CN1143277C - 近场光学存储介质及其光学数据存储系统 - Google Patents

近场光学存储介质及其光学数据存储系统 Download PDF

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CN1143277C
CN1143277C CNB991051017A CN99105101A CN1143277C CN 1143277 C CN1143277 C CN 1143277C CN B991051017 A CNB991051017 A CN B991051017A CN 99105101 A CN99105101 A CN 99105101A CN 1143277 C CN1143277 C CN 1143277C
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李哲雨
赵虔皓
申东镐
徐仲彦
郑承台
朴昞皓
黄仁吾
卢明道
金伦基
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Samsung Electronics Co Ltd
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Abstract

一种利用光学拾取器对光学存储介质写或读信息的光学数据存储系统，该光学拾取器包括产生近场效应的固态浸没光学系统或透镜。光学存储介质的记录层设置在面向固态浸没光学系统或透镜的透光层表面的相对面上。透光层厚度大于一个所用光波长。在固态浸没光学系统或透镜和透光层的表面之间的间隔小于一个所用光波长。因此，空气间隙内和它与记录层之间的存储介质内反射的光束不会对记录层反射的光束起噪声作用。

Description

近场光学存储介质及其光学数据存储系统
技术领域
本发明涉及一种近场光学存储介质和具有光学聚焦系统的光学数据存储系统，更具体地涉及这样一种光学存储介质和一种近场光学数据存储系统，所述光学存储介质与具有近场光学聚焦系统诸如固态浸没光学系统或固态透镜的光学拾取器一起使用，所述近场光学数据存储系统用于从所述光学存储介质读取信息和/或将信息写入所述光学存储介质。
背景技术
在光学数据存储系统中，具有固态浸没光学系统或固态浸没透镜的光学拾取器，以在固态浸没光学系统或固态浸没透镜与所述光学数据存储系统之间形成近场的方式，从所述光学数据存储系统读取信息和/或将信息写入所述光学数据存储系统。
图1和图2示出了现有的作为光学数据存储系统的光盘。在图1中，示出了与具有折反射型固态浸没光学系统的光学数据存储系统一起使用的现有光盘，图2示出了与具有折射型固态浸没透镜的光学数据存储系统一起使用的现有光盘。
在图1中，光发送和接收部10发出的光束1被反射镜12反射，并入射到折反射型固态浸没光学系统14。滑块16用于支撑固态浸没光学系统14，这要利用在光盘等的光学数据存储介质18和滑块16之间的相对运动而产生空气支承力这一空气动力学现象，使固态浸没光学系统14飘浮起来。结果是，在固态浸没光学系统14和光学数据存储介质18的保护层183之间形成了空气间隙。该空气间隙的厚度，即在固态浸没光学系统14和光学数据存储介质18的相对表面之间的距离，例如被保持在一个所用光波长之内。最好是，该厚度远小于一个所用光波长。折反射型固态浸没光学系统14折射和反射从反射镜12入射的光束1，并形成在其与光学数据存储介质18相对的表面上聚焦的光斑。该光斑在固态浸没光学系统14和光学数据存储介质18的表面之间的空气间隙内形成近场效应。
图2所示的光学数据存储介质包括有聚焦物镜24和折射固态浸没透镜26，而不是图1所示的折反射型固态浸没光学系统14。光发送和接收部20发出其直径针对物镜24优化的光束1。反射镜22向物镜24反射从光发送和接收部20发出的光束1。物镜24在固态浸没透镜26上聚焦从反射镜22入射的光束1。在固态浸没透镜26上形成的光斑在光学数据存储介质18中的保护层183和与光学存储介质18相对的表面之间形成近场效应。物镜24和固态浸没透镜26由滑块28支撑。如图1所示的滑块16，滑块28利用空气动力学原理使固态浸没透镜26飘浮起来，并在固态浸没透镜26和光学存储介质18之间形成厚度在一个所用光波长之内的空气间隙。
在图1或图2所示的光学数据存储系统中，在近场效应产生区中形成光斑，所述近场效应产生区是在与光学存储介质18相对的固态浸没光学系统14或固态浸没透镜26表面上的某个预定位置。一般地，图1或图2所示的系统采用对应于至少一个用于对光学存储介质18写入或读取信息的数值孔径(NA)的有限光斑。在使用的光波长λ为650nm的情况下，则形成近场产生区光斑的光束要通过厚度近似为110nm的空气间隙和厚度为70-90nm的保护层183，并传送到光学存储介质18的记录层。记录层设置在光学记录介质的保护层183和基底181之间。记录层反射的光束通过保护层183和空气间隙，传送到固态浸没光学系统或固态浸没透镜26。
一般地，按照折射和全反射规则，数值孔径大的光会被固态浸没光学系统14或固态浸没透镜26的发射表面全反射，即近场产生区为靠近存储介质18的光学发射表面。因此，在空气间隙的厚度大于所用光波长λ的情况下，光学存储介质18位于近场以外的部分。于是，数值孔径大的光不会在存储介质18上形成光斑。换句话说，在通过空气间隙时，能够在光学存储介质18上形成光斑的光束的数值孔径要小于“1”。结果是，通过厚度大于所用光波长的空气间隙的光束聚焦在存储介质18上而形成的光束光斑的尺寸，要大于在固态浸没光学系统14或固态浸没透镜26的近场产生区上形成的光斑的尺寸。然而，在空气间隙的厚度远小于一个所用光波长的情况下，最好为λ/4，则入射到光学存储介质18的光束光斑尺寸接近在近场产生区中形成的光斑的尺寸。因此，在这种条件下，图1或图2所示的光学数据存储系统，能够利用固态浸没光学系统或固态浸没透镜26，高密度地对光学存储介质18的记录层写入和读出信息。
图3示出了在固态浸没光学系统14或固态浸没透镜26的表面和光学存储介质18的保护层183之间的近场产生区。从与光学存储介质相对的固态浸没光学系统14或固态浸没透镜26的表面到保护层183、更准确地讲到记录层的厚度SRD，小于一个所用光波长，而存储介质18的记录层处在具有近场效应的该距离之内。
在第5470627号美国专利中公开了一个现有光盘的例子。在上述现有光盘是磁光盘等的情况下，该盘片将包括顺序设置在常规基底上的一个反射层、一个第一介质层、一个记录层、以及一个第二介质层。反射层由厚度为500-1000埃的铝等金属制成。第一介质层由厚度为150-400埃的氮化铝或氮化硅制成。记录层由厚度为150-500埃的TbFeCo等稀土渡越金属合金制成。最后，保护层由厚度为400-800埃的氮化硅Si3N4制成。
然而，在使用上述现有光盘时，该光学数据存储系统存在下面两种问题。在包含固态浸没光学系统14的数据存储系统或包含固态浸没透镜26的数据存储系统中均会时常产生这些问题。因此，为了方便起见，将结合现有光盘和固态浸没透镜26来说明这些问题。
首先，将参照图4和图5来说明由具有上述结构的现有光盘上的记录层所反射的光束中包含有干涉噪声的问题。图4示出了折射率为1.8的固态浸没透镜26。在图4中，“空气间隙反射光(NB)”表示从固态浸没透镜26的近场产生区以及固态浸没透镜26和光学存储介质18之间的空气间隙全反射的光束，“记录层反射光(RB)”表示从光学存储介质18中的记录层反射的光束。在固态浸没透镜26的折射率为1.8的情况下，固态浸没透镜26的56.3度的全反射角对应于0.83的数值孔径。图5示出了固态浸没光学系统14或固态浸没透镜26相对于三种空气间隙厚度的角度与反射率关系的特性曲线。在图5中，曲线(a)是厚度为50nm的空气间隙的角度与反射率关系的特性曲线，曲线(b)是厚度为100nm的空气间隙的角度与反射率关系的特性曲线，曲线(c)是厚度为150nm的空气间隙的角度与反射率关系的特性曲线。在曲线(a)至(c)中，“++”表示的是P极化光束的角度与反射率关系的特性曲线，“-”(实线)表示的是S极化光束的角度与反射率关系的特性曲线。水平轴的角度表示的是从固态浸没透镜26通过空气间隙传送的光束的入射角。例如，在存在于光学存储介质18和固态浸没透镜26之间的空气间隙的厚度大于所用光波长的情况下，入射角大于56.3度全反射角的光束部分，特别是数值孔径大的光束部分，例如从固态浸没透镜26透射到存储介质18的光束中数值孔径为1.2或更大的光束将不能通过空气间隙，而是被近场产生区或空气间隙内部全反射。从图5所示的数值孔径为1.5的反射率关系中可以看出，空气间隙反射光NB具有相对较大的反射率。而且，由于空气间隙和记录层彼此非常靠近，所以在空气间隙反射光(NB)和记录层反射光(RB)之间会产生干涉。最后，空气间隙反射光(NB)对于记录层反射光(RB)来说起噪声的作用。
现在，参照图6来说明高密度下的光学存储介质18带来的问题。在光学存储介质18为高密度光学存储介质的情况下，在存储介质的基底181上形成有用于记录信息的宽度为100-150nm的沟槽或凹坑。通过镀膜处理，实际上记录有信息的记录层或反射层依次覆盖在沟槽或凹坑上。此外，厚度为150-200nm的保护层183在记录层上形成。在图6中，在基底上所形成的沟槽或凹坑具有不均匀的结构185，如图中所示，它的形状为楔形(“V”形)或井形(“U”形)。由于保护层183覆盖的记录层的深度大于沟槽或凹坑的宽度，所以，从固态浸没光学系统14或固态浸没透镜26入射到光学存储介质18上的光束，没有到达沟槽或凹坑，更准确地说没有到记录层，而是在保护层183的内表面附近上被反射。结果是，光学数据存储系统不能够对高密度光学存储介质18进行写入和/或读出信息的操作。
发明内容
为了解决上述问题，本发明的一个目的是提供一种光学存储介质，为了与具有固态浸没光学系统或固态浸没透镜的光学拾取器一起使用来写入或读出信息，所述光学存储介质包括一个在固态浸没光学系统或固态浸没透镜和光学存储介质上形成的记录层之间的具有所需厚度的透光层，该透光层使得上述的空气间隙反射光对记录层反射光不起噪声作用。
本发明的另一个目的是提供一种光学数据存储系统，它包括用于在光学存储介质上记录信息或从其中读出信息的光学拾取器。
为了实现本发明的上述目的，提供了一种用于存储信息的光学存储介质，它与具有光学聚焦系统的光学拾取器一起使用，所述光学存储介质包括记录层和保护层，其中在相对的光学聚集系统光学表面和记录层之间的距离小于所用光波长，并且保护层的厚度大于所用光波长。
为了实现本发明的上述目的，还提供了一种用于存储信息的光学存储介质，它与具有用于产生近场效应的光学聚焦系统的光学拾取器一起使用，所述光学存储介质包括：透光层，其厚度大于一个所用光波长，该厚度是在数个微米至数百微米之间；及记录层，它设置在面向所述光学聚焦系统的所述透光层表面的相对面上，其中，所述透光层是具有在面向所述光学聚焦系统的所述表面上形成的不均匀结构的基底，以便提供用于存储信息的预定格式化的结构。
为了实现本发明的其它目的，还提供了一种光学数据存储系统，用于利用光学拾取器对光学存储介质进行写或读信息操作，所述光学数据存储系统包括：所述光学拾取器，包括产生近场效应的聚焦透镜，其中，所述光学存储介质包括：一透光层，其厚度大于一个所用光波长，该厚度在数个微米至数百微米之间；和一记录层，它设置在面向所述聚焦透镜的所述透光层表面的相对面上，其中，在所述聚焦透镜和所述透光层两侧表面之间的间隔小于一个所用光波长，并且，所述透光层是具有在面向所述聚焦透镜的所述表面上形成的不均匀结构的基底，以便提供用于存储信息的预定格式化的结构。
按照本发明，还提供了一种光学数据存储系统，用于利用光学拾取器对光学存储介质进行写或读信息操作，所述光学数据存储系统包括：所述光学拾取器，包括第一和第二光学拾取器，两者均包含产生近场效应的光学聚焦系统；以及，所述光学存储介质，包括单个光学存储介质，它包含具有面向所述第一光学拾取器的一个表面的第一透光层、具有面向所述第二光学拾取器的一个表面的第二透光层、以及第一和第二记录层，所述记录层分别设置在所述第一透光层的另一表面和所述第二透光层的另一表面上，其中，所述第一和第二透光层的厚度大于一个所用光波长，并且在所述光学聚焦系统和所述透光层的相对表面之间的距离小于一个所用光波长。
附图说明
通过参照附图对本发明的结构和操作的详细说明，将会更清楚地理解本发明的目的和其它优点，附图中：
图1示出了包括现有光盘的现有光学数据存储系统及其折反射型固态浸没透镜；
图2示出了包括现有光盘的现有光学数据存储系统及其折射型固态浸没透镜；
图3示出了图1和图2所示的光学数据存储系统中的近场产生区；
图4是说明在图2系统中产生的空气间隙反射光和记录层反射光的示意图；
图5是在图1或图2所示的光学数据存储系统中随空气间隙变化的角度与反射率关系的特性曲线图；
图6是说明在图1或图2所示的光学数据存储系统中光学拾取器没有检测到光学存储介质基底上形成的不均匀结构的情况的示意图；
图7示出了本发明第一实施例的光学数据存储系统，它与包括折反射型固态浸没透镜的光学数据存储系统一起使用；
图8示出了本发明第二实施例的光学数据存储系统，它与包括透射型固态浸没透镜的光学数据存储系统一起使用；
图9是说明在图8所示的光学数据存储系统中光学拾取器检测到光盘基底上形成的不均匀结构的情况的示意图；
图10示出了本发明第三实施例的光学数据存储系统；
图11示出了本发明第一实施例的光盘的分层结构；以及
图12是图11所示的光盘中相对运动静磨擦力随磨纹深度变化的曲线图。
具体实施方式
下面将参照附图说明本发明的优选实施例，附图中相同的标号执行相同的功能。
参照图7，本发明第一实施例的光学数据存储系统包括：具有光发送和接收部10、反射镜12、折反射型固态浸没光学系统64、滑块66的光学拾取器以及光学存储介质68。由于图7所示的各单元与图1所示的具有相同标号的各单元执行相同的光学功能，所以这里省略了对它们的详细描述。
一般盘片形式的光学存储介质68包括：基底681、透光保护层686、以及在基底681和保护层686之间设置的记录层。在可重写的光学存储介质68中，记录层是通过在基底681表面上覆盖一层光敏材料来形成的。这样制造的光学存储介质68使得从折反射型固态浸没光学系统64发出的光束，透过具有透光特性的保护层686，并在记录层上形成最小的光斑。与具有薄保护层183的现有存储介质18不同，该光学存储介质68具有厚度大于所用光波长的保护层686。在保护层686和固态浸没光学系统64之间存在一空气间隙。因此，考虑保护层686的厚度和折射率，使面向反射镜12的固态浸没光学系统64的表面具有在光学存储介质68上形成最小光斑的非球面结构。
或者，以与图1的固态浸没光学系统14的形状和材料相似的形状和材料，来构造折反射型固态浸没光学系统64。如上所述，考虑到基底的厚度大于所用光波长，其形状略有变化。
如图7所示，从反射镜12反射到固态浸没透镜64的光束1，被固态浸没透镜折射和反射，并在与存储介质68的保护层686相对的表面的中央形成一个光斑。利用旋转的存储介质68和滑块66之间的相对运动而产生的空气动力学效应，滑块66使固态浸没透镜64从存储介质68的表面上飘浮起来，并在存储介质68和滑块66的相对表面之间形成了空气间隙。这里，要保持在固态浸没透镜64和保护层686的表面之间存在的空气间隙的厚度在所采用的光波长以下，即小于光发送和接收部10所发出的光束的光波长。在最佳情况下，如果将空气间隙的厚度保持在1/4波长以下，将会减小干涉现象，从而获得极佳的信噪比。入射到存储介质68的光束通过透光保护层686后，到达记录层。于是，在所制造的光学存储介质68是高密度光学存储介质的情况下，即光学数据存储系统68具有宽度为100-150nm的沟槽或凹坑以及厚度为150-200nm的保护层686，从面向空气间隙的存储介质68的表面到沟槽或凹坑之间的深度会大于沟槽或凹坑的宽度。于是，图7的系统能够对高密度光学存储介质进行写入或读出信息的操作。
图8示出了本发明第二实施例的光学数据存储系统。图8的系统包括：物镜74、折射型固态浸没透镜76和滑块78，取代了图7所示的固态浸没光学系统64和滑块66。图9是图8所示的光学存储介质88和固态浸没透镜76的放大示意图。
物镜74在折射型固态浸没透镜76上聚焦由反射镜22入射的光束。在此实施例中，与上述存储介质68不同的是，光学存储介质88包括：与固态浸没透镜76相对的一个表面上的具有透光特性的基底881、在背对固态浸没透镜76的另一个表面上的保护层883。记录信息的沟槽或凹坑形成在光学存储介质88的基底881上。在图9中示出了向基底881一侧凹陷的楔形或井形形式的在透光基底881上形成的沟槽或凹坑所构成的不均匀结构885。
固态浸没透镜76利用由物镜74入射的光束在光学存储介质88的记录层上形成一最佳光斑，它位于在与存储介质88相对的固态浸没透镜76的表面的中央。此时，物镜74和固态浸没透镜76所形成的光斑在上述固态浸没透镜76表面上具有至少为1的数值孔径。滑块78使固态浸没透镜76从旋转的存储介质88的表面上飘浮起来，并将在固态浸没透镜76和基底881之间的空气间隙的厚度保持在1/4的所用光波长或以下，所采用的光波长即从光发送和接收部20发出的光束的波长。
在空气间隙的厚度为1/4的所用光波长或更大的情况下，当在与存储介质88相对的固态浸没透镜76的表面上形成光斑的光束通过空气间隙时，具有为1或更大数值孔径的该光束会被空气间隙全反射。因此，只有具有小于1的数值孔径的光束能被传送到光学存储介质88。到达存储介质88的光束的光斑尺寸会相对较大。然而，当空气间隙的厚度小于1/4的所用光波长时，数值孔径为1或更大的光束就被传送到存储介质88，并且光斑的尺寸变小。而且，与现有光学存储介质相比，由于其中形成有记录层的不均匀结构885远离了空气间隙，所以记录层反射光不会受到空气间隙反射光的干涉。因此，图8所示的光学数据存储系统也能够以极佳的信噪比对光学存储介质88进行写或读信息的操作。在图9中，实箭头线表示由存储介质88的记录层反射的“记录层反射光”，点划线箭头线表示由固态浸没透镜76的表面、空气间隙和基底881反射的“空气间隙反射光”。
图10示出了本发明第三实施例的光学数据存储系统。图10所示的系统包括双面光学存储介质90。在该光学存储介质90的构造中，两片图7所示的光学存储介质68的基底681彼此靠近或彼此接触。或者，在存储介质90的构造中，两片图8所示的光学存储介质88的保护层883彼此靠近或彼此接触，或在两片光学存储介质合并为一后只保留一个保护层883。图10的系统包括：一对用于光学存储介质90的光发送和接收部20、反射镜22、物镜74、固态浸没透镜76和滑块78。由于本领域技术人员通过上述实施例能够理解图10的操作，所以省略了对其的详细说明。
由于本领域普通技术人员了解如何利用图7或图8所示的系统构成图10所示的对光学存储介质90进行写和/或读信息操作的光学数据存储系统，所以省略对其的详细说明。
在上述第一实施例中，保护层的厚度原则上可以无限厚，但实际上保护层的厚度只要使在固态浸没光学系统64和保护层686之间的空气间隙的厚度小于一个所用光波长就足矣了。然而，考虑到决定光斑尺寸的数值孔径和实际厚度，保护层686的厚度可以在几个微米至几百微米的范围内。例如，数字通用盘(DVD)的基底厚度为0.6mm，即600μm。显然实际上上述厚度还可以变化。
而且，尽管固态浸没光学系统64或固态浸没透镜76的光轴没有垂直于光学存储介质68或88的表面，而是对其倾斜，只要在固态浸没光学系统64或固态浸没透镜76的相对光学存储介质68或88的表面最远的部分、同光学存储介质68或88的表面之间的距离小于所用光波长，空气间隙内部或在空气间隙和记录层之间的存储介质内部反射的光束就不会对记录层反射的光束起噪声的作用。具体是，如果固态浸没光学系统64或固态浸没透镜76聚焦的光束尺寸，在该光束通过光学存储介质68或88的表面时保持在0.1-0.2mm之间，就能够对表面有灰尘或损伤的光学存储介质68或88获得极佳的记录或再现特性。
图11示出了作为图7所示的光学存储介质68实例的光盘的分级结构。图11所示的光盘是具有20G字节或更多记录容量的高密度磁光盘，它包括：基底681、以及依次设置在基底681上的反射层682、第一介质层683、记录层684、第二介质层685、保护层686和润滑膜687。基底681由玻璃、聚碳酸酯、PMMA、丙烯酸盐基(aerylrate-based)树脂制成，并具有轨距在0.3-0.4μm之间、沟深在50-800埃之间的不均匀结构。反射层682由铝(AL)、镍(Ni)、铜(Cu)、铂(Pt)、银(Ag)、金(Au)中之一制成，并其厚度在500-2000埃之间。第一和第二介质层683和685由Si3N4、ZnS-SiO2等制成。第一介质层683的厚度在100-400埃之间，第二介质层685的厚度在300-800埃之间。为了进行磁光记录操作，记录层684由TbFeCo、NdTbFeCo、TbFe等制成，其厚度在150-400埃之间。保护层686可以用透光的无机材料或有机材料制成。在此实施例中，保护层由旋压涂覆丙烯酸盐基树脂制成，其厚度在5-100μm之间。保护层686的表面经磨纹处理(texturing-process)以便减小所谓的静磨擦。磨纹处理的凸纹间隔在20-60μm之间，并且磨纹深度(或凸纹高度)在5-50埃之间。在保护层686上形成的润滑膜687的厚度在1-3nm之间，它是一种不与保护层686发生化学反应的润滑剂，由PFPE(全氟聚醚，PerfluoroPolyether)制成。在硬盘中采用的Fomblin Z Dol或Fromblin 2001用作润滑剂。Galden SV用作与润滑剂混合的溶剂。
参照图12，在光盘表面上没有进行磨纹处理的情况下，会产生静磨擦。然而，在进行了具有5埃或更大深度的磨纹处理后，减小了此种静磨擦。
在本发明中，使用了固态浸没光学系统或固态浸没透镜。但是，对于本领域普通技术人员来说，如果在光学系统的发射表面和存储介质的保护层之间的空气间隙厚度小于所用光波长、并且保护层厚度大于所用光波长，则显然还可以采用一般的光学聚焦系统来取代固态浸没光学系统或固态浸没透镜。
在上述实施例中，反射镜12或22的作用是，将光发送和接收部10或20发出的光束传送到固态浸没透镜，并将从固态浸没透镜入射的光束传送到光发送和接收部。因此，可以采用能够改变光路的各种光学元件如棱镜等来取代反射镜。
如上所述，本发明的光学数据存储系统采用了透射层厚度大于所用光波长的光学存储介质，其中所述透射层位于光学聚焦系统如固态浸没光学系统或固态浸没透镜的发射表面和记录层之间。因此，本发明中，从空气间隙内部或在空气间隙和记录层之间的存储介质内部反射的光束不会对从记录层反射的光束起噪声作用。而且，由于本发明能够加厚作为光学存储介质外表面的保护层或基底的厚度，所以能够精确地对具有灰尘和损伤的光学存储介质进行写或读信息操作。

Claims (14)

1.一种用于存储信息的光学存储介质，它与具有用于产生近场效应的光学聚焦系统的光学拾取器一起使用，所述光学存储介质包括：
透光层，其厚度大于一个所用光波长，该厚度是在数个微米至数百微米之间；及
记录层，它设置在面向所述光学聚焦系统的所述透光层表面的相对面上，
其中，所述透光层是具有在面向所述光学聚焦系统的所述表面上形成的不均匀结构的基底，以便提供用于存储信息的预定格式化的结构。
2.如权利要求1所述的光学存储介质，其中，所述透光层是由丙烯酸盐基树脂制成的保护层。
3.如权利要求1所述的光学存储介质，其中，所述不均匀结构包括多个向面向所述光学聚焦系统的所述表面蚀刻的沟槽或凹坑。
4.如权利要求3所述的光学存储介质，其中，所述多个沟槽或凹坑的各自宽度在100-150nm之间，并且所述记录层的厚度在150-400nm之间。
5.一种光学数据存储系统，用于利用光学拾取器对光学存储介质进行写或读信息操作，所述光学数据存储系统包括：
所述光学拾取器，包括产生近场效应的聚焦透镜，
其中，所述光学存储介质包括：一透光层，其厚度大于一个所用光波长，该厚度在数个微米至数百微米之间；和一记录层，它设置在面向所述聚焦透镜的所述透光层表面的相对面上，
其中，在所述聚焦透镜和所述透光层两侧表面之间的间隔小于一个所用光波长，并且，所述透光层是具有在面向所述聚焦透镜的所述表面上形成的不均匀结构的基底，以便提供用于存储信息的预定格式化的结构。
6.如权利要求7所述的光学数据存储系统，其中，当所述聚焦透镜的光轴相对于所述光学存储介质倾斜时，在所述聚焦透镜距离所述光学存储介质表面最远的部分和所述光学存储介质表面之间的间隔保持在一个所用光波长以下。
7.如权利要求10所述的光学数据存储系统，其中，所述不均匀结构包括多个向面向所述聚焦透镜的所述表面蚀刻的沟槽或凹坑。
8.如权利要求11所述的光学数据存储系统，其中，所述多个沟槽或凹坑的各自宽度在100-150nm之间，并且所述记录层的厚度在150-400nm之间。
9.如权利要求7所述的光学数据存储系统，其中，在所述光学存储介质和所述聚焦透镜两侧所述表面之间的间隔小于1/4的所用光波长。
10.如权利要求7所述的光学数据存储系统，其中，所述光学拾取器包括数值孔径为1或大于1的光学聚焦系统。
11.如权利要求14所述的光学数据存储系统，其中，所述光学聚焦系统是折反射型固态浸没光学系统。
12.如权利要求14所述的光学数据存储系统，其中，所述光学聚焦系统是折射型固态浸没透镜。
13.如权利要求14所述的光学数据存储系统，还包括：
光发送和接收部，用于发出光束并检测入射光束；
滑块，用于以空气动力学的方式使所述光学聚焦系统从所述光学存储介质的所述侧表面上飘浮起来；以及
光路变化装置，用于将所述光发送和接收部发出的光束传送到所述光学聚焦系统，并将从所述光学聚焦系统入射的光束传送到所述光发送和接收部。
14.一种光学数据存储系统，用于利用光学拾取器对光学存储介质进行写或读信息操作，所述光学数据存储系统包括：
所述光学拾取器，包括第一和第二光学拾取器，两者均包含产生近场效应的光学聚焦系统；以及
所述光学存储介质，包括单个光学存储介质，它包含具有面向所述第一光学拾取器的一个表面的第一透光层、具有面向所述第二光学拾取器的一个表面的第二透光层、以及第一和第二记录层，所述第一和第二记录层分别设置在所述第一透光层的另一表面和所述第二透光层的另一表面上，
其中，所述第一和第二透光层的厚度大于一个所用光波长，并且在所述光学聚焦系统和所述透光层的相对表面之间的距离小于一个所用光波长。
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