CN114324459A - Test apparatus and test data processing method - Google Patents
Test apparatus and test data processing method Download PDFInfo
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- CN114324459A CN114324459A CN202111620006.5A CN202111620006A CN114324459A CN 114324459 A CN114324459 A CN 114324459A CN 202111620006 A CN202111620006 A CN 202111620006A CN 114324459 A CN114324459 A CN 114324459A
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
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Abstract
The embodiment of the application discloses a testing device and a testing data processing method, which are used for monitoring the real-time change condition of the thermal performance of a Langmuir probe in the testing process. The utility model provides a testing arrangement for test Langmuir probe, include: the temperature measuring device comprises a temperature measuring instrument and a plurality of thermocouples, wherein the thermocouples comprise a first thermocouple and a second thermocouple; wherein the first thermocouple and the second thermocouple are arranged on the side wall of the Langmuir probe, and the first position of the first thermocouple and the second position of the second thermocouple are separated by a preset distance along the extension direction of the Langmuir probe; the temperature measuring instrument is connected with the first thermocouple and the second thermocouple, and is used for collecting a first temperature of the first position and a second temperature of the second position, and the first temperature and the second temperature are used for generating a test result.
Description
Technical Field
The embodiment of the application relates to the field of testing, in particular to a testing device and a testing data processing method.
Background
The plasma is generated by means of high temperature, high pressure and the like, long-range force among charged particles plays a leading role, and ionized gas with collective effect is generally in an electrically neutral property and is often called as a fourth state of a substance. In recent years, plasma devices are used to simulate the reaction conditions of thermonuclear fusion, and the thermal shock resistance, thermal fatigue resistance and the like of materials are tested. However, the current plasma device test can only output a plasma beam with a certain power through electric field and magnetic field control, and cannot monitor the real-time change condition of the thermal performance of the langmuir probe in the test process.
Disclosure of Invention
The embodiment of the application provides a testing device and a testing data processing method, which are used for monitoring the real-time change condition of the thermal performance of a Langmuir probe in the testing process.
A first aspect of the embodiments of the present application provides a testing apparatus, configured to test a langmuir probe, including: the temperature measuring device comprises a temperature measuring instrument and a plurality of thermocouples, wherein the thermocouples comprise a first thermocouple and a second thermocouple;
wherein the first thermocouple and the second thermocouple are arranged on the side wall of the Langmuir probe, and the first position of the first thermocouple and the second position of the second thermocouple are separated by a preset distance along the extension direction of the Langmuir probe;
the temperature measuring instrument is connected with the first thermocouple and the second thermocouple, and is used for collecting a first temperature of the first position and a second temperature of the second position, and the first temperature and the second temperature are used for generating a test result.
The temperature measuring instrument and the thermocouples are arranged in the embodiment of the application, the first temperature and the second temperature are collected, the real-time change situation of the thermal performance of the Langmuir probe is reflected by the first temperature and the second temperature, and the first temperature and the second temperature are used for generating a test result, so that the thermal performance of the Langmuir probe is monitored in real time.
In an implementation manner of the first aspect of the embodiment of the present application, the testing apparatus further includes a water cooling module and a circulating water system;
the water-cooling module is fixedly connected with the Langmuir probe, the circulating water system is connected with the water-cooling module through a water pipe, and the circulating water system is used for cooling the water-cooling module.
The water cooling module is used in the embodiment of the application, and the Langmuir probe is cooled.
In one implementation of the first aspect of the embodiments of the present application, the langmuir probe is connected to the water cooling module by high temperature diffusion welding.
In an implementation manner of the first aspect of the embodiment of the present application, the water-cooling module is made of copper.
In one implementation of the first aspect of the embodiments of the present application, the testing apparatus further includes a refractory metal baffle; the high-melting-point metal baffle is provided with a through hole, the diameter of the through hole is larger than or equal to that of the front end of the Langmuir probe, and the front end of the Langmuir probe is matched with the through hole; the high-melting-point metal wire is made of metal with a melting point higher than a preset melting point.
Set up high melting point metal baffle in this application embodiment, let plasma beam direct bombardment langmuir probe needle body head, it is thermal-insulated that other places utilize high melting point metal baffle to block, makes the heat propagate along the needle body passageway.
In an implementation manner of the first aspect of the embodiment of the present application, the testing device further includes a plasma emission source, a plasma cavity, a fixed support, an insulating base, and a moving track;
the plasma emission source is used for emitting plasma into the plasma cavity and emitting the plasma to the Langmuir probe;
the high melting point metal baffle, the Langmuir probe, the fixed bracket, the insulating base and the moving track are arranged in the plasma cavity; the insulating base sets up at the removal track, and the fixed bolster setting is at the insulating base, and the Langmuir probe sets up at the fixed bolster, and the fixed bolster is used for adjusting the Langmuir probe to unanimous with the level of plasma emission source.
The embodiment of the application is provided with the plasma emission source, the plasma cavity, the fixed support, the insulating base and the moving track, so that the realizability of the scheme is improved.
In one implementation of the first aspect of the embodiments of the present application, the plasma chamber is provided with a visible glass window, and the moving track is configured to adjust the langmuir probe to an observation region of the visible glass window.
Set up visual glass window in this application embodiment, be convenient for observe the langmuir probe.
In an implementation manner of the first aspect of the embodiment of the present application, the testing apparatus further includes an insulation tester;
the Langmuir probe comprises a high-melting-point metal wire, an intermediate insulating layer and a high-melting-point metal heat shield, wherein the high-melting-point metal wire is arranged in the high-melting-point metal heat shield, the intermediate insulating layer is arranged between the high-melting-point metal wire and the high-melting-point metal heat shield, the intermediate insulating layer enables the high-melting-point metal wire and the high-melting-point metal heat shield to be mutually insulated, and two poles of an insulation tester are respectively connected with the high-melting-point metal wire and the high-melting-point metal heat shield; the high-melting-point metal baffle and the high-melting-point metal heat shield are made of metal with a melting point higher than a preset melting point.
In the embodiment of the application, the insulation tester monitors the real-time change of the electrical property of the Langmuir probe in the test process.
In an implementation manner of the first aspect of the embodiment of the present application, the positive electrode of the insulation tester is connected to the high-melting-point metal wire, and the negative electrode of the insulation tester is connected to the high-melting-point metal heat shield.
In one implementation of the first aspect of the embodiments of the present application, the refractory metal wire, the intermediate insulating layer, and the refractory metal heat shield are connected by brazing.
In one implementation of the first aspect of the embodiments of the present application, the intermediate insulating layer is an intermediate ceramic layer.
In an implementation manner of the first aspect of the embodiment of the present application, the test apparatus further includes a communication interface;
the temperature measurer sends the first temperature and the second temperature of the Langmuir probe to a test data processing device through the communication interface, so that the test data processing device obtains the temperature gradient of the Langmuir probe surface and the maximum temperature of the Langmuir probe surface according to the first temperature and the second temperature.
According to the embodiment of the application, the communication interface is arranged between the testing device and the testing data processing device, so that the communication efficiency is improved.
A second aspect of the embodiments of the present application provides a test data processing method, for testing a langmuir probe using the test apparatus of the first aspect, including:
acquiring a first position of a first thermocouple and a second position of a second thermocouple;
acquiring a first temperature of a first position and a second temperature of a second position;
acquiring a temperature distribution model of the Langmuir probe;
acquiring boundary parameters of a temperature distribution model, wherein the boundary parameters comprise plasma heat flow of a Langmuir probe and convection heat exchange between a water cooling module and a circulating water system;
inputting the boundary parameters into a temperature distribution model;
determining a third location in the temperature distribution model representing the first location;
determining a fourth location in the temperature distribution model representing the second location;
acquiring a third temperature of a third position and a fourth temperature of a fourth position in the temperature distribution model;
judging whether the absolute value of the difference value of the third temperature and the first temperature is smaller than a first preset value or not;
judging whether the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value or not;
if the temperature is smaller than the first preset value and smaller than the second preset value, acquiring the temperature gradient of the Langmuir probe surface and the highest temperature of the Langmuir probe surface output by the temperature distribution model;
and if the boundary parameter is not less than the first preset value or not less than the second preset value, updating the boundary parameter, and then executing the step of inputting the boundary parameter into the temperature distribution model.
In the embodiment of the application, the real-time change condition of the thermal performance of the Langmuir probe in the test process is monitored by processing the test data.
In an implementation manner of the second aspect of the embodiment of the present application, the obtaining a boundary parameter of the temperature distribution model includes:
acquiring the circulating water temperature of a circulating water system;
acquiring the contact area between the water cooling module and the water pipe;
and obtaining the convective heat transfer between the water cooling module and the circulating water system according to the temperature and the contact area of the circulating water.
In the embodiment of the application, a circulating water system and the temperature of circulating water are considered, and the realizability of the scheme is improved.
In an implementation manner of the second aspect of the embodiment of the present application, the method further includes:
acquiring the resistance of the Langmuir probe acquired by the insulation tester;
judging whether the resistance of the Langmuir probe is smaller than a preset resistance value or not;
if the resistance value is less than the preset resistance value, determining that the Langmuir probe is unqualified;
and if the resistance value is not less than the preset resistance value, determining that the Langmuir probe is qualified.
The real-time change condition of Langmuir probe electrical property in the testing process is monitored by using the insulation tester to test.
A third aspect of the embodiments of the present application provides a test data processing apparatus for testing a langmuir probe using the test apparatus according to the first aspect, including:
the first acquisition unit is used for acquiring a first position of a first thermocouple and a second position of a second thermocouple;
a second acquisition unit configured to acquire a first temperature at the first location and a second temperature at the second location;
a third acquiring unit for acquiring a temperature distribution model of the Langmuir probe;
the fourth acquisition unit is used for acquiring boundary parameters of the temperature distribution model, wherein the boundary parameters comprise plasma heat flow of the Langmuir probe and convection heat exchange between the water cooling module and the circulating water system;
an input unit for inputting the boundary parameter into the temperature distribution model;
a first determination unit for determining a third position representing the first position in the temperature distribution model;
a second determination unit for determining a fourth location representing the second location in the temperature distribution model;
a fifth acquiring unit, configured to acquire a third temperature at a third position and a fourth temperature at a fourth position in the temperature distribution model;
the first judging unit is used for judging whether the absolute value of the difference value of the third temperature and the first temperature is smaller than a first preset value or not;
the second judging unit is used for judging whether the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value or not;
a sixth acquiring unit, configured to acquire the temperature gradient of the surface of the langmuir probe and the maximum temperature of the surface of the langmuir probe output by the temperature distribution model when the first determining unit determines that the temperature gradient is smaller than the first preset value and the second determining unit determines that the temperature gradient is smaller than the second preset value;
and the updating unit is used for updating the boundary parameter when the first judging unit determines that the boundary parameter is not less than the first preset value or the second judging unit determines that the boundary parameter is not less than the second preset value, and then executing the step of inputting the boundary parameter into the temperature distribution model.
In an implementation manner of the third aspect of the embodiment of the present application, the fourth obtaining unit is specifically configured to: acquiring the circulating water temperature of a circulating water system; acquiring the contact area between the water cooling module and the water pipe; and obtaining the convective heat transfer between the water cooling module and the circulating water system according to the temperature and the contact area of the circulating water.
In an implementation manner of the third aspect of the embodiment of the present application, the test data processing apparatus further includes:
a seventh acquiring unit, configured to acquire the resistance of the langmuir probe acquired by the insulation tester;
the third judging unit is used for judging whether the resistance of the Langmuir probe is smaller than a preset resistance value or not;
the third determining unit is used for determining that the Langmuir probe is unqualified when the third judging unit determines that the resistance value is smaller than the preset resistance value;
and a fourth determining unit for determining that the Langmuir probe is qualified when the third judging unit determines that the resistance value is not less than the preset resistance value.
A fourth aspect of the present embodiment provides a test data processing apparatus, including:
the system comprises a central processing unit, a memory, an input/output interface, a wired or wireless network interface and a power supply;
the memory is a transient memory or a persistent memory;
the central processor is configured to communicate with the memory and execute the operations of the instructions in the memory to perform the method of the second aspect.
A fifth aspect of embodiments of the present application provides a computer-readable storage medium comprising instructions which, when executed on a computer, cause the computer to perform the method of the second aspect.
A sixth aspect of embodiments of the present application provides a computer program product comprising instructions which, when run on a computer, cause the computer to perform the method according to the second aspect.
A seventh aspect of embodiments of the present application provides a chip system, where the chip system includes at least one processor and a communication interface, where the communication interface and the at least one processor are interconnected by a line, and the at least one processor is configured to execute a computer program or instructions to perform the method according to the second aspect.
Drawings
FIG. 1 is a schematic structural diagram of a testing apparatus according to an embodiment of the present application;
FIG. 2 is a schematic view of another structure of the testing device according to the embodiment of the present application;
FIG. 3 is a flowchart of a test data processing method according to an embodiment of the present application;
FIG. 4 is another flow chart of a test data processing method according to an embodiment of the present application;
FIG. 5 is a schematic structural diagram of a test data processing apparatus according to an embodiment of the present application;
FIG. 6 is a schematic diagram of another structure of a test data processing apparatus according to an embodiment of the present application;
FIG. 7 is a schematic diagram of another structure of a test data processing apparatus according to an embodiment of the present application;
FIG. 8 is an experimental flow chart of a test data processing method according to an embodiment of the present application;
FIG. 9 is a graph of experimental results of a test data processing method according to an embodiment of the present application;
fig. 10 is a graph showing another experimental result of the test data processing method according to the embodiment of the present application.
1. A plasma emission source; 2. plasma; 3. a plasma chamber; 4. a tungsten baffle; 5. a water cooling module; 6. langmuir probe; 7. fixing a bracket; 8. an insulating base; 9. a moving track; 10. a circulating water system.
Detailed Description
The terms "first," "second," "third," "fourth," and the like in the description and in the claims of the present application and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It will be appreciated that the data so used may be interchanged under appropriate circumstances such that the embodiments described herein may be practiced otherwise than as specifically illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
The langmuir probe is used for detecting plasma, and in order to ensure that the langmuir probe can work in a plasma environment, the temperature distribution of the langmuir probe needs to be monitored in real time.
The metal with a melting point higher than the predetermined melting point may be tungsten, platinum, tantalum, or the like, in this embodiment, tungsten is taken as an example for description, the high-melting-point metal wire is a tungsten wire, the high-melting-point metal baffle is a tungsten baffle, and the high-melting-point metal heat shield is a tungsten heat shield. The preset melting point can be determined according to the actual service condition of the Langmuir probe, and the preset melting point can be 1500 ℃, 2000 ℃, 3000 ℃ or the like.
As shown in fig. 1, the present embodiment provides a testing apparatus for testing a langmuir probe 6, including: the temperature measuring device comprises a temperature measuring instrument and a plurality of thermocouples, wherein the thermocouples comprise a first thermocouple and a second thermocouple;
wherein the first thermocouple and the second thermocouple are configured to be disposed on a sidewall of the langmuir probe 6, and a first position of the first thermocouple and a second position of the second thermocouple are spaced apart by a predetermined distance along an extending direction of the langmuir probe 6;
the temperature measuring instrument is connected with the first thermocouple and the second thermocouple and is used for collecting the first temperature of the first position and the second temperature of the second position. Both the first temperature and the second temperature are the surface temperature of the langmuir probe 6. The first temperature and the second temperature are used to generate a test result.
As shown in fig. 2, the present embodiment provides a testing apparatus for testing the langmuir probe 6, and monitoring the surface temperature of the langmuir probe 6 in real time to obtain the thermal performance of the langmuir probe 6, including the plasma emission source 1, the plasma 2, the plasma cavity 3, the tungsten baffle 4, the water cooling module 5, the langmuir probe 6, the fixed support 7, the insulating base 8, the moving rail 9, the circulating water system 10, the thermocouple, the thermometer, and the insulating tester.
The test apparatus may be divided into a test environment module, a position adjusting module, a thermal performance test module, and an electrical performance test module according to functions, which are described below, respectively.
The testing environment assembly includes a plasma emission source 1 and a plasma chamber 3. The testing environment component is used for providing a plasma 2 testing environment, simulating an actual service environment of the langmuir probe 6, especially simulating the service environment of the langmuir probe 6 in the thermonuclear fusion high-temperature experiment, and this embodiment takes as an example the simulation of the service environment of the langmuir probe 6 in the thermonuclear fusion high-temperature experiment as an illustration.
During the experiment, the plasma cavity 3 is kept in a vacuum state, the testing environment assembly enables the plasma emission source 1 to generate glow discharge by adjusting parameters of a magnetic field and an electric field, so that high-energy plasma 2 beams are emitted into the plasma cavity and irradiated on the Langmuir probe 6, and the high-temperature experiment is carried out.
The high melting point metal baffle, the Langmuir probe 6, the water cooling module 5, the fixed support 7, the insulating base 8 and the moving track 9 are arranged in the plasma cavity 3. The plasma cavity 3 is provided with a visible glass window for observing the internal conditions of the plasma cavity 3.
The position adjusting component comprises a fixed support 7, an insulating base 8 and a moving track 9. The insulating base 8 is arranged on the moving rail 9, the fixed support 7 is arranged on the insulating base 8, and the Langmuir probe 6 is arranged on the fixed support 7.
In the experiment, the langmuir probe 6 and the copper water-cooling module 5 are connected with the insulating base 8 through the fixing bracket 7, and the langmuir probe 6 and the plasma emission source 1 are adjusted to the same horizontal height through the fixing bracket 7.
The testing apparatus is kept insulated from the plasma chamber 3 by means of an insulating base 8.
The insulating base 8 can adjust the distance between the plasma emission source 1 and the langmuir probe 6 through the moving track 9, and move the langmuir probe 6 to the observation area of the visible glass window, so as to be convenient for observing the plasma 2 glow discharge and the surface condition of the langmuir probe 6 in the experiment process.
The thermal performance testing assembly comprises a tungsten baffle 4, a water cooling module 5, a circulating water system 10, a thermocouple and a temperature measuring instrument.
The number of the thermocouples can be two or more, and all the thermocouples need to be connected with a temperature measuring instrument. When there are more than two thermocouples, at least two thermocouples have a predetermined distance in the front-rear direction, and the predetermined distance is not zero, for example, when there are three thermocouples, the first thermocouple and the second thermocouple have a predetermined distance in the front-rear direction of the langmuir probe 6, a third thermocouple may be disposed at another position of the langmuir probe 6, a third thermocouple may be disposed between the first thermocouple and the second thermocouple, and a third thermocouple may not be disposed between the first thermocouple and the second thermocouple, so that the first thermocouple, the second thermocouple, and the third thermocouple are located at three vertices of a triangle. The present embodiment is described by taking two thermocouples as an example.
The thermocouples include a first thermocouple and a second thermocouple, which are disposed at a side wall of the langmuir probe 6, and which have a predetermined distance in a front-rear direction of the langmuir probe 6. The preset distance may be determined according to the anteroposterior length of the langmuir probe 6, for example, 10 mm. For the langmuir probe 6, the side on which the tungsten wire is disposed to receive the irradiation of the plasma 2 is the front, i.e., the left side shown in fig. 2 is the front.
The temperature measuring instrument is connected with the first thermocouple and the second thermocouple through a lead and is used for displaying the Langmuir probe 6 surface temperature data measured by the thermocouples in real time. The surface temperature of the langmuir probe 6 was used to generate the test results. . The thermometer may be further connected to a computer, and data of the surface temperature of the langmuir probe 6 measured by the thermocouple may be input to the computer, so that the computer performs data analysis.
The water cooling module 5 is closely attached to the langmuir probe 6, and it is necessary to ensure good thermal conductivity between the water cooling module 5 and the langmuir probe 6. The langmuir probe 6 is connected to the water-cooled module 5 by high-temperature diffusion welding, and may be connected by other means such as brazing. The water cooled module 5 should ensure that it does not melt during the experiment, and the material may be selected from copper, or other metals with a melting point above 1000 degrees celsius.
Circulating water system 10 leads to water piping connection water-cooling module 5, and circulating water system 10 is used for cooling off water-cooling module 5, and then utilizes the circulating water to derive the heat of Langmuir probe 6 fast. The diameter of the water pipe may be determined according to the size of the water cooling module 5 and the cooling rate to be achieved, for example, 9 mm to 10 mm. The temperature of the circulating water in the circulating water system 10 can be determined according to the cooling rate required by the water cooling module 5, for example, 22 ℃.
The tungsten baffle 4 is provided with a through hole which is circular, and the diameter of the through hole is larger than or equal to the diameter of the front end of the Langmuir probe 6. The langmuir probe 6 may be cylindrical as a whole, or may be cylindrical as a main body and truncated-cone-shaped at the tip, and in this case, the diameter of the tip of the langmuir probe 6 is the minimum diameter of the truncated cone. The diameter of the through hole is determined according to the diameter of the tip of the langmuir probe 6, for example, 8 mm.
The tungsten shutter 4 is disposed in front of the langmuir probe 6, and the langmuir probe 6 is fitted into the through hole. The through hole on the baffle is flush with the head part of the Langmuir probe 6, so that the plasma beam directly bombards the head part of the Langmuir probe 6, and the tungsten baffle 4 is used for blocking and insulating heat at other places, so that heat is transmitted along the needle body channel;
the electrical property testing assembly includes an insulation tester.
The langmuir probe 6 comprises a tungsten filament, an intermediate insulating layer, which may be an intermediate ceramic layer or other high temperature resistant insulator layer, and a tungsten heat shield, which is exemplified in the present embodiment.
The qualified langmuir probe 6 needs to maintain good insulation performance at high temperature, so that a certain voltage needs to be applied to the langmuir probe 6 through an insulation tester to test whether the resistance of the langmuir probe 6 can reach the level of M Ω in the bombardment process of the plasma 2.
The tungsten filament has a diameter of no more than 3 mm, e.g., 3 mm, 2 mm, 1 mm, 0.1 mm, etc., is disposed within the tungsten heat shield, and an intermediate insulating layer is disposed between the tungsten filament and the tungsten heat shield, the intermediate insulating layer insulating the tungsten filament and the tungsten heat shield from each other. The langmuir probe 6 consists of an inner tungsten rod, an intermediate ceramic layer and an outer tungsten heat shield by brazing.
The two poles of the insulation tester are respectively connected with the tungsten filament and the tungsten heat shield, for example, the anode of the insulation tester is connected with the tungsten filament, and the cathode of the insulation tester is connected with the tungsten heat shield.
As shown in fig. 3, the present embodiment provides a method for processing test data, which uses the test apparatus in the embodiments shown in fig. 3 to test the langmuir probe, and includes:
301. acquiring a first position of a first thermocouple and a second position of a second thermocouple;
the test data processing device acquires a first position of a first thermocouple and a second position of a second thermocouple, which are input by a tester, through input equipment; alternatively, the test data processing device reads the first position of the first thermocouple and the second position of the second thermocouple input by the measuring device.
It should be noted that when the number of the thermocouples is greater than 2, position information of other thermocouples may also be obtained, and the position information of other thermocouples is also used as a measurement parameter, and this embodiment takes two thermocouples as an example for description.
302. Acquiring a first temperature of a first position and a second temperature of a second position;
the test data processing device acquires a first temperature and a second temperature input by a tester through input equipment; or the test data processing device reads the first temperature and the second temperature input by the temperature measuring instrument.
303. Acquiring a temperature distribution model of the Langmuir probe;
the test data processing device obtains the temperature distribution model input by the tester through the input equipment. The temperature distribution model was used to simulate the temperature variation and temperature distribution of the langmuir probe in the plasma environment.
The temperature distribution model is generated using simulation software, such as ANSYS, based on the size and material of the langmuir probe.
304. Acquiring boundary parameters of a temperature distribution model;
the boundary parameters comprise plasma heat flow of the Langmuir probe and convection heat exchange between the water cooling module and the circulating water system. The plasma heat flow is determined according to the power of the plasma emission source.
305. Inputting the boundary parameters into a temperature distribution model;
and inputting the set boundary parameters into the temperature distribution model, and starting the simulation operation of the temperature distribution model. There is no timing relationship between steps 301 to 302 and steps 303 to 305, and the timing relationship is not particularly limited.
306. Determining a third location in the temperature distribution model representing the first location;
and determining a third position representing the first position in the temperature distribution model according to the corresponding relation between the temperature distribution model and the Langmuir probe.
307. Determining a fourth location in the temperature distribution model representing the second location;
and determining a third position representing the first position in the temperature distribution model according to the corresponding relation between the temperature distribution model and the Langmuir probe. Step 306 and step 307 have no timing relationship, and are not limited.
308. Acquiring a third temperature of a third position and a fourth temperature of a fourth position in the temperature distribution model;
and after the simulation operation of the temperature distribution model is finished, reading a third temperature of the third position and a fourth temperature of the fourth position.
309. Judging whether the absolute value of the difference value of the third temperature and the first temperature is smaller than a first preset value or not;
and comparing the first temperature with the third temperature, and judging whether the absolute value of the difference value between the third temperature and the first temperature is smaller than a first preset value.
310. Judging whether the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value or not;
and comparing the second temperature with the fourth temperature, and judging whether the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value. Step 309 and step 310 have no timing relationship, and are not limited in particular.
311. If the temperature is smaller than the first preset value and smaller than the second preset value, acquiring the temperature gradient of the Langmuir probe surface and the highest temperature of the Langmuir probe surface output by the temperature distribution model;
and when the absolute value of the difference value between the third temperature and the first temperature is smaller than a first preset value and the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value, the boundary parameter is consistent with the actual boundary parameter or basically consistent with the actual boundary parameter. And acquiring the temperature gradient of the surface of the Langmuir probe and the highest temperature of the surface of the Langmuir probe output by the temperature distribution model, and generating a test result of the Langmuir probe.
312. And if the boundary parameter is not less than the first preset value or not less than the second preset value, updating the boundary parameter, and then executing the step of inputting the boundary parameter into the temperature distribution model.
And when one of the two conditions is not met or both of the two conditions are not met, the boundary parameter is not consistent with the actual boundary parameter. And (4) determining the boundary parameters again, inputting the updated boundary parameters into the temperature distribution model, and performing simulation operation on the temperature distribution model again. The update may be multiple times until the boundary parameters match or substantially match the actual.
As shown in fig. 4, the present embodiment provides a method for processing test data, which uses the test apparatus in the embodiments shown in fig. 4 to test the langmuir probe, and includes:
401. acquiring a measurement parameter;
the test data processing device acquires a first position of a first thermocouple and a second position of a second thermocouple, which are input by a tester, through input equipment; alternatively, the test data processing device reads the first position of the first thermocouple and the second position of the second thermocouple input by the measuring device.
The test data processing device acquires a first temperature and a second temperature input by a tester through input equipment; or the test data processing device reads the first temperature and the second temperature input by the temperature measuring instrument.
The test data processing device acquires the circulating water temperature of the circulating water system input by a tester through input equipment; alternatively, the test data processing means reads the circulating water temperature input by the measuring means.
The measured parameters include a first temperature, a second temperature, a circulating water temperature, a first position of the first thermocouple, and a second position of the second thermocouple.
402. Acquiring a temperature distribution model of the Langmuir probe;
403. acquiring boundary parameters of a temperature distribution model;
404. inputting the boundary parameters into a temperature distribution model;
405. Judging whether the boundary parameters are reasonable or not according to the measurement parameters;
and determining a third position representing the first position in the temperature distribution model according to the corresponding relation between the temperature distribution model and the Langmuir probe. And determining a third position representing the first position in the temperature distribution model according to the corresponding relation between the temperature distribution model and the Langmuir probe. And after the simulation operation of the temperature distribution model is finished, reading a third temperature of the third position and a fourth temperature of the fourth position.
And comparing the first temperature with the third temperature, and judging whether the absolute value of the difference value between the third temperature and the first temperature is smaller than a first preset value.
And comparing the second temperature with the fourth temperature, and judging whether the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value.
If the boundary parameter is smaller than the first preset value and smaller than the second preset value, the boundary parameter is reasonable; otherwise the boundary parameters are not reasonable.
The first and second preset values may be determined according to the accuracy of the test, and may be, for example, 10%, 5%, 2%, 1%, etc. of the first and second temperatures.
406. If the boundary parameter is not reasonable, updating the boundary parameter, and then executing the step of inputting the boundary parameter into the temperature distribution model;
and when one of the two conditions is not met or both of the two conditions are not met, the boundary parameter is not consistent with the actual boundary parameter. And (4) determining the boundary parameters again, inputting the updated boundary parameters into the temperature distribution model, and performing simulation operation on the temperature distribution model again. The update may be multiple times until the boundary parameters match or substantially match the actual.
407. If the boundary parameters are reasonable, generating a test result of the Langmuir probe;
and when the absolute value of the difference value between the third temperature and the first temperature is smaller than a first preset value and the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value, the boundary parameter is consistent with the actual boundary parameter or basically consistent with the actual boundary parameter. And acquiring the temperature gradient of the surface of the Langmuir probe and the highest temperature of the surface of the Langmuir probe output by the temperature distribution model, and generating a test result of the Langmuir probe.
408. Performing thermal analysis to obtain the actual heat flux of the surface of the Dalangmuir probe;
and the test data processing device carries out thermal analysis according to the temperature gradient to obtain the actual heat flux of the plasma reaching the Langmuir probe.
409. Acquiring the resistance of the Langmuir probe acquired by the insulation tester;
the test data processing device acquires the resistance of the Langmuir probe input by a tester through input equipment; alternatively, the test data processing device reads the resistance of the langmuir probe input by the insulation tester.
410. Langmuir probe electrical performance was analyzed.
The test data processing device judges whether the resistance of the Langmuir probe is smaller than a preset resistance value. The predetermined resistance value is greater than or equal to 1 mega ohm. If the resistance value is smaller than the preset resistance value, the test data processing device determines that the Langmuir probe is unqualified, and informs a tester of the unqualified Langmuir probe information through an output device; and if the resistance value is not less than the preset resistance value, the test data processing device determines that the Langmuir probe is qualified, and informs the qualified Langmuir probe information to the tester through the output equipment.
As shown in fig. 5, an embodiment of the present application provides a test data processing apparatus for testing a langmuir probe using the test apparatus according to the first aspect, including:
a first obtaining unit 501, configured to obtain a first position of a first thermocouple and a second position of a second thermocouple;
a second acquiring unit 502 for acquiring a first temperature of the first location and a second temperature of the second location;
a third acquiring unit 503 configured to acquire a temperature distribution model of the langmuir probe;
a fourth obtaining unit 504, configured to obtain boundary parameters of the temperature distribution model, where the boundary parameters include a plasma heat flow of the langmuir probe and a convective heat transfer between the water cooling module and the circulating water system;
an input unit 505 for inputting the boundary parameter into the temperature distribution model;
a first determining unit 506 for determining a third position representing the first position in the temperature distribution model;
a second determining unit 507 for determining a fourth location representing the second location in the temperature distribution model;
a fifth obtaining unit 508, configured to obtain a third temperature at a third position and a fourth temperature at a fourth position in the temperature distribution model;
a first judging unit 509, configured to judge whether an absolute value of a difference between the third temperature and the first temperature is smaller than a first preset value;
a second determining unit 510, configured to determine whether an absolute value of a difference between the fourth temperature and the second temperature is smaller than a second preset value;
a sixth acquiring unit 511, configured to acquire the temperature gradient of the surface of the langmuir probe and the maximum temperature of the surface of the langmuir probe output by the temperature distribution model when the first determining unit 509 determines that the temperature is smaller than the first preset value and the second determining unit determines that the temperature 510 is smaller than the second preset value;
an updating unit 512, configured to update the boundary parameter when the first determining unit 509 determines that the boundary parameter is not less than the first preset value or the second determining unit determines that the boundary parameter is not less than the second preset value 510, and then perform a step of inputting the boundary parameter into the temperature distribution model.
As shown in fig. 6, an embodiment of the present application provides a test data processing apparatus for testing a langmuir probe using the test apparatus according to the first aspect, including:
a first acquiring unit 601 configured to acquire a first position of a first thermocouple and a second position of a second thermocouple;
a second acquiring unit 602, configured to acquire a first temperature at the first location and a second temperature at the second location;
a third acquiring unit 603 for acquiring a temperature distribution model of the langmuir probe;
a fourth obtaining unit 604, configured to obtain boundary parameters of the temperature distribution model, where the boundary parameters include a plasma heat flow of the langmuir probe and a convective heat transfer between the water cooling module and the circulating water system;
an input unit 605 for inputting the boundary parameter into the temperature distribution model;
a first determining unit 606 for determining a third position representing the first position in the temperature distribution model;
a second determination unit 607 for determining a fourth location representing the second location in the temperature distribution model;
a fifth obtaining unit 608, configured to obtain a third temperature at a third position and a fourth temperature at a fourth position in the temperature distribution model;
a first judging unit 609, configured to judge whether an absolute value of a difference between the third temperature and the first temperature is smaller than a first preset value;
a second judging unit 610, configured to judge whether an absolute value of a difference between the fourth temperature and the second temperature is smaller than a second preset value;
a sixth acquiring unit 611, configured to acquire the temperature gradient of the surface of the langmuir probe and the maximum temperature of the surface of the langmuir probe output by the temperature distribution model when the first determining unit determines 609 is smaller than the first preset value and the second determining unit determines 610 is smaller than the second preset value;
an updating unit 612, configured to update the boundary parameter when the first determining unit determines 609 is not smaller than the first preset value or the second determining unit determines 611 is not smaller than the second preset value, and then perform the step of inputting the boundary parameter into the temperature distribution model.
In an implementation manner of the third aspect of the embodiment of the present application, the fourth obtaining unit 604 is specifically configured to: acquiring the circulating water temperature of a circulating water system; acquiring the contact area between the water cooling module and the water pipe; and obtaining the convective heat transfer between the water cooling module and the circulating water system according to the temperature and the contact area of the circulating water.
In an implementation manner of the third aspect of the embodiment of the present application, the test data processing apparatus further includes:
a seventh acquiring unit 613, configured to acquire the resistance of the langmuir probe acquired by the insulation tester;
a third determining unit 614, configured to determine whether the resistance of the langmuir probe is smaller than a preset resistance value;
a third determining unit 615, configured to determine that the langmuir probe is not qualified when the third determining unit 614 determines that the resistance value is smaller than the preset resistance value;
a fourth determining unit 616, configured to determine that the langmuir probe is qualified when the third determining unit 614 determines that the resistance value is not less than the preset resistance value.
As shown in fig. 7, an embodiment of the present application provides a test data processing apparatus 700, including:
a central processing unit 701, a memory 705, an input/output interface 704, a wired or wireless network interface 703 and a power supply 702;
the central processor 701 is configured to communicate with the memory 705 and execute the operations of the instructions in the memory 705 to perform the methods of the embodiments shown in fig. 3-4.
The embodiment of the present application provides a computer-readable storage medium, which includes instructions, when the instructions are executed on a computer, the instructions cause the computer to execute the method of the embodiment shown in fig. 3 to 4.
The embodiments of the present application provide a computer program product containing instructions, which when run on a computer, cause the computer to execute the method of the embodiments shown in fig. 3 to 4.
The embodiment of the present application provides a chip system, where the chip system includes at least one processor and a communication interface, where the communication interface and the at least one processor are interconnected by a line, and the at least one processor is configured to execute a computer program or instructions to perform the method according to the embodiment shown in fig. 3 to 4.
As shown in fig. 8 to 10, in order to better explain the effects of the embodiments of the present application, an experiment of the embodiments of the present application is given below.
801. Testing by using a testing device;
in the testing apparatus as shown in fig. 2, the plasma emission source is turned on, and 20min plasma irradiation is performed on the langmuir probe, so as to obtain a first temperature of the langmuir probe of 524 ℃, a second temperature of the langmuir probe of 183 ℃, and a significant temperature gradient difference is formed;
802. acquiring a temperature distribution model;
and establishing a temperature distribution model of the Langmuir probe by using ANSYS 2019r2 software, and modeling the Langmuir probe and the water cooling module.
803. Using a test data processing device to process data;
and obtaining the plasma heat flow of the Langmuir probe and the convection heat exchange between the water cooling module and the circulating water system. The convective heat exchange between the water cooling module and the circulating water system refers to the convective heat exchange of the inner wall surface of a cooling pipeline of the water cooling module, and the convective heat exchange between the water cooling module and the circulating water system is related to the temperature of circulating water. Thermal analysis was performed after obtaining the temperature gradient at the surface of the langmuir probe, thus obtaining the input temperature at which the plasma reached the surface of the langmuir probe, and the specific heat flux at which the plasma reached the langmuir probe.
As can be seen from fig. 9, when the plasma heat flow on the upper surface of the langmuir probe is 7MW/m2, the convective heat transfer of the inner wall surface of the cooling pipe of the water-cooling module is 40000W/m2K, the circulating water temperature is 22 ℃, the simulated front and rear thermocouple temperatures are 521 ℃ and 184 ℃, respectively, which are relatively consistent with the actually measured temperature, and it is proved that the boundary condition is relatively consistent with the actual situation. Further, the maximum temperature of the Langmuir probe surface is 1039 ℃, and the magnetic field and electric field parameters set by the plasma system meet the environment temperature of the simulated thermal fusion experiment.
For the description of fig. 9, Heat Flux is the langmuir probe upper surface plasma Heat Flux; the Convection is the Convection heat transfer of the inner wall surface of the cooling pipeline of the water cooling module; tmax is the maximum temperature of the langmuir probe; T.A is the third temperature; T.B is the fourth temperature; detaT is the difference between the third temperature and the fourth temperature; the third position was 8 mm from the tip of the langmuir probe, the fourth position was 21 mm from the tip of the langmuir probe, and the third and fourth positions were both on the side of the langmuir probe away from the water-cooling module.
Further, fig. 10 is a thermal analysis langmuir probe surface temperature profile, showing that the two thermocouple temperature differences are 337 ℃ in the graph, resulting in a significant temperature gradient difference, illustrating that the langmuir probe is well internally connected to form a heat transfer channel.
In the description of FIG. 10, the Langmuir probe shown in FIG. 9 has a heat flux of 7MW/m in the upper surface plasma2The convection heat transfer of the inner wall surface of the cooling pipeline of the water cooling module is 40000W/m2℃。
Can the real-time supervision plasma environment through testing arrangement, Langmuir probe thermal behavior and electrical property's the change condition, verify through thermal analysis whether Langmuir probe's quality is qualified, here simultaneously, can obtain the specific heat flux that plasma reachd the Langmuir probe, verify in return that plasma's magnetic field and electric field set up the parameter and whether satisfy simulation Langmuir probe actual service condition.
804. Electrical performance testing was performed.
Under the plasma environment tested by the voltage-resistant insulation tester, the resistance of the probe is kept above M omega, which shows that the ceramic inside the probe is complete and can keep better insulation performance. The results prove that the Langmuir probe can meet the test requirements under the service condition and has qualified quality. The integrated plasma testing rack is built by the thermal performance testing component and the electrical performance testing component, so that the change condition of the surface temperature of the Langmuir probe in the plasma environment and the insulation performance can be monitored in real time.
The above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.
Claims (10)
1. A test apparatus for testing a langmuir probe, comprising: the temperature measuring device comprises a temperature measuring instrument and a plurality of thermocouples, wherein the thermocouples comprise a first thermocouple and a second thermocouple;
wherein the first thermocouple and the second thermocouple are configured to be disposed on a sidewall of the Langmuir probe, and a first position of the first thermocouple and a second position of the second thermocouple are spaced apart by a predetermined distance along an extension direction of the Langmuir probe;
the temperature measuring instrument is connected with the first thermocouple and the second thermocouple, and is used for collecting a first temperature of a first position and a second temperature of a second position, and the first temperature and the second temperature are used for generating a test result.
2. The testing device of claim 1, further comprising a water cooling module and a circulating water system;
the water-cooling module fixed connection the Langmuir probe, circulating water system leads to water piping connection the water-cooling module, circulating water system is used for cooling the water-cooling module.
3. The testing device of claim 1 or 2, further comprising a refractory metal baffle; the high melting point metal baffle is provided with a through hole, the diameter of the through hole is larger than or equal to that of the front end of the Langmuir probe, and the front end of the Langmuir probe is matched with the through hole; the high-melting-point metal wire is made of metal with a melting point higher than a preset melting point.
4. The testing device of claim 3, further comprising a plasma emission source, a plasma chamber, a fixed support, an insulating base, and a moving rail;
the plasma emission source is used for emitting plasma into the plasma cavity and emitting the plasma to the Langmuir probe;
the high melting point metal baffle, the Langmuir probe, the fixed support, the insulating base, and the moving rail are disposed within a plasma chamber; the insulation base is arranged on the moving track, the fixed support is arranged on the insulation base, the Langmuir probe is arranged on the fixed support, and the fixed support is used for adjusting the Langmuir probe to be consistent with the horizontal height of a plasma emission source.
5. The testing device of claim 4, wherein the plasma chamber is provided with a visible glass window, and the moving track is used for adjusting the Langmuir probe to an observation region of the visible glass window.
6. The test device of claim 1, 2, 4, or 5, further comprising an insulation tester;
the Langmuir probe comprises a high-melting-point metal wire, an intermediate insulating layer and a high-melting-point metal heat shield, wherein the high-melting-point metal wire is arranged in the high-melting-point metal heat shield, the intermediate insulating layer is arranged between the high-melting-point metal wire and the high-melting-point metal heat shield, the intermediate insulating layer enables the high-melting-point metal wire and the high-melting-point metal heat shield to be mutually insulated, and two poles of the insulation tester are respectively connected with the high-melting-point metal wire and the high-melting-point metal heat shield; the high-melting-point metal baffle and the high-melting-point metal heat shield are made of metal with a melting point higher than a preset melting point.
7. The test device of claim 1, 2, 4 or 5, further comprising a communication interface;
the temperature measurer sends the first temperature and the second temperature of the Langmuir probe to a test data processing device through the communication interface, so that the test data processing device obtains the temperature gradient of the Langmuir probe surface and the maximum temperature of the Langmuir probe surface according to the first temperature and the second temperature.
8. A test data processing method for testing the langmuir probe using the test apparatus as claimed in any one of claims 1 to 6, comprising:
acquiring a first position of the first thermocouple and a second position of the second thermocouple;
acquiring a first temperature of a first position and a second temperature of a second position;
acquiring a temperature distribution model of the Langmuir probe;
acquiring boundary parameters of the temperature distribution model, wherein the boundary parameters comprise plasma heat flow of the Langmuir probe and convection heat exchange between the water cooling module and a circulating water system;
inputting the boundary parameters into a temperature distribution model;
determining a third location in the temperature distribution model representing the first location;
determining a fourth location in the temperature distribution model representing the second location;
acquiring a third temperature of a third position and a fourth temperature of a fourth position in the temperature distribution model;
judging whether the absolute value of the difference value of the third temperature and the first temperature is smaller than a first preset value or not;
judging whether the absolute value of the difference value between the fourth temperature and the second temperature is smaller than a second preset value or not;
if the temperature is smaller than the first preset value and smaller than the second preset value, acquiring the temperature gradient of the Langmuir probe surface and the highest temperature of the Langmuir probe surface output by the temperature distribution model;
and if the boundary parameter is not less than the first preset value or not less than the second preset value, updating the boundary parameter, and then executing the step of inputting the boundary parameter into the temperature distribution model.
9. The method of claim 8, wherein the obtaining boundary parameters of the temperature distribution model comprises:
acquiring the circulating water temperature of the circulating water system;
acquiring the contact area between the water cooling module and the water pipe;
and obtaining the convection heat exchange between the water cooling module and a circulating water system according to the temperature of the circulating water and the contact area.
10. The method of test data processing according to claim 8, the method further comprising:
acquiring the resistance of the Langmuir probe acquired by the insulation tester;
judging whether the resistance of the Langmuir probe is smaller than a preset resistance value or not;
if the resistance value is smaller than the preset resistance value, determining that the Langmuir probe is unqualified;
and if the resistance value is not less than the preset resistance value, determining that the Langmuir probe is qualified.
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