CN114236367B - Improved integrated circuit strip line cell measuring device - Google Patents
Improved integrated circuit strip line cell measuring device Download PDFInfo
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- CN114236367B CN114236367B CN202111547447.7A CN202111547447A CN114236367B CN 114236367 B CN114236367 B CN 114236367B CN 202111547447 A CN202111547447 A CN 202111547447A CN 114236367 B CN114236367 B CN 114236367B
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- 238000005259 measurement Methods 0.000 claims abstract description 49
- 239000002023 wood Substances 0.000 claims description 4
- 238000012360 testing method Methods 0.000 abstract description 52
- 230000005855 radiation Effects 0.000 abstract description 18
- 230000007547 defect Effects 0.000 abstract description 2
- 239000002184 metal Substances 0.000 description 23
- 230000036039 immunity Effects 0.000 description 19
- 238000004088 simulation Methods 0.000 description 18
- 238000013461 design Methods 0.000 description 10
- 239000000047 product Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 238000011160 research Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 239000004020 conductor Substances 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 230000000149 penetrating effect Effects 0.000 description 4
- VQAPWLAUGBBGJI-UHFFFAOYSA-N [B].[Fe].[Rb] Chemical compound [B].[Fe].[Rb] VQAPWLAUGBBGJI-UHFFFAOYSA-N 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000012467 final product Substances 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 241000218666 Metasequoia Species 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000008094 contradictory effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
Abstract
The invention discloses an improved integrated circuit strip line cell measuring device, which comprises a bottom plate, a conductive core plate and a main body with a strip line cell, wherein the main body is fixedly arranged on the bottom plate; the two ends of the main body are provided with radio frequency interfaces, the conductive core plate is positioned in the strip line small chamber, and the two ends of the conductive core plate are respectively connected with core wires of the radio frequency interfaces. By additionally arranging the slots of the dielectric dissipation sheets or the permanent magnet sheets or the core plates in the strip line cells, harmonic waves generated by the higher-order modes can be effectively absorbed, the applicable frequency band of the strip line cells is effectively expanded, the defect of the available measurement frequency band of the traditional strip line cells is overcome, and the radiation emission test of the integrated circuits with wider frequency band is realized. The invention is applied to the technical field of integrated circuit electromagnetic compatibility.
Description
Technical Field
The invention relates to the technical field of integrated circuit electromagnetic compatibility, in particular to an improved integrated circuit strip line cell radiation emission measuring device.
Background
Domestic electromagnetic compatibility research is mainly focused on system-level equipment and products, and electromagnetic compatibility of integrated circuits is started later, and although the research is gradually conducted with the leading research direction of the world, a great gap is still remained. The front-end field is often a foreign high-performance and high-reliability IC product, and the EMC of the system and the integrated circuit is mainly controlled by foreign companies. China does not have a national test and verification standard of integrated circuit EMC, but only considers the chip-level EMC problem in individual application. With the development of domestic chips, aerospace, automobile electronics and other industries, china starts to develop high-performance and high-reliability IC chips with independent intellectual property rights from the national level and inside each industry.
In recent years, more and more circuit designers and application personnel develop research on EMC design and test methods of integrated circuits, and EMC performance has become another important technical index for measuring the performance of integrated circuits. With the improvement of integrated circuit integration, more and more elements are integrated on a chip, the functions and density of a circuit are increased, the speed of transmitting pulse current is increased, the working voltage is reduced, and the problems of electromagnetic interference and anti-interference of the integrated circuit are the problems of design and manufacturing of the integrated circuit. The research of the EMC of the integrated circuit not only relates to the research of the electromagnetic interference and immunity test and design method of the integrated circuit, but also needs to be combined with the application of the integrated circuit, and the EMC requirement of mandatory standards on equipment and systems is combined into the design of the integrated circuit, so that the circuit is easier to design a final product meeting the standards. The integrated circuit with small electromagnetic interference and strong anti-interference capability is more beneficial to the EMC design of the product, the burden of system design can be reduced, the cost of measures such as filtering and shielding is saved, so that the design guidance can be provided for the application of the circuit by developing the EMC design and detection research of the integrated circuit, and the cost of the final product is saved.
The strip line cell method is widely applied to electromagnetic compatibility test, and is an electromagnetic interference measurement method based on the strip line cell. The rectangular part in the middle of the strip line cell is provided with a rectangular window which is matched with the tested circuit board and is used for placing a special evaluation circuit board provided with the tested integrated circuit, the inner side of the PCB is the tested integrated circuit, and the outer side is the peripheral circuit of the integrated circuit and the connecting end of auxiliary equipment. The radiation emission measured is mainly derived from the chip under test. The high-frequency current of the chip to be tested flows on the internal interconnection line, and the internal bonding wires and pins serve as radiation emitting antennas. When the test frequency is lower than the first-order high-order mode frequency of the strip line cell, only the primary mode TEM mode is transmitted, the power transmitted to the two coaxial loads is in direct proportion to the square of the current of the tested sample on the PCB, and therefore the electromagnetic emission performance of the integrated circuit on the circuit board can be evaluated through the spectrum of the test coaxial output end. Along with the increasing integration level of the integrated circuit to be tested, the design is more and more complex, the working frequency is continuously improved, the traditional strip line cell is no longer suitable for measuring the high-frequency-band integrated circuit, and the expansion of the applicable measuring frequency band of the strip line cell is needed. The traditional method for improving the measurement frequency band of the strip line cell is to reduce the volume of the strip line cell, and the first-order high-order mode frequency of the strip line cell is improved along with the reduction of the volume of the cell so as to achieve the purpose of expanding the measurement frequency band, but the method certainly reduces the window opening of the cell so as to limit the size of an integrated circuit to be measured. The test frequency band specified by the stripline cell method universal standards IEC61967-8 and IEC62132-8 for the electromagnetic compatibility test of the integrated circuits is 0-3 GHz at present, and with the development and application of 5G technology, more and more integrated circuit chips with the working frequency above 3GHz are used, and obviously, the existing standard can not meet the measurement of high-frequency integrated circuits.
From the above analysis, in the electromagnetic compatibility test of the integrated circuit, aiming at radiation emission and immunity measurement of the strip line cell of the integrated circuit, on one hand, the test frequency band needs to be improved on the premise of not changing the size of the test area; on the other hand, the national test and verification standard of integrated circuit EMC is required to be developed so as to support the radiation emission measurement of the integrated circuit strip line cell.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention provides an improved integrated circuit strip line cell measuring device which is suitable for a strip line cell measuring method in integrated circuit electromagnetic emission measurement specified by IEC61967-2 and IEC61967-8 and a strip line cell measuring method in integrated circuit immunity measurement specified by IEC62132-2 and IEC 62132-8.
In order to achieve the above object, the present invention provides an improved integrated circuit stripline cell measurement apparatus, comprising a base plate, a conductive core plate, and a main body having a stripline cell, the main body being fixedly disposed on the base plate;
the two ends of the main body are provided with radio frequency interfaces, the conductive core plate is positioned in the strip line small chamber, and the two ends of the conductive core plate are respectively connected with core wires of the radio frequency interfaces.
In one embodiment, the improved integrated circuit stripline cell measurement apparatus further comprises a lossy dielectric sheet positioned within the stripline cell, the lossy dielectric sheet positioned between the base plate and the conductive core plate.
In one embodiment, the lossy dielectric sheet is a dielectric sheet having a dielectric constant greater than 1 and less than 2, and a dielectric loss tangent greater than 0.15 and less than 0.3.
In one embodiment, the consumable media sheet is an air dried metasequoia wood sheet.
In one embodiment, the lossy dielectric sheet is a rectangular plate having the same cross-section as the stripline cells;
the consumable medium sheet is clamped in the strip line small chamber, and the edge contour line of the consumable medium sheet is fixed with the inner wall of the strip line small chamber in a gluing mode.
In one embodiment, the conductive core is located in a central position of the stripline cell and the lossy dielectric sheet is located in a central position between the base plate and the conductive core.
In one embodiment, the improved integrated circuit strip line cell measurement device further comprises two permanent magnet pieces symmetrically arranged on the side walls of the strip line cell and located on two sides of the lead core plate.
In one embodiment, the permanent magnet pieces are rectangular plates with a size smaller than that of the side walls of the strip line cells, and the permanent magnet pieces are glued on the corresponding side walls of the strip line cells in parallel.
In one embodiment, the conductive core plate is located at a middle position of the ribbon wire cell, and the permanent magnet piece is located at a middle position of a corresponding side wall of the ribbon wire cell.
In one embodiment, the guide core plate is provided with a plurality of core plate slits along the electromagnetic wave transmission direction.
In one embodiment, the conductive core plate is located at a middle position of the strip line cell, a connection line between two connection points corresponding to the radio frequency interface on the conductive core plate is a central axis of the conductive core plate, and each core plate gap is symmetrical along the central axis of the conductive core plate.
In one embodiment, the two sides of the central axis of the conductive core plate are provided with at least one core plate gap.
In one embodiment, two ends of the conductive core plate are protruding structures which extend outwards and shrink, and the tail ends of the protruding structures are connected with the core wire of the radio frequency interface in a welding mode.
In one embodiment, the top end of the main body is provided with a plurality of first fixing holes for fixing a PCB board with a chip to be tested.
In one embodiment, the bottom plate is an i-shaped metal plate, and the four corners of the bottom plate are provided with a plurality of second fixing holes.
As the radiation emission and the immunity measurement of the integrated circuit strip line cell, compared with the prior art, the improved radiation emission and the immunity measurement device of the integrated circuit strip line cell provided by the invention has the following advantages:
the test device has the advantages that the applicable frequency band is obviously expanded, and for a common strip line cell with a window of 5X 5cm, the test frequency band is expanded from 0GHz to 6GHz to 0GHz to 11GHz; for the strip line cells with windows of 3X 3cm, the test frequency band is extended from 0-10 GHz to 0-18 GHz, and for the strip line cells with other sizes, the upper limit of the test frequency band is effectively extended by more than 80% on the original basis.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to the structures shown in these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a front view of a modified integrated circuit stripline cell measurement apparatus of example 1 of the present invention;
FIG. 2 is a top view of the improved integrated circuit stripline cell measurement apparatus of example 1 of the present invention prior to rounding of the conductor core;
FIG. 3 is a top view of the improved integrated circuit stripline cell measurement apparatus of example 1 of the present invention after the wire core is rounded;
FIG. 4 is a schematic diagram showing the voltage standing wave ratio and S-parameter simulation results of a conventional 5X 5cm windowed stripline cell in example 1 of the present invention;
FIG. 5 is a front view of a modified integrated circuit stripline cell measurement apparatus of example 2 of the present invention;
FIG. 6 is a top view of an improved integrated circuit stripline cell measurement apparatus of example 2 of the present invention prior to rounding of the conductor core;
FIG. 7 is a top view of the improved integrated circuit stripline cell measurement apparatus of example 2 of the present invention after the wire core is rounded;
FIG. 8 is a schematic diagram showing the voltage standing wave ratio and S-parameter simulation results of the improved integrated circuit stripline cell measurement apparatus of embodiment 2 of the present invention before the lossy dielectric sheet meets the parameter requirements and the wire core board is rounded;
FIG. 9 is a schematic diagram showing the voltage standing wave ratio and S-parameter simulation result of the improved integrated circuit stripline cell measurement apparatus in embodiment 2 of the present invention when the lossy dielectric sheet does not meet the parameter requirements;
FIG. 10 is a schematic diagram showing the voltage standing wave ratio and S-parameter simulation results of the improved integrated circuit stripline cell measurement apparatus of embodiment 2 of the present invention after the lossy dielectric sheet meets the parameter requirements and the wire core is rounded;
FIG. 11 is a front view of a modified integrated circuit stripline cell measurement apparatus of example 3 of the present invention;
FIG. 12 is a top view of an improved integrated circuit stripline cell measurement apparatus of example 3 of the present invention prior to rounding of the conductor core;
FIG. 13 is a top view of the improved integrated circuit stripline cell measurement apparatus of example 3 of the present invention prior to rounding of the conductor core;
FIG. 14 is a schematic diagram showing the voltage standing wave ratio and S-parameter simulation result of the improved integrated circuit strip line cell measurement device in embodiment 3 of the present invention after the permanent magnet sheet is added;
FIG. 15 is a front view of a modified integrated circuit stripline cell measurement apparatus of example 4 of the present invention;
FIG. 16 is a top view of a modified integrated circuit stripline cell measurement apparatus of example 4 of the present invention;
fig. 17 is a schematic diagram showing the simulation results of S parameters and voltage standing wave ratio when the improved integrated circuit strip line cell measuring device in embodiment 4 of the present invention is used for core board slotting.
Reference numerals: a metal shielding shell 1, a radio frequency interface 2, a conductive core plate 3, a consumable medium sheet 401, a permanent magnet sheet 402 and a core plate gap 403.
The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that all directional indicators (such as up, down, left, right, front, and rear … …) in the embodiments of the present invention are merely used to explain the relative positional relationship, movement, etc. between the components in a particular posture (as shown in the drawings), and if the particular posture is changed, the directional indicator is changed accordingly.
Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present invention, the meaning of "plurality" means at least two, for example, two, three, etc., unless specifically defined otherwise.
In the present invention, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; the device can be mechanically connected, electrically connected, physically connected or wirelessly connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
In addition, the technical solutions of the embodiments of the present invention may be combined with each other, but it is necessary to be based on the fact that those skilled in the art can implement the technical solutions, and when the technical solutions are contradictory or cannot be implemented, the combination of the technical solutions should be considered as not existing, and not falling within the scope of protection claimed by the present invention.
Example 1
A first embodiment of an improved integrated circuit stripline cell measurement apparatus of the present invention is shown in fig. 1-2 and generally comprises a base plate, a conductive core plate 3, and a body having a stripline cell. Specifically, the main body is a rectangular columnar structure made of metal, the strip line cell is a rectangular groove penetrating through the main body along the axial direction of the main body, the main body is fixedly arranged on the bottom plate, and the bottom plate and the main body jointly form the metal shielding shell 1. The two ends of the main body are respectively provided with a radio frequency interface 2, the conductive core plate 3 is positioned in the strip line small chamber, and the two ends of the conductive core plate 3 are respectively connected with the core wires of the radio frequency interfaces 2.
In this example, the window size of the stripline cell was 3X 3cm or 5X 5cm. The wave generated by the strip line cell is characterized by an orthogonal electric field (E) and magnetic field (H), in this embodiment, the main body with the strip line cell is a symmetrically designed metal structure, the conductive core plate 3 is installed inside for transmitting electromagnetic waves, and the upper and lower sides of the conductive core plate 3 are free spaces, that is, the conductive core plate 3 is located at the middle position of the strip line cell. The bottom of the strip line cell is a bottom plate serving as a metal shielding cover plate and is fixed below the main body through screws. The top of stripline cell sets up to a square test window, and the top of main part is equipped with a plurality of first fixed orifices of encircleing around the test window, and the test window passes through the cooperation fixed PCB test board of screw and first fixed orifices, and the chip that is surveyed welds on the PCB test board. When the chip is measured to radiate, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with an electromagnetic interference test receiver, and when the chip is electrified to work, the electromagnetic interference test receiver can detect the radiation emission condition of the chip in real time; when the chip immunity is measured, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with a signal source through a power amplifier, after the test frequency is set, the lowest output power for disabling the chip is found according to the chip failure criterion by adjusting the output power of the power amplifier, and the measurement of the chip immunity is completed.
In this embodiment, the two ends of the conductive core plate 3 are protruding structures extending outwards and shrinking, and the ends of the protruding structures are welded with the core wire of the radio frequency interface 2, so as to avoid the conductive core plate 3 contacting with the main body when being connected with the radio frequency interface 2. Specifically, the conductive core plate 3 in this embodiment is a hexagonal structure formed by overlapping and splicing two isosceles quadrilaterals via bottom edges, and the convex structure is located at the bottom corner position of the isosceles trapezoid. As a preferred embodiment, referring to fig. 3, four corners of the conductive core plate 3 are rounded to further improve VSWR value.
In this embodiment, the bottom plate is I shape metal sheet, and four bights of bottom plate all are provided with a plurality of second fixed orifices, and then can more even the installing on the platform with the bottom plate.
Example 2
Fig. 5-6 illustrate a first embodiment of an improved integrated circuit stripline cell measurement apparatus of the present invention, which generally comprises a base plate, a conductive core plate 3, a sheet of lossy medium 401, and a body having a stripline cell. Specifically, the main body is a rectangular columnar structure made of metal, the strip line cell is a rectangular groove penetrating through the main body along the axial direction of the main body, the main body is fixedly arranged on the bottom plate, and the bottom plate and the main body jointly form the metal shielding shell 1. The two ends of the main body are respectively provided with a radio frequency interface 2, the conductive core plate 3 is positioned in the strip line small chamber, the two ends of the conductive core plate 3 are respectively connected with the core wires of one radio frequency interface 2, the consumable medium sheet 401 is positioned in the strip line small chamber, and the consumable medium sheet 401 is positioned between the bottom plate and the conductive core plate 3. According to the device, the dielectric dissipation sheet 401 is arranged below the conductive core plate 3, and then the low-order high-order mode of the strip line cell can be effectively absorbed through the dielectric dissipation sheet 401, so that the cut-off frequency of the first-order high-order mode is shifted upwards, the available test frequency band of the strip line cell is expanded, and radiation emission and noise immunity measurement of chips with higher working frequencies are realized.
The stripline cells have various specifications according to different sizes, and in this embodiment, the stripline cells with windows of 5cm×5cm in embodiment 1 are taken as an example, and the applicable frequency band for measuring the radiation emission and the noise immunity of the chip is 0-6 GHz. In this embodiment, by adding the lossy dielectric sheet 401 on the basis of the original stripline cell in embodiment 1, the lossy dielectric sheet 401 can effectively absorb the harmonic wave generated by the higher order mode, and the applicable frequency band can be extended to 0-11 GHz. In this embodiment, the lossy dielectric sheet 401 is a rectangular plate with the same cross section as the stripline cell, the lossy dielectric sheet 401 is clamped in the stripline cell, and the edge contour line of the lossy dielectric sheet 401 is glued and fixed to the inner wall of the stripline cell. The parameters of the lossy dielectric sheet 401 are required to have a dielectric constant value between 1 and 2 and a tangent value of a dielectric loss angle between 0.15 and 0.3, and frequency expansion to 0-11 GHz can be realized when the lossy dielectric sheet 401 is added below the stripline cell in accordance with the parameters, and frequency expansion can be realized when the parameters of the dielectric sheet slightly exceed the parameters of the lossy dielectric sheet, but the expansion range is smaller than 11GHz. In a specific implementation, the lossy medium sheet 401 may specifically be a wood board meeting the above parameters, for example, a normally air-dried fir wood sheet, preferably 3mm thick.
The wave generated by the strip line cell is characterized by an orthogonal electric field (E) and a magnetic field (H), in this embodiment, the main body with the strip line cell is a symmetrically designed metal structure, the conductive core plate 3 is internally installed for transmitting electromagnetic waves, the upper and lower parts of the conductive core plate 3 are free spaces, that is, the conductive core plate 3 is located at the middle position of the strip line cell, and the lossy dielectric sheet 401 is located at the middle position between the bottom plate and the conductive core plate 3. The bottom of the strip line cell is a bottom plate serving as a metal shielding cover plate and is fixed below the main body through screws. The top of stripline cell sets up to a square test window, and the top of main part is equipped with a plurality of first fixed orifices of encircleing around the test window, and the test window passes through the cooperation fixed PCB test board of screw and first fixed orifices, and the chip that is surveyed welds on the PCB test board. When the chip is measured to radiate, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with an electromagnetic interference test receiver, and when the chip is electrified to work, the electromagnetic interference test receiver can detect the radiation emission condition of the chip in real time; when the chip immunity is measured, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with a signal source through a power amplifier, after the test frequency is set, the lowest output power for disabling the chip is found according to the chip failure criterion by adjusting the output power of the power amplifier, and the measurement of the chip immunity is completed.
In this embodiment, the two ends of the conductive core plate 3 are protruding structures extending outwards and shrinking, and the ends of the protruding structures are welded with the core wire of the radio frequency interface 2, so as to avoid the conductive core plate 3 contacting with the main body when being connected with the radio frequency interface 2. Specifically, the conductive core plate 3 in this embodiment is a hexagonal structure formed by overlapping and splicing two isosceles quadrilaterals via bottom edges, and the convex structure is located at the bottom corner position of the isosceles trapezoid. As a preferred embodiment, referring to fig. 7, four corners of the conductive core plate 3 are rounded to further improve VSWR value.
In this embodiment, the bottom plate is I shape metal sheet, and four bights of bottom plate all are provided with a plurality of second fixed orifices, and then can more even the installing on the platform with the bottom plate.
The improved integrated circuit stripline cell measurement apparatus of this embodiment is further described below with reference to specific examples.
The index requirements for the stripline cell in standard IEC62132-8 mainly include two points, namely, voltage Standing Wave Ratio (VSWR) is less than 1.25, and insertion loss (S21) is less than 3dB. The industry generally accepts that the value of the voltage standing wave ratio is less than 1.25 in the range of 0-3 GHz and can be relaxed to be not more than 2 above 3GHz under the condition that a high-order mode is not generated in the strip line cell. Taking the original strip line cell with a window of 5×5cm in example 1 as an example, the simulation results of the S parameter and the Voltage Standing Wave Ratio (VSWR) are shown in fig. 4, and the actual measurement result of the product is slightly worse than the simulation result. The actual measurement result of the VSWR value of the product on the market at present is as follows: less than 1.25 in the range of 0 to 3 GHz; less than 1.5 in the range of 3 to 5 GHz; less than 1.9 in the range of 5 to 6 GHz; higher order modes begin to appear above 6GHz, and the VSWR value is increased sharply, so that the requirement of the standard IEC62132-8 on the VSWR value is not met. The improved stripline cell provided in this embodiment is provided with the lossy dielectric sheet 401 in the lower half space of the cell, where the parameters of the lossy dielectric sheet 401 are required to have a dielectric constant value between 1 and 2 and a tangent value of a dielectric loss angle between 0.15 and 0.3, and two groups of lossy dielectric sheets 401 are selected, where the parameters of the first group of lossy dielectric sheets 401 satisfy the above ranges, and specific parameters: the dielectric constant is 1.579+ -0.058, the tangent value of the dielectric loss angle is 0.209+ -0.022, and the VSWR simulation result after the lossy dielectric sheet 401 is added is shown in FIG. 8, so that the dielectric loss angle is less than 1.25 in the range of 0-3 GHz; less than 1.5 in the range of 3 to 9 GHz; less than 1.7 in the range of 9 to 11GHz; higher order modes begin to appear above 11GHz, and the VSWR value no longer meets the standard requirement; the parameters of the second set of lossy media sheets 401 do not meet the above ranges, the specific parameters: the dielectric constant is 3+ -0.1, the tangent value of the dielectric loss angle is 0.1, and the VSWR simulation result after the lossy dielectric sheet 401 is added is shown in FIG. 9, so that the VSWR is more than 2 in the range of 0-1 GHz; the VSWR value does not meet the standard requirements. Therefore, the applicable frequency range of the improved strip line cell provided by the embodiment can be expanded from 0GHz to 6GHz to 0GHz to 11GHz. Further, on the basis of the first group of the consumable medium sheets 401, the four corners of the lead core plate 4 are replaced by round angles from straight lines, the simulation result is as shown in fig. 10, and comparing fig. 8 shows that VSWR values after round angles are lower than 1.5 near 9.8GHz and 10.8GHz, which is slightly improved compared with those before round angles.
Example 3
Fig. 11-12 show a first embodiment of an improved integrated circuit stripline cell measurement apparatus of the present invention, which generally comprises a base plate, a conductive core plate 3, permanent magnet pieces 402, and a body with stripline cells. Specifically, the main body is a rectangular columnar structure made of metal, the strip line cell is a rectangular groove penetrating through the main body along the axial direction of the main body, the main body is fixedly arranged on the bottom plate, and the bottom plate and the main body jointly form the metal shielding shell 1. The two ends of the main body are respectively provided with a radio frequency interface 2, the conductive core plate 3 is positioned in the strip line cell, the two ends of the conductive core plate 3 are respectively connected with core wires of the radio frequency interfaces 2, the number of the permanent magnet pieces 402 is two, and the two permanent magnet pieces 402 are symmetrically arranged on the side walls of the strip line cell, which are positioned on the two sides of the conductive core plate 3. According to the device, the permanent magnet pieces 402 are arranged on the inner side walls of the two sides of the metal shielding shell 1, which are positioned on the conductive core plate 3, and then the low-order high-order modes of the strip line cell can be effectively absorbed through the permanent magnet pieces 402, so that the cut-off frequency of the first-order high-order modes is shifted upwards, the available test frequency band of the strip line cell is expanded, and radiation emission and noise immunity measurement of chips with higher working frequencies are realized.
The stripline cells have various specifications according to different sizes, and in this embodiment, the stripline cells with windows of 5cm×5cm in embodiment 1 are taken as an example, and the applicable frequency band for measuring the radiation emission and the noise immunity of the chip is 0-6 GHz. In this embodiment, by adding the permanent magnet piece 402 on the basis of the stripline cell in embodiment 1, the permanent magnet piece 402 can effectively absorb the harmonic wave generated by the higher order mode, and the applicable frequency band can be extended to 0-11 GHz. In this embodiment, the permanent magnet pieces 402 are rectangular plates with dimensions slightly smaller than the inner side walls of the stripline cells, and the permanent magnet pieces 402 are glued in parallel to the middle positions of the corresponding inner side walls of the stripline cells. In a specific implementation, the permanent magnet piece 402 has a magnetic flux density of 3000 gauss, a Landmark factor of 2, a resonance line width of 500OE, and an external magnetization having a value (0,0,1272.7OE) in three components (x, y, z). Still more particularly, the permanent magnet pieces 402 may be specifically rubidium-iron-boron magnets meeting the above-described parameter requirements.
The wave generated by the strip line cell is characterized by an orthogonal electric field (E) and a magnetic field (H), in this embodiment, the main body with the strip line cell is a symmetrically designed metal structure, the conductive core plate 3 is installed inside for transmitting electromagnetic waves, the upper and lower sides of the conductive core plate 3 are free spaces, that is, the conductive core plate 3 is located at the middle position of the strip line cell, and the permanent magnet pieces 402 are located at the inner side walls of two sides of the strip line cell. The bottom of the strip line cell is a bottom plate serving as a metal shielding cover plate and is fixed below the main body through screws. The top of stripline cell sets up to a square test window, and the top of main part is equipped with a plurality of first fixed orifices of encircleing around the test window, and the test window passes through the cooperation fixed PCB test board of screw and first fixed orifices, and the chip that is surveyed welds on the PCB test board. When the chip is measured to radiate, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with an electromagnetic interference test receiver, and when the chip is electrified to work, the electromagnetic interference test receiver can detect the radiation emission condition of the chip in real time; when the chip immunity is measured, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with a signal source through a power amplifier, after the test frequency is set, the lowest output power for disabling the chip is found according to the chip failure criterion by adjusting the output power of the power amplifier, and the measurement of the chip immunity is completed.
In this embodiment, the two ends of the conductive core plate 3 are protruding structures extending outwards and shrinking, and the ends of the protruding structures are welded with the core wire of the radio frequency interface 2, so as to avoid the conductive core plate 3 contacting with the main body when being connected with the radio frequency interface 2. Specifically, the conductive core plate 3 in this embodiment is a hexagonal structure formed by overlapping and splicing two isosceles quadrilaterals via bottom edges, and the convex structure is located at the bottom corner position of the isosceles trapezoid. As a preferred embodiment, referring to fig. 13, the four corners of the conductive core plate 3 are rounded to further improve VSWR value.
In this embodiment, the bottom plate is I shape metal sheet, and four bights of bottom plate all are provided with a plurality of second fixed orifices, and then can more even the installing on the platform with the bottom plate.
The improved integrated circuit stripline cell measurement apparatus of this embodiment is further described below with reference to specific examples.
The index requirements for the stripline cell in standard IEC62132-8 mainly include two points, namely, voltage Standing Wave Ratio (VSWR) is less than 1.25, and insertion loss (S21) is less than 3dB. The industry generally accepts that the value of the voltage standing wave ratio is less than 1.25 in the range of 0-3 GHz and can be relaxed to be not more than 2 above 3GHz under the condition that a high-order mode is not generated in the strip line cell. In this embodiment, taking the strip line cell with a window of 5×5cm in embodiment 1 as an example, the Voltage Standing Wave Ratio (VSWR) simulation result is shown in fig. 4, and the actual measurement result of the product is slightly worse than the simulation result. The actual measurement result of the VSWR value of the product on the market at present is as follows: less than 1.25 in the range of 0 to 3 GHz; less than 1.5 in the range of 3 to 5 GHz; less than 1.9 in the range of 5 to 6 GHz; higher order modes begin to appear above 6GHz, and the VSWR value is increased sharply, so that the requirement of the standard IEC62132-8 on the VSWR value is not met. The improved strip line cell provided in this embodiment has a rubidium-iron-boron magnet sheet added to the inner side wall of the cell, and the VSWR simulation result of the rubidium-iron-boron magnet sheet added and rounded off the conductive core plate 3 is shown in fig. 14, which shows that the strip line cell is less than 1.25 in the range of 0-6 GHz; less than 1.5 in the range of 6 to 11GHz; higher order modes begin to appear above 11GHz and the VSWR value no longer meets the standard requirements. Therefore, the applicable frequency range of the improved strip line cell provided by the embodiment can be expanded from 0GHz to 6GHz to 0GHz to 11GHz.
Example 4
A third embodiment of an improved integrated circuit stripline cell measurement apparatus of the present invention is shown in fig. 15-16 and generally comprises a base plate, a conductive core plate 3, and a body having a stripline cell. Specifically, the main body is a rectangular columnar structure made of metal, the strip line cell is a rectangular groove penetrating through the main body along the axial direction of the main body, the main body is fixedly arranged on the bottom plate, and the bottom plate and the main body jointly form the metal shielding shell 1. The two ends of the main body are respectively provided with a radio frequency interface 2, the conductive core plate 3 is positioned in the strip line small chamber, the two ends of the conductive core plate 3 are respectively connected with the core wires of the radio frequency interfaces 2, and a plurality of core plate gaps 403 are formed in the conductive core plate 3 along the electromagnetic wave transmission direction. The core plate slot 403 can effectively prevent transverse current on the guide core plate 3, so that the cut-off frequency of the first-order high-order mode is shifted upwards, the available test frequency band of the strip line cell is expanded, and radiation emission and noise immunity measurement of chips with higher working frequencies are realized.
The stripline cells have various specifications according to different sizes, and the stripline cell windowed by 5cm×5cm in the embodiment is taken as an example in the embodiment 1, and the applicable frequency band for measuring the radiation emission and the noise immunity of the chip is 0-6 GHz. In this embodiment, the core board slits 403 are longitudinally formed in the core board of the original stripline cell in embodiment 1, and the core board slits 403 can effectively prevent the transverse current on the core board, so that the working bandwidth can be extended to 7GHz. In this embodiment, the conductive core plate 3 is located in the middle of the stripline chamber, the connection line between two connection points corresponding to the radio frequency interface 2 on the conductive core plate 3 is the central axis of the conductive core plate 3, each core plate slit 403 is symmetrical along the central axis of the conductive core plate 3, and at least one core plate slit 403 is provided on two sides of the central axis of the conductive core plate 3. In the specific implementation process, two core plate slits 403 are respectively arranged on two sides of the central axis of the conductive core plate 3, and the length of each core plate slit 403 is 20 mm, the width of each core plate slit is 1.5 mm, and the core plate slits are distributed at positions 9 mm and 14 mm away from the two sides of the central axis of the conductive core plate 3.
The wave generated by the strip line cell is characterized by an orthogonal electric field (E) and a magnetic field (H), in this embodiment, the main body with the strip line cell is a symmetrically designed metal structure, the conductive core plate 3 is internally installed for transmitting electromagnetic waves, the upper and lower sides of the conductive core plate 3 are free spaces, namely, the conductive core plate 3 is positioned in the middle of the strip line cell, the bottom of the strip line cell is a bottom plate serving as a metal shielding cover plate, and the bottom plate is fixed below the main body through screws. The top of stripline cell sets up to a square test window, and the top of main part is equipped with a plurality of first fixed orifices of encircleing around the test window, and the test window passes through the cooperation fixed PCB test board of screw and first fixed orifices, and the chip that is surveyed welds on the PCB test board. When the chip is measured to radiate, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with an electromagnetic interference test receiver, and when the chip is electrified to work, the electromagnetic interference test receiver can detect the radiation emission condition of the chip in real time; when the chip immunity is measured, the radio frequency interface 2 at one end of the strip line cell is connected with a matching load, the radio frequency interface 2 at the other end is connected with a signal source through a power amplifier, after the test frequency is set, the lowest output power for disabling the chip is found according to the chip failure criterion by adjusting the output power of the power amplifier, and the measurement of the chip immunity is completed.
In this embodiment, the two ends of the conductive core plate 3 are protruding structures extending outwards and shrinking, and the ends of the protruding structures are welded with the core wire of the radio frequency interface 2, so as to avoid the conductive core plate 3 contacting with the main body when being connected with the radio frequency interface 2. Specifically, the conductive core plate 3 in this embodiment is a hexagonal structure formed by overlapping and splicing two isosceles quadrilaterals via bottom edges, and the convex structure is located at the bottom corner position of the isosceles trapezoid. It should be noted that, compared with embodiments 1, 2 and 3, if the four corners of the conductive core plate 3 are rounded on the basis of opening the core plate slits 403 in embodiment 4, the VSWR value cannot be improved, but the VSWR value is increased, so that the conductive core plate 3 is not rounded in this embodiment.
In this embodiment, the bottom plate is I shape metal sheet, and four bights of bottom plate all are provided with a plurality of second fixed orifices, and then can more even the installing on the platform with the bottom plate.
The improved integrated circuit stripline cell measurement apparatus of this embodiment is further described below with reference to specific examples.
The index requirements for the stripline cell in standard IEC62132-8 mainly include two points, namely, voltage Standing Wave Ratio (VSWR) is less than 1.25, and insertion loss (S21) is less than 3dB. The industry generally accepts that the value of the voltage standing wave ratio is less than 1.25 in the range of 0-3 GHz and can be relaxed to be not more than 2 above 3GHz under the condition that a high-order mode is not generated in the strip line cell. Taking the strip line cell with a window of 5×5cm in the embodiment 1 as an example in this embodiment, the Voltage Standing Wave Ratio (VSWR) simulation result is shown in fig. 4, and the actual measurement result of the product is slightly worse than the simulation result. The actual measurement result of the VSWR value of the product on the market at present is as follows: less than 1.25 in the range of 0 to 3 GHz; less than 1.5 in the range of 3 to 5 GHz; less than 1.9 in the range of 5 to 6 GHz; higher order modes begin to appear above 6GHz, and the VSWR value is increased sharply, so that the requirement of the standard IEC62132-8 on the VSWR value is not met. The improved strip line cell provided in this embodiment has a core slot 403 formed in the conductive core 3 in the cell, and the VSWR simulation result after the core slot 403 is added is shown in fig. 17, and it can be seen that the VSWR simulation result is less than 1.25 in the range of 0 to 7GHz. Therefore, the applicable frequency range of the improved strip line cell provided by the embodiment can be expanded from 0GHz to 6GHz to 0GHz to 7GHz.
The foregoing description is only of the preferred embodiments of the present invention and is not intended to limit the scope of the invention, and all equivalent structural changes made by the description of the present invention and the accompanying drawings or direct/indirect application in other related technical fields are included in the scope of the invention.
Claims (2)
1. An improved integrated circuit strip line cell measuring device is characterized by comprising a bottom plate, a conductive core plate and a main body with a strip line cell, wherein the main body is fixedly arranged on the bottom plate;
the two ends of the main body are provided with radio frequency interfaces, the conductive core plate is positioned in the strip line small chamber, and the two ends of the conductive core plate are respectively connected with core wires of the radio frequency interfaces;
the device further comprises a lossy dielectric sheet, wherein the lossy dielectric sheet is positioned in the strip line cell, and the lossy dielectric sheet is positioned between the bottom plate and the conductive core plate;
the dielectric sheet with the dielectric constant equal to 1.579+/-0.058 and the dielectric loss tangent value greater than 0.15 and less than 0.3;
the four corners of the conductive core plate are all of a rounded corner structure so as to further improve the VSWR value;
the consumable medium sheet is air-dried fir wood sheet, and the thickness is 3mm.
2. The improved integrated circuit stripline cell measurement apparatus of claim 1, wherein the conductive core plate has outwardly extending and converging raised structures at both ends, the ends of the raised structures being soldered to the core wires of the radio frequency interface.
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| PCT/CN2022/116112 WO2023109190A1 (en) | 2021-12-16 | 2022-08-31 | Improved integrated circuit stripline cell measuring device |
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