CN114363230B - Golden finger test fixture - Google Patents
Golden finger test fixture Download PDFInfo
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- CN114363230B CN114363230B CN202210037571.7A CN202210037571A CN114363230B CN 114363230 B CN114363230 B CN 114363230B CN 202210037571 A CN202210037571 A CN 202210037571A CN 114363230 B CN114363230 B CN 114363230B
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- clamping part
- clamping
- golden finger
- pcie
- test fixture
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- 238000012360 testing method Methods 0.000 title claims abstract description 29
- 229910052751 metal Inorganic materials 0.000 claims abstract description 55
- 239000002184 metal Substances 0.000 claims abstract description 55
- 230000002093 peripheral effect Effects 0.000 claims abstract description 3
- 239000004020 conductor Substances 0.000 claims description 7
- 239000011248 coating agent Substances 0.000 claims description 5
- 238000000576 coating method Methods 0.000 claims description 5
- 230000003647 oxidation Effects 0.000 claims description 4
- 238000007254 oxidation reaction Methods 0.000 claims description 4
- 230000006835 compression Effects 0.000 claims description 3
- 238000007906 compression Methods 0.000 claims description 3
- 230000005540 biological transmission Effects 0.000 abstract description 7
- 238000010586 diagram Methods 0.000 description 6
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 4
- 229910052737 gold Inorganic materials 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- 230000006978 adaptation Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- TZRXHJWUDPFEEY-UHFFFAOYSA-N Pentaerythritol Tetranitrate Chemical compound [O-][N+](=O)OCC(CO[N+]([O-])=O)(CO[N+]([O-])=O)CO[N+]([O-])=O TZRXHJWUDPFEEY-UHFFFAOYSA-N 0.000 description 1
- 230000003064 anti-oxidating effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 230000005489 elastic deformation Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910000510 noble metal Inorganic materials 0.000 description 1
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- -1 polytetrafluoroethylene Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
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- Measuring Leads Or Probes (AREA)
Abstract
The application discloses a golden finger test fixture which comprises a first clamping part and a second clamping part which are connected in an opening-closing manner and are used for clamping two sides of a PCIe (peripheral component interconnect express) standard card, wherein metal elastic sheets correspondingly connected with golden fingers of the PCIe standard card are arranged on the inner side surfaces of the first clamping part and the second clamping part, and signal leading-out pins correspondingly connected with the metal elastic sheets are arranged on the first clamping part and the second clamping part. The golden finger test fixture utilizes the metal elastic sheet to lead out PCIe signals from golden fingers on the front side and the back side of the PCIe standard card, avoids damaging the golden fingers, reduces the loss of the PCIe signals on a link, meets the requirements of PCIe data transmission, such as high performance, high bandwidth, high reliability, high expandability and the like, and is convenient and reliable to connect and use.
Description
Technical Field
The application relates to the field of communication connection testing equipment, in particular to a golden finger testing clamp.
Background
PCI-express (peripheral component interconnect express) is called PCIe for short, which is a high-speed serial computer expansion bus standard, which adopts the technologies of point-to-point serial transmission, low-voltage differential signal, embedded clock mode and the like, effectively meets the requirements of high performance, high bandwidth, high reliability, high expandability and the like of data transmission, and is a mainstream system interconnection bus standard in the existing server and microcomputer systems.
In the server and microcomputer system, interconnection of PCIe links is often required by gold fingers, which are composed of a plurality of metal contacts arranged like finger surfaces that are plated with gold and electrically conductive, and the PCIe links are interconnected by interposition with socket connectors. In the process of testing PCIe link signals, PCIe signals are often required to be connected out at the end of the golden finger, and because the PCIe signals are positioned at the front end and the back end of the golden finger and the golden finger is a layer of thinner metal contact piece attached to the surface of the circuit board, the PCIe signals are led out very inconvenient, and the golden finger is very easy to scratch and fall off, so that the whole circuit board is damaged.
Content of the application
The application aims to provide a golden finger test fixture, which utilizes a metal elastic sheet to lead PCIe signals out of golden fingers on the front side and the back side of a PCIe standard card, avoids damage to the golden fingers, reduces loss of the PCIe signals on a link, meets requirements of PCIe data transmission such as high performance, high bandwidth, high reliability, high expandability and the like, and is convenient and reliable to connect and use.
In order to achieve the above purpose, the application provides a golden finger test fixture, which comprises a first clamping part and a second clamping part which are connected in an opening-closing manner and are used for clamping two sides of a PCIe standard card, wherein the inner side surfaces of the first clamping part and the second clamping part opposite to each other are respectively provided with a metal spring sheet correspondingly connected with a golden finger of the PCIe standard card, and the first clamping part and the second clamping part are respectively provided with a signal leading-out pin header correspondingly connected with the metal spring sheets.
Optionally, the first clamping part with the second clamping part is articulated, first clamping part with the middle part inboard of second clamping part is equipped with articulated supporting part, articulated hole is seted up to articulated supporting part, articulated supporting part pass through the back shaft with the articulated hole is connected, metal shell fragment locates first clamping part with the inboard of the first end of second clamping part, still include the drive first clamping part with the first end closed elasticity drive division of second clamping part.
Optionally, the elastic driving portion is a first compression spring that is crimped between the first clamping portion and the second end of the second clamping portion.
Optionally, the inboard of one of the two first clamping part and the second clamping part is equipped with the guide post, and the inboard of the other two is equipped with guide post sliding connection's guide sleeve, the second pressure spring is established to the week portion cover of guide post, still include wear to locate the guide post with guide sleeve links firmly first clamping part with adjusting stud and the adjusting nut of second clamping part.
Optionally, the local section of the first clamping part and the second clamping part bearing the metal elastic sheet is concavely arranged on the inner side surface of the local section, the metal elastic sheet is protruded relative to the inner side surfaces of the first clamping part and the second clamping part, and the metal conductors connecting the metal elastic sheet and the signal lead-out pins are embedded in the first clamping part and the second clamping part.
Optionally, the width of any one of the metal spring plates is greater than or equal to 1/2 of the width of a single golden finger and less than or equal to the width of the single golden finger.
Optionally, the surface of the metal elastic sheet is plated with an antioxidation coating.
Optionally, the signal connection pin header is disposed at one end of the first clamping portion and the second clamping portion, which is far away from the metal elastic sheet.
Compared with the background art, the golden finger test clamp disclosed by the application has the advantages that by means of the opening and closing movement of the first clamping part and the second clamping part, the first clamping part and the second clamping part are clamped at the two sides of the PCIe standard card when being closed, PCIe signals are led out from the front side and the back side of the golden finger to the signal leading-out pin by utilizing the metal elastic sheets at the inner sides of the first clamping part and the second clamping part, the golden finger is prevented from being damaged, the loss of the PCIe signals on a link is reduced, the requirements of PCIe data transmission on high performance, high bandwidth, high reliability, high expandability and the like are met, and meanwhile, the golden finger test clamp is simple in structure and convenient to use.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present application, and that other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.
FIG. 1 is a block diagram of a golden finger testing fixture according to a first embodiment of the present application;
FIG. 2 is a schematic diagram of a golden finger testing fixture according to a second embodiment of the present application;
FIG. 3 is a schematic diagram of the golden finger test fixture of FIG. 1;
fig. 4 is a top view of the A-A plane of fig. 3.
Wherein:
the device comprises a first clamping part, a second clamping part, a 3-metal elastic piece, a 4-metal conductor, a 5-signal lead-out pin header, a 6-first pressure spring, a 7-second pressure spring, an 8-supporting shaft, a 9-PCIe standard card, a 10-golden finger, an 11-adjusting stud, a 12-adjusting nut, a 101-guiding column and a 201-guiding sleeve.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
The present application will be further described in detail below with reference to the drawings and detailed description for the purpose of enabling those skilled in the art to better understand the aspects of the present application.
Referring to fig. 1 to 4, fig. 1 is a block diagram of a golden finger testing fixture according to a first embodiment of the present application, fig. 2 is a schematic diagram of a golden finger testing fixture according to a second embodiment of the present application, fig. 3 is a schematic diagram of a golden finger testing fixture in fig. 1, and fig. 4 is a top view of A-A surface in fig. 3.
The application aims to provide a golden finger test fixture which can be quickly connected with a golden finger 10 of a PCIe label card 9, so that the golden finger 10 is prevented from being damaged, the loss of PCIe signals on a link is reduced, and the requirements of PCIe data transmission on high performance, high bandwidth, high reliability, high expandability and the like are met.
In order to achieve the above objective, as shown in fig. 1, 3 and 4, the golden finger test fixture provided by the embodiment of the present application includes a first clamping portion 1, a second clamping portion 2, a metal spring plate 3 and a signal lead-out pin 5, wherein the first clamping portion 1 and the second clamping portion 2 are clamped at the middle parts of the inner sides of the first clamping portion 1 and the second clamping portion 2, respectively, and hinge support portions are provided at the middle parts of the inner sides of the first clamping portion 1 and the second clamping portion 2, and the hinge support portions are provided with hinge holes, and the first clamping portion 1 and the second clamping portion 2 are connected with a support shaft 8 through the hinge holes of the hinge support portions. The metal elastic sheet 3 is specifically arranged at the inner sides of the first ends of the first clamping part 1 and the second clamping part 2, and the signal leading-out pin header 5 is correspondingly connected with the metal elastic sheet 3. Currently PCIe links may be single-channel or multi-channel, each containing two pairs of low voltage differential signal lines, one pair for transmit (PETP, PETN) and the other pair for receive (PERP, PERN). Therefore, the number of the metal elastic pieces 3 of the first clamping portion 1 or the second clamping portion 2 is generally four or more, and the number of the pins in the first clamping portion 1 and the second clamping signal lead-out pin header 5 is equal to and correspondingly connected with the number of the metal elastic pieces 3. The number of metal spring plates 3 of the first clamping part 1 and the second clamping part 2 is generally equal.
In order to keep the first ends of the first clamping part 1 and the second clamping part 2 firmly clamped on two sides of the PCIe standard card 9 and enable the metal elastic sheet 3 to be attached to the golden finger 10 and keep good contact, an elastic driving part for driving the first ends of the first clamping part 1 and the second clamping part 2 to be closed is further arranged between the first clamping part 1 and the second clamping part 2, in the embodiment shown in fig. 1, the elastic driving part adopts a first pressure spring 6 arranged between the inner sides of the second ends of the first clamping part 1 and the second clamping part 2, and the inner sides of the second ends of the first clamping part 1 and the second clamping part 2 can be provided with a groove position for accommodating the end part of the first pressure spring 6. It is conceivable that the elastic drive may employ not only the first compression spring 6 but also a torsion spring provided at the support shaft 8.
Referring to fig. 2, in another embodiment, the first clamping portion 1 and the second clamping portion 2 of the golden finger testing fixture are not hinged any more, but are guided by the guiding post 101 and the guiding sleeve 201 in a matched manner, and the first clamping portion 1 and the second clamping portion 2 slide towards or away from each other integrally, so as to realize the opening and closing movement. In this embodiment, the guide post 101 is convexly disposed on the inner side of the first clamping portion 1, the guide sleeves 201 corresponding to the guide posts 101 one by one are disposed on the inner side of the second clamping portion 2, the guide posts 101 are provided with hollow screw holes, and the adjusting stud 11 passes through the guide posts 101 and the guide sleeves 201 to be matched with the adjusting nut 12 to integrally lock the first clamping portion 1 and the second clamping portion 2. The second pressure spring 7 is sleeved on the periphery of the guide post 101, the first clamping part 1 and the second clamping part 2 are driven to keep a mutually separated state by means of the second pressure spring 7, the first clamping part 1 and the second clamping part 2 are driven to overcome the elastic force of the second pressure spring 7 by screwing the adjusting nut 12, the first clamping part 1 and the second clamping part 2 are closed, and the metal elastic sheet 3 on the inner side surfaces of the first clamping part 1 and the second clamping part 2 can be well contacted with the golden finger 10 on the two side surfaces of the PCIe standard card 9.
In the above embodiment, the metal spring plate 3 is preferably disposed at the first end inside the first clamping portion 1 and the second clamping portion 2, the signal lead-out pin 5 is disposed at the second end of the first clamping portion 1 and the second clamping portion 2, the metal conductors 4 are pre-buried in the first clamping portion 1 and the second clamping portion 2, and the metal spring plate 3 and the signal lead-out pin 5 are connected through the metal conductors 4. Meanwhile, the local sections of the first clamping part 1 and the second clamping part 2 are used for arranging the metal elastic sheet 3 to be concavely arranged on the inner side surfaces of the first clamping part 1 and the second clamping part 2, the metal elastic sheet 3 is fixed on a concavely arranged plane and convexly arranged relative to the inner side surfaces of the first clamping part 1 and the second clamping part 2, so that when the first ends of the first clamping part 1 and the second clamping part 2 are closed, the metal elastic sheet 3 is firstly contacted with the golden finger 10 of the PCIe label card 9, and the metal elastic sheet 3 has certain deformation capability, and when the inner side surfaces of the first clamping part 1 and the second clamping part 2 are contacted with the PCIe label card 9, the metal elastic sheet 3 is kept well contacted with the golden finger 10 by virtue of elastic force generated by elastic deformation of the metal elastic sheet 3. Meanwhile, in order to prevent the metal spring plate 3 from scratching the golden finger 10, the metal spring plate 3 has a certain width, and referring to fig. 4, the certain width is generally equal to or greater than 1/2 of the width of the single golden finger 10 and is equal to or less than the width of the single golden finger 10, so that a certain contact surface is ensured, and meanwhile, the adjacent golden finger 10 short circuit caused by the too wide metal spring plate 3 is avoided.
In order to prevent oxidation of the contact, an oxidation-resistant coating is provided on the surface of the metal spring plate 3, and the oxidation-resistant coating may be made of an inert noble metal with good conductivity, such as gold or platinum, so that the arrangement of the coating does not affect the connection and signal transmission between the metal spring plate 3 and the gold finger 10. Except for the metal spring plate 3 at the access end and the signal lead-out pin 5 at the lead-out end, the rest part, namely the metal conductor 4 is totally buried in the first clamping part 1 and the second clamping part 2, so that the metal conductor 4 is not easy to oxidize, break or short circuit. The first clamping part 1 and the second clamping part 2 are made of materials with excellent electrical insulation property, compressive strength, high temperature resistance and low temperature corrosion resistance, and can be polytetrafluoroethylene.
The golden finger test clamp provided by the embodiment of the application has the advantages of simple structure and convenience in use; the PCIe signal can be conveniently led out from the front side and the back side of the golden finger 10, the golden finger 10 is prevented from being damaged, the loss of the PCIe signal on a link is reduced, and the requirements of PCIe data transmission, such as high performance, high bandwidth, high reliability, high expandability and the like, are met.
It should be noted that in this specification relational terms such as first and second are used solely to distinguish one entity from another entity without necessarily requiring or implying any actual such relationship or order between such entities.
The golden finger test fixture provided by the application is described in detail above. The principles and embodiments of the present application have been described herein with reference to specific examples, the description of which is intended only to facilitate an understanding of the method of the present application and its core ideas. It should be noted that it will be apparent to those skilled in the art that various modifications and adaptations of the application can be made without departing from the principles of the application and these modifications and adaptations are intended to be within the scope of the application as defined in the following claims.
Claims (6)
1. The golden finger test clamp is characterized by comprising a first clamping part and a second clamping part which are connected in an opening-closing manner and are used for clamping two sides of a PCIe (peripheral component interconnect express) standard card, wherein metal elastic sheets correspondingly connected with golden fingers of the PCIe standard card are arranged on the inner side surfaces of the first clamping part and the second clamping part which are opposite to each other, and signal leading-out pins correspondingly connected with the metal elastic sheets are arranged on the first clamping part and the second clamping part;
the inner side of one of the first clamping part and the second clamping part is provided with a guide column, the inner side of the other one of the first clamping part and the second clamping part is provided with a guide sleeve in sliding connection with the guide column, the periphery of the guide column is sleeved with a second pressure spring, and the guide column and the guide sleeve are penetrated to fixedly connect an adjusting stud and an adjusting nut of the first clamping part and the second clamping part;
the first clamping part and the second clamping part bear the weight of the local section of the metal elastic sheet and are concavely arranged on the inner side surfaces of the local section, the metal elastic sheet protrudes relative to the inner side surfaces of the first clamping part and the second clamping part, and the metal conductors for connecting the metal elastic sheet and the signal leading-out pins are embedded in the first clamping part and the second clamping part.
2. The golden finger test fixture of claim 1 wherein the first clamping portion and the second clamping portion are hinged, a hinged support portion is arranged on the inner sides of the middle portions of the first clamping portion and the second clamping portion, a hinged hole is formed in the hinged support portion, the hinged support portion is connected with the hinged hole through a support shaft, the metal elastic sheet is arranged on the inner sides of the first ends of the first clamping portion and the second clamping portion, and the golden finger test fixture further comprises an elastic driving portion for driving the first ends of the first clamping portion and the second clamping portion to be closed.
3. The golden finger test fixture of claim 2 wherein the resilient drive section is a first compression spring crimped between the second ends of the first and second clamping sections.
4. The golden finger test fixture of claim 1 wherein the width of any one of the metal spring plates is greater than or equal to 1/2 the width of a single golden finger and less than or equal to the width of a single golden finger.
5. The golden finger test fixture of claim 4 wherein the surface of the metal spring is coated with an oxidation resistant coating.
6. The golden finger test fixture of claim 1 wherein the signal lead pins are disposed at ends of the first and second clamping portions remote from the metal spring.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210037571.7A CN114363230B (en) | 2022-01-13 | 2022-01-13 | Golden finger test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210037571.7A CN114363230B (en) | 2022-01-13 | 2022-01-13 | Golden finger test fixture |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114363230A CN114363230A (en) | 2022-04-15 |
| CN114363230B true CN114363230B (en) | 2023-09-26 |
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ID=81108276
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210037571.7A Active CN114363230B (en) | 2022-01-13 | 2022-01-13 | Golden finger test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114363230B (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202815372U (en) * | 2012-10-08 | 2013-03-20 | 赵林 | Gold finger connection device |
| CN202817246U (en) * | 2012-10-08 | 2013-03-20 | 赵林 | Gold finger connecting device |
| CN202815373U (en) * | 2012-10-09 | 2013-03-20 | 赵林 | Golden finger connecting device |
| CN202817250U (en) * | 2012-10-09 | 2013-03-20 | 赵林 | Golden finger connecting device |
| CN209014671U (en) * | 2018-06-14 | 2019-06-21 | 湖南必然网络科技有限公司 | A kind of DPSK PCIE edge connector automatic test equipment of 10Gbps signal |
| CN214750639U (en) * | 2021-05-31 | 2021-11-16 | 东莞市台易电子科技有限公司 | Gold finger hand-held type clip test fixture |
| CN215181967U (en) * | 2021-07-09 | 2021-12-14 | 中国电子技术标准化研究院 | Test fixture and test system for power consumption test of PCIE (peripheral component interface express) interface product |
| CN215499733U (en) * | 2021-08-26 | 2022-01-11 | 厦门固杰科技有限公司 | Novel flexible circuit board of convenient test of ZIF golden finger encapsulation |
-
2022
- 2022-01-13 CN CN202210037571.7A patent/CN114363230B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202815372U (en) * | 2012-10-08 | 2013-03-20 | 赵林 | Gold finger connection device |
| CN202817246U (en) * | 2012-10-08 | 2013-03-20 | 赵林 | Gold finger connecting device |
| CN202815373U (en) * | 2012-10-09 | 2013-03-20 | 赵林 | Golden finger connecting device |
| CN202817250U (en) * | 2012-10-09 | 2013-03-20 | 赵林 | Golden finger connecting device |
| CN209014671U (en) * | 2018-06-14 | 2019-06-21 | 湖南必然网络科技有限公司 | A kind of DPSK PCIE edge connector automatic test equipment of 10Gbps signal |
| CN214750639U (en) * | 2021-05-31 | 2021-11-16 | 东莞市台易电子科技有限公司 | Gold finger hand-held type clip test fixture |
| CN215181967U (en) * | 2021-07-09 | 2021-12-14 | 中国电子技术标准化研究院 | Test fixture and test system for power consumption test of PCIE (peripheral component interface express) interface product |
| CN215499733U (en) * | 2021-08-26 | 2022-01-11 | 厦门固杰科技有限公司 | Novel flexible circuit board of convenient test of ZIF golden finger encapsulation |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114363230A (en) | 2022-04-15 |
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