CN114137004A - Material identification method and device and storage medium - Google Patents

Material identification method and device and storage medium Download PDF

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CN114137004A
CN114137004A CN202111356516.6A CN202111356516A CN114137004A CN 114137004 A CN114137004 A CN 114137004A CN 202111356516 A CN202111356516 A CN 202111356516A CN 114137004 A CN114137004 A CN 114137004A
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高春宇
汤秀章
陈欣南
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China Institute of Atomic of Energy
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China Institute of Atomic of Energy
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

Abstract

The invention discloses a material identification method, a device and a storage medium, wherein the method comprises the following steps: acquiring approximate scattering points and scattering angles corresponding to each of a plurality of radiation particles passing through a detection area where a material to be identified is deployed; dividing the detection area into a plurality of sub-areas, and aiming at each sub-area in the plurality of sub-areas, selecting radiation particles of which corresponding approximate scattering points are located in the sub-area from a plurality of radiation particles, and determining the radiation particles as corresponding radiation particles; determining a corresponding scattering density for each of the plurality of sub-regions based on the scattering angle of the corresponding radiation particle to obtain a plurality of scattering densities corresponding to the plurality of sub-regions one to one; and identifying the material type of the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified. Through the technical scheme, the efficiency of material identification is improved.

Description

Material identification method and device and storage medium
Technical Field
The present disclosure relates to the field of material detection technologies, and in particular, to a method and an apparatus for identifying a material, and a storage medium.
Background
In recent years, problems such as illegal transfer and nuclear diffusion of nuclear materials threaten homeland security, and nuclear material detection technology has attracted attention from countries around the world.
Compared with the traditional detection method of nuclear materials, the muons are used as a natural radiation source, have no irradiation hazard, are sensitive to high-Z substances, have strong penetration capability and have natural advantages in the application of nuclear material detection technology, however, as the flux of the natural muons is limited, in order to improve the image quality of the imaging of the muons, a longer detection time is usually needed, and the timeliness of material identification is poor for the field application scenes requiring timeliness, such as container and cargo nuclear material smuggling detection.
Disclosure of Invention
In order to solve the above technical problems, embodiments of the present invention desirably provide a material identification method, device and storage medium, in which a preset material identification model is directly used, and a scattering density corresponding to a detection region is combined to determine a material type of a material to be identified, so as to improve the efficiency of material identification.
The technical scheme of the invention is realized as follows:
the invention provides a material identification method, which comprises the following steps:
acquiring approximate scattering points and scattering angles corresponding to each of a plurality of radiation particles passing through a detection area where a material to be identified is deployed;
dividing the detection area into a plurality of sub-areas, and selecting radiation particles with corresponding approximate scattering points in the sub-areas from the plurality of radiation particles aiming at each sub-area in the plurality of sub-areas to determine the radiation particles as corresponding radiation particles;
for each sub-region in the plurality of sub-regions, determining a corresponding scattering density based on a scattering angle of the corresponding radiation particle, and obtaining a plurality of scattering densities corresponding to the plurality of sub-regions one to one;
and carrying out material type identification on the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified.
In the above method, the acquiring a plurality of radiation particles passing through a detection region where a material to be identified is deployed, each particle corresponding to an approximate scatter point and a scatter angle, includes:
acquiring an incident track and an emergent track corresponding to each of the plurality of radiation particles;
determining, for each of the plurality of radiation particles, an intersection of an extension of the corresponding incident track and an extension of the exit track as a corresponding approximate scattering point;
for each of the plurality of radiation particles, determining an angle between an extension of the corresponding incident track and an extension of the exit track as a corresponding scattering angle.
In the above method, the determining, for each of the plurality of sub-regions, a corresponding scattering density based on a scattering angle of a corresponding radiation particle to obtain a plurality of scattering densities corresponding to the plurality of sub-regions one to one includes:
calculating the variance of the scattering angle of the corresponding radiation particle aiming at each sub-area in the plurality of sub-areas to obtain the corresponding variance of the scattering angle;
for each sub-region of the plurality of sub-regions, determining a height of the corresponding sub-region as a corresponding particle penetration length;
for each sub-region of the plurality of sub-regions, determining a ratio of a corresponding scatter angle variance and a particle pass length as a corresponding scatter density.
In the above method, the performing, by using a preset material identification model, material type identification on the material to be identified based on the plurality of scattering densities to obtain a material type identification result of the material to be identified includes:
selecting a scattering density characterizing an anomaly from the plurality of scattering densities;
and inputting the selected scattering density into the preset material identification model to obtain the material type identification result.
In the above method, before the performing, by using a preset material identification model, material type identification on the material to be identified based on the plurality of scattering densities to obtain a material type identification result of the material to be identified, the method further includes:
acquiring a scattering density sample, and performing material type recognition on the sample to be recognized based on the scattering density sample by using a material recognition model to be trained to obtain a material type recognition result of the sample to be recognized;
calculating loss information between a material type identification result of the sample to be identified and a target material type identification result preset for the scattering density sample to obtain loss information;
and adjusting model parameters of the material recognition model to be trained based on the loss information to obtain the preset material recognition model.
The present invention provides a material identification device, including:
an acquisition module for acquiring an approximate scatter point and a scatter angle corresponding to each of a plurality of radiation particles passing through a detection region where a material to be identified is deployed;
a selecting module, configured to divide the detection region into a plurality of sub-regions, and select, for each sub-region in the plurality of sub-regions, a radiation particle whose corresponding approximate scattering point is located in the sub-region from the plurality of radiation particles, and determine the radiation particle as a corresponding radiation particle;
a determining module, configured to determine, for each of the multiple sub-regions, a corresponding scattering density based on a scattering angle of the corresponding radiation particle, so as to obtain multiple scattering densities corresponding to the multiple sub-regions one to one;
and the identification module is used for identifying the material type of the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified.
In the above apparatus, the obtaining module is specifically configured to obtain an incident track and an exit track corresponding to each of the plurality of radiation particles; determining, for each of the plurality of radiation particles, an intersection of an extension of the corresponding incident track and an extension of the exit track as a corresponding approximate scattering point; for each of the plurality of radiation particles, determining an angle between an extension of the corresponding incident track and an extension of the exit track as a corresponding scattering angle.
In the above apparatus, the determining module is specifically configured to calculate, for each sub-region of the plurality of sub-regions, a variance of a scattering angle of the corresponding radiation particle, so as to obtain a corresponding scattering angle variance; for each sub-region of the plurality of sub-regions, determining a height of the corresponding sub-region as a corresponding particle penetration length; for each sub-region of the plurality of sub-regions, determining a ratio of a corresponding scatter angle variance and a particle pass length as a corresponding scatter density.
In the above apparatus, the identification module is specifically configured to select a scattering density that is characteristic of an anomaly from the plurality of scattering densities; and inputting the selected scattering density into the preset material identification model to obtain the material type identification result.
The device further comprises a model training module, a model identification module and a data processing module, wherein the model training module is used for acquiring a scattering density sample, and performing material type identification on the sample to be identified based on the scattering density sample by using a material identification model to be trained to obtain a material type identification result of the sample to be identified; calculating loss information between a material type identification result of the sample to be identified and a target material type identification result preset for the scattering density sample to obtain loss information; and adjusting model parameters of the material recognition model to be trained based on the loss information to obtain the preset material recognition model.
The present invention provides a material identification device, including: a processor, a memory, and a communication bus;
the communication bus is used for realizing communication connection between the processor and the memory;
the processor is used for executing the material identification program stored in the memory so as to realize the material identification method.
The present invention provides a computer-readable storage medium storing one or more programs, which are executable by one or more processors to implement the above-described material identification method.
The invention provides a material identification method, a device and a storage medium, wherein the method comprises the following steps: acquiring approximate scattering points and scattering angles corresponding to each of a plurality of radiation particles passing through a detection area where a material to be identified is deployed; dividing the detection area into a plurality of sub-areas, and aiming at each sub-area in the plurality of sub-areas, selecting radiation particles of which corresponding approximate scattering points are located in the sub-area from a plurality of radiation particles, and determining the radiation particles as corresponding radiation particles; determining a corresponding scattering density for each of the plurality of sub-regions based on the scattering angle of the corresponding radiation particle to obtain a plurality of scattering densities corresponding to the plurality of sub-regions one to one; and identifying the material type of the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified. According to the technical scheme provided by the invention, the preset material identification model is directly utilized, and the scattering density corresponding to the detection area is combined to determine the material type of the material to be identified, so that the material identification efficiency is improved.
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Fig. 1 is a schematic flow chart of a material identification method according to an embodiment of the present invention;
FIG. 2 is a schematic flow diagram of an exemplary simulated probing environment provided by an embodiment of the present invention;
FIG. 3 is a schematic diagram of an exemplary determination of approximate scattering points and scattering angles provided by embodiments of the present invention;
FIG. 4 is a schematic diagram of an exemplary default material identification model according to an embodiment of the present invention;
FIG. 5 is a graphical illustration of an exemplary model accuracy as a function of iteration number provided by an embodiment of the present invention;
FIG. 6 is a diagram illustrating an exemplary loss function as a function of iteration number, according to an embodiment of the present invention;
fig. 7 is a first schematic structural diagram of a material identification device according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of a material identification device according to an embodiment of the present invention.
Detailed Description
The technical solution of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant application and are not limiting of the application. It should be noted that, for the convenience of description, only the parts related to the related applications are shown in the drawings.
The invention provides a material identification method, which is applied to a material identification device, and fig. 1 is a flow schematic diagram of the material identification method provided by the embodiment of the invention. As shown in fig. 1, the method mainly comprises the following steps:
s101, acquiring approximate scattering points and scattering angles corresponding to each of a plurality of radiation particles passing through a detection area for deploying the material to be identified.
In an embodiment of the invention, a material identification device may acquire a plurality of radiation particles passing through a detection region where a material to be identified is deployed, each particle corresponding to an approximate scatter point and a scatter angle.
It should be noted that in the embodiment of the present invention, the radiation particle may be a muon, which is a natural radiation source, has no radiation hazard, is sensitive to high-Z substances, has strong penetrating power, and has natural advantages in the application of nuclear detection technology.
Fig. 2 is a schematic flow chart of an exemplary simulated detection environment according to an embodiment of the present invention. As shown in fig. 2, a plurality of radiation particles are first incident into the detection region through the 2-layer detection array, then pass through the detection region, and finally are scattered out through the 2-layer detection array.
Specifically, in an embodiment of the present invention, a material identification apparatus acquiring a plurality of radiation particles passing through a detection region where a material to be identified is deployed, each particle corresponding to an approximate scattering point and a scattering angle, includes: acquiring an incident track and an emergent track corresponding to each of a plurality of radiation particles; determining, for each of the plurality of radiation particles, an intersection of an extension of the corresponding incident track and an extension of the corresponding exit track as a corresponding approximate scattering point; for each of the plurality of radiation particles, determining an angle between an extension of the corresponding incoming track and an extension of the outgoing track as a corresponding scattering angle.
It should be noted that, in the embodiment of the present invention, the material identification apparatus may obtain the incident track and the exit track corresponding to each of the plurality of radiation particles, then extend the incident track and the exit track, determine the intersection point of two straight lines as the approximate scattering point, and determine the included angle between the two straight lines as the scattering angle.
Fig. 3 is a schematic diagram of an exemplary method for determining approximate scattering points and scattering angles according to an embodiment of the present invention. As shown in fig. 3, the two detection arrays located at the upper two levels of the detection area are used to record the incident position information of the radiation particle, the material identification device uses the upper two levels, i.e. 1# and 2#, the two position information of the radiation particle recorded by the detection arrays to fit the incident track, the two detection arrays located at the lower two levels of the detection area are used to record the emergent position information of the radiation particle, the material identification device uses the upper two levels, i.e. 3# and 4#, the two position information of the radiation particle recorded by the detection arrays to fit the emergent track, then, the incident track and the emergent track are extended, the intersection point γ of two straight lines is determined as an approximate scattering point, and the included angle θ of the two straight lines is determined as a scattering angle.
S102, dividing the detection area into a plurality of sub-areas, and aiming at each sub-area in the plurality of sub-areas, selecting the radiation particles with the corresponding approximate scattering points in the sub-area from the plurality of radiation particles, and determining the radiation particles as the corresponding radiation particles.
In an embodiment of the invention, the material identification device divides the detection area into a plurality of sub-areas, and for each of the plurality of sub-areas, selects a radiation particle whose corresponding approximate scattering point is located in the sub-area from the plurality of radiation particles, and determines the radiation particle as the corresponding radiation particle.
It should be noted that, in the embodiment of the present invention, the material identification apparatus divides the detection area into a plurality of sub-areas, a specific division manner is shown in fig. 3, and a specific division size may be set according to actual needs and application scenarios, which is not limited in the present invention.
It should be noted that, in the embodiment of the present invention, after dividing the detection region into a plurality of sub-regions, the material identification apparatus determines the radiation particle corresponding to each of the plurality of sub-regions according to the approximate scattering point corresponding to each of the plurality of radiation particles.
S103, determining corresponding scattering density for each sub-region in the plurality of sub-regions based on the scattering angle of the corresponding radiation particle, and obtaining a plurality of scattering densities corresponding to the plurality of sub-regions one to one.
In an embodiment of the present invention, the material identification apparatus determines, for each of the plurality of sub-regions, a corresponding scattering density based on a scattering angle of the corresponding radiation particle, resulting in a plurality of scattering densities corresponding to the plurality of sub-regions one to one.
It should be noted that, in the embodiment of the present invention, the material identification apparatus determines, for each sub-region in the plurality of sub-regions, a scattering density by using the radiation angles corresponding to all the radiation particles corresponding to the sub-region.
Specifically, in the embodiment of the present invention, the determining, by the material identification device, for each of the plurality of sub-regions, a corresponding scattering density based on a scattering angle of the corresponding radiation particle, and obtaining a plurality of scattering densities corresponding to the plurality of sub-regions one to one includes: calculating the variance of the scattering angle of the corresponding radiation particle aiming at each sub-area in the plurality of sub-areas to obtain the corresponding variance of the scattering angle; for each sub-region of the plurality of sub-regions, determining a height of the corresponding sub-region as a corresponding particle penetration length; for each of the plurality of sub-regions, a ratio of the corresponding scatter angle variance and the particle pass length is determined as a corresponding scatter density.
It should be noted that, in the embodiment of the present invention, the material identification apparatus calculates, for each sub-region in the plurality of sub-regions, a variance of scattering angles corresponding to all radiation particles corresponding to the sub-region in a specific calculation manner shown in formula (1):
Figure BDA0003357370290000071
wherein the content of the first and second substances,
Figure BDA0003357370290000081
variance of scattering angle, σ, of M radiation particles corresponding to ith sub-regionθ1θ2,…,σθNScattering angle, σ, of M radiation particles corresponding to the ith sub-regionaThe mean value of the scattering angles of the M radiation particles corresponding to the ith sub-region.
It should be noted that, in the embodiment of the present invention, for each sub-region in the plurality of sub-regions, the material identification apparatus determines the height of the corresponding sub-region as the particle passing length, and the specific particle passing length is the distance between two parallel planes through which the radiation particle passes, that is, the height of the sub-region.
It should be noted that, in the embodiment of the present invention, after obtaining the particle penetration length and the scattering angle variance corresponding to each sub-region in the plurality of sub-regions, the material identification apparatus determines the ratio of the scattering angle variance corresponding to a certain sub-region to the particle penetration length as the scattering angle density of the corresponding sub-region, and the specific calculation formula is shown in formula (2):
Figure BDA0003357370290000082
wherein λ isiScattering density, L, corresponding to the ith sub-regioniIs the height corresponding to the ith sub-region,
Figure BDA0003357370290000083
the scattering angle variance corresponding to the ith sub-region.
And S104, carrying out material type identification on the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified.
In the embodiment of the invention, the material identification device identifies the material type of the material to be identified by utilizing the preset material identification model based on a plurality of scattering densities to obtain the material type identification result of the material to be identified.
It should be noted that, in the embodiment of the present invention, the material type identification result may include the material type of the material to be identified, and the accuracy, the false alarm rate, or the overall accuracy of identifying the material type, and the specific material type identification result may be set according to the actual requirement and the application scenario, which is not limited in the present invention.
The calculation method of the recognition accuracy of the specific preset material recognition model for a certain material type may be:
Figure BDA0003357370290000084
wherein, taccuracy(xi) Is a material xiThe accuracy of the correct recognition is such that,
Figure BDA0003357370290000091
is a material xiThe number of correctly identified samples is such that,
Figure BDA0003357370290000092
is a material xiTotal number of samples.
The calculation method of the false recognition rate of the specific preset material recognition model for recognizing a certain material type as other materials by mistake may be as follows:
Figure BDA0003357370290000093
wherein, t (x)i,xj) Is a material xiIs identified as xjThe false recognition rate of (1).
The specific calculation formula of the overall accuracy of the preset material identification model may be:
Figure BDA0003357370290000094
wherein, ttotalTo predetermine the overall accuracy of the material identification model, NTotal number of samplesIs the total number of samples of the Q materials,
Figure BDA0003357370290000095
the number of correctly identified samples for Q materials. Specifically, in the embodiment of the present invention, the material identification device performs material type identification on the material to be identified based on a plurality of scattering densities by using a preset material identification model, and obtains a material type identification result of the material to be identified, including: selecting a scattering density representing an anomaly from the plurality of scattering densities; and inputting the selected scattering density into a preset material identification model to obtain a material type identification result.
It should be noted that, in the embodiment of the present invention, after the material identification device obtains the plurality of scattering densities, the material identification device may first screen the plurality of scattering densities, select the scattering density corresponding to the sub-region affected by the material to be identified, and then determine the material type identification result of the material to be identified by using the selected scattering density.
Specifically, in the embodiment of the present invention, before the material identification device identifies the material type of the material to be identified based on a plurality of scattering densities by using the preset material identification model, and obtains the material type identification result of the material to be identified, the following steps may be further performed: acquiring a scattering density sample, and performing material type recognition on the sample to be recognized based on the scattering density sample by using a material recognition model to be trained to obtain a material type recognition result of the sample to be recognized; calculating loss information between a material type identification result of the sample to be identified and a target material type identification result preset for the scattering density sample to obtain loss information; and based on the loss information, carrying out model parameter adjustment on the material identification model to be trained to obtain a preset material identification model.
It should be noted that, in the embodiment of the present invention, the to-be-trained material identification model may be a convolutional neural network model, and the material identification model may input the scattering density sample into the to-be-trained material identification model, and perform feature extraction on the scattering density sample to obtain the material type identification result of the to-be-identified sample.
Fig. 4 is a schematic structural diagram of an exemplary identification model of a material to be identified according to an embodiment of the present invention. As shown in fig. 4, the material recognition model inputs the scattering density sample into a preset material recognition model, the feature map output by the convolutional layer is transmitted to the pooling layer for feature selection and information filtering, so as to further reduce data dimension and accelerate the model training speed, after the processing of the multi-turn convolutional layer and the pooling layer, the input scattering density is abstracted into high-order features, and the extracted features are nonlinearly combined by the full-connection layer to obtain the material type recognition result of the sample to be recognized corresponding to the scattering density sample.
It should be noted that, in the embodiment of the present invention, after obtaining the material type recognition result of the sample to be recognized, the material recognition apparatus calculates loss information between the material type recognition result of the sample to be recognized and the target material type recognition result preset for the scattering density sample, to obtain loss information, that is, determines the weight with the largest loss contribution, and then performs model parameter adjustment on the material recognition model to be trained based on the loss information to obtain a preset material recognition model, where a specific parameter adjustment process is to first adjust the optimization weight using a cross entropy loss function to reduce the loss, and an expression is shown in formula (6):
Figure BDA0003357370290000101
wherein C is a cross loss function, N is the number of samples, y represents a target material type identification result preset for the scattering density sample, x represents a material type identification result of a previous layer of sample to be identified, a represents a material type identification result of the sample to be identified, and a specific expression of a is shown in formula (7):
a=σ(z)(z=wx+b) (7)
wherein w is the link weight, b is a parameter, and the cross entropy loss function is derived as follows:
Figure BDA0003357370290000102
Figure BDA0003357370290000103
the corresponding parameter updating formula is as follows:
Figure BDA0003357370290000111
Figure BDA0003357370290000112
wherein η is the learning rate. As can be seen from equation (10), the update speed of the weight and the loss information (a-y) are linearly related, and when the loss information is large, the weight update is fast, and when the loss information is small, the weight update is slow. And inputting a plurality of scattering density samples into the identification model of the material to be trained, and performing iterative training.
FIG. 5 is a diagram illustrating exemplary model accuracy as a function of iteration number, according to an embodiment of the present invention. As shown in fig. 5, the accuracy gradually converges as the number of iterations increases. Fig. 6 is a schematic diagram of an exemplary loss function varying with the number of iterations according to an embodiment of the present invention, and as shown in fig. 6, the loss function gradually converges as the number of iterations increases. And finally, obtaining an optimal weight set to obtain a trained preset material recognition model.
It should be noted that, in the embodiment of the present invention, the scattering density sample obtained by the material recognition device may be simulated data or actually measured data, and accordingly, the trained model is only applicable to a corresponding environment, for example, the preset material recognition model trained by the material recognition device using the simulated data may be applied to material recognition in the simulated environment, and the preset material recognition model trained by the material recognition device using the actual data may be applied to material recognition in an actual situation, and of course, the models corresponding to the length of the detection time may be different or the same, which is not limited in this respect.
The invention provides a material identification method, which comprises the following steps: acquiring approximate scattering points and scattering angles corresponding to each of a plurality of radiation particles passing through a detection area where a material to be identified is deployed; dividing the detection area into a plurality of sub-areas, and aiming at each sub-area in the plurality of sub-areas, selecting radiation particles of which corresponding approximate scattering points are located in the sub-area from a plurality of radiation particles, and determining the radiation particles as corresponding radiation particles; determining a corresponding scattering density for each of the plurality of sub-regions based on the scattering angle of the corresponding radiation particle to obtain a plurality of scattering densities corresponding to the plurality of sub-regions one to one; and identifying the material type of the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified. According to the material identification method provided by the invention, the preset material identification model is directly utilized, and the material type of the material to be identified is determined by combining the scattering density corresponding to the detection area, so that the material identification efficiency is improved.
The invention provides a material identification device, and fig. 7 is a schematic structural diagram of the material identification device provided in the embodiment of the invention. As shown in fig. 7, includes:
an obtaining module 701, configured to obtain an approximate scattering point and a scattering angle corresponding to each of a plurality of radiation particles passing through a detection region where a material to be identified is deployed;
a selecting module 702, configured to divide the detection region into a plurality of sub-regions, and select, for each sub-region in the plurality of sub-regions, a radiation particle whose corresponding approximate scattering point is located in the sub-region from the plurality of radiation particles, and determine the radiation particle as a corresponding radiation particle;
a determining module 703, configured to determine, for each of the multiple sub-regions, a corresponding scattering density based on a scattering angle of the corresponding radiation particle, so as to obtain multiple scattering densities corresponding to the multiple sub-regions one to one;
and the identifying module 704 is configured to perform material type identification on the material to be identified based on the plurality of scattering densities by using a preset material identification model, so as to obtain a material type identification result of the material to be identified.
Optionally, the obtaining module 701 is specifically configured to obtain an incident track and an exit track corresponding to each of the plurality of radiation particles; determining, for each of the plurality of radiation particles, an intersection of an extension of the corresponding incident track and an extension of the exit track as a corresponding approximate scattering point; for each of the plurality of radiation particles, determining an angle between an extension of the corresponding incident track and an extension of the exit track as a corresponding scattering angle.
Optionally, the determining module 703 is specifically configured to calculate, for each sub-region in the plurality of sub-regions, a variance of a scattering angle of a corresponding radiation particle, so as to obtain a corresponding scattering angle variance; for each sub-region of the plurality of sub-regions, determining a height of the corresponding sub-region as a corresponding particle penetration length; for each sub-region of the plurality of sub-regions, determining a ratio of a corresponding scatter angle variance and a particle pass length as a corresponding scatter density.
Optionally, the identifying module 704 is specifically configured to select a scattering density that is characteristic of an anomaly from the plurality of scattering densities; and inputting the selected scattering density into the preset material identification model to obtain the material type identification result.
Optionally, the material identification device further includes a model training module (not shown in the figure) configured to obtain a scattering density sample, and perform material type identification on the sample to be identified based on the scattering density sample by using a material identification model to be trained, so as to obtain a material type identification result of the sample to be identified; calculating loss information between a material type identification result of the sample to be identified and a target material type identification result preset for the scattering density sample to obtain loss information; and adjusting model parameters of the material recognition model to be trained based on the loss information to obtain the preset material recognition model.
The invention provides a material identification device, and fig. 8 is a schematic structural diagram of a material identification device provided in an embodiment of the invention. As shown in fig. 8, the material recognition apparatus includes: a processor 801, a memory 802, and a communication bus 803;
the communication bus 803 is used for realizing communication connection between the processor 801 and the memory 802;
the processor 801 is configured to execute the material identification program stored in the memory 802 to implement the material identification method.
The invention provides a material identification device, which is used for acquiring approximate scattering points and scattering angles corresponding to each particle in a plurality of radiation particles passing through a detection area for deploying a material to be identified; dividing the detection area into a plurality of sub-areas, and aiming at each sub-area in the plurality of sub-areas, selecting radiation particles of which corresponding approximate scattering points are located in the sub-area from a plurality of radiation particles, and determining the radiation particles as corresponding radiation particles; determining a corresponding scattering density for each of the plurality of sub-regions based on the scattering angle of the corresponding radiation particle to obtain a plurality of scattering densities corresponding to the plurality of sub-regions one to one; and identifying the material type of the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified. According to the material identification device provided by the invention, the preset material identification model is directly utilized, and the material type of the material to be identified is determined by combining the scattering density corresponding to the detection area, so that the material identification efficiency is improved.
The present invention provides a computer-readable storage medium storing one or more programs, which are executable by one or more processors to implement the above-described material identification method. The computer-readable storage medium may be a volatile Memory (volatile Memory), such as a Random-Access Memory (RAM); or a non-volatile Memory (non-volatile Memory), such as a Read-Only Memory (ROM), a flash Memory (flash Memory), a Hard Disk (Hard Disk Drive, HDD) or a Solid-State Drive (SSD); or may be a respective device, such as a mobile phone, computer, tablet device, personal digital assistant, etc., that includes one or any combination of the above-mentioned memories.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of a hardware embodiment, a software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
The above description is only an embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention disclosed in the present application should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.

Claims (10)

1. A material identification method, characterized in that the method comprises:
acquiring approximate scattering points and scattering angles corresponding to each of a plurality of radiation particles passing through a detection area where a material to be identified is deployed;
dividing the detection area into a plurality of sub-areas, and selecting radiation particles with corresponding approximate scattering points in the sub-areas from the plurality of radiation particles aiming at each sub-area in the plurality of sub-areas to determine the radiation particles as corresponding radiation particles;
for each sub-region in the plurality of sub-regions, determining a corresponding scattering density based on a scattering angle of the corresponding radiation particle, and obtaining a plurality of scattering densities corresponding to the plurality of sub-regions one to one;
and carrying out material type identification on the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified.
2. The method of claim 1, wherein acquiring a plurality of radiation particles traversing a detection region in which a material to be identified is deployed, each particle corresponding to an approximate scatter point and scatter angle, comprises:
acquiring an incident track and an emergent track corresponding to each of the plurality of radiation particles;
determining, for each of the plurality of radiation particles, an intersection of an extension of the corresponding incident track and an extension of the exit track as a corresponding approximate scattering point;
for each of the plurality of radiation particles, determining an angle between an extension of the corresponding incident track and an extension of the exit track as a corresponding scattering angle.
3. The method of claim 1, wherein determining, for each of the plurality of sub-regions, a corresponding scattering density based on a scattering angle of a corresponding radiation particle, resulting in a plurality of scattering densities in one-to-one correspondence with the plurality of sub-regions comprises:
calculating the variance of the scattering angle of the corresponding radiation particle aiming at each sub-area in the plurality of sub-areas to obtain the corresponding variance of the scattering angle;
for each sub-region of the plurality of sub-regions, determining a height of the corresponding sub-region as a corresponding particle penetration length;
for each sub-region of the plurality of sub-regions, determining a ratio of a corresponding scatter angle variance and a particle pass length as a corresponding scatter density.
4. The method according to claim 1, wherein the performing material type recognition on the material to be recognized based on the plurality of scattering densities by using a preset material recognition model to obtain a material type recognition result of the material to be recognized comprises:
selecting a scattering density characterizing an anomaly from the plurality of scattering densities;
and inputting the selected scattering density into the preset material identification model to obtain the material type identification result.
5. The method according to claim 1, wherein before performing material type recognition on the material to be recognized based on the plurality of scattering densities by using a preset material recognition model to obtain a material type recognition result of the material to be recognized, the method further comprises:
acquiring a scattering density sample, and performing material type recognition on the sample to be recognized based on the scattering density sample by using a material recognition model to be trained to obtain a material type recognition result of the sample to be recognized;
calculating loss information between a material type identification result of the sample to be identified and a target material type identification result preset for the scattering density sample to obtain loss information;
and adjusting model parameters of the material recognition model to be trained based on the loss information to obtain the preset material recognition model.
6. A material identification device, comprising:
an acquisition module for acquiring an approximate scatter point and a scatter angle corresponding to each of a plurality of radiation particles passing through a detection region where a material to be identified is deployed;
a selecting module, configured to divide the detection region into a plurality of sub-regions, and select, for each sub-region in the plurality of sub-regions, a radiation particle whose corresponding approximate scattering point is located in the sub-region from the plurality of radiation particles, and determine the radiation particle as a corresponding radiation particle;
a determining module, configured to determine, for each of the multiple sub-regions, a corresponding scattering density based on a scattering angle of the corresponding radiation particle, so as to obtain multiple scattering densities corresponding to the multiple sub-regions one to one;
and the identification module is used for identifying the material type of the material to be identified based on the plurality of scattering densities by using a preset material identification model to obtain a material type identification result of the material to be identified.
7. The apparatus of claim 6,
the acquiring module is specifically configured to acquire an incident track and an exit track corresponding to each of the plurality of radiation particles; determining, for each of the plurality of radiation particles, an intersection of an extension of the corresponding incident track and an extension of the exit track as a corresponding approximate scattering point; for each of the plurality of radiation particles, determining an angle between an extension of the corresponding incident track and an extension of the exit track as a corresponding scattering angle.
8. The apparatus of claim 6,
the determining module is specifically configured to calculate, for each sub-region of the plurality of sub-regions, a variance of a scattering angle of the corresponding radiation particle, so as to obtain a corresponding scattering angle variance; for each sub-region of the plurality of sub-regions, determining a height of the corresponding sub-region as a corresponding particle penetration length; for each sub-region of the plurality of sub-regions, determining a ratio of a corresponding scatter angle variance and a particle pass length as a corresponding scatter density.
9. A material identification device, comprising: a processor, a memory, and a communication bus;
the communication bus is used for realizing communication connection between the processor and the memory;
the processor is configured to execute the material identification program stored in the memory to implement the material identification method according to any one of claims 1 to 5.
10. A computer-readable storage medium storing one or more programs, the one or more programs being executable by one or more processors to implement the material identification method of any one of claims 1-5.
CN202111356516.6A 2021-11-16 2021-11-16 Material identification method and device and storage medium Pending CN114137004A (en)

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