CN114441592A - Device and method for simulation test of performance of heat-conducting silicone grease in storage device - Google Patents

Device and method for simulation test of performance of heat-conducting silicone grease in storage device Download PDF

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CN114441592A
CN114441592A CN202210109149.8A CN202210109149A CN114441592A CN 114441592 A CN114441592 A CN 114441592A CN 202210109149 A CN202210109149 A CN 202210109149A CN 114441592 A CN114441592 A CN 114441592A
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temperature
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苏程
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IEIT Systems Co Ltd
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Inspur Electronic Information Industry Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/20Investigating or analyzing materials by the use of thermal means by investigating the development of heat, i.e. calorimetry, e.g. by measuring specific heat, by measuring thermal conductivity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N13/00Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N13/00Investigating surface or boundary effects, e.g. wetting power; Investigating diffusion effects; Analysing materials by determining surface, boundary, or diffusion effects
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Abstract

The application discloses a device and a method for simulation test of performance of heat-conducting silicone grease in storage equipment, comprising the following steps: the chip simulation board and the shell simulation board are arranged oppositely and used for containing heat-conducting silicone grease, and a chip simulation piece used for simulating a chip in the storage device is arranged on the inner surface of the chip simulation board; the temperature regulating components are respectively arranged on the outer surfaces of the chip simulation board and the shell simulation board and are used for regulating the temperature of the chip simulation piece and the shell simulation board; the temperature sensors are arranged in the chip simulation board and the shell simulation board and are used for measuring the temperature of the chip simulation piece and the shell simulation board; the heat dissipation part is arranged on the outer side of the shell simulation plate and used for dissipating heat of the shell simulation plate; and the graduated scale is arranged on the inner surface of the shell simulation plate and is used for measuring the diffusion distance of the silicone oil in the heat-conducting silicone grease on the shell simulation plate. The device in this application can measure out the diffusion distance of silicon oil on the casing analog board in the heat conduction silicone grease, realizes the simulation detection of heat conduction silicone grease oil leak diffusion on storage device.

Description

一种用于模拟测试存储设备中导热硅脂性能的设备和方法A device and method for simulating and testing the performance of thermally conductive silicone grease in storage devices

技术领域technical field

本申请涉及存储设备散热领域,特别是涉及一种用于模拟测试存储设备中导热硅脂性能的设备和方法。The present application relates to the field of heat dissipation of storage devices, and in particular, to a device and method for simulating and testing the performance of thermally conductive silicone grease in storage devices.

背景技术Background technique

存储设备在传输存储的数据时会产生大量的功耗,例如固态硬盘(Solid StateDrive,SSD)在数据高速传输中瞬时电流能达到18A,芯片所产生的温度能够达到80℃,需要导热硅脂及时传导热量至SSD壳体表面,通过服务器外置风冷装置对SSD进行散热。不同的导热硅脂导热系数不同,且硅油含量不同,硅油含量较高的导热硅脂,会在SSD壳体内表面产生油脂扩散,由于壳体对硅油的毛吸现象,在一定高温环境及足够时间下,硅油甚至会扩散出壳体内表面,使SSD壳体外表面产生油渍,污染标签,影响客户使用感和存储设备质量。因此,对存储设备选用合适的导热硅脂非常重要,但是目前缺少对导热硅脂中的硅油在存储设备壳体上扩散的测试研究。The storage device will generate a lot of power consumption when transferring stored data. For example, the solid state drive (SSD) can achieve an instantaneous current of 18A during high-speed data transmission, and the temperature generated by the chip can reach 80°C. Thermal grease is required in time. The heat is conducted to the surface of the SSD casing, and the SSD is dissipated through the external air cooling device of the server. Different thermal conductive silicone grease has different thermal conductivity and different silicone oil content. Thermal grease with higher silicone oil content will cause grease diffusion on the inner surface of the SSD casing. Under high pressure, the silicone oil will even diffuse out of the inner surface of the casing, causing oil stains on the outer surface of the SSD casing, contaminating the label, and affecting the customer's sense of use and the quality of the storage device. Therefore, it is very important to select a suitable thermal grease for the storage device, but there is currently a lack of testing and research on the diffusion of the silicone oil in the thermal grease on the housing of the storage device.

所以,如何解决上述技术问题应是本领域技术人员重点关注的。Therefore, how to solve the above technical problems should be the focus of those skilled in the art.

发明内容SUMMARY OF THE INVENTION

本申请的目的是提供一种用于模拟测试存储设备中导热硅脂性能的设备和方法,以实现导热硅脂的硅油在存储设备壳体上的扩散检测。The purpose of the present application is to provide a device and method for simulating and testing the performance of thermally conductive silicone grease in a storage device, so as to realize the diffusion detection of the silicone oil of the thermally conductive silicone grease on the housing of the storage device.

为解决上述技术问题,本申请提供一种用于模拟测试存储设备中导热硅脂性能的设备,包括:In order to solve the above-mentioned technical problems, the present application provides a device for simulating and testing the performance of thermally conductive silicone grease in a storage device, including:

相对设置的芯片模拟板和壳体模拟板,用于容纳导热硅脂,所述芯片模拟板的内表面设有用于模拟存储设备中芯片的芯片模拟件;The oppositely arranged chip simulation board and the shell simulation board are used for accommodating thermally conductive silicone grease, and the inner surface of the chip simulation board is provided with a chip simulation piece for simulating the chip in the storage device;

分别设于所述芯片模拟板和所述壳体模拟板外表面的调温部件,用于调节所述芯片模拟件和所述壳体模拟板的温度;temperature adjustment components respectively arranged on the outer surfaces of the chip simulation board and the shell simulation board, for adjusting the temperature of the chip simulation piece and the shell simulation board;

设于所述芯片模拟板和所述壳体模拟板内的温度传感器,用于测量所述芯片模拟件和所述壳体模拟板的温度;temperature sensors arranged in the chip simulation board and the casing simulation board, for measuring the temperature of the chip simulation piece and the casing simulation board;

设于所述壳体模拟板外侧的散热部件,用于对所述壳体模拟板散热;a heat dissipation component arranged on the outer side of the casing simulation board, used for radiating heat to the casing simulation board;

设于所述壳体模拟板内表面的刻度尺,用于测量所述导热硅脂中的硅油在所述壳体模拟板上的扩散距离。A scale set on the inner surface of the casing simulation board is used to measure the diffusion distance of the silicone oil in the thermal conductive silicone grease on the casing simulation board.

可选的,还包括:Optionally, also include:

与所述调温部件连接的控制台,用于控制设于所述芯片模拟板外表面的所述调温部件升温,并根据所述芯片模拟件和所述壳体模拟板的温度确定所述导热硅脂的导热系数。The console connected with the temperature regulation component is used to control the temperature of the temperature regulation component disposed on the outer surface of the chip simulation board, and determine the temperature of the temperature regulation component according to the temperature of the chip simulation piece and the shell simulation board Thermal conductivity of thermal grease.

可选的,所述控制台还用于根据所述扩散距离和所述导热系数,确定所述导热硅脂对于所述存储设备的综合性能评分以及生成测试报告。Optionally, the console is further configured to determine a comprehensive performance score of the thermally conductive silicone grease for the storage device and generate a test report according to the diffusion distance and the thermal conductivity.

可选的,所述控制台还包括:Optionally, the console further includes:

显示器,用于显示所述芯片模拟件和所述壳体模拟板的温度,以及所述导热系数。a display for displaying the temperature of the chip simulation part and the casing simulation board, and the thermal conductivity.

可选的,还包括:Optionally, also include:

带有刻度的轨道,用于调节所述芯片模拟板和所述壳体模拟板的间距,所述芯片模拟板和所述壳体模拟板设于所述轨道中。A track with a scale is used to adjust the distance between the chip simulation board and the housing simulation board, and the chip simulation board and the housing simulation board are arranged in the track.

本申请还提供一种用于模拟测试存储设备中导热硅脂性能的方法,包括:The present application also provides a method for simulating and testing the performance of thermally conductive silicone grease in a storage device, comprising:

当导热硅脂夹设于所述芯片模拟板和所述壳体模拟板,控制所述芯片模拟板中芯片模拟件和所述壳体模拟板同时升温至第一预设最高温度并维持第一预设时间,以使所述导热硅脂中的硅油扩散;When the thermal grease is sandwiched between the chip simulation board and the shell simulation board, the chip simulation part and the shell simulation board in the chip simulation board are controlled to heat up to the first preset maximum temperature at the same time and maintain the first temperature. a preset time to diffuse the silicone oil in the thermally conductive silicone grease;

控制所述芯片模拟件升温至芯片工作温度并维持第二预设时间,并控制散热部件对所述壳体模拟板散热;Controlling the temperature of the chip simulation part to the chip working temperature and maintaining it for a second preset time, and controlling the heat dissipation component to dissipate heat to the casing simulation board;

利用刻度尺测量所述导热硅脂中的硅油在所述壳体模拟板上的扩散距离。Use a scale to measure the diffusion distance of the silicone oil in the thermal conductive silicone grease on the housing simulation board.

可选的,还包括:Optionally, also include:

控制所述芯片模拟件由环境温度逐渐升温至第二预设最高温度,并在所述芯片模拟件处于预设温度节点时,获取所述壳体模拟板对应的温度;controlling the chip simulation piece to gradually increase from the ambient temperature to a second preset maximum temperature, and acquiring the temperature corresponding to the casing simulation board when the chip simulation piece is at a preset temperature node;

确定所述预设温度节点与对应的所述温度的差值;determining the difference between the preset temperature node and the corresponding temperature;

根据所述差值和所述预设温度节点的数量确定所述导热硅脂的导热系数。The thermal conductivity of the thermally conductive silicone grease is determined according to the difference and the number of the preset temperature nodes.

可选的,所述根据所述差值和所述预设温度节点的数量确定所述导热硅脂的导热系数包括:Optionally, the determining the thermal conductivity of the thermally conductive silicone grease according to the difference and the number of the preset temperature nodes includes:

根据第一预设公式确定所述导热系数,所述第一预设公式为:The thermal conductivity is determined according to a first preset formula, and the first preset formula is:

M=(△T1+△T2+△T3+...+△Tn)/nM=(△T1+△T2+△T3+...+△Tn)/n

其中,M为导热系数,n为预设温度节点的数量,△Ti为第i个预设温度节点与壳体模拟板对应的温度的差值,1≤i≤n。Among them, M is the thermal conductivity, n is the number of preset temperature nodes, ΔTi is the difference between the temperature corresponding to the i-th preset temperature node and the shell simulation board, 1≤i≤n.

可选的,还包括:Optionally, also include:

根据所述扩散距离和所述导热系数,确定所述导热硅脂对于所述存储设备的综合性能评分以及生成测试报告。According to the diffusion distance and the thermal conductivity, a comprehensive performance score of the thermally conductive silicone grease for the storage device is determined and a test report is generated.

可选的,所述根据所述扩散距离和所述导热系数,确定所述导热硅脂对于所述存储设备的综合性能评分包括:Optionally, determining the comprehensive performance score of the thermally conductive silicone grease for the storage device according to the diffusion distance and the thermal conductivity includes:

根据第二预设公式确定所述综合性能评分,所述第二预设公式为:The comprehensive performance score is determined according to a second preset formula, and the second preset formula is:

Figure BDA0003494505570000031
Figure BDA0003494505570000031

其中,Ta为环境温度,M为导热系数,S为扩散距离,N为芯片模拟件的宽度。Among them, Ta is the ambient temperature, M is the thermal conductivity, S is the diffusion distance, and N is the width of the chip analog.

本申请所提供的一种用于模拟测试存储设备中导热硅脂性能的设备,包括:相对设置的芯片模拟板和壳体模拟板,用于容纳导热硅脂,所述芯片模拟板的内表面设有用于模拟存储设备中芯片的芯片模拟件;分别设于所述芯片模拟板和所述壳体模拟板外表面的调温部件,用于调节所述芯片模拟件和所述壳体模拟板的温度;设于所述芯片模拟板和所述壳体模拟板内的温度传感器,用于测量所述芯片模拟件和所述壳体模拟板的温度;设于所述壳体模拟板外侧的散热部件,用于对所述壳体模拟板散热;设于所述壳体模拟板内表面的刻度尺,用于测量所述导热硅脂中的硅油在所述壳体模拟板上的扩散距离。A device for simulating and testing the performance of thermally conductive silicone grease in a storage device provided by the present application includes: a chip simulation board and a housing simulation board that are arranged opposite to each other for accommodating the thermally conductive silicone grease, and the inner surface of the chip simulation board is A chip simulation piece for simulating a chip in a storage device is provided; temperature adjustment components respectively arranged on the outer surfaces of the chip simulation board and the casing simulation board are used to adjust the chip simulation piece and the casing simulation board temperature; temperature sensors arranged in the chip simulation board and the shell simulation board are used to measure the temperature of the chip simulation piece and the shell simulation board; A heat-dissipating component is used to dissipate heat to the casing simulation board; a scale arranged on the inner surface of the casing simulation board is used to measure the diffusion distance of the silicone oil in the thermal conductive silicone grease on the casing simulation board .

可见,本申请中的设备中设有模拟存储设备壳体的壳体模拟板以及模拟存储设备中芯片的芯片模拟板,将导热硅脂夹在壳体模拟板和芯片模拟板之间,即模拟出导热硅脂在存储设备中的状态,调温部件调节芯片模拟件和壳体模拟板的温度,可以加速导热硅脂中硅油的扩散,且调温部件和散热部件可以模拟存储设备中芯片和壳体模拟板的工作环境,硅油在壳体模拟板上发生扩散后,通过刻度尺即可测量出硅油的扩散距离,实现导热硅脂在存储设备上漏油扩散的模拟检测,进而为存储设备选出合适的导热硅脂。It can be seen that the device in this application is provided with a shell simulation board for simulating the housing of the storage device and a chip simulation board for simulating the chip in the storage device, and the thermal grease is sandwiched between the shell simulation board and the chip simulation board, that is, the simulation The state of the thermal grease in the storage device is obtained, and the temperature adjustment component adjusts the temperature of the chip simulation part and the shell simulation board, which can accelerate the diffusion of the silicone oil in the thermal grease, and the temperature adjustment component and the heat dissipation component can simulate the chip and the heat dissipation component in the storage device. In the working environment of the shell simulation board, after the silicone oil spreads on the shell simulation board, the diffusion distance of the silicone oil can be measured through the scale, so as to realize the simulation detection of the oil leakage and diffusion of the thermal conductive silicone grease on the storage device, and then for the storage device Choose a suitable thermal grease.

此外,本申请还提供一种具有上述优点的方法。In addition, the present application also provides a method with the above-mentioned advantages.

附图说明Description of drawings

为了更清楚的说明本申请实施例或现有技术的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单的介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to illustrate the technical solutions of the embodiments of the present application or the prior art more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only For some embodiments of the present application, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.

图1为本申请实施例所提供的一种用于模拟测试存储设备中导热硅脂性能的设备的结构示意图;1 is a schematic structural diagram of a device for simulating and testing the performance of thermally conductive silicone grease in a storage device according to an embodiment of the present application;

图2为本申请实施例所提供的一种用于模拟测试存储设备中导热硅脂中硅油的扩散距离的流程图;2 is a flow chart for simulating the diffusion distance of silicone oil in thermally conductive silicone grease in a test storage device provided by an embodiment of the present application;

图3为本申请实施例所提供的一种用于模拟测试存储设备中导热硅脂的导热系数的流程图。FIG. 3 is a flowchart for simulating and testing the thermal conductivity of thermally conductive silicone grease in a storage device according to an embodiment of the present application.

具体实施方式Detailed ways

为了使本技术领域的人员更好地理解本申请方案,下面结合附图和具体实施方式对本申请作进一步的详细说明。显然,所描述的实施例仅仅是本申请一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。In order to make those skilled in the art better understand the solution of the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

在下面的描述中阐述了很多具体细节以便于充分理解本发明,但是本发明还可以采用其他不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本发明内涵的情况下做类似推广,因此本发明不受下面公开的具体实施例的限制。In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention can also be implemented in other ways different from those described herein, and those skilled in the art can do so without departing from the connotation of the present invention. Similar promotion, therefore, the present invention is not limited by the specific embodiments disclosed below.

正如背景技术部分所述,不同的导热硅脂硅油含量不同,导热硅脂可以将存储设备的芯片产生的热量传导至可以表面进行散热,同时导热硅脂中的硅油会在存储设备的壳体上发生扩散,严重时扩散至壳体外面表,影响存储设备的质量。As mentioned in the background section, different thermal greases have different silicone oil contents. Thermal grease can conduct heat generated by the chips of the storage device to the surface for heat dissipation. At the same time, the silicone oil in the thermal grease will be on the housing of the storage device. Diffusion occurs, and in severe cases, it spreads to the outer surface of the casing, affecting the quality of the storage device.

有鉴于此,本申请提供了一种用于模拟测试存储设备中导热硅脂性能的设备,请参考图1,包括:In view of this, the present application provides a device for simulating and testing the performance of thermal grease in storage devices, please refer to Figure 1, including:

相对设置的芯片模拟板1和壳体模拟板2,用于容纳导热硅脂,所述芯片模拟板1的内表面设有用于模拟存储设备中芯片的芯片模拟件;The oppositely arranged chip simulation board 1 and the housing simulation board 2 are used for accommodating thermally conductive silicone grease, and the inner surface of the chip simulation board 1 is provided with a chip simulation piece for simulating a chip in a storage device;

分别设于所述芯片模拟板1和所述壳体模拟板2外表面的调温部件3,用于调节所述芯片模拟件和所述壳体模拟板2的温度;The temperature regulating components 3 respectively arranged on the outer surfaces of the chip simulation board 1 and the housing simulation board 2 are used to adjust the temperature of the chip simulation piece and the housing simulation board 2;

设于所述芯片模拟板1和所述壳体模拟板2内的温度传感器,用于测量所述芯片模拟件和所述壳体模拟板2的温度;The temperature sensors arranged in the chip simulation board 1 and the housing simulation board 2 are used to measure the temperature of the chip simulation piece and the housing simulation board 2;

设于所述壳体模拟板2外侧的散热部件,用于对所述壳体模拟板2散热;The heat dissipation component arranged on the outer side of the housing simulation board 2 is used to dissipate heat to the housing simulation board 2;

设于所述壳体模拟板2内表面的刻度尺,用于测量所述导热硅脂中的硅油在所述壳体模拟板2上的扩散距离。The scale provided on the inner surface of the casing simulation plate 2 is used to measure the diffusion distance of the silicone oil in the thermal conductive silicone grease on the casing simulation plate 2 .

壳体模拟板2的材质、内部凹槽、花纹大小等结构完全模拟存储设备的壳体,保证壳体模拟板2与真实存储设备壳体内部环境一致。The material, internal groove, pattern size and other structures of the shell simulation board 2 completely simulate the shell of the storage device, ensuring that the shell simulation board 2 is consistent with the internal environment of the real storage device shell.

芯片模拟板1的材质根据存储设备中芯片材质相同,芯片模拟件与芯片的材料、大小、数量和排布方式一致。导热硅脂具体设置在芯片模拟件与壳体模拟板2之间。The material of the chip simulation board 1 is the same according to the material of the chip in the storage device, and the material, size, quantity and arrangement of the chip simulation piece and the chip are the same. The thermally conductive silicone grease is specifically arranged between the chip simulation part and the casing simulation board 2 .

芯片模拟板1内温度传感器的数量与芯片模拟件的数量相同,且安装位置在芯片模拟件中,壳体模拟板2内温度传感器的安装位置与芯片模拟件对应。The number of temperature sensors in the chip simulation board 1 is the same as that of the chip simulation pieces, and the installation positions are in the chip simulation pieces. The installation positions of the temperature sensors in the housing simulation board 2 correspond to the chip simulation pieces.

为了使得调温部件3对芯片模拟板1和壳体模拟板2进行均匀调温,调温部件3为温度调节板,设于芯片模拟板1和壳体模拟板2的外表面。In order to make the temperature adjustment component 3 uniformly adjust the temperature of the chip simulation board 1 and the case simulation board 2 , the temperature adjustment component 3 is a temperature adjustment board and is provided on the outer surfaces of the chip simulation board 1 and the case simulation board 2 .

在硅油扩散测量过程中,两个调温部件3均先升温至第一预设最高温度,使得硅油发生快速扩散,以加快检测效率;然后模拟存储设备中芯片工作时的状况,仅对芯片模拟板1处进行升温,壳体模拟板2外侧由散热部件对其散热。In the process of silicone oil diffusion measurement, the two temperature adjustment components 3 are first heated to the first preset maximum temperature, so that the silicone oil diffuses rapidly, so as to speed up the detection efficiency; The temperature rises at the board 1, and the outer side of the shell simulation board 2 is dissipated by the heat dissipation component.

散热部件可以为散热风扇,对壳体模拟板2进行风冷散热。The heat dissipation component may be a heat dissipation fan, which performs air cooling and heat dissipation on the casing analog board 2 .

本申请中对刻度尺与壳体模拟板2的关系不做限定,例如刻度尺可以集成在壳体模拟板2上,与壳体模拟板2为一体结构,或者,刻度尺粘接在壳体模拟板2上。In this application, the relationship between the scale and the casing simulation board 2 is not limited. For example, the scale can be integrated on the casing simulation board 2, and the scale can be integrated with the casing simulation board 2, or the scale can be glued to the casing. on analog board 2.

本申请中的设备中设有模拟存储设备壳体的壳体模拟板2以及模拟存储设备中芯片的芯片模拟板1,将导热硅脂夹在壳体模拟板2和芯片模拟板1之间,即模拟出导热硅脂在存储设备中的状态,调温部件3调节芯片模拟件和壳体模拟板2的温度,可以加速导热硅脂中硅油的扩散,且调温部件3和散热部件可以模拟存储设备中芯片和壳体模拟板2的工作环境,硅油在壳体模拟板2上发生扩散后,通过刻度尺即可测量出硅油的扩散距离,实现导热硅脂在存储设备上漏油扩散的模拟检测,进而为存储设备选出合适的导热硅脂。The device in this application is provided with a shell simulation board 2 that simulates the housing of the storage device and a chip simulation board 1 that simulates a chip in the storage device, and the thermally conductive silicone grease is sandwiched between the shell simulation board 2 and the chip simulation board 1, That is, the state of the thermal grease in the storage device is simulated, and the temperature adjustment part 3 adjusts the temperature of the chip simulation part and the shell simulation board 2, which can accelerate the diffusion of the silicone oil in the thermal grease, and the temperature adjustment part 3 and the heat dissipation part can simulate The working environment of the chip and the shell simulation board 2 in the storage device. After the silicone oil spreads on the shell simulation board 2, the diffusion distance of the silicone oil can be measured by the scale, so as to realize the oil leakage and diffusion of the thermal grease on the storage device. Simulate the detection, and then select the appropriate thermal grease for the storage device.

在本申请的一个实施例中,用于模拟测试存储设备中导热硅脂性能的设备还可以包括:与所述调温部件3连接的控制台4,用于控制设于所述芯片模拟板1外表面的所述调温部件3升温,并根据所述芯片模拟件和所述壳体模拟板2的温度确定所述导热硅脂的导热系数。In an embodiment of the present application, the device for simulating and testing the performance of thermally conductive silicone grease in a storage device may further include: a console 4 connected to the temperature regulating component 3 for controlling the chip simulation board 1 The temperature of the temperature-adjusting component 3 on the outer surface is heated, and the thermal conductivity of the thermally conductive silicone grease is determined according to the temperature of the chip simulation piece and the housing simulation board 2 .

控制台4与调温部件3的连接方式可以为有线连接,例如通过I2C总线、CAN总线等连接。控制台4中设有控制器。The connection between the console 4 and the temperature regulating component 3 may be wired connection, for example, through an I2C bus, a CAN bus, or the like. A controller is provided in the console 4 .

控制台4还可以用于在测量硅油扩散时,控制两个调温部件3同时升温至第一预设最高温度以及控制芯片模拟板1外表面的调温部件3升温至芯片工作温度,在控制芯片模拟件升温至工作温度时,升温过程与芯片从上电至高功耗状态的工作温度变化情况相同。The console 4 can also be used to control the temperature of the two temperature regulating components 3 to simultaneously increase to the first preset maximum temperature when measuring the diffusion of the silicone oil, and to control the temperature regulating component 3 on the outer surface of the chip analog board 1 to increase the temperature to the chip operating temperature. When the chip analog is heated up to the working temperature, the temperature rise process is the same as the change of the working temperature of the chip from power-on to high power consumption state.

在测量导热系数时,控制台4仅需控制芯片模拟班外侧的调温部件3进行升温,由于导热硅脂的存在,因此壳体模拟板2处的温度也会升高。When measuring the thermal conductivity, the console 4 only needs to control the temperature adjustment component 3 outside the chip simulation class to heat up. Due to the existence of thermal grease, the temperature at the housing simulation board 2 will also increase.

所述控制台4还包括:显示器5,用于显示所述芯片模拟件和所述壳体模拟板2的温度,以及所述导热系数。The console 4 further includes: a display 5 for displaying the temperature of the chip simulation part and the casing simulation board 2 , and the thermal conductivity.

进一步的,控制台4还可以包括操作键盘6,用于提供人机交互接口,选择或设定升温算法。Further, the console 4 may also include an operating keyboard 6 for providing a human-computer interaction interface for selecting or setting the heating algorithm.

本实施例中的设备不仅可以实现硅油扩散距离的测量,还可以实现对导热硅脂的导热系数的测量。有效提升导热硅脂选择的效率及正确率,能够根据综合评价选出更适用存储设备的导热硅脂。The device in this embodiment can not only measure the diffusion distance of silicone oil, but also measure the thermal conductivity of thermally conductive silicone grease. Effectively improve the efficiency and accuracy of thermal grease selection, and can select thermal grease more suitable for storage devices based on comprehensive evaluation.

进一步的,所述控制台4还用于根据所述扩散距离和所述导热系数,确定所述导热硅脂对于所述存储设备的综合性能评分以及生成测试报告。Further, the console 4 is further configured to determine a comprehensive performance score of the thermally conductive silicone grease for the storage device and generate a test report according to the diffusion distance and the thermal conductivity.

在上述任一实施例的基础上,在本申请的一个实施例中,用于模拟测试存储设备中导热硅脂性能的设备还包括:On the basis of any of the foregoing embodiments, in an embodiment of the present application, the device for simulating the performance of the thermally conductive silicone grease in the testing storage device further includes:

带有刻度8的轨道7,用于调节所述芯片模拟板1和所述壳体模拟板2的间距,所述芯片模拟板1和所述壳体模拟板2设于所述轨道7中。A track 7 with a scale 8 is used to adjust the distance between the chip simulation board 1 and the housing simulation board 2 , and the chip simulation board 1 and the housing simulation board 2 are arranged in the track 7 .

轨道7可以设置在控制台4的上表面。The rail 7 may be provided on the upper surface of the console 4 .

在轨道7调节芯片模拟板1和壳体模拟板2,从而调节导热硅脂受到的压力,以精确模拟出导热硅脂在存储设备的芯片和壳体之间的真实厚度和压力,提升导热系数和扩散距离的检测准确性。Adjust the chip simulation board 1 and the shell simulation board 2 on the track 7, so as to adjust the pressure of the thermal grease, so as to accurately simulate the real thickness and pressure of the thermal grease between the chip and the shell of the storage device, and improve the thermal conductivity. and the detection accuracy of diffusion distance.

本申请还提供一种用于模拟测试存储设备中导热硅脂性能的方法,请参考图2,包括:The present application also provides a method for simulating and testing the performance of thermal grease in a storage device, please refer to FIG. 2 , including:

步骤S101:当导热硅脂夹设于所述芯片模拟板和所述壳体模拟板,控制所述芯片模拟板中芯片模拟件和所述壳体模拟板同时升温至第一预设最高温度并维持第一预设时间,以使所述导热硅脂中的硅油扩散。Step S101 : when the thermal conductive silicone grease is sandwiched between the chip simulation board and the casing simulation board, control the chip simulation part and the casing simulation board in the chip simulation board to heat up to a first preset maximum temperature at the same time and The first preset time is maintained to diffuse the silicone oil in the thermally conductive silicone grease.

本步骤的目的是模拟芯片工作温度,让导热硅脂中的硅油加速扩散。本申请中对第一预设最高温度不做限定,可自行设置,例如可以为85℃,90℃,等等。同理,本申请中对第一预设时间也不做限定,可自行设置,例如可以为24小时,或者30小时等等。The purpose of this step is to simulate the working temperature of the chip and to accelerate the diffusion of the silicone oil in the thermal grease. The first preset maximum temperature is not limited in this application, and can be set by yourself, for example, it can be 85° C., 90° C., and so on. Similarly, the first preset time is not limited in this application, and can be set by yourself, for example, it can be 24 hours, or 30 hours, and so on.

芯片模拟件和壳体模拟板的升温方案是控制台内置的,即以对方案进行选择,也可以在控制台中输入,例如可以输入升温曲线数据,从而控制调温部件按照升温曲线数据进行温度变化。The heating scheme of the chip simulation part and the shell simulation board is built in the console, that is, the scheme can be selected or input in the console. For example, the heating curve data can be input, so as to control the temperature adjustment components to change the temperature according to the heating curve data. .

步骤S102:控制所述芯片模拟件升温至芯片工作温度并维持第二预设时间,并控制散热部件对所述壳体模拟板散热。Step S102 : control the temperature of the chip simulation component to increase to the chip working temperature and maintain the temperature for a second preset time, and control the heat dissipation component to dissipate heat from the casing simulation board.

本步骤的目的是模拟存储部件的芯片在工作时的情况。The purpose of this step is to simulate the operation of the chip of the memory component.

芯片的工作温度根据具体的芯片而定,本申请中不做限定。进一步的,本申请中对第二预设时间也不做限定,例如,可以为24小时,或者28小时等等。The working temperature of the chip is determined according to the specific chip, and is not limited in this application. Further, the second preset time is also not limited in this application, for example, it may be 24 hours, or 28 hours, and so on.

步骤S103:利用刻度尺测量所述导热硅脂中的硅油在所述壳体模拟板上的扩散距离。Step S103 : using a scale to measure the diffusion distance of the silicone oil in the thermal conductive silicone grease on the housing simulation board.

本实施例中的方法通过控制芯片模拟件和壳体模拟板同时升温至第一预设最高温度以加快导热硅脂的扩散,然后模拟芯片的工作情况,即控制芯片模拟件升温至芯片工作温度,壳体模拟板处于环境温度,测量出硅油的扩散距离,实现导热硅脂在存储设备上漏油扩散的模拟检测,进而为存储设备选出合适的导热硅脂。The method in this embodiment accelerates the diffusion of thermal grease by controlling the chip simulation part and the casing simulation board to heat up to the first preset maximum temperature at the same time, and then simulates the working condition of the chip, that is, controls the chip simulation part to heat up to the chip working temperature , the shell simulation board is at the ambient temperature, the diffusion distance of the silicone oil is measured, and the simulation detection of the oil leakage and diffusion of the thermal conductive silicone grease on the storage device is realized, and then the appropriate thermal conductive silicone grease is selected for the storage device.

在本申请的一个实施例中,该方法还包括导热系数的测量,请参考图3,包括:In an embodiment of the present application, the method further includes the measurement of thermal conductivity, please refer to FIG. 3 , including:

步骤S201:控制所述芯片模拟件由环境温度逐渐升温至第二预设最高温度,并在所述芯片模拟件处于预设温度节点时,获取所述壳体模拟板对应的温度。Step S201 : controlling the chip simulation piece to gradually increase from the ambient temperature to a second preset maximum temperature, and acquiring the temperature corresponding to the casing simulation board when the chip simulation piece is at a preset temperature node.

第二预设最高温度为芯片可以承受的最高温度,具体根据芯片的类型而定。例如,第二预设最高温度可以为70℃,或者80℃等等。The second preset maximum temperature is the maximum temperature that the chip can withstand, which is determined according to the type of the chip. For example, the second preset maximum temperature may be 70°C, or 80°C, and so on.

需要指出的是,本申请中对预设温度节点不做限定,可自行设置。例如,从环境温度开始,每个整数点的温度可以一个预设温度节点,或者,每间隔3℃,设定一个温度节点,等等。It should be pointed out that the preset temperature node is not limited in this application, and can be set by yourself. For example, starting from the ambient temperature, the temperature of each integer point can be a preset temperature node, or, every 3°C, a temperature node can be set, and so on.

芯片模拟件的升温速率可以自行设置,例如,每20分钟上升1℃,或者每20分钟上升1.5℃,等等。The heating rate of the chip simulation can be set by itself, for example, it increases by 1°C every 20 minutes, or 1.5°C every 20 minutes, and so on.

由于导热硅脂的存在,当芯片模拟件升温,壳体模拟板处的温度也会逐渐升高。需要指出的是,在获取壳体模拟板处的温度时,需要在芯片模拟件温度稳定时采集,以提升检测精度。每一个预设温度节点均对应一个在壳体模拟板处采集的温度。Due to the presence of thermal grease, when the chip simulation part heats up, the temperature at the housing simulation board will also gradually increase. It should be pointed out that, when acquiring the temperature at the housing analog board, it needs to be collected when the temperature of the chip analog part is stable, so as to improve the detection accuracy. Each preset temperature node corresponds to a temperature collected at the shell simulation board.

步骤S202:确定所述预设温度节点与对应的所述温度的差值。Step S202: Determine the difference between the preset temperature node and the corresponding temperature.

用预设温度节点减去壳体模拟板处对应的温度。Subtract the corresponding temperature at the shell simulation plate from the preset temperature node.

步骤S203:根据所述差值和所述预设温度节点的数量确定所述导热硅脂的导热系数。Step S203: Determine the thermal conductivity of the thermally conductive silicone grease according to the difference and the number of the preset temperature nodes.

具体的,根据第一预设公式确定所述导热系数,所述第一预设公式为:Specifically, the thermal conductivity is determined according to a first preset formula, and the first preset formula is:

M=(△T1+△T2+△T3+...+△Tn)/n (1)M=(△T1+△T2+△T3+...+△Tn)/n (1)

其中,M为导热系数,n为预设温度节点的数量,△Ti为第i个预设温度节点与壳体模拟板对应的温度的差值,1≤i≤n。Among them, M is the thermal conductivity, n is the number of preset temperature nodes, ΔTi is the difference between the temperature corresponding to the i-th preset temperature node and the shell simulation board, 1≤i≤n.

进一步的,在本申请的一个实施例中,还包括:根据所述扩散距离和所述导热系数,确定所述导热硅脂对于所述存储设备的综合性能评分以及生成测试报告。Further, in an embodiment of the present application, the method further includes: determining a comprehensive performance score of the thermally conductive silicone grease for the storage device and generating a test report according to the diffusion distance and the thermal conductivity.

综合性能评分的确定方式为:The comprehensive performance score is determined as follows:

根据第二预设公式确定所述综合性能评分,所述第二预设公式为:The comprehensive performance score is determined according to a second preset formula, and the second preset formula is:

Figure BDA0003494505570000101
Figure BDA0003494505570000101

其中,Ta为环境温度,M为导热系数,S为扩散距离,N为芯片模拟件的宽度。Among them, Ta is the ambient temperature, M is the thermal conductivity, S is the diffusion distance, and N is the width of the chip analog.

芯片模拟件的大小与芯片的大小相等,也即N为芯片的宽度。The size of the chip simulation piece is equal to the size of the chip, that is, N is the width of the chip.

综合性能评分J越大越好,满分为100。当扩散距离S大于芯片宽度N时,此时J为负数,证明漏油效果极差。测试报告包括各组温度数据记录和最终的综合性能评分。The larger the comprehensive performance score J, the better, with a full score of 100. When the diffusion distance S is greater than the chip width N, J is a negative number at this time, which proves that the oil leakage effect is extremely poor. The test report includes each group of temperature data records and the final comprehensive performance score.

下面以图1所示的设备为例,对导热硅脂在固态硬盘中的模拟测试过程进行阐述。Taking the device shown in Figure 1 as an example, the simulation test process of thermal grease in a solid-state hard disk will be described below.

首先,将待测导热硅脂均匀涂至芯片模拟板的芯片模拟件处,调整芯片模拟板与壳体模拟板的距离,调节至与固态硬盘实际芯片与壳体间隙一致。First, evenly apply the thermal grease to be tested to the chip simulation part of the chip simulation board, adjust the distance between the chip simulation board and the casing simulation board, and adjust it to be consistent with the gap between the actual chip and the casing of the solid-state drive.

步骤1、从轨道上取下芯片模拟板,将待测导热硅脂均匀涂至芯片模拟板的芯片模拟件表面处;Step 1. Remove the chip simulation board from the track, and evenly apply the thermal conductive silicone grease to be tested to the surface of the chip simulation part of the chip simulation board;

步骤2、将芯片模拟板安装归位,调整芯片模拟板与壳体模拟板的距离至与固态硬盘中芯片与壳体间隙一致;Step 2. Install the chip simulation board in its original position, and adjust the distance between the chip simulation board and the casing simulation board to be consistent with the gap between the chip and the casing in the SSD;

步骤3、在控制台设置芯片耐受最高温度,启动导热硅脂导热系数测试:控制台在接收到测试命令后,会自动进行预设的测试方案,调节芯片模拟板外表面的温度调节板的温度使芯片模拟板升温至85℃,在达到每个预设温度节点时,获取壳体模拟板处的温度,并通过公式(1)确定出导热硅脂的导热系数;Step 3. Set the maximum temperature that the chip can withstand on the console, and start the thermal conductivity test of thermal grease: After the console receives the test command, it will automatically carry out the preset test plan to adjust the temperature of the temperature control board on the outer surface of the chip simulation board. The temperature increases the temperature of the chip simulation board to 85°C. When each preset temperature node is reached, the temperature at the housing simulation board is obtained, and the thermal conductivity of the thermal grease is determined by formula (1);

步骤4、导热系数测试完毕后自动进入硅油扩散测试:首先将芯片模拟板和壳体模拟板处的温度稳定至环境温度,然后控制两个温度调节板同时升温,使得芯片模拟板和壳体模拟板处的温度同时升温至85℃,并维持24小时,再进入节温差交变测试,即只将芯片模拟板处的温度升温至芯片工作温度55℃,散热风扇对壳体模拟板进行散热以模拟壳体模拟板的真实工作环境,24小时后取下带有刻度尺的壳体模拟板,读取扩散距离S,并通过操作键盘输入至控制台;Step 4. After the thermal conductivity test is completed, it will automatically enter the silicone oil diffusion test: first stabilize the temperature of the chip simulation board and the shell simulation board to the ambient temperature, and then control the two temperature adjustment boards to heat up at the same time, so that the chip simulation board and the shell simulation board are simulated. The temperature at the board is raised to 85°C at the same time, and maintained for 24 hours, and then enters the junction temperature difference alternating test, that is, only the temperature at the chip simulation board is raised to the chip operating temperature of 55°C, and the cooling fan dissipates the heat on the housing simulation board. To simulate the real working environment of the shell simulation board, remove the shell simulation board with a scale after 24 hours, read the diffusion distance S, and input it to the console through the operation keyboard;

步骤5、控制台根据公式(2)确定导热硅脂的综合性能评分并生成测试报告,作为固态硬盘选用导热硅脂的参考。Step 5. The console determines the comprehensive performance score of thermal grease according to formula (2) and generates a test report, which is used as a reference for selecting thermal grease for solid-state drives.

本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其它实施例的不同之处,各个实施例之间相同或相似部分互相参见即可。对于实施例公开的装置而言,由于其与实施例公开的方法相对应,所以描述的比较简单,相关之处参见方法部分说明即可。The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments may be referred to each other. As for the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant part can be referred to the description of the method.

以上对本申请所提供的用于模拟测试存储设备中导热硅脂性能的设备和方法进行了详细介绍。本文中应用了具体个例对本申请的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本申请的方法及其核心思想。应当指出,对于本技术领域的普通技术人员来说,在不脱离本申请原理的前提下,还可以对本申请进行若干改进和修饰,这些改进和修饰也落入本申请权利要求的保护范围内。The device and method for simulating and testing the performance of thermally conductive silicone grease in a storage device provided by the present application have been described in detail above. Specific examples are used herein to illustrate the principles and implementations of the present application, and the descriptions of the above embodiments are only used to help understand the methods and core ideas of the present application. It should be pointed out that for those of ordinary skill in the art, without departing from the principles of the present application, several improvements and modifications can also be made to the present application, and these improvements and modifications also fall within the protection scope of the claims of the present application.

Claims (10)

1. An apparatus for simulating the performance of thermally conductive silicone in a test storage device, comprising:
the chip simulation board and the shell simulation board are arranged oppositely and used for containing heat-conducting silicone grease, and a chip simulation piece used for simulating a chip in the storage device is arranged on the inner surface of the chip simulation board;
the temperature regulating components are respectively arranged on the outer surfaces of the chip simulation plate and the shell simulation plate and are used for regulating the temperature of the chip simulation piece and the shell simulation plate;
the temperature sensors are arranged in the chip simulation board and the shell simulation board and are used for measuring the temperature of the chip simulation piece and the temperature of the shell simulation board;
the heat dissipation part is arranged on the outer side of the shell simulation plate and used for dissipating heat of the shell simulation plate;
and the graduated scale is arranged on the inner surface of the shell simulation plate and is used for measuring the diffusion distance of the silicone oil in the heat-conducting silicone grease on the shell simulation plate.
2. The apparatus for modeling performance of a thermally conductive silicone in a test storage device of claim 1, further comprising:
and the console is connected with the temperature regulating component and used for controlling the temperature of the temperature regulating component arranged on the outer surface of the chip simulation board to rise and determining the heat conductivity coefficient of the heat-conducting silicone grease according to the temperatures of the chip simulation piece and the shell simulation board.
3. The apparatus of claim 2, wherein the console is further configured to determine a composite performance score for the thermal grease for the storage device and generate a test report based on the diffusion distance and the thermal conductivity.
4. The apparatus for modeling performance of a thermally conductive silicone in a test storage device of claim 2, wherein said console further comprises:
and the display is used for displaying the temperatures of the chip simulation piece and the shell simulation plate and the heat conductivity coefficient.
5. The apparatus for analog testing of the performance of a thermally conductive silicone grease in a memory device of any of claims 1 to 4, further comprising:
the track with scale is used for adjusting the chip simulation board with the interval of casing simulation board, the chip simulation board with the casing simulation board is located in the track.
6. A method for analog testing of the performance of thermally conductive silicone grease in a memory device, comprising:
when the heat-conducting silicone grease is clamped between the chip simulation board and the shell simulation board, controlling the chip simulation piece and the shell simulation board in the chip simulation board to simultaneously heat to a first preset maximum temperature and maintain for a first preset time so as to diffuse the silicone oil in the heat-conducting silicone grease;
controlling the temperature of the chip simulation part to rise to the working temperature of the chip and maintaining the working temperature for a second preset time, and controlling the heat dissipation part to dissipate heat of the shell simulation plate;
and measuring the diffusion distance of the silicone oil in the heat-conducting silicone grease on the shell simulation board by using a graduated scale.
7. The method for simulation testing the performance of a thermally conductive silicone grease in a memory device of claim 6, further comprising:
controlling the temperature of the chip simulation piece to gradually rise from the ambient temperature to a second preset maximum temperature, and acquiring the temperature corresponding to the shell simulation board when the chip simulation piece is at a preset temperature node;
determining the difference value between the preset temperature node and the corresponding temperature;
and determining the heat conductivity coefficient of the heat-conducting silicone grease according to the difference and the number of the preset temperature nodes.
8. The method of claim 7, wherein determining the thermal conductivity of the thermally conductive silicone grease based on the difference and the number of predetermined temperature nodes comprises:
determining the heat conductivity coefficient according to a first preset formula, wherein the first preset formula is as follows:
M=(△T1+△T2+△T3+...+△Tn)/n
wherein M is a heat conductivity coefficient, n is the number of preset temperature nodes, delta Ti is a difference value of the ith preset temperature node and the temperature corresponding to the shell simulation plate, and i is more than or equal to 1 and less than or equal to n.
9. The method for analog testing of the performance of a thermally conductive silicone grease in a memory device of claim 8 further comprising:
and determining the comprehensive performance score of the heat-conducting silicone grease on the storage equipment and generating a test report according to the diffusion distance and the heat conductivity coefficient.
10. The method of claim 9, wherein determining a composite performance score for the thermal grease for the storage device based on the diffusion distance and the thermal conductivity comprises:
determining the comprehensive performance score according to a second preset formula, wherein the second preset formula is as follows:
Figure FDA0003494505560000031
wherein Ta is the ambient temperature, M is the thermal conductivity, S is the diffusion distance, and N is the width of the chip simulation piece.
CN202210109149.8A 2022-01-28 2022-01-28 Device and method for simulation test of performance of heat-conducting silicone grease in storage device Pending CN114441592A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115616197A (en) * 2022-08-29 2023-01-17 格力电器(武汉)有限公司 Device and method for testing oil separation performance of heat-conducting silicone grease

Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0124104A1 (en) * 1983-04-27 1984-11-07 Polska Akademia Nauk Centrumbadan Molekularnych I Makromolekularnych Method and apparatus for measuring the thermal conductivity and thermal capacity of materials
PL272596A1 (en) * 1988-05-20 1989-11-27 Polska Akad Nauk Centrum Method for determining heat conduction coefficient and a device for measuring the heat conduction coefficient of materials
WO2010103784A1 (en) * 2009-03-11 2010-09-16 学校法人常翔学園 Heat conduction measuring device and heat conduction measuring method
CN103411996A (en) * 2013-08-05 2013-11-27 电子科技大学 Measuring equipment and measuring method for heat conductivity coefficients of solid materials
CN205593951U (en) * 2016-03-24 2016-09-21 苏州柯仕达电子材料有限公司 A analog system for detecting heat conduction silicone grease
CN206292196U (en) * 2016-12-09 2017-06-30 上海大郡动力控制技术有限公司 For the test device of heat conductivity of heat-conduction silicone grease
CN108072680A (en) * 2018-01-19 2018-05-25 林荣铨 A kind of use for laboratory heat conductivity of heat-conduction silicone grease evaluating apparatus
CN109406573A (en) * 2018-12-10 2019-03-01 江苏赛诺格兰医疗科技有限公司 It is a kind of for testing the test device and test method of thermal conductive silicon rubber mat thermal conductivity
CN211453433U (en) * 2019-08-15 2020-09-08 昆山九聚新材料技术有限公司 Heat conduction silica gel detection device
CN212083294U (en) * 2020-03-25 2020-12-04 赛伦(厦门)新材料科技有限公司 Interface temperature difference testing device of heat-conducting interface material
CN212180527U (en) * 2020-05-07 2020-12-18 赛伦(厦门)新材料科技有限公司 Oil leakage testing device for heat-conducting slurry
CN212904769U (en) * 2020-08-12 2021-04-06 杭州英希捷科技有限责任公司 Heat conduction gasket's oil outlet area testing arrangement
CN112710696A (en) * 2021-03-26 2021-04-27 北京三快在线科技有限公司 Test tool and test equipment for heat-conducting medium
CN113092523A (en) * 2021-04-07 2021-07-09 宁波石墨烯创新中心有限公司 Device and method for testing heat-conducting property of thin-film material

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0124104A1 (en) * 1983-04-27 1984-11-07 Polska Akademia Nauk Centrumbadan Molekularnych I Makromolekularnych Method and apparatus for measuring the thermal conductivity and thermal capacity of materials
PL272596A1 (en) * 1988-05-20 1989-11-27 Polska Akad Nauk Centrum Method for determining heat conduction coefficient and a device for measuring the heat conduction coefficient of materials
WO2010103784A1 (en) * 2009-03-11 2010-09-16 学校法人常翔学園 Heat conduction measuring device and heat conduction measuring method
CN103411996A (en) * 2013-08-05 2013-11-27 电子科技大学 Measuring equipment and measuring method for heat conductivity coefficients of solid materials
CN205593951U (en) * 2016-03-24 2016-09-21 苏州柯仕达电子材料有限公司 A analog system for detecting heat conduction silicone grease
CN206292196U (en) * 2016-12-09 2017-06-30 上海大郡动力控制技术有限公司 For the test device of heat conductivity of heat-conduction silicone grease
CN108072680A (en) * 2018-01-19 2018-05-25 林荣铨 A kind of use for laboratory heat conductivity of heat-conduction silicone grease evaluating apparatus
CN109406573A (en) * 2018-12-10 2019-03-01 江苏赛诺格兰医疗科技有限公司 It is a kind of for testing the test device and test method of thermal conductive silicon rubber mat thermal conductivity
CN211453433U (en) * 2019-08-15 2020-09-08 昆山九聚新材料技术有限公司 Heat conduction silica gel detection device
CN212083294U (en) * 2020-03-25 2020-12-04 赛伦(厦门)新材料科技有限公司 Interface temperature difference testing device of heat-conducting interface material
CN212180527U (en) * 2020-05-07 2020-12-18 赛伦(厦门)新材料科技有限公司 Oil leakage testing device for heat-conducting slurry
CN212904769U (en) * 2020-08-12 2021-04-06 杭州英希捷科技有限责任公司 Heat conduction gasket's oil outlet area testing arrangement
CN112710696A (en) * 2021-03-26 2021-04-27 北京三快在线科技有限公司 Test tool and test equipment for heat-conducting medium
CN113092523A (en) * 2021-04-07 2021-07-09 宁波石墨烯创新中心有限公司 Device and method for testing heat-conducting property of thin-film material

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115616197A (en) * 2022-08-29 2023-01-17 格力电器(武汉)有限公司 Device and method for testing oil separation performance of heat-conducting silicone grease

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