CN114066889B

CN114066889B - Imaging quality detection method and device of OCT (optical coherence tomography) host

Info

Publication number: CN114066889B
Application number: CN202210029325.7A
Authority: CN
Inventors: 苏展民; 耿科; 李百灵; 高峻
Original assignee: Guangzhou Winstar Medical Technology Co ltd
Current assignee: Shenzhen Aositian Medical Technology Co ltd
Priority date: 2022-01-12
Filing date: 2022-01-12
Publication date: 2022-04-29
Anticipated expiration: 2042-01-12
Also published as: WO2023134047A1; CN114066889A

Abstract

The embodiment of the invention relates to an imaging quality detection method and device of an OCT (optical coherence tomography) host, which are used for preprocessing a standard sample image to be detected to obtain a preprocessed image, further detecting whether the preprocessed image is a deformed image or not, and performing deformation detection on the standard sample image to be detected, thereby realizing the qualified installation detection of an OCT imaging device; whether the transverse resolution and the longitudinal resolution of the current OCT host are qualified or not can be known according to the transverse resolution score and the longitudinal resolution score, the transverse resolution and the longitudinal resolution can be respectively detected, the operation is simple and convenient, the implementation is easy, the score calculation is carried out on the basis of the pixel value distribution curve generated by the selected acquisition line, and the measurement is more accurate; artifact detection is realized by acquiring an artifact image; the embodiment integrates the detection of image deformation, resolution and artifacts of the OCT tool, and can better ensure the imaging quality of the OCT main machine.

Description

Imaging quality detection method and device of OCT (optical coherence tomography) host

Technical Field

The invention relates to the technical field of medical instruments, in particular to a method and a device for detecting imaging quality of an OCT (optical coherence tomography) host machine.

Background

Currently, Optical interference Tomography (OCT) is based on the principle of interference of weak coherent light, and can perform three-dimensional tomographic imaging on biological tissues by detecting back-reflected or scattered signals of weak coherent light emitted by different tissues to a probe. The resolution, image deformation and image artifact interference of the OCT device are one of the key parameters of the imaging quality, and directly affect the imaging quality of the OCT device pair and the diagnosis result of the lesion.

The resolution of the OCT apparatus reflects the ability of the OCT apparatus to resolve the fine structure of the tissue, and the higher the resolution, the clearer the fine structure of the medical tissue is observed. The image deformation is the change of the size and shape of the image formed by the OCT equipment and the real detection tissue, and the size and shape of the tissue are important indexes of medical tissue analysis and reflect the severity of the tissue lesion. Image artifacts are artifacts that occur in imaging but for objects that are not present, and severe artifacts can obscure the true image and interfere with medical judgment. The three imaging indexes have great influence on the application effect of the OCT, so the indexes need to be detected before equipment leaves a factory, and the equipment leaves the factory to meet the use standard.

Disclosure of Invention

Aiming at the defects, the embodiment of the invention discloses an imaging quality detection method and device of an OCT host, which can be used for quickly detecting the image quality problem easily generated during imaging of the OCT host so as to improve the final image imaging quality.

The first aspect of the embodiment of the invention discloses an imaging quality detection method of an OCT host, which comprises the following steps:

acquiring a detection standard sample image by using an OCT image deformation detection device, and preprocessing the detection standard sample image to obtain a preprocessed image; wherein the OCT image deformation detection device comprises an OCT scanning probe, a support and a detection standard sample;

acquiring the boundary of the preprocessed image, and detecting whether the preprocessed image is a deformed image according to the boundary;

and respectively generating a transverse resolution inspection image and a longitudinal resolution inspection image, wherein the transverse resolution inspection image is acquired by the OCT host, the OCT scanning probe and the first inspection component, and the longitudinal resolution inspection image is acquired by the OCT host, the OCT scanning probe and the second inspection component. The first inspection assembly comprises a first standard thickness plate, a resolution ratio plate and a white diffuse reflection piece, wherein the first standard thickness plate, the resolution ratio plate and the white diffuse reflection piece are sequentially stacked from top to bottom. The second inspection assembly comprises a second standard thickness plate, a third standard thickness plate and a fourth standard thickness plate, the second standard thickness plate, the third standard thickness plate and the fourth standard thickness plate are sequentially stacked from top to bottom, the OCT host is connected with the OCT scanning probe, and the OCT scanning probe is used for collecting the section image of the resolution plate and collecting the reflection image formed by the reflection of the third standard thickness plate;

selecting at least one first acquisition line on the transverse resolution inspection image based on a first acquisition rule, and selecting at least one second acquisition line on the longitudinal resolution inspection image based on a second acquisition rule;

respectively selecting a first acquisition line and a second acquisition line to generate a first pixel value distribution curve of the first acquisition line and a second pixel value distribution curve of the second acquisition line;

calculating a lateral resolution score according to the first pixel value distribution curve, and calculating a longitudinal resolution score according to the second pixel value distribution curve;

acquiring an OCT artifact image, acquiring image pixel values of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel values to obtain the pixel values and the number of the artifacts; and judging whether the pixel values and the quantity of the artifacts meet preset detection standards.

As an alternative implementation manner, in the first aspect of the embodiments of the present invention, the inspection standard has an inner hole with a preset shape, the preset shape includes a triangle, a quadrangle, a pentagon, and a hexagon, and the light outlet end of the OCT scanning probe is fixed in the middle of the inner hole of the inspection standard through the support.

As an optional implementation manner, in the first aspect of the embodiment of the present invention, detecting whether the preprocessed image is a deformed image according to the boundary includes:

displaying a pre-stored standard comparison image, wherein a comparison closed loop is formed on the standard comparison image;

and comparing whether the inspection standard sample image is in the range of the preset tolerance region formed by the comparison closed loop, and defining the inspection standard sample image as a non-deformation image when the inspection standard sample image is in the range of the preset tolerance region formed by the comparison closed loop.

As an optional implementation manner, in the first aspect of the embodiments of the present invention, the comparison closed loop includes a first comparison closed loop and a second comparison closed loop, and the second comparison closed loop is located in the first comparison closed loop; correspondingly, the comparing whether the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop or not, and when the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop, defining the inspection standard sample image as a non-deformation image, includes:

and comparing whether the inspection standard sample image is in a preset tolerance area range formed by the first comparison closed loop and the second comparison closed loop, and defining the inspection standard sample image as a non-deformation image when the inspection standard sample image is in the preset tolerance area range formed by the first comparison closed loop and the second comparison closed loop.

As an optional implementation manner, in the first aspect of the embodiment of the present invention, the acquiring an image pixel value of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel value to obtain a pixel value and a number of artifacts includes:

selecting an acquisition line in the OCT artifact image, wherein the acquisition line is a line segment formed between a central point and a point on a boundary in the OCT artifact image to obtain an image pixel value of the OCT artifact image;

carrying out data processing on the image pixel values to obtain the pixel values and the number of artifacts, and acquiring a relation curve between the pixel coordinates and the pixel values of the acquisition lines;

correspondingly, the determining whether the pixel values and the number of the artifacts satisfy preset detection criteria includes:

rotating the acquisition lines by a preset rotation angle with the central point as a circle center to obtain a relation curve between pixel coordinates and pixel values of a plurality of acquisition lines;

and judging whether the relation curve meets a preset detection standard or not.

As an alternative implementation manner, in the first aspect of the embodiment of the present invention, the first acquisition rule is to select a transverse line perpendicular to the resolution board with a first set length on the transverse resolution inspection image, and the second acquisition rule is to select a transverse line perpendicular to the third standard thickness board with a second set length on the longitudinal resolution inspection image;

correspondingly, the selecting at least one first acquisition line on the transverse resolution inspection image based on the first acquisition rule includes:

generating a first contrast line pattern as a first acquisition line on the transverse resolution inspection image, the first contrast line pattern being equal to a first set length and perpendicular to a cross-sectional pattern of a resolution board;

correspondingly, the selecting at least one second acquisition line on the longitudinal resolution inspection image based on the second acquisition rule includes:

and generating a second contrast line pattern of a reflection image which is equal to a second set length and is vertical to a third standard thickness plate on the longitudinal resolution inspection image as a second acquisition line.

As an alternative implementation, in the first aspect of the embodiment of the present invention, the calculating a lateral resolution score according to the first pixel value distribution curve includes:

performing Fourier transform on the first pixel value distribution curve to obtain a frequency distribution graph;

obtaining the peak intensity of the spatial frequency corresponding to the section pattern of the resolution plate from the frequency distribution map as a transverse resolution score;

said calculating a longitudinal resolution score from said second pixel value distribution curve, comprising:

acquiring a peak value of a first peak and a peak value of a second peak in the second pixel value distribution curve, and acquiring a value of a peak valley between the first peak and the second peak;

the longitudinal resolution Score is calculated according to the formula Score = sqrt ((peak1-valley) (peak2-valley))/valley, where Score is the longitudinal resolution Score, peak1 is the peak of the first peak, peak2 is the peak of the second peak, and valley is the value of the peak-valley.

The second aspect of the embodiment of the present invention discloses an imaging quality detection apparatus for an OCT host, including:

a first image acquisition module: the OCT image deformation detection device is used for acquiring a detection standard sample image, and the detection standard sample image is preprocessed to obtain a preprocessed image; wherein the OCT image deformation detection device comprises an OCT scanning probe, a support and a detection standard sample;

an image deformation detection module: the boundary detection module is used for acquiring the boundary of the preprocessed image and detecting whether the preprocessed image is a deformed image or not according to the boundary;

a second image acquisition module: the system is used for respectively generating a transverse resolution inspection image and a longitudinal resolution inspection image, wherein the transverse resolution inspection image is acquired through the OCT host machine, the OCT scanning probe and the first inspection component, and the longitudinal resolution inspection image is acquired through the OCT host machine, the OCT scanning probe and the second inspection component. The first inspection assembly comprises a first standard thickness plate, a resolution ratio plate and a white diffuse reflection piece, wherein the first standard thickness plate, the resolution ratio plate and the white diffuse reflection piece are sequentially stacked from top to bottom. The second inspection assembly comprises a second standard thickness plate, a third standard thickness plate and a fourth standard thickness plate, the second standard thickness plate, the third standard thickness plate and the fourth standard thickness plate are sequentially stacked from top to bottom, the OCT host is connected with the OCT scanning probe, and the OCT scanning probe is used for collecting the section image of the resolution plate and collecting the reflection image formed by the reflection of the third standard thickness plate;

acquisition area selects module: the device is used for selecting at least one first acquisition line on the transverse resolution inspection image based on a first acquisition rule and selecting at least one second acquisition line on the longitudinal resolution inspection image based on a second acquisition rule;

a resolution scoring module: the device comprises a first acquisition line, a second acquisition line, a first pixel value distribution curve and a second pixel value distribution curve, wherein the first acquisition line and the second acquisition line are respectively selected to generate a first pixel value distribution curve of the first acquisition line and a second pixel value distribution curve of the second acquisition line; calculating a lateral resolution score according to the first pixel value distribution curve, and calculating a longitudinal resolution score according to the second pixel value distribution curve;

an artifact acquisition module: the OCT image acquisition system is used for acquiring an OCT artifact image, acquiring image pixel values of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel values to obtain the pixel values and the quantity of artifacts; and judging whether the pixel values and the quantity of the artifacts meet preset detection standards.

As an alternative implementation manner, in the second aspect of the embodiment of the present invention, the inspection standard has an inner hole with a preset shape, the preset shape includes a triangle, a quadrangle, a pentagon, and a hexagon, and the light outlet end of the OCT scanning probe is fixed in the middle of the inner hole of the inspection standard through the support.

As an alternative implementation, in the second aspect of the embodiment of the present invention, detecting whether the preprocessed image is a deformed image according to the boundary includes:

As an optional implementation manner, in the second aspect of the embodiment of the present invention, the comparison closed loop includes a first comparison closed loop and a second comparison closed loop, and the second comparison closed loop is located in the first comparison closed loop; correspondingly, the comparing whether the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop or not, and when the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop, defining the inspection standard sample image as a non-deformation image, includes:

As an optional implementation manner, in the second aspect of the embodiment of the present invention, the acquiring an image pixel value of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel value to obtain a pixel value and a number of artifacts includes:

As an alternative implementation manner, in the second aspect of the embodiment of the present invention, the first acquisition rule is to select a transverse line perpendicular to the resolution board with a first set length on the transverse resolution inspection image, and the second acquisition rule is to select a transverse line perpendicular to the third standard thickness board with a second set length on the longitudinal resolution inspection image;

As an alternative implementation, in the second aspect of the embodiment of the present invention, the calculating a lateral resolution score according to the first pixel value distribution curve includes:

The third aspect of the embodiment of the present invention discloses an imaging quality detection apparatus for an OCT host, including: a memory storing executable program code; a processor coupled with the memory; the processor calls the executable program code stored in the memory for executing the imaging quality detection method of the OCT host disclosed in the first aspect of the embodiments of the present invention.

A fourth aspect of the embodiments of the present invention discloses a computer-readable storage medium storing a computer program, where the computer program enables a computer to execute the imaging quality detection method for an OCT host disclosed in the first aspect of the embodiments of the present invention.

Compared with the prior art, the embodiment of the invention has the following beneficial effects:

in the embodiment of the invention, the OCT equipment respectively collects the inspection standard sample image, the transverse resolution detection image, the longitudinal resolution detection image and the OCT artifact image, wherein the inspection standard sample image is preprocessed to obtain a preprocessed image, the preprocessing process can help filter noise points and the like in a target image, whether the preprocessed image is a deformed image or not is further detected according to the boundary of the preprocessed image, and the inspection standard sample image deformation detection aiming at the standard sample collected by the OCT equipment is realized, so that the qualified inspection of the installation of the OCT equipment is realized; the transverse resolution score and the longitudinal resolution score are used for evaluating indexes of transverse resolution and longitudinal resolution, whether the transverse resolution and the longitudinal resolution of the current OCT host are qualified or not can be known according to the transverse resolution score and the longitudinal resolution score, the transverse resolution and the longitudinal resolution can be detected respectively, the operation is simple and convenient, the implementation is easy, the score calculation is performed on the basis of the pixel value distribution curve generated by the selected acquisition line, and the measurement is more accurate; the method comprises the steps of acquiring an OCT artifact image to realize artifact detection; the embodiment integrates the detection of image deformation, resolution and artifacts of the OCT tool, and can better ensure the imaging quality of the OCT main machine.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without creative efforts.

Fig. 1 is a schematic flowchart of an imaging quality detection method of an OCT host according to an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of an OCT image deformation detection apparatus according to an embodiment of the invention;

FIG. 3 is a schematic diagram of an installation configuration for generating a lateral resolution inspection image according to an embodiment of the present invention;

FIG. 4 is a schematic diagram of a configuration for generating a longitudinal resolution inspection image according to an embodiment of the present invention;

FIG. 5 is a schematic diagram of the structure of an OCT artifact image generated by an embodiment of the invention;

FIG. 6 is an exemplary diagram of a verification sample image in accordance with an embodiment of the present invention;

fig. 7 is a schematic structural diagram of an imaging quality detection apparatus of an OCT host according to an embodiment of the present invention;

fig. 8 is a schematic structural diagram of an imaging quality detection apparatus of an OCT host according to an embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It should be noted that the terms "first", "second", "third", "fourth", and the like in the description and the claims of the present invention are used for distinguishing different objects, and are not used for describing a specific order. The terms "comprises," "comprising," and any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

The embodiment of the invention discloses an imaging quality detection method, a device, equipment and a storage medium of an OCT (optical coherence tomography) host, wherein a target image, a transverse resolution detection image, a longitudinal resolution detection image and a pseudo image are respectively collected through corresponding OCT tools, the target image is preprocessed to obtain a preprocessed image, the preprocessing process can help to filter noise points and the like in the target image, whether the preprocessed image is a deformed image or not is further detected according to the boundary of the preprocessed image, and the deformation detection of the target image of a standard sample collected by the OCT imaging equipment is realized in the embodiment, so that the condition that an installation operator of the OCT imaging equipment is qualified is realized; the transverse resolution score and the longitudinal resolution score are used for evaluating indexes of transverse resolution and longitudinal resolution, whether the transverse resolution and the longitudinal resolution of the current OCT host are qualified or not can be known according to the transverse resolution score and the longitudinal resolution score, the transverse resolution and the longitudinal resolution can be detected respectively, the operation is simple and convenient, the implementation is easy, the score calculation is performed on the basis of the pixel value distribution curve generated by the selected acquisition line, and the measurement is more accurate; artifact detection is realized by acquiring an artifact image; the embodiment integrates the detection of image deformation, resolution and artifacts of the OCT tool, and can better ensure the imaging quality of the OCT main machine.

The following are detailed below.

Example one

Referring to fig. 1, fig. 1 is a schematic flowchart of an imaging quality detection method of an OCT host according to an embodiment of the present invention. The execution main body of the method described in the embodiment of the present invention is an execution main body composed of software or/and hardware, and the execution main body can receive related information in a wired or/and wireless manner and can send a certain instruction. Of course, it may also have certain processing and storage functions. The execution body may control a plurality of devices, such as a remote physical server or a cloud server and related software, or may be a local host or a server and related software for performing related operations on a device installed somewhere. In some scenarios, multiple storage devices may also be controlled, which may be co-located with the device or located in a different location.

Step 101: and acquiring a test standard sample image by using an OCT image deformation detection device, and preprocessing the test standard sample image to obtain a preprocessed image.

In an embodiment, the method is applied to an OCT image deformation detection device, and the OCT image deformation detection device comprises an OCT scanning probe, a support and an inspection standard sample. Specifically, referring to fig. 2, the OCT imaging apparatus includes an OCT scanning probe 201, a ring 202, and a support 203, where the ring 202 is installed at a position corresponding to a middle portion of the OCT scanning probe 201 to bend the middle portion of the OCT scanning probe 201, an optical exit end of the OCT scanning probe 201 is installed on the support 203, and a set distance is provided between the support 203 and a test standard 204, and the set distance is in a range of 10-15 mm. The diameter of the circular ring is 50mm, the circular ring is used for bending the middle part of the probe, and the OCT image is deformed when the probe is simulated to be used in actual use and possibly existing bending conditions. In addition to the above structure, an OCT host is usually included, and the OCT scanning probe 201 performs image acquisition on the standard sample. The target image is the image collected for the test standard. The inspection standard sample 204 has an inner hole with a preset shape, the preset shape includes a triangle, a quadrangle, a pentagon, a hexagon, and possibly other shapes, and the light outlet end of the OCT scanning probe is fixed in the middle of the inner hole of the inspection standard sample through the supporting member. The inner bore of the inspection standard OCT scanning probe 201 is generally circular. Thus, referring to fig. 6, the pattern shown in fig. 6 is a quadrilateral shaded area that is the inspection standard image of the acquired standard, and a circular area in the inspection standard image represents the inner bore of the OCT scanning probe. In the embodiment, the collection of the inspection standard sample image and the subsequent processing are performed to detect whether the target image is deformed, that is, whether the size, shape and relative position of the target image to be detected are changed. When acquiring images, the inspection standard sample is also acquired by using a fiber scanning probe with different outer diameters, for example, a fiber scanning probe with an outer diameter of 1.7mm or a fiber scanning probe with an outer diameter of 2.5 mm. The light scanning probe scans the inspection standard sample, and an image of the inspection standard sample is acquired and then can be displayed on the OCT host. Before the optical fiber scanning probe is used for collecting a target image, the optical fiber scanning probe with a set specification is installed, and a PL value is adjusted to enable a normal image to be presented on an OCT host. When the optical fiber scanning probe is installed, the light outlet end of the OCT scanning probe is inserted into the detection standard sample so as to acquire images of the detection standard sample. In order to ensure the acquisition effect of the probe, a supporting part is adopted to support the probe at a position 15-20mm away from the light outlet on the probe, and the supporting part is a V-shaped groove for example. The position of the test standard is then adjusted to be appropriate so that the image of the test standard is in the centered position.

In an embodiment, the preprocessing may include converting the target image into a preset image format, performing filtering processing on the target image converted into the preset image format, obtaining feature pixel points of the filtered target image, and cutting the target image into a target image of a preset size based on the feature pixel points. The target image is a preprocessed image after preprocessing.

In the above, the collected inspection standard sample image is preprocessed to remove noise and the like, so that the follow-up observation and use are more convenient. In the preprocessing process, for convenience of subsequent comparison and detection, the format of the inspection standard sample image is converted, preset image formats such as jpg and the like are prestored in the OCT host, and the inspection standard sample image is converted into the jpg format if the currently acquired inspection standard sample image is in a non-jpg format. After the format of the inspection standard sample image is converted, the target image is further filtered, mean value filtering is performed, and after the inspection standard sample image is filtered by using a matched filter, corresponding noises are removed, so that the image is clearer. And after the filtering processing of the inspection standard sample image, further extracting characteristic pixel points of the target image. The test standard image includes a test standard image target pattern of a certain shape, such as a square pattern, an animal pattern, a circular pattern, etc., which is generally adapted to the probe. The characteristic pixel points refer to pixel characteristics of the inspection standard sample image in the inspection standard sample image. The pixel characteristics of the target image are obtained, namely the specific shape, size and position of the target pattern in the inspection standard sample image are obtained, so that the inspection standard sample image can be cut by referring to the specific position and the like of the target pattern. For example, the size of the currently acquired test sample image is 4mm × 4mm, the preset size is 3mm × 3mm, and the size of the target pattern in the test sample image is only 2mm × 2mm, so that the test sample image can be acquired as 3mm × 3 mm. The inspection standard sample is provided with an inner hole with a preset shape, the preset shape comprises a triangle, a quadrangle, a pentagon and a hexagon, and the light outlet end of the OCT scanning probe is fixed in the middle of the inner hole of the inspection standard sample through the supporting piece.

In the OCT imaging system, the final influencing factors of the artifact are various, and may be caused by a host or a probe. For different reasons, in general, when an artifact is detected, the detection target is different. In the embodiment, in order to detect whether an artifact is generated in a target image acquired in the OCT imaging system or whether the number of artifacts meets a criterion in the subsequent step, one image may be acquired arbitrarily under a set condition. And the process may typically be repeated multiple times for more confidence in the results.

Step 102: and acquiring the boundary of the preprocessed image, and detecting whether the preprocessed image is a deformed image or not according to the boundary.

In order to ensure the accuracy of the result of whether the image is deformed or not, deformation detection is carried out on the preprocessed image. Specifically, the boundary of the preprocessed image is extracted, for example, the target pattern in the preprocessed image is a square pattern, and a boundary, that is, a boundary, is formed between the inside of the square pattern region and the outside of the square pattern region, because the color presentation in the square pattern region is usually different from the outside of the square pattern region, the boundary of the target pattern can be easily extracted by calculating a pixel value and the like by combining the prior art, and the boundary is further compared and detected.

In the embodiment, whether the image is deformed or not, that is, whether the target pattern in the preprocessed image is deformed or not, is detected, and the target detection point is selected from the preprocessed image, that is, the target detection point is selected from the target pattern. In order to ensure the accuracy of the result, a plurality of target detection points are selected. The preset reference detection point is a set of data stored in the OCT host in advance, and is used for comparison with the target detection point as a comparison reference, so as to know whether the position of the target detection point is shifted. For example, the preset reference detection point may be in the form of an image, the worker stores the group of images in the OCT host in advance, and when a preprocessed image is acquired and processed, the preset reference detection point is displayed on the preprocessed image, so that the preset reference detection point and the target detection point can be visually compared. In another example, the preset reference detection points may be stored as coordinate data, the number of the preset reference detection points is the same as the number of the target detection points, when the inspection standard sample image is collected and processed into the preprocessed image, the target detection points are obtained, that is, the target detection points are selected and the coordinate positions of the target detection points in the preprocessed image are obtained, and the preset reference detection points at corresponding positions are respectively compared with the target detection points one by one, so that whether the target detection points generate deviation or not can be accurately known.

Further, detecting whether the preprocessed image is a deformed image according to the boundary includes: displaying a pre-stored standard comparison image, wherein a comparison closed loop is formed on the standard comparison image; and comparing whether the inspection standard sample image is in the range of the preset tolerance region formed by the comparison closed loop, and defining the inspection standard sample image as a non-deformation image when the inspection standard sample image is in the range of the preset tolerance region formed by the comparison closed loop.

The standard comparison image is stored in the OCT host computer in advance by related staff, is equivalent to a virtual comparison card, is displayed on the preprocessed image, and can be compared visually to determine whether differences exist. And performing further deformation detection on the non-preliminary deformed image in order to ensure the accuracy of the result of whether the image is deformed or not at the moment, wherein subsequent steps are not required if the target detection point is set to detect that the current target image is deformed, and only if the target detection point is consistent with the preset reference detection point, the current pre-processed image is indicated to be the non-preliminary deformed image. Specifically, the boundary of the preprocessed image is extracted, for example, the target pattern in the preprocessed image is a square pattern, and a boundary, that is, a boundary, is formed between the inside of the square pattern region and the outside of the square pattern region, because the color presentation in the square pattern region is usually different from the outside of the square pattern region, the boundary of the target pattern can be easily extracted by calculating a pixel value and the like by combining the prior art, and the boundary is further compared and detected.

In the above, as a more preferred embodiment, the comparison closed loop includes a first comparison closed loop and a second comparison closed loop, and the second comparison closed loop is located within the first comparison closed loop; correspondingly, the comparing whether the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop or not, and when the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop, defining the inspection standard sample image as a non-deformation image, includes: and comparing whether the inspection standard sample image is in a preset tolerance area range formed by the first comparison closed loop and the second comparison closed loop, and defining the inspection standard sample image as a non-deformation image when the inspection standard sample image is in the preset tolerance area range formed by the first comparison closed loop and the second comparison closed loop.

In the above, the one-comparison closed loop and the second-comparison closed loop are allowable tolerances corresponding to standard sizes. And when the detected standard sample image is in the range formed by the first comparison closed loop and the second comparison closed loop, the target image is qualified and is a non-deformation image.

Step 103: and respectively generating a transverse resolution inspection image and a longitudinal resolution inspection image, wherein the transverse resolution inspection image is acquired by the OCT host, the OCT scanning probe and the first inspection component, and the longitudinal resolution inspection image is acquired by the OCT host, the OCT scanning probe and the second inspection component. The first inspection assembly comprises a first standard thickness plate, a resolution ratio plate and a white diffuse reflection piece, wherein the first standard thickness plate, the resolution ratio plate and the white diffuse reflection piece are sequentially stacked from top to bottom. The second inspection assembly comprises a second standard thickness plate, a third standard thickness plate and a fourth standard thickness plate, the second standard thickness plate, the third standard thickness plate and the fourth standard thickness plate are sequentially stacked from top to bottom, the OCT host is connected with the OCT scanning probe, and the OCT scanning probe is used for collecting the section image of the resolution plate and collecting the reflection image formed by reflection of the third standard thickness plate.

The probe adopted in the embodiment is a probe applied to a lumen OCT device. A driving unit in the host machine drives the probe to circumferentially scan for 360 degrees through the guide wire, so that a sectional image of one position of the lumen channel can be obtained. The transverse resolution inspection image is acquired through the OCT scanning probe, the OCT host and the first inspection component, the longitudinal resolution inspection image is acquired through the OCT scanning probe, the OCT host and the second inspection component, the first inspection assembly comprises a first standard thickness plate, a resolution plate and a white diffuse reflection member, the first standard thickness plate, the resolution plate and the white diffuse reflection member are sequentially stacked from top to bottom, the second checking assembly comprises a second standard thickness plate, a third standard thickness plate and a fourth standard thickness plate, the second standard thickness plate, the third standard thickness plate and the fourth standard thickness plate are sequentially stacked from top to bottom, the OCT scanning probe is connected with the OCT host machine and used for collecting the section image of the resolution plate and collecting the reflection image formed by reflection of the third standard thickness plate.

The components used for collecting the transverse resolution inspection image are shown in fig. 3, and include an OCT scanning probe 301, an OCT host, a first standard thickness plate 302, a resolution plate 303, and a white diffuse reflection member 304, where the first standard thickness plate 302, the resolution plate 303, and the white diffuse reflection member 304 are sequentially stacked from top to bottom, the OCT scanning probe 601 is used for collecting a cross-sectional image of the resolution plate 303, and the OCT scanning probe 301 is connected to the OCT host. Referring to fig. 4, the components used in acquiring the longitudinal resolution inspection image include a first OCT scanning probe 401, an OCT host, a second standard thickness plate 402, a third standard thickness plate 403, and a fourth standard thickness plate 404, where the second standard thickness plate 402, the third standard thickness plate 403, and the fourth standard thickness plate 404 are sequentially stacked from top to bottom, the OCT scanning probe 401 is configured to acquire a reflection image formed by the third standard thickness plate 403 being reflected by the second standard thickness plate 402 and the fourth standard thickness plate 404, and the OCT scanning probe 401 is connected to the OCT host. The OCT imaging system generally includes an OCT host and an OCT scanning probe, and the OCT scanning probe acquires an image of a target region, and the acquired image is defined as an OCT medical image in this embodiment.

For example, the inspection specification for the lateral resolution may be to inspect the OCT host and the fiber scanning probe as the inspection objects, and when the OCT host is inspected, the inspection tool may be an acceptable fiber scanning probe, and when the fiber scanning probe is inspected, the inspection tool is an acceptable OCT host. In the inspection, a white diffuse reflection surface, a test board with a certain resolution and a third standard thickness board with a certain standard are generally required. The white diffuse reflection piece is also a white diffuse reflection surface, and a standard diffuse reflection surface made of standard alumina ceramics or white diffuse reflection paper can be adopted. The resolution plate is a parallel line pattern with a certain interval of light and shade distribution, and transparent glass or plastic is generally used as a carrier. More effectively, bright and dark parallel line patterns can be directly etched on a substrate such as white alumina ceramics, so as to replace a white diffuse reflection surface and a resolution test board. In this example, the number of lines of the line pattern in the resolution board is not less than 5, so as to ensure the effective data volume of the acquired image. The standard thickness plate can be a 300um standard third standard thickness plate, a 600um standard third standard thickness plate and a 1500 standard third standard thickness plate, and because the OCT imaging equipment can integrally image a scanning section, the lateral resolution on different thickness surfaces on the section needs to be detected. Illustratively, when the transverse resolution is checked, a resolution plate is placed on the white diffuse reflection surface, a standard thickness plate is arranged above the resolution plate, and image acquisition and final transverse resolution scoring are performed under the thickness plates corresponding to different standards respectively. In the transverse resolution detection, the OCT image is collected and output to be a light and shade distributed stripe image corresponding to the resolution plate, and the final transverse line resolution score can be obtained by analyzing the stripe image.

And corresponding to the test of the longitudinal resolution, a standard third standard thickness plate with the thickness to be measured is clamped by two transparent sheets with certain thickness. That is, the second standard thickness plate and the fourth standard thickness plate are transparent sheets. The function of the transparent sheet is mainly to give the standard third standard thickness plate support. The standard third standard thickness plate to be measured is generally thinner, for example, a standard third standard thickness plate of 50um is adopted as the third standard thickness plate to be measured. The transparent sheet and the standard third standard thickness plate can be suspended in the air, and the reason for suspending is to reduce the influence of the reflected light on the lower surface on the measurement result. In the longitudinal resolution detection, the OCT image is acquired and output as an image formed by an upper reflecting surface and a lower reflecting surface of a standard third standard thickness plate, and the final longitudinal resolution score can be obtained by analyzing the two reflecting surfaces.

Step 104: selecting at least one first acquisition line on the transverse resolution inspection image based on a first acquisition rule, and selecting at least one second acquisition line on the longitudinal resolution inspection image based on a second acquisition rule.

In the embodiment, the transverse resolution inspection image and the longitudinal resolution inspection image are respectively acquired based on the acquired standard, and then the first acquisition line and the second acquisition line are respectively acquired according to a first acquisition rule and a second acquisition rule which are set in advance. The first and second acquisition rules are commonly set according to the object to be acquired, the size of the inspection image, and the like, and can be pre-stored by the staff in advance.

The first acquisition rule is that a transverse line with a first set length and perpendicular to the resolution plate is selected on the transverse resolution inspection image, and the second acquisition rule is that a transverse line with a second set length and perpendicular to the third standard thickness plate is selected on the longitudinal resolution inspection image; correspondingly, the selecting at least one first acquisition line on the transverse resolution inspection image based on the first acquisition rule includes: generating a first contrast line pattern as a first acquisition line on the transverse resolution inspection image, the first contrast line pattern being equal to a first set length and perpendicular to a cross-sectional pattern of a resolution board; correspondingly, the selecting at least one second acquisition line on the longitudinal resolution inspection image based on the second acquisition rule includes: a second set length is generated on the longitudinal resolution inspection image.

Step 105: respectively selecting a first acquisition line and a second acquisition line to generate a first pixel value distribution curve of the first acquisition line and a second pixel value distribution curve of the second acquisition line; and calculating a transverse resolution score according to the first pixel value distribution curve, and calculating a longitudinal resolution score according to the second pixel value distribution curve.

Specifically, a first acquisition line and a second acquisition line are respectively selected to generate a first pixel value distribution curve of the first acquisition line and a second pixel value distribution curve of the second acquisition line; according to the first pixel value distribution. And calculating a transverse resolution score according to the curve, and calculating a longitudinal resolution score according to the second pixel value distribution curve.

Step 106: acquiring an OCT artifact image, acquiring image pixel values of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel values to obtain the pixel values and the number of the artifacts; and judging whether the pixel values and the quantity of the artifacts meet preset detection standards.

The acquiring of the image pixel value of the OCT artifact image according to the preset acquisition rule, and performing data processing on the image pixel value to obtain the pixel value and the number of the artifacts includes:

selecting an acquisition line in the OCT artifact image, wherein the acquisition line is a line segment formed between a central point and a point on a boundary in the OCT artifact image to obtain an image pixel value of the OCT artifact image; carrying out data processing on the image pixel values to obtain the pixel values and the number of artifacts, and acquiring a relation curve between the pixel coordinates and the pixel values of the acquisition lines; correspondingly, the determining whether the pixel values and the number of the artifacts satisfy preset detection criteria includes: rotating the acquisition lines by a preset rotation angle with the central point as a circle center to obtain a relation curve between pixel coordinates and pixel values of a plurality of acquisition lines; and judging whether the relation curve meets a preset detection standard or not.

As shown in fig. 5, the tool for generating an OCT artifact image includes a fourth probe 501 and a white diffuse reflection surface 502. Specifically, whether the pseudo image is a linear artifact or an annular artifact is detected; when the pseudo image is a linear artifact, judging whether the number of the linear artifact is greater than a first detection threshold value and judging whether the brightness of the linear artifact is greater than a second detection threshold value; when the pseudo image is a ring artifact, judging whether the distance between the ring artifact and the central point is greater than a detection distance, judging whether the number of the ring artifacts is greater than a third detection threshold, and judging whether the brightness of the ring artifact is greater than a fourth detection threshold.

Example two

Referring to fig. 7, fig. 7 is a schematic structural diagram of an imaging quality detection apparatus of an OCT host according to an embodiment of the present invention. As shown in fig. 7, the imaging quality detection apparatus of the OCT host may include: the system comprises a first image acquisition module 701, an image deformation detection module 702, a second image acquisition module 703, an acquisition region selection module 704, a resolution scoring module 705 and an artifact acquisition module 706. Wherein:

the first image acquisition module 701: the OCT image deformation detection device is used for acquiring a detection standard sample image, and the detection standard sample image is preprocessed to obtain a preprocessed image; wherein, the OCT image deformation detection device comprises an OCT scanning probe, a support piece and a detection standard sample. Image deformation detection module 702: the method is used for acquiring the boundary of the preprocessed image and detecting whether the preprocessed image is a deformed image or not according to the boundary. The second image acquisition module 703: the system is used for respectively generating a transverse resolution inspection image and a longitudinal resolution inspection image, wherein the transverse resolution inspection image is acquired through the OCT host machine, the OCT scanning probe and the first inspection component, and the longitudinal resolution inspection image is acquired through the OCT host machine, the OCT scanning probe and the second inspection component. The first inspection assembly comprises a first standard thickness plate, a resolution ratio plate and a white diffuse reflection piece, wherein the first standard thickness plate, the resolution ratio plate and the white diffuse reflection piece are sequentially stacked from top to bottom. The second inspection assembly comprises a second standard thickness plate, a third standard thickness plate and a fourth standard thickness plate, the second standard thickness plate, the third standard thickness plate and the fourth standard thickness plate are sequentially stacked from top to bottom, the OCT host is connected with the OCT scanning probe, and the OCT scanning probe is used for collecting the section image of the resolution plate and collecting the reflection image formed by reflection of the third standard thickness plate. Acquisition area selection module 704: for selecting at least one first acquisition line on the transverse resolution check-up image based on a first acquisition rule and at least one second acquisition line on the longitudinal resolution check-up image based on a second acquisition rule. A resolution scoring module 705, configured to select a first acquisition line and a second acquisition line, respectively, and generate a first pixel value distribution curve of the first acquisition line and a second pixel value distribution curve of the second acquisition line; calculating a lateral resolution score according to the first pixel value distribution curve, and calculating a longitudinal resolution score according to the second pixel value distribution curve; the artifact acquisition module 706: the OCT image acquisition system is used for acquiring an OCT artifact image, acquiring image pixel values of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel values to obtain the pixel values and the quantity of artifacts; and judging whether the pixel values and the quantity of the artifacts meet preset detection standards.

EXAMPLE III

Referring to fig. 8, fig. 8 is a schematic structural diagram of an imaging quality detection apparatus of an OCT host according to an embodiment of the present invention. The imaging quality detection device of the OCT host may be a computer, a server, or the like, and may also be an intelligent device such as a mobile phone, a tablet computer, a monitoring terminal, or the like, and an image acquisition device having a processing function. As shown in fig. 8, the imaging quality detection apparatus of the OCT host may include:

a memory 801 in which executable program code is stored;

a processor 802 coupled with the memory 801;

the processor 802 calls the executable program code stored in the memory 801 to execute some or all of the steps in the imaging quality detection method of the OCT host in the first embodiment.

The embodiment of the invention discloses a computer-readable storage medium which stores a computer program, wherein the computer program enables a computer to execute part or all of the steps in the imaging quality detection method of an OCT host in the first embodiment.

The embodiment of the invention also discloses a computer program product, wherein when the computer program product runs on a computer, the computer is enabled to execute part or all of the steps in the imaging quality detection method of the OCT host in the first embodiment.

The embodiment of the invention also discloses an application publishing platform, wherein the application publishing platform is used for publishing a computer program product, and when the computer program product runs on a computer, the computer is enabled to execute part or all of the steps in the imaging quality detection method of the OCT host in the first embodiment.

In various embodiments of the present invention, it should be understood that the sequence numbers of the processes do not mean the execution sequence necessarily in order, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The integrated units, if implemented as software functional units and sold or used as a stand-alone product, may be stored in a computer accessible memory. Based on such understanding, the technical solution of the present invention, which is a part of or contributes to the prior art in essence, or all or part of the technical solution, can be embodied in the form of a software product, which is stored in a memory and includes several requests for causing a computer device (which may be a personal computer, a server, a network device, or the like, and may specifically be a processor in the computer device) to execute part or all of the steps of the method according to the embodiments of the present invention.

In the embodiments provided herein, it should be understood that "B corresponding to a" means that B is associated with a from which B can be determined. It should also be understood, however, that determining B from a does not mean determining B from a alone, but may also be determined from a and/or other information.

Those of ordinary skill in the art will appreciate that some or all of the steps of the methods of the embodiments may be implemented by hardware instructions associated with a program, which may be stored in a computer-readable storage medium, such as a Read-Only Memory (ROM), a Random Access Memory (RAM), a Programmable Read-Only Memory (PROM), an Erasable Programmable Read-Only Memory (EPROM), a One-time Programmable Read-Only Memory (OTPROM), an Electrically Erasable Programmable Read-Only Memory (EEPROM), a Compact Disc Read-Only Memory (CD-ROM), or other Memory, a CD-ROM, or other disk, or a combination thereof, A tape memory, or any other medium readable by a computer that can be used to carry or store data.

The imaging quality detection method, the imaging quality detection device, the electronic device and the storage medium of the OCT host disclosed in the embodiments of the present invention are described in detail above, and a specific example is applied in the present document to explain the principle and the implementation of the present invention, and the description of the above embodiments is only used to help understanding the method and the core idea of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.

Claims

1. An imaging quality detection method of an OCT host computer is characterized by comprising the following steps:

respectively generating a transverse resolution inspection image and a longitudinal resolution inspection image, wherein the transverse resolution inspection image is acquired through the OCT host, the OCT scanning probe and the first inspection component, and the longitudinal resolution inspection image is acquired through the OCT host, the OCT scanning probe and the second inspection component;

the first inspection assembly comprises a first standard thickness plate, a resolution plate and a white diffuse reflection piece, wherein the first standard thickness plate, the resolution plate and the white diffuse reflection piece are sequentially stacked from top to bottom;

the second inspection assembly comprises a second standard thickness plate, a third standard thickness plate and a fourth standard thickness plate, the second standard thickness plate, the third standard thickness plate and the fourth standard thickness plate are sequentially stacked from top to bottom, the OCT host is connected with the OCT scanning probe, and the OCT scanning probe is used for collecting the section image of the resolution plate and collecting the reflection image formed by the reflection of the third standard thickness plate;

2. The imaging quality detection method according to claim 1, wherein the inspection standard sample has an inner hole with a preset shape, the preset shape comprises a triangle, a quadrangle, a pentagon and a hexagon, and the light outlet end of the OCT scanning probe is fixed in the middle of the inner hole of the inspection standard sample through the support.

3. The imaging quality detection method according to claim 1, wherein detecting whether the preprocessed image is a deformed image according to the boundary includes:

4. The imaging quality detection method according to claim 3, wherein the comparison closed loop includes a first comparison closed loop and a second comparison closed loop, the second comparison closed loop being located within the first comparison closed loop; correspondingly, the comparing whether the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop or not, and when the inspection standard sample image is in the range of the preset tolerance region formed by the comparing closed loop, defining the inspection standard sample image as a non-deformation image, includes:

5. The imaging quality detection method according to claim 1, wherein the acquiring an image pixel value of the OCT artifact image according to a preset acquisition rule, and performing data processing on the image pixel value to obtain a pixel value and a number of artifacts comprises:

6. The imaging quality inspection method according to claim 1, wherein the first acquisition rule is to select a first set length of a transverse line perpendicular to the resolution board on the transverse resolution inspection image, and the second acquisition rule is to select a second set length of a transverse line perpendicular to the third standard thickness board on the longitudinal resolution inspection image;

7. The imaging quality detection method of claim 6, wherein said calculating a lateral resolution score from the first pixel value distribution curve comprises:

8. An imaging quality detection device of an OCT host computer, comprising:

a second image acquisition module: the system comprises a main OCT unit, a main OCT scanning probe, a first inspection assembly, a second inspection assembly, a transverse resolution inspection image, a longitudinal resolution inspection image, a second inspection image, a third inspection image, a fourth inspection image, a third;

9. An imaging quality detection apparatus of an OCT host computer, comprising: a memory storing executable program code; a processor coupled with the memory; the processor calls the executable program code stored in the memory for executing the imaging quality detection method of the OCT host of any one of claims 1 to 7.

10. A computer-readable storage medium characterized in that it stores a computer program, wherein the computer program causes a computer to execute the imaging quality detection method of an OCT host of any one of claims 1 to 7.