CN114398287A - Test scheme generation method and device - Google Patents
Test scheme generation method and device Download PDFInfo
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- CN114398287A CN114398287A CN202210060040.XA CN202210060040A CN114398287A CN 114398287 A CN114398287 A CN 114398287A CN 202210060040 A CN202210060040 A CN 202210060040A CN 114398287 A CN114398287 A CN 114398287A
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3684—Test management for test design, e.g. generating new test cases
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
- G06F11/3676—Test management for coverage analysis
Abstract
The invention provides a test scheme generation method and a test scheme generation device, which can be applied to the field of artificial intelligence or the field of finance. Meanwhile, the target test cases are sequenced according to the historical test attributes of the target test cases, so that a test scheme is automatically generated according to the number of the target test cases, the test implementation period and the sequencing of the target test cases, and the test analysis, the test design and the test implementation efficiency are improved.
Description
Technical Field
The invention relates to the technical field of software testing, in particular to a method and a device for generating a testing scheme.
Background
With the adoption of agile development methods by more and more development teams at present, agile test methods are in force. In order to respond to the rapid change of the demand, realize the rapid delivery of the software and support the sustainability of the test, the agile test needs to be capable of rapidly identifying the demand and rapidly generating a corresponding agile test scheme.
Disclosure of Invention
In view of this, the present invention provides a method and an apparatus for generating a test scheme, which automatically and quickly generate a test scheme after obtaining a test requirement, thereby effectively improving test analysis, test design and test implementation efficiency.
In order to achieve the above purpose, the invention provides the following specific technical scheme:
a test scenario generation method, comprising:
acquiring a test requirement;
selecting a target test outline and a target test case matched with the test requirement from a pre-constructed test library;
sequencing the target test cases according to the historical test attributes of the target test cases;
and generating a test scheme according to the number of the target test cases, the test implementation period and the sequence of the target test cases.
Optionally, the selecting a target test outline and a target test case matching the test requirement from a pre-constructed test library includes:
matching the test requirement with the high-frequency words in the test library by using a preset text comparison method to obtain target high-frequency words matched with the test requirement;
and determining the test outline corresponding to the target high-frequency word as the target test outline, and determining the test case corresponding to the target high-frequency word as the target test case.
Optionally, constructing the test library includes:
acquiring historical test requirements and test schemas and test cases corresponding to the historical test requirements;
marking the incidence relation among the historical test requirements, the test outline and the test case;
and preprocessing the historical test requirements to obtain high-frequency words corresponding to the historical test requirements, wherein the test outline and the test case corresponding to each high-frequency word form the test library.
Optionally, the sorting the target test cases according to the historical test attributes of the target test cases includes:
sorting the target test cases in a descending order according to the single number of the associated problems;
aiming at the target test cases with the same associated problem singular number, sequencing the target test cases in a descending order according to the test task number;
aiming at the target test cases with the same associated problem odd number and the same test task number, sequencing the target test cases in a descending order according to the test interruption times;
aiming at the target test cases with the same associated problem odd number, the same test task number and the same test interruption times, sequencing the target test cases in an ascending order according to the test date;
and aiming at the target test cases with the same associated problem odd number, the same test task number, the same test interruption times and the same test date, sequencing the target test cases in a descending order according to the test priority.
Optionally, generating a test scheme according to the number of the target test cases, the test implementation period, and the sequence of the target test cases includes:
determining the ratio of the number of the target test cases to the test implementation period as the average number of the daily execution cases;
according to the sequence of the target test cases, determining the first half of the target test cases in the sequence as a first part of cases, and determining the second half of the target test cases in the sequence as a second part of cases;
and sequentially and respectively extracting the first part of cases and the second part of cases in equal quantity to form a daily execution case according to the sequence of the target test cases.
Optionally, after the generating the test solution, the method further includes:
and under the condition of receiving a test scheme adjusting instruction, adjusting the test scheme according to the test scheme adjusting instruction.
A test scenario generation apparatus, comprising:
the test requirement acquisition unit is used for acquiring a test requirement;
the test requirement matching unit is used for selecting a target test outline and a target test case which are matched with the test requirement from a pre-constructed test library;
the test case sorting unit is used for sorting the target test cases according to the historical test attributes of the target test cases;
and the test scheme generating unit is used for generating a test scheme according to the number of the target test cases, the test implementation period and the sequencing of the target test cases.
Optionally, the test requirement matching unit is specifically configured to:
matching the test requirement with the high-frequency words in the test library by using a preset text comparison method to obtain target high-frequency words matched with the test requirement;
and determining the test outline corresponding to the target high-frequency word as the target test outline, and determining the test case corresponding to the target high-frequency word as the target test case.
Optionally, the apparatus further comprises:
the test library construction unit is used for acquiring historical test requirements and test schemas and test cases corresponding to the historical test requirements; marking the incidence relation among the historical test requirements, the test outline and the test case; and preprocessing the historical test requirements to obtain high-frequency words corresponding to the historical test requirements, wherein the test outline and the test case corresponding to each high-frequency word form the test library.
Optionally, the test case sorting unit is specifically configured to:
sorting the target test cases in a descending order according to the single number of the associated problems;
aiming at the target test cases with the same associated problem singular number, sequencing the target test cases in a descending order according to the test task number;
aiming at the target test cases with the same associated problem odd number and the same test task number, sequencing the target test cases in a descending order according to the test interruption times;
aiming at the target test cases with the same associated problem odd number, the same test task number and the same test interruption times, sequencing the target test cases in an ascending order according to the test date;
and aiming at the target test cases with the same associated problem odd number, the same test task number, the same test interruption times and the same test date, sequencing the target test cases in a descending order according to the test priority.
Optionally, the test scheme generating unit is specifically configured to:
determining the ratio of the number of the target test cases to the test implementation period as the average number of the daily execution cases;
according to the sequence of the target test cases, determining the first half of the target test cases in the sequence as a first part of cases, and determining the second half of the target test cases in the sequence as a second part of cases;
and sequentially and respectively extracting the first part of cases and the second part of cases in equal quantity to form a daily execution case according to the sequence of the target test cases.
Optionally, the apparatus further comprises:
and the test scheme modification unit is used for adjusting the test scheme according to the test scheme adjustment instruction under the condition of receiving the test scheme adjustment instruction.
Compared with the prior art, the invention has the following beneficial effects:
according to the test scheme generation method disclosed by the invention, the test library is constructed in advance, and after the test requirements are obtained, the target outline and the target test case matched with the test requirements are quickly selected from the test library, so that the multiplexing of the outline and the test case is realized, and the analysis design redundancy caused by the inconsistency of the test requirements of testers is avoided. Meanwhile, the target test cases are sequenced according to the historical test attributes of the target test cases, so that a test scheme is automatically generated according to the number of the target test cases, the test implementation period and the sequencing of the target test cases, and the test analysis, the test design and the test implementation efficiency are improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a schematic flow chart illustrating a test scenario generation method according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a part of a method for generating a test scenario according to an embodiment of the present invention;
FIG. 3 is a schematic flow chart of a part of a method for generating a test scenario according to an embodiment of the present invention;
FIG. 4 is a schematic flow chart of a part of a method for generating a test scenario according to an embodiment of the present invention;
fig. 5 is a schematic structural diagram of a test scenario generation apparatus according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The inventor finds out through research that: besides developers, testers also need to master methods for meeting the requirements of rapid changes in the agile development process. The existing outline case multiplexing is generally based on empirical analysis of a test manager, and the existing outline and case are referred according to a functional module, so that the analysis granularity is not fine enough, and the related outline and case are difficult to accurately position. Meanwhile, the existing case generally has no implementation plan, or a test manager formulates a test scheme according to experience, so that the efficiency is low.
In order to solve the technical problems, the invention provides a test scheme generation method, which is characterized in that a test library is constructed in advance, after a test requirement is obtained, a target outline and a target test case matched with the test requirement are quickly selected from the test library, the outline and the test case are reused, and analysis design redundancy caused by inconsistent comprehension of test requirements of testers is avoided. Meanwhile, the target test cases are sequenced according to the historical test attributes of the target test cases, so that a test scheme is automatically generated according to the number of the target test cases, the test implementation period and the sequencing of the target test cases, and the test analysis, the test design and the test implementation efficiency are improved.
Specifically, referring to fig. 1, a test scenario generation method disclosed in this embodiment includes the following steps:
s101: acquiring a test requirement;
for the convenience of subsequent processing, the test requirements are input by the user in a specific format, such as a text format.
S102: selecting a target test outline and a target test case matched with the test requirements from a pre-constructed test library;
referring to fig. 2, the embodiment provides an optional method for constructing a test library, which specifically includes the following steps:
s201: acquiring historical test requirements and test schemas and test cases corresponding to the historical test requirements;
the historical test requirements are the test requirements corresponding to at least one test task which is implemented historically, and each historical test requirement corresponds to a test outline and a test case respectively.
S202: marking the incidence relation between the historical test requirements and the test outline as well as the test cases;
namely, the association relationship between the marking historical test requirements and the test outline, and the association relationship between the marking historical test requirements and the at least one test case.
S203: and preprocessing the historical test requirements to obtain high-frequency words corresponding to the historical test requirements, wherein the test outline and the test cases corresponding to each high-frequency word form a test library.
Preprocessing the historical test requirements comprises: and sequentially performing word segmentation processing, word frequency unified processing, stop word processing and the like on the historical test requirements. The method comprises the steps of preprocessing historical test requirements to obtain at least one high-frequency word corresponding to the historical test requirements, and marking the association relation among the historical test requirements, a test outline and a test case in advance, so that the association relation also exists among the high-frequency word, the test outline and the test case. On the basis, the test outline and the test case corresponding to each high-frequency word form a test library.
After a test library is constructed and test requirements are obtained, matching the test requirements with high-frequency words in the test library by using a preset text comparison method, such as a google diff-match-patch text comparison method, to obtain target high-frequency words matched with the test requirements, determining a test outline corresponding to the target high-frequency words as a target test outline, and determining test cases corresponding to the target high-frequency words as target test cases.
Specifically, when the test requirement is matched with the high-frequency words in the test library, the high-frequency words with similarity between the test requirement and the high-frequency words in the test library larger than the threshold value may be determined as the target high-frequency words matched with the test requirement.
Because the test requirements are analyzed through the NLP technology, the test outline and the test cases are quickly matched by comparing the similar test requirements in the test library, the test outline and the test cases are multiplexed, and the analysis design redundancy caused by the inconsistency of the requirement comprehension of testers is avoided.
S103: sequencing the target test cases according to the historical test attributes of the target test cases;
since the target test case is a test case in a historically implemented test task, the target test case has historical test attributes, such as an associated problem singular number, a test task number, a test interruption number, a test date, a test priority, and the like.
The importance degree of the historical test attributes can be determined according to actual requirements in an application scene, and the target test cases are sorted according to the importance degree of the historical test quantity. It will be appreciated that the importance of individual historical test attributes may vary from application scenario to application scenario.
Referring to fig. 3, the present embodiment provides an optional target test case sorting method, which specifically includes the following steps:
s301: and sorting the target test cases in a descending order according to the single number of the associated problems.
Each test case records a corresponding question list report in the execution process, and records the problems found in the test case in the execution process, so that the associated question list number represents the number of the problems found in the target test case in the execution process.
The target test cases are sorted in a descending order according to the single number of the associated problems, that is, the more the single number of the associated problems is, the higher the order is, the more the target test cases with more problems are preferentially executed.
S302: and aiming at the target test cases with the same associated problem singularity, sequencing the target test cases in a descending order according to the test task number.
After the target test cases are sorted in a descending order according to the associated problem singular number, the target test cases with the same associated problem singular number are sorted in a descending order according to the test task number, and the test task number is numbered according to the test task assignment date, so that the target test cases are sorted in a descending order according to the test task number, namely, the later the test task assignment date is, the earlier the test task assignment date is, and the purpose of preferentially executing the target test cases corresponding to the latest historical test task with the same associated problem singular number is achieved.
S303: and aiming at the target test cases with the same associated problem singular number and the same test task number, sequencing the target test cases in a descending order according to the test interruption times.
After the target test cases are sorted according to the associated problem singular number and the test task number, the target test cases with the same associated problem singular number and the same test task number are sorted in a descending order according to the test interruption times, the test interruption times indicate that the test cases cannot be completed in the same time, the interruption times are required in the period, the value range can be 1-9, the target test cases are sorted in the descending order according to the test interruption times, and the aim of preferentially executing the target test cases with more test interruption times is achieved.
It should be noted that, the target test case with the test interruption number greater than 1 needs to be marked, and needs to be continuously executed in the whole test process.
S304: and aiming at the target test cases with the same associated problem odd number, the same test task number and the same test interruption times, sequencing the target test cases in an ascending order according to the test date.
After the target test cases are sequenced according to the associated problem singular number, the test task number and the test interruption times, the target test cases with the same associated problem singular number, the same test task number and the same test interruption times are sequenced in an ascending order according to the test date, namely, the target test cases corresponding to the same test task number are tested according to the sequence of the historical test dates.
S305: and aiming at the target test cases with the same associated problem odd number, the same test task number, the same test interruption times and the same test date, sequencing the target test cases in a descending order according to the test priority.
After the target test cases are sorted according to the associated problem singular number, the test task number, the test interruption frequency and the test date, the target test cases with the same associated problem singular number, the same test task number, the same test interruption frequency and the same test date are sorted in a descending order according to the test priority, namely, the higher the test priority, the higher the order, the higher the target test cases are, the higher the test priority is, the target test cases are preferentially executed.
S104: and generating a test scheme according to the number of the target test cases, the test implementation period and the sequencing of the target test cases.
Referring to fig. 4, the present embodiment provides an alternative scheme for generating a test scheme, which specifically includes the following steps:
s401: determining the ratio of the number of the target test cases to the test implementation period as the average number of the daily execution cases;
s402: according to the sequence of the target test cases, determining the first half of the target test cases in the sequence as a first part of cases, and determining the second half of the target test cases in the sequence as a second part of cases;
s403: and sequentially and respectively extracting the first part of cases and the second part of cases in equal quantity to form daily execution cases according to the sequence of the target test cases.
If the number of target test cases is set as the variable counts and the test implementation period is set as the variable days, the average number of daily execution cases is equal to counts/days. According to the sequence of the target test cases, determining the first half of the target test cases in the sequence as a first part of cases, determining the second half of the target test cases in the sequence as a second part of cases, if the total number of the target test cases is 100, the test implementation period is 5 days, the average number of the cases executed every day is 20, the number of the first part of cases and the number of the second part of cases are respectively 50, the test cases executed in the first day are the first 10 of the first part of cases plus the first 10 of the second part of cases, and so on, and obtaining the test cases executed every day.
In order to enable the generated test scheme to be more flexible and accurate, the generated test scheme can be manually reanalyzed, and if the generated test scheme needs to be modified, the test scheme can be adjusted by sending a test scheme modification instruction and according to the test scheme modification instruction.
Therefore, according to the test scheme generation method disclosed by the embodiment, the test requirements are analyzed through the NLP technology, the similar requirements in the test library are compared, the test outline and the test case are rapidly matched, the test outline and the test case are multiplexed, and analysis design redundancy caused by the fact that testers understand the test requirements inconsistently is avoided; and simultaneously analyzing the early implementation condition of each test case to obtain a better implementation plan. Therefore, the embodiment can obtain the best matching test outline and test case, can provide the current better test case implementation plan, improves the efficiency of test analysis, test design and test implementation, and improves the reuse rate of the outline and the case.
Based on the method for generating a test solution disclosed in the foregoing embodiment, this embodiment correspondingly discloses a device for generating a test solution, please refer to fig. 5, where the device includes:
a test requirement obtaining unit 501, configured to obtain a test requirement;
a test requirement matching unit 502, configured to select a target test outline and a target test case matching the test requirement from a pre-constructed test library;
the test case sorting unit 503 is configured to sort the target test cases according to the historical test attributes of the target test cases;
the test scheme generating unit 504 is configured to generate a test scheme according to the number of the target test cases, the test implementation period, and the sequence of the target test cases.
Optionally, the test requirement matching unit 502 is specifically configured to:
matching the test requirement with the high-frequency words in the test library by using a preset text comparison method to obtain target high-frequency words matched with the test requirement;
and determining the test outline corresponding to the target high-frequency word as the target test outline, and determining the test case corresponding to the target high-frequency word as the target test case.
Optionally, the apparatus further comprises:
the test library construction unit is used for acquiring historical test requirements and test schemas and test cases corresponding to the historical test requirements; marking the incidence relation among the historical test requirements, the test outline and the test case; and preprocessing the historical test requirements to obtain high-frequency words corresponding to the historical test requirements, wherein the test outline and the test case corresponding to each high-frequency word form the test library.
Optionally, the test case sorting unit 503 is specifically configured to:
sorting the target test cases in a descending order according to the single number of the associated problems;
aiming at the target test cases with the same associated problem singular number, sequencing the target test cases in a descending order according to the test task number;
aiming at the target test cases with the same associated problem odd number and the same test task number, sequencing the target test cases in a descending order according to the test interruption times;
aiming at the target test cases with the same associated problem odd number, the same test task number and the same test interruption times, sequencing the target test cases in an ascending order according to the test date;
and aiming at the target test cases with the same associated problem odd number, the same test task number, the same test interruption times and the same test date, sequencing the target test cases in a descending order according to the test priority.
Optionally, the test scheme generating unit 504 is specifically configured to:
determining the ratio of the number of the target test cases to the test implementation period as the average number of the daily execution cases;
according to the sequence of the target test cases, determining the first half of the target test cases in the sequence as a first part of cases, and determining the second half of the target test cases in the sequence as a second part of cases;
and sequentially and respectively extracting the first part of cases and the second part of cases in equal quantity to form a daily execution case according to the sequence of the target test cases.
Optionally, the apparatus further comprises:
and the test scheme modification unit is used for adjusting the test scheme according to the test scheme adjustment instruction under the condition of receiving the test scheme adjustment instruction.
According to the test scheme generation device disclosed by the embodiment, the test library is constructed in advance, and after the test requirements are obtained, the target outline and the target test case matched with the test requirements are quickly selected from the test library, so that the outline and the test case are reused, and the analysis design redundancy caused by the inconsistency of the test requirements of testers is avoided. Meanwhile, the target test cases are sequenced according to the historical test attributes of the target test cases, so that a test scheme is automatically generated according to the number of the target test cases, the test implementation period and the sequencing of the target test cases, and the test analysis, the test design and the test implementation efficiency are improved.
It should be noted that the test scheme generation method and device provided by the invention can be applied to the field of artificial intelligence or the field of finance. The above description is only an example, and does not limit the application field of the test scheme generation method and apparatus provided by the present invention.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
It is further noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
The above embodiments can be combined arbitrarily, and the features described in the embodiments in the present specification can be replaced or combined with each other in the above description of the disclosed embodiments, so that those skilled in the art can implement or use the present application.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A test scenario generation method, comprising:
acquiring a test requirement;
selecting a target test outline and a target test case matched with the test requirement from a pre-constructed test library;
sequencing the target test cases according to the historical test attributes of the target test cases;
and generating a test scheme according to the number of the target test cases, the test implementation period and the sequence of the target test cases.
2. The method of claim 1, wherein selecting the target test schema and the target test cases matching the test requirements from the pre-constructed test library comprises:
matching the test requirement with the high-frequency words in the test library by using a preset text comparison method to obtain target high-frequency words matched with the test requirement;
and determining the test outline corresponding to the target high-frequency word as the target test outline, and determining the test case corresponding to the target high-frequency word as the target test case.
3. The method of claim 1, wherein constructing the test library comprises:
acquiring historical test requirements and test schemas and test cases corresponding to the historical test requirements;
marking the incidence relation among the historical test requirements, the test outline and the test case;
and preprocessing the historical test requirements to obtain high-frequency words corresponding to the historical test requirements, wherein the test outline and the test case corresponding to each high-frequency word form the test library.
4. The method of claim 1, wherein sorting the target test cases according to historical test attributes of the target test cases comprises:
sorting the target test cases in a descending order according to the single number of the associated problems;
aiming at the target test cases with the same associated problem singular number, sequencing the target test cases in a descending order according to the test task number;
aiming at the target test cases with the same associated problem odd number and the same test task number, sequencing the target test cases in a descending order according to the test interruption times;
aiming at the target test cases with the same associated problem odd number, the same test task number and the same test interruption times, sequencing the target test cases in an ascending order according to the test date;
and aiming at the target test cases with the same associated problem odd number, the same test task number, the same test interruption times and the same test date, sequencing the target test cases in a descending order according to the test priority.
5. The method of claim 1, wherein generating a test plan according to the number of the target test cases, the test implementation period, and the ordering of the target test cases comprises:
determining the ratio of the number of the target test cases to the test implementation period as the average number of the daily execution cases;
according to the sequence of the target test cases, determining the first half of the target test cases in the sequence as a first part of cases, and determining the second half of the target test cases in the sequence as a second part of cases;
and sequentially and respectively extracting the first part of cases and the second part of cases in equal quantity to form a daily execution case according to the sequence of the target test cases.
6. The method of claim 1, wherein after the generating a test plan, the method further comprises:
and under the condition of receiving a test scheme adjusting instruction, adjusting the test scheme according to the test scheme adjusting instruction.
7. A test scenario generation apparatus, comprising:
the test requirement acquisition unit is used for acquiring a test requirement;
the test requirement matching unit is used for selecting a target test outline and a target test case which are matched with the test requirement from a pre-constructed test library;
the test case sorting unit is used for sorting the target test cases according to the historical test attributes of the target test cases;
and the test scheme generating unit is used for generating a test scheme according to the number of the target test cases, the test implementation period and the sequencing of the target test cases.
8. The apparatus according to claim 7, wherein the test requirement matching unit is specifically configured to:
matching the test requirement with the high-frequency words in the test library by using a preset text comparison method to obtain target high-frequency words matched with the test requirement;
and determining the test outline corresponding to the target high-frequency word as the target test outline, and determining the test case corresponding to the target high-frequency word as the target test case.
9. The apparatus of claim 7, further comprising:
the test library construction unit is used for acquiring historical test requirements and test schemas and test cases corresponding to the historical test requirements; marking the incidence relation among the historical test requirements, the test outline and the test case; and preprocessing the historical test requirements to obtain high-frequency words corresponding to the historical test requirements, wherein the test outline and the test case corresponding to each high-frequency word form the test library.
10. The apparatus of claim 7, wherein the test case ordering unit is specifically configured to:
sorting the target test cases in a descending order according to the single number of the associated problems;
aiming at the target test cases with the same associated problem singular number, sequencing the target test cases in a descending order according to the test task number;
aiming at the target test cases with the same associated problem odd number and the same test task number, sequencing the target test cases in a descending order according to the test interruption times;
aiming at the target test cases with the same associated problem odd number, the same test task number and the same test interruption times, sequencing the target test cases in an ascending order according to the test date;
and aiming at the target test cases with the same associated problem odd number, the same test task number, the same test interruption times and the same test date, sequencing the target test cases in a descending order according to the test priority.
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| CN115543775A (en) * | 2022-08-17 | 2022-12-30 | 睿智合创(北京)科技有限公司 | Automatic test case generation method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115543775A (en) * | 2022-08-17 | 2022-12-30 | 睿智合创(北京)科技有限公司 | Automatic test case generation method |
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