CN114264384A - Temperature sensor, temperature sensing method, and storage medium - Google Patents
Temperature sensor, temperature sensing method, and storage medium Download PDFInfo
- Publication number
- CN114264384A CN114264384A CN202111605761.6A CN202111605761A CN114264384A CN 114264384 A CN114264384 A CN 114264384A CN 202111605761 A CN202111605761 A CN 202111605761A CN 114264384 A CN114264384 A CN 114264384A
- Authority
- CN
- China
- Prior art keywords
- analog
- circuit
- digital conversion
- data component
- quantization error
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Landscapes
- Analogue/Digital Conversion (AREA)
Abstract
The invention relates to a temperature sensor, a temperature sensing method and a storage medium. A temperature sensor, comprising: the device comprises an analog front-end circuit, an analog-to-digital conversion circuit and a first splicing circuit. The analog front end circuit is configured to: an input signal and a reference signal are generated in response to a temperature change. The analog-to-digital conversion circuit is connected with the analog front-end circuit and is configured to: performing quantization processing on an input signal based on a reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the bit number of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component. The first splicing circuit is connected with the analog-to-digital conversion circuit and is configured to: and splicing the first data component and the second data component to obtain target data. The temperature sensor has the advantages of high precision and low power consumption.
Description
Technical Field
The present invention relates to the field of electronic circuit technology, and in particular, to a temperature sensor, a temperature sensing method, and a storage medium.
Background
The temperature sensor is a sensor that can sense temperature and convert the temperature into a digital signal, and is widely used in the fields of medical treatment, industrial control, home appliances, and the like.
Since the real temperature has a corresponding relationship with the voltage value or the current value, the temperature sensor can generally acquire the temperature change by collecting the change of the voltage or the current. That is, the temperature sensor may obtain a digital signal that may represent temperature by converting a voltage signal or a current signal. However, the accuracy of the temperature sensor is often limited by the conversion accuracy of the voltage signal or the current signal into a digitized signal.
Disclosure of Invention
In view of the above, it is desirable to provide a temperature sensor, a temperature sensing method and a storage medium to improve the accuracy of the temperature sensor.
A temperature sensor, comprising: the device comprises an analog front-end circuit, an analog-to-digital conversion circuit and a first splicing circuit.
The analog front end circuit is configured to: an input signal and a reference signal are generated in response to a temperature change.
The analog-to-digital conversion circuit is connected with the analog front-end circuit and is configured to: performing quantization processing on an input signal based on a reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the bit number of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component.
The first splicing circuit is connected with the analog-to-digital conversion circuit and is configured to: and splicing the first data component and the second data component to obtain target data.
In the above temperature sensor, the analog front end circuit may generate the input signal and the reference signal in response to a temperature change. After the input signal and the reference signal are obtained, the analog-to-digital conversion circuit may perform quantization processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error. Thus, after the number of bits of the first data component reaches the preset threshold, the quantization error can be further quantized in the second analog-to-digital conversion mode to obtain the second data component. The first data component and the second data component may then be spliced using a first splicing circuit to obtain the target data. That is to say, the temperature sensor can further convert the quantization error after the input signal is converted for the first time, which is beneficial to enabling the target data obtained after conversion to have higher conversion precision, that is, the temperature sensor has the advantage of high precision.
In some embodiments, the analog-to-digital conversion circuit comprises: incremental analog-to-digital conversion circuits.
The incremental analog-to-digital conversion circuit is respectively connected with the analog front-end circuit and the first splicing circuit and is configured to: the input signal is oversampled based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error, and the first data component is transmitted to a first splicing circuit.
In the temperature sensor, an incremental analog-to-digital conversion circuit may be used to perform oversampling processing on the input signal to obtain the first data component and the quantization error. Therefore, the conversion precision can be improved, so that the first data component has higher precision, the quantization error is smaller, and the precision of the temperature sensor is further improved. In addition, the incremental analog-to-digital conversion circuit has better linearity and is beneficial to improving the conversion precision.
In some embodiments, the analog-to-digital conversion circuit further comprises: cyclic analog-to-digital conversion circuitry and a second stitching circuit.
The cyclic analog-to-digital conversion circuit is connected with the incremental analog-to-digital conversion circuit and is configured to: after the digit of the first data component reaches a preset threshold value, acquiring a quantization error, and performing analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.
The second splicing circuit is respectively connected with the circulating analog-to-digital conversion circuit and the first splicing circuit and is configured to: the plurality of conversion results are concatenated to obtain a second data component, and the second data component is transmitted to a first concatenation circuit.
In some embodiments, the analog-to-digital conversion circuit comprises: the signal acquisition circuit, mixed analog-to-digital conversion circuit and third concatenation circuit.
The signal acquisition circuit is connected with the analog front-end circuit and is configured to: acquiring an input signal and a reference signal in a first analog-to-digital conversion mode; and acquiring the quantization error in the second analog-to-digital conversion mode.
The hybrid analog-to-digital conversion circuit is respectively connected with the signal acquisition circuit and the first splicing circuit and is configured to: performing oversampling processing on an input signal based on a reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error, transmitting the first data component to a first splicing circuit, and latching the quantization error; performing analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.
The third splicing circuit is respectively connected with the hybrid analog-to-digital conversion circuit and the first splicing circuit and is configured to: the plurality of conversion results are spliced in a second analog-to-digital conversion mode to obtain a second data component, and the second data component is transmitted to the first splicing circuit.
In the temperature sensor, the signal acquisition circuit and the hybrid analog-to-digital conversion circuit can be used in cooperation to perform oversampling processing on an input signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error, and perform analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results. After obtaining the plurality of conversion results, the third splicing circuit may be further utilized to splice the plurality of conversion results in the second analog-to-digital conversion mode to obtain the second data component. That is to say, the temperature sensor can meet the conversion requirements of different analog-to-digital conversion modes by adopting the same circuit element, thereby realizing the multiplexing of the circuit element, being beneficial to simplifying the circuit and reducing the volume of the temperature sensor.
In some embodiments, the temperature sensor further comprises: and the digital compensation circuit is connected with the first splicing circuit. The digital compensation circuit is configured to: and compensating the target data to obtain a temperature value.
Based on the same inventive concept, the embodiment of the present application further provides a temperature sensing method, which is applied to the temperature sensor in some of the foregoing embodiments. Technical effects that can be achieved by the temperature sensor in some of the foregoing embodiments can also be achieved by the temperature sensing method, and details are not repeated here.
The temperature sensing method includes the following steps.
An input signal and a reference signal are generated in response to a temperature change. The input signal is quantized based on a reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error. And after the bit number of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component. And splicing the first data component and the second data component to obtain target data.
In the temperature sensing method described above, the input signal and the reference signal may be generated in response to a temperature change. After the input signal and the reference signal are obtained, the input signal may be quantized based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error. Then, after the number of bits of the first data component reaches a preset threshold, the quantization error is further quantized in a second analog-to-digital conversion mode to obtain a second data component. The first data component and the second data component may then be concatenated to obtain the target data. Therefore, the target data obtained after conversion has higher conversion precision.
In some embodiments, the quantization processing of the input signal in the first analog-to-digital conversion mode comprises: and (5) oversampling treatment.
In the temperature sensing method, the input signal may be oversampled to make the first data component have higher accuracy and to make the quantization error smaller.
In some embodiments, after the number of bits of the first data component reaches a preset threshold, the quantization error is quantized in the second analog-to-digital conversion mode to obtain the second data component, including the following steps.
And acquiring the quantization error after the digit of the first data component reaches a preset threshold value. Performing analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component. The plurality of conversion results are concatenated to obtain a second data component.
In some embodiments, after obtaining the target data, the temperature conversion method further comprises: and compensating the target data to obtain a temperature value.
The present application further provides a storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the steps of the temperature sensing method in some of the foregoing embodiments. The storage medium can achieve the technical effects achieved by the temperature sensing method.
Drawings
Fig. 1 is a block diagram of a temperature sensor according to an embodiment;
fig. 2 is a schematic circuit diagram of an analog front-end circuit according to an embodiment;
fig. 3 is a schematic circuit diagram of another analog front-end circuit according to an embodiment;
FIG. 4 is a block diagram of another temperature sensor according to an embodiment;
fig. 5 is a schematic circuit diagram of an analog-to-digital conversion circuit according to an embodiment;
FIG. 6 is a block diagram of another exemplary temperature sensor according to an embodiment;
fig. 7 is a schematic circuit diagram of another analog-to-digital conversion circuit according to an embodiment;
FIG. 8 is a schematic flow chart of a temperature sensing method according to an embodiment;
fig. 9 is a flowchart illustrating steps in step S300 according to an embodiment.
Description of reference numerals:
100-analog front end circuitry; 110-a bias current generating circuit; 111-a first dynamic matching circuit;
112-a chopper modulation circuit; 120-a voltage generation circuit; 121-a second dynamic matching circuit;
200-analog-to-digital conversion circuit; 211-incremental analog-to-digital conversion circuitry; 2111-first accumulator;
2112-integrator; 2113-first comparator; 2114-first digital to analog converter;
212-cyclic analog-to-digital conversion circuitry; 2121-a second accumulator; 2122-a first amplifier;
2123-a second comparator; 2124-a second digital-to-analog converter; 213-a second stitching circuit;
221-a signal acquisition circuit; 222-a hybrid analog-to-digital conversion circuit;
2221 — second amplifier; 2222 — a third comparator; 223-a third splicing circuit;
300-a first stitching circuit; 400-digital compensation circuit.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Where the terms "comprising," "having," and "including" are used herein, another element may be added unless an explicit limitation is used, such as "only," "consisting of … …," etc. Unless mentioned to the contrary, terms in the singular may include the plural and are not to be construed as being one in number.
Referring to fig. 1, an embodiment of the present application provides a temperature sensor. The method comprises the following steps: the digital front-end circuit comprises an analog front-end circuit 100, an analog-to-digital conversion circuit 200 and a first splicing circuit 300.
The analog front-end circuit 100 is configured to: an input signal and a reference signal are generated in response to a temperature change.
For example, the input signal and the reference signal may be both voltage signals or current signals. For ease of understanding, the following description will be given taking as an example that the input signal and the reference signal are both voltage signals.
In some embodiments, the analog front end circuit 100 is shown in fig. 2. Input signal of DeltaVbeThe reference signal is VbeThe ratio of the two currents is 1: m (m is a positive integer). Delta VbeAnd VbeMay be represented by the following formulas, respectively.
Where K Is boltzmann constant, T Is temperature, q Is charge amount, I Is bias current, Ic Is bipolar transistor collector current, and Is saturation current (determined by process parameters).
In other embodiments, as shown in fig. 3, analog front-end circuit 100 includes: a bias current generating circuit 110 and a voltage generating circuit 120 connected to the bias current generating circuit 110. Wherein the bias current generating circuit 110 is configured to: providing a bias current to the voltage generation circuit 120. The voltage generation circuit 120 is configured to: generating an input signal of DeltaVbeAnd the reference signal is Vbe。
Optionally, the bias current is Proportional To Absolute Temperature (PTAT).
Part of the bias current generating circuit 110 may employ a first dynamic matching circuit 111 and a chopper modulation circuit 112 connected to the first dynamic matching circuit 111, and part of the voltage generating circuit 120 may employ a second dynamic matching circuit 121 connected to the first dynamic matching circuit 111. This is advantageous for improving the accuracy of the temperature sensor.
The analog-to-digital conversion circuit 200 is connected to the analog front-end circuit 100, and is configured to: performing quantization processing on an input signal based on a reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; and after the bit number of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component. The preset threshold is related to the conversion accuracy. If the conversion precision is high, it indicates that the number of bits of the data obtained after conversion is large, that is, the preset threshold is large.
The quantization error is a difference between the quantization result and the quantized analog quantity. Since the digital signal reflects discrete information that is discontinuous, and the voltage value or the current value is a physical quantity that is continuously transformed, the process of converting from a continuously changing physical quantity to discrete information that is discontinuous introduces quantization errors. A large quantization error indicates a low conversion accuracy and, correspondingly, a low accuracy of the temperature sensor. A small quantization error indicates a high conversion accuracy, and correspondingly, the accuracy of the temperature sensor is also high.
The first splicing circuit 300 is connected to the analog-to-digital conversion circuit 200, and is configured to: and splicing the first data component and the second data component to obtain target data.
The target data is a conversion result obtained by converting the voltage signal or the current signal, and the target data may be represented as:
in the above temperature sensor, the analog front end circuit 100 may generate the input signal and the reference signal in response to a temperature change. After the input signal and the reference signal are obtained, the analog-to-digital conversion circuit 200 may perform quantization processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error. Thus, after the number of bits of the first data component reaches the preset threshold, the quantization error can be further quantized in the second analog-to-digital conversion mode to obtain the second data component. The first data component and the second data component may then be spliced using the first splicing circuit 300 to obtain the target data. That is to say, the temperature sensor can further convert the quantization error after the input signal is converted for the first time, which is beneficial to enabling the target data obtained after conversion to have higher conversion precision, that is, the temperature sensor has the advantage of high precision.
Continuing to refer to fig. 1, in some embodiments, the temperature sensor further comprises: and a digital compensation circuit 400 connected to the first splicing circuit. The digital compensation circuit 400 is configured to: and compensating the target data to obtain a temperature value.
By way of example, the temperature value T may be expressed as:
where α is a compensation coefficient, and may be determined according to the process. From the above equation, the temperature value T is only related to Y.
Referring to fig. 4, in some embodiments, the analog-to-digital conversion circuit 200 includes: incremental analog to digital conversion circuit 211.
The incremental analog-to-digital conversion circuit 211 is connected to the analog front-end circuit 100 and the first splicing circuit 300, and configured to: the input signal is oversampled based on the reference signal in the first analog-to-digital conversion mode to obtain a first data component and a quantization error, and the first data component is transmitted to the first concatenation circuit 300.
Oversampling refers to the process of sampling the input signal with a sampling signal much higher than twice the input signal bandwidth. The predetermined threshold is increased by one bit for each oversampling 4 times.
In the temperature sensor, the incremental analog-to-digital conversion circuit 211 may be used to perform oversampling processing on the input signal to obtain the first data component and the quantization error. Therefore, the conversion precision can be improved, so that the first data component has higher precision, the quantization error is smaller, and the precision of the temperature sensor is further improved. In addition, the incremental analog-to-digital conversion circuit 211 has better linearity, which is also beneficial to improving the conversion precision.
In some embodiments, the analog-to-digital conversion circuit further comprises: a cyclic analog-to-digital conversion circuit 212 and a second stitching circuit 213.
The cyclic analog-to-digital conversion circuit 212 is connected to the incremental analog-to-digital conversion circuit 211, and is configured to: after the digit of the first data component reaches a preset threshold value, acquiring a quantization error, and performing analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.
The second splicing circuit 213 is connected to the cyclic analog-to-digital conversion circuit 212 and the first splicing circuit 300, and configured to: the plurality of conversion results are concatenated to obtain a second data component, and the second data component is transmitted to a first concatenation circuit.
The temperature sensor may perform quantization processing on the input signal by using a combination of the incremental analog-to-digital conversion circuit 211 and the cyclic analog-to-digital conversion circuit 212. Compared with the temperature sensor adopting the Sigma Delta type analog-digital converter with high precision and high power consumption, the temperature sensor in the embodiment of the application has higher precision and lower power consumption.
In some embodiments, the specific circuitry of the incremental analog-to-digital conversion circuit 211 and the cyclic analog-to-digital conversion circuit 212 is shown in fig. 5.
The incremental analog-to-digital conversion circuit 211 includes: a first accumulator 2111, an integrator 2112, a first comparator 2113 and a first digital-to-analog converter (DAC) 2114; the connection relationship between the devices is shown in fig. 5.
The cyclic analog-to-digital conversion circuit 212 includes: a second accumulator 2121, a first amplifier 2122, a second comparator 2123, and a second digital-to-analog converter (DAC) 2124; the connection relationship between the devices is shown in fig. 5.
For ease of understanding, the input signal DeltaV is used belowbe0.06V, reference signal VbeThe operation principle of the above circuit is illustrated by taking 0.68V, the number of bits of the first data component converted by the incremental analog-to-digital conversion circuit 211 is 6 bits (the preset threshold is 6), and the number of bits of the second data component converted by the cyclic analog-to-digital conversion circuit 212 is 8 bits.
When inputting signal DeltaVbe(0.06V) and the reference signal is Vbe(0.68V) is inputted to the incremental analog-to-digital conversion circuit 211 (reference signal V)beAcquired by the first digital-to-analog converter 2114), the input signal DeltaVbeWill be inputted into the integrator 2112 through the first accumulator 2111, and the integrator 2112 will input the input signal DeltaV for the first timebeStoring and converting the input signal DeltaVbeIs input to the first comparator 2113 and compared with 0. At this time, the input signal DeltaVbeGreater than 0, the first comparator 2113 will output 1 as its first comparison result.
The first DAC 2114 will output the positive reference signal Vbe(0.68V) to the first accumulator 2111. The first accumulator 2111 will input the signal DeltaVbe(0.06V) minus the positive reference signal Vbe(0.68V), yielding-0.62V as an output. The integrator 2112 will add the result output by the first accumulator 2111 to the existing data (0.06V) in the integrator 2112, resulting in an integrated result (i.e., -0.56V). The first comparator 2113 compares the integration result with 0. At this time, the integration result is less than 0, and the first comparator 2113 outputs 0 as the second comparison result. The first DAC 2114 will output the negative reference signal VbeTo the first accumulator 2111.
The first accumulator 2111 will input the signal DeltaVbe(0.06V) minus a negative reference signal Vbe(-0.68V), yielding 0.74V as an output result. The integrator 2112 adds the output result (0.74V) of the first accumulator 2111 to the existing data (-0.56V) to obtain an integration result (0.18V). The first comparator 2113 compares the integration result with0 for comparison. At this time, the integration result is greater than 0, and the first comparator 2113 outputs 1 as its third comparison result. The first DAC 2114 will output the positive reference signal VbeTo the first accumulator 2111. The first accumulator 2111 will input the signal DeltaVbe(0.06V) minus the positive reference signal Vbe(0.68V), and-0.62V is obtained as an output result, and the output result is input to the integrator 2112.
Since the incremental analog-to-digital conversion circuit 211 converts the first data component to 6 bits, the above process is repeated 64 times (2 times)6) And then stopping. The first comparator 2113 outputs 64 comparison results. The incremental analog-to-digital conversion circuit 211 further includes: a digital filter (not shown in fig. 5) connected to the first comparator 2113. The digital filter filters and converts the 64 comparison results to obtain the first data component D _ MSB.
After the conversion of the incremental analog-to-digital conversion circuit 211 is completed, there will be quantization errors that are not converted. The incremental adc circuit 211 amplifies the quantization error by 64 times to obtain an amplified quantization error Vres. The amplification quantization error Vres can be calculated by the following equation.
The incremental analog-to-digital conversion circuit 211 inputs the amplified quantization error Vres to the cyclic analog-to-digital conversion circuit 212 for conversion again.
First, the switch is switched to the A terminal to amplify the quantization error Vres(-0.24V) and a reference signal VbeCollected in the cyclic analog-to-digital conversion circuit 212 (reference signal V)beCollected by the second dac 2124), the switch is switched to the B terminal after the data is collected. The first amplifier 2122 will amplify the quantization error V during acquisitionresThe (-0.24V) amplification is doubled to obtain an amplified result, and the amplified result (-0.48V) is inputted to the second comparator 2123 and the second accumulator 2121.
The second comparator 2123 compares the amplified result with 0, and the amplified result is comparedLess than 0, the second comparator 2123 outputs 0 as its first comparison result. The second DAC 2124 outputs the negative reference signal Vbe(-0.68V) to the second accumulator 2121. The second accumulator 2121 subtracts the negative reference signal V from the output (-0.48V) of the first amplifier 2122be(-0.68V), 0.2V was obtained as output. The first amplifier 2122 amplifies the output of the second accumulator 2121 by 2 times to obtain an amplified result (0.4V), and inputs the amplified result to the second comparator 2123 and the second accumulator 2121.
The second comparator 2123 compares the amplified result with 0, where the amplified result is greater than 0, and the second comparator 2123 outputs 1 as its second comparison result. The second DAC 2124 outputs the positive reference signal Vbe(0.68V) to the second accumulator 2121. The second accumulator 2121 subtracts the positive reference signal V from the output (0.4V) of the first amplifier 2122be(0.68V), yielding-0.28V as an output. The first amplifier 2122 amplifies the output of the second accumulator 2121 by 2 times to obtain an amplified result (-0.56V), and inputs the amplified result to the second comparator 2123 and the second accumulator 2121.
Since the number of bits converted into the second data component by the cyclic analog-to-digital conversion circuit 212 is 8 bits, the above process is stopped after repeating 8 times. The second comparator 2123 outputs 8 comparison results. Each comparison result represents one bit of data in the second data component.
The second data component D _ LSB is obtained by splicing the comparison results output by the second comparator 2123 by using a second splicing circuit (not shown in fig. 5).
Other embodiments of the structure of the analog-to-digital conversion circuit 200 are also possible.
Referring to fig. 6, in some embodiments, the analog-to-digital conversion circuit 200 includes: a signal acquisition circuit 221, a hybrid analog-to-digital conversion circuit 222, and a third splicing circuit 223.
The signal acquisition circuit 221 is connected to the analog front-end circuit 100, and is configured to: acquiring an input signal and a reference signal in a first analog-to-digital conversion mode; and acquiring the quantization error in the second analog-to-digital conversion mode.
The hybrid analog-to-digital conversion circuit 222 is connected to the signal acquisition circuit 221 and the first splicing circuit 300, and is configured to: performing oversampling processing on an input signal based on a reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error, transmitting the first data component to the first splicing circuit 300, and latching the quantization error; performing analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.
The third splicing circuit 223 is connected to the hybrid analog-to-digital conversion circuit 222 and the first splicing circuit 300, and is configured to: the plurality of conversion results are concatenated in the second analog-to-digital conversion mode to obtain a second data component, and the second data component is transmitted to the first concatenation circuit 300.
For example, the specific circuits of the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 are shown in fig. 7.
The signal acquisition circuit 221 comprises a switch SW 1-SW 12 and 4 sampling capacitors Cin. The gate circuit includes switches SW13 through SW 16. In the first analog-to-digital conversion mode, the switch SW1, the switch SW12, the switch SW13 and the switch SW16 are opened, and the switches SW2 to SW11, the switch SW14 and the switch SW15 are closed to acquire an input signal DeltaVbeAnd a reference signal Vbe. Sampling capacitor CinFor holding the acquired signal for a period of time. After the signals are collected, the switch SW14 and the switch SW15 are opened, and the switch SW13 and the switch SW16 are closed, so that the input signals DeltaV can be transmittedbeAnd a reference signal VbeInput to a hybrid analog-to-digital conversion circuit 222. In the first analog-to-digital conversion mode, the second amplifier 2221 in the hybrid analog-to-digital conversion circuit 222 is used as an integrator (the function of which is the same as that of the integrator 2112 described above), and the third comparator 2222 functions as the first comparator 2113. In addition, the third comparator 2222 latches the quantization error, so that the signal acquisition circuit 221 acquires the quantization error in the second analog-to-digital conversion mode.
In the second A/D conversion mode, the switch SW2,The switch SW11, the switch SW13 and the switch SW16 are opened, and the switch SW1, the switches SW3 to SW10, the switch SW12, the switch SW14 and the switch SW15 are closed to collect the quantization error and the reference signal Vbe. After the signals are collected, the switch SW14 and the switch SW15 are opened, and the switch SW13 and the switch SW16 are closed to combine the quantization error with the reference signal VbeInput to a hybrid analog-to-digital conversion circuit 222. In the second analog-to-digital conversion mode, the second amplifier 2221 in the hybrid analog-to-digital conversion circuit 222 is used as an amplifier (the function of which is the same as that of the first amplifier 2122 described above), and the third comparator 2222 functions as the second comparator 2123.
Two capacitors C in the hybrid analog-to-digital conversion circuit 222fFor integrating capacitance, switch SW17 and switch SW18 are coupled to input signal DeltaVbeIt is closed before the transition is made to clear the charge on the integrating capacitor.
In the first analog-to-digital conversion mode, the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 function as the incremental analog-to-digital conversion circuit 211. In the second adc mode, the signal acquisition circuit 221 and the hybrid adc circuit 222 function as the cyclic adc circuit 212 described above.
In the temperature sensor, the signal acquisition circuit 221 and the hybrid analog-to-digital conversion circuit 222 may be used in cooperation to perform oversampling processing on the input signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error, and perform multiple analog-to-digital conversions on the quantization error in the second analog-to-digital conversion mode to obtain multiple conversion results. After obtaining the plurality of conversion results, the third stitching circuit 223 may also be utilized to stitch the plurality of conversion results in the second analog-to-digital conversion mode to obtain the second data component. That is to say, the temperature sensor can meet the conversion requirements of different analog-to-digital conversion modes by adopting the same circuit element, thereby realizing the multiplexing of the circuit element, being beneficial to simplifying the circuit and reducing the volume of the temperature sensor.
Based on the same inventive concept, the embodiment of the present application further provides a temperature sensing method, which is applied to the temperature sensor in some of the foregoing embodiments. Technical effects that can be achieved by the temperature sensor in some of the foregoing embodiments can also be achieved by the temperature sensing method, and details are not repeated here.
Referring to fig. 8, the temperature sensing method includes the following steps.
And S100, responding to the temperature change, and generating an input signal and a reference signal.
S200, in a first analog-to-digital conversion mode, an input signal is quantized based on a reference signal to obtain a first data component and a quantization error.
And S300, after the number of bits of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component.
S400, splicing the first data component and the second data component to obtain target data.
In the temperature sensing method described above, the input signal and the reference signal may be generated in response to a temperature change. After the input signal and the reference signal are obtained, the input signal may be quantized based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error. Then, after the number of bits of the first data component reaches a preset threshold, the quantization error is further quantized in a second analog-to-digital conversion mode to obtain a second data component. The first data component and the second data component may then be concatenated to obtain the target data. Therefore, the target data obtained after conversion has higher conversion precision.
With continued reference to fig. 8, in some embodiments, after obtaining the target data, the temperature conversion method further includes the following steps.
S500, compensating the target data to obtain a temperature value.
In some embodiments, the quantization processing of the input signal in the first analog-to-digital conversion mode comprises: and (5) oversampling treatment.
In the temperature sensing method, the input signal may be oversampled to make the first data component have higher accuracy and to make the quantization error smaller.
Referring to fig. 9, in some embodiments, step S300 includes the following steps.
And S310, acquiring a quantization error after the digit of the first data component reaches a preset threshold value.
S320, performing analog-to-digital conversion on the quantization error for multiple times in a second analog-to-digital conversion mode to obtain multiple conversion results; wherein each conversion result is one bit of data in the second data component.
S330, splicing the plurality of conversion results to obtain a second data component.
The present application further provides a storage medium, on which a computer program is stored, and the computer program, when executed by a processor, implements the steps of the temperature sensing method in some of the foregoing embodiments. The storage medium can achieve the technical effects achieved by the temperature sensing method.
In some embodiments, the processor may be implemented by a general-purpose integrated circuit chip or an application-specific integrated circuit chip, for example, the integrated circuit chip may be disposed on a motherboard, for example, a storage medium, a power supply circuit, and the like may also be disposed on the motherboard; further, a processor may also be implemented by circuitry, or in software, hardware (circuitry), firmware, or any combination thereof.
In some embodiments, the processor may also be a central processing unit, a microprocessor, such as an X86 processor, an ARM processor, or may be a Graphics Processor (GPU) or Tensor Processor (TPU), or may be a Digital Signal Processor (DSP), or the like.
The storage medium used in the embodiments provided herein may each include at least one of a nonvolatile and a volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical storage, or the like. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM), among others.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A temperature sensor, comprising:
an analog front end circuit configured to: generating an input signal and a reference signal in response to a temperature change;
analog-to-digital conversion circuitry coupled to the analog front end circuitry configured to: quantizing the input signal based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error; after the number of bits of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component;
a first stitching circuit connected to the analog-to-digital conversion circuit and configured to: and splicing the first data component and the second data component to obtain target data.
2. The temperature sensor of claim 1, wherein the analog-to-digital conversion circuit comprises:
the incremental analog-to-digital conversion circuit is respectively connected with the analog front-end circuit and the first splicing circuit and is configured to: and performing oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error, and transmitting the first data component to the first splicing circuit.
3. The temperature sensor of claim 2, wherein the analog-to-digital conversion circuit further comprises:
a cyclic analog-to-digital conversion circuit connected to the incremental analog-to-digital conversion circuit and configured to: after the number of bits of the first data component reaches a preset threshold value, acquiring the quantization error, and performing analog-to-digital conversion on the quantization error for multiple times in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each of the conversion results is one bit of data in the second data component;
the second splicing circuit is respectively connected with the circulating analog-to-digital conversion circuit and the first splicing circuit and is configured to: concatenating a plurality of the conversion results to obtain the second data component, and transmitting the second data component to the first concatenation circuit.
4. The temperature sensor of claim 1, wherein the analog-to-digital conversion circuit comprises:
a signal acquisition circuit connected to the analog front end circuit and configured to: acquiring the input signal and the reference signal in the first analog-to-digital conversion mode; and collecting the quantization error in the second analog-to-digital conversion mode;
a hybrid analog-to-digital conversion circuit, connected to the signal acquisition circuit and the first splicing circuit, respectively, and configured to: performing oversampling processing on the input signal based on the reference signal in the first analog-to-digital conversion mode to obtain the first data component and the quantization error, and transmitting the first data component to the first splicing circuit and latching the quantization error; performing analog-to-digital conversion on the quantization error for multiple times in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each of the conversion results is one bit of data in the second data component;
a third splicing circuit, connected to the hybrid analog-to-digital conversion circuit and the first splicing circuit, respectively, and configured to: and splicing a plurality of the conversion results in the second analog-to-digital conversion mode to obtain the second data component, and transmitting the second data component to the first splicing circuit.
5. The temperature sensor of claim 1, further comprising: the digital compensation circuit is connected with the first splicing circuit;
the digital compensation circuit is configured to: and compensating the target data to obtain a temperature value.
6. A method of temperature sensing, comprising:
generating an input signal and a reference signal in response to a temperature change;
quantizing the input signal based on the reference signal in a first analog-to-digital conversion mode to obtain a first data component and a quantization error;
after the number of bits of the first data component reaches a preset threshold value, carrying out quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component;
and splicing the first data component and the second data component to obtain target data.
7. The temperature sensing method of claim 6, wherein the quantization processing of the input signal in the first analog-to-digital conversion mode comprises: and (5) oversampling treatment.
8. The temperature sensing method according to claim 6, wherein after the number of bits of the first data component reaches a preset threshold, performing quantization processing on the quantization error in a second analog-to-digital conversion mode to obtain a second data component, and including:
collecting the quantization error after the number of bits of the first data component reaches a preset threshold;
performing analog-to-digital conversion on the quantization error for multiple times in the second analog-to-digital conversion mode to obtain multiple conversion results; wherein each of the conversion results is one bit of data in the second data component;
concatenating a plurality of the conversion results to obtain the second data component.
9. The temperature sensing method of claim 6, wherein after obtaining the target data, the temperature conversion method further comprises:
and compensating the target data to obtain a temperature value.
10. A storage medium, characterized in that a computer program is stored thereon, which computer program, when being executed by a processor, carries out the steps of the temperature sensing method according to any one of claims 6 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111605761.6A CN114264384A (en) | 2021-12-25 | 2021-12-25 | Temperature sensor, temperature sensing method, and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111605761.6A CN114264384A (en) | 2021-12-25 | 2021-12-25 | Temperature sensor, temperature sensing method, and storage medium |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114264384A true CN114264384A (en) | 2022-04-01 |
Family
ID=80830271
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111605761.6A Pending CN114264384A (en) | 2021-12-25 | 2021-12-25 | Temperature sensor, temperature sensing method, and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114264384A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115603751A (en) * | 2022-10-13 | 2023-01-13 | 河南翔宇医疗设备股份有限公司（Cn） | Control method, device and medium for ADC (analog to digital converter) acquisition |
-
2021
- 2021-12-25 CN CN202111605761.6A patent/CN114264384A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115603751A (en) * | 2022-10-13 | 2023-01-13 | 河南翔宇医疗设备股份有限公司（Cn） | Control method, device and medium for ADC (analog to digital converter) acquisition |
| CN115603751B (en) * | 2022-10-13 | 2024-03-01 | 河南翔宇医疗设备股份有限公司 | ADC acquisition control method, ADC acquisition control device and medium |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US9748969B1 (en) | Method of operation for an oversampled data converter | |
| US20110200070A1 (en) | Adc, a temperature sensor, a non-contact transponder, and a method of converting analog signals to digital signals | |
| CN110514322B (en) | High-precision temperature sensor | |
| US6177899B1 (en) | Analog-to-digital converter having multiple reference voltage comparators and boundary voltage error correction | |
| Maloberti et al. | Design considerations on low-voltage low-power data converters | |
| US7486218B2 (en) | Cyclic analog-to-digital converter | |
| TW201014194A (en) | Data conversion circuitry and method therefor | |
| CN112513598B (en) | Method and circuit for temperature sensing, temperature sensor and electrical appliance | |
| Santos et al. | A survey on nonlinear analog-to-digital converters | |
| CN114264384A (en) | Temperature sensor, temperature sensing method, and storage medium | |
| US10484003B2 (en) | A/D converter | |
| CN106169934B (en) | Temperature compensation circuit for pressure sensor, quantification method of simulation result of temperature compensation circuit and working method of temperature sensor | |
| US20200112318A1 (en) | D/a conversion circuit, quantization circuit, and a/d conversion circuit | |
| JP2011228778A (en) | A/d converter and signal processing circuit | |
| JP2004096636A (en) | Analog/digital conversion circuit | |
| US7746261B2 (en) | Variable gain amplifier and D/A converter | |
| US11867572B2 (en) | Method for implementing Vptat multiplier in high accuracy thermal sensor | |
| CN102594276A (en) | Gain calibration system for instrument amplifier and gain calibration method | |
| CN110071696B (en) | Continuous time integrator for temperature sensor | |
| JP2011109352A (en) | Analog front-end circuit | |
| CN111162788B (en) | Resistive sensor readout circuit with quantization noise shaping | |
| CN111181562B (en) | Logarithmic scale analog-to-digital converter for wide dynamic range avalanche photodiode current companding | |
| JP4357709B2 (en) | Pipeline type A / D converter | |
| Fang et al. | CMOS 12 bits 50kS/s micropower SAR and dual-slope hybrid ADC | |
| JP2010022047A (en) | Variable gain amplifier and d/a converter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |