CN114235799B - Method and device for acquiring pure object function - Google Patents

Method and device for acquiring pure object function Download PDF

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Publication number
CN114235799B
CN114235799B CN202111365117.6A CN202111365117A CN114235799B CN 114235799 B CN114235799 B CN 114235799B CN 202111365117 A CN202111365117 A CN 202111365117A CN 114235799 B CN114235799 B CN 114235799B
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function
wave function
aperture plane
diffraction
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CN114235799A (en
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赵江涛
张福才
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Southwest University of Science and Technology
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Southwest University of Science and Technology
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    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications

Abstract

The application provides a method and a device for acquiring a pure object function, and relates to the technical field of microscopy and imaging. The method comprises the steps of obtaining object-free diffraction intensity data in a first modulated imaging scene; obtaining diffraction intensity data of an object in a second modulation imaging scene; updating the ith exit wave function of the aperture plane according to the ith exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene; and under the second modulation imaging scene, determining an (i+1) th pure object function of the first object according to the (i) th emergent wave function of the aperture plane updated under the first modulation imaging scene, the diffraction intensity data of the object and the (i) th pure object function of the first object to obtain a target pure object function of the first object, wherein i is a positive integer greater than 1. In the coherent modulation imaging system, the application can obtain a pure object function and realize high-quality microscope imaging of an object without illumination artifact.

Description

Method and device for acquiring pure object function
Technical Field
The application belongs to the technical field of microscopy and imaging, and particularly relates to a method and a device for acquiring a pure object function.
Background
Currently, in the field of coherent diffraction imaging, the traditional coherent modulation imaging method is most prominent. However, the conventional coherent modulation imaging method can only obtain the combined function information of the exit wave function and the object function of the aperture plane, and cannot separate the object function from the combined function information, that is, the conventional coherent modulation imaging method cannot obtain the pure object function. Thus, the method is unfavorable for realizing high-quality microscope imaging of the object without illumination artifact and is unfavorable for researching the object.
Disclosure of Invention
The embodiment of the application provides a method and a device for acquiring a pure object function, which can acquire the pure object function of an object, thereby being beneficial to realizing high-quality microscope imaging of the object without illumination artifacts and being beneficial to researching the object.
To achieve the above object, in a first aspect, an embodiment of the present application provides a method for acquiring a pure object function, including:
obtaining diffraction intensity data of no object in a first modulation imaging scene;
obtaining diffraction intensity data of objects in a second modulated imaging scene, wherein the second modulated imaging scene differs from the first modulated imaging scene in that the second modulated imaging scene comprises first objects and the first modulated imaging scene does not comprise the first objects;
Determining an ith exit wave function of an aperture plane according to the ith-1 exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the ith-1' exit wave function of the aperture plane under a first modulation imaging scene, wherein the first modulation imaging scene and a second modulation imaging scene comprise aperture planes;
updating the ith exit wave function of the aperture plane according to the ith exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene;
in a second modulation imaging scene, determining an i+1th pure object function of the first object according to an i-th exit wave function of the aperture plane updated in the first modulation imaging scene, the object diffraction intensity data and an i-th pure object function of the first object, wherein the i+1th pure object function is used for determining a target pure object function of the first object;
i is a positive integer greater than 1.
Specifically, the i-1' th exit wave function of the aperture plane is the updated result of the i-1 th exit wave function of the aperture plane in the second modulation imaging scene.
In the method for acquiring the pure object function, firstly, updating the ith exit wave function of the aperture plane according to the diffraction intensity data of the non-object, the limited size constraint of the aperture plane and the ith exit wave function of the aperture plane in a first modulation imaging scene; and in the second modulation imaging scene, determining the (i+1) th pure object function of the first object according to the (i) th exit wave function of the aperture plane, the (i) th pure object function of the first object and the diffraction intensity data of the object updated in the first modulation imaging scene, and determining the target pure object function of the first object according to the (i+1) th pure object function of the first object. Since the emergent wave functions of the aperture plane should be kept consistent in the first modulated imaging scene and the second modulated imaging scene; thus, the present application can utilize the exit wave function of the aperture plane obtained in the first modulated imaging scene as a parameter input in the second modulated imaging scene. And then obtaining a pure object function of the first object by utilizing the diffraction intensity data of the object, and further obtaining a target pure object function of the first object. Wherein the target pure object function of the first object is advantageous for achieving high quality microscopic imaging of the first object without illumination artifacts, facilitating investigation of the first object.
Optionally, the second modulated imaging scene is composed of an aperture of the aperture plane, the first object, the modulator and a detection element for recording the above-mentioned diffraction intensity data of the object.
Optionally, in a second modulated imaging scene, determining an ith illumination probe function according to an ith exit wave function of the aperture plane updated in the first modulated imaging scene;
determining an ith outgoing wave function of the first object according to the ith illumination probe function and an ith pure object function of the first object;
determining an ith object diffraction field according to an ith exit wave function of the first object, wherein the ith object diffraction field consists of ith object diffraction amplitude data and ith object diffraction phase data;
replacing the ith object diffraction amplitude data in the ith object diffraction field with square root operation results of the object diffraction intensity data, and determining an updated ith object diffraction field;
updating the ith emergent wave function of the first object according to the updated ith diffraction field of the object;
and determining an i+1 pure object function of the first object according to the i-th emergent wave function of the first object, the i-th emergent wave function of the updated first object, the i-th illumination probe function and the i-th pure object function.
In the above-described aspect, the i-th object diffraction amplitude data in the i-th object diffraction field is replaced with the square root operation result of the object diffraction intensity data, so that the updated i-th object diffraction field is made closer to the true value. Since the ith object diffraction field contains the diffraction information of the aperture, the first object and the modulator; thus, the updated first object ith exit wave function will also be closer to the true value using the updated ith object diffraction field and modulator function constraints. The updated i-th outgoing wave function of the first object contains information of the first object and the illumination probe, and the i+1-th pure object function determined by using the updated i-th outgoing wave function is closer to the real pure object function of the first object.
Optionally, in the second modulation imaging scene, determining the i-1' th exit wave function of the aperture plane according to the i-1 th exit wave function of the aperture plane updated in the first modulation imaging scene, the diffraction intensity data of the object, and the i-1 st pure object function of the first object.
In the scheme, the obtained ith-1' emergent wave function of the aperture plane is used for determining the input of the ith emergent wave function of the aperture plane in the first modulation imaging scene.
Optionally, in the second modulated imaging scene, determining the ith diffraction field of the object according to the ith exit wave function of the first object specifically includes:
determining an ith object diffraction field according to an ith emergent wave function of the first object and the constraint of the modulator in the second modulation imaging scene;
updating the ith emergent wave function of the first object according to the updated ith diffraction field of the object, and specifically comprises the following steps:
and updating the ith emergent wave function of the first object according to the updated ith diffraction field of the object and the constraint of the modulator.
In the scheme, under the second modulation imaging scene, the constraint of the modulator can be used for eliminating the fuzzy solution, avoiding the phase stagnation, and increasing the convergence of the method and the universality of the method on a general object; facilitating reconstruction of the first object.
Optionally, the method further comprises:
and determining an (i+1) th illumination probe function according to the (i) th exit wave function of the first object, the (i+1) th pure object function, the (i) th exit wave function of the updated first object and the (i) th illumination probe function.
And determining an i+1' emergent wave function of the aperture plane according to the determined i+1 illumination probe function.
In the above scheme, since the i-th emergent wave function of the updated first object is closer to the true value, and the i-th emergent wave function contains the information of the first object and the illumination probe, the i-th emergent wave function is expressed as the product of the pure object function of the first object and the illumination probe function; the i-th illumination probe function, i.e. the i+1-th illumination probe function, can thus be updated in a similar way as the i-th pure object function. The determined i+1 illumination probe function will be closer to the true value. According to the determined i+1th illumination probe function, determining an i+1th emergent wave function of the aperture plane, and ending the second modulation imaging scene; meanwhile, the (i+1') th emergent wave function of the determined aperture plane can be used as the input of the next first modulation imaging scene.
Optionally, the method further comprises:
and if the error between the diffraction intensity data of the ith object diffraction field and the diffraction intensity data of the ith object is smaller than the first preset error, determining the (i+1) th pure object function as a target pure object function of the first object.
In the above-described scheme, different values may be set for the error between the diffraction intensity data of the i-th diffraction field with the object and the diffraction intensity data with the object smaller than the first preset error in the first preset error scheme as needed. For example, the first preset error may be set smaller in order to obtain a more accurate target pure object function of the first object.
Optionally, the first modulated imaging scene is comprised of an aperture plane, a modulator and a detector element for recording the above-mentioned object-free diffraction intensity data.
Optionally, in the first modulation imaging scene, determining an i-th object-free diffraction field according to an i-th exit wave function of the aperture plane, wherein the i-th object-free diffraction field is composed of i-th object-free diffraction amplitude data and i-th object-free diffraction phase data;
replacing the ith non-object diffraction amplitude data in the ith non-object diffraction field with square root operation results of non-object diffraction intensity data, and determining an updated ith non-object diffraction field;
And updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field and the aperture limited size constraint of the aperture plane.
In the above-described scheme, the i-th object diffraction amplitude data in the i-th object diffraction field is replaced with the square root operation result of the object-free diffraction intensity data, so that the updated i-th object diffraction field is more close to the true value. Since the ith no-object diffraction field contains the diffraction information of the aperture and modulator; thus, the updated, and aperture plane ith exit wave function constrained by the finite size of the aperture plane will also be closer to the true value with the updated ith no object diffraction field, modulator function.
Optionally, in the first modulated imaging scene, determining the ith no-object diffraction field according to the ith exit wave function of the aperture plane specifically includes:
under a first modulation imaging scene, determining an ith diffraction field without an object according to an ith emergent wave function of an aperture plane and the constraint of a modulator;
updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field and the aperture limited size constraint of the aperture plane, and specifically comprising the following steps:
and updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field, the constraint of the modulator and the aperture limited size constraint of the aperture plane.
In the scheme, under the first modulation imaging scene, the constraint of the modulator can be used for eliminating the fuzzy solution, avoiding the phase stagnation, and increasing the convergence of the method and the universality of the method on a general object; the reconstruction of the exit wave function of the aperture plane is facilitated.
In a second aspect, an embodiment of the present application provides an apparatus for acquiring a pure object function, including:
the first acquisition unit is used for acquiring the diffraction intensity data of the non-object under the first modulation imaging scene;
the second acquisition unit is used for acquiring diffraction intensity data of objects in a second modulation imaging scene, and the second modulation imaging scene is different from the first modulation imaging scene in that the second modulation imaging scene comprises first objects, and the first modulation imaging scene does not comprise the first objects;
a first determining unit, configured to determine, under a first modulated imaging scene, an ith exit wave function of an aperture plane according to the ith-1 exit wave function of the aperture plane, an aperture finite size constraint of the aperture plane, and the ith-1' exit wave function of the aperture plane, where the first modulated imaging scene and the second modulated imaging scene include aperture planes;
the first updating unit is used for updating the ith emergent wave function of the aperture plane according to the ith emergent wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene;
And the second determining unit is used for determining the (i+1) th pure object function of the first object according to the (i) th exit wave function of the aperture plane updated in the first modulation imaging scene, the diffraction intensity data of the object and the (i) th pure object function of the first object in the second modulation imaging scene. The i+1th pure object function is used to determine a target pure object function for the first object, i being a positive integer greater than 1.
Optionally, the third determining unit is configured to determine, in the second modulated imaging scene, an ith illumination probe function according to an ith exit wave function of the aperture plane updated in the first modulated imaging scene.
Optionally, the fourth determining unit is configured to determine an i-th outgoing wave function of the first object based on the i-th illumination probe function and an i-th pure object function of the first object.
Optionally, the fifth determining unit is configured to determine an i-th diffraction field of the object according to an i-th exit wave function of the first object; the i-th object diffraction field is composed of i-th object diffraction amplitude data and i-th object diffraction phase data.
Optionally, the sixth determining unit is configured to replace the i-th object diffraction amplitude data in the i-th object diffraction field with the square root operation result of the object diffraction intensity data, and determine the updated i-th object diffraction field.
Optionally, the second updating unit is configured to update the ith outgoing wave function of the first object according to the updated ith diffraction field of the object.
Optionally, the seventh determining unit is configured to determine an i+1 th pure object function of the first object according to the i-th exit wave function of the first object, the updated i-th exit wave function of the first object, the i-th illumination probe function, and the i-th pure object function.
Optionally, the eighth determining unit is configured to determine, in the second modulated imaging scene, the i-1' th exit wave function of the aperture plane according to the i-1 th exit wave function of the aperture plane updated in the first modulated imaging scene, the diffraction intensity data of the object, and the i-1 st pure object function of the first object.
Optionally, the ninth determining unit is configured to determine, in the second modulated imaging scenario, an i-th diffraction field of the object according to an i-th exit wave function of the first object and constraints of the modulator.
Optionally, the third updating unit is configured to update the ith outgoing wave function of the first object according to the updated ith diffraction field of the object and the constraint of the modulator.
Optionally, the tenth determining unit is configured to determine the i+1th illumination probe function according to the i-th exit wave function of the first object, the i+1th pure object function, the i-th exit wave function of the updated first object, and the i-th illumination probe function;
And determining an i+1th emergent wave function of the aperture plane according to the determined i+1th illuminating probe function.
Optionally, the eleventh determining unit is configured to determine the i+1th pure object function as the target pure object function of the first object if an error between the diffraction intensity data of the i-th diffraction field of the object and the diffraction intensity data of the object is smaller than a first preset error.
Optionally, the twelfth determining unit is configured to determine, in the first modulated imaging scene, an ith no-object diffraction field according to an ith exit wave function of the aperture plane; the i-th object-free diffraction field is composed of i-th object-free diffraction amplitude data and i-th object-free diffraction phase data.
Optionally, the thirteenth determining unit is configured to replace the i no-object diffraction amplitude data in the i no-object diffraction field with a square root operation result of the no-object diffraction intensity data, and determine the updated i no-object diffraction field.
Optionally, the fourth updating unit is configured to update the i-th exit wave function of the aperture plane according to the updated i-th object-free diffraction field and the aperture finite size constraint of the aperture plane.
Optionally, the fourteenth determining unit is configured to determine, in the first modulated imaging scene, an i-th object-free diffraction field according to an i-th exit wave function of the aperture plane and constraints of the modulator.
Optionally, the fifth updating unit is configured to update the ith exit wave function of the aperture plane according to the updated ith no object diffraction field, the modulator constraint, and the aperture finite size constraint of the aperture plane.
In a third aspect, an embodiment of the present application provides an apparatus for obtaining a pure object function, including a processor, the processor being coupled to a memory, the processor being configured to implement the method of the first aspect or any implementation manner of the first aspect, when executing a computer program or instructions stored in the memory.
In a fourth aspect, embodiments of the present application provide a computer readable storage medium storing a computer program which, when executed, causes a computer to perform the method of the first aspect or any implementation of the first aspect.
Compared with the prior art, the embodiment of the application has the beneficial effects that: the aperture plane emergent wave function can be obtained under the first modulation imaging scene; and then the pure object function of the first object can be reconstructed by using the obtained aperture plane emergent wave function and the diffraction intensity data of the object in the second modulation imaging scene, and then the target pure object function of the first object is obtained. Wherein the target pure object function of the first object is advantageous for achieving high quality microscopic imaging of the first object without illumination artifacts, facilitating investigation of the first object.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a coherent modulation imaging apparatus according to an embodiment of the present application;
FIG. 2 is a flow chart of a method for obtaining a pure object function according to an embodiment of the present application;
FIG. 3 is a flow chart of another method for obtaining a pure object function according to an embodiment of the present application;
FIG. 4 is a schematic diagram of an apparatus for obtaining a pure object function according to an embodiment of the present application;
FIG. 5 is a schematic diagram of another apparatus for obtaining a pure object function according to an embodiment of the present application.
Detailed Description
The following describes the technical solution in the embodiment of the present application in detail in combination with the embodiment of the present application.
It should be understood that the manner, the case, the category, and the division of the embodiments of the present application are merely for convenience of description, and do not limit the present application in any way, and the various manners, the categories, the cases, and the features of the embodiments may be combined with each other without contradiction.
It should also be understood that the "first", "second" through "fourteenth" in the embodiments of the present application are merely for distinguishing, and do not constitute any limitation to the present application. It should also be understood that, in the embodiments of the present application, the sequence number in each process does not mean the execution sequence of the steps, and the execution sequence of the steps is determined by the logic therein, which does not limit the execution process of the embodiments of the present application in any way.
Currently, in the field of coherent diffraction imaging, the traditional coherent modulation imaging method is most prominent. However, the conventional coherent modulation imaging method can only obtain the combined function information of the emergent wave function of the aperture plane and the object function, and cannot obtain the emergent wave function of the aperture plane, so that the object function cannot be separated from the combined function information, that is, the conventional coherent modulation imaging method cannot obtain the pure object function, which is not beneficial to realizing high-quality microscope imaging of the object without illumination artifact and is not beneficial to researching the object.
Fig. 1 is a schematic diagram of a coherent modulation imaging device according to an embodiment of the present application, where the device includes an aperture of an aperture plane, a modulator, a detecting element, and a first object. Wherein the detection element is used for recording a diffraction pattern formed in the coherent modulation imaging scene. The experimental scene comprising an aperture 101 of an aperture plane, a modulator 103 and a detection element 104 is a first modulation imaging scene; the experimental scene comprising the aperture 101 of the aperture plane, the first object 102, the modulator 103 and further comprising the detection element 104 is a second modulated imaging scene. In the first modulation imaging scene, incident light passes through an aperture 101 of an aperture plane to form an emergent wave of the aperture plane, and after the emergent wave of the aperture plane passes through a modulator 103, object-free diffraction intensity data are formed on a detection element 104; the object-free diffraction intensity data includes the aperture of the aperture plane and diffraction information of the modulator. In the second modulation imaging scene, incident light passes through an aperture 101 of an aperture plane to form an emergent wave function of the aperture plane, the emergent wave function of the aperture plane passes through a first object 102 and a modulator 103, and object diffraction intensity data is formed on a detection element 104; the object diffraction intensity data includes an aperture of an aperture plane, a first object, and diffraction information of a modulator. The first modulation imaging scene and the second modulation imaging scene have the same actual incident light, and the actual incident light has certain coherence; the aperture finite size constraint of an aperture plane in a coherent modulation imaging apparatus is represented using a function, and the modulator constraint is represented using a function. Distance d shown in FIG. 1 1 、d 2 、d 3 The distance between the first object 102 and the aperture 101 of the aperture plane, the distance between the aperture 101 of the aperture plane and the modulator 103, the distance between the modulator 103 and the detection element 104, respectively; the aperture shape of the aperture plane may be any shape; the modulator may use a binary type or continuous type phase plate.
Under the whole experimental scene, the aperture limited size constraint of the aperture plane and the constraint of the modulator are known and unchanged, and the emergent wave function of the actual aperture plane and the actual first object function obtained by the actual incident light are unknown and remain unchanged, but the method of the application is needed to be utilized, so that the emergent wave function of the recovered aperture plane and the first object function can be more and more approximate to the true value. Wherein the first object function refers to object function information that does not carry the exit wave function information of the aperture plane, i.e. a pure object function of the first object.
It should be noted that fig. 1 does not limit the structure of the coherent modulation imaging apparatus, and as shown in fig. 1, the distance d in the figure 1 、d 2 、d 3 Can be changed or kept unchanged.
Based on the problems in the related art and the coherent modulation imaging experimental scene shown in fig. 1, the application provides a method and a device for acquiring a pure object function, comprising: firstly, obtaining diffraction intensity data without objects in a first modulation imaging scene; obtaining diffraction intensity data of an object in a second modulation imaging scene; updating the ith exit wave function of the aperture plane according to the ith exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene; and under the second modulation imaging scene, determining an (i+1) th pure object function of the first object according to the (i) th emergent wave function of the aperture plane updated under the first modulation imaging scene, the diffraction intensity data of the object and the (i) th pure object function of the first object to obtain a target pure object function of the first object, wherein i is a positive integer greater than 1. In this way, in the first modulation imaging scene, the exit wave function of the aperture plane can be obtained, and the obtained exit wave function of the aperture plane can be used to reconstruct the target pure object function of the first object from the diffraction intensity data of the object recorded in the second modulation imaging scene. Wherein the target pure object function of the first object is advantageous for achieving high quality microscopic imaging of the first object without illumination artifacts, facilitating investigation of the first object.
The technical solution of the present application is described in detail below with specific embodiments, and the following specific embodiments may be combined with each other, and may not be repeated in some embodiments for the same or similar concepts or processes.
Fig. 2 is a flow chart of a method for obtaining a pure object function according to an embodiment of the present application, as shown in fig. 2, the method includes the following steps:
s210, obtaining object-free diffraction intensity data in the first modulation imaging scene.
Optionally, under a first modulated imaging scene, object-free diffraction intensity data is acquired from a detector element in the scene.
For example, in the modulated imaging scenario shown in FIG. 1, which does not contain a first object, i.e., in the first modulated imaging scenario, the incident light propagates d through the aperture of the aperture plane 2 After the distance, the light field irradiates the modulator, and the light field is modulated by the modulator and then propagates d 3 Distance, finally, the light irradiates the detecting element. Here, the data recorded by the detecting element is object-free diffraction intensity data, which contains the aperture of the aperture plane and diffraction information of the modulator. The diffraction intensity data without the object is only required to be obtained once on the premise of unchanged experimental scene.
S220, obtaining diffraction intensity data of objects in a second modulation imaging scene, wherein the second modulation imaging scene is different from the first modulation imaging scene in that the second modulation imaging scene comprises the first objects, and the first modulation imaging scene does not comprise the first objects.
Optionally, in a second modulated imaging scene, object diffraction intensity data is acquired from a detector element in the scene.
For example, in the modulated imaging scenario illustrated in FIG. 1 with a first object, i.e., in a second modulated imaging scenario, incident light propagates d through the aperture of the aperture plane 1 After a distance, irradiates the first object, and leaves from the object to propagate d 2 -d 1 After the distance, irradiating the modulator; the light field is modulated by the modulator and then is propagated d 3 Distance, finally, the light irradiates the detecting element. Here, the data recorded by the detecting element are diffraction intensity data of an object, which includes an aperture of an aperture plane, a first object, anddiffraction information of the modulator. Under the condition of keeping the experimental scene unchanged, combining the non-object diffraction intensity obtained by the first modulation imaging scene and the object diffraction intensity corresponding to different imaging objects of the second modulation imaging scene, so as to obtain pure object functions of the different imaging objects; the recovered pure object functions are in one-to-one correspondence with the obtained diffraction intensity data of the object.
S230, determining an ith exit wave function of the aperture plane according to the ith-1 exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the ith-1' exit wave function of the aperture plane in the first modulation imaging scene, wherein the first modulation imaging scene and the second modulation imaging scene comprise the aperture plane.
Specifically, the i-1' th exit wave function of the aperture plane is the updated result of the i-1 th exit wave function of the aperture plane in the second modulation imaging scene.
Optionally, the i-th exit wave function of the aperture plane is determined from a summation, product relationship between the i-1-th exit wave function of the aperture plane, the i-1' exit wave function of the aperture plane, the aperture finite size constraint of the aperture plane.
For example, in a first modulated imaging scene, according to
ψ A,i ＝ψ′ A,i-1 ·S+β a (ψ′ A,i-1 -ψ A,i-1 ) Determining the ith exit wave function ψ of an aperture plane A,i Wherein beta is a As regulatory factor, ψ' A,i-1 Is the i-1' exit wave function of the aperture plane, S is the aperture finite size constraint of the aperture plane, ψ A,i-1 Is the i-1 th exit wave function of the aperture plane.
S240, updating the ith exit wave function of the aperture plane according to the ith exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene.
Optionally, in the first modulation imaging scene, determining an i-th object-free diffraction field according to an i-th exit wave function of the aperture plane, wherein the i-th object-free diffraction field is composed of i-th object-free diffraction amplitude data and i-th object-free diffraction phase data;
replacing the ith non-object diffraction amplitude data in the ith non-object diffraction field with square root operation results of non-object diffraction intensity data, and determining an updated ith non-object diffraction field;
and updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field and the aperture limited size constraint of the aperture plane.
In the above-described scheme, the i-th object diffraction amplitude data in the i-th object diffraction field is replaced with the square root operation result of the object-free diffraction intensity data, so that the updated i-th object diffraction field is more close to the true value. Since the ith no-object diffraction field contains the diffraction information of the aperture and modulator; thus, the updated, and aperture plane ith exit wave function constrained by the finite size of the aperture plane will also be closer to the true value with the updated ith no object diffraction field, modulator function.
Optionally, the first modulated imaging scene is comprised of an aperture plane, a modulator and a detector element for recording the above-mentioned object-free diffraction intensity data.
Optionally, in the first modulated imaging scene, determining the ith no-object diffraction field according to the ith exit wave function of the aperture plane specifically includes:
under a first modulation imaging scene, determining an ith diffraction field without an object according to an ith emergent wave function of an aperture plane and the constraint of a modulator;
updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field and the aperture limited size constraint of the aperture plane, and specifically comprising the following steps:
and updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field, the constraint of the modulator and the aperture limited size constraint of the aperture plane.
In the scheme, under the first modulation imaging scene, the constraint of the modulator can be used for eliminating the fuzzy solution, avoiding the phase stagnation, and increasing the convergence of the method and the universality of the method on a general object; the reconstruction of the exit wave function of the aperture plane is facilitated.
Optionally, in the first modulation imaging scene, using the ith emergent wave function of the aperture plane, and obtaining the ith light field function of the front surface of the modulator through forward propagation calculation; the ith light field function of the front surface of the modulator is multiplied by the modulator function M to determine the function of the rear surface of the modulator, namely the emergent wave function of the modulator. The ith emergent wave function of the modulator is calculated through forward propagation, and an ith diffraction field without an object at a detection plane is determined;
Replacing the ith non-object diffraction amplitude data in the ith non-object diffraction field with square root operation results of non-object diffraction intensity data, and determining an updated ith non-object diffraction field;
calculating an updated ith outgoing wave function of the modulator through the ith object diffraction field after back propagation update; the ith emergent wave function of the updated modulator obtains the ith optical field function of the front surface of the updated modulator after the modulation effect is removed; and (3) obtaining an ith emergent wave function of the updated aperture plane through back propagation calculation by the ith optical field function of the front surface of the updated modulator.
For example, in a first modulated imaging scene, ψ A,i By forward propagationObtain the light field of the front surface of the modulator->According to->Obtaining the modulator outgoing wave function->Will then->Propagating to the detection element, determining the i-th diffraction field without object +.>
According toDetermining the updated i-th object-free diffraction field +.>
Counter-propagationTo modulator, i.e. according to->Determining updated modulator exit wave functionsAccording to
Removing modulation effect to obtain updated modulator front surface light field +.>Will then->Back to the aperture plane according to +.>Updating the ith exit wave function ψ of an aperture plane A,i 。
In the above formula, beta a 、β m The value range is 0-1, psi for regulating factor A,i Is the i-th exit wave function of the aperture plane,is the ith light field function of the front surface of the modulator, < >>For the modulator ith outgoing wave function, +.>For no object diffraction intensity data, +.>For the updated modulator ith exit wave function>For the i-th light field function of the updated modulator front surface,>is the ith exit wave function of the updated aperture plane. />Representing forward propagation algorithm, < >>Representing a back propagation algorithm, Z being a propagation distance; typically the near field uses an angular spectrum propagation algorithm and the far field uses a fresnel diffraction or fraunhofer diffraction propagation algorithm. The superscript I indicates that the light field belongs to a first modulated imaging scene.
Optionally, in the second modulation imaging scene, determining the i-1' th exit wave function of the aperture plane according to the i-1 th exit wave function of the aperture plane updated in the first modulation imaging scene, the diffraction intensity data of the object, and the i-1 st pure object function of the first object.
In the scheme, the obtained ith-1' emergent wave function of the aperture plane is used for determining the input of the ith emergent wave function of the aperture plane in the first modulation imaging scene.
S240, determining an i+1th pure object function of the first object according to the i-th exit wave function of the aperture plane updated in the first modulation imaging scene, the diffraction intensity data of the object and the i-th pure object function of the first object in the second modulation imaging scene, wherein the i+1th pure object function is used for determining a target pure object function of the first object.
Optionally, in a second modulated imaging scene, determining an ith illumination probe function according to an ith exit wave function of the aperture plane updated in the first modulated imaging scene;
determining an ith outgoing wave function of the first object according to the ith illumination probe function and an ith pure object function of the first object;
determining an ith object diffraction field according to an ith exit wave function of the first object, wherein the ith object diffraction field consists of ith object diffraction amplitude data and ith object diffraction phase data;
replacing the ith object diffraction amplitude data in the ith object diffraction field with square root operation results of the object diffraction intensity data, and determining an updated ith object diffraction field;
updating the ith emergent wave function of the first object according to the updated ith diffraction field of the object;
and determining an i+1 pure object function of the first object according to the i-th emergent wave function of the first object, the i-th emergent wave function of the updated first object, the i-th illumination probe function and the i-th pure object function.
In the above-described aspect, the i-th object diffraction amplitude data in the i-th object diffraction field is replaced with the square root operation result of the object diffraction intensity data, so that the updated i-th object diffraction field is made closer to the true value. Since the ith object diffraction field contains the diffraction information of the aperture, the first object and the modulator; thus, the updated first object ith exit wave function will also be closer to the true value using the updated ith object diffraction field and modulator function constraints. The updated i-th outgoing wave function of the first object contains information of the first object and the illumination probe, and the i+1-th pure object function determined by using the updated i-th outgoing wave function is closer to the real pure object function of the first object.
Optionally, the second modulated imaging scene is composed of an aperture of the aperture plane, the first object, the modulator and a detection element for recording the above-mentioned diffraction intensity data of the object.
Optionally, in the second modulated imaging scene, determining the ith diffraction field of the object according to the ith exit wave function of the first object specifically includes:
determining an ith object diffraction field according to an ith emergent wave function of the first object and the constraint of the modulator in the second modulation imaging scene;
updating the ith emergent wave function of the first object according to the updated ith diffraction field of the object, and specifically comprises the following steps:
and updating the ith emergent wave function of the first object according to the updated ith diffraction field of the object and the constraint of the modulator.
In the scheme, under the second modulation imaging scene, the constraint of the modulator can be used for eliminating the fuzzy solution, avoiding the phase stagnation, and increasing the convergence of the method and the universality of the method on a general object; facilitating reconstruction of the first object.
Optionally, in the second modulation imaging scene, according to the ith emergent wave function of the aperture plane updated in the first modulation imaging scene, obtaining an ith illumination probe function through forward propagation calculation; obtaining an ith emergent wave function of the first object according to the ith illumination probe function and the ith pure object function of the first object; the ith emergent wave function of the first object is calculated through forward propagation, so that the ith light field function of the front surface of the modulator is obtained; then modulating to obtain an ith emergent wave function of the modulator, and determining an ith diffraction field of the object according to the ith emergent wave function of the modulator;
Replacing the ith object diffraction amplitude data in the ith object diffraction field with square root operation results of the object diffraction intensity data, and determining an updated ith object diffraction field;
calculating an updated ith outgoing wave function of the modulator through the ith object diffraction field after back propagation update; removing the modulation effect from the i-th emergent wave function of the updated modulator to obtain an i-th light field function of the front surface of the updated modulator; the ith light field function of the front surface of the updated modulator is calculated to obtain an ith emergent wave function of the updated first object through back propagation;
and determining an i+1 pure object function of the first object according to the updated i outgoing wave function of the first object, the i illumination probe function and the i pure object function of the first object.
For example, in a second modulated imaging scene, the ith exit wave from the aperture plane updated in the first modulated imaging sceneForward propagating to the first object to obtain the ith illumination probe P i The method comprises the steps of carrying out a first treatment on the surface of the According to psi O,i ＝P i ·O i Obtaining the i-th emergent wave psi of the first object O,i The method comprises the steps of carrying out a first treatment on the surface of the Will be psi O,i Propagating to the modulator to obtain the light field of the front surface of the modulator +. >Then carries out modulation according to
Obtain modulator emergent wave->According to->Determining the i-th diffraction field of the first object>According to->Determining the updated i-th diffraction field of the object +.>
Reverse directionPropagation ofAnd according to->Obtaining updated modulator outgoing wavesWill->After removal of the modulation effect, an updated modulator front surface light field is obtained>Afterwards, will->Back to the first object, updating the i-th outgoing wave of said first object>
According toDetermining an i+1th pure object function O of a first object i+1 ；
In the above formula, beta m 、β p For adjusting factors, the value range is 0-1,is diffraction intensity data of an object. The superscript II indicates that the light field belongs to a second modulated imaging scene.
Optionally, the i+1 th illumination probe function is determined according to the updated i-th exit wave function of the first object, the i+1-th pure object function of the first object, and the i-th illumination probe function.
And determining an i+1' emergent wave function of the aperture plane according to the determined i+1 illumination probe function.
In the above scheme, since the i-th emergent wave function of the updated first object is closer to the true value, and the i-th emergent wave function contains the information of the first object and the illumination probe, the i-th emergent wave function is expressed as the product of the pure object function of the first object and the illumination probe function; the i-th illumination probe function, i.e. the i+1-th illumination probe function, can thus be updated in a similar way as the i-th pure object function. The determined i+1 illumination probe function will be closer to the true value. And determining an i+1 'emergent wave function of the aperture plane according to the determined i+1 illumination probe function, ending the second modulation imaging scene, and simultaneously, taking the determined i+1' emergent wave function of the aperture plane as the input of the next first modulation imaging scene.
For example, according toThe i+1th illumination probe function P can be obtained i+1 . Wherein beta is o For the adjustment factor, the value range is 0-1, and the superscript II indicates that the light field belongs to a second modulation imaging scene;
P i+1 back to the aperture plane, updating the ith exit wave function of the aperture plane
Optionally, if the error between the ith object diffraction intensity data and the ith object diffraction intensity data is less than the first preset error, determining the (i+1) th pure object function as the target pure object function of the first object.
In the above-described scheme, different values may be set for the i-th object diffraction intensity data and the error of the object diffraction intensity data smaller than the first preset error in the first preset error scheme as needed. For example, the first preset error may be set smaller in order to obtain a more accurate target pure object function of the first object.
For example, ifThen the i+1 pure object function O i+1 Determining a target pure object function as the first object, < >>For the ith diffraction field of the object, +.>For having object diffraction intensity data, delta 1 Is the first preset error.
In order to facilitate understanding of the technical solution of the present application, an embodiment is given below:
first preset error delta 1 0.009, the current time is 1 st time, and i is 2, in the first modulation imaging scene, as shown in fig. 3 (a), the 1 st exit wave function ψ of the aperture plane is known in the first modulation imaging scene A，1 The 1 st ' exit wave function psi ' of the aperture plane ' A，1 Regulatory factor beta a And a pore size limitation S of the pore size plane according to
ψ A,2 ＝ψ′ A,1 ·S+β a (ψ′ A,1 -ψ A,1 ) (1-S) obtaining the 2 nd exit wave function ψ of an aperture plane A,2 The method comprises the steps of carrying out a first treatment on the surface of the Forward propagation ψ A,2 To the modulator and according toObtain the light field of the front surface of the modulator->Based on->Obtaining the modulator outgoing wave function->And then to the detection element to determine the 2 nd diffraction field without object +.>
According toDetermining the updated 2 nd object-free diffraction field +.>Counter-propagating->To modulator, i.e. according to->Determining an updated modulator outgoing wave function +.>
According toRemoving modulation effect to obtain updated modulator front surface light field +.>Will->Back to the aperture plane according toUpdating the 2 nd exit wave function ψ of the aperture plane A,2 ；
In the second modulation imaging scene, according to the 2 nd emergent wave function of the aperture plane updated in the first modulation imaging sceneForward propagation to the first object to obtain the 2 nd illumination probe function P 2 The method comprises the steps of carrying out a first treatment on the surface of the According to psi O,2 ＝P 2 ·O 2 Obtaining a first object2 nd outgoing wave function ψ O,2 And will be psi O,2 Propagating to the modulator to obtain the light field of the front surface of the modulator +.>Then modulation is carried out according to->Obtaining the modulator outgoing wave function->
According toDetermining the 2 nd object diffraction field of the first object >According toDetermining the updated 2 nd diffraction field of the object +.>Counter-propagating->And according toObtaining an updated modulator outgoing wave function +.>And then->Removing modulation effect to obtain updated modulator front surface light field +.>Afterwards, will->Back to the first object, updating the 2 nd outgoing wave function of said first object +.>
According toDetermination of the 3 rd pure object function O of the first object 3 。
Due to the current time, there isThen at this point O 3 Cannot be a function of the target pure object of the first object.
At this time, it can be according to
Obtain updated 3 rd illumination probe function P 3 ，P 3 Propagate to the aperture plane, update the 2 nd exit wave function psi of the aperture plane A,2 。
In the iteration, when the current number of times is 101 th and i is 102, in the first modulation imaging scene, as shown in fig. 3 (b), the 101 st emergent wave function psi of the known aperture plane is obtained in the first modulation imaging scene A，101 101' th exit wave function ψ ' of aperture plane ' A，101 Regulatory factor beta a The aperture finite size constraint S of the aperture plane is based on
ψ A,102 ＝ψ′ A,101 ·S+β a (ψ′ A,101 -ψ A,101 ) (1-S) obtaining 102 th exit wave function ψ of an aperture plane A,102 ；ψ A,102 After propagating to the modulator according toObtain the light field of the front surface of the modulator->According toObtaining the modulator outgoing wave function-> And then propagates to the detection element to determine the 102 th diffraction field without the object +. >
According toDetermining the updated 102 th object-free diffraction field +.>Counter-propagationTo modulator, i.e. according to->Determining an updated modulator back surface function +.>
According toRemoving modulation effect to obtain updated modulator front surface light field +.>Will->Back to the aperture plane according to +.>Updating 102 th exit wave function ψ of aperture plane A,102 ；
In the second modulation imaging scene, according to the 102 th emergent wave function of the aperture plane updated in the first modulation imaging scene102 th illumination probe function P of first object propagating forward to first object 102 After that, according to psi O,102 ＝P 102 ·O 102 Obtaining 102 th outgoing wave function psi of the first object O,102 ；
Will be psi O,102 Propagate to the modulator to obtain the light field of the front surface of the modulatorThen carries out modulation according toObtaining the modulator outgoing wave function->Forward propagation->And according to->Determining the 102 th object diffraction field of the first object>According to->Determining the updated 102 th diffraction field of the object +.>
According toObtaining an updated modulator outgoing wave function +.>And then->Removing modulation effect to obtain updated modulator front surface light field +.>Afterwards, will->Back to the first object, updating the 102 th outgoing wave function of said first object->
According toDetermining the 103 th pure object function O of the first object 103 。
Due to the current time, there isThen at this point O 103 And cannot be a function of the target pure object being the first object.
At this time, it can be according to
Updated 103 th illumination probe function P 103 ，P 103 Propagate to aperture plane, update 102 th emergent wave function psi of aperture plane A,102 。
In the iteration, when 201 times are reached, i.e. the current times are 201 times, and i is 202 times, in the first modulation imaging scene, as shown in fig. 3 (c), the 201 st exit wave function ψ of the aperture plane is known in the first modulation imaging scene A，201 201' th exit wave function psi ' of aperture plane ' A，201 Regulatory factor beta a A pore size limitation S of the pore size plane;
according to psi A,202 ＝ψ′ A,101 ·S+β a (ψ′ A,201 -ψ A,201 ) (1-S) obtaining 202 st exit wave function ψ of aperture plane A,202 ；ψ A,202 After propagating to the modulator according toObtain the light field of the front surface of the modulator->Based on->Obtaining the modulator outgoing wave function->And then to the detection element to determine the 202 th diffraction field without object +.>
According toDetermining the updated 202 nd object-free diffraction field +.>Counter-propagationTo modulator, i.e. according to->Determining an updated modulator back surface function +.>
According toRemoving modulation effect to obtain updated modulator front surface light field +.>Will->Back to the aperture plane according to +. >Updating 202 st exit wave function ψ of aperture plane A,202 ；
In the second modulated imaging scene, according to the 202 st emergent wave function of the aperture plane updated in the first modulated imaging scene202 st illuminated probe function P of first object propagating forward to first object 202 After that, according to psi O,202 ＝P 202 ·O 202 Obtaining 202 st outgoing wave function psi of first object O,202 Will be psi O,202 And then propagates to the modulator to obtain the light field of the front surface of the modulator +.>Then modulation is carried out according to->Obtaining modulator outgoing wave functionForward propagation->And according to->Determining 202 th object diffraction field of first object>According to->Determining the updated 202 th diffraction field of the object +.>
According toObtaining an updated modulator outgoing wave function +.>And then->Removing modulation effect to obtain updated modulator front surface light field +.>Afterwards, will->Back to the first object, updating the 202 st outgoing wave function of said first object>
According toDetermining 203 th pure object function O of first object 203 。
Due to the current time, there isThen at this point O 203 As a function of the target pure object being the first object.
At this time, it can be according toUpdated 203 th illumination probe function P 203 ，P 203 Propagate to the aperture plane, update the 202 st exit wave function ψ of the aperture plane A,202 。
Fig. 4 is a schematic structural diagram of an apparatus for acquiring a pure object function according to an embodiment of the present application, where, as shown in fig. 4, the apparatus provided in this embodiment includes:
the first acquisition unit is used for acquiring the diffraction intensity data of the non-object under the first modulation imaging scene;
the second acquisition unit is used for acquiring diffraction intensity data of objects in a second modulation imaging scene, and the second modulation imaging scene is different from the first modulation imaging scene in that the second modulation imaging scene comprises first objects, and the first modulation imaging scene does not comprise the first objects;
a first determining unit, configured to determine, under a first modulated imaging scene, an ith exit wave function of an aperture plane according to the ith-1 exit wave function of the aperture plane, an aperture finite size constraint of the aperture plane, and the ith-1' exit wave function of the aperture plane, where the first modulated imaging scene and the second modulated imaging scene include aperture planes;
the first updating unit is used for updating the ith emergent wave function of the aperture plane according to the ith emergent wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene;
the second determining unit is used for determining an i+1th pure object function of the first object according to the i-th exit wave function of the aperture plane updated in the first modulation imaging scene, the i-th pure object function with the object diffraction intensity data and the first object in the second modulation imaging scene, wherein the i+1th pure object function is used for determining a target pure object function of the first object, and i is a positive integer greater than 1.
The device for acquiring a pure object function provided in this embodiment may perform the above method embodiment, and its implementation principle is similar to that of the technical effect, and will not be described herein.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.
Based on the same inventive concept, fig. 5 shows an apparatus for acquiring a pure object function according to an embodiment of the present application, where the apparatus includes a processor, and the processor is coupled to a memory, as shown in fig. 5; the processor is configured to execute the computer program or instructions stored in the memory to implement the method described in the above embodiment. Optionally, the apparatus further comprises a memory. Alternatively, the device may be a chip.
Embodiments of the present application provide a computer-readable storage medium storing a computer program, which when executed, implements the method described in the above embodiments.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the application.

Claims (9)

1. A method for obtaining a pure object function, the method being applied to a coherent modulation imaging apparatus, comprising:
obtaining diffraction intensity data of no object in a first modulation imaging scene;
obtaining diffraction intensity data of an object in a second modulated imaging scene, wherein the second modulated imaging scene differs from the first modulated imaging scene in that the second modulated imaging scene comprises a first object, and the first modulated imaging scene does not comprise the first object;
determining an ith exit wave function of an aperture plane according to the ith-1 exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the ith-1 'exit wave function of the aperture plane in the first modulation imaging scene, wherein the first modulation imaging scene and the second modulation imaging scene comprise the aperture plane, and the ith-1' exit wave function is the updated result of the ith-1 exit wave function in the second modulation imaging scene;
Updating an ith exit wave function of the aperture plane according to the ith exit wave function of the aperture plane, the aperture limited size constraint of the aperture plane and the diffraction intensity data without objects in the first modulation imaging scene;
determining an ith illumination probe function according to an ith exit wave function of the aperture plane updated in the first modulation imaging scene in the second modulation imaging scene;
determining an ith outgoing wave function of the first object according to the ith illumination probe function and an ith pure object function of the first object;
determining an ith object diffraction field according to an ith exit wave function of the first object, wherein the ith object diffraction field consists of ith object diffraction amplitude data and ith object diffraction phase data;
replacing the ith object diffraction amplitude data in the ith object diffraction field with square root operation results of the object diffraction intensity data, and determining the updated ith object diffraction field;
updating an ith emergent wave function of the first object according to the updated ith object diffraction field;
determining an (i+1) -th pure object function of the first object according to the (i) -th outgoing wave function of the first object, the (i) -th outgoing wave function of the first object after updating, the (i) -th illumination probe function and the (i) -th pure object function, wherein the (i+1) -th pure object function is used for determining a target pure object function of the first object;
i is a positive integer greater than 1.
2. The method of claim 1, wherein the method further comprises:
and under the second modulation imaging scene, determining an i-1' emergent wave function of the aperture plane according to the i-1 emergent wave function of the aperture plane, the diffraction intensity data of the object and the i-1 pure object function of the first object after updating the first modulation imaging scene.
3. The method of claim 1, wherein the method further comprises:
determining an i+1th illumination probe function according to the i-th exit wave function of the first object, the i+1th pure object function, the i-th exit wave function of the first object after updating and the i-th illumination probe function;
and determining an i+1th emergent wave function of the aperture plane according to the determined i+1th illuminating probe function.
4. The method of claim 1, wherein the second modulated imaging scene is comprised of an aperture of the aperture plane, the first object, a modulator, and a detection element;
the diffraction intensity data of the object is diffraction intensity data obtained by recording incident light at the detection element after passing through the aperture at the aperture plane, the first object and the modulator;
Wherein the determining the ith diffraction field of the object according to the ith exit wave function of the first object comprises:
determining an ith object diffraction field according to an ith exit wave function of the first object and the constraint of the modulator;
wherein updating the ith exit wave function of the first object according to the updated ith object diffraction field comprises:
and updating the ith emergent wave function of the first object according to the updated ith object diffraction field and the constraint of the modulator.
5. The method of claim 1, wherein the method further comprises:
and if the error between the diffraction intensity data of the ith object diffraction field and the diffraction intensity data of the ith object is smaller than a first preset error, determining the (i+1) th pure object function as a target pure object function of the first object.
6. The method of any of claims 1 to 5, wherein said updating, in said first modulated imaging scene, an i-th exit wave function of an aperture plane as a function of said i-th exit wave function of said aperture plane, an aperture finite size constraint of said aperture plane, and said object-free diffraction intensity data, comprises:
Determining an ith no-object diffraction field according to an ith emergent wave function of the aperture plane under the first modulation imaging scene, wherein the ith no-object diffraction field consists of ith no-object diffraction amplitude data and ith no-object diffraction phase data;
replacing the ith non-object diffraction amplitude data in the ith non-object diffraction field with square root operation results of the non-object diffraction intensity data, and determining the updated ith non-object diffraction field;
and updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field and the aperture limited size constraint of the aperture plane.
7. The method of claim 6, wherein the first modulated imaging scene consists of an aperture of the aperture plane, a modulator, and a detection element;
the diffraction intensity data without the object is diffraction intensity data obtained by recording the incident light at the detection element after passing through the aperture at the aperture plane and the modulator;
wherein, in the first modulated imaging scene, determining an ith diffraction field without an object according to an ith exit wave function of the aperture plane includes:
Determining an ith diffraction field without an object according to an ith emergent wave function of the aperture plane and the constraint of the modulator under the first modulation imaging scene;
wherein updating the ith exit wave function of the aperture plane according to the updated ith non-object diffraction field and the aperture finite size constraint of the aperture plane comprises:
and updating the ith emergent wave function of the aperture plane according to the updated ith non-object diffraction field, the constraint of the modulator and the aperture limited size constraint of the aperture plane.
8. An apparatus for obtaining a pure object function, comprising:
the first acquisition unit is used for acquiring the diffraction intensity data of the non-object under the first modulation imaging scene;
the second acquisition unit is used for acquiring diffraction intensity data of objects in a second modulation imaging scene, and the second modulation imaging scene is different from the first modulation imaging scene in that the second modulation imaging scene comprises a first object, and the first modulation imaging scene does not comprise the first object;
a first determining unit, configured to determine, in the first modulated imaging scene, an i-th exit wave function of an aperture plane according to the i-1-th exit wave function of the aperture plane, an aperture finite size constraint of the aperture plane, and the i-1 'exit wave function of the aperture plane, where the first modulated imaging scene and the second modulated imaging scene include the aperture plane, and the i-1' exit wave function is a result of updating the i-1-th exit wave function in the second modulated imaging scene;
A first updating unit, configured to update, in the first modulated imaging scene, an i-th exit wave function of the aperture plane according to the i-th exit wave function of the aperture plane, an aperture finite size constraint of the aperture plane, and the object-free diffraction intensity data;
the second determining unit is used for determining an ith illumination probe function according to an ith emergent wave function of the aperture plane updated in the first modulation imaging scene in the second modulation imaging scene;
determining an ith outgoing wave function of the first object according to the ith illumination probe function and an ith pure object function of the first object;
determining an ith object diffraction field according to an ith exit wave function of the first object, wherein the ith object diffraction field consists of ith object diffraction amplitude data and ith object diffraction phase data;
replacing the ith object diffraction amplitude data in the ith object diffraction field with square root operation results of the object diffraction intensity data, and determining the updated ith object diffraction field;
updating an ith emergent wave function of the first object according to the updated ith object diffraction field;
Determining an i+1th pure object function of the first object according to the i-th outgoing wave function of the first object, the updated i-th outgoing wave function of the first object, the i-th illumination probe function and the i-th pure object function, wherein the i+1th pure object function is used for determining a target pure object function of the first object, and i is a positive integer greater than 1.
9. A computer readable storage medium, characterized in that the computer readable storage medium stores a computer program which, when executed, implements the method according to any of claims 1-7.
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CN113281979A (en) * 2021-05-20 2021-08-20 清华大学深圳国际研究生院 Lensless laminated diffraction image reconstruction method, system, device and storage medium

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