CN114326080A - Ultra-large depth of field and anti-vibration and anti-shake image processing method for microscope - Google Patents
Ultra-large depth of field and anti-vibration and anti-shake image processing method for microscope Download PDFInfo
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- 238000003672 processing method Methods 0.000 title claims description 17
- 230000001052 transient effect Effects 0.000 claims abstract description 13
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 10
- 238000003786 synthesis reaction Methods 0.000 claims abstract description 10
- 238000001514 detection method Methods 0.000 claims abstract description 9
- 238000000034 method Methods 0.000 claims abstract description 7
- 238000012216 screening Methods 0.000 claims description 13
- 230000008569 process Effects 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 claims description 2
- 238000012545 processing Methods 0.000 abstract description 4
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- 230000007547 defect Effects 0.000 description 3
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- 230000003287 optical effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
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- 238000005259 measurement Methods 0.000 description 1
- 230000009347 mechanical transmission Effects 0.000 description 1
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Abstract
The invention discloses a method for processing an ultra-large depth of field and a shockproof anti-shake image for a microscope, which comprises the following steps: s1, judging whether the image is shake detection or slope detection according to the image acquisition scene of the microscope, if so, executing a step S2, and if so, executing a step S3; s2, shooting a plurality of real-time images at different transient positions; s3, dividing the moving stroke of the microscope, setting a plurality of image acquisition points on the moving stroke and acquiring real-time images; s4, extracting the clearest part of each real-time image to be used as a synthesis source image; and S5, overlapping all the synthesis source pictures to form a final image. The invention can be suitable for occasions that the measured surface of the measured object is seriously not perpendicular to the microscope, the measured surface is seriously uneven or the measured object shakes and the like, can present clear and uniform pictures, and has the advantages of larger application environment, workload reduction of inspectors and the like.
Description
Technical Field
The invention relates to the technical field of microscope image processing, in particular to a method for processing an ultra-large field depth and shockproof anti-shake image for a microscope.
Background
The depth of field of the existing optical equipment such as a microscope and the like is very small, and the existing optical equipment cannot resist shock and shake. When observing an object, the measured object must be required to be very flat and very perpendicular to a microscope lens, the measured object cannot shake, otherwise, the measured object cannot be imaged, and the defects cannot be eliminated by the hardware technology of the microscope and must be solved by the image processing software technology.
Disclosure of Invention
Therefore, in order to solve the above technical problems, it is necessary to provide an ultra-large depth of field and anti-shake image processing method for a microscope, which has a larger applicable environment, reduces the workload of inspectors, and improves the work efficiency of the inspectors.
An ultra-large depth of field and anti-vibration and anti-shake image processing method for a microscope comprises the following steps:
s1, judging whether the image is shake detection or slope detection according to the image acquisition scene of the microscope, if so, executing a step S2, and if so, executing a step S3;
s2, shooting a plurality of real-time images at different transient positions;
s3, dividing the moving stroke of the microscope, setting a plurality of image acquisition points on the moving stroke and acquiring real-time images;
s4, extracting the clearest part of each real-time image to be used as a synthesis source image;
and S5, overlapping all the synthesized source images to form a final image.
In one embodiment, the step S2 includes:
s21, moving the microscope to the position to be measured of the object to be measured;
s22, determining image acquisition time, and dividing image acquisition transient points according to set interval time;
s23, continuously collecting a plurality of images at each image collection instant point;
and S24, selecting the clearest image in each image acquisition transient point as a real-time image.
In one embodiment, the step S3 includes:
s31, finding the image reference point of the object to be detected;
s32, determining the moving stroke of the microscope according to the image reference points;
and S33, dividing the moving stroke into a plurality of image acquisition points, and acquiring a real-time image at each image acquisition point.
In one embodiment, the step S31 includes:
s311, moving the microscope to a position to be detected of an object to be detected;
s312, adjusting the microscope to obtain an image, and taking a picture of the image in real time in the process;
s313, screening out the clearest image as a basic image;
and S314, taking the position corresponding to the basic image as an image reference point of the object to be detected.
In one embodiment, the step S32 includes:
s321, presenting the actual size of the object to be detected according to the final image, and determining the effective image acquisition length;
s322, dividing walking paths to two sides along the surface of the object to be detected by taking the reference point as an origin according to the image acquisition length;
and S323, planning the walking paths on the two sides of the reference point to the same straight line to form a moving stroke of the microscope, wherein the lengths of the walking paths on the two sides of the surface of the object to be detected are the same.
In one embodiment, the step S33 includes:
s331, setting a plurality of image acquisition points on the moving stroke according to a set interval;
s332, collecting a plurality of real-time images at each image collecting point;
s333, screening the real-time images of each image acquisition point, and selecting the real-time image with the highest definition.
In one embodiment, the step S4 includes:
s41, selecting and collecting the clearest part in the real-time image by a screening box with a set shape;
s42, recording the coordinate position of the picture collected by the screening frame relative to the reference point;
and S43, generating a synthetic source image with the coordinate position.
In one embodiment, the step S5 includes:
s51, overlapping all the synthesis source pictures according to the coordinate positions by taking the reference points as the original points;
s52, performing self-inspection on the superposed pictures, judging whether the pictures are clear or uniform, and if so, forming a final image; if not, the dislocation and the deformation are corrected through an algorithm so as to enable the final image to be clear.
In one embodiment, the microscope is connected to an external mobile terminal, which is capable of controlling the movement of the microscope.
In one embodiment, an industrial camera is installed on the microscope, the industrial camera can photograph the image of the microscope in real time, the industrial camera can transmit the picture to a mobile terminal, and the mobile terminal can analyze the definition of the picture.
The processing method for the ultra-large field depth and shockproof anti-shake image for the microscope can be suitable for occasions that the measured surface of the measured object is seriously not perpendicular to the microscope, the measured surface is seriously uneven or the measured object shakes and the like, can present clear and uniform pictures, and has the advantages of being larger in application environment, reducing the workload of inspectors, improving the working efficiency of the inspectors and the like.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
FIG. 1 is a flow chart of the ultra-large depth of field and anti-shake image processing method for a microscope of the present invention;
fig. 2 is a detailed flowchart of step S5 of the present invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1, an embodiment of the present invention provides a method for processing an ultra-large depth of field and an anti-shake image for a microscope, including the following steps:
s1, judging whether the image is shake detection or slope detection according to the image acquisition scene of the microscope, if so, executing a step S2, and if so, executing a step S3;
s2, shooting a plurality of real-time images at different transient positions;
s3, dividing the moving stroke of the microscope, setting a plurality of image acquisition points on the moving stroke and acquiring real-time images;
s4, extracting the clearest part of each real-time image to be used as a synthesis source image;
and S5, overlapping all the synthesized source images to form a final image.
The processing method for the ultra-large field depth and shockproof anti-shake image for the microscope can be suitable for occasions that the measured surface of the measured object is seriously not perpendicular to the microscope, the measured surface is seriously uneven or the measured object shakes and the like, can present clear and uniform pictures, and has the advantages of more applicable environments, workload reduction of inspectors, work efficiency improvement of the inspectors and the like.
In an embodiment of the present invention, the step S2 includes:
s21, moving the microscope to the position to be measured of the object to be measured;
s22, determining image acquisition time, and dividing image acquisition transient points according to set interval time; for example: the acquisition time is 10S, and the set interval time can be 1-2S, so that the image acquisition transient can be divided into 5-10 image acquisition transients.
S23, continuously collecting a plurality of images at each image collection instant point;
and S24, selecting the clearest image in each image acquisition transient point as a real-time image.
In the embodiment, by setting the plurality of image acquisition transient points and acquiring the plurality of images at different image acquisition transient points, the efficiency and probability of capturing clear images can be improved, and therefore powerful guarantee is provided for partial extraction and synthesis of subsequent images.
In an embodiment of the present invention, the step S3 includes:
s31, finding the image reference point of the object to be detected;
s32, determining the moving stroke of the microscope according to the image reference points;
and S33, dividing the moving stroke into a plurality of image acquisition points, and acquiring a real-time image at each image acquisition point.
In an embodiment of the present invention, the step S31 includes:
s311, moving the microscope to a position to be detected of an object to be detected;
s312, adjusting the microscope to obtain an image, and taking a picture of the image in real time in the process;
s313, screening out the clearest image as a basic image;
and S314, taking the position corresponding to the basic image as an image reference point of the object to be detected.
In this embodiment, the microscope is connected with an external mobile terminal, and the mobile terminal can control the microscope to move, wherein the mobile terminal can be a computer, a single chip microcomputer or a raspberry group and the like. Specifically, a driving motor of the microscope can be connected with the mobile terminal, and the mobile terminal can adjust the up-down position or the horizontal position of the microscope by controlling the rotation angles of different motors. For example: in this embodiment, first, a motor of a microscope is assigned to a computer, a single chip microcomputer, or a raspberry to send a command, the motor drives the microscope to move up and down, an industrial camera (a camera) can photograph an image of the microscope in real time, then the image is transmitted to the computer, the single chip microcomputer, or the raspberry to perform resolution analysis, and a clearest image is found out, where a position of the motor corresponding to the image is a reference point.
It should be noted that, in this embodiment, an industrial camera (e.g., a camera) installed on the microscope can take a picture of an image of the microscope in real time, and the industrial camera and the mobile terminal may be connected by a wire or a wireless WiFi.
In an embodiment of the present invention, the step S32 includes:
s321, presenting the actual size of the object to be detected according to the final image, and determining the effective image acquisition length; for example: the final image shows that the size of the object to be measured is 1mm (for example, a square image, the side length is 1mm, and for a circular image, the diameter is 1mm), and the effective image acquisition length is also set to be 1 mm. Therefore, the defects of the length of the image acquisition can be avoided, the definition of a partial area of the final image cannot be guaranteed, excessive image acquisition can be avoided, and the workload and the working efficiency are increased.
S322, dividing walking paths to two sides along the surface of the object to be detected by taking the reference point as an origin according to the image acquisition length; in this embodiment, if the surface of the object to be measured is an inclined plane, the walking path may be divided into: extending in parallel along the surface of the inclined plane of the object to be measured; if the surface of the object to be measured is a plane, the walking path can be divided to extend in parallel along the plane surface of the object to be measured.
S323, planning the walking paths on the two sides of the reference point to the same straight line to form a moving stroke of the microscope, so that the mobile terminal can control the action of the motor in a single direction, measuring errors can be reduced, the operation efficiency is improved, meanwhile, the coordinate position can be determined conveniently, and subsequent picture synthesis is facilitated.
Optionally, the lengths of the walking paths along the two sides of the surface of the object to be detected are the same. Therefore, the microscope can be symmetrical to the pictures collected from two sides along the reference point, so that the identification and comparison are convenient, and the measurement and statistical errors are reduced.
In an embodiment of the present invention, the step S33 includes:
s331, setting a plurality of image acquisition points on the moving stroke according to a set interval; for example: the set interval is 0.05-0.15 mm.
S332, collecting a plurality of real-time images at each image collecting point;
s333, screening the real-time images of each image acquisition point, and selecting the real-time image with the highest definition.
In this embodiment, the moving stroke s of the motor, which needs to move back and forth, can be calculated according to the inclination angle of the object to be measured, then at least one picture is taken at intervals of 0.1mm, a plurality of pictures are taken up and down, generally, the inclination angle is below 10 degrees, 10 pictures are taken up and down, the inclination angle is below 20 degrees, 20 pictures are taken up and down, and so on, and the mobile terminal can measure and acquire the inclination angle.
In an embodiment of the present invention, the step S4 includes:
s41, selecting and collecting the clearest part in the real-time image by a screening box with a set shape; in this embodiment, in order to facilitate the superimposition of subsequent images, the screening frame may be set to have a shape suitable for superimposition, such as a square shape, a regular hexagon shape, and the like, and has a certain verification effect on the accuracy of the superimposition position of the image.
S42, recording the coordinate position of the picture collected by the screening frame relative to the reference point; in this embodiment, if the image is in the shake detection environment, the reference point is the location point of the microscope because the microscope does not need to perform the route planning.
And S43, generating a synthetic source image with the coordinate position. Therefore, accurate superposition of pictures according to the coordinate positions is facilitated.
Referring to fig. 2, in an embodiment of the present invention, the step S5 includes:
s51, overlapping all the synthesis source pictures according to the coordinate positions by taking the reference points as the original points; in this way, the display accuracy of the final image can be improved.
S52, performing self-inspection on the superposed pictures, judging whether the pictures are clear or uniform, and if so, forming a final image; if not, the dislocation and the deformation are corrected through an algorithm so as to enable the final image to be clear.
It should be noted that, in the present invention, the images collected by the ultra-large depth of field (inclined plane) portion and the shaking portion have functions of misalignment correction and distortion correction, and because the microscope has gaps in the focusing process due to mechanical transmission, the images taken under different depth of field (focal length) may have defects such as misalignment and distortion (the condition of the shaking portion is similar), and therefore, the images need to be corrected by an algorithm to reduce or avoid the occurrence of the ghost phenomenon.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-described examples merely represent several embodiments of the present application and are not to be construed as limiting the scope of the claims. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. An ultra-large depth of field and anti-vibration and anti-shake image processing method for a microscope is characterized by comprising the following steps:
s1, judging whether the image is shake detection or slope detection according to the image acquisition scene of the microscope, if so, executing a step S2, and if so, executing a step S3;
s2, shooting a plurality of real-time images at different transient positions;
s3, dividing the moving stroke of the microscope, setting a plurality of image acquisition points on the moving stroke and acquiring real-time images;
s4, extracting the clearest part of each real-time image to be used as a synthesis source image;
and S5, overlapping all the synthesized source images to form a final image.
2. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 1, wherein the step S2 includes:
s21, moving the microscope to the position to be measured of the object to be measured;
s22, determining image acquisition time, and dividing image acquisition transient points according to set interval time;
s23, continuously collecting a plurality of images at each image collection instant point;
and S24, selecting the clearest image in each image acquisition transient point as a real-time image.
3. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 1, wherein the step S3 includes:
s31, finding the image reference point of the object to be detected;
s32, determining the moving stroke of the microscope according to the image reference points;
and S33, dividing the moving stroke into a plurality of image acquisition points, and acquiring a real-time image at each image acquisition point.
4. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 3, wherein the step S31 includes:
s311, moving the microscope to a position to be detected of an object to be detected;
s312, adjusting the microscope to obtain an image, and taking a picture of the image in real time in the process;
s313, screening out the clearest image as a basic image;
and S314, taking the position corresponding to the basic image as an image reference point of the object to be detected.
5. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 4, wherein the step S32 includes:
s321, presenting the actual size of the object to be detected according to the final image, and determining the effective image acquisition length;
s322, dividing walking paths to two sides along the surface of the object to be detected by taking the reference point as an origin according to the image acquisition length;
and S323, planning the walking paths on the two sides of the reference point to the same straight line to form a moving stroke of the microscope, wherein the lengths of the walking paths on the two sides of the surface of the object to be detected are the same.
6. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 5, wherein the step S33 includes:
s331, setting a plurality of image acquisition points on the moving stroke according to a set interval;
s332, collecting a plurality of real-time images at each image collecting point;
s333, screening the real-time images of each image acquisition point, and selecting the real-time image with the highest definition.
7. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 1, wherein the step S4 includes:
s41, selecting and collecting the clearest part in the real-time image by a screening box with a set shape;
s42, recording the coordinate position of the picture collected by the screening frame relative to the reference point;
and S43, generating a synthetic source image with the coordinate position.
8. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 7, wherein the step S5 includes:
s51, overlapping all the synthesis source pictures according to the coordinate positions by taking the reference points as the original points;
s52, performing self-inspection on the superposed pictures, judging whether the pictures are clear or uniform, and if so, forming a final image; if not, the dislocation and the deformation are corrected through an algorithm so as to enable the final image to be clear.
9. The ultra-large depth of field and shock-proof anti-shake image processing method for a microscope according to claim 1, wherein the microscope is connected to an external mobile terminal, and the mobile terminal can control the microscope to move.
10. The ultra-large depth of field and shock-proof and anti-shake image processing method for the microscope as claimed in claim 9, wherein an industrial camera is installed on the microscope, the industrial camera can take a picture of the image of the microscope in real time, the industrial camera can transmit the picture to a mobile terminal, and the mobile terminal can perform sharpness analysis on the picture.
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