CN114236285A

CN114236285A - Electric measurement dynamic self-checking test system for detonation experiment and test method thereof

Info

Publication number: CN114236285A
Application number: CN202111542515.0A
Authority: CN
Inventors: 张信; 文雪峰; 李波; 杨振伟; 蒲国红
Original assignee: Institute of Fluid Physics of CAEP
Current assignee: Institute of Fluid Physics of CAEP
Priority date: 2021-12-14
Filing date: 2021-12-14
Publication date: 2022-03-25
Anticipated expiration: 2041-12-14
Also published as: CN114236285B

Abstract

The invention relates to the technical field of an integrated detonation experiment testing system, and discloses an electric testing dynamic self-checking testing system for a detonation experiment, which comprises a trigger module, a signal delay circuit and a plurality of switch conducting circuits, wherein the trigger module is used for triggering the signal delay circuit; the trigger module is used for providing a trigger signal to the signal delay circuit, and meanwhile, the trigger signal is synchronously output through the synchronous output module; the signal delay circuit is provided with a plurality of output channels, the triggering time of each output channel is sequentially delayed for a plurality of nanoseconds, and each channel outputs a triggering line number to the electric probe circuit through the corresponding switch conduction circuit. The invention realizes the time-sharing discharge of the multi-path electric probe, delays the time among all the channels by a plurality of nanoseconds for increasing, and can quickly check the state of each channel on an oscilloscope.

Description

Electric measurement dynamic self-checking test system for detonation experiment and test method thereof

Technical Field

The invention relates to the technical field of an integrated detonation experiment testing system, in particular to an electric testing dynamic self-checking testing system for a detonation experiment and a testing method thereof.

Background

In large-scale detonation integrated test, the time signal of electric probe commonly used distinguishes the physical change process, the signal of a large amount of electric probe monitoring often has in a test device, it is normal in order to guarantee that every probe circuit of electric probe is normal, it is normal to take the mode of scraping the signal with the hand to every passageway to confirm the return circuit usually, this work is accomplished to the manual inspection return circuit of once so needs a large amount of manpowers and time usually, the manual inspection of two to three times is needed in general large-scale test, the time has also been increased for whole experimental period simultaneously.

In a large-scale test, a master control system usually examines each subsystem comprehensively for many times, but an electric probe signal can be a signal only when a physical device is required to explode and impact to enable two ends of the probe to be short-circuited, so that each time of joint test only can examine the triggering of an oscillograph group, an electric probe loop cannot be examined, and if a certain path of signal has a fault, a problem cannot be found basically.

The simplification of the test flow improves the efficiency, the traditional test can add a simulation device for dynamic examination before the formal test to examine whether all the systems are normal, the introduction of the simulation test device can increase much consumption on time schedule and manpower and financial resources, the examination of the dynamic simulation device is cancelled after the current flow is optimized, the success rate of each channel is also required without the opportunity of dynamic examination, and the pressure of the electric probe system is higher.

Disclosure of Invention

Aiming at the three aspects of the situation, in order to fully examine the electric probe system, reduce the operation flow and shorten the whole experiment time and ensure the reliability of a large-scale electric signal loop, the invention provides the dynamic self-examination test system and the test method for the electric probe system for the detonation experiment, only one trigger is needed to be given to equipment to finish the electric probe discharge process and present discharge data on an oscilloscope, meanwhile, the real whole system examination connection effect can be finished, the formal device is directly connected after the final joint test is finished, the condition that the experiment operator spends a large amount of time outside to carry out individual test on each channel is reduced, and the self-examination efficiency is greatly improved.

The invention is realized by the following technical scheme:

a dynamic self-checking test system for electric measurement of detonation experiment comprises a trigger module, a signal delay circuit and a plurality of switch conduction circuits;

the trigger module is used for providing a trigger signal to the signal delay circuit, and meanwhile, the trigger signal is synchronously output through the synchronous output module;

the signal delay circuit is provided with a plurality of output channels, the trigger time of each output channel is sequentially delayed for a plurality of nanoseconds, and each channel outputs a trigger line number to the electric probe circuit through the corresponding switch conduction circuit.

As an optimization, the triggering module comprises a manual triggering submodule, an optical triggering submodule and an electric triggering submodule.

As an optimization, the manual trigger sub-module includes a MAX6817 chip and a peripheral circuit of the MAX6817 chip, and an output end of the MAX6817 chip is connected to an input end of the signal delay circuit.

As an optimization, the signal delay circuit comprises a plurality of delay chips connected in series and a peripheral circuit of the delay chips, wherein the input end of the delay chip located at the head position in the transmission direction of the trigger signal is connected with the output end of the trigger module, and the output end of the last position of the delay chip located at the tail position transmits the trigger signal to the switch-on circuit through a channel; and the last set output end of the previous time delay chip is connected with the input end of the next time delay chip, and the output end of the non-last set on the time delay chip transmits a trigger signal to the switch conduction circuit through a channel.

As optimization, the delay chip adopts a DS1005 chip.

Preferably, the switch conducting circuit comprises a triode, a transformer, a mos switch and a BNC connector, wherein the base electrode of the triode is connected with the output end of the signal delay circuit, the emitting electrode of the triode is grounded, the collecting electrode of the triode is connected with one primary end of the transformer, and the other primary end of the transformer is connected with a power supply; and the grid and the drain of the mos switch are respectively connected with two secondary ends of the transformer, and the source and the drain of the mos switch are also respectively connected with the BNC connector.

Preferably, the mos switch is an N MOSFET switch.

Preferably, the triode is an NPN triode.

The analog trigger electric probe comprises a signal delay circuit, an adapter and a synchronous output module, wherein the input end of the adapter is connected with a plurality of output channels of the signal delay circuit through the synchronous output module, and the output end of the adapter is connected with an oscilloscope and used for displaying a trigger signal of the analog trigger electric probe.

The invention also discloses a testing method of the electric testing dynamic self-checking testing system based on the detonation experiment, which comprises the following steps:

step 1, a trigger signal is sent to a signal delay circuit through the trigger module;

step 2, sequentially delaying a plurality of output channels of the signal delay circuit for a plurality of nanoseconds to output trigger signals to corresponding switch conducting circuits;

and 3, transmitting the trigger signal to the corresponding electric probe circuit by the switch conduction circuit so as to simulate the trigger electric probe circuit.

Compared with the prior art, the invention has the following advantages and beneficial effects:

the invention realizes the time-sharing discharge of the multi-path electric probe, delays a plurality of nanoseconds among all the channels and increases progressively, can quickly check the state of each output channel on the oscilloscope, really realizes the purpose of the whole system joint test check, only needs to connect once when the system is built, can check the system electric probe system for a plurality of times, and can greatly improve the working efficiency of the operation of the test system.

Drawings

In order to more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the drawings that are required to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and that for those skilled in the art, other related drawings can be obtained from these drawings without inventive effort. In the drawings:

FIG. 1 is a system block diagram of an electrical test dynamic self-test system for detonation experiments according to the present invention;

FIG. 2 is a circuit diagram of the manual trigger submodule and the signal delay circuit in FIG. 1;

FIG. 3 is a circuit diagram of a switch conduction circuit;

FIG. 4 is a circuit diagram of an adapter;

FIG. 5 is a signal diagram of an oscilloscope demonstrating the simulation of a trigger electrical probe by the detonation experimental electrical measurement dynamic self-checking test system.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.

Example 1

As shown in fig. 1-5, an electrical measurement dynamic self-checking test system for detonation experiments includes a trigger module, a signal delay circuit, and a plurality of switch conduction circuits;

the trigger module is used for providing a trigger signal to the signal delay circuit, and meanwhile, the trigger signal is synchronously output through the synchronous output module; in this embodiment, the triggering module includes a manual triggering sub-module, an optical triggering sub-module, and an electrical triggering sub-module. The manual trigger submodule comprises a MAX6817 chip and a peripheral circuit of the MAX6817 chip, and the output end of the MAX6817 chip is connected with the input end of the signal delay circuit. As shown in FIG. 2, the peripheral circuit of the manual trigger submodule comprises a resistor R14 and a capacitor C4. The electric probe circuit, the optical trigger sub-module and the electric trigger sub-module are all in the prior art, and can be obtained by those skilled in the art according to the prior knowledge, and are not described herein again.

The signal delay circuit is provided with a plurality of output channels, the trigger time of each output channel is sequentially delayed for a plurality of nanoseconds, and each channel outputs a trigger line number to the electric probe circuit through the corresponding switch conduction circuit. The forward delay here means that the delay time of each output channel is sequentially increased, for example, the delay time of channel 1 is 100ns, the delay time of channel 2 is 200ns, and the delay time of channel 3 is 300ns

In this embodiment, the signal delay circuit includes a plurality of delay chips connected in series and a peripheral circuit of the delay chip, as shown in fig. 2, the delay chip is a DS1005 chip, the peripheral circuit includes a resistor, one end of the resistor is connected to an input end of the DS1005 chip, the other end of the resistor is connected to a ground end of the DS1005 chip, an input end of the delay chip located at a first position in a transmission direction of the trigger signal is connected to an output end of the trigger module, and an output end of an end position of the delay chip located at a last position transmits the trigger signal to the switch-on circuit through a channel; and the last set output end of the previous time delay chip is connected with the input end of the next time delay chip, and the output end of the non-last set on the time delay chip transmits a trigger signal to the switch conduction circuit through a channel. Specifically, as shown in fig. 2, the first delay chip is U1, the last delay chip is U10, and the pin of the last set output terminal of the delay chip DS1005 is TAP5, and meanwhile, for example, the chip U2 is the previous delay chip and the chip U3 is the next delay chip.

The quantity of the time delay chips can be set according to the quantity of the electric probes to be tested. In this embodiment, a self-test system can test 60 electrical probes, and then 15 delay chips and their peripheral circuits are provided.

As shown in fig. 3, in the present embodiment, the switch conducting circuit includes a transistor Q11, a transformer T1, a mos switch Q1, and a BNC connector Q5, the mos switch is an N MOSFET switch, and the transistor is an NPN transistor.

The base electrode of the triode is connected with the output end of the signal delay circuit, the emitting electrode of the triode is grounded, the collector electrode of the triode is connected with one primary end of the transformer, and the other primary end of the transformer is connected with a power supply; and the grid and the drain of the mos switch are respectively connected with two secondary ends of the transformer, and the source and the drain of the mos switch are also respectively connected with the BNC connector.

The working principle of the circuit is as follows: the trigger signal is received and then sent to a signal delay circuit for outgoing, the signal delay circuit is formed by serially connecting delay lines DS1005-100 chips, the chip outputs 100ns of delay time among the triggering of each channel of 5 channels, then the trigger switch conducting circuit is output through a signal delay control circuit, after SG1 receives the signal, 15V given by a storage battery passes through R3 and then passes through a transformer primary and then is conducted as a triode Q11, so that a-15V signal is generated by a transformer secondary, the MOSFET switch Q1 is triggered through a current limiting resistor R1, and then two ends of a BNC connector Q5 are closed to achieve an analog triggering state, and the trigger signal is sent to an electric probe.

In this embodiment, the analog trigger device further includes an adapter and a synchronous output module, an input end of the adapter is connected with the plurality of output channels of the signal delay circuit through the synchronous output module, and an output end of the adapter is connected with an oscilloscope so as to display a trigger signal of the analog trigger electric probe.

Taking the detonation of a certain explosive as an example of a ball experiment, 180 electric probe test points are uniformly and densely distributed on the spherical surface of the explosive, only 3 dynamic self-test systems are needed (assuming that one self-test system can test 60 electric probes). The trigger signal of the synchronizer (trigger module) for triggering the oscilloscope is divided into three paths to trigger three sets of systems respectively, the systems are connected with the oscilloscope in a recording mode, and when self-checking is needed, the discharging process of all the measuring points of the electric probes can be completed only by triggering the synchronizer. When the whole system joint test is needed, the detonating device triggers the synchronous machine, the synchronous machine outputs a trigger signal to simultaneously trigger the oscilloscope and the dynamic self-checking system to realize the discharge check of the electric probe, so that the joint test can be triggered at any time.

The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.

Claims

1. A dynamic self-checking test system for electrical measurement of detonation experiments is characterized by comprising a trigger module, a signal delay circuit and a plurality of switch conduction circuits;

the trigger module is used for providing a trigger signal to the signal delay circuit;

2. The detonation experimental electrical logging dynamic self-test system of claim 1, wherein the triggering module comprises a manual triggering sub-module, an optical triggering sub-module and an electrical triggering sub-module.

3. The detonation experimental electrical logging dynamic self-test system of claim 1, wherein the manual trigger sub-module comprises a MAX6817 chip and a peripheral circuit of the MAX6817 chip, and an output end of the MAX6817 chip is connected to an input end of the signal delay circuit.

4. The system according to claim 1, wherein the signal delay circuit comprises a plurality of delay chips connected in series and a peripheral circuit of the delay chips, an input end of the delay chip located at the head in the transmission direction of the trigger signal is connected with an output end of the trigger module, and an output end of the delay chip located at the tail transmits the trigger signal to the switch-on circuit through a channel; and the last set output end of the previous time delay chip is connected with the input end of the next time delay chip, and the output end of the non-last set on the time delay chip transmits a trigger signal to the switch conduction circuit through a channel.

5. The detonation experimental electrical logging dynamic self-test system of claim 4, wherein the delay chip is a DS1005 chip.

6. The detonation experimental electrical logging dynamic self-checking test system according to claim 1, wherein the switch conducting circuit comprises a triode, a transformer, a mos switch and a BNC connector, wherein a base of the triode is connected with an output end of the signal delay circuit, an emitter of the triode is grounded, a collector of the triode is connected with one primary end of the transformer, and the other primary end of the transformer is connected with a power supply; and the grid and the drain of the mos switch are respectively connected with two secondary ends of the transformer, and the source and the drain of the mos switch are also respectively connected with the BNC connector.

7. The detonation experimental electrical logging dynamic self-test system of claim 6, wherein the mos switch is an N MOSFET switch.

8. The detonation experimental electrical logging dynamic self-test system of claim 6, wherein the triode is an NPN type triode.

9. The detonation experimental electrical logging dynamic self-inspection testing system of claim 1, further comprising an adapter and a synchronous output module, wherein an input end of the adapter is connected with the plurality of output channels of the signal delay circuit through the synchronous output module, and an output end of the adapter is connected with an oscilloscope so as to display a trigger signal for simulating a trigger electric probe.

10. A testing method of the detonation experimental electrical measurement dynamic self-test system based on any one of claims 1 to 9, characterized by comprising the following steps: