CN114229033A - High-low temperature test system for flight device position marker - Google Patents
High-low temperature test system for flight device position marker Download PDFInfo
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- CN114229033A CN114229033A CN202111554076.5A CN202111554076A CN114229033A CN 114229033 A CN114229033 A CN 114229033A CN 202111554076 A CN202111554076 A CN 202111554076A CN 114229033 A CN114229033 A CN 114229033A
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- 239000003550 marker Substances 0.000 title claims abstract description 222
- 238000012360 testing method Methods 0.000 title claims abstract description 94
- 238000000034 method Methods 0.000 claims abstract description 56
- 238000004088 simulation Methods 0.000 claims abstract description 35
- 238000012545 processing Methods 0.000 claims abstract description 20
- 230000007613 environmental effect Effects 0.000 claims abstract description 8
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 13
- 229910052757 nitrogen Inorganic materials 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 3
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- 238000005259 measurement Methods 0.000 description 2
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B64—AIRCRAFT; AVIATION; COSMONAUTICS
- B64F—GROUND OR AIRCRAFT-CARRIER-DECK INSTALLATIONS SPECIALLY ADAPTED FOR USE IN CONNECTION WITH AIRCRAFT; DESIGNING, MANUFACTURING, ASSEMBLING, CLEANING, MAINTAINING OR REPAIRING AIRCRAFT, NOT OTHERWISE PROVIDED FOR; HANDLING, TRANSPORTING, TESTING OR INSPECTING AIRCRAFT COMPONENTS, NOT OTHERWISE PROVIDED FOR
- B64F5/00—Designing, manufacturing, assembling, cleaning, maintaining or repairing aircraft, not otherwise provided for; Handling, transporting, testing or inspecting aircraft components, not otherwise provided for
- B64F5/60—Testing or inspecting aircraft components or systems
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Abstract
The invention discloses a high and low temperature test system for a position marker of a flight device, which comprises a position marker simulation control test module and a position marker information acquisition processing module, wherein the position marker simulation control test module is used for simulating the movement of the position marker and simulating environmental parameters in the movement process of the position marker; the invention is suitable for high and low temperature testing of the flight device position marker, can realize the detection of various technical parameters of the flight device position marker in high and low temperature environments by setting the cooperation of the position marker simulation control testing module and the position marker information acquisition processing module, and records various parameter information in the whole testing process, thereby improving the reliability of the measuring process and the confidence coefficient of the measuring result, releasing the testing personnel from the past working environment and avoiding the influence of human intervention on the testing result.
Description
Technical Field
The invention belongs to the technical field of testing of flight device position markers, and particularly relates to a high and low temperature testing system for a flight device position marker.
Background
The position marker of the flight device is an important component of a seeker, whether the function and technical parameters of the position marker meet the design requirements or not is directly related to the performance of the seeker, the previous test on the position marker is completed manually in a high-temperature and low-temperature box, and the following problems are faced in the test process: when the high-low temperature box is operated, the environmental temperature is influenced, and the testing environmental temperature of the position marker is influenced; the testing efficiency is low, and the testing time is long; in the test process, testers need to constantly observe test signals and data and judge whether the test results meet the index requirements, the test results in the working mode are greatly influenced by human factors, and some transient signals can be missed.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a high-low temperature test system for a position marker of a flight device.
In order to achieve the purpose, the invention adopts the following technical scheme:
a high and low temperature test system for a flight device position marker comprises a position marker simulation control test module and a position marker information acquisition processing module, wherein,
the position marker simulation control test module is used for simulating the movement of the position marker and simulating the environmental parameters in the movement process of the position marker;
the position marker information acquisition processing module is used for acquiring and processing parameter information in the movement process of the position marker.
In one possible implementation manner, the landmark simulation control testing module includes a landmark clamping unit, a landmark moving unit, and a temperature simulation unit, where:
the position marker clamping unit is used for clamping and fixing the position marker;
the position marker moving unit is used for controlling the position marker to move and simulating flight;
the temperature simulation unit is used for simulating the ambient temperature of the position marker in the motion process.
In a possible implementation manner, the landmark information collecting and processing module includes a collecting unit, a storage unit, and a display unit, where:
the acquisition unit is used for acquiring various parameter data information of the position marker, position information and motion information of the position marker in the motion process of the position marker;
the storage unit is used for storing various parameter data information of the position marker, position information and motion information of the position marker;
the display unit is used for displaying various parameter data information of the position marker, position information and motion information of the position marker.
In a possible implementation manner, the display unit adopts control display or waveform curve display, the control display directly displays various parameter data information of the position marker and position information and motion information of the position marker through a display, and the waveform curve display displays various parameter data information of the position marker and position information and motion information of the position marker as a waveform curve graph according to time manufacture.
In a possible implementation manner, the flight device position marker testing system further comprises a playback unit, and the playback unit is used for playing back the whole testing process after the high and low temperature testing of the flight device position marker.
In a possible implementation manner, the flight device position marker testing system further comprises a power supply unit, wherein the power supply unit is used for supplying power to each power device in the high and low temperature testing process of the flight device position marker.
In a possible implementation manner, the flight device position marker further comprises an inquiry unit, and the inquiry unit is used for inquiring the test data after the high and low temperature tests of the flight device position marker.
In a possible implementation mode, the device further comprises a gas supply unit, and the gas supply unit is used for supplying high-pressure nitrogen gas in the simulation test process of the position marker.
In one possible implementation manner, the testing process of the high and low temperature testing system of the flight device position marker is as follows:
(S1) clamping and fixing the position marker by the position marker clamping unit;
(S2) the temperature simulation unit simulates the ambient temperature in the movement process of the position marker;
the air supply unit provides high-pressure nitrogen in the simulation test process of the position marker;
the power supply unit supplies power to each power device in the high-low temperature test process of the flight device position marker;
(S3) the position marker moving unit controls the position marker to move and simulate flight;
(S4), the acquisition unit acquires various parameter data information of the position marker, and position information and motion information of the position marker in the motion process of the position marker;
(S5), the storage unit stores the parameter data information of each item of the marker, the position information and the motion information of the marker;
(S6), the display unit displays the parameter data information of the marker, the position information and the motion information of the marker.
According to the invention, through the cooperation of the position marker simulation control testing module and the position marker information acquisition processing module, the detection of various technical parameters of the position marker of the flight device in high and low temperature environments can be realized, various parameter information in the whole testing process is recorded, the reliability of the measuring process and the confidence coefficient of the measuring result are improved, testers are released from the past working environment, the testing result is prevented from being influenced by human intervention, the testing speed is high, and the testing efficiency is high.
The invention also discloses a method for displaying the parameter data information of the position marker, the position information and the motion information of the position marker by arranging a display unit, wherein the display unit can display the parameter data information of the position marker, the position information and the motion information of the position marker by adopting control display or waveform curve display, the control display directly displays the parameter data information of the position marker, the position information and the motion information of the position marker by a display, the waveform curve display displays the parameter data information of the position marker, the position information and the motion information of the position marker as a waveform curve graph according to time, and the parameter data information of the position marker, the position information and the motion information of the position marker can be visually displayed by the two modes, and meanwhile, the fluctuation condition of the whole information in the process can be tested.
Drawings
FIG. 1 is a system block diagram of the present invention.
Detailed Description
The following further describes a specific embodiment of the high and low temperature test system of the position marker of the flight device according to the present invention with reference to fig. 1. The high and low temperature test system for the position marker of the flight device is not limited to the description of the following embodiments.
Example 1:
the present embodiment provides a specific structure of a high and low temperature test system for a flight device beacon device, as shown in fig. 1, which includes a beacon device simulation control test module and a beacon device information acquisition processing module, wherein,
the position marker simulation control test module is used for simulating the movement of the position marker and simulating the environmental parameters in the movement process of the position marker;
the position marker information acquisition processing module is used for acquiring and processing parameter information in the movement process of the position marker.
The position marker simulation control test module comprises a position marker clamping unit, a position marker moving unit and a temperature simulation unit, wherein:
the position marker clamping unit is used for clamping and fixing the position marker;
the position marker moving unit is used for controlling the position marker to move and simulating flight;
the temperature simulation unit is used for simulating the ambient temperature in the movement process of the position marker.
The information acquisition and processing module of the position marker comprises an acquisition unit, a storage unit and a display unit, wherein:
the acquisition unit is used for acquiring various parameter data information of the position marker, position information and motion information of the position marker in the motion process of the position marker;
the storage unit is used for storing various parameter data information of the position marker, position information and motion information of the position marker;
the display unit is used for displaying various parameter data information of the position marker, position information and motion information of the position marker.
The display unit adopts control display or waveform curve display, the control display directly displays various parameter data information of the position marker and position information and motion information of the position marker through a display, and the waveform curve display displays various parameter data information of the position marker and position information and motion information of the position marker as a waveform curve graph according to time.
The flight device position marker device is characterized by further comprising a playback unit, wherein the playback unit is used for playing back the whole testing process after the flight device position marker device is subjected to high and low temperature testing.
The power supply unit is used for supplying power to all power equipment in the high-low temperature test process of the flight device position marker.
The device also comprises an inquiry unit, wherein the inquiry unit is used for inquiring the test data after the high-low temperature test of the position marker of the flight device.
The device also comprises an air supply unit, wherein the air supply unit is used for providing high-pressure nitrogen in the simulation test process of the position marker.
Example 2:
the present embodiment provides a specific structure of a high and low temperature test system for a flight device beacon device, as shown in fig. 1, which includes a beacon device simulation control test module and a beacon device information acquisition processing module, wherein,
the position marker simulation control test module is used for simulating the movement of the position marker and simulating the environmental parameters in the movement process of the position marker;
the position marker information acquisition processing module is used for acquiring and processing parameter information in the movement process of the position marker.
The position marker simulation control test module comprises a position marker clamping unit, a position marker moving unit and a temperature simulation unit, wherein:
the position marker clamping unit is used for clamping and fixing the position marker;
the position marker moving unit is used for controlling the position marker to move and simulating flight;
the temperature simulation unit is used for simulating the ambient temperature in the movement process of the position marker.
The information acquisition and processing module of the position marker comprises an acquisition unit, a storage unit and a display unit, wherein:
the acquisition unit is used for acquiring various parameter data information of the position marker, position information and motion information of the position marker in the motion process of the position marker;
the storage unit is used for storing various parameter data information of the position marker, position information and motion information of the position marker;
the display unit is used for displaying various parameter data information of the position marker, position information and motion information of the position marker.
The display unit adopts control display or waveform curve display, the control display directly displays various parameter data information of the position marker and position information and motion information of the position marker through a display, and the waveform curve display displays various parameter data information of the position marker and position information and motion information of the position marker as a waveform curve graph according to time.
The flight device position marker device is characterized by further comprising a playback unit, wherein the playback unit is used for playing back the whole testing process after the flight device position marker device is subjected to high and low temperature testing.
The power supply unit is used for supplying power to all power equipment in the high-low temperature test process of the flight device position marker.
The device also comprises an inquiry unit, wherein the inquiry unit is used for inquiring the test data after the high-low temperature test of the position marker of the flight device.
The device also comprises an air supply unit, wherein the air supply unit is used for providing high-pressure nitrogen in the simulation test process of the position marker.
The test process of the high and low temperature test system of the flight device position marker is as follows:
(S1) clamping and fixing the position marker by the position marker clamping unit;
(S2) the temperature simulation unit simulates the environmental temperature of the position marker in the movement process;
providing high-pressure nitrogen in the simulation test process of the air supply unit alignment marker;
the power supply unit supplies power to each power device in the high-low temperature test process of the position marker of the flight device;
(S3) the position marker moving unit controls the position marker to move and simulate flight;
(S4), the acquisition unit acquires the parameter data information of the position marker, the position information and the motion information of the position marker in the motion process of the position marker;
(S5), the storage unit stores the parameter data information of each item of the coordinator, the position information and the motion information of the coordinator;
(S6), the display unit displays the parameter data information of the position marker, the position information and the motion information of the position marker.
In combination with example 1-example 2, it can be seen that:
the system can realize the detection of various technical parameters of the flight device position marker in high and low temperature environments by arranging the position marker simulation control test module and the position marker information acquisition processing module, and records various parameter information in the whole test process, thereby improving the reliability of the measurement process and the confidence coefficient of the measurement result, freeing testers from the past working environment and avoiding the influence of human intervention on the test result.
The invention also discloses a method for displaying the parameter data information of the position marker, the position information and the motion information of the position marker by arranging a display unit, wherein the display unit can display the parameter data information of the position marker, the position information and the motion information of the position marker by adopting control display or waveform curve display, the control display directly displays the parameter data information of the position marker, the position information and the motion information of the position marker by a display, the waveform curve display displays the parameter data information of the position marker, the position information and the motion information of the position marker as a waveform curve graph according to time, and the parameter data information of the position marker, the position information and the motion information of the position marker can be visually displayed by the two modes, and meanwhile, the fluctuation condition of the whole information in the process can be tested.
The foregoing is a more detailed description of the invention in connection with specific preferred embodiments and it is not intended that the invention be limited to these specific details. For those skilled in the art to which the invention pertains, several simple deductions or substitutions can be made without departing from the spirit of the invention, and all shall be considered as belonging to the protection scope of the invention.
Claims (9)
1. The utility model provides a high low temperature test system of flight device position marker which characterized in that: comprises a marker simulation control test module and a marker information acquisition processing module, wherein,
the position marker simulation control test module is used for simulating the movement of the position marker and simulating the environmental parameters in the movement process of the position marker;
the position marker information acquisition processing module is used for acquiring and processing parameter information in the movement process of the position marker.
2. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the position marker simulation control test module comprises a position marker clamping unit, a position marker moving unit and a temperature simulation unit, wherein:
the position marker clamping unit is used for clamping and fixing the position marker;
the position marker moving unit is used for controlling the position marker to move and simulating flight;
the temperature simulation unit is used for simulating the ambient temperature of the position marker in the motion process.
3. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the information acquisition and processing module of the position marker comprises an acquisition unit, a storage unit and a display unit, wherein:
the acquisition unit is used for acquiring various parameter data information of the position marker, position information and motion information of the position marker in the motion process of the position marker;
the storage unit is used for storing various parameter data information of the position marker, position information and motion information of the position marker;
the display unit is used for displaying various parameter data information of the position marker, position information and motion information of the position marker.
4. The high and low temperature test system for the position marker of the flight device according to claim 3, wherein: the display unit adopts control display or waveform curve display, the control display directly displays various parameter data information of the position marker and position information and motion information of the position marker through a display, and the waveform curve display displays various parameter data information of the position marker and position information and motion information of the position marker as a waveform curve graph according to time manufacture.
5. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the flight device position marker device is characterized by further comprising a playback unit, wherein the playback unit is used for playing back the whole testing process after the flight device position marker device is subjected to high and low temperature testing.
6. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the device also comprises a power supply unit, wherein the power supply unit is used for supplying power to each power device in the high-low temperature test process of the flight device position marker.
7. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the aircraft position marker data query device further comprises a query unit, and the query unit is used for querying the test data after the high and low temperature tests of the aircraft position marker.
8. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the device further comprises an air supply unit, and the air supply unit is used for providing high-pressure nitrogen in the simulation test process of the position marker.
9. The high and low temperature test system for the position marker of the flight device according to claim 1, wherein: the testing process of the high and low temperature testing system of the flight device position marker is as follows:
(S1) clamping and fixing the position marker by the position marker clamping unit;
(S2) the temperature simulation unit simulates the ambient temperature in the movement process of the position marker;
the air supply unit provides high-pressure nitrogen in the simulation test process of the position marker;
the power supply unit supplies power to each power device in the high-low temperature test process of the flight device position marker;
(S3) the position marker moving unit controls the position marker to move and simulate flight;
(S4), the acquisition unit acquires various parameter data information of the position marker, and position information and motion information of the position marker in the motion process of the position marker;
(S5), the storage unit stores the parameter data information of each item of the marker, the position information and the motion information of the marker;
(S6), the display unit displays the parameter data information of the marker, the position information and the motion information of the marker.
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| CN202111554076.5A CN114229033A (en) | 2021-12-17 | 2021-12-17 | High-low temperature test system for flight device position marker |
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