CN114414378A - Detection system and method for missile adapter of missile packing box - Google Patents
Detection system and method for missile adapter of missile packing box Download PDFInfo
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- CN114414378A CN114414378A CN202210316953.3A CN202210316953A CN114414378A CN 114414378 A CN114414378 A CN 114414378A CN 202210316953 A CN202210316953 A CN 202210316953A CN 114414378 A CN114414378 A CN 114414378A
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/08—Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M13/00—Testing of machine parts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N3/32—Investigating strength properties of solid materials by application of mechanical stress by applying repeated or pulsating forces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0001—Type of application of the stress
- G01N2203/0003—Steady
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0001—Type of application of the stress
- G01N2203/0005—Repeated or cyclic
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0014—Type of force applied
- G01N2203/0016—Tensile or compressive
- G01N2203/0019—Compressive
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
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- G01N2203/0075—Strain-stress relations or elastic constants
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Abstract
The application provides a detection system and a detection method for a missile adapter of a missile packing box, wherein the detection system comprises an information acquisition module, a judgment module and a test database; the test database comprises a category module, a test scene module and a threshold module; the class module comprises the class of the missile adapter, a test area of the missile adapter corresponding to the class and a weight corresponding to the test area; the test scene module comprises a preset test scene; the threshold module comprises a maximum deformation standard value, an area abnormal score threshold value and a distribution rate threshold value of each test area; the information acquisition module is used for collecting deformation generated by a test area of a test sample in a test scene; the judging module is used for judging whether the deformation of the detection area is normal or not according to the test area. The application improves the detection efficiency.
Description
Technical Field
The application relates to the field of rapid detection of missile adapters, in particular to a rapid detection system of a missile adapter and a rapid detection method thereof.
Background
In the existing various missile packing boxes, missiles in the box are usually fixed by adopting an adapter mode, and the adapter is used for finishing the protection effect of the packing box on the missiles in the processes of storage, transportation and transportation, and specifically comprises the step of providing a vibration damping effect on the missiles when the packing box is impacted or vibrated; the missile is effectively supported and protected during transportation; the necessary restraining force is provided for the missile in the box when the packing box is accidentally dropped and overturned in the transferring process, and the missile is prevented from being damaged.
In order to ensure the safety of storage and transportation of missiles, before the missile adapter is specifically installed, the missile adapter needs to be detected to ensure that the adaptive performance of the adapter can meet the use condition, and when the adapter is not uniform in shape, specification and material and even a plurality of parts are combined together, a more complicated detection mode, such as partition detection and the like, needs to be carried out to accurately judge whether the adapter can have a good adaptive effect, so that the detection efficiency is inevitably greatly reduced, and if the adapter is not accurately detected, the missile safety problem or the launching fault problem can be caused, and a great potential safety hazard is caused.
Disclosure of Invention
In order to solve the problems, the application provides a rapid detection system of a missile adapter, which comprises an information acquisition module, a judgment module and a test database;
the test database comprises a category module, a test scene module and a threshold module; the class module comprises the class of the missile adapter, a test area of the missile adapter corresponding to the class and a weight corresponding to the test area; the test scene module comprises a preset test scene; the threshold module comprises a maximum deformation standard value, an area abnormal score threshold value and a distribution rate threshold value of each test area;
the information acquisition module is used for collecting deformation generated by a test area of a test sample in a test scene;
the judging module is used for judging whether the deformation of the detection area is normal or not according to the deformation quantity generated by the test area in the test scene and the maximum standard value of the deformation, and when the deformation is abnormal, the calculation is carried out according to the area abnormal score threshold and the distribution rate threshold, so that the dominant abnormal area of any type of missile adapter in any test scene is obtained.
Preferably, the judging module comprises a deformation judging module, an abnormal score calculating module and an abnormal distribution rate calculating module; the deformation judging module is used for judging whether the deformation of the detection area is normal or not according to the deformation quantity of the test area generated in the test scene; the abnormal score calculation module is used for calculating and obtaining an abnormal area of the current sample in any test scene; the abnormal distribution rate calculation module is used for calculating and obtaining an explicit abnormal region of any type of samples in any test scene.
Preferably, the test scenario includes a static pressure test scenario, a variable pressure test scenario, a vibration test scenario, or a guiding test scenario.
Preferably, in a static pressure test scene, deformation detection is carried out on the missile adapter after fixed pressure is used; in a variable pressure test scene, deformation detection is carried out on the missile adapter in a mode of alternating variable pressure and fixed pressure; in a vibration test scene, after simulating severe vibration, carrying out deformation detection on the missile adapter; in a guiding test scene, pressure with an inclined angle is applied to the missile adapter, so that the stress on the surface of the missile adapter is in an uneven state, and then deformation detection is carried out.
The application also provides a detection method of the detection system for the missile adapter of the missile packing box, which comprises the following steps:
s10, setting the missile adapter as the test sample to comprise n classes, wherein the sample class P = [ P ]1，P2，P3，…，Pn]Wherein the ith class PiIncluding m test areas, class i PiTest area PIR = [ ]1，PIR2，PIR3，…，PIRm](ii) a Wherein the ith category P is setiJ test area PIRjCorresponding weight of is thetaj;
S20, setting the test system to comprise k classes of test scenarios, wherein the class of the test scenarios Q = [ Q ]1，Q2，Q3，…，Qk]Wherein in the ω -th class test scenario QωObtaining a jth test area PIR of a sample PIA to be detected and belonging to an ith categoryjAmount of deformation Bj;
Setting the ith category PiJ test area PIRjMaximum standard value B of deformationj0;
When B is presentj＜Bj0Then, the j test area PIR is judgedjDeformation is normal, and deformation quantity is not recorded;
when B is presentj≥Bj0Then, the j test area PIR is judgedjRecording the J test area PIR when the deformation is abnormaljAbnormal difference in deformation of Delta Bj=Bj-Bj0;
S30, according to j test area PIRjCorresponding weight of thetajObtaining a jth test area PIRjIs abnormal score of
；
S40, setting a region abnormal score threshold value
When the jth test area PIRjIs abnormal score of
Then, the jth test area PIRjRecording as the sample PIA in the omega type test scene QωA lower abnormal region;
testing the sample PIA in the omega type test scene QωAll abnormal areas under the test are recorded in the omega-type test scene of the sample PIA
QωIn the abnormal area list of (2);
s50, setting the ith category PiThere are c test samples according to all ith classes PiTest sample in the omega-type test scenario QωList of abnormal regions from the i-th class PiAll test areas of the test specimen under the omega-type test scenario QωMake the lower part intoTotal count NUM for abnormal regionGeneral assemblyAnd the ith category PiIn the jth test area of the test sample in the omega-type test scene QωTotal count of lower occurrence of exceptions NUMj；
Obtaining a jth test area PIRjIn the omega-type test scenario QωLower anomaly distribution ratio λ = NUMj/NUMGeneral assembly；
Setting a distribution rate threshold lambda0；
When lambda is more than or equal to lambda0Then, the jth test area PIRjAs the ith class PiThe dominant abnormal region of (a);
s60, recording the ith category PiIn the omega-type test scenario QωNext, the ith category P to be detectediAnd the adapter carries out priority detection display on the explicit abnormal area.
Preferably, the method further includes step S70 of setting a dominant abnormal region PIRjThe correlation threshold value in the omega-type test scene is W;
if the z test area PIRz(z ≠ j) in the ω -th class test scenario QωTotal count NUM of occurrence of abnormality in testz(ii) a Setting S = NUMz/NUMj；
When S is more than or equal to W;
if the z test area PIRzIn the omega-type test scenario QωLower abnormal distribution ratio lambdaz<λ0(ii) a The z-th test area PIR is used in the testzAs dominant abnormal region PIRjThe associated area of (a) is displayed.
The beneficial effect that this application realized is as follows:
the missile adapter detection method and device can improve detection efficiency while accurately detecting the missile adapter. According to the method, the frequency distribution of abnormal deformation of any test area of each type of sample under any test scene is obtained according to the deformation conditions of different test areas of different types of test samples under different test scenes, so that abnormal conditions of the areas under the scenes can be summarized, the abnormal conditions can be obtained after statistics and judgment are carried out on the abnormal conditions, the abnormal conditions can be used as judgment standards, the test area with high abnormal risk under a certain scene is used as an explicit abnormal area, detection is preferentially carried out, the test samples of the same type can be rapidly detected, and meanwhile the detection accuracy and the detection efficiency of the missile adapter are improved.
Detailed Description
The technical solutions in the embodiments of the present application are clearly and completely described below, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The system for rapidly detecting the missile adapter comprises an information acquisition module, a judgment module and a test database;
the test database comprises a category module, a test scene module and a threshold module; the class module comprises test areas of missile adapters in various classes and weights corresponding to the test areas; the test scene module comprises a preset test scene; the threshold module comprises a maximum deformation standard value, an area abnormal score threshold value and a distribution rate threshold value of each test area;
the information acquisition module is used for collecting deformation generated by a test area of a test sample in a test scene;
the judging module is used for judging whether the deformation of the detection area is normal or not according to the deformation quantity generated by the test area in the test scene, and when the deformation is abnormal, the abnormal area of the current sample in the current test scene is obtained by calculating according to the abnormal difference value and the threshold value in the threshold value module, so that the dominant abnormal area of the sample of any type in any test scene is obtained. The judging module comprises a deformation judging module, an abnormal score calculating module and an abnormal distribution rate calculating module; the deformation judging module is used for judging whether the deformation of the detection area is normal or not according to the deformation quantity of the test area generated in the test scene; the abnormal score calculation module is used for calculating and obtaining an abnormal area of the current sample in any test scene; the abnormal distribution rate calculation module is used for calculating and obtaining an explicit abnormal region of any type of samples in any test scene.
And taking the dominant abnormal region as a detection region for quick judgment.
The missile adapter is designed according to the storage and transportation conditions of the missile, particularly the static and dynamic stress-deformation characteristics and the mechanical creep performance requirements of the missile.
The specific adapter types can be classified according to the use requirements, such as the storage stage of the missile, namely the period from loading to completion of launching of the missile is generally long, so that the adapter with certain static compressive strength and rigidity as a support function is required; the missile is impacted and vibrated in the hoisting and transporting processes, and the adapter with good shock absorption and vibration reduction functions is required at the moment so as to avoid the damage of electrical components on the missile and prolong the service life of the missile.
The adapter for missile packing box is formed from ring elastic liner made of soft elastic material, and is fixed in the interior of packing box along the axial direction of the packing box by means of adhesion or mechanical fixing mode, and the surface of adapter and sealing gasket contacted with missile is coated with a layer of material with low friction coefficient, for example teflon so as to reduce friction between the adapter and sealing gasket and missile, and two ends of both them are equipped with oblique surfaces to facilitate transportation, loading and unloading of missile, and said adapter is not very high in sealing action, so that it can adopt non-complete ring structure, and the ring sealing gasket is formed from cylindrical body portion contacted with box and lip portion contacted with surface of missile, and the inner diameter of the lip portion is smaller than outer diameter of missile, and the lip portion of sealing gasket can be bent under the compression action of missile when the missile is loaded, therefore, the attachment between the guided missile and the adapter can be effectively ensured, and the guided missile is prevented from being damaged in the transportation bumping process due to the gap.
Specifically, the missile adapter is set to comprise n classes, wherein the class of the adapter P = [ P = [ P ]1，P2，P3，…，Pn]Wherein the i-th adapter PiIncluding m test zones, class i adapters PiTest area PIR = [ ]1，PIR2，PIR3，…，PIRm]Wherein P isiJ test area PIRjComprising r test points, PiTest point PIRJ = [ PIRJ ] of jth test area of (1)1，PIRJ2，PIRJ3，…，PIRJr]Setting the z-th detection point in the test area PIRJzCorresponding weight of is thetaz;
The setting test system comprises k test scenes, and the test scenes are of the type Q = [ Q =1，Q2，Q3，…，Qk]Wherein the ith test scenario QiAccording to the test point PIRJ in the test resultzAmount of deformation of (B)zAnd test point PIRJzExceeding the maximum standard value B of deformationz0Then, the difference Delta B is recordedz=Bz-Bz0Then test point PIRJ can be obtainedzIs an abnormality score ofz△BzObtaining a jth test area PIRjIs abnormal score of
；
Setting a fractional threshold epsilon0When the jth test area PIRjIs abnormal fraction epsilonj≥ε0Then, the jth test area PIRjJudging as the ith test scene QiA lower abnormal region;
obtaining the test scene Q of all test samples in the ith classiThe test result is obtained to obtain the ith test scene QiException count NUM of all the areas underQi；
I.e. class i test scenario QiDistributing abnormal areas, wherein the number of test samples is c, and obtaining the ith test scene Q of the jth test areaiLower anomaly distribution Rate NUMj/c
When the abnormal distribution rate is larger than the abnormal distribution rate threshold value, taking the jth test area as the ith test scene QiLower dominant abnormal regionA domain;
and obtaining the counts of the abnormal regions under all the test scene types, and setting the abnormal regions with the count correlation values larger than the correlation threshold value as the correlation abnormal regions.
Finding out corresponding associated abnormal regions in the dominant abnormal regions as the ith type test scene QiThe following explicit association anomaly region.
In this embodiment, 5 classes of missile adapters are tested, one class of sample is selected, and a 002 transportation-damping class of test sample is taken as an example, the test sample includes 6 test regions (test region 1, test region 2, test region 3, test region 4, test region 5 and test region 6), the 6 test regions are distributed on the circumferential surface and the transverse surface of the test sample, the 6 test regions can cover all positions of the class of adapter, each test region of the class of missile adapter includes a plurality of test points, for example, the test region C includes 5 test points (test point a, test point B, test point C, test point D and test point E), and weights corresponding to the 5 test points are 1.5, 1.2, 1.4 and 1.5.
The test system of the embodiment totally comprises 4 types of test scenes, namely a static pressure test scene, a variable pressure test scene, a vibration test scene and a guiding test scene;
in a static pressure test scene, deformation detection is carried out on the missile adapter by using fixed pressure, in a variable pressure test scene, deformation detection is carried out on the missile adapter by using variable + fixed pressure, in a high-frequency vibration test scene, deformation detection is carried out on the missile adapter after severe vibration conditions are simulated, in a guide test scene, stress of an inclined angle needs to be applied to the missile adapter, the stress on the surface of the missile adapter is in an uneven state, and deformation detection is carried out after the test.
For example, in a transformation test scenario, the deformation amount B of all the test points C in the test area 2 of the 002 class test sample is obtained, and the maximum standard deformation amount B of the test points C in the historical data is passed0By pairing B and B0The comparison can obtain whether the deformation of the test point C is in a normal range or not, and if B is less than B0Then the description of test point CIf the deformation after the test is in the normal range, the test point C is not abnormal, the detection of the next test point is continued, and if B is more than or equal to B0If the deformation quantity of the test point C after the test is abnormal, the test point C is taken as an abnormal test point, and the abnormal difference value delta B = B-B of the test point C is recorded0Obtaining an abnormal score of the test point C as
;
Obtaining the abnormal difference values of all abnormal test points in the test area 2 to obtain the abnormal score of the test area 2
;
Anomaly score threshold ε for known test zone 20When epsilon2≥ε0Taking the test area 2 as an abnormal area of the test sample in a variable-voltage test scene;
and in analogy, recording all abnormal areas of the test sample in the variable-voltage test scene in a test sample 1-scene 2-abnormal area list.
In the same way, an abnormal area list of the same type of c test samples under each scene is obtained: for example, test sample 1-scene 1-exception region list, test sample 1-scene 2-exception region list, … …, test sample 2-scene 1-exception region list, … …, test sample c-scene 4-exception region list;
obtaining the abnormal count NUM of any test area i under all test scenes according to the abnormal area listi(ii) a Obtaining the total abnormal count of 6 test areas simultaneously
To be provided with
Setting the abnormal count of the area 2 to NUM under all test scenes2Obtaining the abnormal distribution rate lambda = NUM of the test area 22/NUMGeneral assembly；
Setting a distribution rate threshold lambda0；
When lambda is more than or equal to lambda0Taking test area 2 asA dominant abnormal region of the test sample class.
When the adapter is rapidly detected, only the dominant abnormal area of the adapter is detected, and through specific tests, the detection accuracy is more than ninety two percent, so that other areas do not need to be detected, and the detection efficiency can be improved by more than eighty percent.
Meanwhile, in order to further improve the precision, a dominant abnormal region PIR is setjThe correlation threshold value in the omega-type test scene is W; if the z test area PIRz(z ≠ j) in the ω -th class test scenario QωTotal count NUM of occurrence of abnormality in testzW is larger than the total weight of the steel; simultaneous z-th test area PIRzIn the omega-type test scenario QωLower abnormal distribution ratio lambdaz<λ0(ii) a Then the z-th test area PIR is testedzAs dominant abnormal region PIRjThe associated area of (a) is displayed.
The specific test scenario includes, for example, that 5 different missile adapter specification types are stored in the system, and the missile adapter to be detected is in the category of '002 transportation-damping'; obtaining detection points 'detection point A, detection point B, detection point C, detection point D, detection point E and detection point F' in the deformation detection index of the '002 transportation-damping' type missile adapter in the database, wherein the weights corresponding to the detection points in the deformation detection index are 1.2, 1.4, 1.4, 1.5 and 1.2, and the basic test time period of the obtained detection points is 240 s;
taking the detection point D as an example, the test time period for which the detection point D can be obtained is 240s × 1.5=360 s.
The detection period of the detection point D includes a fixed pressure period Ta1And a variable pressure period Tb1According to the formula
Obtaining a time period of varying pressure
；
Fixed pressure time period
；
That is, during the test, the fixed pressure of 240s is applied to the detection point D, the variable pressure of 120s is applied, and then the amount of deformation at the detection point D is detected to obtain the amount of deformation.
While the preferred embodiments of the present application have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all alterations and modifications as fall within the scope of the application. It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (6)
1. A detection system for a missile adapter of a missile packing box is characterized by comprising an information acquisition module, a judgment module and a test database;
the test database comprises a category module, a test scene module and a threshold module; the class module comprises the class of the missile adapter, a test area of the missile adapter corresponding to the class and a weight corresponding to the test area; the test scene module comprises a preset test scene; the threshold module comprises a maximum deformation standard value, an area abnormal score threshold value and a distribution rate threshold value of each test area;
the information acquisition module is used for collecting deformation generated by a test area of a test sample in a test scene;
the judging module is used for judging whether the deformation of the detection area is normal or not according to the deformation quantity generated by the test area in the test scene and the maximum standard value of the deformation, and when the deformation is abnormal, the calculation is carried out according to the area abnormal score threshold and the distribution rate threshold, so that the dominant abnormal area of any type of missile adapter in any test scene is obtained.
2. The system for detecting a missile adapter for a missile packing box according to claim 1, wherein the judging module comprises a deformation judging module, an abnormal score calculating module and an abnormal distribution rate calculating module; the deformation judging module is used for judging whether the deformation of the detection area is normal or not according to the deformation quantity of the test area generated in the test scene; the abnormal score calculation module is used for calculating and obtaining an abnormal area of the current sample in any test scene; the abnormal distribution rate calculation module is used for calculating and obtaining an explicit abnormal region of any type of samples in any test scene.
3. The system of claim 1, wherein the test scenarios include static pressure test scenarios, variable pressure test scenarios, vibration test scenarios, and guided test scenarios.
4. The missile adapter detection system for missile packing boxes of claim 3, wherein the missile adapter is subjected to deformation detection after a fixed pressure is used in a static pressure test scene; in a variable pressure test scene, deformation detection is carried out on the missile adapter in a mode of alternating variable pressure and fixed pressure; in a vibration test scene, after simulating severe vibration, carrying out deformation detection on the missile adapter; in a guiding test scene, pressure with an inclined angle is applied to the missile adapter, so that the stress on the surface of the missile adapter is in an uneven state, and then deformation detection is carried out.
5. An inspection method using the inspection system for missile adapters for missile packing boxes of any one of claims 1 to 4, comprising the steps of:
s10, setting the missile adapter as the test sample to comprise n classes, wherein the sample class P = [ P ]1，P2，P3，…，Pn]Wherein the ith class PiIncluding m test areas, class i PiTest area PIR = [ ]1，PIR2，PIR3，…，PIRm](ii) a Wherein the ith category P is setiJ test area PIRjCorresponding weight of is thetaj;
S20, setting the test system to comprise k classes of test scenarios, wherein the class of the test scenarios Q = [ Q ]1，Q2，Q3，…，Qk]Wherein in the ω -th class test scenario QωObtaining a jth test area PIR of a sample PIA to be detected and belonging to an ith categoryjAmount of deformation Bj;
Setting the ith category PiJ test area PIRjMaximum standard value B of deformationj0;
When B is presentj＜Bj0Then, the j test area PIR is judgedjDeformation is normal, and deformation quantity is not recorded;
when B is presentj≥Bj0Then, the j test area PIR is judgedjRecording the J test area PIR when the deformation is abnormaljAbnormal difference in deformation of Delta Bj=Bj-Bj0;
S30, according to j test area PIRjCorresponding weight of thetajObtaining a jth test area PIRjIs abnormal score of
；
S40, setting a region abnormal score threshold value
When the jth test area PIRjIs abnormal score of
Then, the jth test area PIRjRecording as the sample PIA in the omega type test scene QωA lower abnormal region;
testing the sample PIA in the omega type test scene QωAll abnormal areas under the test are recorded in the omega-type test scene of the sample PIA
QωIn the abnormal area list of (2);
s50, setting the ith category PiThere are c test samples according to all ith classes PiTest sample in the omega-type test scenario QωList of abnormal regions from the i-th class PiAll test areas of the test specimen under the omega-type test scenario QωTotal count NUM of next abnormal regionGeneral assemblyAnd the ith category PiIn the jth test area of the test sample in the omega-type test scene QωTotal count of lower occurrence of exceptions NUMj；
Obtaining a jth test area PIRjIn the omega-type test scenario QωLower anomaly distribution ratio λ = NUMj/NUMGeneral assembly；
Setting a distribution rate threshold
；
When in use
Then, the jth test area PIRjAs the ith class PiThe dominant abnormal region of (a);
s60, recording the ith category PiIn the omega-type test scenario QωNext, the ith category P to be detectediAnd the adapter carries out priority detection display on the explicit abnormal area.
6. The method of detecting a system for detecting missile adapters for missile packing boxes according to claim 5, further comprising the step of setting a PIR (passive infrared) region as an explicit abnormal region S70jThe correlation threshold value in the omega-type test scene is W;
if the z test area PIRz(z ≠ j) in the ω -th class test scenario QωTotal count NUM of occurrence of abnormality in testz(ii) a Setting S = NUMz/NUMj；
When S is more than or equal to W;
if the z test area PIRzIn the omega-type test scenario QωLower abnormal scoreCloth rate lambdaz<λ0(ii) a The z-th test area PIR is used in the testzAs dominant abnormal region PIRjThe associated area of (a) is displayed.
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| CN114486533A (en) * | 2022-04-18 | 2022-05-13 | 天津航天和兴科技有限公司 | Partitioned intelligent test system for missile adapter and test method thereof |
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