CN114261534B - Aircraft complete machine electromagnetic pulse test method - Google Patents
Aircraft complete machine electromagnetic pulse test method Download PDFInfo
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- CN114261534B CN114261534B CN202210183992.0A CN202210183992A CN114261534B CN 114261534 B CN114261534 B CN 114261534B CN 202210183992 A CN202210183992 A CN 202210183992A CN 114261534 B CN114261534 B CN 114261534B
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Abstract
The invention relates to the technical field of electromagnetic pulse tests, and discloses an aircraft complete machine electromagnetic pulse test method, which comprises the following steps: s1, assembling the test piece; s2, mounting and positioning the test piece; s3, positioning the current probe, the electric field probe and the magnetic field probe in the test piece; s4, adjusting the position of the test piece to face the pulse generator; s5, starting the pulse generator to generate a set HEMP; s6, rotating the test piece 90 degrees clockwise, returning to execute the step S5 before rotating the test piece 360 degrees clockwise relative to the initial position, and entering the next step when rotating the test piece 360 degrees clockwise relative to the initial position; s7, changing the set parameters of the HEMP, returning to the step S5 until the test of the test piece is finished in all the HEMP environments needing to be tested; the invention combines the actual situation of high-altitude electromagnetic pulse, simulates the phenomenon of high-altitude electromagnetic pulse generated in the nuclear explosion process, and tests and examines the electromagnetic pulse protection of the whole aircraft and internal equipment thereof.
Description
Technical Field
The invention relates to the technical field of electromagnetic pulse tests, in particular to an electromagnetic pulse test method for an aircraft complete machine.
Background
Electromagnetic environmental effects may affect the proper operation of an aircraft and its subsystems and equipment. The threat to the flight safety of the airplane is not only interference, but also key function failure caused by 'hard damage' of the airplane can be generated when the energy density of the space electromagnetic environment reaches a higher threshold value (strong electromagnetic environment). By providing reasonable electromagnetic environment effect requirements, the electromagnetic environment effect acting on the airplane can be controlled, and the normal operation of the airplane is realized.
Study of HEMP (Chinese of HEMP is called high altitude electromagnetic pulse, and its electric field waveform is divided into E1、E2、E3Three parts) are necessary for further developing electromagnetic pulse protection research on the effect generated by the whole airplane, but a uniform executable method for the electromagnetic pulse test of the whole airplane is lacked in the prior art.
Disclosure of Invention
The invention provides an aircraft complete machine electromagnetic pulse test method, which solves the technical problem that a unified executable method is lacked for aircraft complete machine electromagnetic pulse tests in the related technology.
According to one aspect of the invention, the invention provides an electromagnetic pulse test method for an aircraft complete machine, which comprises the following steps:
s1, assembling the test piece, and verifying that the test piece can normally operate under the correct installation condition;
s2, mounting and positioning the test piece to make the center of the test piece located at the point of generating the electric field peak value of the required HEMP;
s3, positioning the current probe, the electric field probe and the magnetic field probe in the test piece so as to confirm that the set peak value of the electric field of the HEMP is generated in the test area pulse by pulse;
s4, adjusting the position of the test piece to face the pulse generator;
s5, starting the pulse generator to generate a set HEMP;
s6, rotating the test piece 90 degrees clockwise, returning to the step S5 before rotating the test piece 360 degrees clockwise relative to the initial position, and entering the next step when rotating the test piece 360 degrees clockwise relative to the initial position;
s7, changing the set parameters of the HEMP, returning to the step S5 until the test of the test piece is finished in all the HEMP environments needing to be tested;
the peak value of the standard electric field of the HEMP is 50kV/m, and the peak values of the standard electric field which are multiples of 10%, 20%, 50% and 100% are taken as the peak values of the electric field of the HEMP to be tested;
e of HEMP1The rising edge of the electric field waveform is 1.8-2.8 ns, and the pulse width is 18-28 ns;
the method for estimating the electromagnetic pulse tolerance of the test piece comprises the following steps of estimating the electromagnetic pulse tolerance of the test piece in advance before selecting the electric field peak value of the HEMP to be tested:
dividing the influence factors of the electromagnetic pulse tolerance into three types, namely a sensitivity factor M, a protection factor F and a transmission factor C;
the sensitivity factor M comprises three sensitivity evaluation items, namely a first sensitivity evaluation item, a second sensitivity evaluation item and a third sensitivity evaluation item;
if the test piece type is mechanical equipment, judging that the rating of the first sensitivity evaluation item is 1, if the test piece type is mechatronic equipment, judging that the rating of the first sensitivity evaluation item is 2, and if the test piece type is electronic equipment, judging that the rating of the first sensitivity evaluation item is 3;
if the number of the semiconductor devices contained in the test piece is more than or equal to 30, judging that the rating of the second sensitivity evaluation item is 3, judging that the number of the semiconductor devices contained in the test piece is 10-30, judging that the rating of the second sensitivity evaluation item is 2, and judging that the number of the semiconductor devices contained in the test piece is less than or equal to 10, and judging that the rating of the second sensitivity evaluation item is 1;
if the power supply voltage of the test piece is less than or equal to 240v, judging that the grade of the third sensitivity evaluation item is 1, judging that the grade of the third sensitivity evaluation item is 2 if the power supply voltage of the test piece is 240-560 v, and judging that the grade of the third sensitivity evaluation item is 3 if the power supply voltage of the test piece is more than or equal to 560 v;
the protection factor F comprises three protection evaluation items, namely a first protection evaluation item, a second protection evaluation item and a third protection evaluation item;
if the power lightning protection level of the test piece is three-level, judging that the rating of the first protection evaluation item is 1, if the power lightning protection level of the test piece is two-level, judging that the rating of the first protection evaluation item is 2, and if the power lightning protection level of the test piece is one-level, judging that the rating of the first protection evaluation item is 3;
if the withstand voltage value of the insulating protective layer of the test piece is more than or equal to 10kV, judging that the rating of the second protection evaluation item is 3, and the withstand voltage value of the insulating protective layer of the test piece is 5-10 kV, judging that the rating of the second protection evaluation item is 2, and judging that the rating of the second protection evaluation item is 1 if the withstand voltage value of the insulating protective layer of the test piece is less than or equal to 5 kV;
if the nominal discharge current of the lightning protector of the test piece is not less than 10kA, judging that the rating of the third protection evaluation item is 3, and the nominal discharge current of the lightning protector of the test piece is 5-10 kA, judging that the rating of the third protection evaluation item is 2, and judging that the rating of the third protection evaluation item is 1, wherein the nominal discharge current of the lightning protector of the test piece is not more than 5 kA;
the transfer factor C comprises three transfer evaluation items, namely a first transfer evaluation item, a second transfer evaluation item and a third transfer evaluation item;
if the number of the functions required to be executed by the test piece is more than or equal to 3, judging that the rating of the first transmission evaluation item is 3, and the number of the functions required to be executed by the test piece is 1-3, judging that the rating of the first transmission evaluation item is 2, and judging that the number of the functions required to be executed by the test piece is less than or equal to 1, and judging that the rating of the first transmission evaluation item is 1;
if the number of the test pieces connected with other equipment is not less than 5, judging that the rating of the second transfer evaluation item is 3, and the number of the test pieces connected with other equipment is 3-5, judging that the rating of the second transfer evaluation item is 2, and judging that the number of the test pieces connected with other equipment is not more than 3, and judging that the rating of the second transfer evaluation item is 1;
if the utilization rate of the test piece is high, the grade of the third transfer evaluation item is judged to be 3, if the utilization rate of the test piece is medium, the grade of the third transfer evaluation item is judged to be 2, and if the utilization rate of the test piece is low, the grade of the third transfer evaluation item is judged to be 1;
the use rate of the test piece is determined based on the use time of the test piece in a set time, the use time of the test piece in the set time exceeds a first time threshold value and is defined as a high use rate, the use time of the test piece in the set time is defined as a medium use rate between a second time threshold value and the first time threshold value, and the use time of the test piece in the set time is defined as a low use rate below the second time threshold value;
the electromagnetic pulse tolerance of the test piece is calculated by the formula: n = F/MC;
the sensitivity factor M is calculated as follows:
wherein M isiA rating of an evaluation item representing an ith sensitivity factor;
the formula for the protection factor F is as follows:
wherein, FiA rating of an evaluation item representing an ith protection factor;
the formula for the transfer factor C is as follows:
wherein, CiA rating of an evaluation item representing an ith delivery factor;
setting a reference threshold value for the electromagnetic pulse tolerance, and comparing the reference threshold value with the reference threshold value to determine the lowest value of the electric field peak value of the tested HEMP;
selecting a standard electric field peak value with the lowest value of the electric field peak value of the HEMP to be tested being a multiple of 50% if the electromagnetic pulse tolerance of the test piece exceeds the first tolerance threshold, and selecting a standard electric field peak value with the lowest value of the electric field peak value of the HEMP to be tested being a multiple of 20% if the electromagnetic pulse tolerance of the test piece is between the second tolerance threshold and the first tolerance threshold; selecting a standard electric field peak value with the lowest value of the electric field peak value of the tested HEMP being a multiple of 10% if the electromagnetic pulse tolerance of the test piece is lower than the second tolerance threshold value.
The pulse generator comprises a first-stage generator, a second-stage generator and a third-stage generator, wherein the first-stage generator, the second-stage generator and the third-stage generator all adopt Marx generators, and the peak value of voltage output by the first-stage generator is 1.85 MV;
the voltage peak value output by the secondary generator is greater than or equal to 0.74MV and less than 1.125 MV;
the voltage peak value output by the three-stage generator is greater than or equal to 0.46MV and less than 0.74 MV;
the output end of the first-stage generator is connected with the first pulse rectifier, the output end of the second-stage generator is connected with the second pulse rectifier, the output end of the third-stage generator is connected with the third pulse rectifier, the first pulse rectifier is connected with the transmitting antenna through the first switch unit, the second pulse rectifier is connected with the transmitting antenna through the second switch unit, and the third pulse rectifier is connected with the transmitting antenna through the third switch unit;
the first switch unit is used for conducting the circuit under the condition that a first switch voltage is exceeded, the second switch unit is used for conducting the circuit under the condition that a second switch voltage is exceeded, and the third switch unit is used for conducting the circuit under the condition that a third switch voltage is exceeded;
the first switch unit, the second switch unit and the third switch unit are all connected to the switch control unit, and the switch control unit can adjust the values of the first switch voltage, the second switch voltage and the third switch voltage;
the distance between the electric field test point and the antenna in the test area is 37 m.
Further, the strategy for the switch control unit to adjust the first switch voltage, the second switch voltage and the third switch voltage is:
when the first-stage generator needs to be connected, adjusting the first switching voltage to be smaller than the output voltage of the first-stage generator and larger than the voltage peak value output by the second-stage generator; adjusting the second switch voltage and the third switch voltage to be greater than the maximum output voltage of the primary generator;
when the secondary generator needs to be connected, adjusting the second switching voltage to be smaller than the output voltage of the secondary generator and larger than the voltage peak value output by the tertiary generator; adjusting the first switch voltage and the third switch voltage to be greater than the maximum output voltage of the secondary generator;
when the three-stage generator needs to be connected, adjusting the voltage of the third switch to be smaller than the output voltage of the three-stage generator; and adjusting the first switching voltage and the second switching voltage to be larger than the maximum output voltage of the three-stage generator.
The first pulse rectifier, the second pulse rectifier and the third pulse rectifier adopt single-stage capacitors which are used for bearing high pulse voltage, and the pulse rising time output by the first-stage generator, the second-stage generator and the third-stage generator can be shortened.
Further, the accuracy of the current probe, the electric field probe and the magnetic field probe is +/-5%.
Furthermore, the range of the electric field peak value of the HEMP required to be output by the pulse generator is 5-50 kV/m.
Further, the first, second, and third switching units employ switches whose closing voltages are adjusted by adjusting the pressure of the insulating gas or the gap of the switches.
Further, the transmitting antenna is used for converting the high-voltage pulse into a plane wave.
The invention has the beneficial effects that:
the invention combines the actual situation of high-altitude electromagnetic pulse, simulates the high-altitude electromagnetic pulse phenomenon generated in the nuclear explosion process, tests and examines the electromagnetic pulse protection of the aircraft complete machine and internal equipment thereof, determines the test flow, method and waveform parameters, forms a unified executable method, solves the problem of lack of standard method reference at present, and provides technical support for improving the nuclear electromagnetic pulse protection capability of the aircraft complete machine.
Drawings
FIG. 1 is a flow chart of an aircraft complete machine electromagnetic pulse test method of the present invention;
FIG. 2 is a waveform diagram of the HEMP of the present invention;
fig. 3 is a block schematic diagram of a pulse generator of the present invention.
In the figure: the pulse correction device comprises a primary generator 111, a first pulse corrector 112, a first switching unit 113, a secondary generator 121, a second pulse corrector 122, a second switching unit 123, a tertiary generator 131, a third pulse corrector 132, a third switching unit 133 and a transmitting antenna 140.
Detailed Description
The subject matter described herein will now be discussed with reference to example embodiments. It should be understood that these embodiments are discussed only to enable those skilled in the art to better understand the subject matter described herein and are not intended to limit the scope, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements discussed without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as needed. In addition, features described with respect to some examples may also be combined in other examples.
Example one
As shown in fig. 1 and 2, an electromagnetic pulse test method for an aircraft complete machine comprises the following steps:
s1, debugging and starting workers to assemble the test piece, and verifying that the test piece can normally run under the correct installation condition; the debugging start-up staff is a test center staff and is responsible for overall test execution, system operation, system monitoring and data analysis. The debug initiation staff will also assist the project manager in understanding any specific results/analysis of the HEMP test on behalf of.
S2, debugging and starting workers to install and position the test piece, and enabling the center of the test piece to be located at a point where the required electric field peak value of the HEMP is generated;
s3, the debugging executive staff positions the current probe, the electric field probe and the magnetic field probe in the test piece so as to confirm that the set HEMP electric field peak value is generated in the test area pulse by pulse;
the debugging and executing staff can also collect and analyze the data of the placed current probe, the placed electric field probe and the placed magnetic field probe. The current probe, the electric field probe and the magnetic field probe are connected to a digitizer on a debugging execution control vehicle through coaxial cables. The digitizer will be computer controlled. All instruments will be verified to function properly.
And S4, positioning the test piece to face the pulse generator. The test piece is verified to run normally. All personnel are directed to the secure area.
S5, the commissioning executive staff will activate the pulse generator to generate the set HEMP. The commissioning executive staff will process the captured current waveform from the current probe and confirm that the correct current waveform was captured, which indicates that the predetermined HEMP was generated. The commissioning personnel will verify that the test piece is functioning properly after being exposed to the HEMP environment.
S6, rotating the test piece 90 degrees clockwise, returning to the step S5 before rotating the test piece 360 degrees clockwise relative to the initial position, and entering the next step when rotating the test piece 360 degrees clockwise relative to the initial position;
and S7, changing the set parameters of the HEMP, and returning to the step S5 until the test piece is tested in all HEMP environments needing to be tested.
The peak value of the standard electric field of the HEMP is 50kV/m, and the peak values of the standard electric field of multiples of 10%, 20%, 50% and 100% are taken as the peak values of the electric field of the HEMP to be tested.
E of HEMP1The rising edge of the electric field waveform is 1.8-2.8 ns, and the pulse width is 18-28 ns.
The accuracy of the current probe, the electric field probe and the magnetic field probe is +/-5%.
The digitizer is a transient digitizer with an operating bandwidth of 750MHz, with a sampling rate of 1 giga per second. The fiber optic data transmission system must equal the operating bandwidth of the transient digitizer. The response of the current probe, the electric field probe and the magnetic field probe is at least 1000 MHz. The length of cable used may vary, but the maximum length is 2 meters.
In the step, when the standard electric field peak values of different multiples are used as the electric field peak value of the HEMP for testing, the range of the electric field peak value of the HEMP required to be output by the pulse generator is 5-50 kV/m;
the pulse generator adopts a Marx generator, but due to the technical limitation of the Marx generator, the output range of the Marx generator is 40-100%; if the maximum electric field peak value is 50kV/m, the minimum electric field peak value which can be met by the device is 20kV/m (40 percent of the maximum electric field peak value);
on the other hand, the Marx generator has high inductance due to the connection of a plurality of capacitor beam stages, so that the pulse rise time is long and the simulation E cannot be satisfied1The rising edge of the electric field waveform is required to be 1.8-2.8 ns; in order to solve the above technical problem, as shown in fig. 3, the pulse generator in the above embodiment of the present invention includes a first-stage generator 111, a second-stage generator 121, and a third-stage generator 131, wherein the first-stage generator 111, the second-stage generator 121, and the third-stage generator 131 all use macbeth generators, and the voltage peak value output by the first-stage generator 111 is 1.85 MV;
assuming that the distance between an electric field test point and an antenna in the test area is 37 m; under ideal calculation conditions: the output range of the primary generator 111 is 40% to 100%; when the voltage output by the primary generator 111 is 0.74MV (40%), the peak value of the electric field which can be generated in the test area is 20kV/m, and when the voltage output by the primary generator 111 is 1.85MV (100%), the peak value of the electric field which can be generated in the test area is 50 kV/m;
the voltage peak value output by the secondary generator 121 is greater than or equal to 0.74MV and less than 1.125 MV;
when the voltage peak value output by the secondary generator 121 is 0.74MV, the electric field peak value in the test area which can be generated within the output range of the secondary generator 121 is 20kV/m at most;
the peak value of the voltage output by the three-stage generator 131 is greater than or equal to 0.46MV and less than 0.74 MV;
when the voltage peak value output by the three-stage generator 131 is 0.46MV, the maximum electric field peak value in the test area which can be generated in the output range of the three-stage generator 131 is 4.9 kV/m;
the first-stage generator 111, the second-stage generator 121 and the third-stage generator 131 are matched with each other, so that the requirements of standard electric field peak values of multiples of 10%, 20%, 50% and 100% in the steps can be met;
the output end of the primary generator 111 is connected with the first pulse rectifier 112, the output end of the secondary generator 121 is connected with the second pulse rectifier 122, the output end of the tertiary generator 131 is connected with the third pulse rectifier 132, the first pulse rectifier 112 is connected with the transmitting antenna 140 through the first switch unit 113, the second pulse rectifier 122 is connected with the transmitting antenna 140 through the second switch unit 123, and the third pulse rectifier 132 is connected with the transmitting antenna 140 through the third switch unit 133;
wherein the first switching unit 113 is used for turning on the circuit under the condition that the first switching voltage is exceeded, the second switching unit 123 is used for turning on the circuit under the condition that the second switching voltage is exceeded, and the third switching unit 133 is used for turning on the circuit under the condition that the third switching voltage is exceeded;
the first switching unit 113, the second switching unit 123, and the third switching unit 133 are all connected to a switching control unit, which can adjust values of the first switching voltage, the second switching voltage, and the third switching voltage;
the strategy for the switch control unit to adjust the first switch voltage, the second switch voltage and the third switch voltage is as follows:
when the primary generator 111 needs to be connected, adjusting the first switching voltage to be smaller than the output voltage of the primary generator 111 and larger than the voltage peak value output by the secondary generator 121; adjusting the second switching voltage and the third switching voltage to be greater than the maximum output voltage of the primary generator 111;
when the secondary generator 121 needs to be connected, adjusting the second switching voltage to be smaller than the output voltage of the secondary generator 121 and to be larger than the voltage peak value output by the tertiary generator 131; adjusting the first switching voltage and the third switching voltage to be greater than the maximum output voltage of the secondary generator 121;
when the third-stage generator 131 needs to be connected, adjusting the third switch voltage to be smaller than the output voltage of the third-stage generator 131; adjusting the first switching voltage and the second switching voltage to be greater than the maximum output voltage of the three-stage generator 131;
in the above-described embodiment of the present invention, the first pulse rectifier 112, the second pulse rectifier 122 and the third pulse rectifier 132 may employ a single-stage capacitor for withstanding a high pulse voltage, which can shorten the rise time of the pulse output from the first-stage generator 111, the second-stage generator 121 and the third-stage generator 131;
in the above-described embodiments of the present invention, the first switching unit 113, the second switching unit 123, and the third switching unit 133 may employ switches that adjust the closing voltage by adjusting the pressure of the insulating gas or the gap of the switches.
In the above-described embodiment of the present invention, the transmitting antenna 140 is used to convert the high voltage pulse into a plane wave.
Example two
On the basis of the first embodiment, in order to improve the efficiency of the test, the electromagnetic pulse tolerance of the test piece can be estimated in advance before the electric field peak value of the HEMP of the test is selected, if the tolerance is higher, the electric field peak value of the lower HEMP can be skipped, if the tolerance is lower, the test needs to be carried out from the electric field peak value of the lower HEMP, the damage to the test piece can be avoided as much as possible in the process of the test, and the test times can be reduced to the maximum extent;
in this embodiment, a method for estimating the electromagnetic pulse tolerance of a test piece is provided, in which the influence factors of the electromagnetic pulse tolerance are divided into three types, namely a sensitivity factor M, a protection factor F, and a transmission factor C, and a calculation formula of the electromagnetic pulse tolerance is as follows: n = F/MC;
for the calculation of the sensitivity factor, the sensitivity factor comprises a plurality of evaluation items, and each evaluation item corresponds to a set score or rating;
in one embodiment of the present invention, the sensitivity factors include the following evaluation items and ratings:
the individual evaluation items and the ratings of the evaluation items can be determined by the above table, and the sensitivity factor can be further calculated by the following formula:
for the calculation of the protection factors, the protection factors comprise a plurality of evaluation items, and each evaluation item corresponds to a set score or rating;
in one embodiment of the invention, the protective factors include the following evaluation items and ratings:
through the table, each evaluation item and the rating of the evaluation item can be determined, and further, the protection factor can be calculated through the following formula:
for the calculation of the transfer factor, the transfer factor comprises a plurality of evaluation items, and each evaluation item corresponds to a set score or rating;
in one embodiment of the invention, the delivery factors include the following evaluation items and ratings:
wherein the definition of the use frequency of the device can be the use time within a set time, the exceeding of a first time threshold is defined as high frequency, the middle frequency is defined between a second time threshold and the first time threshold, and the low frequency is defined below the second time threshold;
the evaluation items and the ratings of the evaluation items can be determined by the table, and the transfer factor can be further calculated by the following formula:
the electromagnetic pulse tolerance of the test piece can be calculated through the method and the steps, a reference threshold value can be set for the electromagnetic pulse tolerance, and the reference threshold value is compared with the reference threshold value to determine the lowest value of the peak value of the electric field of the HEMP to be tested;
for example, setting a first tolerance threshold and a second tolerance threshold, selecting a standard electric field peak value with the lowest value of the electric field peak value of the tested HEMP being a multiple of 50% if the electromagnetic pulse tolerance of the test piece exceeds the first tolerance threshold, and selecting a standard electric field peak value with the lowest value of the electric field peak value of the tested HEMP being a multiple of 20% if the electromagnetic pulse tolerance of the test piece is between the second tolerance threshold and the first tolerance threshold; selecting a standard electric field peak value with the lowest value of the electric field peak value of the tested HEMP being a multiple of 10% if the electromagnetic pulse tolerance of the test piece is lower than the second tolerance threshold value.
One method of setting the first tolerance threshold and the second tolerance threshold is:
with reference to the evaluation items of the sensitivity factor M, the protection factor F, and the transmission factor C in the above three tables, the maximum value of the theoretical electromagnetic pulse tolerance is calculated according to the calculation formula of the electromagnetic pulse tolerance, and the first tolerance threshold and the second tolerance threshold are set with reference to the standard reference tolerance threshold with the maximum value of the theoretical electromagnetic pulse tolerance as the standard reference tolerance threshold.
For example, the first tolerance threshold is set to 0.75 times the standard reference tolerance threshold, and the second tolerance threshold is set to 0.5 times the standard reference tolerance threshold.
The embodiments of the present invention have been described with reference to the drawings, but the present invention is not limited to the above-mentioned specific embodiments, which are only illustrative and not restrictive, and those skilled in the art can make many forms without departing from the spirit and scope of the present invention and the protection scope of the claims.
Claims (8)
1. An aircraft complete machine electromagnetic pulse test method is characterized by comprising the following steps:
s1, assembling the test piece, and verifying that the test piece can normally operate under the correct installation condition;
s2, mounting and positioning the test piece to make the center of the test piece located at the point of generating the electric field peak value of the required HEMP;
s3, positioning the current probe, the electric field probe and the magnetic field probe in the test piece so as to confirm that the set peak value of the electric field of the HEMP is generated in the test area pulse by pulse;
s4, adjusting the position of the test piece to face the pulse generator;
s5, starting the pulse generator to generate a set HEMP;
s6, rotating the test piece 90 degrees clockwise, returning to the step S5 before rotating the test piece 360 degrees clockwise relative to the initial position, and entering the next step when rotating the test piece 360 degrees clockwise relative to the initial position;
s7, changing the set parameters of the HEMP, returning to the step S5 until the test of the test piece is finished in all the HEMP environments needing to be tested;
the peak value of the standard electric field of the HEMP is 50kV/m, and the peak values of the standard electric field which are multiples of 10%, 20%, 50% and 100% are taken as the peak values of the electric field of the HEMP to be tested;
e of HEMP1The rising edge of the electric field waveform is 1.8-2.8 ns, and the pulse width is 18-28 ns;
the method for estimating the electromagnetic pulse tolerance of the test piece comprises the following steps of estimating the electromagnetic pulse tolerance of the test piece in advance before selecting the electric field peak value of the HEMP to be tested:
dividing the influence factors of the electromagnetic pulse tolerance into three types, namely a sensitivity factor M, a protection factor F and a transmission factor C;
the sensitivity factor M comprises three sensitivity evaluation items, namely a first sensitivity evaluation item, a second sensitivity evaluation item and a third sensitivity evaluation item;
if the test piece type is mechanical equipment, judging that the rating of the first sensitivity evaluation item is 1, if the test piece type is mechatronic equipment, judging that the rating of the first sensitivity evaluation item is 2, and if the test piece type is electronic equipment, judging that the rating of the first sensitivity evaluation item is 3;
if the number of the semiconductor devices contained in the test piece is more than or equal to 30, judging that the rating of the second sensitivity evaluation item is 3, judging that the number of the semiconductor devices contained in the test piece is 10-30, judging that the rating of the second sensitivity evaluation item is 2, and judging that the number of the semiconductor devices contained in the test piece is less than or equal to 10, and judging that the rating of the second sensitivity evaluation item is 1;
if the power supply voltage of the test piece is less than or equal to 240v, judging that the grade of the third sensitivity evaluation item is 1, judging that the grade of the third sensitivity evaluation item is 2 if the power supply voltage of the test piece is 240-560 v, and judging that the grade of the third sensitivity evaluation item is 3 if the power supply voltage of the test piece is more than or equal to 560 v;
the protection factor F comprises three protection evaluation items, namely a first protection evaluation item, a second protection evaluation item and a third protection evaluation item;
if the power lightning protection level of the test piece is three-level, judging that the rating of the first protection evaluation item is 1, if the power lightning protection level of the test piece is two-level, judging that the rating of the first protection evaluation item is 2, and if the power lightning protection level of the test piece is one-level, judging that the rating of the first protection evaluation item is 3;
if the withstand voltage value of the insulating protective layer of the test piece is more than or equal to 10kV, judging that the rating of the second protection evaluation item is 3, and the withstand voltage value of the insulating protective layer of the test piece is 5-10 kV, judging that the rating of the second protection evaluation item is 2, and judging that the rating of the second protection evaluation item is 1 if the withstand voltage value of the insulating protective layer of the test piece is less than or equal to 5 kV;
if the nominal discharge current of the lightning protector of the test piece is not less than 10kA, judging that the rating of the third protection evaluation item is 3, and the nominal discharge current of the lightning protector of the test piece is 5-10 kA, judging that the rating of the third protection evaluation item is 2, and judging that the rating of the third protection evaluation item is 1, wherein the nominal discharge current of the lightning protector of the test piece is not more than 5 kA;
the transfer factor C comprises three transfer evaluation items, namely a first transfer evaluation item, a second transfer evaluation item and a third transfer evaluation item;
if the number of the functions required to be executed by the test piece is more than or equal to 3, judging that the rating of the first transmission evaluation item is 3, and the number of the functions required to be executed by the test piece is 1-3, judging that the rating of the first transmission evaluation item is 2, and judging that the number of the functions required to be executed by the test piece is less than or equal to 1, and judging that the rating of the first transmission evaluation item is 1;
if the number of the test pieces connected with other equipment is not less than 5, judging that the rating of the second transmission evaluation item is 3, and the number of the test pieces connected with other equipment is 3-5, judging that the rating of the second transmission evaluation item is 2, and judging that the number of the test pieces connected with other equipment is not more than 3, and judging that the rating of the second transmission evaluation item is 1;
if the utilization rate of the test piece is high, the grade of the third transfer evaluation item is judged to be 3, if the utilization rate of the test piece is medium, the grade of the third transfer evaluation item is judged to be 2, and if the utilization rate of the test piece is low, the grade of the third transfer evaluation item is judged to be 1;
the utilization rate of the test piece is determined based on the time of the use of the test piece in the set time, the time of the use of the test piece in the set time exceeds a first time threshold value and is defined as a high utilization rate, the time of the use of the test piece in the set time is defined as a medium utilization rate between a second time threshold value and the first time threshold value, and the time of the use of the test piece in the set time is below the second time threshold value and is defined as a low utilization rate;
the calculation formula of the electromagnetic pulse tolerance of the test piece is as follows: n = F/MC;
the sensitivity factor M is calculated as follows:
wherein, MiEvaluation item showing the ith sensitivity factorA rating of (a);
the formula for the protection factor F is as follows:
wherein, FiA rating of an evaluation item representing an ith safeguard factor;
the formula for the transfer factor C is as follows:
wherein, CiA rating of an evaluation item representing an ith delivery factor;
setting a reference threshold value for the electromagnetic pulse tolerance, and comparing the reference threshold value with the reference threshold value to determine the lowest value of the electric field peak value of the tested HEMP;
selecting a standard electric field peak value with the lowest value of the electric field peak value of the HEMP to be tested being a multiple of 50% if the electromagnetic pulse tolerance of the test piece exceeds the first tolerance threshold, and selecting a standard electric field peak value with the lowest value of the electric field peak value of the HEMP to be tested being a multiple of 20% if the electromagnetic pulse tolerance of the test piece is between the second tolerance threshold and the first tolerance threshold; selecting a standard electric field peak value with the lowest value of the electric field peak value of the tested HEMP being a multiple of 10% if the electromagnetic pulse tolerance of the test piece is lower than the second tolerance threshold value.
2. The aircraft complete machine electromagnetic pulse test method according to claim 1, wherein the accuracy of the current probe, the electric field probe and the magnetic field probe is +/-5%.
3. The aircraft complete machine electromagnetic pulse test method as claimed in claim 1, wherein the range of the peak value of the electric field of the HEMP required to be output by the pulse generator is 5-50 kV/m.
4. The aircraft complete machine electromagnetic pulse test method according to claim 3, wherein the pulse generator comprises a primary generator, a secondary generator and a tertiary generator, wherein the primary generator, the secondary generator and the tertiary generator all adopt Marx generators, and the voltage peak value output by the primary generator is 1.85 MV;
the voltage peak value output by the secondary generator is greater than or equal to 0.74MV and less than 1.125 MV;
the voltage peak value output by the three-stage generator is greater than or equal to 0.46MV and less than 0.74 MV;
the output end of the first-stage generator is connected with the first pulse rectifier, the output end of the second-stage generator is connected with the second pulse rectifier, the output end of the third-stage generator is connected with the third pulse rectifier, the first pulse rectifier is connected with the transmitting antenna through the first switch unit, the second pulse rectifier is connected with the transmitting antenna through the second switch unit, and the third pulse rectifier is connected with the transmitting antenna through the third switch unit;
the first switch unit is used for conducting the circuit under the condition that a first switch voltage is exceeded, the second switch unit is used for conducting the circuit under the condition that a second switch voltage is exceeded, and the third switch unit is used for conducting the circuit under the condition that a third switch voltage is exceeded;
the first switch unit, the second switch unit and the third switch unit are all connected to the switch control unit, and the switch control unit can adjust the values of the first switch voltage, the second switch voltage and the third switch voltage;
the distance between the electric field test point and the antenna in the test area is 37 m.
5. The aircraft complete machine electromagnetic pulse test method according to claim 4, wherein the strategy for adjusting the first switch voltage, the second switch voltage and the third switch voltage by the switch control unit is as follows:
when the first-stage generator needs to be connected, adjusting the first switching voltage to be smaller than the output voltage of the first-stage generator and larger than the voltage peak value output by the second-stage generator; adjusting the second switch voltage and the third switch voltage to be greater than the maximum output voltage of the primary generator;
when the secondary generator needs to be connected, adjusting the second switching voltage to be smaller than the output voltage of the secondary generator and larger than the voltage peak value output by the tertiary generator; adjusting the first switch voltage and the third switch voltage to be greater than the maximum output voltage of the secondary generator;
when the three-stage generator needs to be connected, adjusting the voltage of the third switch to be smaller than the output voltage of the three-stage generator; and adjusting the first switching voltage and the second switching voltage to be larger than the maximum output voltage of the three-stage generator.
6. The aircraft complete machine electromagnetic pulse test method as claimed in claim 4, wherein the first pulse rectifier, the second pulse rectifier and the third pulse rectifier adopt a single-stage capacitor which is used for bearing high pulse voltage and can shorten the pulse rise time output by the first-stage generator, the second-stage generator and the third-stage generator.
7. The aircraft complete machine electromagnetic pulse test method according to claim 4, wherein the first switch unit, the second switch unit and the third switch unit adopt switches of which closing voltages are adjusted by adjusting insulating gas pressure or gaps of the switches.
8. The aircraft complete machine electromagnetic pulse test method according to claim 4, wherein the transmitting antenna is used for converting the high-voltage pulse into a plane wave.
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