CN114384071A - Wall and floor brick side bottom surface defect measuring device based on laser TOF technology - Google Patents
Wall and floor brick side bottom surface defect measuring device based on laser TOF technology Download PDFInfo
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- CN114384071A CN114384071A CN202011130390.6A CN202011130390A CN114384071A CN 114384071 A CN114384071 A CN 114384071A CN 202011130390 A CN202011130390 A CN 202011130390A CN 114384071 A CN114384071 A CN 114384071A
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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Abstract
The invention provides a wall and floor tile side bottom surface defect measuring device based on a laser TOF technology, which comprises a group of laser transmitters, a return light receiver, a data acquisition system and a data processing system, wherein the laser transmitters are arranged on the wall and floor tile side bottom surface; the laser transmitters are respectively arranged at certain distances from the bottom surface and four side surfaces of the wall and floor tile and used for transmitting laser to each surface, the light return receivers and the laser transmitters are arranged in pairs, the light return receivers are used for receiving the laser transmitted by the laser transmitters and collecting and transmitting the received data to the data processing system by the data collecting system, and the data processing system carries out three-dimensional point cloud calculation. The device both can satisfy the persistence and measure wall ceramic tile side bottom surface defect, can not too much increase the cost in business again simultaneously, and this device is as the auxiliary device of wall ceramic tile full plane detecting system simultaneously, thereby will cooperate the wall ceramic tile front surface high accuracy measurement system can realize the full plane of wall ceramic tile and cover.
Description
Technical Field
The invention provides a wall and floor tile side and bottom surface defect measuring device based on a laser TOF technology, and belongs to the technical field of detection methods.
Background
At present, the side bottom surface of the wall and floor tile is mainly manually checked by eyes, and particularly, the bottom surface is often not checked or checked by a sample. This can cause hidden troubles for quality inspection and even classification of the tiles.
Machine vision is currently being used more and more widely, and especially in factory automation inspection applications, machine vision is gradually replacing manual work. Machine vision plays an increasingly important role not only in detection efficiency and accuracy, but also in complex environments.
Although the machine vision is already applied to various industries and is mature, the machine vision is not applied to the quality detection of the wall and floor tiles, and on one hand, because the wall and floor tiles are various in variety, especially, the same factory can often produce a plurality of wall and floor tiles with different sizes, different textures or different applications, which brings difficulty to the application of the machine vision in the quality detection of the wall and floor tiles.
With the development of laser technology, the 3D +2D joint detection solution brings hopes for quality detection of wall and floor tiles, and some devices begin to detect the front plane of the wall and floor tiles. However, the detection of the side bottom surface of the wall or floor tile is often overlooked because the important process is inferior to the main plane, and the visual detection equipment is expensive.
On one hand, because the prior art mainly carries out manual visual inspection on the wall and floor tiles, the missing inspection or the wrong inspection is often caused easily due to the mixed interference of the eye fatigue, the subjectivity or the on-site light problem and the color of the wall and floor tile body. On the other hand, the method adopts pure visual detection or high-precision 3D measurement, and although the high-precision measurement of the defects of the lateral bottom surface can be realized, the cost is too high. The development of a detection device and a detection method suitable for the bottom surfaces of the wall and floor tiles is convenient to use and low in cost, and is a problem to be solved urgently.
Laser TOF technology is becoming more and more widespread in low-precision mapping applications, and the application technical scheme of acceptable measurement precision (millimeter level) and mature, reliable and low-cost is being adopted by many industries. TOF is an abbreviation of Time of Flight (TOF) technology, i.e. a sensor emits modulated near-infrared light, which is reflected after encountering an object, and the sensor converts the distance of the photographed scene by calculating the Time difference or phase difference between light emission and reflection to generate depth information.
Disclosure of Invention
The technical problem is as follows: in order to solve the defects of the prior art, the invention provides a low-cost wall and floor tile side ground defect detection device.
The technical scheme is as follows: the invention provides a wall and floor tile side bottom surface defect measuring device based on a laser TOF technology, which comprises a group of laser transmitters, a return light receiver, a data acquisition system and a data processing system, wherein the laser transmitters are arranged on the wall and floor tile side bottom surface; the laser transmitters are respectively arranged at certain distances from the bottom surface and four side surfaces of the wall and floor tile and used for transmitting laser to each surface, the light return receivers and the laser transmitters are arranged in pairs, the light return receivers are used for receiving the laser transmitted by the laser transmitters and collecting and transmitting the received data to the data processing system by the data collecting system, and the data processing system carries out three-dimensional point cloud calculation.
Has the advantages that: the wall and floor tile side and bottom surface defect measuring device based on the laser TOF technology provided by the invention combines the requirements of side and bottom surfaces on low defect precision, adopts the wall and floor tile ground size defect measuring device based on the TOF technology, and carries out multi-point full coverage measurement on the wall and floor tiles from the bottom surfaces and the side surfaces of the wall and floor tiles respectively based on the laser ranging principle, so that the cost is low, and the scheme is simple. The device both can satisfy the persistence and measure wall ceramic tile side bottom surface defect, can not too much increase the cost in business again simultaneously, and this device is as the auxiliary device of wall ceramic tile full plane detecting system simultaneously, thereby will cooperate the wall ceramic tile front surface high accuracy measurement system can realize the full plane of wall ceramic tile and cover.
Specifically, the present invention has the following outstanding advantages over the prior art:
1. because this device adopts the side and the simultaneous multiple spot measurement mode of bottom surface based on TOF technique, so can realize to side and bottom surface full coverage measurement.
2. Because the device adopts a mature spectrum measurement technology, the principle is simple and the cost is low.
3. Because the device comprises the laser emitter, the return light detector and the data analysis software system, the device can realize integrated measurement, analysis and output.
Drawings
Fig. 1 is a schematic structural diagram of a device for measuring defects on the bottom surface of a side of a wall or floor tile based on a laser TOF technology.
Fig. 2 is a working flow chart of the device for measuring defects on the side and bottom surfaces of the wall and floor tiles based on the laser TOF technology.
Detailed Description
The present invention is further explained below.
The device for measuring the defects of the side bottom surfaces of the wall and floor tiles based on the laser TOF technology comprises a group of laser transmitters, a return light receiver, a data acquisition system and a data processing system; the laser transmitters are respectively arranged at certain distances from the bottom surface and four side surfaces of the wall and floor tile and used for transmitting laser to each surface, the light return receivers and the laser transmitters are arranged in pairs, the light return receivers are used for receiving the laser transmitted by the laser transmitters and collecting and transmitting the received data to the data processing system by the data collecting system, and the data processing system carries out three-dimensional point cloud calculation.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (1)
1. The utility model provides a wall and floor brick side bottom surface defect measuring device based on laser TOF technique which characterized in that: the system comprises a group of laser transmitters, a return light receiver, a data acquisition system and a data processing system; the laser transmitters are respectively arranged at certain distances from the bottom surface and four side surfaces of the wall and floor tile and used for transmitting laser to each surface, the light return receivers and the laser transmitters are arranged in pairs, the light return receivers are used for receiving the laser transmitted by the laser transmitters and collecting and transmitting the received data to the data processing system by the data collecting system, and the data processing system carries out three-dimensional point cloud calculation.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011130390.6A CN114384071A (en) | 2020-10-21 | 2020-10-21 | Wall and floor brick side bottom surface defect measuring device based on laser TOF technology |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011130390.6A CN114384071A (en) | 2020-10-21 | 2020-10-21 | Wall and floor brick side bottom surface defect measuring device based on laser TOF technology |
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| CN114384071A true CN114384071A (en) | 2022-04-22 |
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| CN202011130390.6A Pending CN114384071A (en) | 2020-10-21 | 2020-10-21 | Wall and floor brick side bottom surface defect measuring device based on laser TOF technology |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114581441A (en) * | 2022-05-05 | 2022-06-03 | 深圳百里科技有限公司 | Part detection method, device, equipment and storage medium |
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| CN101639452A (en) * | 2009-09-11 | 2010-02-03 | 北京科技大学 | 3D detection method for rail surface defects |
| CN201724659U (en) * | 2010-03-16 | 2011-01-26 | 黄柱基 | Intelligent detection system of ceramic tile flatness |
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Address after: 210000 room 0601, building C, Xingzhi Science Park, Xingzhi Road, Nanjing Economic and Technological Development Zone, Jiangsu Province Applicant after: Nanjing Mulai Laser Technology Co.,Ltd. Address before: 210000 room 0601, building C, Xingzhi Science Park, Xingzhi Road, Nanjing Economic and Technological Development Zone, Jiangsu Province Applicant before: NANJING MOVELASER TECHNOLOGY Co.,Ltd. |