CN114232086B - Growth method for MPCVD single crystal diamond containing crack seed crystal - Google Patents
Growth method for MPCVD single crystal diamond containing crack seed crystal Download PDFInfo
- Publication number
- CN114232086B CN114232086B CN202111603964.1A CN202111603964A CN114232086B CN 114232086 B CN114232086 B CN 114232086B CN 202111603964 A CN202111603964 A CN 202111603964A CN 114232086 B CN114232086 B CN 114232086B
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- crack
- single crystal
- seed
- seed crystal
- mpcvd
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- 239000013078 crystal Substances 0.000 title claims abstract description 144
- 239000010432 diamond Substances 0.000 title claims abstract description 63
- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 62
- 238000000034 method Methods 0.000 title claims abstract description 38
- 238000000259 microwave plasma-assisted chemical vapour deposition Methods 0.000 title claims abstract 17
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 claims abstract description 40
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 36
- 229910052757 nitrogen Inorganic materials 0.000 claims abstract description 18
- 238000000137 annealing Methods 0.000 claims abstract description 8
- 238000004140 cleaning Methods 0.000 claims abstract description 8
- 238000003698 laser cutting Methods 0.000 claims abstract description 8
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 claims description 6
- 239000001257 hydrogen Substances 0.000 claims description 6
- 229910052739 hydrogen Inorganic materials 0.000 claims description 6
- 238000002791 soaking Methods 0.000 claims description 6
- QAOWNCQODCNURD-UHFFFAOYSA-N sulfuric acid Substances OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 3
- 239000003153 chemical reaction reagent Substances 0.000 claims description 3
- 150000002431 hydrogen Chemical class 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 239000002699 waste material Substances 0.000 abstract description 2
- 210000002381 plasma Anatomy 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 239000000243 solution Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 206010016165 failure to thrive Diseases 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000002679 ablation Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 238000004880 explosion Methods 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/186—Epitaxial-layer growth characterised by the substrate being specially pre-treated by, e.g. chemical or physical means
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/20—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer
- C30B25/205—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer the substrate being of insulating material
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/04—Diamond
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
- C30B33/02—Heat treatment
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
Claims (9)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202111603964.1A CN114232086B (en) | 2021-12-24 | 2021-12-24 | Growth method for MPCVD single crystal diamond containing crack seed crystal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202111603964.1A CN114232086B (en) | 2021-12-24 | 2021-12-24 | Growth method for MPCVD single crystal diamond containing crack seed crystal |
Publications (2)
Publication Number | Publication Date |
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CN114232086A CN114232086A (en) | 2022-03-25 |
CN114232086B true CN114232086B (en) | 2023-01-17 |
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Family Applications (1)
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CN202111603964.1A Active CN114232086B (en) | 2021-12-24 | 2021-12-24 | Growth method for MPCVD single crystal diamond containing crack seed crystal |
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CN (1) | CN114232086B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115074826B (en) * | 2022-06-29 | 2023-08-22 | 中南钻石有限公司 | Process for preparing CVD single crystal diamond by directly growing cutting surface |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5628824A (en) * | 1995-03-16 | 1997-05-13 | The University Of Alabama At Birmingham Research Foundation | High growth rate homoepitaxial diamond film deposition at high temperatures by microwave plasma-assisted chemical vapor deposition |
CN104651928A (en) * | 2015-01-17 | 2015-05-27 | 王宏兴 | Homogeneous epitaxial lateral growth method for diamond |
CN107287654A (en) * | 2017-07-14 | 2017-10-24 | 中国电子科技集团公司第四十六研究所 | A kind of method that CVD synthetic single crystal diamond reduces dislocation density |
CN109023517A (en) * | 2018-10-17 | 2018-12-18 | 哈尔滨工业大学 | A method of single crystal diamond seed crystal surface defect is eliminated using focused ion beam technology |
CN109722713A (en) * | 2019-01-31 | 2019-05-07 | 西安交通大学 | A kind of novel diamond substrat structure, cutting technique and application thereof |
CN110023545A (en) * | 2016-12-01 | 2019-07-16 | 六号元素技术有限公司 | Pass through the synthetic diamonds material of chemical vapor deposition |
CN110938864A (en) * | 2019-11-08 | 2020-03-31 | 武汉大学 | Method for efficiently regulating and controlling dislocation density of CVD single crystal diamond local area |
-
2021
- 2021-12-24 CN CN202111603964.1A patent/CN114232086B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5628824A (en) * | 1995-03-16 | 1997-05-13 | The University Of Alabama At Birmingham Research Foundation | High growth rate homoepitaxial diamond film deposition at high temperatures by microwave plasma-assisted chemical vapor deposition |
CN104651928A (en) * | 2015-01-17 | 2015-05-27 | 王宏兴 | Homogeneous epitaxial lateral growth method for diamond |
CN110023545A (en) * | 2016-12-01 | 2019-07-16 | 六号元素技术有限公司 | Pass through the synthetic diamonds material of chemical vapor deposition |
CN107287654A (en) * | 2017-07-14 | 2017-10-24 | 中国电子科技集团公司第四十六研究所 | A kind of method that CVD synthetic single crystal diamond reduces dislocation density |
CN109023517A (en) * | 2018-10-17 | 2018-12-18 | 哈尔滨工业大学 | A method of single crystal diamond seed crystal surface defect is eliminated using focused ion beam technology |
CN109722713A (en) * | 2019-01-31 | 2019-05-07 | 西安交通大学 | A kind of novel diamond substrat structure, cutting technique and application thereof |
CN110938864A (en) * | 2019-11-08 | 2020-03-31 | 武汉大学 | Method for efficiently regulating and controlling dislocation density of CVD single crystal diamond local area |
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CN114232086A (en) | 2022-03-25 |
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CB03 | Change of inventor or designer information |
Inventor after: Zhu Jiaqi Inventor after: Li Yicun Inventor after: Dai Bing Inventor after: Hao Xiaobin Inventor before: Zhu Jiaqi Inventor before: Li Yicun Inventor before: Dai Bing Inventor before: Kong Xia Inventor before: Hao Xiaobin |
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Effective date of registration: 20231205 Address after: 443000 Wufeng Ethnic Industrial Park, Yichang City, Hubei Province Patentee after: HUBEI 6CARBON TECHNOLOGY CO.,LTD. Patentee after: HARBIN INSTITUTE OF TECHNOLOGY Address before: 443300 Wu Yan Quan Zhen Miao Gang Cun, Yidu City, Yichang City, Hubei Province Patentee before: Yichang China Carbon Future Technology Co.,Ltd. Patentee before: HARBIN INSTITUTE OF TECHNOLOGY |
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