CN114371348A - Super-surface testing device, testing method and PB phase testing method - Google Patents
Super-surface testing device, testing method and PB phase testing method Download PDFInfo
- Publication number
- CN114371348A CN114371348A CN202111572426.0A CN202111572426A CN114371348A CN 114371348 A CN114371348 A CN 114371348A CN 202111572426 A CN202111572426 A CN 202111572426A CN 114371348 A CN114371348 A CN 114371348A
- Authority
- CN
- China
- Prior art keywords
- waveguide
- reflected
- waves
- polarizer
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 81
- 230000010287 polarization Effects 0.000 claims abstract description 45
- 238000006243 chemical reaction Methods 0.000 claims abstract description 20
- 238000010998 test method Methods 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 12
- 230000007704 transition Effects 0.000 claims description 8
- 238000003012 network analysis Methods 0.000 claims 1
- 238000012545 processing Methods 0.000 abstract description 3
- 238000004088 simulation Methods 0.000 description 6
- 230000033228 biological regulation Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005388 cross polarization Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000012085 test solution Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0892—Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention provides a super-surface testing device, a testing method and a PB phase testing method, wherein the testing device comprises: the device comprises a first coaxial waveguide converter, a second coaxial waveguide converter, an orthogonal mode coupler, a polarizer, a reflection waveguide and a Vector Network Analyzer (VNA), wherein the coaxial ends of the two coaxial waveguide converters are connected with the vector network analyzer, and the waveguide ends are connected with the orthogonal mode coupler; the orthogonal mode coupler, the polarizer and the reflection waveguide are connected in sequence; the reflective waveguide has a reflective surface for reflecting an incident circularly polarized wave. The invention can collect the amplitude and the phase of the polarized converted reflected wave beam by adopting the testing device, and realizes the circular polarization conversion efficiency and the PB (Pancharatnam-Berry) phase test. Compared with the conventional free space test method, the waveguide test system can effectively save the sample processing cost and improve the test working efficiency.
Description
Technical Field
The invention provides a super-surface testing device, a testing method and a PB phase testing method, and relates to the field of super-surface unit structure performance testing, in particular to a device and a method for testing the polarization conversion efficiency and the PB phase of a super-surface unit structure.
Background
The super surface can realize the restraint and regulation of electromagnetic waves on the scale of sub-wavelength through a specific unit structure and novel physical characteristics. Meanwhile, the optical fiber cable is widely concerned by the scientific and industrial fields by virtue of the advantages of low loss, low profile, easy design and manufacture and the like. With the continuous development of the super surface, the unit structure is designed from simple to complex, and the functions can be presented from single to multiple, so that the diversity and complexity of the performance index requirements and evaluation criteria of the super surface are determined. It is an important task to make accurate measurements of the properties of these super-surfaces.
At present, the analysis of the performance of the super-surface is mainly focused on the whole super-surface, namely the full-mold test, and the test method can accurately and completely obtain the whole performance of the super-surface, but the processing cost of the full-mold sample is high and the time is long. Polarization is an important attribute of electromagnetic waves, and polarization regulation of electromagnetic waves is widely applied to the aspects of communication, detection and the like. Through the published literature, the test of the polarization conversion characteristic of the super-surface is carried out through a far-field transmitting and receiving mode, the requirement on a test system is high, and the test cost is high. Therefore, performance testing of full-scale super-surfaces is not an ideal option, and more often a test solution with low manufacturing and testing costs, simple system, and high efficiency is needed.
Disclosure of Invention
In order to solve the above problems, the present invention provides a super-surface testing apparatus, a testing method, and a PB phase testing method, which can obtain the polarization conversion performance of a super-surface unit structure relatively quickly and accurately. Meanwhile, the PB phase of the super-surface unit structure can be obtained by measuring the super-surface unit structure with different rotation angles, so that the geometric phase regulation and control capability of the unit structure can be obtained. The PB (Pancharatnam-Berry) phase is a geometric phase related to polarization or polarization of electromagnetic waves, namely the PB phase based on the sub-wavelength unit structure can regulate and control the electromagnetic waves more flexibly.
The technical scheme adopted by the invention for solving the technical problems is as follows:
a super-surface testing apparatus, the testing apparatus comprising: first coaxial waveguide converter, second coaxial waveguide converter, orthogonal mode coupler, polarizer, reflective waveguide, Vector Network Analyzer (VNA): the coaxial ends of the two coaxial waveguide converters are connected with the vector network analyzer, and the waveguide ends are connected with the orthogonal mode coupler; the orthogonal mode coupler, the polarizer and the reflection waveguide are connected in sequence; the reflective waveguide has a reflective surface for reflecting an incident circularly polarized wave.
Further, the testing device comprises a motor capable of driving the tested structure to rotate.
Further, the polarizer is a circular polarizer, the reflective waveguide is a reflective square waveguide, and a square-circle transition waveguide is used for connecting the polarizer and the reflective waveguide.
Further, the first coaxial waveguide converter, the second coaxial waveguide converter, the orthogonal mode coupler, the polarizer and the reflecting waveguide are fixedly connected or detachably connected.
Further, the structure to be measured can be a single super surface unit structure or an array composed of N × M super surface unit structures, wherein N and M are positive integers.
The invention also provides the following technical scheme:
a testing method based on the super surface testing device as described above, comprising the following steps:
1) when the measured structure is not loaded, the normalized reference reflection signal S21-1 is measured: the method comprises the steps that a first coaxial waveguide converter (1) radiates linearly polarized waves, the linearly polarized waves enter a polarizer (4) through a common port of an orthogonal mode coupler (3) and are converted into circularly polarized waves, the circularly polarized waves enter a reflection waveguide (6) and are reflected by a reflection surface of the reflection waveguide (6) and are converted into orthogonal circularly polarized reflection waves in a polarization mode, the orthogonal circularly polarized reflection waves are converted into orthogonal linearly polarized waves through the polarizer (4), the orthogonal circularly polarized reflection waves are separated by the orthogonal mode coupler (3), the reflection waves are finally received by a second coaxial waveguide converter (2), the obtained reflection wave signals are displayed on a vector network analyzer at the moment, namely normalized reference reflection signals S21-1, the amplitude value of the signals S21-1 is directly calibrated, and the amplitude value is approximate to 1 after the calibration;
2) loading the measured structure, measuring a reflection signal S21-2: the first coaxial waveguide converter 1 radiates linear polarized waves in the same polarization direction as the linear polarized waves, the linear polarized waves enter a polarizer (4) through an orthogonal mode coupler (3) and are converted into circular polarized waves, the circular polarized waves enter a reflection waveguide (6) and are reflected by a reflection surface and a structure, part of circular polarized incident waves converted by the structure polarization are converted into circular polarized reflected waves with the same rotation direction as the incident waves, and part of circular polarized incident waves not converted by the structure polarization are converted into circular polarized reflected waves with the rotation direction opposite to the incident waves; two kinds of circularly polarized reflected waves are converted into orthogonal linear polarized waves in two directions through a polarizer (4), the linearly polarized waves are separated by an orthogonal mode coupler (3) and are respectively received through two coaxial waveguide converters, the reflected waves which are not subjected to polarization conversion of the structure to be tested are received by a second coaxial waveguide converter (2), and corresponding reflected signals S21-2 are displayed on a vector network analyzer; the reflected wave converted by the structural polarization is received by the first coaxial waveguide converter (1), i.e. the reflected signal S11;
3) subtracting the square of the amplitude of S21-2 when the measured structure is loaded from the square of the amplitude of S21-1 to obtain the circular polarization conversion efficiency of the measured structure (S21-1)2-(S21-2)2。
Further, the linearly polarized wave radiated by the first coaxial waveguide converter may be a linearly polarized wave of H polarization, V polarization, or other polarization direction.
The invention also provides another technical scheme:
the PB phase testing method based on the super-surface testing device comprises the following steps:
1) the measured reflected signal S11 specifically includes:
loading a measured structure, radiating linear polarized waves in the same polarization direction as the linear polarized waves by a first coaxial waveguide converter, entering a polarizer through an orthogonal mode coupler to be converted into circular polarized waves, entering the circular polarized waves into a reflection waveguide to be reflected by a reflection surface and a structure, converting part of circular polarized incident waves converted by structural polarization into circular polarized reflected waves with the same rotation direction as the incident waves, and converting part of circular polarized incident waves not converted by the structural polarization into circular polarized reflected waves with the opposite rotation direction to the incident waves; two kinds of circularly polarized reflected waves are converted into linear polarized waves in two orthogonal directions through a polarizer, the reflected waves are separated by an orthogonal mode coupler and are respectively received through two coaxial waveguide converters, and part of the reflected waves converted by structural polarization is received by a first coaxial waveguide converter, namely a reflected signal S11;
2) rotating the measured structure by a rotation angle theta; automatically acquiring the phase information of S11 corresponding to different angles theta;
3) and selecting any frequency point in the range of the measured frequency band, and drawing a coordinate graph of theta and phase information.
The test device can customize the size of the waveguide structure according to the size of the structure to be tested and the working frequency range.
Compared with the prior art, the invention has the beneficial effects that: the testing device is used for testing the super-surface unit structure, no far-field testing equipment is needed, the structure is compact, the processing and testing cost required in the full-size super-surface polarization characteristic testing process can be effectively reduced, and the testing work efficiency is improved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a diagram of a structure under test used in an example of the present invention;
FIG. 3 is a comparison of polarization transformation test and theory for a structure under test in accordance with an embodiment of the present invention;
FIG. 4 is a comparison graph of the phase test and theory of the PB structure under test in the example of the present invention.
Reference numerals:
1-first coaxial waveguide converter, 2-second coaxial waveguide converter, 3-orthogonal mode coupler, 4-polarizer, 5-square-circle transition waveguide, 6-reflection waveguide and 7-measured structure.
Detailed Description
The present invention will be described in detail with reference to the drawings and the detailed description, but the scope of the present invention is not limited to the following embodiments, and the present invention shall include the entire contents of the claims.
As shown in fig. 1, a super surface test apparatus includes: a first coaxial waveguide converter 1, a second coaxial waveguide converter 2, an orthogonal mode coupler 3, a polarizer 4, a reflection waveguide 6, a Vector Network Analyzer (VNA); the two coaxial waveguide converters 1 and 2 are used for transmitting and receiving orthogonal linear polarization waves, the coaxial ends of the two coaxial waveguide converters are connected with the vector network analyzer and used for transmitting signals to the vector network analyzer, and the waveguide ends are connected with the orthogonal mode coupler 3; the orthogonal mode coupler 3 can separate or synthesize orthogonal linear polarization waves; the orthogonal mode coupler 3, the polarizer 4 and the reflecting square waveguide 6 are connected in sequence. The first coaxial waveguide converter 1, the second coaxial waveguide converter 2, the orthogonal mode coupler 3, the polarizer 4 and the reflective waveguide 6 can be fixedly connected or detachably connected, the connection mode does not affect the realization of functions, and the first coaxial waveguide converter, the second coaxial waveguide converter, the orthogonal mode coupler 3, the polarizer 4 and the reflective waveguide 6 are connected with one another sequentially through screws in the embodiment. The polarizer 4 can convert the incident linear polarization into the circularly polarized wave and can also convert the reflected circularly polarized wave into the linearly polarized wave. The reflective waveguide 6 has a reflective surface for reflecting an incident circularly polarized wave. In this embodiment, for convenience of description, the system is arranged in a horizontal direction, and in practical application, the placement position of the system may be set to be vertical or in other directions. One skilled in the art can customize the dimensions of the waveguide structure to the size of the structure being measured and the operating frequency range.
In the embodiment, the model of the first coaxial waveguide converter 1 and the model of the second coaxial waveguide converter 2 are HD-100WCAS, the model of the orthogonal mode coupler 3 is HD-100CWOMT23.825T3, the model of the polarizer 4 is HD-23.825CWPST1, and the model of the reflective waveguide 6 is HD-20X20WSST1, in addition, since the section of the selected polarizer 4 is circular and the section of the reflective waveguide 6 is square, a square-circle transition waveguide 5 with the model of HD-20X20RCA23.825T1 is selected here for connecting the two devices, the circular waveguide port of the square-circle transition waveguide 5 is connected with the circular polarizer 4, and the square waveguide port is connected with the reflective square waveguide 6; if the two devices have the same cross section shape, the two devices can be directly connected without replacing other devices; in addition, the model selected in this embodiment is only exemplified here, and those skilled in the art can select the coaxial waveguide converter, the orthogonal mode coupler, the circular polarizer, the square-circle transition waveguide, and the reflective square waveguide according to actual conditions. Under test, the structure under test may be a single super-surface unit structure, as shown in FIG. 2; or an array of multiple super-surface unit structures, such as an N × N or N × M array of super-surface unit structures shown in fig. 2, where N and M are positive integers. The super surface unit structure as shown in fig. 2 may be assembled to the position of 7 in fig. 1 at the time of testing. The length of the rectangular patch is l, and the width of the rectangular patch is w, in this embodiment, the values of l is 18mm, w is 5mm, the material is stainless steel, and the thickness of the patch is 1 mm. The distance of the patch from the reflective surface is 7.5 mm. The material of the super-surface unit structure can also be a medium, the measuring principle of the measuring device is irrelevant to the material of the super-surface unit structure, and the measuring device can be used for testing the circular polarization conversion efficiency of the super-surface unit structure made of any material. In order to measure the phase of the super-surface unit structure PB, in this embodiment, a motor is used to rotate the super-surface unit structure fixed on a motor shaft, and the motor can change the rotation angle θ of the measured structure. In practical use, the PB phase can be measured as long as the structure to be measured or the aforementioned testing device can rotate relative to each other, and the specific structure for generating the relative rotation is not limited herein.
The polarization conversion efficiency test using method of the test device is as follows: the method comprises the following steps:
1) acquiring a reference signal: the super surface unit structure is not loaded and a normalized reflected signal S21 is measured. Here, S21 denotes a signal transmitted from the first coaxial waveguide converter 1 and received by the second coaxial waveguide converter 2, and similarly, S11 denotes a signal transmitted from the first coaxial waveguide converter 1 and received by the first coaxial waveguide converter 1. For ease of resolution, S21 at this step is identified herein as S21-1. The ratio of the input linear polarized wave energy to the output linear polarized wave energy of the first coaxial waveguide converter 1 is characterized by calibrating the amplitude value of the reflected signal S21 through the electromagnetic wave frequency band output by the first coaxial waveguide converter 1. The electromagnetic wave transmitting and receiving process is as follows: the first coaxial waveguide converter 1 radiates H-polarized waves, enters the polarizer 4 through the common port of the orthogonal mode coupler 3 to be converted into circularly polarized waves, the circularly polarized waves enter the reflection waveguide 6 through the square-circle transition waveguide 5, and at this time, the circularly polarized waves entering the reflection waveguide 6 are reflected by the reflection surface, meanwhile, due to half-wave loss, the incident wave is polarized and converted into an orthogonal circularly polarized reflected wave by the reflective waveguide 6, the orthogonal circularly polarized reflected wave is converted into V polarization by the polarizer 4, and is separated by the orthogonal mode coupler 3 and then received by the second coaxial waveguide converter 2, and displaying the signal S21-1 on the vector network analyzer, and performing direct calibration on the amplitude value of S21-1 by operating the vector network analyzer, wherein the value is approximately 1 after calibration, and the specific calibration method is a conventional use means of a person skilled in the art and is not described herein.
2) And loading the structure to be measured, wherein the structure to be measured is loaded in front of the reflecting surface, and measuring a reflected signal S21-2. The electromagnetic wave transmitting and receiving process is as follows: the first coaxial waveguide converter 1 radiates polarized waves which are the same as those in the step 1), in this embodiment, the polarized waves are H polarized waves, enter the polarizer through the orthogonal mode coupler 3 and are converted into circularly polarized waves, the circularly polarized waves enter the reflection waveguide 6 through the square-circle transition waveguide 5 and are reflected by the reflection surface, and due to the combined action of half-wave loss and a measured junction sample, circularly polarized incident waves subjected to structural polarization conversion to be measured are converted into circularly polarized reflected waves with the same rotation direction as incident waves, and circularly polarized incident waves not subjected to structural polarization conversion to be measured are converted into circularly polarized reflected waves with the opposite rotation direction as the incident waves; two circularly polarized reflected waves are converted into linear polarized waves in two orthogonal directions through a polarizer 4, the linear polarized waves are separated by an orthogonal mode coupler 3 and are respectively received through two coaxial waveguide converters, the part which is not subjected to structural polarization conversion is received by a second coaxial waveguide converter (2), a signal S21-2 is displayed on a vector network analyzer, and the part which is subjected to structural polarization conversion is received by a first coaxial waveguide converter (1), namely a reflected signal S11;
3) subtracting the square amplitude of S21-2 when the tested structure is loaded from the square amplitude of S21-1 obtained in the step 1), namely the circular polarization conversion efficiency of the tested structure (in this case, the single super surface unit structure shown in the attached figure 2) (S21-1)2-(S21-2)2. Note that, here, the first coaxial waveguide converter 1 radiates the H-polarized wave, and for convenience of explanation, the V-polarized wave or another direction may be selectedPolarized waves.
The results of the circular polarization conversion efficiency test are shown in fig. 3, and in this embodiment, it is verified by numerical simulation that the results of the circular polarization conversion efficiency test performed by the testing apparatus (shown by the dotted line) are consistent with the results of the CST theoretical simulation (shown by the solid line). It is noted that when verifying the performance of a test apparatus using the CST theoretical simulation, the parameter settings of the CST theoretical simulation need to be consistent with the actual test apparatus; if the measured structure is connected with the motor shaft in the embodiment, the diameter of the motor shaft is 3mm, a small hole with the diameter of 3.1mm is reserved in the center of the reflecting surface of the reflecting waveguide 6, so that the motor shaft can conveniently enter the reflecting waveguide 6, the position of the motor shaft is adjusted, and the measured structure is 7.5mm away from the reflecting surface of the reflecting waveguide 6, so that the same distance between the motor shaft and the measured structure and the reflecting surface of the reflecting waveguide 6 needs to be simulated when CST theoretical simulation is performed, and the comparability of a simulation result and a testing device can be ensured. The maximum polarization conversion of the selected tested structures was 97.87% in the 10-11GHz range, and near f-10.588 GHz, the polarization conversion was close to 100%.
The testing device can be used for a PB phase test and used for determining whether the designed super-surface unit structure has excellent geometric phase regulation and control capacity, and the method comprises the following specific steps:
measuring a reflected signal S11 by loading the measured structure, and rotating the measured structure at a rotating speed v1The angle of rotation is θ. Because the PB phase of the measured structure changes to 2 pi every time the measured structure rotates 180 degrees, a more accurate PB phase can be obtained by generally giving a slower rotating speed, but the efficiency of data measurement is influenced by too low speed, so the value of the PB phase can be specifically selected by a person skilled in the art according to the actual situation; the corresponding S11 phase information of different angles theta is automatically collected; and selecting any frequency point in the range of the measured frequency band, and drawing a coordinate graph of theta and phase information. Note that, here, the first coaxial waveguide converter 1 radiates the H-polarized wave, and for convenience of explanation, a V-polarized wave or a polarized wave in another direction may be selected.
The result of the testing device for testing the PB phase is shown in fig. 4, the phase change relationship of S11 corresponding to different angles θ at 10.588GHz is extracted, and the PB phase tested by the waveguide device is consistent with theory, that is, the testing device has excellent PB phase testing accuracy.
In summary, the present invention provides a cross polarization testing apparatus and a testing method for a polarization-switched super-surface unit structure, which can obtain the polarization switching performance and PB phase of the tested structure more quickly and accurately.
Accordingly, while the embodiments of the present invention have been described above with reference to the accompanying drawings, the present invention is not limited to the above-described specific embodiments, which are merely illustrative and not restrictive. Those skilled in the art, having the benefit of this disclosure, may effect numerous modifications thereto without departing from the scope and spirit of the invention as set forth in the claims that follow. The invention has not been described in detail and is part of the common general knowledge of a person skilled in the art.
Claims (9)
1. A super-surface test apparatus, the test apparatus comprising: first coaxial waveguide converter (1), second coaxial waveguide converter (2), orthomode coupler (3), polarizer (4), reflection waveguide (6), vector network analysis appearance, its characterized in that:
the coaxial ends of the first and second coaxial waveguide converters are connected with the vector network analyzer, and the waveguide ends are connected with the orthogonal mode coupler (3); the orthogonal mode coupler (3), the polarizer (4) and the reflection waveguide (6) are connected in sequence; the reflective waveguide (6) has a reflective surface for reflecting an incident circularly polarized wave.
2. A super surface test apparatus according to claim 1, wherein:
the testing device also comprises a motor which can drive the tested structure to rotate.
3. A super surface test apparatus according to claim 2, wherein:
the structure to be measured is connected with a motor shaft of the motor in a mechanical connection mode.
4. A super surface test apparatus according to claim 1, wherein:
the polarizer (4) is a circular polarizer and the reflective waveguide (6) is a reflective square waveguide, wherein a square-round transition waveguide (5) is used for the connection of the two.
5. A super surface test apparatus according to claim 1, wherein:
the first coaxial waveguide converter (1), the second coaxial waveguide converter (2), the orthogonal mode coupler (3), the polarizer (4) and the reflection waveguide (6) are fixedly connected or detachably connected.
6. A super surface test apparatus according to claim 1, wherein:
the structure to be measured can be a single super-surface unit structure or an array consisting of N multiplied by M super-surface unit structures, wherein N and M are positive integers.
7. A testing method based on the super surface testing device of any one of claims 1-6, characterized in that the testing method comprises the following steps:
step 1): when the measured structure is not loaded, the normalized reference reflection signal S21-1 is measured, and the method specifically comprises the following steps:
the method comprises the steps that a first coaxial waveguide converter (1) radiates a polarized wave, the linearly polarized wave enters a polarizer (4) through a common port of an orthogonal mode coupler (3) and is converted into a circularly polarized wave, the circularly polarized wave enters a reflection waveguide (6), is reflected by a reflection surface of the reflection waveguide (6) and is polarized and converted into an orthogonal circularly polarized reflected wave, the orthogonal circularly polarized reflected wave is converted into an orthogonal linearly polarized wave through the polarizer (4), the orthogonal linearly polarized wave is separated by the orthogonal mode coupler (3), the reflected wave is finally received by a second coaxial waveguide converter (2), at the moment, an obtained reflected wave signal, namely a normalized reference reflected signal S21-1, is displayed on a vector network analyzer, and the amplitude value of the signal S21-1 is calibrated;
step 2): loading the measured structure, and measuring a reflected signal S21-2, wherein the method specifically comprises the following steps:
the first coaxial waveguide converter (1) radiates linearly polarized waves with the same polarization direction as the linearly polarized waves, the linearly polarized waves enter the polarizer (4) through the orthogonal mode coupler (3) and are converted into circularly polarized waves, the circularly polarized waves enter the reflection waveguide (6) and are reflected by the reflecting surface and the structure to be measured, the reflected circularly polarized waves are converted into the linearly polarized waves in two orthogonal directions through the polarizer (4), the linearly polarized waves in the two orthogonal directions are separated by the orthogonal mode coupler (3) and respectively receive reflected waves through the first coaxial waveguide converter and the second coaxial waveguide converter, part of the reflected waves which are not subjected to polarization conversion of the structure to be measured are received by the second coaxial waveguide converter (2), and corresponding reflected signals S21-2 are displayed on the vector network analyzer;
step 3): and subtracting the square amplitude of the signal S21-2 acquired when the measured structure is loaded from the square amplitude of the acquired signal S21-1 to obtain the circular polarization conversion efficiency of the measured structure.
8. The test method of claim 7, wherein:
the linearly polarized wave radiated by the first coaxial waveguide converter (1) can be H-polarized, V-polarized or linearly polarized wave with other polarization directions.
9. A PB phase test method based on the super surface test device of any one of claims 1-6, the PB phase test method comprising:
1) the measured reflected signal S11 specifically includes:
loading a measured structure, radiating linear polarized waves by a first coaxial waveguide converter (1), enabling the linear polarized waves to enter a polarizer (4) through an orthogonal mode coupler (3) and be converted into circularly polarized waves, enabling the circularly polarized waves to enter a reflection waveguide (6) and be reflected by a reflection surface and the measured structure, converting the reflected circularly polarized waves into orthogonal linear polarized waves in two directions through the polarizer (4), separating the orthogonal linear polarized waves in the two directions by the orthogonal mode coupler (3) and receiving reflected waves through the first coaxial waveguide converter and a second coaxial waveguide converter respectively, and receiving the reflected waves subjected to polarization conversion by the measured structure by the first coaxial waveguide converter (1) to obtain corresponding reflected signals S11;
2) rotating the measured structure by a rotation angle theta; automatically acquiring phase information of reflected signals S11 corresponding to different angles theta;
3) and selecting any frequency point in the range of the measured frequency band, and drawing a coordinate graph of theta and phase information.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310702032.5A CN116859133A (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device and PB phase testing method |
| CN202111572426.0A CN114371348B (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device, testing method and PB phase testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111572426.0A CN114371348B (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device, testing method and PB phase testing method |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310702032.5A Division CN116859133A (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device and PB phase testing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114371348A true CN114371348A (en) | 2022-04-19 |
| CN114371348B CN114371348B (en) | 2023-07-21 |
Family
ID=81139202
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310702032.5A Pending CN116859133A (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device and PB phase testing method |
| CN202111572426.0A Active CN114371348B (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device, testing method and PB phase testing method |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310702032.5A Pending CN116859133A (en) | 2021-12-21 | 2021-12-21 | Super-surface testing device and PB phase testing method |
Country Status (1)
| Country | Link |
|---|---|
| CN (2) | CN116859133A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024060040A1 (en) * | 2022-09-20 | 2024-03-28 | 京东方科技集团股份有限公司 | Single-channel test device and system, and test method |
Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6181221B1 (en) * | 1998-10-06 | 2001-01-30 | Hughes Electronics Corporation | Reflective waveguide variable power divider/combiner |
| CN104569622A (en) * | 2014-12-24 | 2015-04-29 | 复旦大学 | Efficient microwave polarization detection device based on photonic spin Hall effect |
| WO2016178740A2 (en) * | 2015-03-12 | 2016-11-10 | President And Fellows Of Harvard College | Polarization-selective scattering antenna arrays based polarimeter |
| CN107367642A (en) * | 2017-08-01 | 2017-11-21 | 北京航天光华电子技术有限公司 | It is a kind of measure waveguide circular polarizer axle than device |
| CN108037561A (en) * | 2017-12-14 | 2018-05-15 | 中国科学院光电技术研究所 | Waveguide structure for phase regulation and control of chip laser radar based on super surface |
| EP3439107A1 (en) * | 2017-08-01 | 2019-02-06 | University Of Cyprus | Realizing programmable wireless enviroments through software-controlled metasurfaces |
| US20190219623A1 (en) * | 2018-01-17 | 2019-07-18 | Kymeta Corporation | Localized free space tester |
| WO2019148200A1 (en) * | 2018-01-29 | 2019-08-01 | University Of Washington | Metasurfaces and systems for full-color imaging and methods of imaging |
| US20190394073A1 (en) * | 2018-06-20 | 2019-12-26 | Kabushiki Kaisha Toshiba | Antenna device and signal reception method |
| CN111133632A (en) * | 2017-09-20 | 2020-05-08 | 集美塔公司 | RF ripple correction in antenna aperture |
| US20210114205A1 (en) * | 2019-01-03 | 2021-04-22 | Lucomm Technologies, Inc. | Flux Sensing System |
| CN112881815A (en) * | 2021-01-22 | 2021-06-01 | 北京航空航天大学 | Programmable super-surface reflective array-based field simulator |
| CN113063994A (en) * | 2021-03-24 | 2021-07-02 | 中国人民解放军国防科技大学 | Active super-surface strong irradiation field performance testing device and system |
| EP3855192A1 (en) * | 2018-11-27 | 2021-07-28 | Morita Tech Co., Ltd. | Testing device |
| US20210328366A1 (en) * | 2020-01-03 | 2021-10-21 | Pivotal Commware, Inc. | Dual polarization patch antenna system |
-
2021
- 2021-12-21 CN CN202310702032.5A patent/CN116859133A/en active Pending
- 2021-12-21 CN CN202111572426.0A patent/CN114371348B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6181221B1 (en) * | 1998-10-06 | 2001-01-30 | Hughes Electronics Corporation | Reflective waveguide variable power divider/combiner |
| CN104569622A (en) * | 2014-12-24 | 2015-04-29 | 复旦大学 | Efficient microwave polarization detection device based on photonic spin Hall effect |
| WO2016178740A2 (en) * | 2015-03-12 | 2016-11-10 | President And Fellows Of Harvard College | Polarization-selective scattering antenna arrays based polarimeter |
| EP3439107A1 (en) * | 2017-08-01 | 2019-02-06 | University Of Cyprus | Realizing programmable wireless enviroments through software-controlled metasurfaces |
| CN107367642A (en) * | 2017-08-01 | 2017-11-21 | 北京航天光华电子技术有限公司 | It is a kind of measure waveguide circular polarizer axle than device |
| CN111133632A (en) * | 2017-09-20 | 2020-05-08 | 集美塔公司 | RF ripple correction in antenna aperture |
| CN108037561A (en) * | 2017-12-14 | 2018-05-15 | 中国科学院光电技术研究所 | Waveguide structure for phase regulation and control of chip laser radar based on super surface |
| US20190219623A1 (en) * | 2018-01-17 | 2019-07-18 | Kymeta Corporation | Localized free space tester |
| WO2019148200A1 (en) * | 2018-01-29 | 2019-08-01 | University Of Washington | Metasurfaces and systems for full-color imaging and methods of imaging |
| US20190394073A1 (en) * | 2018-06-20 | 2019-12-26 | Kabushiki Kaisha Toshiba | Antenna device and signal reception method |
| EP3855192A1 (en) * | 2018-11-27 | 2021-07-28 | Morita Tech Co., Ltd. | Testing device |
| US20210114205A1 (en) * | 2019-01-03 | 2021-04-22 | Lucomm Technologies, Inc. | Flux Sensing System |
| US20210328366A1 (en) * | 2020-01-03 | 2021-10-21 | Pivotal Commware, Inc. | Dual polarization patch antenna system |
| CN112881815A (en) * | 2021-01-22 | 2021-06-01 | 北京航空航天大学 | Programmable super-surface reflective array-based field simulator |
| CN113063994A (en) * | 2021-03-24 | 2021-07-02 | 中国人民解放军国防科技大学 | Active super-surface strong irradiation field performance testing device and system |
Non-Patent Citations (2)
| Title |
|---|
| ZHAOYI LI 等: "Controlling propagation and coupling of waveguide modes using phase-gradient metasurfaces", 《NATURE NANOTECHNOLOGY》, pages 675 * |
| 崔建华: "基于色散工程的超表面极化调控设计及应用研究", 《中国博士学位论文全文数据库基础科学辑》, pages 005 - 125 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2024060040A1 (en) * | 2022-09-20 | 2024-03-28 | 京东方科技集团股份有限公司 | Single-channel test device and system, and test method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116859133A (en) | 2023-10-10 |
| CN114371348B (en) | 2023-07-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10151783B2 (en) | Antenna measuring station | |
| CN104569635B (en) | Wireless terminal antenna performance test system | |
| CN111987462B (en) | Phased array antenna phase calibration measurement system and method | |
| JP7329085B2 (en) | High-speed OTA production line test platform | |
| US9081045B2 (en) | High frequency analysis of a device under test | |
| KR101360280B1 (en) | Multichannel absorberless near field measurement system | |
| CN107632210B (en) | Terahertz antenna plane near field measurement system | |
| CN107202942A (en) | A kind of free-space Method dielectric constant measurement system and measuring method for adding polarization grid | |
| CN207717615U (en) | A kind of location triggered formula THz continuous wave scanning imaging system | |
| JP6678554B2 (en) | Antenna measuring device | |
| CN114371348A (en) | Super-surface testing device, testing method and PB phase testing method | |
| CN104914115A (en) | Soil moisture content tester and testing method thereof | |
| CN105891617B (en) | A kind of ultrasonic transducer performance test apparatus | |
| CN110470871A (en) | Based on the multi-mode material electromagnetic parameter test device and method of single port | |
| RU130089U1 (en) | MIDDLE-HIGH-FREQUENCY CALIBRATION DEVICE FOR THE MIDDLE ZONE ANTENNA MEASURING COMPLEX | |
| US11287458B2 (en) | Determination of gain characteristics of a linearly-polarized antenna | |
| Räisänen et al. | Measurements of high-gain antennas at THz frequencies | |
| Starr et al. | Angle resolved microwave spectrometer for metamaterial studies | |
| JPS6061664A (en) | Nearby electric field measuring apparatus | |
| CN109580661A (en) | A kind of free space material complex reflection coefficient test method | |
| Amin et al. | Implementation and results of an RCS measurement system in CATR | |
| RU2794870C1 (en) | Method for determining antenna polarization parameters | |
| CN214473624U (en) | Multi-probe bow rack test system | |
| CN221859470U (en) | Coaxial cable electric grating demodulator based on single mixer | |
| CN112505433B (en) | 1-path 48-path power distribution network testing system based on constant temperature switch matrix and testing method thereof |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |