CN114201072A - Calibration method, device and equipment of touch chip and storage medium - Google Patents
Calibration method, device and equipment of touch chip and storage medium Download PDFInfo
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
- G06F3/0418—Control or interface arrangements specially adapted for digitisers for error correction or compensation, e.g. based on parallax, calibration or alignment
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
The invention discloses a calibration method, a device, equipment and a storage medium of a touch chip, wherein the method comprises the steps of obtaining the basic test frequency of each basic RC calibration value of the touch chip to be calibrated; determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of tests, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the rapid and accurate calibration of the touch chip is realized.
Description
Technical Field
The present invention relates to the field of semiconductor technologies, and in particular, to a method, an apparatus, a device, and a storage medium for calibrating a touch chip.
Background
At present, each touch chip is provided with a frequency for normal work at normal temperature, but the natural frequencies of the chips are different inevitably in the production process of the touch chips. In order to enable the touch chips with different natural frequencies to normally work at the same frequency at normal temperature, the touch chips need to be calibrated before leaving the factory. The existing calibration method is based on the continuous test of the intermediate value, and the next calibration value is continuously changed in the analysis of the test result so as to continuously approach to the target value until a satisfactory result is obtained.
Disclosure of Invention
The invention provides a calibration method, a calibration device, calibration equipment and a storage medium of a touch chip, and aims to simplify and improve the efficiency and accuracy of chip calibration.
In order to achieve the above object, the present invention provides a calibration method for a touch chip, the method is applied to a calibration device for a touch chip, and the method includes: the method is applied to calibration equipment of the touch chip, and comprises the following steps:
acquiring the basic test frequency of each basic RC (Resistor-capacitor) calibration value of the touch chip to be calibrated;
determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency;
determining a target calibration value range based on the initially selected RC calibration value;
and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
Preferably, the step of determining an initially selected RC calibration value from the base RC calibration values based on the difference between the base test frequency and the ideal frequency comprises:
and calculating the difference value of the basic test frequency of each basic test frequency and the ideal frequency, and determining the basic RC calibration value corresponding to the basic test frequency with the minimum difference value of the basic test frequency as the initially selected RC calibration value.
Preferably, the step of determining a target calibration value range based on the initially selected RC calibration value comprises:
determining the calibration value interval in which the primarily selected RC calibration value is positioned as a target calibration value range;
the step of determining a target calibration value range based on the initially selected RC calibration value further comprises:
sequentially setting the test RC calibration value of the touch chip to be calibrated to a plurality of primarily selected RC calibration values within the target calibration value range;
and after frequency testing, recording the initial selection testing frequency corresponding to the initial selection RC calibration values.
Preferably, the step of determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as the target RC calibration value comprises:
comparing the initial selection test frequency of each initial selection RC calibration value in the target calibration value range with the ideal frequency;
and determining the initial RC calibration value corresponding to the initial test frequency with the minimum difference as the target RC calibration value.
Preferably, before the step of determining the initially selected RC calibration value corresponding to the initially selected test frequency with the smallest difference as the target RC calibration value, the method further includes:
and comparing the difference value corresponding to the primary selection test frequency with the minimum difference value with a preset difference value, and if the difference value is greater than the preset difference value, sending out warning information.
Preferably, the step of obtaining the basic test frequency of each basic RC calibration value of the touch chip to be calibrated further includes:
and setting the basic RC calibration value of the touch chip to be calibrated, and dividing a plurality of calibration value intervals based on the basic RC calibration value.
Preferably, the step of determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as the target RC calibration value further comprises:
and acquiring the running limited frequency of the touch chip to be calibrated, and carrying out frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
In addition, to achieve the above object, an embodiment of the present invention further provides a calibration device for a touch chip, where the calibration device for a touch chip includes:
the acquisition module is used for acquiring the basic test frequency of each basic RC (Resistor-capacitor) calibration value of the touch chip to be calibrated;
a first determining module, configured to determine a preliminary RC calibration value from the base RC calibration values based on a difference between the base test frequency and an ideal frequency;
a second determination module for determining a target calibration value range based on the initially selected RC calibration value;
and a third determination module, configured to determine, from the target calibration value range, a candidate RC calibration value with the initially selected test frequency closest to the ideal frequency as a target RC calibration value.
In addition, to achieve the above object, an embodiment of the present invention further provides a calibration device for a touch chip, including a memory, a processor, and a calibration program for a touch chip stored on the memory, where the calibration program for a touch chip is executed by the processor to implement the steps of the method described above.
In addition, to achieve the above object, an embodiment of the present invention further provides a computer-readable storage medium, where a calibration program of a touch chip is stored on the computer-readable storage medium, and when the calibration program of the touch chip is executed by a processor, the calibration program of the touch chip implements the steps of the method described above.
Compared with the prior art, the calibration method, the calibration device, the calibration equipment and the calibration storage medium of the touch chip provided by the invention comprise the steps of obtaining the basic test frequency of each basic RC calibration value of the touch chip to be calibrated; determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of tests, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the rapid and accurate calibration of the touch chip is realized.
Drawings
Fig. 1 is a schematic diagram of a hardware structure of a calibration device for a touch chip according to embodiments of the present invention;
FIG. 2 is a flowchart illustrating a calibration method for a touch chip according to a first embodiment of the present invention;
FIG. 3 is a flowchart illustrating a calibration method for a touch chip according to a second embodiment of the present invention;
fig. 4 is a functional block diagram of a calibration apparatus for a touch chip according to a first embodiment of the invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The calibration equipment of the touch chip mainly related to the embodiment of the invention is equipment for calibrating the touch chip, and the calibration equipment of the touch chip can test the frequency of the touch chip through microcontrollers such as STM32 and the like. ST is the group of semiconductors by the Italian society (SGS-THOMSON), M is an abbreviation for Microelectronics, 32 denotes 32 bits, and STM32 refers to the 32-bit microcontroller developed by ST corporation. The STM32 belongs to a microcontroller with various common communication interfaces, can be connected with sensors with various functions, and can control various types of equipment.
The touch control in the touch control chip related to the embodiment of the invention refers to a single-point or multi-point touch control technology; a chip, i.e., an ic (integrated Circuit chip), refers to a metal sheet or a non-metal sheet whose end face can be integrated with a friction lining and a friction material layer, generally refers to all electronic components, and is a Circuit module that integrates multiple electronic components on a silicon board to realize a certain specific function. It is the most important part of electronic equipment, and undertakes the functions of operation and storage. The application range of the touch chip covers almost all electronic equipment for military industry and civil use. The silicon chip containing the integrated circuit is small in size and is often part of a computer or other device.
The production process of the touch chip is complex, and the manufacturing process from raw materials to finished products can be precisely controlled even if the manufacturing process is mature, but the frequency of the touch chips manufactured by the same process according to the same standard is different. Therefore, the touch chip needs to be calibrated before leaving the factory so as to ensure subsequent normal and stable use.
Referring to fig. 1, fig. 1 is a schematic diagram of a hardware structure of a calibration apparatus for a touch chip according to embodiments of the present invention. In the embodiment of the present invention, the calibration device of the touch chip may include a processor 1001 (e.g., a Central Processing Unit, CPU), a communication bus 1002, an input port 1003, an output port 1004, and a memory 1005. The communication bus 1002 is used for realizing connection communication among the components; the input port 1003 is used for data input; the output port 1004 is used for data output, the memory 1005 may be a high-speed RAM memory, or a non-volatile memory (non-volatile memory), such as a magnetic disk memory, and the memory 1005 may optionally be a storage device independent of the processor 1001. Those skilled in the art will appreciate that the hardware configuration depicted in FIG. 1 is not intended to be limiting of the present invention, and may include more or less components than those shown, or some components in combination, or a different arrangement of components.
With continued reference to fig. 1, the memory 1005 of fig. 1, which is a readable storage medium, may include an operating system, a network communication module, an application program module, and a calibration program of a touch chip. In fig. 1, the network communication module is mainly used for connecting to a server and performing data communication with the server; the processor 1001 is configured to call a calibration program of the touch chip stored in the memory 1005, and perform the following operations:
acquiring the basic test frequency of each basic RC (Resistor-capacitor) calibration value of the touch chip to be calibrated;
determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency;
determining a target calibration value range based on the initially selected RC calibration value;
and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
The calibration device based on the touch chip provides a first embodiment of the calibration method of the touch chip. Referring to fig. 2, fig. 2 is a flowchart illustrating a calibration method of a touch chip according to a first embodiment of the invention.
As shown in fig. 1, a first embodiment of the present invention provides a calibration method for a touch chip, where the method is applied to a calibration device for a touch chip, and the method includes:
step S101, acquiring a basic test frequency of each basic RC (Resistor-capacitor) calibration value of the touch chip to be calibrated;
the touch chip comprises an RC circuit, the RC circuit corresponds to an RC register used for frequency calibration, the size of the RC register is 8 bits, the adjustable range (hexadecimal) is 0-FF, and 256 (decimal) numerical values can be set, namely the numerical values correspond to 256 frequencies. Generally, each chip has a desired frequency, for example, a desired frequency required by a touch chip is 16 MHZ.
The present embodiment can acquire the frequency of the touch chip by the STM 32. Specifically, the calibration value in the RC register in the touch chip to be calibrated is set to be a designated calibration value, then a test signal is input, the SMT32 is used to detect the test frequency of the touch chip to be calibrated, and then the test frequency is transmitted to the calibration device of the touch chip, so that the calibration device of the touch chip performs calibration based on the received test frequency.
Before testing a touch chip to be calibrated, the basic RC calibration value of the touch chip to be calibrated is set, for example, in hexadecimal, the basic RC calibration value of an RC register is set to 9 values (x)1-x9): 40. 50, 60, 70, 80, 90, A0, B0, C0. And dividing a plurality of calibration value intervals based on the basic RC calibration value. The respective basic calibration values can be taken as middle points of the intervals, and the calibration value intervals are respectively set to be 36-45, 46-55, 56-66 and the like.
After the setting of the basic calibration value is completed, the calibration value of the RC register of the touch chip to be calibrated is set to one of the basic calibration values, then a test signal is input, and the test frequency under the basic calibration value is detected through the SMT32 and sent to the calibration device of the touch chip. It can be understood that the number of times of the test of the basic frequency in the current round depends on the number of the basic calibration values, and if there are 9 basic calibration values, 9 tests are required. In actual production, more or less base calibration values can be set according to the production conditions, the use requirements and the like of the chip.
Step S102, determining a primary selected RC calibration value from the basic RC calibration values based on the difference value between the basic test frequency and the ideal frequency;
and after obtaining each basic test frequency, calculating a basic test frequency difference value between each basic test frequency and the ideal frequency, and determining the basic RC calibration value corresponding to the basic test frequency with the minimum basic test frequency difference value as the initially selected RC calibration value.
Specifically, each of the fundamental test frequencies (f) is calculated separately11-f1x) With said ideal frequency (f)0) Is measured by the base test frequency difference (Δ f)1＝f1x-f0And x is the number of base test frequencies). Then, the difference values of the basic test frequencies are sequenced from large to small or from small to large, the basic test frequency with the minimum basic difference value is determined based on the sequencing result, the basic RC calibration value is determined as the result of the basic frequency test of the current round, and the basic RC calibration value is marked as the initially selected RC calibration value (v)’)。
Step S103, determining a target calibration value range based on the primarily selected RC calibration value;
and after the initial selection RC standard value is determined, determining a calibration value interval in which the initial selection RC calibration value is divided in advance as a target calibration value range. E.g. if the determined initially selected RC calibration value (v)’) At 60, the corresponding 56-66 is determined as the target calibration value range. It will be appreciated that since in the first round of fundamental frequency testing it has been determined that the fundamental test frequency to which the initially selected RC calibration value corresponds is closest to the ideal frequency, the optimum calibration value should also be before and after the initially selected RC calibration value, i.e. before and after the initially selected RC calibration valueAnd the calibration value interval where the RC calibration value is primarily selected.
After the calibration value interval is determined, sequentially setting the calibration value of an RC register in the touch chip as a plurality of initially selected RC calibration values within the target calibration value range; then inputting a test signal, obtaining a primary selection test frequency of the primary selection RC calibration value of the second round of test through SMT32, and respectively inputting the test signal and recording the primary selection test frequency corresponding to a plurality of the primary selection RC calibration values. The test times of the initial calibration value test in the current round correspond to the number of the calibration values in the target interval, and if 16 calibration values exist, 16 tests are carried out.
And step S104, determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
Specifically, the initial selection test frequency (f) of each initial selection RC calibration value in the target calibration value range21-f2nN is the number of initially selected RC calibration values) and the ideal frequency (f)0) Carrying out comparison; the difference (Δ f) of the test frequencies will be initially selected2＝f2n-f0) The initial RC calibration value corresponding to the minimum initial test frequency is determined as the target RC calibration value (v)0)。
Theoretically, by the method provided by the embodiment, it can be determined that the calibration value of each touch chip has obtained the optimal operating frequency. However, some touch chips generate damage which is difficult to repair in the production process, and therefore, it is difficult to obtain a good operating frequency regardless of calibration. In this embodiment, the difference corresponding to the initially selected test frequency with the smallest difference is compared with a preset difference, and if the difference is greater than the preset difference, it indicates that the quality of the corresponding touch chip is not good, and a good working frequency cannot be achieved, so that a warning message is sent out for an operator to further screen the touch chip. The scheme can be used for eliminating poor-quality touch chips and improving the ex-factory qualification rate of the touch chips.
It is understood that in other embodiments, after obtaining the base test frequency or the initial test frequency with a difference of 0 from the ideal frequency, the test may be stopped and the corresponding calibration value may be determined as the target RC calibration value. Therefore, the test is stopped after the ideal frequency is obtained, the useless labor is avoided, the purpose of frequency calibration is achieved, and the resources are saved.
According to the scheme, the basic test frequency of each basic RC calibration value of the touch chip to be calibrated is obtained; determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of tests, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the rapid and accurate calibration of the touch chip is realized.
As shown in fig. 2, a second embodiment of the present invention provides a calibration method for a touch chip, based on the first embodiment shown in fig. 1, after the step of determining a candidate RC calibration value having a first selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value, the method further includes:
step S105: and acquiring the running limited frequency of the touch chip to be calibrated, and carrying out frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
The touch chip can give off heat in the operation process, and the heat is not timely dissipated, so that the temperature of the chip is increased, the performance of the touch chip can be restricted after the temperature is increased, and equipment carried by the touch chip can be burned out even in severe cases. Generally, when the temperature of the touch chip reaches a certain threshold, the frequency of the touch chip is limited, and the performance of the touch chip must be sacrificed. After the chip is put into use, the relationship between the operating frequency and the temperature is generally controlled by various methods, and even the chip is forcibly turned off to protect the device. In consideration of different use environments of different devices, the present embodiment takes the environmental parameters into consideration before the touch chip leaves the factory, so as to prolong the lifetime of the chip and improve the accuracy of chip calibration from the use perspective.
In this embodiment, the limited frequency of the operation of the touch chip to be calibrated is obtained in advance, and the limited frequency in this embodiment includes a high-temperature limited frequency and a low-temperature limited frequency. For example, some chips for indoor equipment are operated at an ambient temperature of generally 20 to 25 ℃; the chip used in the cold storage device may be-10-0 ℃; chips for some outdoor equipment may be 30-40 c. Before production, the using place of the chip to be calibrated can be generally known, and the highest temperature and the lowest temperature of the chip capable of normally working can be predicted based on the using place and the heat dissipation coefficient of the touch chip in normal working. After the highest temperature and the lowest temperature are determined, on the premise of protecting normal use of the touch chip, the ideal frequency is replaced by the high frequency and the low frequency. And calibrating respectively with the limited high frequency and the limited low frequency to obtain the corresponding limited high-frequency calibration value and the corresponding limited low-frequency calibration value.
Specifically, the calibration value in the RC register in the touch chip to be calibrated is set to be a designated calibration value, then a test signal is input, the SMT32 is used to detect the test frequency of the touch chip to be calibrated, and then the test frequency is transmitted to the calibration device of the touch chip, so that the calibration device of the touch chip performs calibration based on the received test frequency. Test procedure two runs were performed as referred to in example 1: and performing basic frequency test and initial frequency test, namely replacing the limited high frequency and the limited low frequency with the ideal frequency to screen the corresponding calibration value.
Further, the environmental parameter further includes a continuous use time period. For environmental monitoring devices, the usage time may be thousands of hours, while some portable devices may be only a few hours. Therefore, in other embodiments, the usage duration calibration value may also be set based on the usage duration, and generally, the operating frequency of the touch chip with long usage duration may be lower, so that a lower ideal frequency is set, and then the fundamental frequency test and the initial frequency test are performed to obtain the RC calibration value capable of prolonging the service life of the touch chip.
According to the scheme, the limited frequency of the operation of the touch chip to be calibrated is obtained, the frequency test is carried out based on the limited frequency, the limited RC calibration value serving as the touch chip to be calibrated is obtained, and the RC calibration value of the touch chip is secondarily adjusted based on the actual operating environment parameters of the touch chip on the basis of the determined RC calibration value, so that the touch chip is quickly and accurately calibrated, and the service life of the touch chip can be prolonged.
Further, to achieve the above object, the present invention further provides a calibration apparatus for a touch chip, specifically, referring to fig. 4, fig. 4 is a schematic functional module diagram of a first embodiment of the calibration apparatus for a touch chip of the present invention, the calibration apparatus comprising:
an obtaining module 10, configured to obtain a basic test frequency of each basic RC (Resistor-capacitor) calibration value of a touch chip to be calibrated;
a first determining module 20, configured to determine a preliminary RC calibration value from the base RC calibration values based on a difference between the base test frequency and an ideal frequency;
a second determination module 30 for determining a target calibration value range based on the initially selected RC calibration value;
a third determining module 40, configured to determine, from the range of target calibration values, a candidate RC calibration value with the initially selected test frequency closest to the ideal frequency as a target RC calibration value.
Further, the first determining module comprises:
and the first determining unit is used for calculating the difference value of the basic test frequency of each basic test frequency and the ideal frequency, and determining the basic RC calibration value corresponding to the basic test frequency with the minimum basic test frequency difference value as the initially selected RC calibration value.
Further, the second determining module includes:
and the second determining unit is used for determining the calibration value interval in which the primarily selected RC calibration value is positioned as a target calibration value range.
Further, the second determining module further comprises:
the setting unit is used for sequentially setting the test RC calibration value of the touch chip to be calibrated to a plurality of primarily selected RC calibration values within the target calibration value range;
and the initial selection test frequency recording unit is used for recording the initial selection test frequency corresponding to the initial selection RC calibration values after the frequency test is carried out.
Further, the third determining module comprises:
a first comparison unit, configured to compare the initial selection test frequency of each initial selection RC calibration value within the target calibration value range with the ideal frequency;
and the third determining unit is used for determining the initial RC calibration value corresponding to the initial test frequency with the minimum difference as the target RC calibration value.
Further, the third determining module further comprises:
and the second comparison unit is used for comparing the difference value corresponding to the primary selection test frequency with the minimum difference value with a preset difference value, and if the difference value is greater than the preset difference value, warning information is sent out.
Further, the obtaining and determining module further comprises:
and acquiring the running limited frequency of the touch chip to be calibrated, and carrying out frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
Further, the third determining module further comprises:
and the correcting unit is used for acquiring the operating environment parameters of the touch chip to be calibrated, and taking the multiplication of the target RC calibration value and the environment correction factor as the working RC calibration value of the touch chip to be calibrated.
In addition, the present invention further provides a computer-readable storage medium, where a calibration program of the touch chip is stored on the computer-readable storage medium, and when the calibration program of the touch chip is executed by the processor, the steps of the calibration method of the touch chip are implemented, which are not described herein again.
Compared with the prior art, the invention discloses a calibration method, a device, equipment and a storage medium of a touch chip, wherein the method comprises the steps of obtaining the basic test frequency of each basic RC calibration value of the touch chip to be calibrated; determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency; determining a target calibration value range based on the initially selected RC calibration value; and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value. Therefore, through two rounds of tests, the target RC calibration value can be determined based on the difference value between the test frequency and the ideal frequency, and the rapid and accurate calibration of the touch chip is realized.
The above description is only for the preferred embodiment of the present invention and is not intended to limit the scope of the present invention, and all equivalent structures or flow transformations made by the present specification and drawings, or applied directly or indirectly to other related arts, are included in the scope of the present invention.
Claims (10)
1. A calibration method of a touch chip is applied to calibration equipment of the touch chip, and comprises the following steps:
acquiring the basic test frequency of each basic RC (Resistor-capacitor) calibration value of the touch chip to be calibrated;
determining a preliminary selected RC calibration value from the basic RC calibration values based on a difference between the basic test frequency and an ideal frequency;
determining a target calibration value range based on the initially selected RC calibration value;
and determining the candidate RC calibration value with the initially selected test frequency closest to the ideal frequency from the target calibration value range as a target RC calibration value.
2. The method of claim 1, wherein the step of determining an initially selected RC calibration value from the base RC calibration values based on the difference between the base test frequency and an ideal frequency comprises:
and calculating the difference value of the basic test frequency of each basic test frequency and the ideal frequency, and determining the basic RC calibration value corresponding to the basic test frequency with the minimum difference value of the basic test frequency as the initially selected RC calibration value.
3. The method of claim 1, wherein the step of determining a target calibration value range based on the initially selected RC calibration value comprises:
determining the calibration value interval in which the primarily selected RC calibration value is positioned as a target calibration value range;
the step of determining a target calibration value range based on the initially selected RC calibration value further comprises:
sequentially setting the test RC calibration value of the touch chip to be calibrated to a plurality of primarily selected RC calibration values within the target calibration value range;
and after frequency testing, recording the initial selection testing frequency corresponding to the initial selection RC calibration values.
4. The method of claim 3, wherein the step of determining the candidate RC calibration value having the initially selected test frequency closest to the ideal frequency from the range of target calibration values as the target RC calibration value comprises:
comparing the initial selection test frequency of each initial selection RC calibration value in the target calibration value range with the ideal frequency;
and determining the initial RC calibration value corresponding to the initial test frequency with the minimum difference as the target RC calibration value.
5. The method of claim 1, wherein the step of determining the initially selected RC calibration value corresponding to the initially selected test frequency having the smallest difference as the target RC calibration value further comprises:
and comparing the difference value corresponding to the primary selection test frequency with the minimum difference value with a preset difference value, and if the difference value is greater than the preset difference value, sending out warning information.
6. The method as claimed in claim 1, wherein the step of obtaining the base test frequency of each base RC calibration value of the touch chip to be calibrated further comprises:
and setting the basic RC calibration value of the touch chip to be calibrated, and dividing a plurality of calibration value intervals based on the basic RC calibration value.
7. The method of claim 1, wherein the step of determining the candidate RC calibration value having the initially selected test frequency closest to the ideal frequency from the range of target calibration values as the target RC calibration value further comprises:
and acquiring the running limited frequency of the touch chip to be calibrated, and carrying out frequency test based on the limited frequency to obtain a limited RC calibration value serving as the touch chip to be calibrated.
8. A calibration device for a touch chip is characterized by comprising:
the acquisition module is used for acquiring the basic test frequency of each basic RC (Resistor-capacitor) calibration value of the touch chip to be calibrated;
a first determining module, configured to determine a preliminary RC calibration value from the base RC calibration values based on a difference between the base test frequency and an ideal frequency;
a second determination module for determining a target calibration value range based on the initially selected RC calibration value;
and a third determination module, configured to determine, from the target calibration value range, a candidate RC calibration value with the initially selected test frequency closest to the ideal frequency as a target RC calibration value.
9. Calibration device for a touch chip, comprising a memory, a processor and a calibration program for a touch chip stored on the memory, the calibration program for a touch chip implementing the steps of the method according to any one of claims 1 to 7 when executed by the processor.
10. A computer-readable storage medium, having stored thereon a calibration program for a touch chip, which when executed by a processor implements the steps of the method according to any one of claims 1-7.
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