CN114113219A - Damage detection method and system for infrared coating - Google Patents
Damage detection method and system for infrared coating Download PDFInfo
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Abstract
The invention relates to an infrared coating damage detection method and system, belongs to the technical field of coating damage detection, and solves the problems of low detection accuracy and low efficiency of the coating damage detection method in the prior art. The method comprises the following steps: collecting a full-wave-band radiation brightness map, radiation brightness maps of two different wave bands and a black body radiation brightness map of the infrared coating to be detected; obtaining a temperature distribution diagram of the infrared coating to be measured according to the radiation brightness diagrams of the two different wave bands; correcting the blackbody radiation brightness map according to the temperature distribution map to obtain a corrected blackbody radiation brightness map; obtaining an emissivity distribution map of the infrared coating to be measured according to the full-wave-band radiation brightness map and the corrected black body radiation brightness map; and detecting the damage of the infrared coating to be detected based on the temperature distribution map and the emissivity distribution map. The invention realizes the detection of the damage of the infrared coating to be detected and improves the accuracy and efficiency of the damage detection.
Description
Technical Field
The invention relates to the technical field of coating damage detection, in particular to a damage detection method and system for an infrared coating.
Background
The infrared coating is a functional coating applied to the specific field to realize the design requirements, and can be mainly divided into a low-emissivity coating, a high-emissivity coating, an emissivity-adjustable coating and the like, and the functional coating generally has a relatively thin thickness and has a relatively large radiation performance difference with a substrate material. In the using process of the coating, the damage is often caused by the intervention of operators or environmental change, and the performance of the coating is greatly reduced after the coating is damaged, so that the damage state of the coating needs to be identified and analyzed to ensure that the performance of the coating in the using process meets the requirements.
The damage types of the coating can be divided into falling, bubbles, cracks and the like, the traditional coating damage detection method mainly comprises two types, one type is physical inspection, the damage detection mostly depends on the experience of maintenance personnel through visual inspection, knocking touch and the like of the maintenance personnel, the detection depends on the specialty of the maintenance personnel, the efficiency is low, erroneous judgment and missed judgment are easily caused, and secondary damage is easily caused to the coating for contact maintenance; the other type is visible light image algorithm analysis and detection, after a suspicious damaged part is photographed, the image is analyzed by adopting a specific algorithm, so that the coating falling, cracking and the like which have large-area vacancy on the image can be detected, but the defects of coating tiny bubbles, poor bonding and the like are perfect in the image, namely, the coating damage which is difficult to show difference in the image is difficult to detect by the method. And the image algorithm damage judgment also has the technical defect of depending on a training model, and when the detection model is deeply learned, a prefabricated damage unit needs to be provided, but the reduction of the damage real state of the infrared coating to be detected is extremely difficult, and the use cost is greatly increased.
Therefore, the existing coating damage detection method has the problems of poor detection accuracy and low efficiency.
Disclosure of Invention
In view of the foregoing analysis, embodiments of the present invention provide a method and a system for detecting damage of an infrared coating, so as to solve the problems of poor detection accuracy and low efficiency of the existing coating damage detection method.
In one aspect, an embodiment of the present invention provides a method for detecting damage of an infrared coating, including the following steps:
collecting a full-wave-band radiation brightness map, radiation brightness maps of two different wave bands and a black body radiation brightness map of the infrared coating to be detected;
obtaining a temperature distribution diagram of the infrared coating to be measured according to the radiation brightness diagrams of the two different wave bands;
correcting the blackbody radiation brightness map according to the temperature distribution map to obtain a corrected blackbody radiation brightness map;
obtaining an emissivity distribution map of the infrared coating to be measured according to the full-wave-band radiation brightness map and the corrected black body radiation brightness map;
and detecting the damage of the infrared coating to be detected based on the temperature distribution map and the emissivity distribution map.
Further, determining a texture feature block of the infrared coating to be detected; the texture feature block comprises a block structure and/or a crack shape;
detect the damage of infrared coating that awaits measuring, include:
taking a corresponding area of each texture feature block of the infrared coating to be detected in the temperature distribution diagram and the emissivity distribution diagram as a reference area, and expanding each reference area to obtain a corresponding surrounding area;
and determining the damage type of each reference region according to the temperature relation between each reference region and the corresponding surrounding region in the temperature distribution diagram and the emissivity relation between each reference region and the corresponding surrounding region in the emissivity distribution diagram.
Further, the damage types of the infrared coating to be detected comprise falling damage, crack damage and bubble damage.
Further, for each reference region, the type of lesion is determined by performing the following:
if the lowest temperature of the reference area in the temperature distribution diagram is higher than the highest temperature of the corresponding surrounding area, and the lowest emissivity of the reference area in the emissivity distribution diagram is higher than the highest emissivity of the corresponding surrounding area, judging that the infrared coating to be detected is damaged; at this time, if the texture feature block is a block structure, the texture feature block is a falling-off damage; if the texture feature block is in a crack shape, the texture feature block is damaged like a crack;
if the highest temperature of the reference region in the temperature profile is lower than the lowest temperature of the corresponding surrounding region, the highest emissivity of the reference region in the emissivity profile is lower than the lowest emissivity of the corresponding surrounding region, and the texture feature block is a block structure, the texture feature block is a bubble damage.
Further, in the temperature distribution map of the infrared coating to be detected, the temperature T (i, j) of the ith row and jth column of pixel points is represented as:
in the formula, La(i,j)、Lb(i, j) respectively representing pixel values of pixel points in ith row and jth column in radiance map of two different wave bands, wherein Lb(i,j)The wavelength of the corresponding wave band is greater than La(i, j) the corresponding wavelength bands, A, B respectively represent the temperature parameters corresponding to the radiance maps of two different wavelength bands, and the temperature parameters are obtained by fitting the radiance maps of two different wavelength bands at different temperatures and with the nondestructive coating of the same material as the infrared coating to be measured.
Further, the temperature parameters a and B are determined according to the following manner:
collecting a first waveband radiation brightness graph and a second waveband radiation brightness graph of the lossless coating at different temperatures within a set temperature range; the nondestructive coating is made of the same material as the infrared coating to be detected;
non-linear fitting was performed to obtain temperature parameters a and B according to the following formula:
in formula (II) T'kDenotes the k temperature, L 'of the non-destructive coating'aFirst band radiance map, L ', representing lossless coating at kth temperature'bA second band radiance plot of the lossless coating at the kth temperature.
Further, in the corrected blackbody radiation brightness graph, the blackbody radiation brightness L of the ith row and the jth column of pixel points of the infrared coating to be detectedbby(i, j) is expressed as:
in the formula, Lbb0Indicating the blackbody radiation brightness L of the surface source blackbody of the infrared coating to be measured at any pixel pointb0Is expressed in the L and L of the standard plane source black body radiation brightness curvebb0Corresponding pixel point and corresponding standard black body radiation brightness L at the temperature of the surface source black bodyby(i, j) represents the corresponding standard blackbody radiation brightness of the ith row and the jth column of pixel points in the temperature distribution diagram in the standard surface source blackbody radiation brightness curve at the temperature of the pixel points.
Further, the standard blackbody radiation brightness curve is obtained according to the following mode:
collecting standard blackbody radiation brightness graphs of standard surface source blackbodies at different temperatures at fixed temperature intervals within a set temperature range;
obtaining a radiant brightness curve corresponding to each pixel point of the standard surface source black body in a temperature range according to polynomial fitting; and each pixel point of the standard plane source black body corresponds to a pixel point in the temperature distribution diagram one by one.
In another aspect, an embodiment of the present invention provides a damage detection system for an infrared coating, including:
the data acquisition device is used for acquiring a full-wave-band radiation brightness map, radiation brightness maps of two different wave bands and a black body radiation brightness map of the infrared coating to be detected;
the temperature distribution map acquisition module is used for acquiring a temperature distribution map of the infrared coating to be detected according to the radiation brightness maps of the two different wave bands;
the emissivity distribution diagram acquisition module is used for correcting the blackbody radiation brightness diagram according to the temperature distribution diagram to obtain a corrected blackbody radiation brightness diagram; obtaining an emissivity distribution diagram of the infrared coating to be measured according to the full-wave-band radiation brightness diagram and the corrected black body radiation brightness diagram;
and the damage detection module is used for detecting the damage of the infrared coating to be detected based on the temperature distribution diagram and the emissivity distribution diagram.
Furthermore, the data acquisition device comprises a heating table, a thermal infrared imager lens, an integrated carrier wheel and a thermal infrared imager which are sequentially arranged, and the central points of all parts are on the same straight line;
the heating table is used for placing and heating the infrared coating to be detected;
the thermal infrared imager lens is used for converging the radiation generated by the infrared coating to be detected;
the integrated carrier wheel is used for receiving radiation generated by the infrared coating to be detected and generating a full-wave-band radiation brightness diagram, two radiation brightness diagrams with different wave bands and a black body radiation brightness diagram of the infrared coating to be detected;
compared with the prior art, the thermal infrared imager is used for receiving a full-wave-band radiant brightness graph, two radiant brightness graphs of different wave bands and a black body radiant brightness graph of an infrared coating to be detected, and the thermal infrared imager can realize the following beneficial effects:
according to the damage detection method and system for the infrared coating, provided by the invention, the damage of the infrared coating to be detected is detected by acquiring the temperature distribution map and the emissivity distribution map of the infrared coating to be detected through data acquisition, the coating falling, air bubble and crack damage can be detected under the non-contact condition, the coating cannot be damaged secondarily, and the detection accuracy and efficiency are improved; through synchronous acquisition temperature and emissivity, can improve the accurate nature of data collection, further improve the accuracy that the damage detected.
In the invention, the technical schemes can be combined with each other to realize more preferable combination schemes. Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and drawings.
Drawings
The drawings are only for purposes of illustrating particular embodiments and are not to be construed as limiting the invention, wherein like reference numerals are used to designate like parts throughout.
FIG. 1 is a schematic flow chart of a method for detecting damage to an infrared coating according to example 1 of the present invention;
fig. 2 is a schematic structural diagram of a data acquisition device according to embodiment 2 of the present invention;
fig. 3 is a schematic structural view of an integrated carrier wheel in embodiment 2 of the present invention.
Reference numerals:
1-a heater; 2-infrared thermal imager lens; 3-an integral carrier wheel; 4-high precision step motor; 5-infrared thermal imaging system; 6-an upper computer; 31-a blank window unit; 32-a first filter unit; 33-a second filter unit; 34-a planar source blackbody unit; 35-thermocouple.
Detailed Description
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate preferred embodiments of the invention and together with the description, serve to explain the principles of the invention and not to limit the scope of the invention.
One of the existing methods for detecting damage of the infrared coating is physical inspection, depends on the specialty of operators, has low efficiency and is easy to cause secondary damage; one is visible image analysis, which cannot detect insignificant defects in the image and relies on a training model. The two existing detection methods do not contain temperature factors, but the damage of the coating is changed along with the temperature, and the damage shows different characteristics at different temperatures. Therefore, the damage detection method of the infrared coating provided by the invention has the advantages that the damage detection method of the infrared coating simultaneously collects the surface temperature and emissivity data of the infrared coating to be detected, and the damaged part and the damage type of the infrared coating to be detected are jointly analyzed through the surface temperature and the emissivity data, so that the damage detection accuracy and efficiency are improved.
Example 1
The specific embodiment of the invention discloses a damage detection method of an infrared coating, which comprises the following steps as shown in figure 1:
s1, collecting a full-wave-band radiation brightness diagram, two radiation brightness diagrams of different wave bands and a black body radiation brightness diagram of the infrared coating to be detected;
specifically, when collecting the infrared coating data to be detected, the infrared coating to be detected is heated to any temperature within the temperature range of the infrared coating to be detected in the working process, so that the infrared coating to be detected can display the working state, the characteristics of the infrared coating to be detected are better represented, and the collected data can be more accurately used for detecting the damage of the infrared coating to be detected.
Specifically, the coating radiation brightness graph, the radiation brightness graph of different wave bands and the black body radiation brightness graph have the same size, and the pixel points are in one-to-one correspondence.
In practice, the two different bands are determined by:
determining the wave band as a long wave band or a short wave band according to the infrared coating to be detected; and selecting two wave bands with the difference value smaller than a set difference threshold value from the determined long wave bands or short wave bands. Wherein, the difference threshold value is set according to the actual situation. It will be appreciated that the material of the ir coating may be different and the radiation signature may be different, and the band of radiation signatures that are capable of reflecting the ir coating is selected.
Specifically, the short-band wavelength is generally 1-3 um, the long-band wavelength is generally 7.5-14 um, the difference threshold corresponding to the short-band is set to 1um, and the difference threshold corresponding to the long-band is set to 2 um. Illustratively, if the long wavelength band is determined according to the infrared coating to be measured, the two selected wavelength bands are 10um and 8 um.
S2, obtaining a temperature distribution diagram of the infrared coating to be measured according to the radiation brightness diagrams of the two different wave bands; it is understood that the coating is heated by the lower surface of the coating when the coating is heated, so that the temperature of the upper and lower surfaces of the coating is different, and thus, even though the coating is heated at a certain temperature, the temperature of the coating is not uniform.
In the implementation process, in the temperature distribution diagram of the infrared coating to be detected, the temperature T (i, j) of the ith row and the jth column of pixel points is represented as:
in the formula, La(i,j)、Lb(i, j) respectively representing pixel values of pixel points in ith row and jth column in radiance map of two different wave bands, wherein Lb(i, j) corresponds to a wavelength band greater than La(i, j) wavelength of corresponding band; A. and B respectively represents temperature parameters corresponding to the radiation brightness diagrams of two different wave bands, and the temperature parameters are obtained by fitting the radiation brightness diagrams of the two different wave bands at different temperatures and obtaining the nondestructive coating made of the same material as the infrared coating to be detected.
In specific implementation, the temperature parameters a and B are determined according to the following manner:
collecting a first waveband radiation brightness graph and a second waveband radiation brightness graph of the lossless coating at different temperatures within a set temperature range; the nondestructive coating is made of the same material as the infrared coating to be detected;
non-linear fitting was performed to obtain temperature parameters a and B according to the following formula:
in formula (II) T'kDenotes the k temperature, L 'of the non-destructive coating'aFirst band radiance map, L ', representing lossless coating at kth temperature'bA second band radiance plot of the lossless coating at the kth temperature.
It should be noted that, when different infrared coatings to be detected are detected, temperature parameters a and B are obtained according to the corresponding lossless coating of the infrared coating to be detected, and then, when a temperature distribution map of the infrared coating to be detected is obtained, a radiance map of two different bands of the infrared coating to be detected can be obtained.
S3, correcting the blackbody radiation brightness graph according to the temperature distribution graph to obtain a corrected blackbody radiation brightness graph; it can be understood that due to the change of the surrounding environment of the coating to be detected, the blackbody radiation brightness graphs acquired each time have differences, so that the radiation brightness of the standard blackbody surface source is used as a reference, and the blackbody radiation brightness of the infrared coating to be detected corresponding to each pixel point is corrected according to the temperature distribution of the infrared coating to be detected.
During implementation, in the corrected blackbody radiation brightness graph, the blackbody radiation brightness L of the ith row and the jth column of pixel points of the infrared coating to be detectedbby(i, j) is expressed as:
in the formula, Lbb0Indicating the blackbody radiation brightness L of the surface source blackbody of the infrared coating to be measured at any pixel pointb0Expressed in the standard plane source black body radiation brightness curveAt and Lbb0Corresponding pixel point and corresponding standard black body radiation brightness L at the temperature of the surface source black bodyby(i, j) represents the corresponding standard blackbody radiation brightness of the ith row and the jth column of pixel points in the temperature distribution diagram in the standard surface source blackbody radiation brightness curve at the temperature of the pixel points.
In specific implementation, the standard blackbody radiation brightness curve is obtained according to the following mode:
collecting standard blackbody radiation brightness graphs of standard surface source blackbodies at different temperatures at fixed temperature intervals within a set temperature range; specifically, the temperature interval may be set to 15 °, 20 °, or the like.
Obtaining a radiant brightness curve corresponding to each pixel point of the standard surface source black body in a temperature range according to polynomial fitting; and each pixel point of the standard plane source black body corresponds to a pixel point in the temperature distribution diagram one by one. Preferably, a trinomial fitting is selected to obtain a radiance curve corresponding to each pixel point within a temperature range.
It should be noted that the standard blackbody radiation brightness curve is used for correcting the blackbody radiation brightness of the surface source blackbody of the infrared coating to be measured, and after the standard blackbody radiation brightness curve is set, the standard blackbody radiation brightness curve cannot be changed due to the difference of the infrared coating to be measured.
It should be noted that the temperature range set when the standard blackbody radiation brightness curve is obtained, the temperature range set when the temperature parameters a and B are obtained, and the working temperature range of the infrared layer to be measured are consistent, or the temperature range set when the standard blackbody radiation brightness curve is obtained is greater than the temperature ranges set when the temperature parameters a and B are greater than the working temperature range of the infrared layer to be measured. Illustratively, each temperature range is 25 to 1000 ℃.
And S4, obtaining an emissivity distribution map of the infrared coating to be measured according to the full-wave-band radiation brightness map and the corrected black body radiation brightness map.
In the implementation process, in the distribution diagram of the emissivity of the infrared coating to be detected, the emissivity E (i, j) of the ith row and the jth column of pixel points is represented as follows:
in the formula, Ly(i, j) represents the coating radiance of the ith row and the jth column pixel point in the all-band radiance map.
And S5, detecting the damage of the infrared coating to be detected based on the temperature distribution map and the emissivity distribution map.
In implementation, the damage detection method of the infrared coating further comprises the steps of determining a texture feature block of the infrared coating to be detected; the texture feature block comprises a block structure and/or a crack shape;
specifically, when the texture feature block of the infrared coating to be detected is determined, the texture feature block can be identified by selecting an albedo image, a visible light image at different angles, a gray image and the like, and the texture feature block which shows an abnormal condition in the infrared coating to be detected can be identified and determined.
Specifically, the damage to the infrared coating that awaits measuring is detected, includes:
and S51, taking a corresponding area of each texture feature block of the infrared coating to be detected in the temperature distribution diagram and the emissivity distribution diagram as a reference area, and expanding each reference area to obtain a corresponding surrounding area.
Specifically, when the reference region is expanded, the number of expanded pixel points is set according to requirements, each edge point of the reference region is expanded outwards by the number of the pixel points to obtain an expanded region, and the reference region in the expanded region is deleted to obtain a surrounding region corresponding to the reference region. The number of the pixels for setting expansion can be determined according to the determined texture feature block, and the expanded area is prevented from being overlapped with other texture feature blocks.
And S52, determining the damage type of each reference area according to the temperature relation between each reference area and the corresponding surrounding area in the temperature distribution diagram and the emissivity relation between each reference area and the corresponding surrounding area in the emissivity distribution diagram.
Specifically, the damage types of the infrared coating to be detected include shedding damage, crack damage and bubble damage. Wherein, the falling damage comprises coating falling and coating peeling; crack-like damage includes coating cracking, coating scratching.
More specifically, for each reference region, the damage type is determined by performing the following operations:
if the lowest temperature of the reference area in the temperature distribution diagram is higher than the highest temperature of the corresponding surrounding area, and the lowest emissivity of the reference area in the emissivity distribution diagram is higher than the highest emissivity of the corresponding surrounding area, judging that the infrared coating to be detected is damaged; at this time, if the texture feature block is a block structure, the texture feature block is a falling-off damage; if the texture feature block is in a crack shape, the texture feature block is damaged like a crack;
if the highest temperature of the reference region in the temperature profile is lower than the lowest temperature of the corresponding surrounding region, the highest emissivity of the reference region in the emissivity profile is lower than the lowest emissivity of the corresponding surrounding region, and the texture feature block is a block structure, the texture feature block is a bubble damage.
Illustratively, the temperature profile and emissivity profile of the infrared coating to be measured are represented by the following matrices, where tm,nRepresenting the temperature value of the nth column on the mth row of the infrared coating to be measured; e.g. of the typem,nAnd the emissivity value of the mth row and the nth column of the infrared coating to be tested is shown.
The dotted part in the matrix is a determined texture feature block, and the part is used as a reference region in the temperature distribution diagram; taking the region outside the reference region as the surrounding region of the reference region in the temperature profile, and expanding the reference region to the maximum in the temperature profile; the region of the emissivity profile other than the reference region is the surrounding region of the reference region, and the reference region is expanded to the maximum in the emissivity profile.
If the minimum value of the pixel points of the reference area in the temperature distribution diagram is larger than the maximum value of the surrounding area, and the minimum value of the pixel points of the reference area in the emissivity distribution diagram is larger than the maximum value of the surrounding area, it is indicated that the lowest temperature of the reference area is higher than the highest temperature of the corresponding surrounding area, the lowest emissivity of the reference area is higher than the highest emissivity of the corresponding surrounding area, and the infrared coating to be detected is damaged; and the texture feature block is a rectangular or blocky structure, and the position of the texture feature block of the infrared coating to be detected is a falling damage.
If the maximum value of the pixel points of the reference area in the temperature distribution diagram is smaller than the minimum value of the surrounding area, and the maximum value of the pixel points of the reference area in the emissivity distribution diagram is smaller than the minimum value of the surrounding area, it is indicated that the highest temperature of the reference area is lower than the lowest temperature of the corresponding surrounding area, the highest emissivity of the reference area is lower than the lowest emissivity of the corresponding surrounding area, and the infrared coating to be tested is damaged; and the texture feature block is a rectangular or blocky structure, and the position of the texture feature block of the infrared coating to be detected is damaged by bubbles.
Illustratively, the temperature profile and emissivity profile of the infrared coating to be measured are represented by the following matrices, where tm,nRepresenting the temperature value of the nth column on the mth row of the infrared coating to be measured; e.g. of the typem,nAnd the emissivity value of the mth row and the nth column of the infrared coating to be tested is shown.
The dotted part in the matrix is a determined texture feature block, and the part is used as a reference region in the temperature distribution diagram; taking the region outside the reference region as the surrounding region of the reference region in the temperature profile, and expanding the reference region to the maximum in the temperature profile; the region of the emissivity profile other than the reference region is the surrounding region of the reference region, and the reference region is expanded to the maximum in the emissivity profile.
If the minimum value of the pixel points of the reference area in the temperature distribution diagram is larger than the maximum value of the surrounding area, and the minimum value of the pixel points of the reference area in the emissivity distribution diagram is larger than the maximum value of the surrounding area, it is indicated that the lowest temperature of the reference area is higher than the highest temperature of the corresponding surrounding area, the lowest emissivity of the reference area is higher than the highest emissivity of the corresponding surrounding area, and the infrared coating to be detected is damaged; and the texture characteristic block is in a crack shape, and the position of the texture characteristic block of the infrared coating to be detected is obtained as crack damage.
Illustratively, the temperature profile and emissivity profile of the infrared coating to be measured are represented by the following matrices, where tm,nRepresenting the temperature value of the nth column on the mth row of the infrared coating to be measured; e.g. of the typem,nAnd the emissivity value of the mth row and the nth column of the infrared coating to be tested is shown.
The texture feature block structure is not determined in the matrix, which indicates that the coating to be tested has no damage.
Compared with the prior art, the damage detection method of the infrared coating provided by the embodiment has the advantages that the damage of the infrared coating to be detected is detected by acquiring the temperature distribution map and the emissivity distribution map of the infrared coating to be detected through data acquisition, the coating falling, air bubble and crack damage can be detected under the non-contact condition, the coating cannot be damaged secondarily, and the detection accuracy and efficiency are improved; through synchronous acquisition temperature and emissivity, can improve the accurate nature of data collection, further improve the accuracy that the damage detected.
Example 2
The invention discloses a damage detection system of an infrared coating, which comprises:
the data acquisition device is used for acquiring a full-wave-band radiation brightness map, radiation brightness maps of two different wave bands and a black body radiation brightness map of the infrared coating to be detected;
the temperature distribution map acquisition module is used for acquiring a temperature distribution map of the infrared coating to be detected according to the radiation brightness maps of the two different wave bands;
the emissivity distribution diagram acquisition module is used for correcting the blackbody radiation brightness diagram according to the temperature distribution diagram to obtain a corrected blackbody radiation brightness diagram; obtaining an emissivity distribution diagram of the infrared coating to be measured according to the full-wave-band radiation brightness diagram and the corrected black body radiation brightness diagram;
and the damage detection module is used for detecting the damage of the infrared coating to be detected based on the temperature distribution diagram and the emissivity distribution diagram.
In implementation, the data acquisition device comprises a heating table 1, a thermal infrared imager lens 2, an integrated carrier wheel 3 and a thermal infrared imager 5 which are arranged in sequence, and the central points of all parts are on the same straight line;
the heating table 1 is used for placing and heating the infrared coating to be detected;
the thermal infrared imager lens 2 is used for converging the radiation generated by the infrared coating to be detected;
the integrated carrier wheel 3 is used for receiving radiation generated by the infrared coating to be detected and generating a full-wave-band radiation brightness diagram, two radiation brightness diagrams with different wave bands and a black body radiation brightness diagram of the infrared coating to be detected;
the thermal infrared imager 5 is used for receiving a full-wave-band radiant brightness map, radiant brightness maps of two different wave bands and a black body radiant brightness map of the infrared coating to be detected.
In specific implementation, the integrated carrier wheel 3 is sequentially provided with a hollow window unit 31, a first band filter unit 32, a second band filter unit 33 and a surface source blackbody unit 34 around the center; wherein, a thermocouple 35 is arranged in the surface source blackbody unit. More specifically, the hollow window unit 31 is configured to generate a full-band radiance map of the infrared coating to be measured, the first band filter unit 32 and the second band filter unit 33 are configured to generate radiance maps of two different bands, and the area source blackbody unit 34 is configured to generate a blackbody radiance map; the thermocouple 35 is used to collect the temperature of the surface source blackbody unit.
More specifically, the hollow window unit 31, the first waveband filter unit 32 and the second waveband filter unit 33 on the integrated carrier wheel are all in a circular structure, the radius of the circular structure is 55cm, the number of the thermocouples 35 is 1, and the integrated carrier wheel is arranged at the center of the surface source blackbody unit.
The data acquisition device further comprises a high-precision stepping motor 4, wherein the high-precision stepping motor 4 is connected with the integrated carrier wheel 3 through a rotation center and used for controlling the integrated carrier wheel 3 to rotate so as to realize switching of all units on the integrated carrier wheel 3.
More specifically, the centers of the units arranged on the integrated carrier wheel 3 are set at intervals relative to the center point of the integrated carrier wheel 3, wherein the angles are matched with the step angle of the high-precision stepping motor 4, so that the high-precision stepping motor 4 can control the switching of the units on the integrated carrier wheel 3 in the shortest time, and the switched centers of the units are aligned with the center of the thermal infrared imager lens 2.
Illustratively, the high-precision stepping motor 4 selects two phases, the whole is 200 steps, the basic stepping angle is 1.8 degrees, each step rotates 1.8 degrees, the fixed angle of each unit on the integrated carrier wheel 3 is set to be 51 degrees, switching of each unit can be completed within the shortest time, and the center of a target unit is aligned with the center of the thermal infrared imager lens 4.
In specific implementation, the first band filter unit 32 and the second band filter unit 33 are determined by:
determining a long wave band or a short wave band according to the infrared coating to be detected; two wave band wavelengths with the difference value smaller than a set difference threshold value are selected from the determined long wave band or short wave band as the central wavelengths of the first wave band filter unit 32 and the second wave band filter unit 33 respectively. It will be appreciated that the material of the ir coating may be different and the radiation signature may be different, and that the filter may be selected to reflect the wavelength of the wavelength band of the radiation signature of the ir coating.
During specific implementation, the data acquisition device is connected with host computer 6, and host computer 6 is used for controlling high accuracy step motor 4 and rotates, and then controls integral type carrier wheel 3 rotatory, and host computer 6 still receives the data of storage data acquisition device collection. The upper computer 6 is further integrated with a temperature distribution diagram acquisition module, an emissivity distribution diagram acquisition module and a damage detection module, and the operation of each module is executed to complete the detection of the infrared coating to be detected.
The data acquisition process specifically comprises the following steps:
before beginning to carry out damage detection on the infrared coating to be detected:
the standard surface source black body is placed on the heating table 1 to be heated, the upper computer 6 controls the high-precision stepping motor 4 to rotate the integrated carrier wheel 3 to the hollow window unit 31, and radiation brightness graphs of the standard surface source black body at different temperatures at fixed temperature intervals within a set range are collected to obtain a standard surface source black body radiation brightness curve subsequently.
Placing a nondestructive coating corresponding to the infrared coating to be detected on a heating table 1 for heating, controlling a high-precision stepping motor 4 by an upper computer 6 to respectively rotate an integrated carrier wheel to a first optical filter unit 32 and a second optical filter unit 33 for stopping, and respectively collecting radiation brightness graphs of two different wave bands with different temperatures within a set temperature range for subsequent obtaining of temperature parameters of the infrared coating to be detected;
when the damage detection of the infrared coating to be detected is started:
placing an infrared coating to be detected on a heating table 1 for heating, processing and converging the radiation of the infrared coating to be detected through an infrared thermal imager lens 2, and then enabling the radiation to reach an integrated carrier wheel 3, controlling a high-precision stepping motor 4 by an upper computer 6 to sequentially switch all units on an integrated rotating wheel, enabling the infrared thermal imager lens 2 to be concentric with the corresponding units, enabling radiation signals to sequentially pass through all the units, completing acquisition of corresponding signals by an infrared thermal imager 5, and storing and processing the acquired data in the upper computer; the method comprises the steps that a full-wave-band radiation brightness diagram of an infrared coating to be detected is collected through a hollow window unit 31, two radiation brightness diagrams of different wave bands are collected through a first optical filter unit 32 and a second optical filter unit 33, and a blackbody radiation brightness diagram is collected through a surface source blackbody unit 34; and obtains the temperature of the surface source black body unit 34 at this time from the thermocouple 35 provided in the surface source black body unit 34.
The specific implementation process of the embodiment of the present invention may be implemented by referring to the above method embodiment, and the details of the embodiment are not repeated herein.
Since the principle of the present embodiment is the same as that of the above method embodiment, the present system also has the corresponding technical effects of the above method embodiment.
Those skilled in the art will appreciate that all or part of the flow of the method implementing the above embodiments may be implemented by a computer program, which is stored in a computer readable storage medium, to instruct related hardware. The computer readable storage medium is a magnetic disk, an optical disk, a read-only memory or a random access memory.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention.
Claims (10)
1. A damage detection method and a system for an infrared coating are characterized by comprising the following steps:
collecting a full-wave-band radiation brightness map, radiation brightness maps of two different wave bands and a black body radiation brightness map of the infrared coating to be detected;
obtaining a temperature distribution diagram of the infrared coating to be measured according to the radiation brightness diagrams of the two different wave bands;
correcting the blackbody radiation brightness map according to the temperature distribution map to obtain a corrected blackbody radiation brightness map;
obtaining an emissivity distribution map of the infrared coating to be measured according to the full-wave-band radiation brightness map and the corrected black body radiation brightness map;
and detecting the damage of the infrared coating to be detected based on the temperature distribution map and the emissivity distribution map.
2. The method for detecting damage of infrared coating according to claim 1, further comprising determining a texture feature block of the infrared coating to be detected; the texture feature block comprises a block structure and/or a crack shape;
detect the damage of infrared coating that awaits measuring, include:
taking a corresponding area of each texture feature block of the infrared coating to be detected in the temperature distribution diagram and the emissivity distribution diagram as a reference area, and expanding each reference area to obtain a corresponding surrounding area;
and determining the damage type of each reference region according to the temperature relation between each reference region and the corresponding surrounding region in the temperature distribution diagram and the emissivity relation between each reference region and the corresponding surrounding region in the emissivity distribution diagram.
3. The method for detecting damage of infrared coating according to claim 2, wherein the damage types of the infrared coating to be detected include peeling damage, crack damage and bubble damage.
4. The method of claim 3, wherein the damage type is determined for each reference region by:
if the lowest temperature of the reference area in the temperature distribution diagram is higher than the highest temperature of the corresponding surrounding area, and the lowest emissivity of the reference area in the emissivity distribution diagram is higher than the highest emissivity of the corresponding surrounding area, judging that the infrared coating to be detected is damaged; at this time, if the texture feature block is a block structure, the texture feature block is a falling-off damage; if the texture feature block is in a crack shape, the texture feature block is damaged like a crack;
if the highest temperature of the reference region in the temperature profile is lower than the lowest temperature of the corresponding surrounding region, the highest emissivity of the reference region in the emissivity profile is lower than the lowest emissivity of the corresponding surrounding region, and the texture feature block is a block structure, the texture feature block is a bubble damage.
5. The method for detecting damage to an infrared coating according to any one of claims 1 to 4, wherein in the temperature distribution map of the infrared coating to be detected, the temperature T (i, j) of the pixel point in the ith row and the jth column is expressed as:
in the formula, La(i,j)、Lb(i, j) respectively representing pixel values of pixel points in ith row and jth column in radiance map of two different wave bands, wherein Lb(i, j) corresponds to a wavelength band greater than La(i, j) the corresponding wavelength bands, A, B respectively represent the temperature parameters corresponding to the radiance maps of two different wavelength bands, and the temperature parameters are obtained by fitting the radiance maps of two different wavelength bands at different temperatures and with the nondestructive coating of the same material as the infrared coating to be measured.
6. Method for the damage detection of infrared coatings according to claim 5, characterized in that said temperature parameters A and B are determined according to the following way:
collecting a first waveband radiation brightness graph and a second waveband radiation brightness graph of the lossless coating at different temperatures within a set temperature range; the nondestructive coating is made of the same material as the infrared coating to be detected;
non-linear fitting was performed to obtain temperature parameters a and B according to the following formula:
in formula (II) T'kDenotes the k temperature, L 'of the non-destructive coating'aFirst band radiance map, L ', representing lossless coating at kth temperature'bA second band radiance plot of the lossless coating at the kth temperature.
7. The method for detecting damage to an infrared coating as claimed in claim 1, wherein in the blackbody radiation brightness map after correction, the blackbody radiation brightness L of the pixel point at the ith row and the jth column of the infrared coating to be detectedbby(i, j) is expressed as:
in the formula, Lbb0Indicating the blackbody radiation brightness L of the surface source blackbody of the infrared coating to be measured at any pixel pointb0Is expressed in the L and L of the standard plane source black body radiation brightness curvebb0Corresponding pixel point and corresponding standard black body radiation brightness L at the temperature of the surface source black bodyby(i, j) represents the corresponding standard blackbody radiation brightness of the ith row and the jth column of pixel points in the temperature distribution diagram in the standard surface source blackbody radiation brightness curve at the temperature of the pixel points.
8. The method of claim 7, wherein the standard blackbody radiance curve is obtained by:
collecting standard blackbody radiation brightness graphs of standard surface source blackbodies at different temperatures at fixed temperature intervals within a set temperature range;
obtaining a radiant brightness curve corresponding to each pixel point of the standard surface source black body in a temperature range according to polynomial fitting; and each pixel point of the standard plane source black body corresponds to a pixel point in the temperature distribution diagram one by one.
9. An infrared coated damage detection system, comprising:
the data acquisition device is used for acquiring a full-wave-band radiation brightness map, radiation brightness maps of two different wave bands and a black body radiation brightness map of the infrared coating to be detected;
the temperature distribution map acquisition module is used for acquiring a temperature distribution map of the infrared coating to be detected according to the radiation brightness maps of the two different wave bands;
the emissivity distribution diagram acquisition module is used for correcting the blackbody radiation brightness diagram according to the temperature distribution diagram to obtain a corrected blackbody radiation brightness diagram; obtaining an emissivity distribution diagram of the infrared coating to be measured according to the full-wave-band radiation brightness diagram and the corrected black body radiation brightness diagram;
and the damage detection module is used for detecting the damage of the infrared coating to be detected based on the temperature distribution diagram and the emissivity distribution diagram.
10. The system for detecting damage to the infrared coating according to claim 9, wherein the data acquisition device comprises a heating stage, a thermal infrared imager lens, an integrated carrier wheel and a thermal infrared imager arranged in sequence, and central points of the portions are on the same straight line;
the heating table is used for placing and heating the infrared coating to be detected;
the thermal infrared imager lens is used for converging the radiation generated by the infrared coating to be detected;
the integrated carrier wheel is used for receiving radiation generated by the infrared coating to be detected and generating a full-wave-band radiation brightness diagram, two radiation brightness diagrams with different wave bands and a black body radiation brightness diagram of the infrared coating to be detected;
the thermal infrared imager is used for receiving a full-wave-band radiant brightness map, two radiant brightness maps with different wave bands and a black body radiant brightness map of the infrared coating to be detected.
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