CN114216557B - Method and device for measuring normalized noise exposure level - Google Patents
Method and device for measuring normalized noise exposure level Download PDFInfo
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Abstract
The application relates to a method and a device for measuring normalized noise exposure level, which are used for correcting noise exposure by analyzing the statistical characteristics of noise signals so as to obtain corrected noise exposure level, and predicting hearing loss by taking the corrected noise exposure level as the normalized noise exposure level can effectively improve the prediction accuracy of hearing loss caused by complex noise. The method specifically adopts the waveform fluctuation index to distinguish the noise with the pulse component from the steady-state noise, and on one hand, the waveform fluctuation index can distinguish the hearing impairment degree caused by the noise with different time domain structures under the same noise exposure level. On the other hand, correcting the noise level using waveform fluctuation index adjustment can accurately evaluate NIHL (noise hearing loss).
Description
Technical Field
The present disclosure relates to the field of noise indicator measurement technologies, and in particular, to a method and an apparatus for measuring normalized noise exposure level.
Background
Noise hearing loss is not only caused by professional noise in the population, but is also the result of total noise exposure. The risk of permanent hearing loss due to regular occupational noise exposure or daily repeated noise exposure of the population is related to the noise exposure level and the duration of the noise exposure. The traditional method for measuring the noise exposure level generally adopts the GB/T-14366 noise standard, adopts the measurement of the noise exposure level to use the normalized exposure level of 8h working days in the exposure period generally, and uses L ex，8h To represent.
Researchers have long found, however, that impulse noise or complex noise with impulse/impact components is more detrimental to hearing than continuous steady state (gaussian) noise at similar noise exposure levels. The conventional GB/T-14366 noise standard is determined based on hearing loss caused by continuous stationary noise, which underestimates the hearing impairment of non-gaussian complex noise with the same equivalent sound pressure level.
Disclosure of Invention
Based on the above, it is necessary to provide a method and a device for measuring normalized noise exposure level, which solve the problems that the accuracy of the measurement result of noise exposure level is not high and deviation from the actual situation exists because the damage factor of non-gaussian complex noise to hearing is ignored in the conventional method for measuring noise exposure level.
The application provides a method for determining normalized noise exposure level, which comprises the following steps:
acquiring a noise signal of a current time node, and converting the noise signal into a voltage amplitude;
calling historical voltage amplitude data in a time unit to which a current time node belongs;
calculating a waveform fluctuation index in the time unit to which the current time node belongs by using a formula 1 according to the historical voltage amplitude data in the time unit to which the current time node belongs and the voltage amplitude under the current time node;
wherein beta is j The waveform fluctuation index x in the time unit to which the current time node belongs i N is the total number of historical voltage amplitudes in a time unit to which the current time node belongs, i is the serial number of the time node, and j is the serial number of the time unit; when i is n+1, x i Equal to the voltage amplitude at the current time node;
calculating the waveform fluctuation index under the whole shift according to the formula 2;
wherein beta is N For the waveform fluctuation index under the whole shift, N is the total number of historical time units in the whole shift, i is the sequence number of the time node, and j is the sequence number of the time unit;
converting the voltage amplitude value under each time node in the whole shift into a noise A weighting sound pressure parameter;
calculating the basic noise exposure level of the whole shift according to a formula 3;
wherein,l is the basic noise exposure level of the whole shift Aeq Te For the noise equivalent sound level of the whole shift, te is the working time of the whole shift, T 0 For a shift reference time, C is the conversion coefficient, x i,A Weighting sound pressure parameters for noise A under a time node i, wherein W is the total number of historical voltage amplitudes in the whole shift;
calculating and correcting the basic noise exposure level of the whole shift according to the formula 4 to obtain the normalized noise exposure level of the whole shift;
wherein,normalized noise exposure level for the whole shift, +.>For the base noise exposure level of the whole shift, lambda is a fixed coefficient, beta p Waveform fluctuation index of pure tone signal, beta N For the waveform fluctuation index over the shift, N is the history over the shiftTotal number of time units.
The application also relates to a device for determining normalized noise exposure level, which is characterized by comprising:
a microphone;
an A/D converter in communication with the microphone;
the singlechip is in communication connection with the A/D converter and is used for executing the method for measuring the normalized noise exposure level;
and the display is in communication connection with the singlechip.
The application relates to a method and a device for measuring normalized noise exposure level, which are used for correcting noise exposure by analyzing the statistical characteristics of noise signals so as to obtain corrected noise exposure level, and predicting hearing loss by taking the corrected noise exposure level as the normalized noise exposure level can effectively improve the prediction accuracy of hearing loss caused by complex noise. The method specifically adopts the waveform fluctuation index to distinguish the noise with the pulse component from the steady-state noise, and on one hand, the waveform fluctuation index can distinguish the hearing impairment degree caused by the noise with different time domain structures under the same noise exposure level. On the other hand, correcting the noise level using waveform fluctuation index adjustment can accurately evaluate NIHL (noise hearing loss).
Drawings
Fig. 1 is a flow chart of a method for determining normalized noise exposure level according to an embodiment of the present application.
Fig. 2 is a schematic structural diagram of a device for measuring normalized noise exposure level according to an embodiment of the present application.
Fig. 3 is a time-voltage amplitude diagram of a pure tone signal.
Fig. 4 is a time-voltage amplitude diagram of gaussian noise.
Fig. 5 is a time-voltage amplitude diagram of tone burst.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
The application provides a method for determining normalized noise exposure level.
The method for measuring the normalized noise exposure level provided by the application is not limited to the execution subject thereof. Alternatively, the execution subject of the method for determining a normalized noise exposure level provided in the present application may be a device for determining a normalized noise exposure level.
Specifically, the execution body may be a single chip microcomputer in the measurement device for normalizing the noise exposure level.
As shown in fig. 1, in an embodiment of the present application, the method for determining the normalized noise exposure level includes the following steps S100 to S700:
s100, obtaining a noise signal of a current time node, and converting the noise signal into a voltage amplitude.
In particular, the description of "converting the noise signal into a voltage amplitude" is simplified, and a specific procedure for converting the noise signal into a voltage amplitude is described in detail below.
First, the microphone collects a noise signal of a current time node, and the microphone transmits the noise signal of the current time node to the a/D converter. Further, the A/D converter converts the noise signal of the current time node into an electric signal of the current time node, and sends the electric signal of the current time node to the singlechip for recognition by the singlechip. Finally, the singlechip converts the electric signal of the current time node into a digital signal of the current time node, namely the voltage amplitude of the current time node.
S200, historical voltage amplitude data in a time unit to which the current time node belongs is called.
Specifically, the device for measuring the normalized noise exposure level may be externally connected to a server. The means for determining the normalized noise exposure level may retrieve historical voltage amplitude data from the server for the time cell to which the current time node belongs. The historical voltage amplitude data in the time unit to which the current time node belongs comprises voltage amplitudes under each historical time node in the time unit to which the current time node belongs.
S310, calculating the waveform fluctuation index in the time unit of the current time node by using a formula 1 according to the historical voltage amplitude data in the time unit of the current time node and the voltage amplitude under the current time node.
Wherein beta is j The waveform fluctuation index in the time unit to which the current time node belongs. X is x i Is the voltage magnitude at time node i. n is the total number of historical voltage amplitudes in the time unit to which the current time node belongs. i is the sequence number of the time node. j is the sequence number of the time cell. When i is n+1, x i Equal to the voltage amplitude at the current time node.
Specifically, since n is the total number of historical voltage amplitudes in the time unit to which the current time node belongs, in equation 1, when calculating the waveform fluctuation index, the voltage amplitude at the current time node should be added, so i in equation 1 is taken from 1 to n+1. Through the step, the voltage amplitude under one current time node can be acquired, and the voltage amplitude can be immediately added into the formula 1 to calculate the waveform fluctuation index without waiting for the calculation after the voltage amplitudes under all the time nodes are acquired, so that the calculation efficiency is greatly improved, and the waveform fluctuation index obtained through real-time calculation can be immediately used in the subsequent steps.
In addition, equation 1 can calculate the waveform fluctuation index of various sound signals. Through the calculation of the applicant, as shown in fig. 3, the waveform fluctuation index of the pure tone signal is 1.5, and it is obvious from fig. 3 that the waveform of the pure tone signal is a regular sine wave. As shown in fig. 4, the waveform fluctuation index of the gaussian noise is 3.0, and it is apparent from fig. 4 that the gaussian noise is a pink noise waveform. As shown in fig. 5, the waveform fluctuation index of the tone burst is 20, and fig. 5 shows a tone burst having a period of 0.1 seconds and a duration of 10 milliseconds. S400, calculating the waveform fluctuation index of the noise signal under the whole shift according to the formula 2.
Wherein beta is N Is the undulation index over the shift. N is the total number of historical time units in the entire shift. i is the sequence number of the time node. j is the sequence number of the time cell.
Specifically, a shift includes a plurality of time units. Therefore, the waveform fluctuation index β in the time unit to which the current time node belongs is calculated at S300 j Equation 2 can then be used to determine beta in different time units j And adding and then averaging to obtain the waveform fluctuation index of the noise signal under the whole shift. Thus, beta j The actual meaning is the waveform fluctuation index within time cell j, since equation 1 needs to be interpreted using the term "time cell to which the current time node belongs", β in equation 1 j The meaning of (c) is written as the waveform fluctuation index in the time unit to which the current time node belongs, and those skilled in the art can clearly know beta according to the formulas 1 and 2 and the description in the foregoing and the following of the application j Meaning that the waveform in time unit j fluctuates with no confusion.
S500, converting the voltage amplitude under each time node in the whole shift into a noise A weighting sound pressure parameter.
Specifically, the voltage amplitude at each time node is converted into a noise a weighting sound pressure parameter according to a conversion formula 6:
X i,A ＝a 0 X i +a 1 X i-1 +a 2 X i-2 +a 3 X i-3 +a 4 X i-4 +a 5 X i-5 +a 6 X i-6
-b 1 X i-1,A -b 2 X i-2,A -b 3 X i-3,A -b 4 X i-4,A -b 5 X i-5,A -b 6 X i-6,A
equation 6
Wherein X is i，A Weighting sound pressure parameter X for noise A under time node i i-1，A Weighting sound pressure parameter X for noise A under time node i-1 i-2，A Weigh sound pressure parameters for noise a at time node i-2.
X i For the voltage amplitude at time node i, X i-1 For the voltage amplitude at time node i-1, X i-2 Voltage magnitude at time node i-1.
a 0 ，a 1 ，a 2 ，a 3 ，a 4 ，a 5 ，a 6 Are 7 first type parameters whose values are different from each other. Wherein a is 0 Is 0.477857.a, a 1 Is-0.16590. a, a 2 Is-0.68390. a, a 3 Is 0.03124.a, a 4 Is 0.268102.a, a 5 Is 0.06804.a, a 6 Is 0.00456.
b 1 ，b 2 ，b 3 ，b 4 ，b 5 ，b 6 Is 6 second type parameters with different values. b 1 Is-0.936808. b 2 Is-0.91379. b 3 Is 0.73910.b 4 Is 0.21974.b 5 Is-0.11174. b 6 Is 0.0058835.
When the subscript of any one of the parameters in equation 6 appears negative, that parameter may not be added to the equation for calculation. For example, when calculating the voltage amplitude X at the first time node 1，A When equation 6 becomes X 1 ， A ＝a 0 X 1 +a 1 X 0 -b 1 Y 0,A Other parameters may not be added to the formula for calculation. X is X 0 Is the preset initial voltage amplitude value of Y 0,A And presetting an initial noise A weighting sound pressure parameter.
S600, calculating the basic noise exposure level of the whole shift according to the formula 3.
Wherein,the base noise exposure level for the entire shift. L (L) Aeq Te Is the noise equivalent sound level of the whole shift. Te is the working time of the whole shift. T (T) 0 Is the reference time for a shift. C is the conversion coefficient. X is x i,A The sound pressure parameter is weighted for noise a at time node i. W is the total number of historical voltage magnitudes over the shift.
Specifically, C is a conversion coefficient of voltage amplitude to sound pressure parameter, and is a constant related to the sensitivity of the microphone. T (T) 0 The reference time for one shift may be set to 8 hours. W is the total number of historical voltage amplitudes over the whole shift, since here S500 voltage amplitudes have been converted into noise a weighting sound pressure parameters, the total number of historical voltage amplitudes over the whole shift = total number of historical noise a weighting sound pressure parameters over the whole shift, i.e. equation 3 can be calculated with the total number of historical voltage amplitudes W over the whole shift.
And S700, calculating and correcting the basic noise exposure level of the whole shift according to the formula 4 to obtain the normalized noise exposure level of the whole shift.
Wherein,normalized noise exposure level for the entire shift. />The base noise exposure level for the entire shift. Lambda is a fixed coefficient. Beta p Waveform of pure tone signalA heave index. Beta N Is the undulation index over the shift. N is the total number of historical time units in the entire shift.
Specifically, λ is a fixed coefficient, and the value thereof may be optimized by statistical analysis and then taken as 6.5. Beta p The waveform fluctuation index of the pure tone signal can be calculated according to the formula 1, and the value is 1.5.
In this embodiment, the noise exposure is corrected by analyzing the statistical characteristics of the noise signal, so as to obtain a corrected noise exposure level, and the hearing loss is predicted by using the corrected noise exposure level as the normalized noise exposure level, so that the prediction accuracy of the hearing loss caused by complex noise can be effectively improved. The method specifically adopts the waveform fluctuation index to distinguish the noise with the pulse component from the steady-state noise, and on one hand, the waveform fluctuation index can distinguish the hearing impairment degree caused by the noise with different time domain structures under the same noise exposure level. On the other hand, correcting the noise level using waveform fluctuation index adjustment can accurately evaluate NIHL (noise hearing loss).
In an embodiment of the present application, the noise signal of the current time node is obtained once at preset time intervals.
Specifically, the preset time interval may be set to 1 second.
In an embodiment of the present application, after S700, the method for determining the normalized noise exposure level further includes the following S810 to S820:
and S810, storing the voltage amplitude under the current time node in a historical voltage amplitude database, and updating the historical voltage amplitude data in a time unit to which the current time node belongs in the historical voltage amplitude database.
S820, return to S100.
Specifically, S810 to S820 are steps of storing the voltage amplitude at the current time node in real time.
In an embodiment of the present application, before S100, the determining of the normalized noise exposure level further includes S010 to S040 as follows:
s010, setting the working time of the whole shift.
Specifically, the working time of the whole shift can be set to 8 hours, which is equal to the reference time T of one shift 0 Other values are also possible.
S020, dividing the working time of the whole shift into a plurality of time units, wherein each time unit contains the same time length.
Specifically, each time unit includes the same time length to ensure that the total number of voltage amplitudes collected in each time unit is fixed, so as to eliminate abrupt data changes caused by unnecessary differences between time units.
S030, dividing each time unit into a plurality of time nodes, wherein a time interval between every two adjacent time nodes is a preset time interval.
Specifically, after S810 is performed, S820 is performed after a preset time interval, that is, S100 is returned.
S040, creating storage units corresponding to different time units in the historical voltage amplitude database.
In this embodiment, the working time of the whole shift is divided into a plurality of time units, and a preset time interval for collecting noise signals is set between two adjacent time nodes, so that the density of the original data collected is reduced, the trouble that noise signals are collected once at each time is omitted, and the working efficiency can be greatly improved.
In one embodiment of the present application, each time unit comprises a length of time of 60 seconds.
Specifically, the length of time that each time unit contains may be arbitrarily set.
In an embodiment of the present application, the S810 includes the following S811 to S812:
s811, obtaining a time unit to which the current time node belongs.
And S812, storing the voltage amplitude value under the current time node in a storage unit corresponding to the time unit to which the current time node belongs in a historical voltage amplitude value database.
Specifically, for example, 10 time units in total correspond to 10 memory units, respectively. The current time node belongs to the time unit C, and then the voltage amplitude values representing the previous 2 time units are all collected, and the voltage amplitude value under the current time node is stored in the storage unit C corresponding to the time unit C, so that the data can be effectively prevented from being lost, and the data can be orderly stored.
In an embodiment of the present application, the S200 includes:
s210, all voltage amplitudes in a storage unit corresponding to the time unit to which the current time node belongs in the historical voltage amplitude database are called.
Specifically, when the data is fetched, the data is fetched from the storage unit corresponding to the time unit to which the current time node belongs, so that the data extraction error is prevented.
In an embodiment of the present application, after the step S310, the method for determining the normalized noise exposure level further includes the following steps S321 to S324:
s321, converting the voltage amplitude value of each time node in the time unit to which the current time node belongs into a noise A weighting sound pressure parameter.
S322, calculating the noise equivalent sound level in the time unit to which the current time node belongs according to the formula 5.
Wherein L is Aeq Te Is the noise equivalent sound level in the time unit to which the time node i belongs. M is the total number of historical voltage amplitudes in the time unit to which the time node i belongs. (x) i,A ) The sound pressure parameter is weighted for noise a at time node i. C is the conversion coefficient. i is the time node sequence number.
Specifically, equation 5 is a part of equation 3, and the parameters are also the same, for example, C is a conversion coefficient of voltage amplitude to sound pressure parameter, and is a constant related to the sensitivity of the microphone.
S323, judging whether the noise equivalent sound level in the time unit to which the current time node belongs is smaller than a hearing damage level threshold.
S324, if the noise equivalent sound level in the time unit to which the current time node belongs is smaller than the hearing damage level threshold, deleting the voltage amplitude value under the previous time node and deleting the waveform fluctuation index of the noise signal under the current time node, and returning to S100.
Specifically, if the noise equivalent level is less than the hearing impairment level threshold, this indicates that the noise equivalent level is negligible to the hearing impairment.
According to the embodiment, by introducing the hearing damage level threshold and judging whether the noise equivalent sound level in the time unit to which the current time node belongs is smaller than the hearing damage level threshold, when the noise equivalent sound level in the time unit to which the current time node belongs is smaller than the hearing damage level threshold, deleting the voltage amplitude value under the time node before deleting and deleting the waveform fluctuation index of the noise signal under the current time node, so that the voltage amplitude value corresponding to the noise equivalent sound level which is ignored for hearing damage is deleted, and deleting the data with low value.
In one embodiment of the present application, the hearing impairment level threshold is 70dB.
Specifically, the unit employed in this embodiment is dB, that is, decibel. The equivalent sound level of the noise below 70db is negligible to the hearing impairment. This arrangement is more practical.
The application also provides a measuring device for normalizing the noise exposure level. Comprising the following steps:
as shown in fig. 2, in an embodiment of the present application, the apparatus for determining the normalized noise exposure level includes a microphone 100, an a/D converter 200, a single-chip microcomputer 300, and a display 400.
The a/D converter 200 is communicatively coupled to the microphone 100. The single-chip microcomputer 300 is in communication connection with the a/D converter 200. The single chip 300 is used to perform the method of determining normalized noise exposure level as mentioned in the foregoing. The display 400 is communicatively connected to the single-chip microcomputer 300 for displaying various detected and calculated data.
Specifically, the device for measuring the normalized noise exposure level may be externally connected to a server having a memory, where the server is used for storing data.
In the above description, for simplicity, only the parts of the apparatus for measuring the normalized noise exposure level (i.e., the present embodiment) are labeled with the same names as those appearing in the method for measuring the normalized noise exposure level.
The technical features of the above embodiments may be combined arbitrarily, and the steps of the method are not limited to the execution sequence, so that all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description of the present specification.
The above examples only represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the present application. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application shall be subject to the appended claims.
Claims (10)
1. A method of determining a normalized noise exposure level, the method comprising:
acquiring a noise signal of a current time node, and converting the noise signal into a voltage amplitude;
calling historical voltage amplitude data in a time unit to which a current time node belongs;
calculating a waveform fluctuation index in the time unit to which the current time node belongs by using a formula 1 according to the historical voltage amplitude data in the time unit to which the current time node belongs and the voltage amplitude under the current time node;
wherein beta is j The waveform fluctuation index x in the time unit to which the current time node belongs i N is the total number of historical voltage amplitudes in a time unit to which the current time node belongs, i is the serial number of the time node, and j is the serial number of the time unit; when i is n+1, x i Equal to the voltage amplitude at the current time node;
calculating the waveform fluctuation index under the whole shift according to the formula 2;
wherein beta is N For the waveform fluctuation index under the whole shift, N is the total number of historical time units in the whole shift, i is the sequence number of the time node, and j is the sequence number of the time unit;
converting the voltage amplitude value under each time node in the whole shift into a noise A weighting sound pressure parameter;
calculating the basic noise exposure level of the whole shift according to a formula 3;
wherein,l is the basic noise exposure level of the whole shift Aeq Te For the noise equivalent sound level of the whole shift, te is the working time of the whole shift, T 0 For a shift reference time, C is the conversion coefficient, x i,A Weighting sound pressure parameters for noise A under a time node i, wherein W is the total number of historical voltage amplitudes in the whole shift;
calculating and correcting the basic noise exposure level of the whole shift according to the formula 4 to obtain the normalized noise exposure level of the whole shift;
wherein,normalized noise exposure level for the whole shift, +.>For the base noise exposure level of the whole shift, lambda is a fixed coefficient, beta p Waveform fluctuation index of pure tone signal, beta N For the waveform fluctuation index over the shift, N is the total number of historical time units over the shift.
2. The method for determining a normalized noise exposure level according to claim 1, wherein the noise signal of the current time node is acquired once every a preset time interval.
3. The method for determining a normalized noise exposure level according to claim 2, wherein after the calculating according to formula 4 corrects the basic noise exposure level of the entire shift to obtain the normalized noise exposure level of the entire shift, the method further comprises:
storing the voltage amplitude value under the current time node in a historical voltage amplitude value database, and updating historical voltage amplitude value data in a time unit to which the current time node in the historical voltage amplitude value database belongs;
and returning to the step of acquiring the noise signal of the current time node and converting the noise signal into the voltage amplitude.
4.A method of determining a normalized noise exposure level according to claim 3, wherein prior to said obtaining a noise signal for a current time node, converting said noise signal to a voltage magnitude, said method further comprises:
setting the working time of the whole shift;
dividing the working time of the whole shift into a plurality of time units, wherein each time unit contains the same time length;
dividing each time unit into a plurality of time nodes, wherein the time interval between every two adjacent time nodes is a preset time interval;
memory cells corresponding to different time cells are created in a historical voltage magnitude database.
5. The method of claim 4, wherein each time unit comprises a time period of 60 seconds.
6. The method for determining the normalized noise exposure level according to claim 5, wherein the step of storing the voltage amplitude at the current time node in the historical voltage amplitude database and updating the historical voltage amplitude data in the time unit to which the current time node belongs in the historical voltage amplitude database includes:
acquiring a time unit to which a current time node belongs;
and storing the voltage amplitude value under the current time node in a storage unit corresponding to the time unit to which the current time node belongs in a historical voltage amplitude database.
7. The method of claim 6, wherein the retrieving historical voltage amplitude data for the time cell to which the current time node belongs comprises:
and calling all voltage amplitudes in a storage unit corresponding to the time unit to which the current time node belongs in the historical voltage amplitude database.
8. The method of claim 7, wherein after calculating the waveform fluctuation index in the time cell to which the current time node belongs using equation 1 based on the historical voltage amplitude data in the time cell to which the current time node belongs and the voltage amplitude at the current time node, the method further comprises:
converting the voltage amplitude value of each time node in the time unit to which the current time node belongs into a noise A weighting sound pressure parameter;
calculating the noise equivalent sound level in the time unit to which the current time node belongs according to the formula 5;
wherein L is Aeq Te For the noise equivalent sound level in the time unit to which the time node i belongs, M is the total number of historical voltage amplitudes in the time unit to which the time node i belongs, (x) i,A ) Weighting sound pressure parameters for noise A under a time node i, wherein C is a conversion coefficient, and i is a time node serial number;
judging whether the noise equivalent sound level in the time unit to which the current time node belongs is smaller than a hearing damage level threshold value or not;
if the noise equivalent sound level in the time unit to which the current time node belongs is smaller than the hearing damage level threshold, deleting the voltage amplitude value under the current time node, deleting the waveform fluctuation index of the noise signal under the current time node, returning to the step of acquiring the noise signal of the current time node, and converting the noise signal into the voltage amplitude value.
9. The method of claim 8, wherein the hearing impairment level threshold is 70dB.
10. A device for measuring normalized noise exposure level, comprising:
a microphone;
an A/D converter in communication with the microphone;
the singlechip is in communication connection with the A/D converter and is used for executing the method for measuring the normalized noise exposure level according to any one of claims 1 to 9;
and the display is in communication connection with the singlechip.
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| CN111223564A (en) * | 2020-01-14 | 2020-06-02 | 浙江大学 | Noise hearing loss prediction system based on convolutional neural network |
| CN113739906A (en) * | 2021-08-31 | 2021-12-03 | 深圳市飞科笛系统开发有限公司 | Noise exposure index statistical method, device, equipment and storage medium |
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