CN114281217B - Method for coping with screen touch function failure - Google Patents
Method for coping with screen touch function failure Download PDFInfo
- Publication number
- CN114281217B CN114281217B CN202111670970.9A CN202111670970A CN114281217B CN 114281217 B CN114281217 B CN 114281217B CN 202111670970 A CN202111670970 A CN 202111670970A CN 114281217 B CN114281217 B CN 114281217B
- Authority
- CN
- China
- Prior art keywords
- voltage
- parasitic
- terminal
- screen panel
- vex
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Position Input By Displaying (AREA)
Abstract
The invention discloses a method for dealing with screen touch function failure, relates to the technical field of screen touch induction, and solves the technical problem that screen touch function failure is caused by interference of temperature change on an induction module in a screen. The main technical scheme of the invention is as follows: when the screen panel is touched, a coupling capacitor is correspondingly generated at the screen panel, and a pulse signal with fixed amplitude is input to the input end of the induction module to form a voltage Vex corresponding to the fixed amplitude; shielding the effect generated by the first parasitic capacitor by using active protection voltage; determining the output voltage of the induction module according to the coupling capacitor, the second parasitic capacitor and the voltage Vex with fixed amplitude; and outputting corresponding instruction data by the chip according to the output voltage of the induction module. The invention is mainly applied to ensure the full function of active protection voltage and achieve the aim of avoiding the induction module from being interfered.
Description
Technical Field
The invention relates to the technical field of screen touch induction, in particular to a method for dealing with screen touch function failure.
Background
Electronic equipment is all generally adopted capacitive touch screen (CTP) at present such as smart mobile phone, panel computer, along with the continuous maturity of screen technique, the screen size constantly promotes, the function constantly increases, the integration level constantly increases, then provides abundanter manifold touch function to the user, has promoted user operation and has experienced.
For a Touch and Display Driver Integration (TDDI) product, when a user touches a screen, a Sensing module (i.e., a Sensing module) inside the product senses a load condition, generates different data and transmits the data to the inside of a chip, and the chip makes a correct instruction accordingly, so that the screen displays a correct picture effect.
The connection between the product screen and the Sensing module is complex, parasitic resistance and parasitic capacitance exist, particularly the parasitic resistance is sensitive to the temperature change, for example, the change of the temperature of the product itself and the change of the environment temperature where the product is located (such as the change of the indoor and outdoor environment temperature and the change of the temperature of a hand in contact) can cause the resistance value to change along with the temperature change, so that the Sensing result of the Sensing module on the load condition can be influenced inevitably, interference is brought to the Sensing module, errors exist between the data generated by the Sensing module received in the chip and the actual condition, when the errors are too large to be ignored, the chip can be caused to give wrong instructions, and for a user, the touch control of the screen can be felt to be out of order, and the desired picture effect can not be obtained.
Disclosure of Invention
In view of this, the present invention provides a method for handling a failure of a touch function of a screen, and mainly aims to solve a technical problem of a failure of a touch function of a screen due to interference of temperature variation on a sensing module in the screen.
In order to achieve the above purpose, the present invention mainly provides the following technical solutions:
the application provides a method for dealing with screen touch function failure, which is applied to a circuit of a touch and display driving integrated product, wherein the circuit comprises a screen panel internal subassembly and an on-chip internal subassembly, the screen panel internal subassembly is connected with the on-chip internal subassembly, the screen panel internal subassembly at least comprises a plurality of first parasitic capacitances and parasitic resistances, the on-chip internal subassembly at least comprises a Sensing module, a second parasitic capacitance and a parasitic resistance, and the method comprises the following steps:
when the screen panel is touched, a coupling capacitor is correspondingly generated at the screen panel, and a pulse signal with fixed amplitude is input to the input end of the induction module to form a voltage Vex corresponding to the fixed amplitude;
shielding the effect generated by the first parasitic capacitor by using active protection voltage;
determining the output voltage of the induction module according to the coupling capacitor, the second parasitic capacitor and the voltage Vex with fixed amplitude;
and according to the output voltage of the induction module, the chip outputs corresponding instruction data.
In some variations of the present application, the active guard voltage comprises: the source terminal provided by the thin film transistor inputs a first voltage and the gate terminal inputs a second voltage, and the VCOM terminal inputs a third voltage, wherein the VCOM terminal, the source terminal provided by the thin film transistor and the gate terminal are respectively connected with first terminals of different first parasitic capacitors.
In some modified embodiments of the present application, the shielding, by an active shielding voltage, an effect caused by the first parasitic capacitance includes:
the source terminal is connected with a first terminal of the first parasitic capacitor, and a first voltage input by the source terminal is used for charging the first parasitic capacitor, wherein the first voltage and the voltage Vex with the fixed amplitude have the same voltage amplitude;
charging the first parasitic capacitor with a second voltage input from the gate terminal through the gate terminal being connected to the first end of the first parasitic capacitor, the second voltage having the same voltage magnitude as the fixed magnitude voltage Vex;
charging the first parasitic capacitor with a third voltage input from the VCOM terminal, the third voltage having the same voltage magnitude as the fixed magnitude voltage Vex, through the connection of the VCOM terminal to the first terminal of the first parasitic capacitor;
and controlling the voltage detected at the second end of the first parasitic capacitor to have the same voltage amplitude as the voltage Vex with the fixed amplitude.
In some modified embodiments of the present application, the controlling the voltage detected at the second end of the first parasitic capacitor to have the same voltage magnitude as the voltage Vex with a fixed magnitude includes:
by reducing the frequency of the voltage Vex with the fixed amplitude, the charging time of the VCOM terminal, the source terminal and the gate terminal to the first parasitic capacitor is respectively prolonged, so that the voltage detected at the second terminal of the first parasitic capacitor is the same voltage amplitude as the voltage Vex with the fixed amplitude.
In some variations of the present application, the determining the output voltage of the sensing module according to the coupling capacitance, the second parasitic capacitance, and the fixed magnitude voltage Vex includes:
and multiplying the voltage Vex with the fixed amplitude by the ratio of the coupling capacitor to the second parasitic capacitor to obtain the output voltage of the induction module.
In some modified embodiments of the present application, the outputting, by the chip, corresponding instruction data according to the output voltage of the sensing module includes:
according to a pulse signal with a fixed amplitude input to the input end of the Sensing module, acquiring an output signal of the output end of the Sensing module;
denoising the output signal to obtain a denoised signal;
and determining instruction data output by the chip according to the denoised signal.
In some modified embodiments of the present application, the denoising processing on the output signal to obtain a denoised signal includes:
according to a preset sampling multiple, increasing the sampling rate of the output signal to obtain a sampling signal;
and denoising the sampling signal by using a low-pass filter to obtain a denoised signal.
In some variations of the present application, the sensing module is a charge amplifier; the second parasitic capacitance is a feedback capacitance corresponding to the sensing module.
In some variations of the present application,
obtaining coupling capacitance correspondingly generated by touching the screen panel for each time through touching the screen panel for multiple times;
and determining the output voltage of the induction module, which is obtained correspondingly to the touch screen panel each time, according to different coupling capacitances.
In some modified embodiments of the present application, the sensitivity of the screen panel being touched is detected by using the output voltage of the sensing module obtained by each touch of the screen panel.
By the technical scheme, the technical scheme provided by the invention at least has the following advantages:
the invention provides a method for dealing with screen touch function failure, which is applied to a circuit of a touch and display driving integrated product. The effect generated by the first parasitic capacitor is shielded by using the active protection voltage, so that the active protection voltage is ensured to be fully effective at any time, and the sensing result of the sensing module on the load condition is not influenced even if the parasitic resistance value in the circuit is changed due to temperature change. Compared with the prior art, the method and the device solve the technical problem that the touch function of the screen is failed due to interference caused by temperature change on the sensing module in the screen, and can avoid the sensing module from being badly interfered, so that the sensing module normally works, the accuracy of data received inside the chip is ensured, the chip gives correct instructions, and the phenomenon that the touch function of the screen is failed when being used by a user is avoided.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a simplified circuit diagram of an exemplary touch and display driver integrated product in accordance with an embodiment of the invention;
FIG. 2 is a flowchart of a method for handling a touch malfunction of a screen according to an embodiment of the present invention;
FIG. 3 is a graph illustrating the variation trend of the source voltage, the gate voltage and the input voltage of the Sensing module due to the low frequency driving according to the embodiment of the present invention;
FIG. 4 is a flow chart of another method for handling a touch screen malfunction according to an embodiment of the present invention;
FIG. 5a is a schematic diagram illustrating an exemplary conventional sampling method according to an embodiment of the present invention;
FIG. 5b is a schematic diagram of an exemplary oversampling approach in accordance with an embodiment of the present invention;
FIG. 6a is a diagram illustrating a conventional sampled spectrum according to an embodiment of the present invention;
FIG. 6b is a schematic diagram of an oversampled spectrum of an embodiment of the present invention;
FIG. 7 is a simulation diagram illustrating a conventional sampling result according to an exemplary embodiment of the present invention;
fig. 8 is a simulation diagram of the double oversampling result according to the embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the invention are shown in the drawings, it should be understood that the invention can be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
The embodiment of the invention provides a method for dealing with screen Touch function failure, which is applied to a circuit of a Touch and Display Driver Integration (TDDI) product, wherein the circuit comprises a screen panel internal subassembly and an on-chip internal subassembly, the screen panel internal subassembly is connected with the on-chip internal subassembly, the screen panel internal subassembly at least comprises a plurality of first parasitic capacitors and parasitic resistors, and the on-chip subassembly at least comprises a Sensing module (hereinafter referred to as a Sensing module), a second parasitic capacitor and a parasitic resistor.
Exemplary, embodiments of the present invention exemplify a TDDI product circuit diagram, as shown in fig. 1, showing a connection structure of a screen panel and a Sensing module, including: the screen panel internal subassembly is connected with the chip internal subassembly; for the screen panel inner part assembly, a parasitic resistor 2 and a plurality of first parasitic capacitances 3 are included; for the intra-chip components, a parasitic resistance 2, a second parasitic capacitance 6, a Sensing block 4 and a position 5 connected to the Sensing block 4 are included.
It should be noted that, the embodiment of the present invention adopts the capacitive touch screen technology, and since a human body is equivalent to ground, when a user touches the surface of the screen panel, a coupling capacitor, such as the coupling capacitor 1 pointed by a finger shown in fig. 1, is formed between the user and the screen panel.
A method for dealing with a failure of a touch function of a screen according to an embodiment of the present invention is explained in detail below with reference to fig. 1, and as shown in fig. 2, the embodiment of the present invention provides the following specific steps:
101. when the screen panel is touched, the screen panel correspondingly generates a coupling capacitor, and a pulse signal with a fixed amplitude is input to the input end of the induction module to form a voltage Vex corresponding to the fixed amplitude.
In the embodiment of the present invention, the Sensing module is actually a charge amplifier, and the function of the Sensing module is to amplify the proportion of charge and discharge of the capacitor.
As shown in fig. 1, when a user touches the screen panel with a finger, a coupling capacitor 1 is formed due to the contact of the finger and the screen panel, and accordingly, a pulse signal with a fixed amplitude is input to the input end of the Sensing module 4 inside the chip to form a voltage Vex with a corresponding fixed amplitude.
102. The effect of the first parasitic capacitance is shielded by the active protection voltage.
In the embodiment of the present invention, the Sensing module 4 is actually a charge amplifier, and it functions to amplify the ratio of charge and discharge of the capacitor, and the Sensing module 4 outputs a signal according to the ratio of the capacitor at the position 5 and the second parasitic capacitor 6, specifically: the output voltage of the Sensing module 4 is obtained by multiplying the ratio of the capacitance at the position 5 to the second parasitic capacitance 6 by the voltage Vex with fixed amplitude. Therefore, for the output voltage of the Sensing module 4, the second parasitic capacitance 6 and the voltage Vex with fixed amplitude are fixed, and if the capacitance at the position 5 changes or the impedance changes, the output result of the Sensing module 4 will be affected.
As shown in fig. 1, the coupling capacitor 1 is connected at the position 5, however, if fig. 1 also shows that a plurality of first parasitic capacitors 3 are included, these first parasitic capacitors 3 need to be shielded by the active shielding voltage, so that the position 5 is equivalent to being connected with the coupling capacitor 1 only, and then the output result of the Sensing module 4 is: and multiplying the ratio of the coupling capacitor 1 to the second parasitic capacitor 6 by the voltage Vex with fixed amplitude to obtain the output voltage of the Sensing module 4.
Then, the output result of the Sensing module 4 is only affected by the increase or decrease of the coupling capacitor 1, and for the touch operation of touching the screen panel with a finger, the coupling capacitor 1 is increased or decreased due to the touch area, strength and other factors of the finger, and accordingly, the output result of the Sensing module 4 is also changed, and by using the change, it can be determined whether the screen panel is touched or not touched. Specifically, the difference between the larger and smaller coupling capacitors 1 can be used to further determine the sensitivity of the touch screen panel. In the above way, for the user experience, the touch screen panel is sensitive, and the screen touch function does not malfunction.
For the embodiment of the present invention, as shown in fig. 1, the active protection voltage refers to: for the first voltage inputted to the source terminal and the second voltage inputted to the gate terminal provided by the thin film transistor, and the third voltage inputted to the VCOM terminal, the voltages charged to the first terminals of the different first parasitic capacitors 3 are all the same voltage amplitude as the voltage Vex with the fixed amplitude, so as to achieve the final purpose that the voltage at the second terminal of the first parasitic capacitor 3 is also the same voltage amplitude as the voltage Vex with the fixed amplitude, thereby achieving the effect of shielding the 3 first parasitic capacitors 3 in the circuit shown in fig. 1, and such voltage for performing the protection function is an active protection voltage.
It should be noted that the VCOM terminal is a common electrode voltage terminal, which is a common electrode on the screen, and is used in the display phase, and needs to be shielded in the touch phase.
103. And determining the output voltage of the induction module according to the coupling capacitor, the second parasitic capacitor and the voltage Vex with fixed amplitude.
104. And according to the output voltage of the induction module, the chip outputs corresponding instruction data.
The second parasitic capacitor is a preset capacitor and is a feedback capacitor of the Sensing module.
In the embodiment of the present invention, as shown in fig. 1, after the 3 first parasitic capacitors 3 are shielded by the active protection voltage, the output voltage of the Sensing module 4 can be obtained by multiplying the ratio of the coupling capacitor 1 to the second parasitic capacitor 6 by the voltage Vex with a fixed amplitude, and further, the chip outputs corresponding instruction data according to the output voltage of the Sensing module.
In the embodiment of the present invention, under the condition that the active protection voltage plays a sufficient role, the coupling capacitors 1 correspondingly generated by touching the screen panel each time can be obtained by touching the screen panel for multiple times, and the sizes of the coupling capacitors 1 are different, so that the output voltages of the Sensing modules 4 correspondingly obtained are also different. Further, in combination with the display effect seen on the screen panel, the sensitivity of the screen panel being touched can be detected by using the difference of the output voltages of the Sensing modules 4.
Further, in the embodiment of the present invention, as shown in fig. 1, not only the first parasitic capacitors 3 but also the parasitic resistors 2 are included, and the parasitic resistors 2 are sensitive to temperature changes, such as temperature changes of the product itself during use, and temperature changes of the environment where the product is located (e.g., temperature changes of indoor and outdoor environments, temperature changes of hands in contact), so that the resistance value changes with the temperature changes. In order that the active protection voltage adopted by the embodiment of the present invention is sufficiently functional, a specific implementation method for shielding the effect generated by the first parasitic capacitor 3 includes the following steps:
firstly, a source terminal is connected with a first terminal of a first parasitic capacitor 3, a first voltage input by the source terminal is used for charging the first parasitic capacitor 3, and the first voltage and a voltage Vex with fixed amplitude have the same voltage amplitude;
and, through the gate terminal is connected with the first end of the first parasitic capacitance 3, charge the first parasitic capacitance 3 with the second voltage that the gate terminal inputs, the second voltage has the same voltage amplitude as the voltage Vex of the fixed amplitude;
and, connect with first end of the first parasitic capacitance 3 through VCOM end, utilize the third voltage that VCOM end inputs to charge to the first parasitic capacitance, the third voltage has the same voltage amplitude as voltage Vex of the fixed amplitude;
it should be noted that the first voltage, the second voltage and the third voltage are only convenient to refer to charging voltages input by different terminals, and a final object of the embodiment of the present invention is to further control the voltage detected at the second terminal of the first parasitic capacitor 3 to have the same voltage amplitude as the voltage Vex with a fixed amplitude, and this specific implementation method for implementing the control is as follows:
by reducing the frequency of the voltage Vex of a fixed magnitude, the charging time of the VCOM terminal, the source terminal and the gate terminal to the first parasitic capacitance, respectively, is prolonged so that the voltage detected at the second terminal of the first parasitic capacitance 3 is the same voltage magnitude as the voltage Vex of the fixed magnitude. The specific explanation is as follows:
the embodiment of the invention adopts an active protection voltage technology, and aims to ensure that the input voltage amplitude of a source terminal, a grid terminal and a VCOM terminal is equal to the input voltage amplitude of a Sensing moduleThe input voltage amplitudes are the same, the purpose of shielding the effect generated by the plurality of first parasitic capacitors is achieved, interference caused by loads on a source electrode, a grid electrode and a VCOM line (shown in figure 1) on a Sensing module is eliminated, and the Sensing module can accurately receive load change of a screen due to touch. However, the resistor is a device which is particularly sensitive to temperature variations, and when the temperature varies, the resistance of the second parasitic resistor on the source, the gate and the VCOM line and the resistance of the second parasitic resistor inside the chip are changed, and the time constant t is set c The source voltage, the gate voltage, the VCOM voltage and the reference voltage charging time of the Sensing module are different, because the frequency is higher, the difference of the charging time can cause the generation of a voltage difference, the voltage difference of the three can cause the voltage amplitude of the other end of the first parasitic capacitor shown in fig. 1 to be different from the input voltage amplitude of the Sensing module, so that the 3 parasitic capacitors can not be shielded, the interference to the Sensing module occurs, the Sensing module can not accurately sense the difference condition caused by the touch and the non-touch of the screen, and the data sent into the chip is inaccurate.
The time constant t is c R × C is a key indicator in the circuit, and represents a constant of the time course of the transient reaction, the time required for the terminal voltage of the capacitor to reach 0.63 times the maximum value, and the longer the charging time, the closer the terminal voltage is to the maximum voltage. Although the variation in temperature brings about a difference in time constant, the maximum value of the terminal voltage is not changed. Therefore, in the embodiment of the present invention, the charging time is prolonged by reducing the frequency of the voltage Vex (that is, the voltage Vex with a fixed amplitude formed by inputting the pulse signal with a fixed amplitude to the input end of the Sensing module), so that the voltages of the three reach the maximum value, and the voltage difference caused by the change of the time constant is reduced.
For example, the embodiment of the present invention exemplifies a graph of a variation trend of the low frequency driving, such that the source terminal voltage, the gate terminal voltage, and the Sensing module input voltage, and fig. 3 shows that the abscissa corresponds to the unit of time and the ordinate corresponds to the unit of voltage, and as the time is prolonged, the voltage difference between the source terminal voltage, the gate terminal voltage, and the Sensing module input voltage is reduced, even almost overlapped, and there is no difference.
The embodiment of the invention provides a method for dealing with the failure of the touch function of a screen, which is applied to a circuit of a touch and display driving integrated product. According to the embodiment of the invention, the effect generated by the first parasitic capacitor is shielded by utilizing the active protection voltage, so that the active protection voltage is ensured to be fully effective at any time, and even if the parasitic resistance value in the circuit is changed due to temperature change, the Sensing result of the Sensing module on the load condition is not influenced. Compared with the prior art, the technical problem that the touch function of the screen fails due to interference caused by temperature change on the Sensing module in the screen is solved, the Sensing module can be prevented from being badly interfered, the Sensing module can normally work, the accuracy of data received inside the chip is ensured, the chip can give correct instructions, and the phenomenon that the touch function of the screen fails when being used by a user is avoided.
As an optimized technical solution, in addition to the above embodiment of the present invention that the interference to the Sensing module is dealt with by reducing the frequency of the voltage Vex with a fixed amplitude and prolonging the charging time, on this basis, it is further considered that the output signal of the Sensing module generates noise, and the noise removal processing needs to be performed, so as to optimize the output result of the Sensing module, and further improve the correctness of the instruction given by the chip more optimally, the embodiment of the present invention further provides another method for dealing with the failure of the touch function of the screen, as shown in fig. 4, for the embodiment of the present invention, the following specific steps are provided:
201. when the screen panel is touched, the coupling capacitor is correspondingly generated at the screen panel, and a pulse signal with fixed amplitude is input to the input end of the Sensing module to form a voltage Vex corresponding to the fixed amplitude.
202. The effect of the first parasitic capacitance is shielded by the active protection voltage.
203. And determining the output voltage of the induction module according to the coupling capacitor, the second parasitic capacitor and the voltage Vex with fixed amplitude.
In the embodiment of the present invention, for the explanation of steps 201 and 203, refer to steps 101 and 103, which are not described herein again.
204. And acquiring an output signal of the output end of the induction module according to the pulse signal with fixed amplitude input to the input end of the induction module.
205. And denoising the output signal to obtain a denoised signal.
In the embodiment of the present invention, the step may be detailed to include: firstly, according to a preset sampling multiple, increasing the sampling rate of an output signal to obtain a sampling signal; secondly, denoising the sampling signal by using a low-pass filter to obtain a denoised signal.
206. And determining the instruction data output by the chip according to the denoised signal.
The embodiment of the invention considers that: after the temperature changes, the Sensing module generates much noise due to the impedance changes of the first parasitic resistor and the first parasitic capacitor, so that a large amount of noise signals exist in the output signal. The embodiment of the invention provides a countermeasure for improving the sampling frequency of the output signal and removing the noise signal by the low-pass filter.
The conventional sampling pattern as shown in fig. 5a and the oversampling pattern, e.g. double oversampling, as shown in fig. 5b, the doubling of the sampling frequency per unit time is shown by the arrows in fig. 5 b. The traditional oversampling mode is single-time sampling, and only once sampling is performed in each effective signal period. If noise interference occurs in the period, the Sensing data received inside the chip is a noise signal. The oversampling mode improves the sampling times, and calculates the sampling data for a plurality of times in the period, so that even if noise interference occurs in the period, the Sensing data received in the chip is not a noise signal, but a signal obtained by the operation of the noise signal and a non-noise signal, and the noise can be effectively inhibited and filtered.
And, the oversampling principle according to the embodiment of the present invention is: the quantization noise power is constant and is irrelevant to the sampling rate and the number of sampling points, the sampling rate is improved, the power density of the quantization noise is reduced from the view of a frequency domain, the signal power is unchanged, and the reduction of the power density means that the overlapping part of the quantization noise and a signal is reduced, which is equivalent to the dispersion of noise signals. It is more convenient to remove the noise signal by using a filter, and specifically, the following explanation is made:
for example, according to the conventional sampling method shown in fig. 5a and the oversampling method shown in fig. 5b, the conventional sampling spectrum shown in fig. 6a and the oversampling spectrum shown in fig. 6b are illustrated correspondingly. The oversampling technology increases the sampling rate, the sampling rate is doubled, the triangular part in fig. 6a and fig. 6b is the signal power spectral density, when the temperature changes, the Sensing module will generate much noise due to the resistance and capacitance impedance changes, the noise signal is a dotted rectangle, the area of the dotted rectangle in fig. 6a and fig. 6b is unchanged, but the width of the noise signal (dotted rectangle) is reduced in fig. 6b, and the length is increased, so the dotted rectangle and the triangular part obtained by comparison are reduced, compared with fig. 6a, the overlapping part between the two parts is reduced, and the noise signal is more conveniently removed through the filter in the subsequent process.
In the embodiment of the invention, a low-pass filter is mainly used for removing most of noise signals and reserving signal components, so that the screen touch instruction data is generated according to the signals after the denoising processing, and a chip can give more correct instruction data, thereby more accurately and effectively detecting the changes of screen touch and non-touch.
Further, the embodiment of the present invention provides a simulation graph of a sampling result obtained by using a conventional sampling manner and a double oversampling manner, as shown in fig. 7, and a simulation graph of a conventional sampling result shown in fig. 8.
Comparing fig. 7 and 8, the upper half of each figure shows a record of the Sensing module output voltage, as indicated by the arrows, indicating whether the screen is touched or not, and the lower half of each figure shows the sampling frequency, as compared between the two bold white lines in the figure, with the fig. 8 sampling frequency being higher than that of fig. 7.
In summary, the embodiment of the present invention provides a method for dealing with a failure of a touch function of a screen, which is applied to a circuit of a touch and display driving integrated product, when a screen panel is touched, a coupling capacitor is correspondingly generated at the screen panel, a pulse signal with a fixed amplitude is input to an input end of an induction module to form a voltage Vex with a corresponding fixed amplitude, and an effect generated by a first parasitic capacitor is shielded by using an active protection voltage, so that an output voltage of the induction module can be determined according to the coupling capacitor, a second parasitic capacitor and the voltage Vex with the fixed amplitude. And also considering that the output signal of the Sensing module can generate noise, the noise removal processing is required to optimize the output result of the Sensing module. And finally, according to the output voltage of the induction module, enabling the chip to output corresponding correct instruction data. According to the invention, the effect generated by the first parasitic capacitor is shielded by using the active protection voltage to ensure that the active protection voltage is fully acted all the time, so that even if the parasitic resistance value in the circuit is changed due to temperature change, the Sensing result of the Sensing module on the load condition is not influenced, and the output result of the Sensing module is further optimized by using denoising processing, so that the Sensing module is prevented from being interfered as much as possible. According to the invention, the induction module can be prevented from being interfered badly, so that the induction module works normally, the accuracy of data received in the chip is ensured, the chip can give a correct instruction, and the phenomenon of touch failure of a screen is avoided for a user.
It will be understood by those within the art that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent insertion, improvement, etc. made within the spirit and principle of the present application should be included in the scope of claims of the present application.
Claims (7)
1. A method for coping with a malfunction of a touch function of a screen, applied to a circuit of a touch and display driving integrated product, the circuit including a screen panel internal sub-assembly and an in-chip part-assembly, the screen panel internal sub-assembly being connected to the in-chip part-assembly, the screen panel internal sub-assembly including at least a plurality of first parasitic capacitances and parasitic resistances therein, the in-chip part-assembly including at least a sensing block, a second parasitic capacitance, and a parasitic resistance therein, the method comprising:
when the screen panel is touched, a coupling capacitor is correspondingly generated at the screen panel, and a pulse signal with fixed amplitude is input to the input end of the induction module to form a voltage Vex corresponding to the fixed amplitude;
shielding off effects caused by the first parasitic capacitance with an active protection voltage, wherein the active protection voltage comprises: a first voltage is input to a source terminal and a second voltage is input to a grid terminal of the thin film transistor, and a third voltage is input to a VCOM terminal, wherein the VCOM terminal, the source terminal and the grid terminal of the thin film transistor are respectively connected with first terminals of different first parasitic capacitors;
the shielding the effect of the first parasitic capacitor by using the active protection voltage comprises: the source terminal is connected with a first terminal of the first parasitic capacitor, and a first voltage input by the source terminal is used for charging the first parasitic capacitor, wherein the first voltage and the voltage Vex with the fixed amplitude have the same voltage amplitude; charging the first parasitic capacitor with a second voltage input from the gate terminal through the gate terminal being connected to the first end of the first parasitic capacitor, the second voltage having the same voltage magnitude as the fixed magnitude voltage Vex; charging the first parasitic capacitor with a third voltage input from the VCOM terminal, the third voltage having the same voltage magnitude as the fixed magnitude voltage Vex, through the connection of the VCOM terminal to the first terminal of the first parasitic capacitor; controlling the voltage detected at the second end of the first parasitic capacitor to have the same voltage amplitude as the voltage Vex with the fixed amplitude;
the controlling the voltage detected at the second end of the first parasitic capacitor to have the same voltage amplitude as the voltage Vex with the fixed amplitude includes: prolonging the charging time of the VCOM terminal, the source terminal and the gate terminal to the first parasitic capacitor respectively by reducing the frequency of the voltage Vex with the fixed amplitude so as to achieve that the voltage detected at the second terminal of the first parasitic capacitor is the same voltage amplitude as the voltage Vex with the fixed amplitude;
determining the output voltage of the induction module according to the coupling capacitor, the second parasitic capacitor and the voltage Vex with fixed amplitude;
and outputting corresponding instruction data by the chip according to the output voltage of the induction module.
2. The method of claim 1, wherein determining the output voltage of the sensing module based on the coupling capacitance, the second parasitic capacitance, and the fixed magnitude voltage Vex comprises:
and multiplying the voltage Vex with the fixed amplitude by the ratio of the coupling capacitor to the second parasitic capacitor to obtain the output voltage of the induction module.
3. The method of claim 1, wherein the chip outputs corresponding command data according to the output voltage of the sensing module, comprising:
according to the pulse signal with fixed amplitude input to the input end of the induction module, acquiring an output signal of the output end of the induction module;
denoising the output signal to obtain a denoised signal;
and determining instruction data output by the chip according to the denoised signal.
4. The method of claim 3, wherein the denoising the output signal to obtain a denoised signal comprises:
according to a preset sampling multiple, increasing the sampling rate of the output signal to obtain a sampling signal;
and denoising the sampling signal by using a low-pass filter to obtain a denoised signal.
5. The method of any one of claims 1 to 4, wherein the sensing module is a charge amplifier; the second parasitic capacitance is a feedback capacitance corresponding to the sensing module.
6. The method according to any one of claims 1 to 4,
obtaining coupling capacitance correspondingly generated by touching the screen panel for each time through touching the screen panel for multiple times;
and determining the output voltage of the induction module, which is obtained correspondingly to the touch screen panel each time, according to different coupling capacitances.
7. The method according to claim 6, wherein the sensitivity of the touch on the screen panel is detected by using the output voltage of the sensing module obtained by the touch on the screen panel each time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111670970.9A CN114281217B (en) | 2021-12-31 | 2021-12-31 | Method for coping with screen touch function failure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111670970.9A CN114281217B (en) | 2021-12-31 | 2021-12-31 | Method for coping with screen touch function failure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114281217A CN114281217A (en) | 2022-04-05 |
| CN114281217B true CN114281217B (en) | 2022-09-06 |
Family
ID=80879445
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111670970.9A Active CN114281217B (en) | 2021-12-31 | 2021-12-31 | Method for coping with screen touch function failure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114281217B (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013058446A1 (en) * | 2011-10-21 | 2013-04-25 | 포항공과대학교 산학협력단 | Capacitive touch sensor |
| CN109445629A (en) * | 2018-10-18 | 2019-03-08 | 京东方科技集团股份有限公司 | Touch detecting method and device, touch module and display device |
| CN109471563A (en) * | 2018-12-27 | 2019-03-15 | 北京集创北方科技股份有限公司 | A kind of touch display unit and touch detection circuit |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20110112128A (en) * | 2010-04-06 | 2011-10-12 | 삼성전자주식회사 | Method and apparatus for parasitic capacitance compensation in touch panel |
| KR101216393B1 (en) * | 2010-05-13 | 2012-12-28 | 주식회사 실리콘웍스 | Circuit and method for measuring capacitance value of touch screen |
| CN102541334B (en) * | 2010-12-30 | 2016-09-28 | 上海天马微电子有限公司 | Touch display unit and manufacture method thereof |
| US9007343B1 (en) * | 2013-10-01 | 2015-04-14 | Synaptics Incorporated | Display guarding techniques |
| KR102357768B1 (en) * | 2014-09-26 | 2022-02-04 | 엘지디스플레이 주식회사 | Touch sensing device |
| CN104459400B (en) * | 2014-12-08 | 2018-07-17 | 深圳市华星光电技术有限公司 | Detection circuit and detection method for self-tolerant touch screen |
| KR102347129B1 (en) * | 2014-12-31 | 2022-01-04 | 엘지디스플레이 주식회사 | Touch screen device and method for driving the same |
| KR102480270B1 (en) * | 2015-12-11 | 2022-12-23 | 주식회사 지2터치 | Display device integrated with touch screen and method for detecting touch |
| KR102539856B1 (en) * | 2016-07-28 | 2023-06-08 | 엘지디스플레이 주식회사 | Display and gate driving circuit thereof |
| CN108415633B (en) * | 2018-04-26 | 2024-04-19 | 深圳市爱协生科技股份有限公司 | Touch display screen and touch display device |
-
2021
- 2021-12-31 CN CN202111670970.9A patent/CN114281217B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2013058446A1 (en) * | 2011-10-21 | 2013-04-25 | 포항공과대학교 산학협력단 | Capacitive touch sensor |
| CN109445629A (en) * | 2018-10-18 | 2019-03-08 | 京东方科技集团股份有限公司 | Touch detecting method and device, touch module and display device |
| CN109471563A (en) * | 2018-12-27 | 2019-03-15 | 北京集创北方科技股份有限公司 | A kind of touch display unit and touch detection circuit |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114281217A (en) | 2022-04-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US10282026B2 (en) | Measuring body capacitance effect in touch sensitive device | |
| JP6325031B2 (en) | Multipoint touch surface controller | |
| JP6280198B2 (en) | Capacitance-based touch device with reduced interference and method thereof | |
| US9223436B2 (en) | Full scale calibration measurement for multi-touch surfaces | |
| KR101441218B1 (en) | Touch sensor panel negative pixel compensation | |
| JP4938734B2 (en) | Multiple simultaneous frequency detection | |
| US9430105B2 (en) | Frequency independent offset cancellation scheme in touch receiver channel | |
| US9703422B2 (en) | Sensor-based ESD detection | |
| US20180059870A1 (en) | Analog front end with variable gain control for touch applications | |
| US11079878B1 (en) | Noise mitigation touch sensing circuit | |
| US20140085246A1 (en) | Self capacitance implementation method | |
| KR20170088117A (en) | Touch Processor, Touch DDI Chip and Operating Method of Touch Processor | |
| EP0789318B1 (en) | Method and apparatus for eliminating an offset signal in an electrostatic digitizing tablet | |
| CN114281217B (en) | Method for coping with screen touch function failure | |
| US10895932B1 (en) | Drift invariant processing | |
| KR20220061222A (en) | Capacitance detection device and capacitance detection method | |
| CN109923505A (en) | Interference for touch system reduces circuit | |
| CN112000249A (en) | Capacitance detection circuit, touch control chip and parameter adjustment method of capacitance detection circuit | |
| US11429233B2 (en) | Common mode noise suppression with restoration of common mode signal | |
| US11914820B2 (en) | Distributed analog display noise suppression circuit | |
| CN117693728A (en) | Capacitance detection circuit, touch display device and electronic equipment | |
| JP2023016706A (en) | Correcting touch interference for active pen | |
| TW201401134A (en) | Method for increasing accuracy of touch coordinate calculation for multi-touch capacitive touch panel |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: Room 101, floor 1, building 3, yard 18, Kechuang 10th Street, Beijing Economic and Technological Development Zone, Daxing District, Beijing 100176 Applicant after: Beijing yisiwei Computing Technology Co.,Ltd. Address before: Room 101, floor 1, building 3, yard 18, Kechuang 10th Street, Beijing Economic and Technological Development Zone, Daxing District, Beijing 100176 Applicant before: Beijing yisiwei Computing Technology Co.,Ltd. |
|
| CB02 | Change of applicant information | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |