CN114421962A - Sampling channel abnormity diagnosis method, device, equipment and storage medium - Google Patents
Sampling channel abnormity diagnosis method, device, equipment and storage medium Download PDFInfo
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- CN114421962A CN114421962A CN202111628944.XA CN202111628944A CN114421962A CN 114421962 A CN114421962 A CN 114421962A CN 202111628944 A CN202111628944 A CN 202111628944A CN 114421962 A CN114421962 A CN 114421962A
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/10—Calibration or testing
- H03M1/1071—Measuring or testing
- H03M1/1076—Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Abstract
The invention discloses a method, a device, equipment and a storage medium for diagnosing sampling channel abnormity, wherein the method comprises the following steps: in response to a setting instruction, under the condition that the current temperature is within a preset first temperature range, sampling each ADC channel at intervals of a preset first temperature to obtain a plurality of sampling parameters of each ADC channel, wherein the sampling parameters comprise a first power parameter and a first temperature parameter; fitting according to all sampling parameters of each ADC channel to obtain a fitting function of each ADC channel, and storing all the fitting functions to a storage unit; and performing diagnostic processing on each ADC channel by using the fitting function in response to the diagnostic instruction so as to determine whether the ADC channel is abnormal. The sampling channel abnormity diagnosis method, the device, the equipment and the storage medium disclosed by the invention can find abnormity in time, can diagnose more accurately, reduce the diagnosis cost and are beneficial to improving the reliability.
Description
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a method, an apparatus, a device, and a storage medium for diagnosing an abnormality of a sampling channel.
Background
In various engineering applications, when analog signals need to be converted into digital signals, the analog signals are usually implemented by using an ADC chip. In order to ensure the quality of signals and remove noise, various passive devices, such as filters, are usually added to the front end of the ADC chip in the process of converting analog signals into digital signals. Although the failure rate of the passive device is low, in the actual use process, damage still exists, so that the conversion of signals is influenced, the signals are distorted, and the system fails.
Disclosure of Invention
The present invention is directed to solving at least one of the problems of the prior art. Therefore, the invention provides a sampling channel abnormity diagnosis method which can find abnormity in time and is beneficial to improving reliability.
The invention also provides a sampling channel abnormity diagnosis device comprising the sampling channel abnormity diagnosis method.
The invention also provides equipment comprising the sampling channel abnormity diagnosis method.
The invention also provides a storage medium comprising the sampling channel abnormity diagnosis method.
According to an embodiment of the invention, the sampling channel abnormity diagnosis method comprises the following steps: in response to a setting instruction, under the condition that the current temperature is within a preset first temperature range, sampling each ADC channel at intervals of a preset first temperature to obtain a plurality of sampling parameters of each ADC channel, wherein the sampling parameters comprise a first power parameter and a first temperature parameter; fitting according to all the sampling parameters of each ADC channel to obtain a fitting function of each ADC channel, and storing all the fitting functions to a storage unit; responding to a diagnosis instruction, and performing diagnosis processing on each ADC channel by using the fitting function to determine whether the ADC channel is abnormal or not; the sampling process comprises the following steps: controlling a DAC channel to send a coupling signal to the ADC channel; and when the ADC channel receives the coupling signal, acquiring the first power parameter and the first temperature parameter of the ADC channel.
The sampling channel abnormity diagnosis method provided by the embodiment of the invention at least has the following beneficial effects: coupling signals are sent by using the self-contained DAC channel, the ADC channel is enabled to work, a plurality of sampling parameters of the ADC channel at different temperatures are collected, then a fitting function of each ADC channel is obtained through fitting, whether the ADC channel is abnormal or not is judged, abnormality can be found timely, the self-contained DAC channel serves as a signal source, a fitting function which is better in consistency with the ADC channel is obtained through fitting, whether the ADC channel is abnormal or not is judged accurately, and reliability is improved. In addition, the method takes the self-contained DAC channel as a signal source, thereby avoiding arranging an additional signal emission source and being beneficial to reducing the cost of the method.
According to some embodiments of the invention, the diagnostic process comprises the steps of: controlling the DAC channel to send an excitation signal to an external device so that the external device returns a sampling signal to the ADC channel; when the ADC channel receives the sampling signal, acquiring an actual power parameter and an actual temperature parameter of the ADC channel; calculating to obtain a theoretical power parameter of the ADC channel according to the actual temperature parameter and the fitting function; calculating to obtain the channel loss of the ADC channel according to the actual power parameter, the theoretical power parameter and a preset calculation formula; and confirming whether the ADC channel is abnormal or not according to the channel loss. Whether the ADC is abnormal or not is diagnosed by utilizing the fitting function, so that the accuracy of diagnosis is improved, and the reliability is improved.
According to some embodiments of the invention, the confirming whether the ADC channel is abnormal according to the channel loss comprises: comparing the channel loss with a preset loss threshold; and when the channel loss is larger than the loss threshold value, confirming that the ADC channel is abnormal. And comparing to confirm whether the ADC channel is abnormal.
According to some embodiments of the invention, further comprising the steps of: recording the abnormal number of the ADC channels, and comparing the abnormal number with a preset abnormal threshold value; and when the abnormal number is larger than the abnormal threshold value, confirming that the DAC channel is abnormal. By confirming the abnormal number of the ADC channels, the misjudgment caused by the abnormal DAC channels is avoided, and the reliability is improved.
According to another aspect of the invention, the sampling channel abnormity diagnosis device comprises a configuration module, a sampling module, a setting module, a fitting module and a diagnosis module. The configuration module is used for receiving and storing a preset first temperature range and a preset first temperature and storing a fitting function; the sampling module is used for controlling a DAC channel to send a coupling signal to an ADC channel, and acquiring the first power parameter and the first temperature parameter of the ADC channel when the ADC channel receives the coupling signal; the setting module is used for responding to a setting instruction, and under the condition that the current temperature is within the first temperature range, sampling each ADC channel by using the sampling module at intervals of the first temperature to obtain a plurality of sampling parameters of each ADC channel, wherein the sampling parameters comprise the first power parameter and the first temperature parameter; the fitting module is used for fitting all the sampling parameters of each ADC channel to obtain the fitting function of each ADC channel; and the diagnosis module is used for responding to a diagnosis instruction and performing diagnosis processing on each ADC channel by using the fitting function so as to determine whether the ADC channel is abnormal or not.
The sampling channel abnormity diagnosis device provided by the embodiment of the invention at least has the following beneficial effects: the sampling module sends a coupling signal to the ADC channel through the DAC channel, so as to sample the ADC channel, the setting module controls the sampling module to perform sampling processing at different temperatures, so as to obtain a plurality of sampling parameters, so that the fitting module can fit to obtain a fitting function of each ADC channel, and further the diagnosis module can determine whether the ADC channel is abnormal or not, so as to find the abnormality in time, and the DAC channel is taken as a signal source, and the fitting module can fit to obtain a fitting function which is better in consistency with the ADC channel, so that whether the ADC channel is abnormal or not can be accurately judged, and the reliability can be improved. In addition, the self-contained DAC channel is used as a signal source, and a signal emission source can be avoided from being additionally arranged, so that the cost is reduced.
According to some embodiments of the present invention, the configuration module is further configured to receive and store a preset calculation formula, and the diagnosis module includes a signal sending unit, a parameter collecting unit, a first calculating unit, a second calculating unit, and an abnormality determining unit. The signal sending unit is used for controlling the DAC channel to send an excitation signal to external equipment so that the external equipment returns a sampling signal to the ADC channel; the parameter acquisition unit is used for acquiring an actual power parameter and an actual temperature parameter of the ADC channel under the condition that the ADC channel receives the sampling signal; the first calculation unit is used for calculating theoretical power parameters of the ADC channel according to the actual temperature parameters and the fitting function; the second calculation unit is used for calculating the channel loss of the ADC channel according to the actual power parameter, the theoretical power parameter and the calculation formula; and the abnormity judging unit is used for confirming whether the ADC channel is abnormal or not according to the channel loss. The signal sending unit, the parameter acquisition unit, the first calculation unit, the second calculation unit and the abnormality judgment unit are matched with each other, so that whether the ADC channel is abnormal or not is determined.
According to some embodiments of the present invention, the configuration module is further configured to receive and store a preset loss threshold, and the abnormality determination unit includes a first comparison unit and a first conclusion unit. A first comparing unit for comparing the channel loss with the loss threshold; a first conclusion unit, configured to confirm that the ADC channel is abnormal if the channel loss is greater than the loss threshold. And the first comparison unit and the first conclusion unit are matched with each other so as to determine whether the ADC channel is abnormal.
According to some embodiments of the present invention, the system further comprises a second comparing unit and a second conclusion unit, wherein the configuration module is further configured to receive and store a preset abnormal threshold; the second comparison unit is used for recording the abnormal number of the ADC channel and comparing the abnormal number with the abnormal threshold value; the second conclusion unit is used for confirming that the DAC channel is abnormal under the condition that the number of the abnormity is larger than the abnormity threshold value. The second comparison unit and the second conclusion unit are matched with each other so as to determine whether the DAC channel is abnormal or not.
The computer device according to another embodiment of the present invention includes a processor and a memory, the memory stores a computer program, and the processor implements the sampling channel abnormality diagnosis method described above when executing the computer program.
The computer equipment provided by the embodiment of the invention has at least the following beneficial effects: by the method for diagnosing the abnormity of the sampling channel, whether the ADC channel is abnormal or not can be found in time, accuracy can be improved, reliability can be improved, and in addition, the extra signal emission source is avoided by using the self-contained DAC channel as a signal source, and cost reduction is facilitated.
According to another aspect of the present invention, a storage medium stores computer-executable instructions, which when executed by a computer implement the sampling channel abnormality diagnosis method described above.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a flow chart of a sampling channel abnormality diagnosis method according to an embodiment of the present invention;
FIG. 2 is a detailed flowchart of one embodiment of the method for diagnosing sampling channel anomalies shown in FIG. 1;
FIG. 3 is a schematic diagram of a prior art sampling circuit;
FIG. 4 is a second flowchart of the sampling channel abnormality diagnosis method shown in FIG. 1;
FIG. 5 is a third flowchart of the sampling channel abnormality diagnosis method shown in FIG. 4;
FIG. 6 is a flow chart of additional steps of the method of diagnosing sampling channel anomalies shown in FIG. 1;
fig. 7 is a schematic structural diagram of a sampling channel abnormality diagnosis apparatus according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of a diagnostic module of the sampling channel abnormality diagnostic apparatus shown in fig. 7;
fig. 9 is a schematic structural diagram of an abnormality determination unit of the sampling channel abnormality diagnostic apparatus shown in fig. 8;
FIG. 10 is a schematic structural diagram of a sampling channel abnormality diagnosis apparatus according to some embodiments of the present invention;
fig. 11 is a schematic structural diagram of a computer device according to an embodiment of the present invention.
The reference numbers are as follows:
the device comprises a configuration module 100, a sampling module 200, a setting module 300, a fitting module 400, a diagnosis module 500, a signal sending unit 510, a parameter acquisition unit 520, a first calculation unit 530, a second calculation unit 540, an abnormality judgment unit 550, a first comparison unit 551, a first conclusion unit 552, a second comparison unit 600, a second conclusion unit 700, a processor 800 and a memory 900.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
In the description of the present invention, the meaning of a plurality of means is one or more, the meaning of a plurality of means is two or more, and more than, less than, more than, etc. are understood as excluding the present number, and more than, less than, etc. are understood as including the present number. If there is a description of the first, second, third and fourth only for the purpose of distinguishing between technical features, this is not to be understood as indicating or implying a relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.
ADC: analog-to-digital converter.
DAC: digital-to-analog converter.
Referring to fig. 1 and 3, a sampling channel abnormality diagnosis method includes steps S1000, S2000, and S3000.
Step S1000, in response to the setting instruction, under the condition that the current temperature is within the preset first temperature range, sampling each ADC channel at every interval of the preset first temperature to obtain a plurality of sampling parameters of each ADC channel, where the sampling parameters include a first power parameter and a first temperature parameter.
Sampling parameters of the ADC channel at different temperatures in the first temperature range are collected, so that a fitting function which is consistent with the ADC channel and is better can be obtained by fitting a plurality of sampling parameters subsequently. For example, if the first temperature range is-45 degrees to 80 degrees and the first temperature is 5 degrees, each ADC channel is sampled once every 5 degrees, so that 26 sets of sampling parameters are obtained by sampling each ADC channel; or, the first temperature range is-20 degrees to 70 degrees, and the first temperature is 2 degrees, each ADC channel is sampled every 2 degrees, so that 46 sets of sampling parameters are obtained by sampling each ADC channel.
And S2000, fitting according to all sampling parameters of each ADC channel to obtain a fitting function of each ADC channel, and storing all fitting functions to a storage unit.
The fitting function between each ADC channel is possibly different due to the fact that lines of each ADC channel are different or devices of each ADC channel are different, and fitting of all sampling parameters of each ADC channel is beneficial to obtaining the fitting function which is better in consistency with the ADC channels, and when diagnosis processing is conducted on the basis of the fitting function subsequently, accuracy is improved, and reliability is improved.
In addition, the fitting function obtained by fitting is saved in a storage unit, so that the subsequent diagnosis processing based on the fitting function is facilitated. The storage unit may be a storage medium connected to the control unit, or may be a storage structure located in the control unit.
It should be noted that, before the device leaves the factory, the fitting function of the ADC channel may be obtained first by using the method, and the fitting function is stored in the storage unit, so that after the device leaves the factory, the fitting function may be directly used to perform the diagnostic processing on the ADC channel, so as to improve the diagnostic efficiency.
It should be noted that the fitting function may be a piecewise function in order to improve consistency.
Step S3000, in response to the diagnosis instruction, performing diagnosis processing on each ADC channel by using the fitting function to determine whether the ADC channel is abnormal.
Each ADC channel has a fitting function with good consistency, so that diagnosis processing is performed on the ADC channels based on the corresponding fitting functions, the diagnosis accuracy is improved, and the reliability is improved.
The diagnosis command may be input from the outside or may be generated at regular time by the control unit. For example, a diagnosis instruction is generated every minute to perform diagnosis processing on the ADC channel, which is beneficial to timely finding an abnormality.
Referring to fig. 2 and 3, the sampling process includes step S1100 and step S1200.
In step S1100, the DAC channel is controlled to transmit a coupling signal to the ADC channel.
Step S1200, when the ADC channel receives the coupling signal, acquiring a first power parameter and a first temperature parameter of the ADC channel.
The sampling circuit is provided with a DAC channel, the sampling processing is carried out through the DAC channel, the ADC channel works, and therefore the first power parameter and the first temperature parameter of the ADC channel are collected, an additional signal emission source is avoided, and cost reduction is facilitated. In addition, the first power parameter and the first temperature parameter of the ADC channel can be collected by transmitting the coupling signal by using the DAC channel of the sampling circuit, so that the applicability of the method can be improved, and the reliability is improved.
Referring to fig. 3 and 4, the diagnosis process includes step S3100, step S3200, step S3300, step S3400, and step S3500.
And step S3100, controlling the DAC channel to send an excitation signal to the external device, so that the external device returns a sampling signal to the ADC channel.
Step S3200, when the ADC channel receives the sampling signal, acquiring an actual power parameter and an actual temperature parameter of the ADC channel.
And step S3300, calculating to obtain theoretical power parameters of the ADC channel according to the actual temperature parameters and the fitting function.
And step S3400, calculating to obtain the channel loss of the ADC channel according to the actual power parameter, the theoretical power parameter and a preset calculation formula.
Step S3500, according to the channel loss, determining whether the ADC channel is abnormal.
The DAC channel is controlled to send the excitation signal, so that the ADC channel receives the sampling signal, actual power parameters and actual temperature parameters of the ADC channel are collected conveniently, the actual power parameters, the actual temperature parameters, the corresponding fitting functions and the preset calculation formulas are used conveniently, and channel loss of the ADC channel is calculated to determine whether the ADC channel is abnormal or not.
The corresponding fitting function and the corresponding ADC channel have higher consistency, so that theoretical power parameters obtained by calculation of the fitting function and the actual temperature parameters can be utilized to better represent the actual power of the corresponding ADC channel under the condition of good state, the channel loss of the corresponding ADC channel is accurately calculated, whether the ADC channel is abnormal or not is conveniently and accurately judged, and the reliability is improved.
It should be noted that the calculation formula may be: p3＝|P2-P1L, wherein P3Denotes channel loss, P2Representing a theoretical power parameter, P1Representing the actual power parameter.
Referring to fig. 5, step S3500 includes step S3510 and step S3520.
Step S3510, the channel loss is compared with a preset loss threshold.
Step S3520, when the channel loss is larger than the loss threshold, the ADC channel is confirmed to be abnormal.
The calculated channel loss is compared with a preset loss threshold value, so that whether the ADC channel is abnormal or not is confirmed, calculation difficulty is reduced, diagnosis efficiency is improved, abnormality can be found in time, and therefore maintenance personnel can maintain the sampling circuit in time.
Referring to fig. 6, the sampling channel abnormality diagnosis method further includes steps S4000 and S5000.
And step S4000, recording the abnormal number of the ADC channels, and comparing the abnormal number with a preset abnormal threshold value.
And step S5000, when the abnormal quantity is larger than the abnormal threshold value, confirming that the DAC channel is abnormal.
In the actual use process, the condition that all ADC channels are abnormal may exist, which may be caused by the abnormality of the DAC channels, so that the abnormal number is compared with the preset abnormal threshold value by recording the abnormal number of the ADC channels, so that when the DAC channels are abnormal, maintenance personnel can timely find the abnormality for maintenance, and the reliability is improved. For example, the DAC channel is damaged and cannot transmit the excitation signal, so that the ADC channel cannot receive the sampling signal, and the control unit acquires the wrong sampling parameter.
Referring to fig. 7, a sampling channel abnormality diagnosis apparatus includes a configuration module 100, a sampling module 200, a setting module 300, a fitting module 400, and a diagnosis module 500. A configuration module 100, configured to receive and store a preset first temperature range and a preset first temperature, and configured to store a fitting function; the sampling module 200 is configured to control the DAC channel to send a coupling signal to the ADC channel, and when the ADC channel receives the coupling signal, acquire a first power parameter and a first temperature parameter of the ADC channel; the setting module 300 is configured to, in response to a setting instruction, perform sampling processing on each ADC channel by using the sampling module 200 at every interval of a first temperature under the condition that the current temperature is within a first temperature range, so as to obtain a plurality of sampling parameters of each ADC channel, where the sampling parameters include a first power parameter and a first temperature parameter; a fitting module 400, configured to fit all sampling parameters of each ADC channel to obtain a fitting function of each ADC channel; and the diagnosis module 500 is configured to perform diagnosis processing on each ADC channel by using the fitting function in response to the diagnosis instruction to determine whether the ADC channel is abnormal.
Wherein, the sampling module 200 sends the coupled signal to the ADC channel through the DAC channel, thereby sample the ADC channel, and set up module 300 control sampling module 200 and carry out the sampling process under the temperature of a plurality of differences, thereby obtain a plurality of sampling parameters, so that the fitting module 400 utilizes the fitting of a plurality of sampling parameters to obtain the fitting function of each ADC channel, and then make diagnostic module 500 confirm whether the ADC channel is unusual, so that discover in time unusually, and regard the DAC channel of sampling circuit as the signal source, and the fitting obtains the fitting function better with ADC channel uniformity, so that accurately judge whether the ADC channel is unusual, be favorable to improving the reliability. In addition, the self-contained DAC channel is used as a signal source, and a signal emission source can be avoided from being additionally arranged, so that the cost is reduced.
Referring to fig. 8, the configuration module 100 is further configured to receive and store a preset calculation formula, and the diagnosis module 500 includes a signal sending unit 510, a parameter collecting unit 520, a first calculating unit 530, a second calculating unit 540, and an abnormality determining unit 550. The signal sending unit 510 is configured to control the DAC channel to send an excitation signal to an external device, so that the external device returns a sampling signal to the ADC channel; the parameter acquisition unit 520 is configured to acquire an actual power parameter and an actual temperature parameter of the ADC channel when the ADC channel receives the sampling signal; the first calculating unit 530 is configured to calculate a theoretical power parameter of the ADC channel according to the actual temperature parameter and the fitting function; the second calculating unit 540 is configured to calculate, according to the actual power parameter, the theoretical power parameter, and the calculation formula, a channel loss of the ADC channel; and an abnormality determining unit 550 configured to determine whether the ADC channel is abnormal according to the channel loss.
The signal sending unit 510 controls the DAC channel to send the excitation signal, so that the parameter collecting unit 520 can collect the actual power parameter and the actual temperature parameter of the ADC channel, and the first calculating unit 530 and the second calculating unit 540 calculate the channel loss of the corresponding ADC channel based on the actual power parameter, the actual temperature parameter, the calculation formula, and the fitting function, so that the abnormality determining unit 550 determines whether the ADC channel is abnormal.
Each ADC channel has a corresponding fitting function, that is, the fitting function and the ADC channel are in one-to-one correspondence, which is beneficial to improve the consistency between the fitting function and the ADC channel, so that the first calculating unit 530 and the second calculating unit 540 calculate to obtain more accurate channel loss by using the fitting function, so as to accurately determine whether the ADC channel is abnormal.
It should be noted that, referring to fig. 9, the configuration module 100 is further configured to receive and store a preset loss threshold, and the abnormality determining unit 550 includes a first comparing unit 551 and a first conclusion unit 552. A first comparing unit 551 for comparing the channel loss with a loss threshold; a first conclusion unit 552 configured to confirm that the ADC channel is abnormal if the channel loss is greater than the loss threshold. The first comparing unit 551 and the first conclusion unit 552 cooperate with each other, and the comparison between the channel loss and the loss threshold is utilized to determine whether the ADC channel is abnormal, which is beneficial to reducing the calculation difficulty, thereby improving the diagnosis efficiency, and facilitating the timely discovery of abnormality by the maintenance personnel.
Referring to fig. 10, the sampling channel abnormality diagnosis apparatus further includes a second comparing unit 600 and a second concluding unit 700, and the configuration module 100 is further configured to receive and store a preset abnormality threshold; the second comparing unit 600 is configured to record the abnormal number of the ADC channels, and compare the abnormal number with an abnormal threshold; the second conclusion unit 700 is used to confirm that the DAC channel is abnormal if the number of abnormalities is greater than the abnormality threshold. The second comparing unit 600 and the second concluding unit 700 are matched with each other, and whether the DAC channel is abnormal or not is determined through simple comparison, so that the calculation difficulty is reduced, the diagnosis efficiency is improved, and whether the DAC channel is abnormal or not can be determined, so that a maintainer can maintain the DAC channel in a targeted manner, and the reliability is improved.
Referring to fig. 11, a computer apparatus includes a processor 800 and a memory 900. The memory 900 stores a computer program, and the processor 800 implements the sampling channel abnormality diagnosis method described above when executing the computer program.
By the method for diagnosing the abnormity of the sampling channel, whether the ADC channel is abnormal or not can be found in time, accuracy can be improved, reliability can be improved, in addition, the DAC channel of the sampling circuit is used as a signal source, an additional signal emission source is avoided, and cost reduction is facilitated.
A storage medium stores computer-executable instructions, and when the computer-executable instructions are executed by a computer, the sampling channel abnormity diagnosis method is realized.
The embodiments of the present invention have been described in detail with reference to the accompanying drawings, but the present invention is not limited to the above embodiments, and various changes can be made within the knowledge of those skilled in the art without departing from the gist of the present invention.
Claims (10)
1. A sampling channel abnormality diagnosis method is characterized by comprising the following steps:
in response to a setting instruction, under the condition that the current temperature is within a preset first temperature range, sampling each ADC channel at intervals of a preset first temperature to obtain a plurality of sampling parameters of each ADC channel, wherein the sampling parameters comprise a first power parameter and a first temperature parameter;
fitting according to all the sampling parameters of each ADC channel to obtain a fitting function of each ADC channel, and storing all the fitting functions to a storage unit;
responding to a diagnosis instruction, and performing diagnosis processing on each ADC channel by using the fitting function to determine whether the ADC channel is abnormal or not;
the sampling process comprises the following steps:
controlling a DAC channel to send a coupling signal to the ADC channel;
and when the ADC channel receives the coupling signal, acquiring the first power parameter and the first temperature parameter of the ADC channel.
2. The sampling channel abnormality diagnostic method according to claim 1, characterized in that the diagnostic process includes the steps of:
controlling the DAC channel to send an excitation signal to an external device so that the external device returns a sampling signal to the ADC channel;
when the ADC channel receives the sampling signal, acquiring an actual power parameter and an actual temperature parameter of the ADC channel;
calculating to obtain a theoretical power parameter of the ADC channel according to the actual temperature parameter and the fitting function;
calculating to obtain the channel loss of the ADC channel according to the actual power parameter, the theoretical power parameter and a preset calculation formula;
and confirming whether the ADC channel is abnormal or not according to the channel loss.
3. The sampling channel abnormality diagnosis method according to claim 2, wherein the confirming whether the ADC channel is abnormal according to the channel loss includes:
comparing the channel loss with a preset loss threshold;
and when the channel loss is larger than the loss threshold value, confirming that the ADC channel is abnormal.
4. The method for diagnosing abnormality of a sampling channel according to claim 1, further comprising the steps of:
recording the abnormal number of the ADC channels, and comparing the abnormal number with a preset abnormal threshold value;
and when the abnormal number is larger than the abnormal threshold value, confirming that the DAC channel is abnormal.
5. A sampling channel abnormality diagnostic device characterized by comprising:
the configuration module is used for receiving and storing a preset first temperature range and a preset first temperature and storing a fitting function;
the sampling module is used for controlling a DAC channel to send a coupling signal to an ADC channel, and acquiring the first power parameter and the first temperature parameter of the ADC channel when the ADC channel receives the coupling signal;
the setting module is used for responding to a setting instruction, and under the condition that the current temperature is within the first temperature range, sampling each ADC channel by using the sampling module at intervals of the first temperature to obtain a plurality of sampling parameters of each ADC channel, wherein the sampling parameters comprise the first power parameter and the first temperature parameter;
the fitting module is used for fitting all the sampling parameters of each ADC channel to obtain the fitting function of each ADC channel;
and the diagnosis module is used for responding to a diagnosis instruction and performing diagnosis processing on each ADC channel by using the fitting function so as to determine whether the ADC channel is abnormal or not.
6. The sampling channel abnormality diagnostic device according to claim 5, wherein the configuration module is further configured to receive and store a preset calculation formula, and the diagnostic module includes:
the signal sending unit is used for controlling the DAC channel to send an excitation signal to external equipment so that the external equipment returns a sampling signal to the ADC channel;
the parameter acquisition unit is used for acquiring an actual power parameter and an actual temperature parameter of the ADC channel under the condition that the ADC channel receives the sampling signal;
the first calculation unit is used for calculating theoretical power parameters of the ADC channel according to the actual temperature parameters and the fitting function;
the second calculation unit is used for calculating the channel loss of the ADC channel according to the actual power parameter, the theoretical power parameter and the calculation formula;
and the abnormity judging unit is used for confirming whether the ADC channel is abnormal or not according to the channel loss.
7. The sampling channel abnormality diagnosis device according to claim 6, wherein the configuration module is further configured to receive and store a preset loss threshold, and the abnormality determination unit includes:
a first comparing unit for comparing the channel loss with the loss threshold;
a first conclusion unit, configured to confirm that the ADC channel is abnormal if the channel loss is greater than the loss threshold.
8. The sampling channel abnormality diagnosis device according to claim 5, further comprising a second comparison unit and a second conclusion unit, wherein the configuration module is further configured to receive and store a preset abnormality threshold;
the second comparison unit is used for recording the abnormal number of the ADC channel and comparing the abnormal number with the abnormal threshold value;
the second conclusion unit is used for confirming that the DAC channel is abnormal under the condition that the number of the abnormity is larger than the abnormity threshold value.
9. A computer device comprising a processor and a memory, the memory storing a computer program, the processor implementing the sampling channel abnormality diagnostic method according to any one of claims 1 to 4 when executing the computer program.
10. A storage medium storing computer-executable instructions which, when executed by a computer, implement the sampling channel abnormality diagnostic method according to any one of claims 1 to 4.
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| CN114421962B (en) | 2023-03-24 |
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