CN114136297A - Datum point alignment space measuring instrument - Google Patents

Datum point alignment space measuring instrument Download PDF

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Publication number
CN114136297A
CN114136297A CN202111300794.XA CN202111300794A CN114136297A CN 114136297 A CN114136297 A CN 114136297A CN 202111300794 A CN202111300794 A CN 202111300794A CN 114136297 A CN114136297 A CN 114136297A
Authority
CN
China
Prior art keywords
substrate
adjusting
datum
nut
measuring instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202111300794.XA
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Chinese (zh)
Inventor
高远
董建
刘平
薛金成
张金林
陈建华
胡荣
黄怀富
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Shougang Co Ltd
Original Assignee
Beijing Shougang Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing Shougang Co Ltd filed Critical Beijing Shougang Co Ltd
Priority to CN202111300794.XA priority Critical patent/CN114136297A/en
Publication of CN114136297A publication Critical patent/CN114136297A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01CMEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/02Means for marking measuring points

Abstract

The application discloses datum mark alignment space measuring apparatu, through set up the ware of making level on the base plate, benchmark locating component and a plurality of adjusting part, during the use, place the measuring apparatu in the top of datum mark, and make the preliminary datum mark of aiming at of benchmark locating component, then through adjusting each adjusting part, adjust with the horizontality to the base plate, and observe the horizontality of base plate through the spirit level, until the base plate level, aim at the center of datum mark with the benchmark locating component again, again carry out the accurate adjustment to each adjusting part, after the base plate is in the horizontality, because the center of datum mark is aimed at to the benchmark locating component, consequently the position of final accessible determination benchmark component is measured the position of datum mark. Therefore, through the arrangement of the reference point alignment space measuring instrument, the accurate measurement of the position of the reference point can be realized no matter whether the reference point is on a flat surface, and convenience is provided for the installation and the position adjustment of equipment.

Description

Datum point alignment space measuring instrument
Technical Field
The application belongs to the technical field of measuring instruments, especially, relate to a datum point alignment space measuring apparatu.
Background
At present, high-end product structures of various steel plants are mainly plates, the precision requirement of production equipment of plate products is high, the position precision of the equipment structures is ensured in the process of adjusting and replacing the equipment, the alignment of datum points is particularly important in the process of measuring the equipment, but the datum points often exist in inconvenient measuring positions such as pits and bulges, direct acquisition cannot be carried out through a measuring instrument, and the measuring precision cannot be ensured even if people participate in the alignment.
Therefore, there is a need for an instrument capable of accurately measuring the position of a datum point on an uneven surface, so as to solve the problem of inconvenient installation and adjustment of production equipment.
Disclosure of Invention
This application aims at solving current measuring apparatu to a certain extent at least and is difficult to measure the benchmark position on uneven surface, causes inconvenient technical problem to the installation and the position adjustment of equipment. Therefore, the application provides a datum point alignment space measuring instrument.
The utility model provides a datum point alignment space measuring apparatu, includes:
a substrate;
the leveling device is fixed on the substrate and used for judging whether the substrate is horizontal or not;
the adjusting components are fixed on the substrate and used for adjusting the horizontal state of the substrate and stabilizing the substrate during measurement;
and the datum positioning assembly is fixed on the substrate and is used for aligning a datum point during measurement.
In some embodiments, the fiducial positioning assembly comprises:
the base plate is provided with a first mounting hole, and the first threaded fixing piece is fixed on the first mounting hole;
the positioning screw penetrates through the first thread fixing piece and is in threaded connection or sliding connection with the first thread fixing piece, and a conical positioning head is arranged at the lower end of the positioning screw.
In some embodiments, the upper end of the positioning screw is provided with a measuring base for placing a measuring tool.
In some embodiments, the first threaded fastener comprises:
the first upper spare nut is inserted into the first mounting hole and abuts against the upper surface of the substrate, and the positioning screw penetrates through the first upper spare nut and is in threaded connection with the first upper spare nut;
the first lower spare nut is in threaded connection with the surface of the first upper spare nut and abuts against the lower surface of the substrate.
In some embodiments, the second threaded fastener comprises:
the first upper spare bus is inserted into the first mounting hole and abuts against the upper surface of the substrate, and the adjusting screw penetrates through the first upper spare bus and is in sliding connection with the first upper spare bus;
the first lower spare nut is in threaded connection with the surface of the first upper spare nut and abuts against the lower surface of the substrate.
In some embodiments, the first mounting hole is located at an edge of the substrate.
In some embodiments, each of the adjustment assemblies comprises:
the base plate is provided with a first mounting hole, and the first threaded fixing piece is fixed on the first mounting hole;
and the adjusting screw rod penetrates through the second thread fixing piece and is in threaded connection with the first thread fixing piece, and an adjusting handle is fixed at the upper end of the adjusting screw rod.
In some embodiments, the adjustment assembly further comprises:
the conical adjusting head is sleeved at the lower end of the adjusting screw rod and is in threaded connection with the adjusting screw rod.
In some embodiments, the second threaded fastener comprises:
the second upper spare nut is inserted into the second mounting hole and abuts against the upper surface of the substrate, and the adjusting screw penetrates through the second upper spare nut and is in threaded connection with the second upper spare nut;
and the second lower spare nut is in threaded connection with the surface of the first upper spare nut and is abutted against the lower surface of the substrate.
In some embodiments, the screed comprises a leveling bubble comprising:
the surface of the substrate is provided with a mounting groove, the shell is fixed in the mounting groove, and the surface of the shell is marked with leveling scales;
the leveling liquid, the leveling liquid set up in the inside of casing.
The embodiment of the application has at least the following beneficial effects: the datum point alignment space measuring instrument is provided with the leveling device, the datum positioning component and the plurality of adjusting components on the base plate, when in use, the measuring instrument is placed above the datum point, the base plate is supported by a plurality of adjusting components, then adjusting the horizontal state of the substrate by adjusting each adjusting assembly, observing the horizontal state of the substrate by a level device until the substrate is horizontal, aligning the reference positioning assembly to the center of the reference point, finely adjusting each adjusting assembly to ensure that the reference positioning assembly is aligned to the center of the reference point, simultaneously controlling the substrate to be horizontal by the observing level device, when the substrate is in the horizontal state, since the datum locator assembly is aligned with the centre of the datum point, the position of the datum point can ultimately be measured by determining the position of the datum assembly. Therefore, through the arrangement of the reference point alignment space measuring instrument, the accurate measurement of the position of the reference point can be realized no matter whether the reference point is on a flat surface, and convenience is provided for the installation and the position adjustment of equipment.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a datum alignment space measuring instrument according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of a datum locator assembly of the datum alignment dimensional measuring instrument of the present embodiment;
FIG. 3 is a schematic diagram of an adjustment assembly of the datum alignment space measuring instrument according to an embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a substrate of a datum point alignment space measuring instrument in an embodiment of the present application.
Reference numerals:
10-substrate 11-first mounting hole 12-second mounting hole
13-mounting groove 20-leveling device 21-leveling bubble
30-adjusting assembly 31-second threaded fixing part 32-adjusting screw
40-datum positioning component 41-first thread fixing part 42-positioning screw rod
211-shell 311-second upper spare mother 312-second lower spare mother
321-adjusting handle 322-conical adjusting head 411-first upper spare nut
412-first bottom mother 421-conical positioning head 422-measuring base.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Moreover, the present application may repeat reference numerals and/or letters in the various examples, such repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. In addition, examples of various specific processes and materials are provided herein, but one of ordinary skill in the art may recognize applications of other processes and/or use of other materials.
The application is described below with reference to specific embodiments in conjunction with the following drawings:
in one embodiment of the present application, as shown in fig. 1, there is provided a reference point alignment space measuring instrument, including:
a substrate 10;
the leveler 20 is fixed on the substrate 10 and used for judging whether the substrate 10 is horizontal or not;
the plurality of adjusting assemblies 30 are all fixed on the substrate 10, and the adjusting assemblies 30 are used for adjusting the horizontal state of the substrate 10 and stabilizing the substrate 10 during measurement;
and a reference positioning assembly 40, wherein the reference positioning assembly 40 is fixed on the substrate 10 and is used for aligning a reference point during measurement.
Specifically, the datum alignment space measuring instrument is provided with a leveling device 20, a datum positioning assembly 40 and a plurality of adjusting assemblies 30 on a base plate 10, when in use, the measuring instrument is placed above a datum, and the reference positioning assembly 40 is preliminarily aligned with the reference point, the substrate 10 is supported by the plurality of adjustment assemblies 30, then, the horizontal state of the substrate 10 is adjusted by adjusting each adjusting assembly 30, the horizontal state of the substrate 10 is observed by a level until the substrate 10 is horizontal, the reference positioning assembly 40 is aligned with the center of the reference point, each adjusting assembly 30 is finely adjusted, the reference positioning assembly 40 is aligned with the center of the reference point, the substrate 10 is controlled to be level by observing the level controller, and after the substrate 10 is in a level state, since datum locator assembly 40 is aligned with the center of the datum, the position of the datum can ultimately be measured by determining the position of datum locator assembly 40. Therefore, through the arrangement of the reference point alignment space measuring instrument, the accurate measurement of the position of the reference point can be realized no matter whether the reference point is on a flat surface, and convenience is provided for the installation and the position adjustment of equipment.
In another embodiment of the present application, as shown in FIGS. 1-2 and 4, datum positioning assembly 40 includes:
a first threaded fastener 41, wherein the substrate 10 is provided with a first mounting hole 11, and the first threaded fastener 41 is fixed on the first mounting hole 11;
and the positioning screw rod 42 penetrates through the first thread fixing part 41 and is in threaded connection with the first thread fixing part 41, and the lower end of the positioning screw rod 42 is provided with a conical positioning head 421.
Specifically, the first threaded fastener 41 can facilitate the fixing of the reference positioning assembly 40 on the first mounting hole 11 of the substrate 10, the reference positioning assembly 40 can be aligned by the conical positioning head 421 at the lower end of the positioning screw 42, and when the positioning screw 42 is in threaded connection with the first threaded fastener 41, the positioning screw 42 can be lifted and lowered by rotating the positioning screw 42, so that the positioning screw 42 can be rotated with respect to reference points of different heights; when the positioning screw rod 42 is slidably connected with the first thread fixing piece 41, the positioning screw rod 42 is aligned with the reference hole through the self gravity; can adapt to the alignment of positioning screw 42 to the datum point of co-altitude not, make space measurement appearance's measuring range wider, in addition, through the setting of first thread fixing piece 41, can effectively avoid positioning screw 42 and base plate 10 direct contact, cause wearing and tearing to base plate 10, even first thread fixing piece 41 produces wearing and tearing, also only need to change first thread fixing piece 41 can to promote space measurement appearance's measurement accuracy.
In another embodiment of the present application, as shown in fig. 1-2, the upper end of the positioning screw 42 is provided with a measuring base 422 for placing a measuring tool.
Specifically, after the datum point is aligned, the position of the positioning screw 42 can be measured by mounting a prism or a patch on the measuring base 422, and thus the position of the datum point can be accurately measured.
In another embodiment of the present application, as shown in fig. 1-2, the first threaded fastener 41 comprises:
the first upper spare nut 411 is inserted into the first mounting hole 11 and abuts against the upper surface of the substrate 10, and the positioning screw 42 passes through the first upper spare nut 411 and is in threaded connection or sliding connection with the first upper spare nut 411;
a first lower spare nut 412, wherein the first lower spare nut 412 is screwed to the surface of the first upper spare nut 411 and abuts against the lower surface of the substrate 10.
Specifically, since the first upper spare nut 411 abuts against the upper surface of the substrate 10, and the first lower spare nut 412 is screwed on the surface of the first upper spare nut 411 and abuts against the lower surface of the substrate 10, the substrate 10 can be clamped between the second upper spare nut 411 and the second lower spare nut 412, and the first upper spare nut 411 and the first lower spare nut 412 are fixed on the substrate 10; the positioning screw rod 42 is in threaded connection with the first upper spare nut 411, and the positioning screw rod 42 can be adjusted in height to be aligned with the datum hole through rotation; after the reference point is precisely found, since the second upper spare mother 411 and the second lower spare mother 412 may be in an untightened state, the first upper spare mother 411 and the first lower spare mother 412 need to be confirmed and tightened after the accurate position of the reference point is found again.
In another embodiment of the present application, the first threaded fastener 41 includes:
the first upper spare nut 411 is inserted into the first mounting hole 11 and abuts against the upper surface of the substrate 10, and the positioning screw 42 penetrates through the first upper spare nut 411 and is in threaded connection with the first upper spare nut 411;
a first lower spare nut 412, wherein the first lower spare nut 412 is screwed to the surface of the first upper spare nut 411 and abuts against the lower surface of the substrate 10.
Specifically, the substrate 10 is clamped between the first upper spare nut 411 and the first lower spare nut 412, so that the first upper spare nut 411 and the first lower spare nut 412 are fixed on the substrate 10, and when the positioning screw 42 is slidably connected with the first threaded fixing member 41, the positioning screw 42 aligns with the reference hole by its own gravity.
In another embodiment of the present application, as shown in fig. 4, the first mounting hole 11 is located at an edge of the substrate 10.
Particularly, by the arrangement, the positioning screw 42 can be positioned at the edge of the substrate 10, the view of the substrate 10 in the middle of the positioning screw 42 can be effectively prevented during measurement, and convenience is provided for adjustment of the positioning screw 42.
In another embodiment of the present application, as shown in fig. 1 and 3-4, each adjustment assembly 30 includes:
a second threaded fastener 31, wherein the substrate 10 is provided with a second mounting hole 12, and the second threaded fastener 31 is fixed on the second mounting hole 12;
and the adjusting screw rod 32 penetrates through the second threaded fixing part 31 and is in threaded connection with the first threaded fixing part 41, and an adjusting handle 321 is fixed at the upper end of the adjusting screw rod 32.
Specifically, second threaded fixing part 31 can be convenient for adjusting part 30 fixed on second mounting hole 12 of base plate 10, base plate 10 is supported by adjusting screw 32, and adjusting screw 32 in 41 threaded connection of first threaded fixing part, can realize adjusting screw 32's lift through rotating adjustment handle 321, benchmark locating component 40 is preliminary after aiming at the benchmark again, can adjust base plate 10 to the level through rotating adjusting screw 32 on each adjusting part 30, realize the alignment of benchmark. In addition, through the setting of second thread fixing piece 31, can effectively avoid adjusting screw 32 and base plate 10 direct contact, cause wearing and tearing to base plate 10, and if first thread fixing piece 41 produces wearing and tearing, only need to change first thread fixing piece 41 can to promote space measurement appearance's measurement accuracy.
In another embodiment of the present application, as shown in fig. 1 and 3, the adjustment assembly 30 further comprises:
a conical adjusting head 322, the conical adjusting head 322 is sleeved on the lower end of the adjusting screw rod 32 and is in threaded connection with the adjusting screw rod 32.
Specifically, the reference surface can be firmly grasped to the head 322 is adjusted to the toper, realizes the stability of space measuring apparatu when measuring, and the toper is adjusted head 322 and adjusting screw 32 threaded connection, through this setting, the department is outside through rotating adjustment handle 321, still can realize the regulation to adjusting screw 32 height through rotating toper adjusting head 322, and conveniently takes out when dismantling, toper adjusting head 322 supports on base plate 10 when preventing to dismantle adjusting screw 32, causes the puzzlement to the dismantlement of adjusting part 30.
In another embodiment of the present application, as shown in fig. 1 and 3, the second threaded fastener 31 includes:
the second upper spare nut 311 is inserted into the second mounting hole 12 and abuts against the upper surface of the substrate 10, and the adjusting screw 32 penetrates through the second upper spare nut 311 and is in threaded connection with the second upper spare nut 311;
and a second lower spare nut 312, wherein the second lower spare nut 312 is screwed on the surface of the first upper spare nut 411 and abuts against the lower surface of the substrate 10.
Specifically, since second upper spare nut 311 abuts against the upper surface of substrate 10, and second lower spare nut 312 is screwed onto the surface of second upper spare nut 311 and abuts against the lower surface of substrate 10, substrate 10 can be clamped between second upper spare nut 311 and second lower spare nut 312, so that second upper spare nut 311 and second lower spare nut 312 are fixed on substrate 10, and adjusting screw 32 is screwed onto second upper spare nut 311 to adjust positioning screw 42 in height. After the reference point is precisely found, since the second upper spare nut 311 and the second lower spare nut 312 may be in an untightened state, after the accurate position of the reference point is found, the second upper spare nut 311 and the second lower spare nut 312 need to be confirmed and tightened.
In another embodiment of the present application, the number of the adjustment assemblies 30 is at least three, and all of the adjustment assemblies 30 are respectively disposed on the periphery side of the datum positioning assembly 40.
Specifically, the adjusting assembly 30 is disposed on the periphery of the reference positioning assembly 40, so that the reference positioning assembly 40 can be stabilized, and the stability of the space measuring instrument during measurement can be improved.
In the present embodiment, further, as shown in fig. 1 and 3, the number of the adjusting assemblies 30 is three, and the base plate 10 is leveled and stabilized by the cooperation of the three adjusting assemblies 30.
In another embodiment of the present application, as shown in fig. 1 and 4, the screed 20 includes a leveling bubble 21, the leveling bubble 21 including:
the surface of the substrate 10 is provided with a mounting groove 13, the housing 211 is fixed in the mounting groove 13, and the surface of the housing 211 is marked with a leveling scale (not marked in the figure);
leveling liquid (not shown); the leveling liquid is disposed inside the housing 211.
Specifically, through the setting of the leveling bubble 21, whether the leveling liquid is in the level can be observed through the leveling scale to judge the level state of the substrate 10, so that the accurate alignment of the reference point is realized.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact of the first and second features, or may comprise contact of the first and second features not directly but through another feature in between. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present application, it is to be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise" indicate orientations or positional relationships based on the orientation or positional relationships illustrated in the drawings, and are used merely for convenience in describing the present application and for simplicity in description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed in a particular orientation, and be operated, and therefore should not be considered as limiting the present application.
It should be noted that all the directional indications in the embodiments of the present application are only used to explain the relative position relationship, the motion situation, and the like between the components in a certain posture, and if the certain posture is changed, the directional indication is changed accordingly.
In this application, unless expressly stated or limited otherwise, the terms "connected," "secured," and the like are to be construed broadly, and for example, "secured" may be a fixed connection, a removable connection, or an integral part; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.
In addition, descriptions in this application as to "first", "second", etc. are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, features defined as "first", "second", may explicitly or implicitly include one or more of the described features. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples described in this specification can be combined and combined by those skilled in the art.
In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present application.
While embodiments of the present application have been shown and described, it will be understood by those of ordinary skill in the art that: numerous changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the application, the scope of which is defined by the claims and their equivalents.

Claims (10)

1. A reference point alignment space measuring instrument, comprising:
a substrate;
the leveling device is fixed on the substrate and used for judging whether the substrate is horizontal or not;
the adjusting components are fixed on the substrate and used for adjusting the horizontal state of the substrate and stabilizing the substrate during measurement;
and the datum positioning assembly is fixed on the substrate and is used for aligning a datum point during measurement.
2. The fiducial alignment space gauge of claim 1, wherein the fiducial positioning assembly comprises:
the base plate is provided with a first mounting hole, and the first threaded fixing piece is fixed on the first mounting hole;
the positioning screw penetrates through the first thread fixing piece and is in threaded connection or sliding connection with the first thread fixing piece, and a conical positioning head is arranged at the lower end of the positioning screw.
3. The fiducial alignment space measuring instrument of claim 2, wherein the upper end of the positioning screw is provided with a measuring base for placing a measuring tool.
4. The datum alignment dimensional measuring instrument of claim 2, wherein the first threaded fastener comprises:
the first upper spare nut is inserted into the first mounting hole and abuts against the upper surface of the substrate, and the positioning screw penetrates through the first upper spare nut and is in threaded connection with the first upper spare nut;
the first lower spare nut is in threaded connection with the surface of the first upper spare nut and abuts against the lower surface of the substrate.
5. The datum alignment dimensional measuring instrument of claim 2, wherein the second threaded fastener comprises:
the first upper spare bus is inserted into the first mounting hole and abuts against the upper surface of the substrate, and the adjusting screw penetrates through the first upper spare bus and is in sliding connection with the first upper spare bus;
the first lower spare nut is in threaded connection with the surface of the first upper spare nut and abuts against the lower surface of the substrate.
6. The datum alignment dimensional measuring instrument of claim 2, wherein the first mounting hole is located at an edge of the base plate.
7. The fiducial alignment space gauge of any of claims 1-6, wherein each of the adjustment assemblies comprises:
the base plate is provided with a first mounting hole, and the first threaded fixing piece is fixed on the first mounting hole;
and the adjusting screw rod penetrates through the second thread fixing piece and is in threaded connection with the first thread fixing piece, and an adjusting handle is fixed at the upper end of the adjusting screw rod.
8. The datum alignment dimensional measuring instrument of claim 7, wherein the adjustment assembly further comprises:
the conical adjusting head is sleeved at the lower end of the adjusting screw rod and is in threaded connection with the adjusting screw rod.
9. The datum alignment dimensional measuring instrument of claim 7, wherein the second threaded fastener comprises:
the second upper spare nut is inserted into the second mounting hole and abuts against the upper surface of the substrate, and the adjusting screw penetrates through the second upper spare nut and is in threaded connection with the second upper spare nut;
and the second lower spare nut is in threaded connection with the surface of the first upper spare nut and is abutted against the lower surface of the substrate.
10. The fiducial alignment space gauge of any of claims 1-6, wherein the leveler comprises a leveling bubble comprising:
the surface of the substrate is provided with a mounting groove, and the shell is fixed in the mounting groove; leveling scales are marked on the surface of the shell;
the leveling liquid, the leveling liquid set up in the inside of casing.
CN202111300794.XA 2021-11-04 2021-11-04 Datum point alignment space measuring instrument Pending CN114136297A (en)

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Application Number Priority Date Filing Date Title
CN202111300794.XA CN114136297A (en) 2021-11-04 2021-11-04 Datum point alignment space measuring instrument

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Application Number Priority Date Filing Date Title
CN202111300794.XA CN114136297A (en) 2021-11-04 2021-11-04 Datum point alignment space measuring instrument

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Publication Number Publication Date
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN208282828U (en) * 2018-06-08 2018-12-25 上海金艺检测技术有限公司 The auxiliary detecting tool of mechanical equipment installation datum mark
CN109958148A (en) * 2019-03-27 2019-07-02 中国化学工程第三建设有限公司 The levelling method of cold box foundation bottom plate centering
CN111561912A (en) * 2020-05-27 2020-08-21 武汉钢铁有限公司 Auxiliary sampling tool for permanent datum point
CN113483658A (en) * 2021-06-25 2021-10-08 成都飞机工业(集团)有限责任公司 Airplane reference point measuring device and method based on optical digital measurement
CN214473375U (en) * 2021-03-31 2021-10-22 四川蜀工公路工程试验检测有限公司 Concrete contraction and expansion instrument

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN208282828U (en) * 2018-06-08 2018-12-25 上海金艺检测技术有限公司 The auxiliary detecting tool of mechanical equipment installation datum mark
CN109958148A (en) * 2019-03-27 2019-07-02 中国化学工程第三建设有限公司 The levelling method of cold box foundation bottom plate centering
CN111561912A (en) * 2020-05-27 2020-08-21 武汉钢铁有限公司 Auxiliary sampling tool for permanent datum point
CN214473375U (en) * 2021-03-31 2021-10-22 四川蜀工公路工程试验检测有限公司 Concrete contraction and expansion instrument
CN113483658A (en) * 2021-06-25 2021-10-08 成都飞机工业(集团)有限责任公司 Airplane reference point measuring device and method based on optical digital measurement

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