CN114265871A - Database-based electron microscope data analysis method - Google Patents
Database-based electron microscope data analysis method Download PDFInfo
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- CN114265871A CN114265871A CN202111650719.6A CN202111650719A CN114265871A CN 114265871 A CN114265871 A CN 114265871A CN 202111650719 A CN202111650719 A CN 202111650719A CN 114265871 A CN114265871 A CN 114265871A
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Abstract
The invention discloses a database-based electron microscope data analysis method, which comprises the following steps: A. storing electron microscope data to be analyzed in a database, and judging whether the storage of all data is finished; B. if yes, an alarm is sent out to remind the user; C. calling electron microscope data to be analyzed in a database, and then importing the data into analysis equipment; D. because the scanning electron microscope photo is a gray image, the total gray gradient value of all pixel points on the gray image is obtained through the gray gradient value of each pixel point on the gray image. According to the invention, the gradient average value of all pixel points on the gray scale image is obtained according to the total gray scale gradient value and the total pixel point number of the gray scale image, and the definition of the image is determined according to the gradient average value, so that the problems that the existing electron microscope data analysis method is poor in analysis effect and low in analysis speed during working, and therefore, the working efficiency is influenced are solved.
Description
Technical Field
The invention relates to the technical field of data analysis, in particular to a database-based electron microscope data analysis method.
Background
An electron microscope is called as an electron microscope for short, and has become an indispensable important tool in modern science and technology through development for over fifty years, the electron microscope is composed of a lens cone, a vacuum device and a power supply cabinet, the application of the electron microscope technology is established on the basis of an optical microscope, the resolution of the optical microscope is 0.2 μm, the resolution of a transmission electron microscope is 0.2nm, namely the transmission electron microscope is amplified by 1000 times on the basis of the optical microscope, and the electron microscope needs to analyze the definition of a picture after processing a sample.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides the database-based electron microscope data analysis method, which has the advantage of high working efficiency and solves the problems that the existing electron microscope data analysis method is poor in analysis effect and low in analysis speed during working, so that the working efficiency is influenced.
Technical scheme
In order to achieve the purpose, the invention provides the following technical scheme: a database-based electron microscope data analysis method comprises the following steps:
A. storing electron microscope data to be analyzed in a database, and judging whether the storage of all data is finished;
B. if yes, an alarm is sent out to remind the user;
C. calling electron microscope data to be analyzed in a database, and then importing the data into analysis equipment;
D. because the scanning electron microscope photo is a gray image, the total gray gradient value of all pixel points on the gray image is obtained through the gray gradient value of each pixel point on the gray image;
E. obtaining the gradient average value of all pixel points on the gray level image according to the total gray level gradient value and the total pixel points of the gray level image;
F. determining the definition of the picture according to the gradient average value;
G. the high-definition image and the low-definition image are separated and stored.
Preferably, the analytical equipment includes photo definition analyzer, photo definition analyzer's bottom fixedly connected with backup pad, the right side fixedly connected with refrigeration shell of backup pad bottom, the left side of refrigeration shell has the fan through the exhaust tube intercommunication, the top intercommunication of fan has the blast pipe, the left and right sides of blast pipe communicates respectively has first shower nozzle and second shower nozzle, the left side fixedly connected with panel computer at backup pad top, the inner chamber to panel computer is run through in the left side of first shower nozzle, the inner chamber to photo definition analyzer is run through on the right side of second shower nozzle.
Preferably, the right side of refrigeration shell inner chamber, the left side of panel computer inner chamber and the right side of photo definition analysis appearance inner chamber all are provided with the carriage, the inner chamber fixedly connected with dust screen of carriage.
Preferably, one side of the connecting frame is fixedly connected with a connecting ring, and the outer surfaces of the connecting ring and the connecting frame are both fixedly connected with elastic rubber rings.
Preferably, the top of the inner cavity of the tablet personal computer and the top of the inner cavity of the photo definition analyzer are both fixedly connected with temperature sensors, and round holes are formed in the inner sides of the tablet personal computer and the photo definition analyzer.
Preferably, the top and the bottom of the inner cavity of the refrigeration shell are both communicated with connecting pipes, semiconductor refrigeration pieces are embedded in the two sides of each connecting pipe, and the front and the back of each connecting pipe are both fixedly connected with the refrigeration shell.
Preferably, the four corners of the bottom of the supporting plate are fixedly connected with supporting legs, and the bottoms of the supporting legs are fixedly connected with non-slip mats.
Advantageous effects
Compared with the prior art, the invention provides the electron microscope data analysis method based on the database, which has the following beneficial effects:
the invention stores the electron microscope data to be analyzed in the database, judges whether the storage of all data is finished, calls the electron microscope data to be analyzed in the database, then guides the data into the analysis equipment, obtains the total gray gradient value of all pixel points on the gray map through the gray gradient value of each pixel point on the gray map because the scanning electron microscope picture is a gray image, obtains the gradient average value of all pixel points on the gray map according to the total gray gradient value and the total pixel point number of the gray map, determines the definition of the picture according to the gradient average value, distinguishes the image with high definition from the image with low definition, stores the images, and dissipates heat to the tablet computer and the photo definition analyzer, so that the operation speed of the tablet computer and the photo definition analyzer is high, the analysis efficiency is further accelerated, the problem that the existing electron microscope data analysis method has poor analysis effect when working is solved, and the analysis speed is slow, thereby affecting the working efficiency.
Drawings
FIG. 1 is a schematic structural diagram of an analysis apparatus according to an embodiment of the present invention;
fig. 2 is a schematic view of the internal structure of the refrigeration shell in the embodiment of the invention.
In the figure: 1. a support plate; 2. a refrigeration shell; 3. an air exhaust pipe; 4. a fan; 5. an exhaust pipe; 6. a first nozzle; 7. a second nozzle; 8. a tablet computer; 9. a photo sharpness analyzer; 10. a connecting frame; 11. a dust screen; 12. a connecting ring; 13. an elastic rubber ring; 14. a connecting pipe; 15. semiconductor refrigeration piece.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-2, a database-based electron microscope data analysis method, the analysis and counting method includes the following steps:
A. storing electron microscope data to be analyzed in a database, and judging whether the storage of all data is finished;
B. if yes, an alarm is sent out to remind the user;
C. calling electron microscope data to be analyzed in a database, and then importing the data into analysis equipment;
D. because the scanning electron microscope photo is a gray image, the total gray gradient value of all pixel points on the gray image is obtained through the gray gradient value of each pixel point on the gray image;
E. obtaining the gradient average value of all pixel points on the gray level image according to the total gray level gradient value and the total pixel points of the gray level image;
F. determining the definition of the picture according to the gradient average value;
G. the high-definition image and the low-definition image are separated and stored.
Analytical equipment includes photo definition analysis appearance 9, photo definition analysis appearance 9's bottom fixedly connected with backup pad 1, the right side fixedly connected with refrigeration shell 2 of backup pad 1 bottom, the left side of refrigeration shell 2 has fan 4 through exhaust tube 3 intercommunication, the top intercommunication of fan 4 has blast pipe 5, the left and right sides of blast pipe 5 communicates respectively has first shower nozzle 6 and second shower nozzle 7, the left side fixedly connected with panel computer 8 at backup pad 1 top, the inner chamber to panel computer 8 is run through in the left side of first shower nozzle 6, the inner chamber to photo definition analysis appearance 9 is run through on the right side of second shower nozzle 7.
The right side of the inner cavity of the refrigeration shell 2, the left side of the inner cavity of the tablet personal computer 8 and the right side of the inner cavity of the photo definition analyzer 9 are respectively provided with a connecting frame 10, and the inner cavity of the connecting frame 10 is fixedly connected with a dust screen 11.
One side of the connecting frame 10 is fixedly connected with a connecting ring 12, and the outer surfaces of the connecting ring 12 and the connecting frame 10 are both fixedly connected with an elastic rubber ring 13.
The equal fixedly connected with temperature sensor in top of panel computer 8 and the 9 inner chambers of picture definition analysis appearance, the round hole has all been seted up to the inboard of panel computer 8 and picture definition analysis appearance 9.
The top and the bottom of 2 inner chambers of refrigeration shell all communicate there is connecting pipe 14, and the both sides of connecting pipe 14 all inlay and be equipped with semiconductor refrigeration piece 15, the front and the back of connecting pipe 14 all with refrigeration shell 2 fixed connection.
The equal fixedly connected with supporting leg in four corners of 1 bottom of backup pad, and the bottom fixedly connected with slipmat of supporting leg.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. A database-based electron microscope data analysis method is characterized by comprising the following steps: the analysis and counting method comprises the following steps:
A. storing electron microscope data to be analyzed in a database, and judging whether the storage of all data is finished;
B. if yes, an alarm is sent out to remind the user;
C. calling electron microscope data to be analyzed in a database, and then importing the data into analysis equipment;
D. because the scanning electron microscope photo is a gray image, the total gray gradient value of all pixel points on the gray image is obtained through the gray gradient value of each pixel point on the gray image;
E. obtaining the gradient average value of all pixel points on the gray level image according to the total gray level gradient value and the total pixel points of the gray level image;
F. determining the definition of the picture according to the gradient average value;
G. the high-definition image and the low-definition image are separated and stored.
2. The database-based electron microscope data analysis method according to claim 1, characterized in that: the analytical equipment includes photo definition analysis appearance (9), bottom fixedly connected with backup pad (1) of photo definition analysis appearance (9), the right side fixedly connected with refrigeration shell (2) of backup pad (1) bottom, the left side of refrigeration shell (2) has fan (4) through aspiration tube (3) intercommunication, the top intercommunication of fan (4) has blast pipe (5), the left and right sides of blast pipe (5) communicate respectively has first shower nozzle (6) and second shower nozzle (7), the left side fixedly connected with panel computer (8) at backup pad (1) top, the inner chamber to panel computer (8) is run through in the left side of first shower nozzle (6), the inner chamber to photo definition analysis appearance (9) is run through on the right side of second shower nozzle (7).
3. The database-based electron microscope data analysis method according to claim 2, characterized in that: the right side of refrigeration shell (2) inner chamber, the left side of panel computer (8) inner chamber and the right side of photo definition analysis appearance (9) inner chamber all are provided with connecting frame (10), the inner chamber fixedly connected with dust screen (11) of connecting frame (10).
4. The database-based electron microscope data analysis method according to claim 3, characterized in that: one side of the connecting frame (10) is fixedly connected with a connecting ring (12), and the outer surfaces of the connecting ring (12) and the connecting frame (10) are fixedly connected with elastic rubber rings (13).
5. The database-based electron microscope data analysis method according to claim 2, characterized in that: the top of the inner cavity of the tablet personal computer (8) and the inner cavity of the photo definition analyzer (9) are fixedly connected with temperature sensors, and the inner sides of the tablet personal computer (8) and the photo definition analyzer (9) are provided with round holes.
6. The database-based electron microscope data analysis method according to claim 2, characterized in that: the top and the bottom of the inner cavity of the refrigeration shell (2) are both communicated with connecting pipes (14), semiconductor refrigeration sheets (15) are embedded on the two sides of each connecting pipe (14), and the front and the back of each connecting pipe (14) are both fixedly connected with the refrigeration shell (2).
7. The database-based electron microscope data analysis method according to claim 2, characterized in that: the supporting legs are fixedly connected to four corners of the bottom of the supporting plate (1), and the anti-slip pads are fixedly connected to the bottoms of the supporting legs.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN202111650719.6A CN114265871A (en) | 2021-12-30 | 2021-12-30 | Database-based electron microscope data analysis method |
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| CN202111650719.6A CN114265871A (en) | 2021-12-30 | 2021-12-30 | Database-based electron microscope data analysis method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116614272A (en) * | 2023-05-23 | 2023-08-18 | 北京科技大学 | Digital remote sharing platform for scanning electron microscope |
| CN116614272B (en) * | 2023-05-23 | 2024-05-14 | 北京科技大学 | Digital remote sharing platform for scanning electron microscope |
-
2021
- 2021-12-30 CN CN202111650719.6A patent/CN114265871A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116614272A (en) * | 2023-05-23 | 2023-08-18 | 北京科技大学 | Digital remote sharing platform for scanning electron microscope |
| CN116614272B (en) * | 2023-05-23 | 2024-05-14 | 北京科技大学 | Digital remote sharing platform for scanning electron microscope |
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