CN114088641A - Measuring device and method suitable for integration of micro-scale regional strain field and temperature field - Google Patents
Measuring device and method suitable for integration of micro-scale regional strain field and temperature field Download PDFInfo
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- CN114088641A CN114088641A CN202111363211.8A CN202111363211A CN114088641A CN 114088641 A CN114088641 A CN 114088641A CN 202111363211 A CN202111363211 A CN 202111363211A CN 114088641 A CN114088641 A CN 114088641A
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- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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Abstract
The invention discloses a measuring device and a working method suitable for integration of a strain field and a temperature field in a micro-scale region, which solve the problem that micro-scale deformation and temperature cannot be synchronously measured in the prior art, have the beneficial effect of realizing simultaneous measurement of a deformation field and a temperature field in the micro-scale region, and have the following specific schemes: measuring device suitable for regional strain field of microscale and temperature field are integrated, including the microspectrum separator, the microspectrum separator includes first casing, set up the dichroic mirror in order to separate the spectrum in the first casing, first casing is connected with the microscope head, the lateral part of first casing still is provided with infrared shooting equipment and camera equipment, infrared shooting equipment and camera equipment set up perpendicularly mutually, the microscope head is perpendicular to test object measurement area, the incident light gets into from the microscope head, shoot the image under the infrared light so that acquire temperature field information by infrared shooting equipment, shoot the image under the visible light so that acquire strain field information by camera equipment.
Description
Technical Field
The invention relates to the technical field of material deformation testing, in particular to a measuring device and a measuring method suitable for integration of a micro-scale area strain field and a temperature field.
Background
The statements in this section merely provide background information related to the present disclosure and may not necessarily constitute prior art.
The deep understanding of the dynamic and thermodynamic properties of materials is the theoretical basis for the study of material deformation and manufacturing techniques. Most of the strain energy dissipates to the outside in the form of heat when the material is plastically deformed. Under accurate space-time resolution, the motion field and the temperature field of the material in the severe loading process are measured, the formation of a shear band and the temperature rise of a shear zone in severe plastic deformation of the material are obtained, and the dynamic deformation and failure mechanism of the material can be revealed, and a corresponding material model can be established. In addition, the material dynamics and thermodynamic mechanism research can provide data and theoretical basis for material deformation and processing simulation, and guides the development of a novel material processing method.
The dynamic deformation of the material often occurs in a micro area (under mesoscopic scale) and within a micro-nano second time range, and the testing and capturing difficulty of the dynamic deformation process is extremely high.
At present, the methods for measuring the deformation of materials are mainly contact measurement methods, including strain gauge measurement, extensometer measurement, acoustic measurement and other types. However, none of the above methods can perform full-field measurement and real-time measurement, and is not suitable for measuring the deformation process of a micro area of a material. The temperature measurement technology mainly comprises a thermocouple method and an infrared measurement method. The thermocouple method is not suitable for temperature measurement in a micro area because the material structure is damaged and the measurement precision is low when the measured material is punched.
The method for measuring the material deformation by the high-speed camera based on the Digital Image Correlation (DIC) technology has the advantages of non-contact, real-time, full-field measurement, high precision and the like. The infrared measurement method overcomes the defects of the thermocouple method and has the advantages of non-contact, real-time measurement, convenience in measurement and the like. Currently, researchers have studied the measurement technology combining the DIC technology and the infrared photography technology, but the existing method only combines the CCD optical camera and the thermal infrared imager for direct use.
The inventors have found that the existing parallel placement schemes can only perform macro-area measurements. Because the field of view of the microscope lens is very small (smaller than a circular area with a diameter of 5 mm), if the microscope lens is only additionally arranged on the video camera, the problem that the measurement area of the high-speed video camera is not matched with that of the high-speed infrared camera is caused, and therefore the simultaneous measurement of the temperature field and the strain field in the micro-scale area cannot be realized.
In addition, the light acquired by the high-speed camera and the high-speed infrared camera is not separated, and due to the calculation characteristic of DIC, if the lens of the camera is not vertically aligned with the test area, the result of the test strain field is inaccurate.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a measuring device suitable for integrating a micro-scale region strain field and a temperature field, overcomes the technical problem that the micro-scale deformation and temperature cannot be synchronously measured by the existing measuring method, can measure the strain field and the temperature field with high space-time resolution, and has the advantages of high measuring precision, simple structure, convenience in operation, non-contact, real-time and full-scene and the like.
In order to realize the purpose, the invention is realized by the following technical scheme:
measuring device suitable for regional strain field of microscale and temperature field are integrated, including the microspectrum separator, the microspectrum separator includes first casing, set up the dichroic mirror in order to separate the spectrum in the first casing, first casing is connected with the microscope head, the lateral part of first casing still is provided with infrared shooting equipment and camera equipment, infrared shooting equipment and camera equipment set up perpendicularly mutually, the microscope head is perpendicular to test object measurement area, the incident light gets into from the microscope head, shoot the image under the infrared light so that acquire temperature field information by infrared shooting equipment, shoot the image under the visible light so that acquire strain field information by camera equipment.
According to the device, the micro-spectrum separator acquires micro-scale information of a measuring area of a test object through the micro-lens, the dichroic mirror can separate spectra to realize separation of visible light and infrared light, the infrared shooting equipment captures an image under the infrared light so as to acquire temperature field information later, the camera equipment acquires an image under the visible light so as to acquire strain field information later, and simultaneous measurement of a temperature field and a strain field of the micro-scale area is realized; meanwhile, the accuracy of strain field information and temperature field information can be effectively ensured by separating the spectrum.
According to the measuring device suitable for integrating the micro-scale area strain field and the temperature field, the first shell is connected with the infrared shooting equipment, so that infrared light is effectively guaranteed to enter the infrared shooting equipment; the first shell is connected with the camera device through the second shell, so that visible light can enter the camera device, the light source is arranged on one side of the second shell, and the light splitting piece is arranged in the second shell to ensure that the light source provides illumination for the camera device.
According to the measuring device suitable for integration of the micro-scale area strain field and the temperature field, the infrared cut-off filter is arranged between the second shell and the light source, so that the infrared spectrum of the light source is filtered, and the error of an infrared light path on shooting of shooting is avoided;
the infrared cut-off filter is supported by the second shell;
the light splitting piece and the light source are coaxially arranged to provide infrared light removal coaxial illumination for the visible light path.
The measuring device suitable for integrating the micro-scale area strain field and the temperature field is characterized in that the microscope lens is vertically oriented to the test object measuring area.
The measurement device suitable for integration of the micro-scale area strain field and the temperature field as described above, wherein the dichroic mirror is arranged at a set angle with the microscope lens such that the incident light is 45 ° to the dichroic mirror.
The measuring device suitable for integrating the micro-scale area strain field and the temperature field is characterized in that the first shell is connected with the infrared shooting equipment through a first pipeline, so that the infrared shooting equipment and the camera shooting equipment can be conveniently installed;
the second shell is connected with the camera equipment through a second pipeline.
The measuring device suitable for integration of the micro-scale area strain field and the temperature field is characterized in that the dichroic mirror is arranged in parallel with the light splitting sheet, so that coaxial illumination of a visible light path is guaranteed.
According to the measuring device suitable for integration of the micro-scale regional strain field and the temperature field, the infrared shooting equipment and the camera equipment are respectively connected with the computer, and the infrared shooting equipment and the camera equipment are respectively connected with the synchronous trigger, so that synchronous acquisition of temperature field information and deformation field information is further realized.
The measuring device suitable for integration of the micro-scale area strain field and the temperature field is characterized in that the micro-spectrum separator, the infrared shooting device and the camera device are respectively supported by a support;
the bracket for supporting the micro-spectrum separator is provided with a rotatable platform for respectively supporting the dichroic mirror and the light splitting sheet, and the first shell and the second shell respectively cover the corresponding rotatable platforms.
In a second aspect, the present invention further provides a working method of a measurement device suitable for integration of a micro-scale region strain field and a temperature field, including the following steps:
preprocessing a test object to make speckles;
clamping a test object at a test platform;
a micro-spectrum separator is arranged in the vertical direction measurement area and is respectively connected with the infrared shooting equipment and the camera shooting equipment;
and performing a force-heat loading test on the test object, shooting an image under infrared light by using infrared shooting equipment so as to acquire temperature field information, and shooting an image under visible light by using camera equipment so as to acquire strain field information.
It should be explained that the force and heat loading test is a general term, and refers to the force loading and/or heat loading (heating the test object) to the test object, and heat is generated during part of the force loading process.
The beneficial effects of the invention are as follows:
1) the invention overcomes the defects and shortcomings that the existing measuring equipment can only measure the deformation field and the temperature field on a macroscopic and large scale without unmatched problems by the arrangement of an integral structure, can realize synchronous measurement of the deformation field and the temperature field in a micro-scale region, realizes simultaneous testing of multiple physical fields such as strain, strain rate, temperature and the like of a material dynamic deformation micro-scale region, has important significance for understanding a material dynamic deformation mechanism, and can help researchers to research material dynamics and thermodynamic behaviors more comprehensively under high space-time resolution.
2) The whole device has simple structure and convenient operation, and can simultaneously measure the deformation field and the temperature field change in the deformation process of the material micro-area by using a single microscope lens; the spectrums are effectively separated, and the simplicity of the spectrums entering the infrared shooting equipment and the camera equipment is ensured; and the high precision of the measured temperature and strain is further ensured by capturing the specific spectrum.
3) According to the invention, the arrangement of the microscope lens, the dichroic mirror and the light splitting sheet is facilitated through the arrangement of the first shell and the second shell; through the setting of light source and beam splitter, can provide even illumination to camera equipment, the setting of cooperation infrared cut-off filter again can avoid the infrared light to camera equipment to acquire the influence of image.
4) According to the invention, through the connection of the infrared shooting equipment and the camera equipment with the computer, the deformation field and the temperature field can be obtained by the computer, and the deformation field and the temperature field can be directly displayed through the computer, so that subsequent force and thermal analysis is facilitated; through the setting of the synchronizer, the infrared shooting equipment and the camera equipment can be synchronously triggered, and the synchronous acquisition of the temperature field information and the deformation field is realized.
5) The whole device of the invention has wide application range, and can be applied to material deformation tests, such as: a tensile compression testing machine, a Hopkinson pressure bar testing machine and the like; it can also be applied to actual processing tests, such as: turning, milling, grinding, etc.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, are included to provide a further understanding of the invention, and are included to illustrate an exemplary embodiment of the invention and not to limit the invention.
Fig. 1 is a schematic diagram of a measurement device suitable for integration of a micro-scale zone strain field with a temperature field according to one or more embodiments of the present invention.
FIG. 2 is a side view of a measurement device suitable for integration of a micro-scale region strain field with a temperature field in accordance with one or more embodiments of the present invention.
Fig. 3 is a schematic diagram of a long-wave pass dichroic mirror in a measurement device suitable for integration of a micro-scale area strain field with a temperature field according to one or more embodiments of the present invention.
FIG. 4 is a schematic optical path diagram of a micro-spectral splitter in a measurement device suitable for integration of a micro-scale region strain field with a temperature field according to one or more embodiments of the invention.
In the figure: the spacing or dimensions between each other are exaggerated to show the location of the various parts, and the schematic is shown only schematically.
Wherein: 1. a light splitting sheet; 2, LED cold light source; 3. a micro-lens; 4. a lens mounting port; 5. a long-wave pass dichroic mirror; 6. a microspectroscopic separator; 7. a first housing mounting port; 8. a high-speed infrared camera; 9. a computer; 10. a high-speed camera; 11. a second housing mounting port; 12. an infrared cut filter; 13. a microspectroscopic separator support; 14. a camera support; 15. a synchronization trigger.
Detailed Description
It is to be understood that the following detailed description is exemplary and is intended to provide further explanation of the invention as claimed. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the invention. As used herein, the singular forms "a", "an", and/or "the" are intended to include the plural forms as well, unless the invention expressly state otherwise, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof;
as described in the background art, the problem that the micro-scale deformation and temperature cannot be synchronously measured exists in the prior art, and in order to solve the technical problem, the invention provides a measuring device suitable for integrating a strain field and a temperature field in a micro-scale region.
Example one
In a typical embodiment of the present invention, referring to fig. 1 and 4, a measurement apparatus suitable for integration of a micro-scale area strain field and a temperature field includes a micro-spectrum separator 6 capable of achieving spectral separation, where the micro-spectrum separator 6 is connected to an infrared shooting device and an image capturing device, respectively, to achieve acquisition of image information at each spectral band.
Referring to fig. 3, the microspectrum separator includes a first housing, a dichroic mirror is disposed in the first housing to separate spectra, the first housing is connected with a microscope lens, an infrared shooting device and a camera device respectively, the infrared shooting device and the camera device are disposed perpendicularly to each other, the microscope lens is perpendicularly oriented to a measurement area of a test object, incident light enters from the microscope lens, the infrared shooting device shoots an image under infrared light so as to acquire temperature field information, and the camera device shoots an image under visible light so as to acquire strain field information.
Further, it is easily understood that the infrared photographing device is embodied as a high-speed infrared camera 8, and the photographing device is embodied as a high-speed video camera 10, and both the high-speed infrared camera and the high-speed video camera are prior art.
The number of high speed cameras 10 may be one, with a maximum number of frames per second being one million frames in some examples. Different frame rates can be selected for shooting according to actual use scenes.
Wherein the dichroic mirror is a long-wave-pass dichroic mirror 5.
Furthermore, the number of the long-wave-pass dichroic mirrors is 1, the long-wave-pass dichroic mirrors are of a parallel flat plate type, and the long-wave-pass dichroic mirrors and the micro-lens are arranged in the micro-spectrum separator at an angle of 45 degrees, so that the incident angle of the micro-spectrum separator is 45 degrees. The long-wave-pass dichroic mirror is used for dividing a light beam incident from the microscope lens into two parts according to different wavelengths, wherein the light beam directly transmitting through the long-wave-pass dichroic mirror is infrared light (the wavelength is 2-6 mu m) and is captured by a high-speed infrared camera; the reflected light is visible light (wavelength between 0.4 μm and 0.78 μm) and will be captured by a high speed camera. The long-wave pass dichroic mirror is capable of responding to infrared radiation in the range of 2 μm to 6 μm (corresponding to the measurement of temperatures of 60 ℃ to 1500 ℃).
The micro lens 3 in the micro spectrum separator is matched with the long-wavelength-pass dichroic mirror 5 to realize the separation of the infrared spectrum and the visible spectrum of the micro-scale measurement area, and the separated visible light and infrared light are respectively transmitted to the sensing elements of the high-speed video camera and the high-speed infrared camera.
It can be understood that the high-speed video camera 10 and the high-speed infrared camera 8 are respectively connected with the computer 9 through data lines, images of the whole process synchronously shot by the high-speed video camera and the high-speed infrared camera are transmitted into the computer through the data lines, the computer selects images at a certain moment according to requirements to analyze, and performs deformation field analysis by using a digital image correlation algorithm to obtain images of the distribution of the strain field and the strain rate field; meanwhile, the computer can obtain a temperature field image through infrared analysis software.
In this example, the number of microspectroscopic separators is one.
Specifically, the number of the micro lenses is 1, the micro lenses achieve the purpose of amplifying the image of the area of the detected sample, the magnification of the lenses can be reasonably selected according to the size of the measurement area, clear shooting from the micro-scale area is achieved, clear speckle images can be shot conveniently, and the requirement of DIC analysis processing is met.
Further, the first housing is connected with the image pickup apparatus through the second housing, and a light source is disposed on one side of the second housing, and the light source is disposed on a side portion of the second housing, so that the beam splitter 1 is disposed in the second housing to provide illumination for the image pickup apparatus.
In the embodiment, the light splitting sheets 1 and the long-wave-pass dichroic mirror 5 are arranged in parallel, the number of the light splitting sheets 1 is 1, the light splitting sheets split input light beams according to the ratio of reflection to transmission of 1:1, and the light splitting sheets and light sources such as an LED cold light source 2 and an infrared cut-off filter 12 provide infrared light removal coaxial illumination for a visible light path of the micro-spectrum separator.
The light source can be supported by the second shell, the light source and the light splitting piece are coaxially arranged, the view field of the high-speed camera is brighter and more uniform, and meanwhile, the infrared cut-off filter is used for filtering the infrared spectrum of the LED light source, so that errors of an infrared light path are avoided.
The infrared cut filter is a conventional technique.
Specifically, the infrared cut-off filter 12 is supported by the second housing, a bump is arranged on one side of the second housing facing the light source, an opening communicated with the inside of the second housing is arranged at the bump, a bayonet is arranged in the opening, and the infrared cut-off filter enters the opening and is clamped into the bayonet; in addition, the second case projection is connected to a connection tube, and a light source is disposed at one end of the connection tube, and light emitted from the light source faces the infrared cut-off filter 12.
In addition, a synchronous trigger 15 is further provided in the embodiment, and is connected with the high-speed video camera 10 and the high-speed infrared camera 8 through data lines, and can be triggered manually through a trigger switch during testing, or can be triggered through an external signal source of the testing device, so that synchronous measurement of the temperature field and the strain field is realized.
In performing the measurement, referring to fig. 2, the microspectrum separator is mounted on a microspectrum separator holder 13, the high-speed video camera and the high-speed infrared camera are mounted on a camera holder 14, and the microlens 3 is mounted at the lens mounting port 4 of the first housing in the microspectrum separator.
One side of the first shell, which is far away from the lens mounting port 4, is spliced with a first pipeline, one end of the first pipeline forms a first shell mounting port 7, the other side of the second shell, which is far away from the first shell and is connected with the first shell, is provided with a second pipeline, the second pipeline is inserted into the second shell, and one end of the second pipeline is also provided with a second shell mounting port 11. It is understood that the first pipeline and the first shell and the second pipeline and the second shell are connected through a thread structure.
Furthermore, the camera of the high-speed camera 10 is clamped into the second shell mounting port 11, and the camera of the high-speed infrared camera 8 is clamped into the first shell mounting port 7, so that the micro-spectrum separator is respectively connected with the infrared shooting equipment and the camera shooting equipment, and the accuracy of the test result is ensured.
The light splitting piece 1 and the long-wave-pass dichroic mirror 5 are respectively installed on a rotatable platform of the micro-spectrum separator 6, the rotatable platform is provided with two positions for respectively supporting the light splitting piece and the long-wave-pass dichroic mirror 5, the long-wave-pass dichroic mirror 5 and the outer plane of the microscope lens are conveniently installed at 45 degrees through the rotatable platform, and the light splitting piece and the long-wave-pass dichroic mirror are installed in parallel. Wherein, rotatable platform is connected with rotary power source, and rotary power source specifically can be driving motor to drive rotary platform's rotation.
Furthermore, openings are formed in one sides of the first shell and the second shell, the rotatable platform is arranged at the openings, so that the first shell and the second shell are prevented from interfering the rotation of the rotatable platform, and the first shell and the second shell are supported by the micro-spectrum separator bracket 13; the microspectrum separator bracket 13 may be provided at one or more positions, one microspectrum separator bracket 13 supports the first housing and the second housing simultaneously, and a plurality of microspectrum separator brackets 13 support the first housing and the second housing respectively.
The infrared camera needs to be temperature calibrated before the measurement is made to ensure that it accurately measures temperature in the micro-scale region. During measurement, the high-speed camera and the high-speed infrared camera are connected to a computer through data lines, and the two cameras are triggered simultaneously through the synchronous trigger, so that the two cameras can synchronously shoot two groups of images at the same time and the same position on a microscale. After shooting is finished, analyzing a deformation field by using a digital image correlation algorithm to obtain an image of distribution of a strain field and a strain rate field; in addition, the computer can also obtain a temperature field image through infrared analysis software. It should be construed that the infrared analysis software is an existing infrared analysis software.
The device provided by the embodiment can shoot the transient evolution conditions of the deformation field and the temperature field of the material under the microsecond resolution based on the high-speed camera and the high-speed infrared camera, and helps researchers measure more microscopic detailed information of the deformation and the temperature change of the material.
Example two
The embodiment provides a working method of a measuring device suitable for integration of a micro-scale area strain field and a temperature field, which comprises the following steps:
preprocessing a test object to manufacture speckles, wherein the resolution and randomness of speckle patterns directly influence the measurement result of a deformation field; clamping a test object at a test platform; a micro-spectrum separator is arranged in the vertical direction measurement area and is respectively connected with the infrared shooting equipment and the camera shooting equipment; and performing a force-heat loading test on the test object, wherein an infrared shooting device realizes an image under infrared light so as to acquire temperature field information, and an image under visible light is shot by a camera device so as to acquire strain field information.
For example, the strain field and the temperature field are measured in the right-angle cutting process of the aluminum alloy on a high-speed dry-cutting right-angle cutting test platform.
Firstly, polishing an aluminum alloy workpiece (test object) and then carrying out sand blasting treatment to manufacture speckles; then, clamping the workpiece on a test platform clamp; and then calibrating the temperature of the infrared camera.
Referring to fig. 1, firstly, a microspectrum separator is installed, then a microscope lens is installed, speckle patterns are ensured to be in the field range of the microscope lens, and a high-speed video camera and a high-speed infrared camera are connected with the microspectrum separator. The data lines of the two cameras are respectively connected with the computer and the synchronous trigger, and the debugging equipment enables shot images to be clearly displayed on the computer.
After the preparation work is finished, a dry cutting test is carried out on a high-speed dry cutting right-angle cutting test platform, the cutting speed is set to be 100m/min, and the cutting depth is 0.1 mm. The synchronous trigger is used for simultaneously triggering the two cameras, so that the two cameras can synchronously shoot two groups of images at the same time and at the same position in the micro-scale during cutting. Images obtained by synchronous measurement of the two cameras simultaneously appear on a computer, and the obtained measurement data is analyzed by using related software and algorithms to obtain a temperature field and a deformation field in the cutting process; meanwhile, the temperature field image obtained by the high-speed infrared camera can be obtained through computer infrared analysis software.
Tests prove that the strain measurement range is 0.01-1000%, and the temperature measurement range is 60-1500 ℃.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. Measuring device suitable for regional strain field of microscale and temperature field are integrated, a serial communication port, including the microspectrum separator, the microspectrum separator includes first casing, set up the dichroic mirror in order to separate the spectrum in the first casing, first casing is connected with the microscope head, the lateral part of first casing still is provided with infrared shooting equipment and camera equipment, infrared shooting equipment and camera equipment set up perpendicularly mutually, the microscope head is perpendicular towards test object measuring area, the incident light gets into from the microscope head, shoot the image under the infrared light so that acquire temperature field information by infrared shooting equipment, shoot the image under the visible light so that acquire strain field information by camera equipment.
2. The measurement device suitable for integration of the micro-scale regional strain field and the temperature field as claimed in claim 1, wherein the first housing is connected with the infrared shooting device;
the first shell is connected with the camera equipment through the second shell, a light source is arranged on one side of the second shell, and the light splitting piece is arranged in the second shell to ensure that the light source provides illumination for the camera equipment.
3. The measurement device suitable for integration of micro-scale regional strain field and temperature field of claim 2, wherein an infrared cut filter is disposed between the second housing and the light source;
the infrared cut-off filter is supported by the second shell;
the light splitting piece and the light source are coaxially arranged.
4. The measurement device suitable for integration of micro-scale regional strain field with temperature field of claim 1, wherein the microscope lens is vertically oriented to the test object measurement region.
5. The measurement device according to claim 1, wherein the dichroic mirror is arranged at a set angle to the microscope lens such that the incident light is 45 ° to the dichroic mirror.
6. The measurement device suitable for integration of the micro-scale regional strain field and the temperature field as claimed in claim 2, wherein the first housing is connected with the infrared shooting equipment through a first pipeline;
the second shell is connected with the camera shooting device through a second pipeline.
7. The apparatus according to claim 2, wherein the dichroic mirror and the light splitting plate are disposed in parallel.
8. The device for measuring the integration of the micro-scale regional strain field and the temperature field as claimed in claim 1, wherein the infrared shooting device and the camera device are respectively connected with a computer, and the infrared shooting device and the camera device are respectively connected with a synchronous trigger.
9. The measurement device suitable for integration of a micro-scale regional strain field and a temperature field of claim 1, wherein the micro-spectrum separator, the infrared shooting device and the camera device are respectively supported by a support;
the bracket for supporting the micro-spectrum separator is provided with a rotatable platform for respectively supporting the dichroic mirror and the light splitting sheet.
10. The working method of the measurement device suitable for integration of the micro-scale area strain field and the temperature field according to any one of claims 1 to 9, comprising the following steps:
preprocessing a test object to make speckles;
clamping a test object at a test platform;
a micro-spectrum separator is vertically arranged towards the test object and is respectively connected with the infrared shooting equipment and the camera shooting equipment;
and performing a force-heat loading test on the test object, shooting an image under infrared light by using infrared shooting equipment so as to acquire temperature field information, and shooting an image under visible light by using camera equipment so as to acquire strain field information.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114964374A (en) * | 2022-05-30 | 2022-08-30 | 中国航空发动机研究院 | Non-contact strain field and temperature field synchronous testing system and testing method thereof |
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