CN114323478A - Method for detecting high-vacuum sealing performance of indium-silver alloy - Google Patents
Method for detecting high-vacuum sealing performance of indium-silver alloy Download PDFInfo
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- CN114323478A CN114323478A CN202111480008.9A CN202111480008A CN114323478A CN 114323478 A CN114323478 A CN 114323478A CN 202111480008 A CN202111480008 A CN 202111480008A CN 114323478 A CN114323478 A CN 114323478A
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- 238000007789 sealing Methods 0.000 title claims abstract description 148
- 229910001316 Ag alloy Inorganic materials 0.000 title claims abstract description 111
- YZASAXHKAQYPEH-UHFFFAOYSA-N indium silver Chemical compound [Ag].[In] YZASAXHKAQYPEH-UHFFFAOYSA-N 0.000 title claims abstract description 111
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000004088 simulation Methods 0.000 claims abstract description 35
- 238000001514 detection method Methods 0.000 claims abstract description 23
- 238000005086 pumping Methods 0.000 claims abstract description 15
- 239000001307 helium Substances 0.000 claims abstract description 12
- 229910052734 helium Inorganic materials 0.000 claims abstract description 12
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000007789 gas Substances 0.000 claims abstract description 9
- 230000007613 environmental effect Effects 0.000 claims abstract description 8
- 238000001125 extrusion Methods 0.000 claims description 19
- 238000004519 manufacturing process Methods 0.000 claims description 13
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 7
- 238000001819 mass spectrum Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 238000005538 encapsulation Methods 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 238000005219 brazing Methods 0.000 description 3
- 229910000846 In alloy Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000003754 machining Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 239000003566 sealing material Substances 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
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Abstract
The application relates to the technical field of space vacuum sealing, in particular to a method for detecting high vacuum sealing performance of indium-silver alloy, which comprises the following steps: step 1: extracting an indium-silver alloy sealing product sample; step 2: extruding and sealing a sample of the indium-silver alloy sealing product to simulate the working condition of the sealing product; and step 3: simulating the actual environmental conditions of the indium-silver alloy sealed sample by an environmental condition simulation system; and 4, step 4: connecting the indium-silver alloy sealed sample with a vacuum pumping system through a quick gas circuit joint, and pumping to the background; and 5: and opening the vacuum stop valve, and completing the detection of the leakage rate of the indium-silver alloy sealing product sample by using a helium mass spectrometer leak detector to obtain the leakage rate of the indium-silver alloy high-vacuum sealing product. The method and the device can simulate various space environments experienced by the indium-silver alloy sealing product, and detect the leakage rate of the indium-silver alloy sealing product.
Description
Technical Field
The application relates to the technical field of space vacuum sealing, in particular to a method for detecting high vacuum sealing performance of indium-silver alloy.
Background
The main task of the lunar exploration triple-stage project in China is to realize unmanned sampling return of the lunar surface, break through lunar surface sampling, drilling sampling and a lunar sample encapsulation technology, wherein the lunar sample encapsulation technology is to seal the collected lunar sample in a high vacuum environment by adopting soft metal indium-silver alloy, then bring the lunar sample to the earth as it is, and then carry out analytical research on the lunar sample, wherein the low leakage rate and high vacuum sealing performance is a key technology for preventing the lunar sample from being polluted by the atmospheric environment and ensuring the accuracy of the lunar sample data analysis on the ground.
The sealing product applied to the moon packaging technology is a disposable product, the sealing performance of the product cannot be detected on the ground or on the sky, and the product belongs to an untestable item.
In the ground emission stage, the moon sample is not collected yet in the indium-silver alloy sealing product, and extrusion sealing is not carried out yet, so that the detection of the sealing performance is not needed in the ground emission stage; in the flight phase, the indium-silver alloy sealing product extrudes and seals a moon sample, but the leakage rate of the indium-silver alloy sealing product cannot be detected due to an unmanned state and a high vacuum environment; in the stage of returning to the ground, the high vacuum sealing performance of the indium-silver alloy can be detected by adopting a bubble method or other methods, but the leakage is only qualitatively judged, and the leakage rate of the product cannot be quantitatively detected.
Disclosure of Invention
The method for detecting the high-vacuum sealing performance of the indium-silver alloy can simulate various space environments experienced by indium-silver alloy sealing products and detect the leakage rate of the indium-silver alloy sealing products.
In order to achieve the above object, the present application provides a method for detecting high vacuum sealing performance of an indium-silver alloy, comprising the following steps: step 1: manufacturing the indium-silver alloy sealing product according to the production process of the indium-silver alloy sealing product, and extracting an indium-silver alloy sealing product sample from the indium-silver alloy sealing product; step 2: performing extrusion sealing on a sample of the indium-silver alloy sealing product through an extrusion sealing tool and an extrusion sealing system, and simulating the working condition of the sealing product; and step 3: simulating the actual environmental conditions of the indium-silver alloy sealed sample by an environmental condition simulation system; and 4, step 4: connecting the indium-silver alloy sealed sample with a vacuum pumping system through a quick gas circuit joint, and pumping to the background; and 5: and opening the vacuum stop valve, and completing the detection of the leakage rate of the indium-silver alloy sealing product sample by using a helium mass spectrometer leak detector to obtain the leakage rate of the indium-silver alloy high-vacuum sealing product.
Further, the indium-silver alloy sealing product sample is a product sample extracted from the same batch of indium-silver alloy sealing products.
Further, the indium-silver alloy sealing product comprises a sealing cover body, an indium-silver alloy and a sealing cylinder body.
Further, in step 3, the environment condition simulation system includes a high temperature environment simulation system, a low temperature environment simulation system, a high and low temperature impact environment simulation system, and a normal temperature environment simulation system.
The method for detecting the high vacuum sealing performance of the indium-silver alloy provided by the invention has the following beneficial effects:
this application is through the product spot check of same batch, the leak rate of simulation product operating mode and detection extraction sample, the leak rate of the sealed product of detection indium silver alloy that can be quantitative, the problem that the sealed product leak rate of sealed product production uniformity of indium silver alloy and indium silver alloy can't be examined on the product body has been solved, realized under various different operating modes, the detection to indium silver alloy high vacuum sealing performance, furthermore, the production technology route of the sealed product of indium silver alloy high vacuum has still been formulated, the uniformity of the sealed product of indium silver alloy high vacuum has been guaranteed.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, serve to provide a further understanding of the application and to enable other features, objects, and advantages of the application to be more apparent. The drawings and their description illustrate the embodiments of the invention and do not limit it. In the drawings:
FIG. 1 is a schematic diagram of a method for detecting high vacuum sealing performance of an indium-silver alloy according to an embodiment of the present application;
FIG. 2 is a schematic diagram of an indium-silver alloy sealing product according to an embodiment of the present disclosure;
in the figure: the device comprises a 1-indium-silver alloy sealed product sample, a 2-extrusion sealing tool, a 3-extrusion sealing system, a 4-high temperature environment simulation system, a 5-low temperature environment simulation system, a 6-high and low temperature impact environment simulation system, a 7-normal temperature environment simulation system, an 8-quick gas circuit connector, a 9-vacuum pumping system, a 10-vacuum stop valve, a 11-helium mass spectrometer leak detector, a 12-sealed cover body, a 13-silver-indium alloy and a 14-sealed cylinder.
Detailed Description
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
As shown in fig. 1, the present application provides a method for detecting high vacuum sealing performance of an indium-silver alloy, comprising the following steps: step 1: manufacturing an indium-silver alloy sealing product according to the production process of the indium-silver alloy sealing product, and extracting an indium-silver alloy sealing product sample 1 from the indium-silver alloy sealing product; step 2: performing extrusion sealing on a sample of the indium-silver alloy sealing product through an extrusion sealing tool 2 and an extrusion sealing system 3, and simulating the working condition of the sealing product; and step 3: simulating the actual environmental conditions of the indium-silver alloy sealed sample by an environmental condition simulation system; and 4, step 4: connecting the indium-silver alloy sealed sample with a vacuum pumping system 9 through a quick gas circuit joint 8, and pumping to the background; and 5: and opening the vacuum stop valve 10, and completing the detection of the leakage rate of the indium-silver alloy sealing product sample 1 by using a helium mass spectrometer leak detector 11 to obtain the leakage rate of the indium-silver alloy high-vacuum sealing product.
Specifically, the method for detecting the high-vacuum sealing performance of the indium-silver alloy is mainly used for detecting the leakage rate of a sealing product applied to a moon encapsulation technology, so that the sealing performance of the sealing product is ensured. The existing sealing product for the moon encapsulation technology belongs to a disposable product, namely, if a sealing knife edge enters into a density material indium-silver alloy, the sealing product cannot recover, the sealing product is not extruded and sealed in an aircraft launching phase and a flight phase, only in a moon surface working phase, after a moon sample is collected, the extrusion sealing of the sealing product is carried out, the sealing leak detection cannot be carried out after the earth is returned, the sealing product is in a vacuum state, the outside is an atmospheric environment, and therefore the leak detection cannot be carried out on the body in the whole life cycle of the sealing product. The indium-silver alloy high-vacuum sealing performance detection method provided by the embodiment of the application can realize quantitative obtaining of the leakage rate of the indium-silver alloy sealing product in place through sampling and detecting the same batch of products, simulating the working condition of the products and detecting the leakage rate of the extracted samples, wherein the extrusion sealing tool 2 is mainly used for arranging a tool clamp of the indium-silver alloy sealing product sample 1; the extrusion sealing system 3 consists of a program control system and an extrusion device, and the extrusion of the indium-silver alloy sealing product sample 1 is completed through program control, so that the sealing performance of the indium-silver alloy sealing product is kept basically consistent, and the accuracy of sealing performance detection is ensured; the environment working condition simulation system is mainly used for simulating the actual working condition of the indium-silver alloy sealing product; the quick gas circuit joint 8 is mainly used for quickly connecting the indium-silver alloy sealed product sample 1 with a vacuum pumping system 9; the vacuum pumping system 9 is mainly used for rapidly pumping the sealed cavity and the pipeline into a high vacuum state; the vacuum stop valve 10 is mainly used for cutting off and opening a gas path between the sealing cavity and the helium mass spectrometer leak detector 11; the helium mass spectrometer leak detector 11 is mainly used for measuring the leak rate of a sealed cavity, and finally, the sealing performance of the indium-silver alloy sealed product is judged according to the obtained leak rate of the indium-silver alloy sealed product.
Further, the indium-silver alloy sealing product sample 1 is a product sample extracted from the same batch of indium-silver alloy sealing products. Indium silver alloy seal product sample 1 was selected from the same batch of indium silver alloy seal products, with identical structure and geometry.
Further, as shown in fig. 2, the indium-silver alloy sealing product includes a sealing cap body 12, an indium-silver alloy 13, and a sealing cylinder body 14. The indium-silver alloy 13 is arranged in a sealing groove of the sealing cover body 12, the sealing cover body 12 is arranged on the sealing cylinder body 14, wherein the indium-silver alloy 13 is used as a main sealing material, and the indium-silver alloy 13 is prepared according to actual conditions during production and processing, then is smelted and cast, and finally is extruded and molded; the surface treatment is firstly carried out on the sealing cover body 12 in the production and processing process, then the sealing cover body and the formed silver-indium alloy 13 are subjected to vacuum brazing, in order to ensure the reliability of the indium-silver alloy vacuum brazing in the sealing groove of the cover body, a layer of silver is plated on the surface of the sealing groove of the cover body, then the sealing material indium-silver alloy is subjected to vacuum brazing in the sealing groove, and then the treatment of the sealing surface is carried out; the surface treatment is also carried out on the sealing cylinder 14 in the production and processing process, then the knife edge finish machining is carried out, the knife edge is subjected to finish machining by adopting a slow wire feeding processing technology, the roughness of the knife edge reaches Ra0.4, the consistency and the tightness of the knife edge processing are ensured, then the sealing cylinder 14 is subjected to gold plating, and finally the sealing cylinder 14 and the sealing cover body 12 are combined together to be processed into the indium-silver alloy sealing product.
Further, in step 3, the environment condition simulation system includes a high temperature environment simulation system 4, a low temperature environment simulation system 5, a high and low temperature impact environment simulation system 6, and a normal temperature environment simulation system 7. And after the indium-silver alloy sealing product is extruded, carrying out leakage rate detection according to the spatial environment sequence of the aircraft in the flying process, and verifying the sealing performance of the indium-silver alloy sealing product in the whole flying task. After the moon sample is encapsulated by the indium-silver alloy sealing product, the moon sample is subjected to temperature environments such as lunar surface high temperature, low temperature, high and low temperature impact and the like; after reaching the ground, the ground is subjected to a normal temperature environment. Therefore, the test sequence for detecting the leakage rate of the indium-silver alloy sealing product is as follows: high-temperature sealing performance detection, low-temperature sealing performance detection, high-low-temperature impact sealing performance detection and normal-temperature sealing performance detection. In addition, when the aircraft returns to the atmospheric layer, the indium-silver alloy sealing product can also experience vibration and other mechanical environments, and the environment working condition simulation system can be additionally provided with a vibration environment simulation system for detecting the sealing performance of the indium-silver alloy sealing product after the vibration test.
The following is a specific implementation manner of the embodiment of the present application, and the embodiment of the present application provides a method for detecting high vacuum sealing performance of an indium-silver alloy, including the following steps: step 1: manufacturing an indium-silver alloy sealing product according to the production process of the indium-silver alloy sealing product, and extracting an indium-silver alloy sealing product sample 1 from the indium-silver alloy sealing product; step 2: extruding and sealing the sample of the indium-silver alloy sealing product through an extrusion sealing tool 2 and an extrusion sealing system 3; and step 3: the high-temperature environment simulation system 4 is used for simulating the actual working conditions of the indium-silver alloy sealing sample, helium mass spectrum vacuum leak detection is completed, and the detection result is as follows: 5.0X 10-11Pa·m3S; and 4, step 4: carry out the operating condition simulation to the sealed sample of indium-silver alloy through low temperature environment simulation system 5 to accomplish helium mass spectrum vacuum leak hunting through quick gas circuit joint 8, vacuum pumping system 9 and vacuum stop valve 10, the testing result is: 5.0X 10- 11Pa·m3S; and 5: carry out the operating condition simulation to the sealed sample of indium-silver alloy through high low temperature impact environment simulation system 6 to accomplish helium mass spectrum vacuum leak hunting through quick gas circuit joint 8, vacuum pumping system 9 and vacuum stop valve 10, the testing result is: 5.0X 10-11Pa·m3S; step 6: the method comprises the steps of simulating the actual working conditions of the indium-silver alloy sealed sample through a vibration environment simulation system, and performing simulation through a quick air path connector 8, a vacuum pumping system 9 and a vacuum pumpThe empty stop valve 10 completes helium mass spectrum vacuum leak detection, and the detection result is as follows: 5.0X 10-11Pa·m3S; and 7: and (3) performing helium mass spectrum vacuum leak detection on the indium-silver alloy sealed sample through a normal-temperature environment simulation system 7, wherein the detection result is as follows: 5.0X 10-11Pa·m3/s。
The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.
Claims (4)
1. The method for detecting the high vacuum sealing performance of the indium-silver alloy is characterized by comprising the following steps of:
step 1: manufacturing the indium-silver alloy sealing product according to the production process of the indium-silver alloy sealing product, and extracting an indium-silver alloy sealing product sample from the indium-silver alloy sealing product;
step 2: performing extrusion sealing on a sample of the indium-silver alloy sealing product through an extrusion sealing tool and an extrusion sealing system, and simulating the working condition of the sealing product;
and step 3: simulating the actual environmental conditions of the indium-silver alloy sealed sample by an environmental condition simulation system;
and 4, step 4: connecting the indium-silver alloy sealed sample with a vacuum pumping system through a quick gas circuit joint, and pumping to the background;
and 5: and opening the vacuum stop valve, and completing the detection of the leakage rate of the indium-silver alloy sealing product sample by using a helium mass spectrometer leak detector to obtain the leakage rate of the indium-silver alloy high-vacuum sealing product.
2. The method for detecting the high vacuum sealing performance of the indium-silver alloy as claimed in claim 1, wherein the indium-silver alloy sealing product samples are product samples extracted from the same batch of indium-silver alloy sealing products.
3. The method for detecting the high vacuum sealing performance of the indium-silver alloy as claimed in claim 2, wherein the indium-silver alloy sealing product comprises a sealing cover body, the indium-silver alloy and a sealing cylinder body.
4. The method for detecting the high vacuum sealing performance of the indium-silver alloy as claimed in claim 1, wherein in the step 3, the environment condition simulation system comprises a high temperature environment simulation system, a low temperature environment simulation system, a high and low temperature impact environment simulation system and a normal temperature environment simulation system.
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| CN202111480008.9A CN114323478A (en) | 2021-12-06 | 2021-12-06 | Method for detecting high-vacuum sealing performance of indium-silver alloy |
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| CN202111480008.9A CN114323478A (en) | 2021-12-06 | 2021-12-06 | Method for detecting high-vacuum sealing performance of indium-silver alloy |
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| CN202111480008.9A Pending CN114323478A (en) | 2021-12-06 | 2021-12-06 | Method for detecting high-vacuum sealing performance of indium-silver alloy |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109655212A (en) * | 2018-12-17 | 2019-04-19 | 兰州空间技术物理研究所 | A kind of extruding metal sealing device for detecting leak rate and method |
| CN112255005A (en) * | 2020-09-27 | 2021-01-22 | 中国科学院空间应用工程与技术中心 | Radial buckling metal sealing deep space sampling packaging device and leakage rate monitoring packaging system |
-
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- 2021-12-06 CN CN202111480008.9A patent/CN114323478A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109655212A (en) * | 2018-12-17 | 2019-04-19 | 兰州空间技术物理研究所 | A kind of extruding metal sealing device for detecting leak rate and method |
| CN112255005A (en) * | 2020-09-27 | 2021-01-22 | 中国科学院空间应用工程与技术中心 | Radial buckling metal sealing deep space sampling packaging device and leakage rate monitoring packaging system |
Non-Patent Citations (2)
| Title |
|---|
| 杜永刚 等: "一种新型深空探测样品封装技术", 《航天器工程》, vol. 23, no. 5, 31 October 2014 (2014-10-31) * |
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