be tested, the working backplane is required to be connected with the management motherboard, and the management motherboard acquires the state information of the blade motherboard 200 to be tested, so that the use is inconvenient.
In this embodiment, when the interface to be tested and the test interface are both IPMI management interfaces, the first interface 110 and the second interface 120 on the test backplane 100 are connected by an I2C transmission line, the I2C transmission line connects the blade motherboard 200 to be tested and the test blade motherboard 300, the test blade motherboard 300 serves as a host, the blade motherboard 200 to be tested serves as a slave, the test blade motherboard 300 can obtain status information of the blade motherboard 200 to be tested, and the non-test blade motherboard that constitutes the blade server is reused to replace a management motherboard in the prior art, so as to detect whether the IPMI management interface can normally operate, which is convenient to use and does not need to connect external equipment.
As a preferred embodiment, the test backplane 100 further includes a display device, and a display test interface;
the display test interface is respectively connected with the display interface of the blade mainboard 200 to be tested and the display device, so that whether the display interface can work normally is tested through the display device.
In this embodiment, can also test the demonstration interface of the blade mainboard 200 that awaits measuring through test backplate 100, and is concrete, be provided with on the test backplate 100 and show the test interface, still include display device among the blade server's the test system, show that the test interface couples together the demonstration interface of the blade mainboard 200 that awaits measuring with display device, whether can show through display device that the information detection that shows on the blade mainboard 200 that awaits measuring shows that whether the interface can normally work. Referring to fig. 2, fig. 2 is a schematic structural diagram of a test backplane in another blade server test system according to the present invention, wherein the test backplane is provided with a display interface 129.
In addition, the display Interface may be a DVI (Digital Visual Interface) Interface and/or a VGA (Video Graphics Array) Interface, which is not particularly limited in this application.
As a preferred embodiment, a fan is further included, and the test backplane 100 further includes a fan interface 127;
the fan interface 127 is connected to a fan to dissipate heat for the blade server test system via the fan.
In this embodiment, the test system of the blade server further includes a fan, and the test backplane 100 is provided with a fan interface 127, so that the fan dissipates heat to the test system of the blade server.
In addition, the test backplane 100 is reasonably arranged, and each tall device is plugged into the air path of the fan, so that the heat dissipation performance of the test system of the blade server can be further improved, please refer to fig. 2, where fig. 2 is a schematic structural diagram of the test backplane in another test system of the blade server provided by the present invention, and it can be seen that the arrangement of each interface is favorable for the heat dissipation of the test system of the blade server.
As a preferred embodiment, the test backplane 100 further includes a display card or a network card, and the PCIE interface 128;
the PCIE interface 128 is connected to the display card or the network card, so as to test whether the PCIE interface 128 can normally operate through the display card or the network card.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a test backplane in a test system of another blade server provided in the present invention.
In this embodiment, the test system of the blade server further includes a display card or a network card, the test backplane 100 is provided with a PCIE interface 128, the display card or the network card can be inserted into the PCIE interface 128, the display card can control correct display of the display, the network card enables the blade motherboard to communicate with a blade motherboard network formed by a plurality of blade motherboards, and the purpose of testing that the PCIE interface 128 on the blade motherboard 200 to be tested can normally work can be achieved through the display card or the network card.
In a preferred embodiment, the test backplane further comprises a serdes interface 123 and/or a USB interface 124 and/or a SATA interface 125 and/or a GPIO interface 126.
In this embodiment, the blade motherboard 200 to be tested communicates with the test backplane 100 through the serdes interface 123, so that the serdes interface of the blade motherboard 200 to be tested can be tested; the blade mainboard 200 to be tested communicates with the test backboard 100 through the USB124 interface, so that the USB interface of the blade mainboard 200 to be tested can be tested; the blade mainboard 200 to be tested communicates with the test backboard 100 through the SATA interface 125, so that the SATA interface of the blade mainboard 200 to be tested can be tested; the blade mainboard 200 to be tested communicates with the test backboard 100 through the GPIO interface 126, so that the GPIO interface of the blade mainboard 200 to be tested can be tested.
In addition, a PHY (Physical Layer) chip, a gigabit optical interface, and a gigabit electrical interface may be further disposed on the test backplane 100100 to implement a test on the servers interface of the blade motherboard 200 to be tested.
In addition, the test backplane 100 may include a combination of one or more of the serdes interface 123, the USB interface 124, the SATA interface 125, and the GPIO interface 126, which is not particularly limited in this application.
As a preferred embodiment, the test device further includes a prompting device for prompting the position of the blade main board 200 to be tested.
In this embodiment, considering that the blade server includes a plurality of blade motherboards, in order to make the operation and maintenance personnel judge the position of the current blade motherboard 200 to be tested more clearly and intuitively, the invention provides a prompting device, which can prompt the position of the blade motherboard 200 to be tested, which is performing the interface test, in the blade server.
In addition, the prompting device can also generate a judgment result of the to-be-detected interface of the to-be-detected blade mainboard 200, and the operation and maintenance personnel can more intuitively judge whether the to-be-detected interface of the current to-be-detected blade mainboard 200 can normally work based on the judgment result generated by the prompting device. For example, the prompting device is an indicator light, and when the determination result of the to-be-tested interface of the to-be-tested blade main board 200 is that the to-be-tested interface is abnormal, the indicator light flickers, and the prompting effect is clear and intuitive.
The invention also provides a blade server, which comprises the test system of the blade server.
For the related introduction of the blade server provided by the present invention, please refer to the above embodiments, which are not described herein.
It is to be noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A test system of a blade server is characterized by comprising a test backboard, a blade mainboard to be tested and a test blade mainboard in a non-blade mainboard to be tested, wherein the test blade mainboard comprises the blade server;
the interface to be tested of the blade mainboard to be tested is connected with the first interface on the test backboard, the test interface of the blade mainboard to be tested is connected with the second interface on the test backboard, and the first interface is connected with the second interface;
the first interface is used for receiving data sent by the blade mainboard to be tested through the interface to be tested and sending the data to the second interface;
the second interface is used for receiving the data sent by the first interface and sending the data to the test blade mainboard through the test interface;
and if the test blade mainboard receives the data sent by the blade mainboard to be tested, judging that the interface to be tested of the blade mainboard to be tested is normal.
2. The system of claim 1, wherein the interface under test and the test interface are each a high speed interconnect interface or an IPMI management interface.
3. The system of claim 2, wherein the first interface is connected to the second interface via a 40G network transmission line when the interface under test and the test interface are both the high speed interconnect interface.
4. The system of claim 2, wherein the first interface and the second interface are connected via an I2C transmission line when the to-be-tested interface and the test interface are both the IPMI management interface.
5. The system of claim 1, further comprising a display device, wherein the test backplane further comprises a display test interface;
the display test interface is respectively connected with the display interface of the blade mainboard to be tested and the display device, so that whether the display interface can normally work is tested through the display device.
6. The test system for a blade server of claim 1, further comprising a fan, the test backplane further comprising a fan interface;
the fan interface is connected with the fan so as to radiate heat for the test system of the blade server through the fan.
7. The system of claim 1, further comprising a video card or a network card, wherein the test backplane further comprises a PCIE interface;
the PCIE interface is connected with the display card or the network card so as to test whether the PCIE interface can work normally through the display card or the network card.
8. The system for testing a blade server of claim 1, wherein the test backplane further comprises a servers interface and/or a USB interface and/or a SATA interface and/or a GPIO interface.
9. The system for testing a blade server as claimed in any one of claims 1 to 8, further comprising a prompting device for prompting a position of the blade motherboard to be tested.
10. A blade server, characterized in that it comprises a test system of a blade server according to any of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210073417.5A CN114461480A (en) | 2022-01-21 | 2022-01-21 | Blade server and test system thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210073417.5A CN114461480A (en) | 2022-01-21 | 2022-01-21 | Blade server and test system thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114461480A true CN114461480A (en) | 2022-05-10 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210073417.5A Withdrawn CN114461480A (en) | 2022-01-21 | 2022-01-21 | Blade server and test system thereof |
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|---|---|
| CN (1) | CN114461480A (en) |
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2022
- 2022-01-21 CN CN202210073417.5A patent/CN114461480A/en not_active Withdrawn
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Application publication date: 20220510 |