CN114355112B - Transient fault and defect discharge fault simulation test platform and data analysis method - Google Patents

Transient fault and defect discharge fault simulation test platform and data analysis method Download PDF

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CN114355112B
CN114355112B CN202210279397.7A CN202210279397A CN114355112B CN 114355112 B CN114355112 B CN 114355112B CN 202210279397 A CN202210279397 A CN 202210279397A CN 114355112 B CN114355112 B CN 114355112B
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low
lead
voltage electrode
voltage
traveling wave
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CN114355112A (en
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唐锋
潘松
淡汉民
刘德平
彭洋
殷志江
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Zhilian Xinneng Power Technology Co ltd
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Zhilian Xinneng Power Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08Locating faults in cables, transmission lines, or networks
    • G01R31/081Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/086Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution networks, i.e. with interconnected conductors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08Locating faults in cables, transmission lines, or networks
    • G01R31/088Aspects of digital computing
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y04INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
    • Y04SSYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
    • Y04S10/00Systems supporting electrical power generation, transmission or distribution
    • Y04S10/50Systems or methods supporting the power network operation or management, involving a certain degree of interaction with the load-side end user applications
    • Y04S10/52Outage or fault management, e.g. fault detection or location

Abstract

The invention relates to a transient fault and defect discharge fault simulation test platform, which comprises: the high-voltage side analog lead is erected on the landing gear through a first insulating part; a low-voltage side analog conductor suspended above the high-voltage side analog conductor by a second insulating member; the power distribution network power supply is connected with the high-voltage side analog lead; the two conducting wires with uniform texture are respectively connected to two ends of the simulated conducting wire on the low-pressure side, and each conducting wire with uniform texture is grounded; a test sample disposed between the high-pressure-side analog lead and the low-pressure-side analog lead. The beneficial effects are that: the test platform adopts the low-pressure side model wire to suspend in the air, and the low-pressure side model wire is grounded through two wires with uniform texture, and the means of externally connecting two wires with uniform texture forms uniform impedance transition between the test sample and the low-pressure side model wire, so that the wave impedance of the whole test loop is continuous, and the problem of measurement error/distortion caused by the phenomenon of travelling wave refraction and reflection can be effectively avoided.

Description

Transient fault and defect discharge fault simulation test platform and data analysis method
Technical Field
The invention relates to the field of power distribution networks, in particular to a transient fault and defect discharge fault simulation test platform and a data analysis method.
Background
The distribution network is mostly located in an urban economy circle, belongs to an important component link of a direct user in a power grid, and safe and reliable operation of the distribution network is a key focus of the power grid in operation and maintenance. Distribution network line faults are generally divided into permanent metal grounding faults, transient faults and defective discharge faults, wherein the distribution network metal grounding faults can be effectively monitored through a distribution network automatic feeder terminal or a distribution network fault indicator, and the distribution network transient faults and the defective discharge faults are monitored by no effective means.
At the present stage, aiming at the monitoring of the hidden danger of the line, a line hidden danger monitoring system based on traveling wave monitoring is newly created in the power transmission network, the accurate positioning function of the hidden danger point is realized by monitoring the discharging traveling wave signal, however, because of the large difference between the distribution network structure and the transmission network structure, the defect monitoring system suitable for the transmission network cannot be applied to the distribution network line, and therefore, the method needs to pass the simulation test, the transient traveling wave waveform characteristics generated when the line has defects in the distribution network structure are researched, and a distribution network defect monitoring system is established on the basis of the transient traveling wave waveform characteristics, currently, experimental research aiming at distribution network faults is usually carried out jointly on the basis of true lines, is time-consuming and labor-consuming, and needs to be carried out in cooperation with multi-party joint cooperation, meanwhile, a simulation test aiming at instantaneous fault and defect discharge of the distribution network has no related projects and technical research results temporarily.
Disclosure of Invention
The invention aims to provide a transient fault and defect discharge fault simulation test platform and a data analysis method, so as to overcome the defects in the prior art.
The technical scheme for solving the technical problems is as follows: a transient fault and defect discharge fault simulation test platform comprises:
the high-voltage side analog lead is erected on the landing gear through a first insulating part;
a low-voltage side analog conductor suspended above the high-voltage side analog conductor by a second insulating member;
the power distribution network power supply is connected with the high-voltage side analog lead;
the two conducting wires with uniform texture are respectively connected to two ends of the simulated conducting wire on the low-pressure side, and each conducting wire with uniform texture is grounded;
and the test sample is arranged between the high-pressure side analog lead and the low-pressure side analog lead.
On the basis of the technical scheme, the invention can be improved as follows.
Furthermore, the power distribution network power supply is simulated by matching a neutral point grounding module with a three-phase alternating current test variable power supply.
Furthermore, a remote control system is arranged on the neutral point grounding module, and a remote control type high-voltage switch is arranged on the neutral point grounding module.
Furthermore, a current sensor is sleeved on the lead with uniform texture, and the current sensor is externally connected with an oscilloscope.
Further, the high-pressure side-mode pseudo-wire and the low-pressure side-mode pseudo-wire adopt steel-cored aluminum stranded wires.
Further, the test samples included: the high-voltage electrode is connected with the high-voltage side analog lead through a lead, the low-voltage electrode is connected with the low-voltage side analog lead through a lead, and the suspension conductor is arranged between the high-voltage electrode and the low-voltage electrode;
the low-voltage electrode is a plate, the suspension conductor and the high-voltage electrode are both rods, the suspension conductor and the high-voltage electrode are coaxially distributed, and the suspension conductor and the high-voltage electrode are both vertically distributed with the low-voltage electrode;
or the low-voltage electrode, the suspension conductor and the high-voltage electrode are all rods, and the low-voltage electrode, the suspension conductor and the high-voltage electrode are coaxially distributed;
or, the low-voltage electrode and the suspension conductor are both rods, the high-voltage electrode is a ball, and the low-voltage electrode, the suspension conductor and the high-voltage electrode are coaxially distributed.
Furthermore, the test sample is a sample tree, the bottom end of the sample tree is connected with the low-voltage side analog lead through a grounding lead, and the top end of the sample tree and the high-voltage side analog lead are arranged at a preset interval.
A transient fault and defect discharge fault simulation test data analysis method adopts the transient fault and defect discharge fault simulation test platform and comprises the following steps:
s00, simulating the transient fault and the defect discharge fault through a transient fault and defect discharge fault simulation test platform to obtain a traveling wave waveform amplitude sequence;
s01, equally dividing the traveling wave waveform amplitude sequence into N sections, equally dividing the N sections into two units according to the energy, and respectively calculating the total energy of the two units, and recording the total energy as sigmaA、ΣBWherein, ΣA>ΣB
S02, judgment ∑ABWhether the ratio of (A) is greater than or equal to 5,if yes, entering the next step, and if not, terminating;
s03, carrying out FFT (fast Fourier transform) on the traveling wave waveform amplitude sequence to obtain a spectrogram of a waveform;
s04, judging whether the frequency with the maximum amplitude in the spectrogram is in the frequency range of [50kHz,1MHz ], if so, entering the next step, and if not, terminating;
s05, calculating the correlation quantity of the traveling wave waveform amplitude sequence obtained by two tests of the same type;
s06, sequentially advancing the elements of the second traveling wave waveform amplitude sequence to form a new sequence;
s07, calculating the correlation quantity of the new sequence according to the S05;
s08, repeating S06 and S07 until the progressive waveform is restored to obtain a plurality of groups of correlation quantities;
s09, taking the largest group of the calculated multiple groups of correlation quantities as the final correlation quantities of the two traveling wave waveform amplitude sequences;
and S10, eliminating the traveling wave waveform amplitude sequence with the correlation quantity less than or equal to 8, and making the residual waveform be a reliable waveform.
Further, the S01 specifically includes:
1) suppose that the amplitude sequence of the traveling wave waveform collected in a certain test is (n)0,n1,n2,n3,……,nz) Z sampling elements are divided into N sections equally, namely the length of each section is N/z;
2) the amplitude sequence of one of the N sections is (N)0,n1,n2,n3,……,nN/z) The time sequence corresponding to the sampling point is (t)0,t1,t2,t3,……,tN/z);
3) Time series equal difference normalization, i.e. with time t of the first sample point0At zero time, the time of the subsequent sampling point is sequentially processed to be (0, t)1-t0,t2-t0,t3-t0,……,tN/z-t0);
4) The energy of the travelling wave waveform amplitude sequence is as follows:
Σ=|n0|2×0+|n1|2×(t1-t0)+|n2|2×(t2-t1)+……+|nN/z|2×(tN/z-tN/z-1);
5) and calculating the energies of N groups equally divided by the amplitude sequence of the traveling wave waveform acquired by the test according to the rule, and sequentially recording the energies as: sigma1,Σ2,Σ3,……,ΣN
6) Sorting the obtained N groups of energy according to size;
7) taking the N/2 component with the largest energy sequence as a unit, recording the unit A, and taking the rest N/2 component as a unit, recording the unit B;
8) the total energy of A, B cells is calculated separately and recorded as ∑A、ΣBWherein ∑A>ΣB
Further, the S05 specifically includes:
supposing that the amplitude sequence of the traveling wave waveform collected in a certain test is Xi (n0,n1,n2,n3,……,nz) And the traveling wave waveform amplitude sequence of the second test of the same type is Yi (m0,m1,m2,m3,……,mz);
The two correlation quantities r are calculated as:
Figure 929663DEST_PATH_IMAGE001
wherein:
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Figure 549923DEST_PATH_IMAGE003
Figure 281119DEST_PATH_IMAGE004
Figure 71221DEST_PATH_IMAGE005
the invention has the beneficial effects that:
1) because the high-frequency traveling wave signal has the characteristic of refraction and reflection at the point of discontinuous wave impedance, the waveforms generated by transient fault and defect discharge fault of the distribution network line are high-frequency signals, and joints such as a simulation lead and the like belong to the point of discontinuous wave impedance in the test process, if the factor is not considered, the signal measured by the test platform can cause the distortion and even distortion of the measured waveform due to the superposition of the initial waveform and the reflected waveform generated by the initial waveform at the point of discontinuous wave impedance, the test platform provided by the invention adopts the suspension of the simulation lead of the low-voltage side, the simulation lead of the low-voltage side is grounded through two leads with uniform texture, and the means of externally connecting the two leads with uniform texture forms uniform impedance transition between the test sample and the simulation lead of the low-voltage side, because the test process measures the traveling wave signal and the traveling wave signal is the high-frequency signal, under the same signal frequency, the resistance and the inductance of the wire with uniform texture are not changed, the capacitance is a ground capacitance, the height from the low-voltage side to the ground is simulated, and the height is uniformly reduced, so the connected wire with uniform texture can be regarded as a continuous transition resistance, the wave impedance of the whole test loop is continuous, and the problem of measurement error/distortion caused by the phenomenon of refraction and reflection of the traveling wave can be effectively avoided;
2) the work is not required to be carried out based on a true line, so that the method is more generalizable;
3) invalid test data are eliminated by adopting a data validity judging method, so that the reliability of a test result can be improved;
4) the method can effectively make up for the technical blank in the field of monitoring instantaneous faults and defective discharge faults of the power distribution network at the present stage.
Drawings
FIG. 1 is a block diagram of a transient fault and defect discharge fault simulation test platform according to the present invention;
FIG. 2 is a diagram of the connection of the power supply of the distribution network and the high-voltage side analog conductor of the present invention;
FIG. 3 is a first type of condition diagram of a bird fault according to the present invention;
FIG. 4 is a second type of condition diagram of a bird fault according to the present invention;
FIG. 5 is a third type of status diagram of a bird fault according to the present invention;
FIG. 6 is a diagram of a condition of an ultrahigh fault of a tree according to the present invention;
FIG. 7 is a flow chart of a method for analyzing data of transient fault and defect discharge fault simulation test according to the present invention.
In the drawings, the components represented by the respective reference numerals are listed below:
1. 2, a high-voltage side analog lead, 3, an undercarriage, 4, a low-voltage side analog lead, 5, a second insulator, 6, a power supply of a power distribution network, 610, a neutral point grounding module, 620, a three-phase alternating current test variable power supply, 7, a lead with uniform texture, and 8, and a test sample.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.
Example 1
As shown in fig. 1 and 2, a transient fault and defect discharge fault simulation test platform includes:
the high-voltage side simulation test device comprises a high-voltage side simulation lead 1, a first insulating part 2, an undercarriage 3, a low-voltage side simulation lead 4, a second insulating part 5, a power distribution network power supply 6, two leads 7 with uniform texture and a test sample 8;
the high-voltage side-mode analog lead 1 is erected on the undercarriage 3 through a first insulating part 2, the first insulating part 2 is used for supporting the high-voltage side-mode analog lead 1, and the first insulating part 2 can select a plurality of insulators;
the low-voltage side analog lead 4 is hung above the high-voltage side analog lead 1 through a second insulating piece 5, and the second insulating piece 5 can be an insulating rope;
the clearance distance between the high-voltage side simulation lead 1 and the low-voltage side simulation lead 4 can be adjusted through the undercarriage 3;
the power distribution network power supply 6 is connected with the high-voltage side analog lead 1;
the two wires 7 with uniform texture are respectively connected to two ends of the low-voltage side simulation wire 4, one end of each wire 7 with uniform texture, which is far away from the low-voltage side simulation wire 4, is grounded, the wires 7 with uniform texture are used for eliminating the phenomenon of travelling wave refraction and reflection, the wires with uniform texture refer to the wires with the same material, structure and size, generally, the circuits with the same specification can be regarded as the wires with uniform texture, for example, the steel-cored aluminum stranded wire with the specification of 'JL/G1A 50/8' can be regarded as the wire with uniform texture;
the test sample 8 is arranged between the high-pressure side analog lead 1 and the low-pressure side analog lead 4;
because the high-frequency traveling wave signal has the characteristic of refraction and reflection at the point of discontinuous wave impedance, the waveforms generated by transient fault and defect discharge fault of the distribution network line are high-frequency signals, and joints such as a simulation lead and the like belong to the point of discontinuous wave impedance in the test process, if the factor is not considered, the signal measured by the test platform can cause the distortion and even distortion of the measured waveform due to the superposition of the initial waveform and the reflected waveform generated by the initial waveform at the point of discontinuous wave impedance.
Example 2
As shown in fig. 2, this embodiment is a further improvement on embodiment 1, and specifically includes the following steps:
the distribution network power supply 6 is simulated by the neutral point grounding module 610 matching with the three-phase alternating current test variable power supply 620, the three-phase alternating current test variable power supply 620 generates alternating voltage with different phases, and meanwhile, the neutral point grounding module 610 is carried to simulate the distribution network power supply 6 in different grounding modes.
Example 3
This embodiment is a further improvement on the basis of embodiment 2, and specifically includes the following steps:
the neutral point grounding module 610 is provided with a remote control system and a remote control type high-voltage switch, and a grounding scheme of a neutral point of a three-phase alternating-current test variable power supply in the test process can be remotely selected and carried out through remote control.
Example 4
This embodiment is a further improvement on the embodiment 1, 2 or 3, and specifically includes the following steps:
the current sensor is sleeved on the lead 7 with uniform texture, the current sensor is externally connected with an oscilloscope, and a standard current sensor is sleeved on the lead 7 with uniform texture to measure test data by means of matching with the oscilloscope.
Example 5
As shown in fig. 1, this embodiment is a further improvement on the basis of embodiment 1 or 2 or 3 or 4, and specifically includes the following steps:
the high-voltage side analog lead 1 and the low-voltage side analog lead 4 adopt steel-cored aluminum stranded wires.
The common types of instantaneous faults and defective discharge faults of the distribution network include tree ultrahigh (high resistance) faults, hardware clamp defective discharge faults, bird damage faults and insulator faults, the test platform is simulated based on the typical faults, and the insulator faults and the hardware clamp faults have mature test arrangement models in the power transmission network, so that the method is not repeated; see examples 6 and 7 for details;
example 6
As shown in fig. 3, 4 and 5, the present embodiment is a further improvement on any one of embodiments 1 to 5, and specifically includes the following steps:
the test sample 8 included: the high-voltage electrode 810 is connected with a high-voltage side analog lead 1 through a lead, the low-voltage electrode 830 is connected with a low-voltage side analog lead 4 through a lead and is generally used for connecting the high-voltage electrode 810 with the high-voltage side analog lead 1, and the lead for connecting the low-voltage electrode 830 with the low-voltage side analog lead 4 is made of a material with the same specification as the analog lead, such as an aluminum steel-cored stranded wire; the floating conductor 820 is disposed between the high voltage electrode 810 and the low voltage electrode 830;
since there are different situations in bird damage states, there are different situations in the structure and arrangement of the high voltage electrode 810, the floating conductor 820 and the low voltage electrode 830, and 3 situations are described in this embodiment, respectively as follows:
as shown in fig. 3, bird damage state 1:
the low-voltage electrode 830 is a plate, the suspension conductor 820 is a rod, the high-voltage electrode 810 is a rod, the suspension conductor 820 and the high-voltage electrode 810 are coaxially distributed, and the suspension conductor 820 and the high-voltage electrode 810 are both vertically distributed with the low-voltage electrode 830, which simulates the following conditions: bird droppings-bird droppings that just dropped;
as shown in fig. 4, bird damage state 2:
the low-voltage electrode 830, the suspension conductor 820 and the high-voltage electrode 810 are all rods, and the low-voltage electrode 830, the suspension conductor 820 and the high-voltage electrode 810 are coaxially distributed, so that the condition is simulated: the situation of bird droppings-the lower end of dropping bird droppings is segmented;
as shown in fig. 5, bird damage state 3:
the low-voltage electrode 830 and the suspension conductor 820 are both rods, the high-voltage electrode 810 is a ball, and the low-voltage electrode 830, the suspension conductor 820 and the high-voltage electrode 810 are coaxially distributed, so that the condition is simulated: the dropping bird droppings are closer to the grading ring;
in the test process, in a bird damage test sample, the geometric shape of the electrodes and the position between the suspension conductors are two main reasons for influencing the breakdown voltage of the combined gap, the electrodes are made of copper materials, the distance between the electrodes is designed to be a fixed value, the distance is recommended to be initially set to be 50cm, the gap is shortened according to a certain step length, the recommended value of the step length is 2cm, and the gap shortening is realized by the undercarriage 3.
Example 7
As shown in fig. 6, the present embodiment is a further improvement on any embodiment of embodiments 1 to 5, and specifically includes the following steps:
the tree barrier is one of fault types with the highest fault rate in the power distribution network, and the test platform designed by the invention can obtain the defect discharge waveforms of the tree barrier at different growth stages;
the test sample 8 is a sample tree, the bottom end of the sample tree is connected with the low-voltage side analog lead 4 through a grounding lead, the top end of the sample tree and the high-voltage side analog lead 1 are arranged at a preset interval, and the interval can be adjusted by the undercarriage 3 to simulate trees in different growth stages.
Example 8
According to data obtained by different types of defect/fault tests of the power distribution network, because interference possibly exists in the test process, validity judgment needs to be carried out on the data obtained by the tests so as to guarantee the reliability of original data, and the judgment flow is as follows:
as shown in fig. 7, a method for analyzing transient fault and defect discharge fault simulation test data, which uses the transient fault and defect discharge fault simulation test platform, includes the following steps:
s00, simulating the transient fault and the defect discharge fault through a transient fault and defect discharge fault simulation test platform to obtain a traveling wave waveform amplitude sequence;
s01, equally dividing the traveling wave waveform amplitude sequence into N sections, equally dividing the N sections into two units according to the energy, and respectively calculating the total energy of the two units, and recording the total energy as sigmaA、ΣBWherein ∑A>ΣB
S02, judgment ∑ABWhether the ratio is more than or equal to 5 is judged, if yes, the next step is carried out, and if not, the step is terminated;
s03, carrying out FFT (fast Fourier transform) on the traveling wave waveform amplitude sequence (the method is a mature calculation method in the prior art and does not carry out embellishment) to obtain a frequency spectrogram of the waveform;
s04, judging whether the frequency with the maximum amplitude in the spectrogram is in the frequency range of [50kHz,1MHz ], if so, entering the next step, and if not, terminating;
s05, calculating the correlation quantity of the traveling wave waveform amplitude sequence obtained by two tests of the same type;
s06, sequentially advancing the elements of the second-time traveling wave waveform amplitude sequence to form a new sequence,
for example, the second-order traveling waveform amplitude sequence is Yi (m0,m1,m2,m3,……,mz) The new sequence formed after the step further is (m)z ,m0,m1,m2,m3,……,mz-1);
S07, calculating the correlation quantity of the new sequence obtained in the S06 according to the S05;
s08, repeating S06 and S07 until the progressive waveform is restored to obtain a plurality of groups of correlation quantities;
s09, taking the largest group of the calculated multiple groups of correlation quantities as the final correlation quantities of the two traveling wave waveform amplitude sequences;
and S10, eliminating the traveling wave waveform amplitude sequence with the correlation quantity less than or equal to 8, and making the residual waveform be a reliable waveform.
Example 9
This embodiment is a further improvement on the basis of embodiment 8, and specifically includes the following steps:
the S01 specifically includes:
1) suppose that the amplitude sequence of the traveling wave waveform collected in a certain test is (n)0,n1,n2,n3,……,nz) Z sampling elements are divided into N sections equally, namely each section is N/z in length;
2) the amplitude sequence of one of the N sections is (N)0,n1,n2,n3,……,nN/z) The time sequence corresponding to the sampling point is (t)0,t1,t2,t3,……,tN/z);
3) Time series equal difference normalization, i.e. with time t of the first sample point0At zero time, the time of the subsequent sampling point is sequentially processed to be (0, t)1-t0,t2-t0,t3-t0,……,tN/z-t0);
4) The energy of the traveling wave waveform amplitude sequence is as follows:
Σ=|n0|2×0+|n1|2×(t1-t0)+|n2|2×(t2-t1)+……+|nN/z|2×(tN/z-tN/z-1);
5) and calculating the energies of N groups equally divided by the amplitude sequence of the traveling wave waveform acquired by the test according to the rule, and sequentially recording the energies as: sigma1,Σ2,Σ3,……,ΣN
6) Sorting the obtained N groups of energy according to size;
7) taking the N/2 component with the largest energy sequence as a unit, recording the unit A, and taking the rest N/2 component as a unit, recording the unit B;
8) the total energy of A, B cells is calculated separately and recorded as ∑A、ΣBWherein, ΣA>ΣB
Example 10
This embodiment is a further improvement on the basis of embodiment 8 or 9, and specifically includes the following steps:
the S05 specifically includes:
suppose that the amplitude sequence of the traveling wave waveform collected in a certain test is Xi (n0,n1,n2,n3,……,nz) And the traveling wave waveform amplitude sequence of the second test of the same type is Yi (m0,m1,m2,m3,……,mz);
The two correlation quantities r are calculated as:
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wherein:
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Figure 570466DEST_PATH_IMAGE005
although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.

Claims (8)

1. A transient fault and defect discharge fault simulation test data analysis method is characterized by comprising the following steps:
s00, simulating the transient fault and the defect discharge fault through a transient fault and defect discharge fault simulation test platform to obtain a traveling wave waveform amplitude sequence;
s01, equally dividing the traveling wave waveform amplitude sequence into N sections, equally dividing the N sections into two units according to the energy, and respectively calculating the total energy of the two units, and recording the total energy as sigmaA、ΣBWherein, ΣA>ΣB
S02, judgment ∑ABWhether the ratio is more than or equal to 5 is judged, if yes, the next step is carried out, and if not, the step is terminated;
s03, carrying out FFT (fast Fourier transform) on the traveling wave waveform amplitude sequence to obtain a spectrogram of a waveform;
s04, judging whether the frequency with the maximum amplitude in the spectrogram is in the frequency range of [50kHz,1MHz ], if so, entering the next step, and if not, terminating;
s05, calculating the correlation quantity of the traveling wave waveform amplitude sequence obtained by two tests of the same type;
s06, sequentially advancing the elements of the second traveling wave waveform amplitude sequence to form a new sequence;
s07, calculating the correlation quantity of the new sequence according to S05;
s08, repeating S06 and S07 until the progressive waveform is restored to obtain a plurality of groups of correlation quantities;
s09, taking the largest one of the calculated multiple groups of correlation quantities as the final correlation quantity of the two travelling wave waveform amplitude sequences;
s10, eliminating the traveling wave waveform amplitude sequence with the correlation quantity less than or equal to 8, wherein the residual waveform is a reliable waveform;
the S01 specifically includes:
1) suppose that the amplitude sequence of the traveling wave waveform collected in a certain test is (n)0,n1,n2,n3,……,nz) Z sampling elements are divided into N sections equally, namely each section is N/z in length;
2) the amplitude sequence of one of the N sections is (N)0,n1,n2,n3,……,nN/z) The time sequence corresponding to the sampling point is (t)0,t1,t2,t3,……,tN/z);
3) Time series equal difference normalization, i.e. with time t of the first sample point0At zero time, the time of the subsequent sampling point is sequentially processed to be (0, t)1-t0,t2-t0,t3-t0,……,tN/z-t0);
4) The energy of the traveling wave waveform amplitude sequence is as follows:
Σ=|n0|2×0+|n1|2×(t1-t0)+|n2|2×(t2-t1)+……+|nN/z|2×(tN/z-tN/z-1);
5) and calculating the energies of N groups equally divided by the amplitude sequence of the traveling wave waveform acquired by the test according to the rule, and sequentially recording the energies as: sigma-shaped1,Σ2,Σ3,……,ΣN
6) Sorting the obtained N groups of energy according to size;
7) taking the N/2 component with the largest energy sequence as a unit, recording the unit A, and taking the rest N/2 component as a unit, recording the unit B;
8) the total energy of A, B cells is calculated separately and recorded as ∑A、ΣBWherein, ΣA>ΣB
The transient fault and defect discharge fault simulation test platform comprises:
the high-voltage side analog lead (1) is erected on the undercarriage (3) through a first insulating piece (2);
a low-voltage-side analog conductor (4) suspended above the high-voltage-side analog conductor (1) by a second insulator (5);
the power distribution network power supply (6) is connected with the high-voltage side analog lead (1);
the two lead wires (7) with uniform texture are respectively connected to two ends of the low-voltage side simulation lead wire (4), and each lead wire (7) with uniform texture is grounded;
a test sample (8) disposed between the high-pressure side dummy lead (1) and the low-pressure side dummy lead (4).
2. The method of claim 1, wherein the method comprises the following steps:
the distribution network power supply (6) is simulated by matching a neutral point grounding module (610) with a three-phase alternating current test variable power supply (620).
3. The method of claim 2, wherein the method comprises the steps of:
and a remote control system is arranged on the neutral point grounding module (610) and is provided with a remote control type high-voltage switch.
4. The method of claim 1, wherein the method comprises the following steps:
and a current sensor is sleeved on the lead (7) with uniform texture, and the current sensor is externally connected with an oscilloscope.
5. The method of claim 1, wherein the method comprises the steps of:
the high-voltage side simulation lead (1) and the low-voltage side simulation lead (4) adopt steel-cored aluminum stranded wires.
6. The method for analyzing simulation test data of transient fault and defect discharge fault as claimed in any one of claims 1 to 5, wherein:
the test sample (8) comprises: the high-voltage electrode (810) is connected with a high-voltage side analog lead (1) through a lead, the low-voltage electrode (830) is connected with a low-voltage side analog lead (4) through a lead, and the suspension conductor (820) is arranged between the high-voltage electrode (810) and the low-voltage electrode (830);
the low-voltage electrode (830) is a plate, the suspension conductor (820) and the high-voltage electrode (810) are both rods, the suspension conductor (820) and the high-voltage electrode (810) are coaxially distributed, and the suspension conductor (820) and the high-voltage electrode (810) are both vertically distributed with the low-voltage electrode (830);
or the low-voltage electrode (830), the suspension conductor (820) and the high-voltage electrode (810) are all rods, and the low-voltage electrode (830), the suspension conductor (820) and the high-voltage electrode (810) are coaxially distributed;
or, the low-voltage electrode (830) and the suspension conductor (820) are both rods, the high-voltage electrode (810) is a ball, and the low-voltage electrode (830), the suspension conductor (820) and the high-voltage electrode (810) are coaxially distributed.
7. The method for analyzing simulation test data of transient fault and defect discharge fault as claimed in any one of claims 1 to 5, wherein:
the test sample (8) is a sample tree, the bottom end of the sample tree is connected with the low-pressure side analog lead (4) through a grounding lead, and the top end of the sample tree and the high-pressure side analog lead (1) are arranged at preset intervals.
8. The method of claim 1, wherein the method comprises the following steps:
the S05 specifically includes:
supposing that the amplitude sequence of the traveling wave waveform collected in a certain test is Xi (n0,n1,n2,n3,……,nz) And the traveling wave waveform amplitude sequence of the second test of the same type is Yi (m0,m1,m2,m3,……,mz);
The two correlation quantities r are calculated as:
Figure 646156DEST_PATH_IMAGE001
wherein:
Figure 744694DEST_PATH_IMAGE002
Figure 950547DEST_PATH_IMAGE003
Figure 67408DEST_PATH_IMAGE004
Figure 966093DEST_PATH_IMAGE005
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