CN114355253A - Split column short circuit test method for extra-high voltage transformer - Google Patents

Split column short circuit test method for extra-high voltage transformer Download PDF

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Publication number
CN114355253A
CN114355253A CN202111641503.3A CN202111641503A CN114355253A CN 114355253 A CN114355253 A CN 114355253A CN 202111641503 A CN202111641503 A CN 202111641503A CN 114355253 A CN114355253 A CN 114355253A
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voltage
low
transformer
tested
short circuit
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Inventor
胡醇
胡德霖
刘海
卞菊惠
贺诚
李叶富
王欣
朱瑞华
袁小勇
杨燕
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Suzhou Electrical Appliance Science Research Institute Co ltd
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Suzhou Electrical Appliance Science Research Institute Co ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/62—Testing of transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

The invention discloses a column-dividing short circuit test method of an extra-high voltage transformer, which specifically comprises the following steps: processing a plurality of parallel columns of the transformer to be tested by combining the condition of the test system to form n parts to be tested; and respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each part to be tested of the transformer to be tested. The grid connection method disclosed by the invention can be used for quickly, effectively and accurately carrying out high-medium short circuit test, high-low short circuit test and medium-low short circuit test on the extra-high voltage transformer.

Description

Split column short circuit test method for extra-high voltage transformer
Technical Field
The invention belongs to the technical field of transformer tests, and particularly relates to a column-dividing short circuit test method of an extra-high voltage transformer.
Background
The extra-high voltage is a power transmission technology with the voltage class of 1000 kilovolts of alternating current or more and +/-800 kilovolts of direct current or more, and has the technical advantages of large transmission capacity, long distance, high efficiency, low loss and the like. The ultra-high voltage transmission plays an important role in the aspects of guaranteeing power supply, promoting the development of clean energy, improving the environment, improving the safety level of a power grid and the like.
The extra-high voltage transformer is a core device in an extra-high voltage transmission network, and the transformer inevitably suffers from the impact of short-circuit current when running in the transmission network, and whether the transformer can withstand the impact of the short-circuit current or not, and the running safety of a transmission line is directly influenced without damage. Whether the transformer can bear the impact of short-circuit current or not is verified through tests in the most effective and direct method.
However, direct testing of the extra-high voltage transformer is difficult, so a method for testing the column short circuit of the extra-high voltage transformer needs to be proposed urgently.
Disclosure of Invention
In order to solve the technical problem, the invention provides a column-dividing short circuit test method of an extra-high voltage transformer.
In order to achieve the purpose, the technical scheme of the invention is as follows:
the invention discloses a column-dividing short circuit test method of an extra-high voltage transformer, which comprises the following steps:
STEP 1: processing a plurality of parallel columns of the transformer to be tested by combining the condition of the test system to form n parts to be tested;
STEP 2: and respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each part to be tested of the transformer to be tested.
On the basis of the technical scheme, the following improvements can be made:
preferably, STEP1 specifically includes the following:
the medium voltage A of the transformer to be testedmThe lead wire is disconnected from the parallel connection part of adjacent column windings inside the lead wire and is divided into Am1End to AmnThe terminal is divided into n medium-voltage terminals to be led out, n is more than or equal to 2, and n is an integer;
or dividing the low-voltage X end of the transformer to be tested into X ends1End to XkAnd the end is divided into k low-voltage terminals to be led out, k is more than or equal to 2, and k is an integer.
Preferably, when the medium pressure A is adjustedmWhen the lead is divided into n medium-voltage terminals, the method of the high-medium short-circuit test is as follows: connecting the A end of the transformer to be tested with the high-voltage system, the X end and the medium voltage A of the ith part to be testedmiThe end is short-circuited and then connected with a low-voltage system; the low-voltage a end and the low-voltage x end are opened, i belongs to [1, n ]]。
Preferably, when the medium pressure A is adjustedmWhen the lead is divided into n medium-voltage terminals, the method of the high-low short-circuit test is as follows: connecting the A end of the transformer to be tested with the high-voltage system, connecting the X end with the low-voltage system, and connecting the ith part to be tested with the medium voltage AmiAn end open circuit; the low-voltage a end and the low-voltage x end are in short circuit, i belongs to [1, n ]]。
Preferably, when the medium pressure A is adjustedmWhen the lead is divided into n medium-voltage terminals, the method of the medium-low short circuit test is as follows: opening the A end of the transformer to be tested, connecting the X end with the low-voltage system, and connecting the ith part to be tested with the medium voltage AmiThe high-voltage system is connected with the terminal; the low-voltage a end and the low-voltage x end are in short circuit, i belongs to [1, n ]]。
Preferably, when the low voltage X terminal is divided into k low voltage terminals, the method of the high-medium short circuit test is as follows: connecting the A end of the transformer to be tested with the high-voltage system, and connecting the X end of the jth part to be tested with the X end of the high-voltage systemjTerminal and AmThe end is short-circuited and then connected with a low-voltage system; the low-voltage a end and the low-voltage x end are opened, and j belongs to [1, k ]]。
Preferably, when the low voltage X terminal is divided into k low voltage terminals, the method of the high-low short circuit test is as follows: connecting the A end of the transformer to be tested with the high-voltage system, and connecting the X end of the jth part to be tested with the X end of the high-voltage systemjTerminating the low-voltage system, AmAn end open circuit; the low-voltage a end and the low-voltage x end are in short circuit, and j belongs to [1, k ]]。
Preferably, when the low-voltage X terminal is divided into k low-voltage terminals, the method of the low-medium short circuit test is as follows: opening the A end of the transformer to be tested, and setting the X of the jth part to be testedjTerminating the low-voltage system, AmThe high-voltage system is connected with the terminal; the low-voltage a end and the low-voltage x end are in short circuit, and j belongs to [1, k ]]。
The invention discloses a column-dividing short circuit test method of an extra-high voltage transformer, which can quickly, effectively and accurately perform high and medium voltage short circuit tests, high and low voltage short circuit tests and medium and low short circuit tests on the extra-high voltage transformer and solve the problem that the existing test system is small in capacity and cannot directly perform short circuit tests on the extra-high voltage transformer.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
Fig. 1 is a flowchart of a column short circuit test method for an extra-high voltage transformer according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of a high-medium short circuit test connection provided in an embodiment of the present invention.
Fig. 3 is a schematic diagram of a high-low short circuit test connection provided in the embodiment of the present invention.
Fig. 4 is a schematic diagram of a medium-low short circuit test connection provided in an embodiment of the present invention.
Fig. 5 is a schematic diagram of a three-winding transformer test working condition wiring provided by the embodiment of the invention.
Fig. 6 is a circuit diagram of an extra-high voltage transformer short circuit endurance test system according to an embodiment of the present invention.
Detailed Description
Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The use of the ordinal terms "first," "second," "third," etc., to describe a common object merely indicate that different instances of like objects are being referred to, and are not intended to imply that the objects so described must be in a given sequence, either temporally, spatially, in ranking, or in any other manner.
Also, the expression "comprising" an element is an expression of "open" which merely means that there is a corresponding component, and should not be interpreted as excluding additional components.
In order to achieve the purpose of the present invention, in some embodiments of the method for testing the column separation short circuit of the extra-high voltage transformer, as shown in fig. 1, the method for testing the column separation short circuit of the extra-high voltage transformer comprises the following steps:
STEP 1: and (2) processing 2 parallel columns of the transformer to be tested by combining the condition of the test system to form 2 parts to be tested, wherein 1 column is one part to be tested.
STEP 2: and respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each column of the transformer to be tested.
It should be noted that this embodiment is exemplified by a 1000MVA/1000kV transformer to be tested with 2 columns, but the scope of the present invention is not limited to a transformer to be tested with 2 columns, with a capacity of 500MVA per column.
The short circuit bearing capacity test mainly examines the bearing capacity of the electric power between the high, middle and low windings of the single column, so that 2 columns of the 1000MVA transformer are respectively subjected to the short circuit test.
STEP1 specifically includes the following: the medium voltage A of the transformer to be testedmThe lead wire is disconnected from the parallel connection position of adjacent column windings inside the lead wire and is divided into medium voltage Am1Terminal and medium voltage Am2And (4) an end.
Further, as shown in fig. 2, the method for testing the short circuit in the high and medium areas of the 1 st column of the transformer to be tested is as follows: connecting the A end of the transformer to be tested with the high-voltage system, the X end and the medium voltage A of the 1 st columnm1The end is short-circuited and then connected with a low-voltage system; the low voltage a terminal and the low voltage x terminal are open.
Further, as shown in fig. 3, the method for testing the high-low short circuit of the 1 st column of the transformer to be tested is as follows: connecting the A end of the transformer to be tested with the high-voltage system, connecting the X end with the low-voltage system, and connecting the 1 st column with the medium voltage Am1An end open circuit; the low-voltage end a is short-circuited with the low-voltage end x.
Further, as shown in fig. 4, the method for testing the middle-low short circuit of the 1 st column of the transformer to be tested is as follows: opening the A end of the transformer to be tested, connecting the X end with the low-voltage system, and connecting the 1 st column with the medium voltage Am1The high-voltage system is connected with the terminal; the low-voltage end a is short-circuited with the low-voltage end x.
Similarly, the short-circuit test method for the 2 nd column of the transformer to be tested is as follows:
the method for testing the high-medium short circuit of the 2 nd column of the transformer to be tested comprises the following steps: connecting the A end of the transformer to be tested with the high-voltage system, the X end and the medium voltage A of the 2 nd columnm2The end is short-circuited and then connected with a low-voltage system; the low voltage a terminal and the low voltage x terminal are open.
The method for testing the high-low short circuit of the 2 nd column of the transformer to be tested comprises the following steps: connecting the A end of the transformer to be tested with the high-voltage system, connecting the X end with the low-voltage system, and connecting the 2 nd column with the medium voltage Am2An end open circuit; the low-voltage end a is short-circuited with the low-voltage end x.
The method for testing the medium-low short circuit of the 2 nd column of the transformer to be tested comprises the following steps: opening the A end of the transformer to be tested, connecting the X end with the low-voltage system, and connecting the 2 nd column with the medium voltage Am2The high-voltage system is connected with the terminal; the low-voltage end a is short-circuited with the low-voltage end x.
As shown in fig. 5, a three-winding power transformer operates on a network, typically a high-voltage side grid, a medium-voltage side grid, and a low-voltage side load. When the test condition selection of the three-winding transformer is carried out, the following conditions are generally available.
If the medium-voltage side outlet end has short-circuit fault, short-circuit current is generated in the high-medium-voltage winding, if the high-voltage side outlet end has short-circuit fault, the medium-voltage power is supplied, the short-circuit current is also generated in the high-medium-voltage winding, and the two fault conditions can be simulated and verified by the high-medium short-circuit test working condition.
If the low-voltage side outlet end has short-circuit fault, the high-medium voltage winding supplies power to the low-voltage winding at the same time, the high-to-low short-circuit impedance of the transformer is larger than the medium-to-low short-circuit impedance, so the short-circuit current is mainly generated in the medium-to-low voltage winding, and the fault condition can be verified by medium-to-low short-circuit test working condition simulation.
The calculation of the specific short-circuit current also determines the system apparent capacity of the medium-voltage network, whether the system is connected to the grid or the parallel operation of several transformers of the same type, and the selection of the operation mode has great influence on the short-circuit current.
Note that in other embodiments.
STEP1 specifically includes the following: dividing the low-voltage X end of the transformer to be tested into low-voltage X ends1Terminal and low voltage X2And (4) an end.
Further, the method for testing the short circuit of the 1 st column of the transformer to be tested comprises the following steps: connecting the A end of the transformer to be tested with the X end of the 1 st column of the high-voltage system1Terminal and AmThe end is short-circuited and then connected with a low-voltage system; the low voltage a terminal and the low voltage x terminal are open.
Further, the method for testing the high-low short circuit of the 1 st column of the transformer to be tested comprises the following steps: connecting the A end of the transformer to be tested with the X end of the 1 st column of the high-voltage system1Terminating the low-voltage system, AmAn end open circuit; the low-voltage end a is short-circuited with the low-voltage end x.
Further, the method for testing the middle-low short circuit of the 1 st column of the transformer to be tested comprises the following steps: opening the A end of the transformer to be tested, and setting the X of the 1 st column1Terminating the low-voltage system, AmThe high-voltage system is connected with the terminal; the low-voltage end a is short-circuited with the low-voltage end x.
The short circuit test method for the 2 nd column of the transformer to be tested is as follows:
the method for testing the high-medium short circuit of the 2 nd column of the transformer to be tested comprises the following steps: connecting the A end of the transformer to be tested with the X end of the 2 nd column of the high-voltage system2Terminal and AmThe end is short-circuited and then connected with a low-voltage system; the low voltage a terminal and the low voltage x terminal are open.
The method for testing the high-low short circuit of the 2 nd column of the transformer to be tested comprises the following steps: connecting the A end of the transformer to be tested with the X end of the 2 nd column of the high-voltage system2Terminating the low-voltage system, AmAn end open circuit; the low-voltage end a is short-circuited with the low-voltage end x.
The method for testing the medium-low short circuit of the 2 nd column of the transformer to be tested comprises the following steps: opening the A end of the transformer to be tested, and setting the X of the 2 nd column2Terminating the low-voltage system, AmThe high-voltage system is connected with the terminal; the low-voltage end a is short-circuited with the low-voltage end x.
In order to facilitate understanding of the invention, a system for testing the short-circuit bearing capacity of the ultra-high voltage transformer is introduced below, and the test is carried out by adopting the method for testing the column-splitting short-circuit.
As shown in fig. 6, the system for testing the short-circuit withstand capability of the extra-high voltage transformer comprises: the power supply device comprises a group of power supply modules, a group of first boosting modules and two groups of second boosting modules.
The power supply module includes: generator G1To generator G5The current-limiting reactor CLR and the closing phase-selecting switch HQ are connected in parallel, and 5 generators are connected in parallel.
The first boost module includes: first step-up transformer DA1To the first step-up transformer DA6；
First step-up transformer DA1To the first step-up transformer DA6Is connected in parallel with the primary side and is electrically connected with the power supply module, and a first step-up transformer DA1To the first step-up transformer DA6The secondary sides of the first step-up transformer DA are sequentially connected in a reverse cascade manner1The secondary side is electrically connected with a first test end of the transformer to be tested. The first test terminal may be, but is not limited to, the x-terminal of the transformer to be tested.
Wherein a set of second boost modules includes: second step-up transformer DB1To the second step-up transformer DB2And an isolation step-up transformer DC1To an isolating step-up transformer DC2；
Isolated step-up transformer DC1To an isolating step-up transformer DC2Is connected in parallel with the primary side and is electrically connected with the power supply module to isolate the step-up transformer DC1To an isolating step-up transformer DC2Is connected in parallel, and then is a second step-up transformer DB1To the second step-up transformer DB2The primary side of (a) supplies power;
second step-up transformer DB1To the second step-up transformer DB2Is connected in series with the primary side of the second step-up transformer DB1To the second step-up transformer DB2Secondary side of the second step-up transformer DB is connected in series1And a first step-up transformer DA6Is electrically connected to the secondary side of the second step-up transformer DB2A second step-up transformer DB in the secondary side and another group of second step-up modules3The secondary side is electrically connected.
Another set of second boost modules includes: second step-up transformer DB3To the second step-up transformer DB4And an isolation step-up transformer DC3To an isolating step-up transformer DC4；
Isolated step-up transformer DC3To an isolating step-up transformer DC4Is connected in parallel with the primary side and is electrically connected with the power supply module to isolate the step-up transformer DC3To an isolating step-up transformer DC4Is connected in parallel, and then is a second step-up transformer DB3To the second step-up transformer DB4The primary side of (a) supplies power;
second step-up transformer DB3To the second step-up transformer DB4Is connected in series with the primary side of the second step-up transformer DB3To the second step-up transformer DB4Secondary side of the second step-up transformer DB is connected in series3And a second step-up transformer DB in the last group of second step-up modules2Is electrically connected to the secondary side of the second step-up transformer DB4The secondary side is electrically connected with the second test end of the transformer to be tested. The second test terminal may be, but is not limited to, the a terminal of the transformer to be tested.
Wherein, the transformer to be tested is a 1000MVA/1000kV extra-high voltage transformer.
The generator is a DSF-6500 impulse generator, 5 6500MVA impulse generators are connected in parallel, and a short-time three-phase 32500MVA and two-phase 18500MVA test power supply is provided.
First step-up transformer DA1To the first step-up transformer DA6And an isolating step-up transformer DC1To an isolating step-up transformer DC4The transformer is an YD-120000/220 impact transformer, in particular a test transformer with the short-time capacity of 1500 MVA;
second step-up transformer DB1To the second step-up transformer DB4The transformer is a YLD-120000/750 impact transformer, in particular a test transformer with a short-time capacity of 1200 MVA.
First step-up transformer DA1Secondary side of and the first step-up transformer DA2The series point between the secondary sides of the transformer is electrically connected with the oil tank shell of the transformer to be tested. First step-up transformer DA3Secondary side of and the first step-up transformer DA4The series point between the secondary sides of the two is grounded. The transformer to be tested is arranged on the insulation platform IP. Second step-up transformer DB3And a second step-up transformer DB4Is arranged on the insulation platform IP.
At the second test end of the transformer to be tested, the FQ is opened through the opening circuit breaker1And tripping circuit breaker FQ2And a second step-up transformer DB in a second step-up module4And (6) electrically connecting.
An arrester ARR is arranged at a proper position of the circuit.
The following specifically describes the steps of the test system for the 1 st column of the transformer to be tested in the high and medium range test.
S1, placing the transformer S to be tested on the insulation platform IP, and keeping the voltage A in the 1 st column of the transformer S to be testedm1The terminal and the X terminal are in short circuit through a wire with a sufficient section, and the low-voltage terminals a and X are in open circuit;
s2, second step-up transformer DB3And a second step-up transformer DB4Is arranged on an insulation platform IP and a second booster transformer DB3And a second step-up transformer DB4Outer casing oil tank pairThe ground insulation can bear 175kV voltage;
s3, a first step-up transformer DA1The X terminal output of the test transformer is connected with the X terminal of the test transformer and the first step-up transformer DA1The A terminal output of the transformer S tank shell and the second step-up transformer DB for the test4The A terminal outputs through the opening circuit breaker FQ1And tripping circuit breaker FQ2A terminal A of the test transformer is received;
s4, generator G1To generator G5Starting to a rated revolution, pre-closing a protection circuit breaker BD and a parallel operation circuit breaker PD, and balancing 5 generators through a parallel operation reactor PR to reach the same voltage and the same revolution;
s5, adjusting the CLR value of the current limiting reactor, controlling the accident current of the generator to be 80kA, and opening the brake circuit breaker FQ1And tripping circuit breaker FQ2Switching on, switching on a phase selection switch HQ, and switching off, so as to adjust the forced excitation input multiple and input time of the generator, the machine adjusting time of the generator and the field suppression time;
s6, measuring the reactance value of the 1 st column of the transformer to be tested before the test;
s7, boosting the voltage of the generator to a first preset value, switching on the HQ switch, and switching off the FQ switch after 250ms1And tripping circuit breaker FQ2Opening the brake to finish the adjustment test of 50% current;
s8, opening circuit breaker FQ1And tripping circuit breaker FQ2Switching on, switching on a phase selection switch HQ and switching off;
s9, boosting the voltage of the generator to a second preset value, switching on the HQ switch, and switching off the FQ switch after 250ms1And tripping circuit breaker FQ2Opening the brake to finish the formal test of the first 100% current;
s10, opening circuit breaker FQ1And tripping circuit breaker FQ2Switching on, switching on a phase selection switch HQ and switching off;
s11, measuring the reactance value of the transformer S to be tested, comparing the measured reactance value with the reactance value of the 1 st column of the transformer S to be tested before the test, and judging whether the reactance value meets the standard requirement;
if yes, go to S12;
if not, stopping the test;
s12, transforming and tapping the 1 st column of the transformer S to be tested, and measuring the reactance value of the 1 st column of the transformer S to be tested before the next test;
s13, repeating the steps S7-S12, and finishing the formal test of the second 100% current;
and S14, repeating the steps S7-S12, and finishing the formal test of the current of 100% for the third time.
The method for the column separation test of the 1000MVA ultra-high voltage transformer solves the problem of testing the power supply capacity, and the 1500MVA ultra-high voltage transformer with the maximum capacity in the ultra-high voltage transmission system can also be verified by the column separation test method.
The invention makes the short circuit bearing capacity test of the extra-high voltage transformer possible, and protects the driving for the safe operation of the extra-high voltage network.
The invention discloses a column-dividing short circuit test method of an extra-high voltage transformer, which can quickly, effectively and accurately perform a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on a transformer to be tested, and solves the problems that the existing test system is small in capacity and cannot directly perform the short circuit test on the extra-high voltage transformer.
The above embodiments are merely illustrative of the technical concept and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the content of the present invention and implement the present invention, and not to limit the scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be covered in the scope of the present invention.

Claims (8)

1. The method for testing the column short circuit of the extra-high voltage transformer is characterized by comprising the following steps of:
STEP 1: processing a plurality of parallel columns of the transformer to be tested by combining the condition of the test system to form n parts to be tested;
STEP 2: and respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each part to be tested of the transformer to be tested.
2. The column-splitting short circuit test method of the extra-high voltage transformer according to claim 1, wherein STEP1 specifically comprises the following contents:
the medium voltage A of the transformer to be testedmThe lead wire is disconnected from the parallel connection part of adjacent column windings inside the lead wire and is divided into Am1End to AmnThe terminal is divided into n medium-voltage terminals to be led out, n is more than or equal to 2, and n is an integer;
or dividing the low-voltage X end of the transformer to be tested into X ends1End to XkAnd the end is divided into k low-voltage terminals to be led out, k is more than or equal to 2, and k is an integer.
3. The method for testing the column short circuit of the extra-high voltage transformer according to claim 2, wherein when the medium voltage A is appliedmWhen the lead is divided into n medium-voltage terminals, the method of the high-medium short-circuit test is as follows: connecting the A end of the transformer to be tested with the high-voltage system, the X end and the medium voltage A of the ith part to be testedmiThe end is short-circuited and then connected with a low-voltage system; the low-voltage a end and the low-voltage x end are opened, i belongs to [1, n ]]。
4. The method for testing the column short circuit of the extra-high voltage transformer according to claim 2, wherein when the medium voltage A is appliedmWhen the lead is divided into n medium-voltage terminals, the method of the high-low short-circuit test is as follows: connecting the A end of the transformer to be tested with the high-voltage system, connecting the X end with the low-voltage system, and connecting the ith part to be tested with the medium voltage AmiAn end open circuit; the low-voltage a end and the low-voltage x end are in short circuit, i belongs to [1, n ]]。
5. The method for testing the column short circuit of the extra-high voltage transformer according to claim 2, wherein when the medium voltage A is appliedmWhen the lead is divided into n medium-voltage terminals, the method of the medium-low short circuit test is as follows: opening the A end of the transformer to be tested, connecting the X end with the low-voltage system, and connecting the ith part to be tested with the medium voltage AmiThe high-voltage system is connected with the terminal; the low-voltage a end and the low-voltage x end are in short circuit, i belongs to [1, n ]]。
6. An ultra high voltage transformer according to claim 2The column-dividing short circuit test method of the transformer is characterized in that when a low-voltage X end is divided into k low-voltage terminals, the high-medium short circuit test method comprises the following steps: connecting the A end of the transformer to be tested with the high-voltage system, and connecting the X end of the jth part to be tested with the X end of the high-voltage systemjTerminal and AmThe end is short-circuited and then connected with a low-voltage system; the low-voltage a end and the low-voltage x end are opened, and j belongs to [1, k ]]。
7. The column-splitting short circuit test method of the extra-high voltage transformer according to claim 2, wherein when the low-voltage X end is split into k low-voltage terminals, the high-low short circuit test method is as follows: connecting the A end of the transformer to be tested with the high-voltage system, and connecting the X end of the jth part to be tested with the X end of the high-voltage systemjTerminating the low-voltage system, AmAn end open circuit; the low-voltage a end and the low-voltage x end are in short circuit, and j belongs to [1, k ]]。
8. The column-splitting short circuit test method of the extra-high voltage transformer according to claim 2, wherein when the low-voltage X end is split into k low-voltage terminals, the method of the medium-low short circuit test is as follows: opening the A end of the transformer to be tested, and setting the X of the jth part to be testedjTerminating the low-voltage system, AmThe high-voltage system is connected with the terminal; the low-voltage a end and the low-voltage x end are in short circuit, and j belongs to [1, k ]]。
CN202111641503.3A 2021-12-29 2021-12-29 Split column short circuit test method for extra-high voltage transformer Pending CN114355253A (en)

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