CN114358531A - Quality management method and device based on cloud platform, electronic equipment and storage medium - Google Patents
Quality management method and device based on cloud platform, electronic equipment and storage medium Download PDFInfo
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Abstract
The invention relates to a quality management method and device based on a cloud platform, electronic equipment and a storage medium, and relates to the field of product quality management. The method comprises the following steps: receiving bad reason information of the product, parameter information of production equipment corresponding to the product and identification information of the production equipment corresponding to the product, which are sent by the quality monitoring equipment; determining equipment bad parameters in the parameter information according to the bad reason information; and generating a bad reason display chart according to the identification information, the bad reason information and the equipment bad parameters. The method and the device can analyze the reasons causing the product failure and the failure parameters corresponding to the production equipment according to the failure reason display chart so as to find out the equipment with problems, adjust the failure parameters corresponding to the equipment with problems and improve the efficiency of quality management.
Description
Technical Field
The invention relates to the field of product quality management, in particular to a quality management method and device based on a cloud platform, electronic equipment and a storage medium.
Background
After the existing product is produced, the product is generally roughly detected, so that the problems existing in the production process of the product cannot be detected, and the equipment with the problems is difficult to find out, so that the quality problem of the product still occurs in the subsequent production process of the product, and the quality management efficiency of the product is low.
Disclosure of Invention
The invention provides a quality management method and device based on a cloud platform, electronic equipment and a storage medium, and aims to solve the problems that the problems existing in the production process of products cannot be detected and the devices with the problems are difficult to find in the prior art.
In a first aspect, the present invention provides a quality management method based on a cloud platform, where the quality management method based on the cloud platform includes:
receiving bad reason information of a product, parameter information of production equipment corresponding to the product and identification information of the production equipment corresponding to the product, which are sent by a quality monitoring device;
determining the equipment bad parameters in the parameter information according to the bad reason information;
and generating a bad reason display chart according to the identification information, the bad reason information and the equipment bad parameters.
A further technical solution is that the determining the device failure parameter in the parameter information according to the failure cause information includes:
obtaining the product bad parameters of the product from the bad reason information;
and determining the equipment bad parameters according to the product bad parameters.
The further technical scheme is that the method also comprises the following steps:
receiving the qualified quantity of the products sent by the quality monitoring equipment;
acquiring the unqualified quantity of the product from the bad reason information;
calculating the qualified rate of the product according to the unqualified quantity and the qualified quantity;
and if the qualified rate is not within the preset qualified rate range, sending alarm information to the terminal.
The further technical scheme is that the method also comprises the following steps:
acquiring the qualification rate of the product every preset time;
generating a qualified rate change trend chart according to the qualified rate;
and if a yield change trend chart acquisition request sent by the terminal is received, sending a yield change trend chart matched with the yield change trend chart acquisition request to the terminal.
The further technical scheme is that the method also comprises the following steps:
recording the sending times of the alarm information, and producing alarm records;
and if an alarm record acquisition request sent by a terminal is received, sending the alarm record to the terminal.
The further technical scheme is that the method also comprises the following steps:
receiving capacity statistical information sent by the quality monitoring equipment;
acquiring capacity condition information in a first preset time period from the capacity statistical information;
and generating a capacity statistical trend chart according to the capacity condition information.
The further technical scheme is that the method also comprises the following steps:
acquiring target product bad parameters and target unqualified quantity of the product in a second preset time period from the bad reason information;
generating a bad information statistical report of the product according to the bad parameters of the target product and the unqualified quantity of the target product;
and if a bad information statistical report acquisition request sent by a terminal is received, sending a bad information statistical report matched with the bad information statistical report acquisition request to the terminal.
In a second aspect, the present invention provides a cloud platform based quality management apparatus comprising means for performing the method according to the first aspect.
In a third aspect, the present invention provides an electronic device, including a controller, where the controller includes a processor, a communication interface, a memory, and a communication bus, where the processor, the communication interface, and the memory complete communication with each other through the communication bus;
a memory for storing a computer program;
a processor for implementing the steps of the method according to the first aspect when executing a program stored in the memory.
In a fourth aspect, the invention provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the method according to the first aspect.
The invention has the beneficial effects that: a quality management method based on a cloud platform comprises the following steps: receiving bad reason information of a product, parameter information of production equipment corresponding to the product and identification information of the production equipment corresponding to the product, which are sent by a quality monitoring device; determining the equipment bad parameters in the parameter information according to the bad reason information; and generating a bad reason display chart according to the identification information, the bad reason information and the equipment bad parameters. The method comprises the steps of finding out a device with problems and a device bad parameter corresponding to the device by receiving bad reason information of a product sent by a quality monitoring device, parameter information of a production device corresponding to the product and identification information of the production device corresponding to the product, and generating a bad reason display chart according to the bad reason information, the device bad parameter and the identification information. The method and the device can analyze the reasons causing the product failure and the failure parameters corresponding to the production equipment according to the failure reason display chart so as to find out the equipment with problems, adjust the failure parameters corresponding to the equipment with problems and improve the efficiency of quality management.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without inventive exercise.
Fig. 1 is a schematic flowchart of a quality management method based on a cloud platform according to embodiment 1 of the present invention;
fig. 2 is a sub-flow diagram of a quality management method based on a cloud platform according to embodiment 1 of the present invention;
fig. 3 is a schematic flowchart of a quality management method based on a cloud platform according to embodiment 2 of the present invention;
fig. 4 is a schematic structural diagram of a quality management apparatus of a cloud platform according to embodiment 3 of the present invention;
fig. 5 is a schematic structural diagram of a quality management apparatus of a cloud platform according to embodiment 4 of the present invention;
fig. 6 is a structural diagram of a controller provided in the present invention.
Detailed Description
In order to more fully understand the technical content of the present invention, the technical solution of the present invention will be further described and illustrated with reference to the following specific embodiments, but not limited thereto.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
Example 1
Referring to fig. 1, an embodiment 1 of the present invention provides a quality management method based on a cloud platform, where the quality management method is applied to a cloud platform server, and the quality management method based on the cloud platform of the embodiment 1 includes the steps of: S101-S103.
S101, receiving the bad reason information of the product sent by the quality monitoring equipment, the parameter information of the production equipment corresponding to the product and the identification information of the production equipment corresponding to the product.
Specifically, the product failure cause information includes the number of product failures and the type of product failure problems, for example, a product failure problem in which foreign substances are present, a product failure problem in which air bubbles are present, a product failure problem in which liquid crystal is present, and the like, and belongs to one of the product failure problems. The parameter information of the production equipment corresponding to the product includes the operation parameters of the equipment such as pressure, temperature, power and the like when the product is produced, and the identification information of the production equipment corresponding to the product is the information such as the serial number of the production equipment and the like, and is used for identifying the production equipment corresponding to the product. In the embodiment of the present invention, the quality monitoring device may be an upper computer.
And S102, determining the equipment bad parameters in the parameter information according to the bad reason information.
Specifically, as described above, the failure cause information of the product includes the type of the failure problem of the product, and the device failure parameter in the device can be obtained based on the type of the failure problem occurring in the product. That is, if a product has a defect, the operation parameters of the production equipment corresponding to the product having the defect must also have a problem, for example, the product has a defect with bubbles, and it can be determined that the pressure parameter has a problem in the parameters of the production equipment producing the product, that is, the above-mentioned equipment defect parameter in the parameter information is determined according to the defect cause information.
In one embodiment, referring to FIG. 2, step S102 above includes steps S1021-S1022.
And S1021, acquiring the product failure parameters of the product from the failure reason information.
Specifically, the product failure parameters of the product, that is, the types of the above-mentioned product failure problems, such as the occurrence of a foreign substance failure, the occurrence of a bubble failure, the occurrence of a liquid crystal failure, and the like, are obtained from the failure cause information and belong to the product failure parameters of the product, and the device failure parameters in the device are determined based on the product failure parameters, such as the occurrence of a liquid crystal failure due to the insufficient output power of the device.
S1022, determining the equipment bad parameters according to the product bad parameters.
Specifically, after the product bad parameters of the product are acquired from the bad cause information, the equipment bad parameters are obtained according to the product bad parameters, if a certain problem occurs in the product, the operation parameters of the equipment are incorrect, and therefore the equipment bad parameters can be determined through the product bad parameters.
S103, generating a bad reason display chart according to the identification information, the bad reason information and the equipment bad parameters.
Specifically, the bad cause display chart generated by the identification information, the bad cause information and the equipment bad parameters can be used for seeing which equipment bad parameters appear in the production equipment from the bad cause display chart, and seeing the unqualified quantity of the products produced by each equipment, the corresponding product bad parameters and the equipment bad parameters caused by the equipment bad parameters intuitively. The method comprises the steps of finding out a device with problems and a device bad parameter corresponding to the device by receiving bad reason information of a product sent by a quality monitoring device, parameter information of a production device corresponding to the product and identification information of the production device corresponding to the product, and generating a bad reason display chart according to the bad reason information, the device bad parameter and the identification information. The method and the device can analyze the reasons causing the product failure and the failure parameters corresponding to the production equipment according to the failure reason display chart so as to find out the equipment with problems, adjust the failure parameters corresponding to the equipment with problems and improve the efficiency of quality management.
Example 2
Referring to fig. 3, an embodiment 2 of the present invention provides a quality management method based on a cloud platform, and the quality management method based on the cloud platform of the embodiment 2 includes the steps of: S201-S218.
S201, receiving the bad reason information of the product sent by the quality monitoring equipment, the parameter information of the production equipment corresponding to the product and the identification information of the production equipment corresponding to the product.
Specifically, the product failure cause information includes the number of product failures and the type of product failure problems, for example, a product failure problem in which foreign substances are present, a product failure problem in which air bubbles are present, a product failure problem in which liquid crystal is present, and the like, and belongs to one of the product failure problems. The parameter information of the production equipment corresponding to the product includes the operation parameters of the equipment such as pressure, temperature, power and the like when the product is produced, and the identification information of the production equipment corresponding to the product is the information such as the serial number of the production equipment and the like, and is used for identifying the production equipment corresponding to the product. In the embodiment of the present invention, the quality monitoring device may be an upper computer.
S202, determining the equipment bad parameters in the parameter information according to the bad reason information.
Specifically, as described above, the failure cause information of the product includes the type of the failure problem of the product, and the device failure parameter in the device can be obtained based on the type of the failure problem occurring in the product. That is, if a product has a defect, the operation parameters of the production equipment corresponding to the product having the defect must also have a problem, for example, the product has a defect with bubbles, and it can be determined that the pressure parameter has a problem in the parameters of the production equipment producing the product, that is, the above-mentioned equipment defect parameter in the parameter information is determined according to the defect cause information.
In one embodiment, step S102 above includes steps S1021-S1022.
S2021, obtaining the product failure parameters of the product from the failure reason information.
Specifically, the product failure parameters of the product, that is, the types of the above-mentioned product failure problems, such as the occurrence of a foreign substance failure, the occurrence of a bubble failure, the occurrence of a liquid crystal failure, and the like, are obtained from the failure cause information and belong to the product failure parameters of the product, and the device failure parameters in the device are determined based on the product failure parameters, such as the occurrence of a liquid crystal failure due to the insufficient output power of the device.
S2022, determining the equipment bad parameters according to the product bad parameters.
Specifically, after the product bad parameters of the product are acquired from the bad cause information, the equipment bad parameters are obtained according to the product bad parameters, if a certain problem occurs in the product, the operation parameters of the equipment are incorrect, and therefore the equipment bad parameters can be determined through the product bad parameters.
And S203, generating a bad reason display chart according to the identification information, the bad reason information and the equipment bad parameters.
Specifically, the bad cause display chart generated by the identification information, the bad cause information and the equipment bad parameters can be used for seeing which equipment bad parameters appear in the production equipment from the bad cause display chart, and seeing the unqualified quantity of the products produced by each equipment, the corresponding product bad parameters and the equipment bad parameters caused by the equipment bad parameters intuitively. The method comprises the steps of finding out a device with problems and a device bad parameter corresponding to the device by receiving bad reason information of a product sent by a quality monitoring device, parameter information of a production device corresponding to the product and identification information of the production device corresponding to the product, and generating a bad reason display chart according to the bad reason information, the device bad parameter and the identification information. The method and the device can analyze the reasons causing the product failure and the failure parameters corresponding to the production equipment according to the failure reason display chart so as to find out the equipment with problems, adjust the failure parameters corresponding to the equipment with problems and improve the efficiency of quality management.
And S204, receiving the qualified quantity of the products sent by the quality monitoring equipment.
Specifically, the quantity of qualified products currently produced can be known by receiving the qualified quantity of the products sent by the quality monitoring equipment, and the qualified quantity of the products can be combined with the unqualified quantity in the failure reason information to calculate data information such as the qualified rate of the products and the unqualified rate of the products.
S205, acquiring the unqualified quantity of the product from the failure reason information.
Specifically, as described above, the failure cause information includes the number of failures of the product, so that the number of failures of the product can be directly obtained from the failure cause information, and the number of failures of the product can be obtained.
And S206, calculating the qualified rate of the product according to the unqualified quantity and the qualified quantity.
Specifically, the total number of products produced by the production equipment can be obtained by adding the unqualified number to the qualified number, and the qualified rate of the products can be calculated by dividing the qualified number by the total number of the products produced by the production equipment.
And S207, if the qualified rate is not within the preset qualified rate range, sending alarm information to the terminal.
In the embodiment of the invention, the preset qualified rate range is more than or equal to 97%, and the terminal can be an electronic device which can be used by a manager such as a mobile phone, a computer and the like. Therefore, if the calculated qualified rate of the product is lower than 97%, it indicates that the production equipment does not meet the set qualified rate requirement, and an alarm message needs to be sent to the terminal in the form of a short message, an email and the like, so that the user can find that the current production equipment does not meet the requirement in time, adjust the requirement in time, and further improve the production efficiency.
And S208, acquiring the qualification rate of the product at preset time intervals.
Specifically, the preset time may be 30 minutes, or may also be 1 hour, 2 hours, or the like, and the preset time may be set according to actual needs. If the qualification rate of the product needs to be closely noticed, the preset time can be set to be shorter time, such as 15 minutes, 20 minutes and the like, so that a user can know the qualification rate condition of the product in time and adjust the qualification rate condition. The preset time can also be set to be 1 hour, 2 hours and the like, so that a user can see the qualification rate condition of the product on the whole and carry out macroscopic regulation and control on the qualification rate of the product.
And S209, generating a yield change trend chart according to the yield.
Specifically, the yield change trend chart is generated according to the condition that the yield of the product is obtained at intervals of preset time, so that a user can conveniently and visually see the change trend of the yield of the product, and if the yield of the product is obtained at intervals of 30 minutes, the user can see the change trend of the yield of the product within each 30 minutes so as to further adjust the yield.
And S210, if a yield change trend chart acquisition request sent by the terminal is received, sending a yield change trend chart matched with the yield change trend chart acquisition request to the terminal.
Specifically, if a yield change trend chart acquisition request sent by a user through the terminal is received, the cloud platform server responds to the yield change trend chart acquisition request and sends a yield change trend chart matched with the yield change trend chart acquisition request to the terminal. If the user needs to check the qualified rate change trend chart in a certain period, such as the period from 9 a.m. to twelve a.m., the terminal generates a qualified rate change trend chart acquisition request related to the period from 9 a.m. to twelve a.m., sends the qualified rate change trend chart acquisition request related to the period from 9 a.m. to twelve a.m. to the cloud platform server, and sends the qualified rate change trend chart corresponding to the period from 9 a.m. to twelve a.m. to the cloud platform server after the cloud platform server responds to the request.
And S211, recording the sending times of the alarm information and producing alarm records.
Specifically, when the yield is not within the preset yield range, that is, the production equipment does not meet the requirement of the yield at the time, the alarm information is sent to the terminal, and the alarm information is recorded every time the alarm information is sent, so that the sending times of the alarm information can be checked, and the alarm record is generated.
S212, if an alarm record acquisition request sent by a terminal is received, sending the alarm record to the terminal.
Specifically, if a user wants to know the production condition of the production equipment, such as the qualification rate of a product produced by the production equipment, such as whether the qualification rate of the product meets requirements or not, an alarm record acquisition request can be sent through the terminal, and the cloud platform sends an alarm record to the terminal after responding to the alarm record acquisition request. The user can know how many times the alarm information is sent due to insufficient qualification rate by checking the alarm records, and can know the qualification rate condition of the product from the side surface, so that whether the production condition of the production equipment is good or not can be generally known.
S213, receiving the capacity statistic information sent by the quality monitoring equipment.
Specifically, the capacity statistics information sent by the quality monitoring device, such as the capacity statistics of all the production devices within 1 hour, or the capacity statistics of all the production devices within 12 hours, is received, and the capacity statistics information includes the capacity statistics of the production devices in all the time periods. The productivity statistics of each current production equipment within 12 hours can be respectively obtained through the productivity statistical information, so that whether the efficiency of each production equipment meets the productivity requirement of the same day can be obtained. The capacity condition of the production equipment can be visually seen through the capacity statistical information, and whether the production equipment meets the preset capacity requirement or not can be seen through setting the preset capacity requirement and comparing the preset capacity requirement with the capacity statistical information.
S214, acquiring the capacity condition information in the first preset time period from the capacity statistical information.
Specifically, as mentioned above, the capacity statistics information includes the capacity statistics of the production equipment in all time periods, and the capacity statistics information in the first preset time period can be obtained according to actual needs. In the embodiment of the present invention, the first preset time period may be 2 hours, 3 hours, 5 hours, and the like, and is not limited herein. For example, the information of the capacity condition in the time period from 2 pm to 4 pm can be obtained, the information of the capacity condition in the time period from 5 pm to 10 pm can be obtained from the capacity statistical information, and the information of the capacity condition in a certain time period can be obtained according to actual needs.
And S215, generating a capacity statistical trend chart according to the capacity condition information.
Specifically, the capacity statistical trend chart is generated through the capacity condition information, for example, the capacity condition information in the first preset time period is obtained as described above, and if the capacity condition information in the time period from 2 pm to 4 pm is obtained, the corresponding capacity statistical trend chart is generated according to the capacity condition information in the time period from 2 pm to 4 pm, and the capacity condition information in the time period from 2 pm to 4 pm can be visually seen. The user can also send a capacity statistical trend chart acquisition request through the terminal to acquire the capacity statistical trend chart. If a user wants to acquire the capacity statistical information in the time period from 6 pm to 9 pm, a capacity statistical information acquisition request corresponding to the time period from 6 pm to 9 pm is generated through the terminal and sent to the cloud platform server, and after the cloud platform server responds, the capacity statistical information corresponding to the time period from 6 pm to 9 pm is sent to the terminal. A user can obtain the information of the capacity condition in any time period and the corresponding capacity statistical trend chart through a terminal.
S216, acquiring target product failure parameters and target failure quantity of the product in a second preset time period from the failure reason information.
Specifically, the second preset time period may be any time period, and is not limited herein, for example, the target product failure parameters and the target failure quantity of the product in the time period from 10 am to 2 pm may be obtained from the failure cause information, and the target product failure parameters and the target failure quantity of the product in the time period from 3 pm to 6 pm may be obtained from the failure cause information, and the second preset time period is not limited herein. By acquiring the target product bad parameters and the target unqualified quantity of the product in the second preset time period, the number of unqualified products produced by the production equipment in a certain time period and the types of bad problems of the product can be known.
And S217, generating a bad information statistical report of the product according to the bad parameters of the target product and the unqualified quantity of the target product.
And generating a statistical report according to the target product bad parameters and the target unqualified quantity, so that the types of the bad problems and the occupation ratio of the bad problems can be visually seen, and the frequency of the bad problems is the largest, so as to remind a user of paying attention to the bad problems and carrying out adjustment.
S218, if a bad information statistical report acquisition request sent by a terminal is received, sending a bad information statistical report matched with the bad information statistical report acquisition request to the terminal.
Specifically, if the cloud platform server receives a bad information statistical report request sent by a user through a terminal, the cloud platform server sends a bad information statistical report matched with the bad information statistical report acquisition request to the terminal after responding to the bad information statistical report request. If the user wants to know the bad information statistical report corresponding to the time period from 8 am to 10 am, the terminal generates a bad information statistical report acquisition request corresponding to the time period from 8 am to 10 am and sends the request to the cloud platform server, and after the cloud platform server responds, the bad information statistical report corresponding to the time period from 8 am to 10 am is sent to the terminal. The user can acquire the bad information statistical report in any time period according to actual needs to know the bad information statistics and the production condition of the current production equipment.
Example 3
Referring to fig. 4, embodiment 3 of the present invention provides a cloud platform-based quality management apparatus 400, where the cloud platform-based quality management apparatus 400 includes: a first receiving unit 401, a determining unit 402, a first generating unit 403.
The first receiving unit 401 is configured to receive the bad reason information of the product, the parameter information of the production device corresponding to the product, and the identification information of the production device corresponding to the product, which are sent by the quality monitoring device.
A determining unit 402, configured to determine a device failure parameter in the parameter information according to the failure cause information.
A first generating unit 403, configured to generate a bad reason display chart according to the identification information, the bad reason information, and the equipment bad parameter.
In an embodiment, the determining the device failure parameter in the parameter information according to the failure cause information includes:
obtaining the product bad parameters of the product from the bad reason information;
and determining the equipment bad parameters according to the product bad parameters.
Example 4
Referring to fig. 5, embodiment 4 of the present invention provides a quality management apparatus 400 based on a cloud platform, and the quality management apparatus 400 based on a cloud platform provided in embodiment 4 is different from the quality management apparatus 400 based on a cloud platform provided in embodiment 3 in that the apparatus further includes a second receiving unit 404, a first obtaining unit 405, a calculating unit 406, a first transmitting unit 407, a second obtaining unit 408, a second generating unit 409, a second transmitting unit 410, a recording unit 411, a third transmitting unit 412, a second receiving unit 413, a third obtaining unit 414, a third generating unit 415, a fourth obtaining unit 416, a fourth generating unit 417, and a fourth transmitting unit 418.
A second receiving unit 404, configured to receive the qualified quantity of the product sent by the quality monitoring device.
A first obtaining unit 405, configured to obtain the number of failures of the product from the failure cause information.
A calculating unit 406, configured to calculate a qualified rate of the product according to the unqualified quantity and the qualified quantity.
A first sending unit 407, configured to send an alarm message to the terminal if the yield is not within a preset yield range.
The second obtaining unit 408 is configured to obtain the yield of the product every preset time.
And a second generating unit 409 for generating a yield change trend chart according to the yield.
A second sending unit 410, configured to send, to the terminal, a yield change trend chart matching the yield change trend chart acquisition request if the yield change trend chart acquisition request sent by the terminal is received.
And the recording unit 411 is used for recording the sending times of the alarm information and producing alarm records.
A third sending unit 412, configured to send the alarm record to the terminal if an alarm record acquisition request sent by the terminal is received.
The second receiving unit 413 is configured to receive the capacity statistic information sent by the quality monitoring device.
A third obtaining unit 414, configured to obtain, from the capacity statistics information, capacity condition information within a first preset time period.
The third generating unit 415 is configured to generate a capacity statistical trend chart according to the capacity condition information.
A fourth obtaining unit 416, configured to obtain, from the failure cause information, a target product failure parameter and a target failure quantity of the product within a second preset time period.
A fourth generating unit 417, configured to generate a statistical report of the bad information of the product according to the bad parameters of the target product and the target number of unqualified products.
A fourth sending unit 418, configured to send, to the terminal, an adverse information statistics report matched with the adverse information statistics report acquisition request if the adverse information statistics report acquisition request sent by the terminal is received.
Example 5
Referring to fig. 6, an electronic device according to an embodiment of the present invention includes a controller, where the controller includes a processor 111, a communication interface 112, a memory 113, and a communication bus 114, where the processor 111, the communication interface 112, and the memory 113 complete communication with each other through the communication bus 114.
A memory 113 for storing a computer program;
the processor 111 is configured to execute the program stored in the memory 113, and implement the quality management method based on the cloud platform provided in embodiment 1 or 2.
Embodiment 5 of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by the processor 111, implements the steps of the cloud platform-based quality management method according to embodiment 1 or embodiment 2.
It is noted that, in this document, relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A quality management method based on a cloud platform is applied to a cloud platform server, and is characterized by comprising the following steps:
receiving bad reason information of a product, parameter information of production equipment corresponding to the product and identification information of the production equipment corresponding to the product, which are sent by a quality monitoring device;
determining the equipment bad parameters in the parameter information according to the bad reason information;
and generating a bad reason display chart according to the identification information, the bad reason information and the equipment bad parameters.
2. The cloud platform-based quality management method according to claim 1, wherein the determining of the device failure parameter in the parameter information according to the failure cause information includes:
obtaining the product bad parameters of the product from the bad reason information;
and determining the equipment bad parameters according to the product bad parameters.
3. The cloud platform-based quality management method of claim 1, wherein the method further comprises:
receiving the qualified quantity of the products sent by the quality monitoring equipment;
acquiring the unqualified quantity of the product from the bad reason information;
calculating the qualified rate of the product according to the unqualified quantity and the qualified quantity;
and if the qualified rate is not within the preset qualified rate range, sending alarm information to the terminal.
4. The cloud platform-based quality management method of claim 3, wherein the method further comprises:
acquiring the qualification rate of the product every preset time;
generating a qualified rate change trend chart according to the qualified rate;
and if a yield change trend chart acquisition request sent by the terminal is received, sending a yield change trend chart matched with the yield change trend chart acquisition request to the terminal.
5. The cloud platform-based quality management method of claim 3, wherein the method further comprises:
recording the sending times of the alarm information, and producing alarm records;
and if an alarm record acquisition request sent by a terminal is received, sending the alarm record to the terminal.
6. The cloud platform-based quality management method of claim 1, wherein the method further comprises:
receiving capacity statistical information sent by the quality monitoring equipment;
acquiring capacity condition information in a first preset time period from the capacity statistical information;
and generating a capacity statistical trend chart according to the capacity condition information.
7. The cloud platform-based quality management method of claim 1, wherein the method further comprises:
acquiring target product bad parameters and target unqualified quantity of the product in a second preset time period from the bad reason information;
generating a bad information statistical report of the product according to the bad parameters of the target product and the unqualified quantity of the target product;
and if a bad information statistical report acquisition request sent by a terminal is received, sending a bad information statistical report matched with the bad information statistical report acquisition request to the terminal.
8. A cloud platform based quality management apparatus comprising means for performing any of claims 1-7.
9. An electronic device, comprising a controller, wherein the controller comprises a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus;
a memory for storing a computer program;
a processor for implementing the steps of the method according to any one of claims 1 to 7 when executing a program stored in a memory.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 7.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115122155A (en) * | 2022-08-31 | 2022-09-30 | 深圳市玄羽科技有限公司 | Machine tool remote diagnosis method and system based on industrial internet big data |
| CN117826887A (en) * | 2024-03-05 | 2024-04-05 | 深圳鼎晶科技有限公司 | Dynamic feedback pressure control method and system for display module bonding |
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2021
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115122155A (en) * | 2022-08-31 | 2022-09-30 | 深圳市玄羽科技有限公司 | Machine tool remote diagnosis method and system based on industrial internet big data |
| CN115122155B (en) * | 2022-08-31 | 2022-11-22 | 深圳市玄羽科技有限公司 | Machine tool remote diagnosis method and system based on industrial internet big data |
| CN117826887A (en) * | 2024-03-05 | 2024-04-05 | 深圳鼎晶科技有限公司 | Dynamic feedback pressure control method and system for display module bonding |
| CN117826887B (en) * | 2024-03-05 | 2024-06-14 | 深圳鼎晶科技有限公司 | Dynamic feedback pressure control method and system for display module bonding |
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