CN114356249A - Processing system and processing method for automatically detecting and optimizing image quality - Google Patents

Processing system and processing method for automatically detecting and optimizing image quality Download PDF

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Publication number
CN114356249A
CN114356249A CN202210022715.1A CN202210022715A CN114356249A CN 114356249 A CN114356249 A CN 114356249A CN 202210022715 A CN202210022715 A CN 202210022715A CN 114356249 A CN114356249 A CN 114356249A
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data
signal generator
image quality
automatically detecting
processing system
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CN202210022715.1A
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朱爱国
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Suzhou Jiudao Information Technology Co ltd
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Suzhou Jiudao Information Technology Co ltd
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Abstract

The invention relates to the technical field of processing for automatically detecting and optimizing image quality, and discloses a processing system for automatically detecting and optimizing image quality and a processing method thereof. According to the invention, the data obtained in S1 is transmitted to the control application software and is transmitted to the data analysis instrument in S2 for analysis, the data can be well and centrally controlled through the set control application software, the data is processed and analyzed centrally, the automatic detection effect is achieved, the working efficiency is effectively improved, the relevant data obtained in S2 is subjected to signal conditioning, the conditioned data is subjected to test programming, the data can be screened and adjusted to a greater extent, the accuracy and precision of the data are further improved, and the instrument detection is more comprehensive.

Description

Processing system and processing method for automatically detecting and optimizing image quality
Technical Field
The invention relates to the technical field of processing for automatically detecting and optimizing image quality, in particular to a processing system for automatically detecting and optimizing image quality and a processing method thereof.
Background
The automatic detection system is a system for measuring, indicating or recording main process parameters in the production process by using various detection instruments and is called as an automatic detection system. It replaces the continuous observation and recording of the technological parameters by the operator, thus playing the role of human eyes. The heat exchanger heats cold liquid by using steam, and whether the temperature of the heated cold liquid meets the requirement or not can be measured, indicated and recorded by using a temperature measuring element matched with a balance bridge; the flow of the cold liquid can be detected by using a pore plate flowmeter; the steam pressure can be indicated by pressure gauges, which are automatic detection systems.
Data analysis refers to the process of analyzing a large amount of collected data by using an appropriate statistical analysis method, extracting useful information and forming a conclusion to study and summarize the data in detail. This process is also a support process for quality management architectures. In practice, data analysis can help people to make judgments in order to take appropriate actions, and the mathematical basis of data analysis has been established in the early 20 th century, but actual operation has not been made possible until the advent of computers and data analysis has been popularized. Data analysis is a product of combining mathematics and computer science, and in the field of statistics, some people divide data analysis into descriptive statistical analysis, exploratory data analysis and verification data analysis; where exploratory data analysis focuses on finding new features among the data, while confirmatory data analysis focuses on validation or authentication of existing assumptions.
Data fluctuation is easy to occur in the process of detecting an object, and the phenomenon is generally influenced by external environmental factors.
Disclosure of Invention
The invention aims to provide a processing system and a processing method for automatically detecting and optimizing image quality, which can reduce the influence of external environment factors in the process of detecting an instrument and improve the clearness and comprehensiveness of data obtained by detection and image display.
In order to achieve the purpose, the invention provides the following technical scheme:
a processing system for automatically detecting and optimizing image quality comprises a processing system, wherein the processing system is composed of an oscilloscope, a frequency counter, a waveform generator, a power sensor, a signal generator and a signal generator, the oscilloscope is movably connected with the waveform generator, the signal generator is movably connected with the signal generator, the frequency counter is movably arranged at one end of the outer side of the oscilloscope and the waveform generator, and the power sensor is arranged at one end of the outer side of the signal generator and the signal generator.
Preferably, a production line is movably mounted at one end of the outer side of the treatment system, and the top surface of the production line is connected with the treatment system.
Preferably, the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator are all electrically connected.
Preferably, the top surface of the assembly line is provided with a conveyor belt, the two sides of the conveyor belt are provided with baffles, the surface of the baffle on one side is provided with a through hole, one end of the through hole is movably connected with an oscilloscope, a frequency counter, a waveform generator, a power sensor, a signal generator and a signal generator, the arranged conveyor belt is convenient for conveying the instrument at a constant speed, the detection is more comprehensive, the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator which are convenient to arrange are used for detecting and analyzing data of the instrument, and the automatic detection effect is achieved.
A processing method for automatically detecting and optimizing image quality, comprising the steps of:
s1, data testing and control
The electronic equipment transmitted on the surface of the top of the assembly line is used for testing and is transmitted at a constant speed, and data obtained by testing is controlled.
S2, data acquisition and analysis
The data controlled in the step S1 are collected in a centralized manner, stored in the electronic device, analyzed in a centralized manner, useful information is extracted, conclusions are formed, the data are studied in detail, summarized and summarized, and finally stored in the memory card.
S3, data arrangement and management
The data analyzed in the memory card in the S2 is collected into a software configuration template, and the memory card is inserted into the conversion instrument.
S4, data conversion and image display
The data are transmitted to the image equipment through screen projection in the conversion instrument and displayed on a large screen.
Preferably, the related data obtained in S2 is subjected to signal conditioning, the conditioned data is tested and programmed, and the conditioned data is transmitted to programming software, and the obtained related data is subjected to signal conditioning, so that the data can be screened and adjusted to a greater extent, and further, the accuracy and precision of the data are improved, and the instrument can be detected more comprehensively.
Preferably, the related data in the programming software is movably inserted into the memory card in S3, so that the data is conveniently collected in a centralized manner, and the data is protected to a certain extent, thereby avoiding the problem of data loss or confusion caused by the influence of external environmental factors.
Preferably, the data obtained in the step S1 is transmitted to the control application software and is transmitted to the data analysis instrument in the step S2 for analysis, the data can be well controlled in a centralized manner through the set control application software, and the data is processed and analyzed in a centralized manner, so that manual operation is reduced, an automatic detection effect is achieved, and the working efficiency is effectively improved.
The invention provides a processing system and a processing method for automatically detecting and optimizing image quality, which have the following beneficial effects:
(1) according to the invention, the data obtained in S1 is transmitted to the control application software and is transmitted to the data analysis instrument in S2 for analysis, the data can be well and centrally controlled through the set control application software, the data is processed and analyzed centrally, manual operation is reduced, an automatic detection effect is achieved, the working efficiency is effectively improved, the related data obtained in S2 is subjected to signal conditioning, the conditioned data is subjected to test programming and is transmitted to the programming software, the obtained related data is subjected to signal conditioning, the data can be screened and adjusted to a greater extent, the accuracy and precision of the data are improved, and the instrument detection is more comprehensive.
(2) According to the invention, the conveyor belt is arranged on the top surface of the assembly line, the baffles are arranged on two sides of the conveyor belt, the through hole is formed in the surface of the baffle on one side, one end of the through hole is movably connected with the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator, the conveyor belt is convenient for carrying out uniform-speed transmission on the instrument, the detection is more comprehensive, and the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator which are convenient to arrange are arranged on the through hole for carrying out data detection and analysis on the instrument, so that the effect of automatic detection is achieved.
Drawings
FIG. 1 is a process diagram of a processing system for automatically detecting and optimizing image quality in accordance with the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the present invention provides a technical solution:
a processing system for automatically detecting and optimizing image quality comprises a processing system, wherein the processing system comprises an oscilloscope, a frequency counter, a waveform generator, a power sensor, a signal generator and a signal generator, the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator are electrically connected, the oscilloscope is movably connected with the waveform generator, the signal generator is movably connected with the signal generator, the frequency counter is movably arranged at one end outside the oscilloscope and the waveform generator, the power sensor is arranged at one end outside the signal generator and the signal generator, a production line is movably arranged at one end outside the processing system, the top surface of the production line is connected with the processing system, a conveyor belt is arranged on the top surface of the production line, baffles are arranged on two sides of the conveyor belt, and a through hole is arranged on the surface of one baffle, and one end of the through hole is movably connected with the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator, the arranged conveyor belt is convenient for conveying the instrument at a constant speed, the detection is more comprehensive, and the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator which are conveniently arranged through the through hole can be used for detecting and analyzing data of the instrument, so that the effect of automatic detection is achieved.
A processing method for automatically detecting and optimizing image quality, comprising the steps of:
s1, data testing and control
The electronic equipment through transmission at assembly line top surface tests, and at the uniform velocity transmission, control the data that the test obtained, data transmission to control application software that obtains in S1, and analyze in transmitting to the data analysis instrument in S2, can be fine through the control application software that sets up with data centralized control, and concentrate and handle the analysis to data, manual operation has been carried out in the manual work to the reduction, automatic detection' S effect has been reached, work efficiency has effectively been improved.
S2, data acquisition and analysis
The data well controlled in the S1 are collected in a centralized manner, stored in the electronic equipment, analyzed in a centralized manner, useful information is extracted, conclusions are formed, the data are researched and summarized in detail, and finally stored in the memory card, the relevant data obtained in the S2 are subjected to signal conditioning, the conditioned data are subjected to test programming and are transmitted to programming software, the obtained relevant data are subjected to signal conditioning, the data can be screened and adjusted to a greater extent, the accuracy and precision of the data are improved, and the instrument is detected more comprehensively.
S3, data arrangement and management
Data analyzed in the storage card in the S2 is intensively arranged in the software configuration template, the storage card is inserted into the conversion instrument, relevant data in the programming software is movably inserted into the storage card in the S3, the data are conveniently and intensively collected, a certain protection effect is achieved on the data, and the problem that the data are lost or disordered due to the influence of external environment factors is avoided.
S4, data conversion and image display
The data are transmitted to the image equipment through screen projection in the conversion instrument and displayed on a large screen.
In conclusion, the data obtained in the S1 is transmitted to the control application software and is transmitted to the data analysis instrument in the S2 for analysis, the data can be well and centrally controlled through the set control application software, the data are centrally processed and analyzed, manual operation is reduced, the effect of automatic detection is achieved, the working efficiency is effectively improved, the relevant data obtained in the S2 are subjected to signal conditioning, the conditioned data are subjected to test programming and are transmitted to the programming software, the obtained relevant data are subjected to signal conditioning, the data can be screened and adjusted to a greater extent, the accuracy and precision of the data are improved, and the instrument can be detected more comprehensively; the assembly line top surface is provided with the conveyer belt, the conveyer belt both sides are provided with the baffle, and the through-hole has been seted up on one side baffle surface, and through-hole one end and oscilloscope, frequency counter, the waveform generator, power sensor, signal generator and signal generator swing joint, the conveyer belt that sets up is convenient for carry out at the uniform velocity conveying to the instrument, it is more comprehensive to detect, the oscilloscope that the through-hole that sets up simultaneously can conveniently set up, frequency counter, the waveform generator, power sensor, signal generator and signal generator carry out the detection and analysis of data to the instrument, reach automated inspection's effect.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Claims (8)

1. A processing system for automatically detecting and optimizing image quality, comprising a processing system, characterized by: the processing system comprises an oscilloscope, a frequency counter, a waveform generator, a power sensor, a signal generator and a signal generator, wherein the oscilloscope is movably connected with the waveform generator, the signal generator is movably connected with the signal generator, the frequency counter is movably arranged at one end of the outer side of the oscilloscope and the waveform generator, and the power sensor is arranged at one end of the outer side of the signal generator and the signal generator.
2. A processing system for automatically detecting and optimizing image quality according to claim 1, characterized by: and a production line is movably arranged at one end of the outer side of the treatment system, and the top surface of the production line is connected with the treatment system.
3. A processing system for automatically detecting and optimizing image quality according to claim 1, characterized by: the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator are all electrically connected.
4. A processing system for automatically detecting and optimizing image quality according to claim 2, characterized by: the conveying belt is arranged on the surface of the top of the assembly line, baffles are arranged on two sides of the conveying belt, a through hole is formed in the surface of one baffle, and one end of the through hole is movably connected with the oscilloscope, the frequency counter, the waveform generator, the power sensor, the signal generator and the signal generator.
5. A processing method for automatically detecting and optimizing image quality, comprising the steps of:
s1, data testing and control
Testing through electronic equipment transmitted on the top surface of the assembly line, and transmitting at a constant speed to control data obtained by testing;
s2, data acquisition and analysis
The data controlled in the S1 are collected in a centralized way, stored in the electronic equipment, analyzed in a centralized way, useful information is extracted, conclusions are formed, the data are researched and summarized in detail, and finally, the data are stored in the memory card;
s3, data arrangement and management
The data analyzed in the memory card in the S2 is centrally arranged in a software configuration template, and the memory card is inserted into a conversion instrument;
s4, data conversion and image display
The data are transmitted to the image equipment through screen projection in the conversion instrument and displayed on a large screen.
6. The process of automatically detecting and optimizing image quality of claim 5, wherein: and performing signal conditioning on the related data obtained in the step S2, performing test programming on the conditioned data, and transmitting the conditioned data to programming software.
7. The process of automatically detecting and optimizing image quality of claim 6, wherein: the relevant data in the programming software is actively plugged with the memory card in S3.
8. The process of automatically detecting and optimizing image quality of claim 5, wherein: and transmitting the data obtained in the step S1 to control application software, and transmitting the data to a data analysis instrument in a step S2 for analysis.
CN202210022715.1A 2022-01-10 2022-01-10 Processing system and processing method for automatically detecting and optimizing image quality Pending CN114356249A (en)

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Application Number Priority Date Filing Date Title
CN202210022715.1A CN114356249A (en) 2022-01-10 2022-01-10 Processing system and processing method for automatically detecting and optimizing image quality

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Application Number Priority Date Filing Date Title
CN202210022715.1A CN114356249A (en) 2022-01-10 2022-01-10 Processing system and processing method for automatically detecting and optimizing image quality

Publications (1)

Publication Number Publication Date
CN114356249A true CN114356249A (en) 2022-04-15

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107515920A (en) * 2017-08-22 2017-12-26 湖北大学 A kind of image big data analysis method based on dynamic aerial survey
CN109060813A (en) * 2018-06-05 2018-12-21 中国矿业大学(北京) Earth and stone material gradation automatic testing method based on image optimization classification
CN110286131A (en) * 2019-07-09 2019-09-27 安徽富煌科技股份有限公司 A kind of textile flaw automatic detection analysis prompt system and method
CN112967225A (en) * 2021-01-29 2021-06-15 绍兴隆芙力智能科技发展有限公司 Automatic detection system, method, equipment and medium based on artificial intelligence

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107515920A (en) * 2017-08-22 2017-12-26 湖北大学 A kind of image big data analysis method based on dynamic aerial survey
CN109060813A (en) * 2018-06-05 2018-12-21 中国矿业大学(北京) Earth and stone material gradation automatic testing method based on image optimization classification
CN110286131A (en) * 2019-07-09 2019-09-27 安徽富煌科技股份有限公司 A kind of textile flaw automatic detection analysis prompt system and method
CN112967225A (en) * 2021-01-29 2021-06-15 绍兴隆芙力智能科技发展有限公司 Automatic detection system, method, equipment and medium based on artificial intelligence

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